JPH0245713B2 - - Google Patents
Info
- Publication number
- JPH0245713B2 JPH0245713B2 JP57232204A JP23220482A JPH0245713B2 JP H0245713 B2 JPH0245713 B2 JP H0245713B2 JP 57232204 A JP57232204 A JP 57232204A JP 23220482 A JP23220482 A JP 23220482A JP H0245713 B2 JPH0245713 B2 JP H0245713B2
- Authority
- JP
- Japan
- Prior art keywords
- hydrochloric acid
- etching solution
- hydrogen peroxide
- etching
- acid concentration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/46—Regeneration of etching compositions
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
Description
【発明の詳細な説明】
本発明は、塩化銅水溶液によるエツチング液
(以下、単にこれを「エツチング液」という)の
能力維持管理法およびそのための装置の新規な提
案に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a novel method for maintaining and managing the capacity of an etching solution (hereinafter simply referred to as "etching solution") using an aqueous copper chloride solution and an apparatus therefor.
プリント配線板などの作成においては、配線部
以外の不要部の銅箔を溶融除去する、いわゆるエ
ツチング作業が行なわれるが、このためのエツチ
ング装置は、エツチング液を循環させながら繰返
し使用するようになつており、エツチング処理量
に比例して、エツチング液には、被処理材(プリ
ント配線板)から銅が溶解混入してその量を増し
て行く。 In the production of printed wiring boards, etc., so-called etching is performed to melt and remove copper foil from unnecessary areas other than wiring areas, and the etching equipment used for this process has come to be used repeatedly while circulating the etching solution. Copper from the material to be processed (printed wiring board) is dissolved into the etching solution and increases in proportion to the amount of etching.
そして、この銅がエツチング液中に増えるにし
たがつて、エツチング液には、次の化学反応式に
より塩化第1銅が生じることになる。 As this copper increases in the etching solution, cuprous chloride is produced in the etching solution according to the following chemical reaction formula.
CuCl2+Cu→Cu2Cl2(2CuCl)
このようにして生じた塩化第一銅は水に不溶で
あり、このためエツチング処理面に付着して被膜
を形成し、エツチング速度を低下せしめる。 CuCl 2 +Cu→Cu 2 Cl 2 (2CuCl) The cuprous chloride thus produced is insoluble in water and therefore adheres to the etched surface to form a film, reducing the etching rate.
そこで、エツチング液の主剤である塩化第二銅
に、補助剤として塩酸を加えることにより、塩化
第一銅による被膜の除去を図るようにしており、
このことは次の化学反応式で表わされる。 Therefore, by adding hydrochloric acid as an auxiliary agent to cupric chloride, which is the main ingredient of the etching solution, the coating caused by cuprous chloride is removed.
This is expressed by the following chemical reaction formula.
CuCl2+2HCl→2HCuCl2(2HCl・CuCl)
2HCuCl2(2HCl・CuCl)は水に可溶であり、
塩化第一銅による被膜を除去する点においての所
期の目的は達成される訳であるが、このままで
は、エツチング能力を持たないから、エツチング
液に酸化剤をくわえることにより、2HCuCl2
(2HCl・CuCl)を酸化させて塩化第二銅に戻し、
エツチング能力を望ましい水準に回復させる手続
き、すなわちエツチング液の再生が行われてい
る。CuCl 2 +2HCl→2HCuCl 2 (2HCl・CuCl) 2HCuCl 2 (2HCl・CuCl) is soluble in water,
Although the intended purpose of removing the cuprous chloride film was achieved, it did not have etching ability as it was, so by adding an oxidizing agent to the etching solution, 2HCuCl 2
(2HCl・CuCl) is oxidized and returned to cupric chloride,
A procedure to restore the etching capacity to the desired level, ie, regeneration of the etching solution, is being carried out.
この再生式は次の通りである。 The regeneration formula is as follows.
2HCuCl2+1/2O2→2CuCl2+H2O
以上の事実から、エツチング液の循環使用によ
り生じる塩化第一銅に起因するエツチング液の能
力低下(エツチング液の疲労)を回避させ、エツ
チング能力を望ましい水準に維持させるための不
可欠な要素は、塩化第一銅の被膜を除去するため
の塩酸と、2HCuCl2の酸化剤としての過酸化水素
の、エツチング液使用中における適時かつ適量の
補充であることが理解される。 2HCuCl 2 +1/2O 2 →2CuCl 2 +H 2 O From the above facts, it is possible to avoid the decrease in the performance of the etching solution (fatigue of the etching solution) caused by cuprous chloride that occurs when the etching solution is used repeatedly, and to improve the etching performance. An essential element to maintain this level is the timely and adequate replenishment of hydrochloric acid to remove the cuprous chloride coating and hydrogen peroxide as the oxidizing agent for 2HCuCl 2 during use of the etching solution. is understood.
