JPH0243151B2 - - Google Patents
Info
- Publication number
- JPH0243151B2 JPH0243151B2 JP1218170A JP21817089A JPH0243151B2 JP H0243151 B2 JPH0243151 B2 JP H0243151B2 JP 1218170 A JP1218170 A JP 1218170A JP 21817089 A JP21817089 A JP 21817089A JP H0243151 B2 JPH0243151 B2 JP H0243151B2
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- charging
- measurement
- determination
- capacitors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 58
- 238000005259 measurement Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 7
- 238000012850 discrimination method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 230000007723 transport mechanism Effects 0.000 description 4
- 230000032683 aging Effects 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電解コンデンサの製造工程においてエ
ージング処理されたものの中から漏れ電流特性の
正常なものを選別する方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for selecting electrolytic capacitors with normal leakage current characteristics from those subjected to aging treatment in the manufacturing process of electrolytic capacitors.
従来、アルミニウム電極箔を回巻きして組み立
てられたコンデンサの特性を安定させるために高
温加熱とともに通電するいわゆるエージング処理
が行われている。しかし、このような処理は多数
のコンデンサを同時に処理するものであるため、
全てのコンデンサが必ずしも同一の条件及び同一
のエージング達成度で処理されず、エージング不
十分のコンデンサが発生することがある。
Conventionally, in order to stabilize the characteristics of a capacitor assembled by winding aluminum electrode foil, a so-called aging treatment is performed in which the capacitor is heated at a high temperature and energized. However, since this type of processing involves processing a large number of capacitors at the same time,
Not all capacitors are necessarily processed under the same conditions and with the same degree of aging performance, and some capacitors may be underaged.
しかるに、従来、エージング不十分のコンデン
サを識別する手段を提供されていなかつたため、
通常の漏れ電流特性の測定手段（一定時間通電・
充電後直ちに漏れ電流を測定する）によつては、
そのようなコンデンサを選別することができなか
つた。エージング不十分のコンデンサは後に経時
変化して漏れ電流を著しく増大する傾向があるた
め、コンデンサ使用上極めて不都合である。
However, conventional methods have not provided a means to identify insufficiently aged capacitors.
Usual means of measuring leakage current characteristics (energizing for a certain period of time,
(Measure leakage current immediately after charging)
It was not possible to sort out such capacitors. Capacitors that have not aged sufficiently tend to deteriorate over time and significantly increase leakage current, which is extremely disadvantageous in the use of capacitors.
本発明はこの点を改良するもので、不安定な漏
れ電流特性を有するコンデンサを短時間で効率よ
く、しかも正確に選別できるコンデンサの選別方
法を提供することを目的とする。 The present invention improves on this point, and aims to provide a method for selecting capacitors that can efficiently and accurately select capacitors having unstable leakage current characteristics in a short period of time.
本発明は、コンデンサを順次搬送するステツプ
と、この搬送されるコンデンサを順次充電するス
テツプとを備えたコンデンサ選別方法において、
充電電圧の異なる段階でコンデンサの漏れ電流を
測定するステツプと、このそれぞれの測定結果及
び測定結果の差に基づいてそれぞれコンデンサの
良否を判別するステツプと、この複数回の判別の
結果によりコンデンサの良否を判別するステツプ
とを備えたことを特徴とする。
The present invention provides a capacitor sorting method comprising a step of sequentially transporting capacitors and a step of sequentially charging the transported capacitors.
A step of measuring the leakage current of the capacitor at different stages of the charging voltage, a step of determining whether the capacitor is good or bad based on the measurement results and the difference between the measurement results, and a step of determining whether the capacitor is good or bad based on the results of this multiple determinations. The method is characterized by comprising a step for determining.
したがつて、同一のコンデンサを異なる判別条
件の下に複数回判別し、この結果によりコンデン
サの良否を判別することができる。このため、判
別結果の信頼度を著しく向上することができる。
Therefore, the same capacitor can be judged multiple times under different judgment conditions, and based on the results, it is possible to judge whether the capacitor is good or bad. Therefore, the reliability of the determination result can be significantly improved.
本発明の一実施例を図面に基づいて説明する。 An embodiment of the present invention will be described based on the drawings.
第１図は本発明一実施例のコンデンサ搬送機構
１を示す概略図である。 FIG. 1 is a schematic diagram showing a capacitor transport mechanism 1 according to an embodiment of the present invention.
