JPH0245154B2 - DENRYUSOKUTEISOCHI - Google Patents
DENRYUSOKUTEISOCHIInfo
- Publication number
- JPH0245154B2 JPH0245154B2 JP10594280A JP10594280A JPH0245154B2 JP H0245154 B2 JPH0245154 B2 JP H0245154B2 JP 10594280 A JP10594280 A JP 10594280A JP 10594280 A JP10594280 A JP 10594280A JP H0245154 B2 JPH0245154 B2 JP H0245154B2
- Authority
- JP
- Japan
- Prior art keywords
- current
- voltage
- time
- load resistor
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/08—Circuits for altering the measuring range
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analogue/Digital Conversion (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
【発明の詳細な説明】
本発明は出力が電流で与えられる計測装置で、
特に出力をデジタル表示する電流測定装置の精度
の向上をはかつたものである。[Detailed Description of the Invention] The present invention is a measuring device whose output is given as a current,
In particular, the aim is to improve the accuracy of a current measuring device that digitally displays the output.
電磁力平衡式のはかりのように出力が電流で与
えられる計測装置の出力をデジタル表示する場
合、出力電流が外乱により変化するので実質的な
測定時間をのばさないと精度がでない。特に一般
に二重積分回路と呼ばれる電子回路を使用した場
合、実質的な測定時間が1回の測定周期の1/3程
度となるが、本発明はこれをながくするようにし
たものである。 When digitally displaying the output of a measuring device whose output is given as a current, such as an electromagnetic force balance scale, the output current changes due to disturbances, so accuracy is lost unless the actual measurement time is extended. In particular, when an electronic circuit generally called a double integration circuit is used, the actual measurement time is about 1/3 of one measurement cycle, but the present invention is designed to lengthen this time.
第1図は従来から行われている方法の一例であ
つて、1が測定電流の発生源であり、2が負荷抵
抗である。2の両端に生じた電圧は30のA−D
変換器により電圧に比例するデジタル量に変換さ
れる。30のA−D変換器の構成はいろいろのも
のが実用化されているが、一例として二重積分方
式の回路で説明する。4は演算増巾器で、5は積
分コンデンサー、6は積分用抵抗、11は4の動
作点を定めるコンデンサーであり、4,5,6,
11はアナログ積分回路を構成する。7,8,1
0a,10bは半導体スイツチを示す。3は基準
電源で2の両端に生じる電圧と逆極性である。ス
イツチ7あるいは8が閉じると、それぞれ2の端
子電圧あるいは3の基準電圧の積分値電圧を4か
ら出力する。12は電圧比較回路で(+)入力側
が接地されており、(−)入力の積分中は正の電
源電圧を出力しているが、入力が負から正に変る
時点で負の電源電圧に急変する。13はシーケン
スコントロール回路で半導体スイツチ、7,8,
10a,10bおよびゲート回路15の開閉を制
御する。14はクロツクパルス発生器である。ス
イツチ7,8を開放し、10a,10bを閉じる
と4,12を通じて帰還がかかり4,12の出力
はほぼ零となる。先ず、スイツチ10a,10b
を開き、7を一定時間t1(第4図参照)だけ閉じ
ると、負荷抵抗2の端子電圧は積分され演算増巾
器4の出力Vは、
V=−1/C∫t1 0iRl/Ridt=−iRlt1/CRi ……(1)
但し、Rl、Riは夫々2および6の抵抗値、C
は5の容量、iはRlを流れる1の電流、t1はスイ
ツチ7の閉じている時間である。 FIG. 1 shows an example of a conventional method, in which numeral 1 represents a source of measurement current and numeral 2 represents a load resistance. The voltage developed across 2 is 30 A-D
A converter converts it into a digital quantity proportional to the voltage. Although various configurations of the 30 A/D converter have been put into practical use, a double integral type circuit will be explained as an example. 4 is an operational amplifier, 5 is an integrating capacitor, 6 is an integrating resistor, 11 is a capacitor that determines the operating point of 4, 4, 5, 6,
11 constitutes an analog integration circuit. 7, 8, 1
0a and 10b indicate semiconductor switches. 3 is a reference power source which has the opposite polarity to the voltage generated across 2. When the switch 7 or 8 is closed, the integrated value voltage of the terminal voltage of 2 or the reference voltage of 3 is outputted from 4, respectively. 12 is a voltage comparison circuit whose (+) input side is grounded, and outputs a positive power supply voltage while integrating the (-) input, but suddenly changes to a negative power supply voltage when the input changes from negative to positive. do. 13 is a sequence control circuit, which is a semiconductor switch; 7, 8,
10a, 10b and the opening/closing of gate circuit 15. 14 is a clock pulse generator. When switches 7 and 8 are opened and switches 10a and 10b are closed, feedback is applied through 4 and 12, and the outputs of 4 and 12 become almost zero. First, the switches 10a and 10b
is opened and 7 is closed for a certain period of time t1 (see Figure 4), the terminal voltage of load resistor 2 is integrated and the output V of operational amplifier 4 is: V=-1/C∫ t1 0 iRl/Ridt =-iRlt 1 /CRi ...(1) However, Rl and Ri are resistance values of 2 and 6, respectively, and C
is the capacitance of 5, i is the current of 1 flowing through Rl, and t1 is the time that switch 7 is closed.