このことは、言い替えれば、エツチング液使用
中、エツチング液中の塩酸と過酸化水素とを所要
の量に維持せしめることが、エツチング液の能力
を望ましい水準に維持せしめることになるという
ことに他ならない。 In other words, maintaining the required amounts of hydrochloric acid and hydrogen peroxide in the etching solution while using the etching solution will maintain the performance of the etching solution at the desired level. .
ところで、これまでの主要な2要素について、
エツチング液使用中に補充する手段(エツチング
液の再生手段)については種々提案されている。 By the way, regarding the two main elements so far,
Various methods have been proposed for replenishing the etching solution while it is in use (etching solution regeneration means).
ところが、エツチング液の、この2要素のうち
で、揮発性を有しており、エツチング処理作業に
よる消耗と蒸発によるロスが加わり、量的変動要
素が高く管理が容易でなく、それ故量的管理が特
に重要である塩酸について、どれだけ存在するか
を、エツチング液使用中に直接的かつ継続的に検
出し、その検出値にもとずいて、これらを補充す
るという提案は、現在まで皆無である。 However, out of these two elements of the etching solution, it is volatile, and there is loss due to consumption and evaporation due to etching processing operations, and quantitative fluctuations are high, making it difficult to manage. To date, there has been no proposal to directly and continuously detect the amount of hydrochloric acid present during use of the etching solution, and to replenish it based on the detected value. be.
このことは、とりも直さず、エツチング液の能
力維持の厳格性を決定的に損なうものであり、高
い目的の達成は到底覚束無いことを側面から証明
するものである。 This seriously undermines the strictness of maintaining the performance of the etching solution, and proves that there is no hope of achieving this high goal.
本発明は以上の事実に鑑み提案に及んだもの
で、エツチング液中の塩酸の含有割合を、エツチ
ング液使用中、直接的かつ継続的に検出し、この
検出値にもとずき、エツチング液中の塩酸濃度を
望ましい範囲に維持せしめるべく、その補充量を
制御して補充すること、ならびに、この塩酸の補
充量から化学反応理論により相対的に得られる量
比の過酸化水素を補充することにより、エツチン
グ液の能力を、エツチング液使用中望ましい水準
に維持せしめること、を要旨とするものであつ
て、以下に一実施例を示した添付図面をもとに本
発明を詳述する。 The present invention has been proposed in view of the above facts, and involves directly and continuously detecting the content of hydrochloric acid in the etching solution while the etching solution is being used, and based on this detected value, etching is performed. In order to maintain the concentration of hydrochloric acid in the solution within a desired range, the amount of replenishment is controlled and replenished, and hydrogen peroxide is replenished in a proportion that can be obtained relatively from the replenishment amount of hydrochloric acid based on chemical reaction theory. The purpose of the present invention is to maintain the performance of an etching solution at a desired level during use of the etching solution.
図は本発明装置の概略説明図であつて、1は、
エツチング液100が収容されたエツチング液槽
であつて、この液槽1に収容されたエツチング液
100は、ポンプ2およびパイプ3aを介して循
環使用されるようになつている。すなわち、ポン
プ2によりパイプ3aに導かれたエツチング液1
00は、ノズル4から被処理材(図示せず)にむ
けて噴射され、被処理材から滑り落ちた液が再び
下方に収容されているエツチング液に混入するよ
うになつている。 The figure is a schematic explanatory diagram of the device of the present invention, and 1 is a
The etching liquid tank 1 contains an etching liquid 100, and the etching liquid 100 contained in the liquid tank 1 is circulated through a pump 2 and a pipe 3a. That is, the etching liquid 1 introduced into the pipe 3a by the pump 2
00 is sprayed from a nozzle 4 toward a material to be processed (not shown), and the liquid that has slipped from the material to be processed is mixed into the etching solution stored below again.