第１図において、コンデンサＣはその両端に導
出されたリード線L1，L2を介して一対の帯状部
材T1，T2に電気的に絶縁状態で保持され、該部
材T1，T2とともに矢印Ｓ方向に単位時間毎に間
欠的に移送される。部材T1，T2に沿つて多数の
板バネ状の電極E1，E2が配設され、コンデンサ
のリード線L1，L2に接触できる。 In FIG. 1, a capacitor C is held in an electrically insulated state by a pair of strip members T 1 and T 2 via lead wires L 1 and L 2 led out from both ends of the capacitor C. At the same time, it is intermittently transferred in the direction of arrow S every unit time. A large number of leaf spring-like electrodes E 1 , E 2 are arranged along the members T 1 , T 2 and can contact the lead wires L 1 , L 2 of the capacitor.
第２図は本発明一実施例のコンデンサ選別機構
の要部ブロツク図を示す。 FIG. 2 shows a block diagram of essential parts of a capacitor selection mechanism according to an embodiment of the present invention.
前記搬送機構１上に取り付けられたコンデンサ
Ｃには電極１〜ｎによつて充電電流が供給され、
移送されて電極n0に達すると測定が行われる。コ
ンデンサの漏れ電流i1は電流−電圧変換器１０に
より電圧に変換された上、デジタル電圧計１１で
測定され記憶器１２に記憶される。同時に、測定
電圧は比較器１３に導入され、予め設定された数
値よりも大きいときは不良品として記憶器１４に
記憶される。 A charging current is supplied to the capacitor C mounted on the transport mechanism 1 through electrodes 1 to n,
Measurements are taken when it is transported and reaches the electrode n 0 . The leakage current i 1 of the capacitor is converted into a voltage by a current-voltage converter 10, measured by a digital voltmeter 11, and stored in a memory 12. At the same time, the measured voltage is introduced into the comparator 13, and if it is larger than a preset value, it is stored in the memory 14 as a defective product.
コンデンサＣはn1以降の電極により引き続き充
電が行われ、搬送機構１の下流において電極nx
により再び測定が行われる。この場合も測定電流
i2は電流−電圧変換器２０により電圧に変換され
た上、デジタル電圧計２１で測定され、測定電圧
は比較器２２及び減算器２３に入力される。比較
器２２は測定電圧が予め設定された数値よりも大
きいときは不良品を示す信号を発生する。減算器
２３は記憶器１２における最初の測定電圧値V1
から電圧計２１からの２回目の測定電圧値V2を
減算して、その差を比較器２４に入力し、差が予
め設定した値より大きいときは不良を示す信号が
比較器２４から出力される。比較器２２，２４及
び記憶器１４の出力はオア回路１５に接続されて
おり、それらのいずれかにコンデンサ不良の判別
出力がある場合にオア回路１５から不良信号が出
力される。 The capacitor C is continuously charged by the electrodes after n1 , and the capacitor C is charged by the electrode nx downstream of the transport mechanism 1.
Measurement is performed again. In this case also the measured current
i 2 is converted into a voltage by a current-voltage converter 20 and then measured by a digital voltmeter 21 , and the measured voltage is input to a comparator 22 and a subtracter 23 . Comparator 22 generates a signal indicating a defective product when the measured voltage is greater than a preset value. The subtracter 23 calculates the first measured voltage value V 1 in the memory 12.
The second measured voltage value V2 from the voltmeter 21 is subtracted from the voltmeter 21, and the difference is input to the comparator 24. If the difference is larger than a preset value, a signal indicating a defect is output from the comparator 24. Ru. The outputs of the comparators 22, 24 and the memory 14 are connected to an OR circuit 15, and if any of them has an output for determining that the capacitor is defective, the OR circuit 15 outputs a defect signal.
以上説明した様に本発明によれば、コンデンサ
を順次搬送するステツプと、この搬送されるコン
デンサを順次充電するステツプとを備えたコンデ
ンサ選別方法にいて、充電電圧の異なる段階でコ
ンデンサの漏れ電流を測定するステツプと、この
それぞれの測定結果及び測定結果の差に基づいて
それぞれコンデンサの良否を判別するステツプ
と、この複数回の判別の結果によりコンデンサの
良否を判別するステツプとを備えたことを特徴と
する。
As explained above, according to the present invention, there is a capacitor sorting method that includes the steps of sequentially transporting capacitors and the step of sequentially charging the transported capacitors, and the capacitor leakage current is detected at different stages of charging voltage. The capacitor is characterized by comprising a step for measuring, a step for determining whether the capacitor is good or bad based on the respective measurement results and the difference between the measurement results, and a step for determining whether the capacitor is good or bad based on the results of the multiple determinations. shall be.