次にスイツチ10a,10bは開いたままでス
イツチ7を開き、8を閉じて演算増巾器4の出力
電圧が零になるまでの時間t2逆極性の基準電圧3
を入力に加えると、その途中の4の出力電圧は、
V=−iRlt1/CR1−1/C∫t 0(−e)/Rtdt
=−iRlt1/CRi+〔et/CRi〕t 0 ……(2)
で与えられ、t=t2でV=0となるから式(2)より
iRlt1/CRi=et2/CRi即ちt2
=i(Rlt1/e) ……(3)
となりスイツチ8を閉じる時間t2はRl、t1、eが
一定であれば電流iに比例する。したがつてt2時
間のクロツクパルスを15より出力すればパルス
数は電流iに比例する。然し式(3)より明かなよう
に、負荷抵抗2の抵抗値Rlの値が電流iによる
自己加熱などの影響で変化すれば積分時間t2も当
然影響をうける。 Next, switch 7 is opened while switches 10a and 10b remain open, and switch 8 is closed. Time t 2 until the output voltage of operational amplifier 4 becomes zero 2 Reference voltage 3 of opposite polarity
is added to the input, the output voltage of 4 in the middle is V=-iRlt 1 /CR 1 -1/C∫ t 0 (-e)/R t dt =-iRlt 1 /CR i +[et/CR i ] t 0 ...(2), and since V=0 at t=t 2 , from equation (2), iRlt 1 /CR i =et 2 /CR i , that is, t 2 =i(Rlt 1 /e ) ...(3) Therefore, the time t 2 for closing the switch 8 is proportional to the current i if Rl, t 1 and e are constant. Therefore, if a clock pulse of t2 hours is output from 15, the number of pulses will be proportional to the current i. However, as is clear from equation (3), if the value of the resistance value Rl of the load resistor 2 changes due to the influence of self-heating due to the current i, the integral time t 2 is naturally affected as well.
第2図は測定電流1と逆極性の基準電流9を上
記t1、t2の期間共通の負荷抵抗2に交互に流して
その端子電圧を積分するようにして2の自己加熱
による抵抗値変化の影響を防止した回路を示す。 Figure 2 shows a reference current 9 of opposite polarity to the measurement current 1 being alternately passed through the common load resistor 2 during the periods t 1 and t 2 above, and the terminal voltage is integrated to measure the change in resistance value due to self-heating of 2. This shows a circuit that prevents the effects of
第4図は第2図のスイツチ7a,8aおよび1
0の動作タイミングと4の出力の関係を示した説
明図である。 Figure 4 shows switches 7a, 8a and 1 in Figure 2.
FIG. 4 is an explanatory diagram showing the relationship between the operation timing of 0 and the output of 4;
第4図に於てt0は測定の一周期で、この内電流
1を測定しているのはt1の時間のみである。基準
電流は一定であるので、逆極性に積分して積分出
力を零にする時間t2は測定電流1の大きさが大き
くなる程ながくなる。従つて積分器の零点を校正
する時間t3は1が大きい程短かくなる。然し最少
限の時間を設ける必要がある。t0を一定にしてt1
を大きくするには基準電流9を大きくし、クロツ
クパルス14の周波数をあげればよいが、いずれ
も限界があり、精度を確保するためにはt1はt0の
1/3〜1/2位とせざるをえない場合が多い。したが
つて測定電流に動揺のある場合には変換毎のバラ
ツキが大きくなる。 In FIG. 4, t 0 is one cycle of measurement, of which current 1 is measured only during time t 1 . Since the reference current is constant, the time t 2 required to integrate with the opposite polarity and make the integral output zero becomes longer as the magnitude of the measurement current 1 becomes larger. Therefore, the time t 3 for calibrating the zero point of the integrator becomes shorter as 1 becomes larger. However, it is necessary to set aside a minimum amount of time. t 1 with t 0 constant
To increase the value, it is possible to increase the reference current 9 and the frequency of the clock pulse 14, but both have their limits, and to ensure accuracy, t 1 should be about 1/3 to 1/2 of t 0 . There are many cases where this is unavoidable. Therefore, if there is fluctuation in the measured current, the variation between conversions will increase.