上記のごとくして、パイプ3aにみちびかれた
エツチング液100の一部は、さらにパイプ3b
を介して塩酸濃度検出具5が浸漬された塩酸濃度
検出用槽50に導かれ、そこで塩酸濃度を検出し
終えたエツチング液100は、パイプ3cを介し
て、再びエツチング液100に戻るようになつて
いる。 As described above, a part of the etching liquid 100 led to the pipe 3a is further transferred to the pipe 3b.
The etching solution 100 is led to the hydrochloric acid concentration detection tank 50 in which the hydrochloric acid concentration detection tool 5 is immersed, and the etching solution 100 whose hydrochloric acid concentration has been detected there returns to the etching solution 100 again via the pipe 3c. ing.
塩酸濃度検出具5にはモル・コントローラー6
が電気的に連結されており、したがつて、塩酸濃
度検出具5により継続的に得られる使用中のエツ
チング液100の塩酸濃度に係る情報は、絶え間
なくモル・コントローラー6に伝えられる。 The molar controller 6 is attached to the hydrochloric acid concentration detector 5.
are electrically connected to each other, and therefore, information regarding the hydrochloric acid concentration of the etching solution 100 in use, which is continuously obtained by the hydrochloric acid concentration detector 5, is continuously transmitted to the molar controller 6.
そして、このモル・コントローラー6には定量
ポンプ7が電気的に連結されており、定量ポンプ
7は、モル・コントローラー6の作動指令にもと
ずき起動をなすもので、而して、この定量ポンプ
7が作動を得ると、塩酸収容槽8に収容された塩
酸80は、パイプ9を介してエツチング液100
に一定量補充される。 A metering pump 7 is electrically connected to this molar controller 6, and the metering pump 7 is activated based on the operation command of the molar controller 6. When the pump 7 is activated, the hydrochloric acid 80 contained in the hydrochloric acid storage tank 8 is transferred to the etching liquid 100 through the pipe 9.
A certain amount will be replenished.
そしてさらに、上記定量ポンプ7には、制御器
10を介してポンプ11が連結されており、この
ポンプ11の作動量は、制御器10をもつて、ポ
ンプ7の作動量に対して、前述の化学反応理論に
より得られる塩酸80の補充量に対する過酸化水
素の量比に相応する量の作動量が得られるように
制御してあるから、上記塩酸80の補充に連動し
て、過酸化水素収容槽12に収容された過酸化水
素120は、化学反応理論で得られる塩酸80と
の量比に相応する量が、パイプ13を介して補充
される。 Furthermore, a pump 11 is connected to the metering pump 7 via a controller 10, and the amount of operation of this pump 11 is controlled by the controller 10 with respect to the amount of operation of the pump 7 as described above. Since it is controlled so that the amount of operation corresponds to the amount ratio of hydrogen peroxide to the replenishment amount of hydrochloric acid 80 obtained by chemical reaction theory, hydrogen peroxide storage is performed in conjunction with the replenishment of hydrochloric acid 80. Hydrogen peroxide 120 contained in tank 12 is replenished via pipe 13 in an amount corresponding to the ratio of hydrogen peroxide 120 to hydrochloric acid 80 obtained by chemical reaction theory.
以上の如くであるから、使用中のエツチング液
の塩酸の濃度は、塩酸濃度検出具5により常時検
出され、その結果は、ただちにモル・コントロー
ラー6に送られ、このモル・コントローラー6の
指令により、塩酸80がエツチング液100に所
要量補充されると同時に、塩酸80の補充量との
所要の量比の過酸化水素120がエツチング液1
00に補充されるもので、本発明によれば、物理
的数値にもとずいた塩酸の迅速・的確な補充と、
理論的必然性のある過酸化水素の迅速・的確な補
充が同時になされるもので、従来法のごとき、こ
れらの補充のための根拠のあい昧さを一切排除し
たもので、抜群の作用効果が得られる画期的発明
である。 As described above, the concentration of hydrochloric acid in the etching solution in use is constantly detected by the hydrochloric acid concentration detector 5, and the results are immediately sent to the molar controller 6, and according to the commands of the molar controller 6, At the same time, the required amount of hydrochloric acid 80 is replenished into the etching solution 100, and at the same time, hydrogen peroxide 120 is added to the etching solution 100 in the required amount ratio to the replenishment amount of hydrochloric acid 80.
According to the present invention, rapid and accurate replenishment of hydrochloric acid based on physical values,
It simultaneously replenishes hydrogen peroxide quickly and accurately, which is a theoretical necessity, and eliminates all the ambiguity of the basis for replenishment as in conventional methods, resulting in outstanding effects. This is an epoch-making invention.