したがつて、同一のコンデンサを異なる条件の
下で複数回判別し、この結果によりコンデンサの
良否を判別することができ、このため判別の結果
の信頼度を著しく向上することができる効果を有
する。 Therefore, the same capacitor can be judged multiple times under different conditions, and based on the results, it is possible to judge whether the capacitor is good or bad, which has the effect of significantly improving the reliability of the judgment results.
第１図は本発明一実施例の搬送機構の該略図。
第２図は本発明一実施例のコンデンサ選別機構の
要部ブロツク構成図。
１……コンデンサ搬送機構、２……コンデンサ
選別機構、１０，２０……電流−電圧変換器、１
１，２１……デジタル電圧計、１２，１４……記
憶器、１３，２２，２４……比較器、１５……オ
ア回路、２３……減算器。
FIG. 1 is a schematic diagram of a conveyance mechanism according to an embodiment of the present invention.
FIG. 2 is a block diagram of essential parts of a capacitor selection mechanism according to an embodiment of the present invention. 1... Capacitor transport mechanism, 2... Capacitor sorting mechanism, 10, 20... Current-voltage converter, 1
1, 21... Digital voltmeter, 12, 14... Memory device, 13, 22, 24... Comparator, 15... OR circuit, 23... Subtractor.
Claims (1)
ンデンサ搬送ステツプと、 前記搬送される各々のコンデンサを複数の充電
段階で順次充電するコンデンサ充電ステツプと、 を備えたコンデンサの判別方法において、 前記コンデンサ充電ステツプの充電段階の内の
所定の第１の充電段階で各コンデンサの漏れ電流
を測定する第１の測定ステツプと、 前記第１の測定ステツプの測定結果に基づいて
各コンデンサの良否を判別して判別結果を記憶す
る第１の判別ステツプと、 前記第１の測定ステツプの測定結果を記憶する
記憶ステツプと、 前記コンデンサ充電ステツプの充電段階の内の
前記第１の充電段階の下流に設定された所定の第
２の充電段階で各コンデンサの漏れ電流を測定す
る第２の測定ステツプと、 前記第２の測定ステツプの測定結果に基づいて
前記第１の判別ステツプで良否が判別された前記
コンデンサの良否を更に判別する第２の判別ステ
ツプと、 前記第２の測定ステツプの測定結果と、この第
２の測定ステツプの結果を得たコンデンサの前記
記憶ステツプで記憶された前記第１の測定ステツ
プの測定結果との差に基づいて前記第１及び第２
のコンデンサの判別ステツプで良否を判別された
前記コンデンサの良否を更に判別する第３の判別
ステツプと、 前記第１の、第２の及び第３の判別ステツプの
結果に基づいてコンデンサの良否を判別するステ
ツプと、 を備えたことを特徴とする漏れ電流特性不良コン
デンサの選別方法。[Claims] 1. A capacitor discrimination method comprising: a capacitor transport step for sequentially transporting each of a plurality of capacitors; and a capacitor charging step for sequentially charging each of the transported capacitors in a plurality of charging stages. a first measuring step of measuring the leakage current of each capacitor in a predetermined first charging stage of the charging stages of the capacitor charging step; and measuring the leakage current of each capacitor based on the measurement result of the first measuring step. a first determination step for determining pass/fail and storing the determination result; a storage step for storing the measurement result of the first measurement step; and a first charging stage of the charging stage of the capacitor charging step. a second measurement step of measuring the leakage current of each capacitor at a predetermined second charging stage set downstream; and a pass/fail determination in the first determination step based on the measurement results of the second measurement step. a second determination step for further determining the quality of the capacitor that has been tested; Based on the difference from the measurement result of the first measurement step, the first and second measurement steps are performed.
a third determination step for further determining the quality of the capacitor determined in the capacitor determination step; and determining the quality of the capacitor based on the results of the first, second, and third determination steps. A method for selecting capacitors with poor leakage current characteristics, the method comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1218170A JPH02124479A (en) | 1989-08-24 | 1989-08-24 | How to select capacitors with poor leakage current characteristics |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1218170A JPH02124479A (en) | 1989-08-24 | 1989-08-24 | How to select capacitors with poor leakage current characteristics |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02124479A JPH02124479A (en) | 1990-05-11 |
| JPH0243151B2 true JPH0243151B2 (en) | 1990-09-27 |
Family
ID=16715724
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1218170A Granted JPH02124479A (en) | 1989-08-24 | 1989-08-24 | How to select capacitors with poor leakage current characteristics |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02124479A (en) |
-
1989
- 1989-08-24 JP JP1218170A patent/JPH02124479A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02124479A (en) | 1990-05-11 |
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