第3図は本発明による一実施例で31,32以
外は第2図と同じ構成をとる。 FIG. 3 shows an embodiment according to the present invention, which has the same configuration as FIG. 2 except for 31 and 32.
第3図に於て、32は積分器の出力が一定電圧
以上になつたことを検出する電圧比較器であり、
31は一定電圧(Vm)を設定する基準電源であ
る。この回路において7a,8bを閉じ、8a,
7bを開いて2の端子にあらわれた電圧を4、
5、6で積分する。t1の時間内に4の出力が31
の設定電圧(Vm)に達しない場合(第5図Aの
場合)には電圧比較器32は動作しない。t1時間
内に4の出力が31の電圧に達した(第5図B,
C)の場合には、比較器32が動作し、プログラ
ム設定回路13を介して、スイツチ8aを閉じ8
bを開き、同時にゲート回路15を開きクロツク
パルスを送る。t1時間以後はスイツチ7aを開き
7bを閉じ、4の出力が零になるまで積分器は動
作を続ける。基準電流9の大きさは測定電流1の
最大値にほぼ同一に設定する。このようにすれば
積分器の出力とスイツチ、7a,8aおよび10
の動作タイミングは第5図のようになる。ゲート
回路15が開いてクロツクパルスを送つている時
間はt2である。 In FIG. 3, 32 is a voltage comparator that detects when the output of the integrator exceeds a certain voltage.
31 is a reference power supply for setting a constant voltage (Vm). In this circuit, 7a, 8b are closed, 8a,
7b is opened and the voltage that appears at terminal 2 is 4,
Integrate at 5 and 6. The output of 4 is 31 within the time of t 1
If the set voltage (Vm) is not reached (in the case of FIG. 5A), the voltage comparator 32 does not operate. t The output of 4 reached the voltage of 31 within 1 hour (Fig. 5B,
In case C), the comparator 32 operates, and the switch 8a is closed via the program setting circuit 13.
b is opened, and at the same time the gate circuit 15 is opened and a clock pulse is sent. After t1 hour, switch 7a is opened and switch 7b is closed, and the integrator continues to operate until the output of 4 becomes zero. The magnitude of the reference current 9 is set to be approximately the same as the maximum value of the measurement current 1. In this way, the output of the integrator and the switches 7a, 8a and 10
The operation timing is as shown in FIG. The time that gate circuit 15 is open and transmits a clock pulse is t2 .
電圧比較器32の設定電圧31の大きさは、基
準電流9の大きさとの関係でt4の時間内に4の出
力極性が負から正に変化しないように選べばよ
い。 The magnitude of the set voltage 31 of the voltage comparator 32 may be selected in relation to the magnitude of the reference current 9 so that the output polarity of the voltage comparator 4 does not change from negative to positive within the time t4 .
測定電流1を負荷抵抗2に流している時間と基
準電流9を2に流している時間を重複させること
ができるのでt0に対する積分時間t1の割合を上昇
でき、第1図・第2図の方法にくらべて1.5〜2
倍の割合にすることが可能となる。 Since the time during which the measurement current 1 is flowing through the load resistor 2 and the time during which the reference current 9 is flowing through the load resistor 2 can be made to overlap, the ratio of the integration time t 1 to t 0 can be increased, and the ratio of the integration time t 1 to t 0 can be increased. 1.5 to 2 compared to the method of
It becomes possible to double the ratio.
通常二重積分形といわれるA−D変換回路は実
質的な測定時間が一周期の1/3程度であるので、
秤のように外乱のある場合には測定精度が若干劣
る場合があつた。本発明はこれを防ぎ、外乱の影
響を20%〜30%少なくできる。 Since the actual measurement time of an A-D converter circuit, which is usually called a double integral type, is about 1/3 of one cycle,
When there is a disturbance, such as when using a scale, the measurement accuracy may be slightly inferior. The present invention can prevent this and reduce the influence of disturbance by 20% to 30%.