図は本発明装置の概略説明図である。
符号説明、1……エツチング槽、5……塩酸濃
度検出具、6……モル・コントロール、8……塩
酸収容槽、12……過酸化水素収容槽、50……
塩酸濃度検出用槽。
The figure is a schematic explanatory diagram of the device of the present invention. Description of symbols, 1... Etching tank, 5... Hydrochloric acid concentration detector, 6... Molar control, 8... Hydrochloric acid storage tank, 12... Hydrogen peroxide storage tank, 50...
Tank for detecting hydrochloric acid concentration.
Claims (1)
配し、この検出具から継続的に得られる塩酸濃度
値にもとずき、エツチング液中の酸濃度を0.1モ
ル〜5モルの間に維持すべく、補充量を制御して
塩酸を補充せしめるとともに、化学反応理論にも
とずいた対塩酸の量比の過酸化水素を補充せしめ
ることにより、使用中のエツチング液の能力を所
要の水準に維持せしめることを特徴とするエツチ
ング液の能力維持管理法。 2 エツチング液中に配する塩酸濃度検出具と、
モル・コントローラーと、供給手段を介してエツ
チング液槽に連結された塩酸収容槽同じく過酸化
水素収容槽とを備え、これらを、塩酸濃度検出具
からの塩酸濃度情報にもとずきモル・コントロー
ラーをもつて塩酸供給手段を制御して塩酸収容槽
からエツチング液槽に所要量の塩酸を補充せし
め、同時に化学反応理論にもとずいた対塩酸の量
比の過酸化水素を過酸化水素収容槽からエツチン
グ液槽に補充せしめ得るように連結させ配置せし
めたことを特徴とするエツチング液の能力維持管
理装置。[Claims] 1. A hydrochloric acid concentration detector is placed in the etching solution in use, and based on the hydrochloric acid concentration value continuously obtained from the detector, the acid concentration in the etching solution is determined from 0.1 mol to 0.1 mol. By controlling the amount of replenishment and replenishing hydrochloric acid to maintain the etching concentration between 5 molar and hydrogen peroxide in a ratio of hydrogen peroxide to hydrochloric acid based on chemical reaction theory, A method for maintaining and managing the capacity of an etching solution, which is characterized by maintaining the capacity at a required level. 2. A hydrochloric acid concentration detector placed in the etching solution;
It is equipped with a molar controller, a hydrochloric acid storage tank and a hydrogen peroxide storage tank connected to the etching liquid tank via a supply means, and these are connected to the molar controller based on the hydrochloric acid concentration information from the hydrochloric acid concentration detector. The hydrochloric acid supply means is controlled to replenish the required amount of hydrochloric acid from the hydrochloric acid storage tank to the etching liquid tank, and at the same time, hydrogen peroxide is added to the hydrogen peroxide storage tank in an amount ratio of hydrogen peroxide to hydrochloric acid based on chemical reaction theory. An etching solution capacity maintenance and management device characterized in that the etching solution capacity maintenance and management device is connected and arranged so that the etching solution can be refilled from the etching solution tank.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23220482A JPS59126777A (en) | 1982-12-31 | 1982-12-31 | Method and device for maintaining and controlling effective power of etching solution |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23220482A JPS59126777A (en) | 1982-12-31 | 1982-12-31 | Method and device for maintaining and controlling effective power of etching solution |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59126777A JPS59126777A (en) | 1984-07-21 |
| JPH0245713B2 true JPH0245713B2 (en) | 1990-10-11 |
Family
ID=16935614
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23220482A Granted JPS59126777A (en) | 1982-12-31 | 1982-12-31 | Method and device for maintaining and controlling effective power of etching solution |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59126777A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2780092B2 (en) * | 1987-03-27 | 1998-07-23 | 株式会社 ヤマトヤ商会 | A method for maintaining the capacity of the etching solution |
| JP3597250B2 (en) * | 1995-03-31 | 2004-12-02 | 日本アクア株式会社 | Etching solution regeneration method and etching solution regeneration device |
| JPH1192966A (en) * | 1997-09-22 | 1999-04-06 | Matsushita Electric Ind Co Ltd | Etching solution concentration control device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5536267A (en) * | 1978-09-08 | 1980-03-13 | Mitsubishi Heavy Ind Ltd | Production of phosphate pigment |
-
1982
- 1982-12-31 JP JP23220482A patent/JPS59126777A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59126777A (en) | 1984-07-21 |
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