第1図は従来から使用されている回路例で、測
定電流を負荷抵抗2に流してその端子電圧を二重
積分形A−D変換器で電流をパルスに変換してデ
ジタル計測する説明図、第2図は測定電流と基準
電流とを交互に共通の負荷抵抗2に流して二重積
分形A−D変換器で電流をパルスに変換してデジ
タル計測する説明図、第3図は本発明による実施
回路例で第2図の積分器4の出力に電圧比較器を
設け、その作動後に測定電流と基準電流を同時に
負荷抵抗2に流す期間を設けて積分時間を大きく
とれるようにし、測定精度の向上を図つた説明
図、第4図は第2図のスイツチ7a,8aおよび
10の動作タイミングと積分器4の出力との関係
を示した説明図で、第5図は第3図のスイツチ7
a,8aおよび10の動作タイミングと積分器4
の出力との関係を示した説明図である。
1……測定電流の発生源、2……負荷抵抗
(Rl)、3,31……基準電圧源、4……演算増
巾器、5……積分コンデンサー(C)、6……積分抵
抗(Ri)、7,8,10a,10b、及び7a,
7b,8a,8b,10……13でON−OFF制
御される電子スイツチ、9……基準電流源、11
……4の動作点をきめるコンデンサー、12,3
2……電圧比較回路、13……シーケンス・コン
トロール回路、14……クロツクパルス発生器、
15……ANDゲート回路。
FIG. 1 is an example of a conventionally used circuit, and is an explanatory diagram in which a measurement current is passed through a load resistor 2, and the terminal voltage is converted into pulses by a double integral type AD converter for digital measurement. Figure 2 is an explanatory diagram of digitally measuring the measurement current and reference current by flowing them alternately through a common load resistor 2 and converting the current into pulses with a double integral type A-D converter, and Figure 3 is the invention of the present invention. In the implementation circuit example, a voltage comparator is installed at the output of the integrator 4 in Fig. 2, and after its operation, a period is set in which the measurement current and the reference current are simultaneously passed through the load resistor 2, so that the integration time can be increased, and the measurement accuracy is improved. FIG. 4 is an explanatory diagram showing the relationship between the operation timing of switches 7a, 8a and 10 in FIG. 2 and the output of the integrator 4, and FIG. 7
Operation timing of a, 8a and 10 and integrator 4
FIG. 1... Source of measurement current, 2... Load resistance (Rl), 3, 31... Reference voltage source, 4... Arithmetic amplifier, 5... Integrating capacitor (C), 6... Integrating resistor ( Ri), 7, 8, 10a, 10b, and 7a,
7b, 8a, 8b, 10...Electronic switch controlled ON-OFF by 13, 9...Reference current source, 11
...Capacitor that determines the operating point of 4, 12,3
2... Voltage comparison circuit, 13... Sequence control circuit, 14... Clock pulse generator,
15...AND gate circuit.
Claims (1)
子電圧を積分器を介して一定時間コンデンサーに
蓄積し、この蓄積電荷に、基準電源による積分値
出力を逆極性で重畳することにより、前記蓄積電
荷を消去するとともに、この消去に要する時間を
パルス変換する手段を備えた電流測定装置におい
て、前記測定電流の負荷抵抗への印加時に所定の
電圧レベルで作動する電圧比較回路を前記積分器
の出力側に設け、この比較回路の作動後前記測定
電流に前記基準電流を重畳して前記負荷抵抗に流
すスイツチ手段を設けるとともに、この基準電流
重畳印加時から前記パルス変換手段を動作させる
ことを特徴とする電流測定装置。1. The measurement current is applied to a load resistor, the terminal voltage of the load resistor is accumulated in a capacitor for a certain period of time via an integrator, and the integrated value output from the reference power source is superimposed on this accumulated charge with the opposite polarity. In a current measuring device equipped with means for erasing charges and converting the time required for erasing into pulses, a voltage comparison circuit that operates at a predetermined voltage level when the measurement current is applied to a load resistor is connected to the output of the integrator. A switch means is provided on the side, and after the comparison circuit is activated, the reference current is superimposed on the measurement current and the same is applied to the load resistor, and the pulse conversion means is operated from the time when the superimposed reference current is applied. Current measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10594280A JPH0245154B2 (en) | 1980-07-31 | 1980-07-31 | DENRYUSOKUTEISOCHI |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10594280A JPH0245154B2 (en) | 1980-07-31 | 1980-07-31 | DENRYUSOKUTEISOCHI |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5730959A JPS5730959A (en) | 1982-02-19 |
| JPH0245154B2 true JPH0245154B2 (en) | 1990-10-08 |
Family
ID=14420894
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10594280A Expired - Lifetime JPH0245154B2 (en) | 1980-07-31 | 1980-07-31 | DENRYUSOKUTEISOCHI |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0245154B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59138696A (en) * | 1983-01-31 | 1984-08-09 | 東亜建設工業株式会社 | Sea bottom tunnel construction method |
-
1980
- 1980-07-31 JP JP10594280A patent/JPH0245154B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5730959A (en) | 1982-02-19 |
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