JPH0248160B2 - - Google Patents
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- Publication number
- JPH0248160B2 JPH0248160B2 JP58163043A JP16304383A JPH0248160B2 JP H0248160 B2 JPH0248160 B2 JP H0248160B2 JP 58163043 A JP58163043 A JP 58163043A JP 16304383 A JP16304383 A JP 16304383A JP H0248160 B2 JPH0248160 B2 JP H0248160B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- negative pressure
- suction
- parts
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Container Filling Or Packaging Operations (AREA)
- Auxiliary Devices For And Details Of Packaging Control (AREA)
Description
【発明の詳細な説明】
この発明は、チツプ部品の検査・計数装置に係
り、特に、チツプ抵抗器等のチツプ部品の良品、
不良品を検査した後、それをマガジン等のケーシ
ング手段に収納する際の収納個数の計数に好適な
チツプ部品の検査・計数装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a device for inspecting and counting chip parts, and in particular, for inspecting and counting chip parts such as chip resistors.
The present invention relates to a chip component inspection/counting device suitable for counting the number of defective products stored in a casing means such as a magazine after inspecting them.
一般にチツプ抵抗器等のチツプ部品は、例えば
偏平な直方体を成し、その形状が極めて小さく、
配線基板に自動配線等の便宜から自動配線装置に
装着されるマガジンに収納して需要者に向けて出
荷されている。マガジンはチツプ部品の縦、横の
長さを許容する大きさを持つ角筒状の収納空間を
持つており、チツプ部品はその中に重ねて収納さ
れている。そして、その個数は収納の際、人的に
或いは光学的な検知等で計数されている。 Chip components such as chip resistors generally have a flat rectangular parallelepiped shape, which is extremely small.
For the convenience of automatic wiring on wiring boards, they are stored in a magazine attached to an automatic wiring device and shipped to customers. The magazine has a rectangular cylindrical storage space that is large enough to accommodate the vertical and horizontal lengths of the chip components, and the chip components are stored in one layer in the magazine. The number of such items is counted manually or by optical detection, etc., when the items are stored.
第1図は従来のチツプ部品の自動挿入装置を示
している。シユータ2を介して矢印Aの方向から
送られて来るチツプ部品4は、シユータ2の終端
部のワークガイド5まで移送された後、その終端
部に挿入口を臨ませて配置されたマガジン6の内
部に、矢印Bで示すように前後方向に移動するプ
ツシヤ8によつて矢印Cの方向に順次移送されて
収納される。この場合、シユータ2の中途部にス
リツト10を設け、このスリツト10を挟んで光
源12とフアイバセンサ14を配置し、シユータ
2を通過するチツプ部品4でフアイバセンサ14
に到達する光が遮られるようにしてチツプ部品4
の通過を検出している。そして、マガジン6の内
部へ収納されるチツプ部品4の計数は、プツシヤ
8の作動を検出して行われ、その作動回数をその
計数値としていた。 FIG. 1 shows a conventional automatic chip component insertion device. Chip parts 4 sent from the direction of arrow A through the shooter 2 are transferred to the work guide 5 at the end of the shooter 2, and then placed in a magazine 6 arranged with the insertion opening facing the end. The pusher 8, which moves back and forth as shown by arrow B, sequentially transports the materials in the direction of arrow C and stores them therein. In this case, a slit 10 is provided in the middle of the shooter 2, a light source 12 and a fiber sensor 14 are placed across the slit 10, and the chip component 4 passing through the shooter 2 is inserted into the fiber sensor 14.
chip parts 4 so that the light reaching the chip is blocked.
is detecting the passage of. The number of chip parts 4 stored in the magazine 6 is counted by detecting the operation of the pusher 8, and the number of times the pusher 8 is operated is used as the count value.
このため、チツプ部品4の検出箇所を通過した
位置からプツシヤ8の手前の区間でチツプ部品4
が詰つた場合、チツプ部品4が無くてもプツシヤ
8が作動し、その計数が進むことから、マガジン
6の収納個数と計数個数に不一致が生じる不都合
があり、それが発見されない場合には、数量不足
のマガジン6が適正なものとして出荷されるおそ
れがある。 For this reason, the chip component 4 is
If the magazine 6 is clogged, the pusher 8 will operate even if there is no chip part 4, and the counting will proceed.Therefore, there will be a discrepancy between the number of chips stored in the magazine 6 and the number of chips counted. There is a possibility that the missing magazine 6 will be shipped as a proper one.
また、ワークガイド5の位置に落下するタイミ
ングと、プツシヤ8が動作するタイミングがずれ
ると、プツシヤ8でチツプ部品4の破損等を生
じ、不良品がマガジン6に移送されて、それも正
規の個数として計数される不都合がある。 Furthermore, if the timing at which the chip parts 4 fall to the position of the work guide 5 is different from the timing at which the pusher 8 operates, the chip parts 4 may be damaged in the pusher 8, and defective products may be transferred to the magazine 6, even if the number of chips is not the correct number. There is an inconvenience that it is counted as
そこで、この発明は、吸着装置に吸着されて移
送すべきチツプ部品の破損を防止するとともに、
移送されるチツプ部品の計数精度を高めたチツプ
部品の検査・計数装置の提供を目的とする。 Therefore, the present invention prevents damage to the chip parts to be transferred by being picked up by a suction device, and
The purpose of the present invention is to provide a chip parts inspection/counting device with improved counting accuracy of chip parts being transferred.
即ち、この発明のチツプ部品の検査・計数装置
は、部品供給位置(供給フイーダ24)から検査
位置(検査テーブル26)に移送されたチツプ部
品4をその良否の検査後、計数して他の移送位置
(マガジン6)に移送するチツプ部品の検査・計
数装置において、前記検査位置で検査後、前記他
の移送位置に移送すべき前記チツプ部品を吸着す
る吸着装置18と、この吸着装置に負圧源から負
圧−Pを作用させ、吸着すべき前記チツプ部品に
対する吸着力を付与する負圧路28と、この負圧
路に設置されて、前記チツプ部品の吸着の有無に
より前記負圧路に生じる圧力変化を検知し、前記
チツプ部品が前記吸着装置に吸着されたことを表
す部品吸着検知信号を発生する圧力センサ(差圧
センサ36)と、この圧力センサが発生した前記
部品吸着検知信号を用いて前記チツプ部品を計数
する計数装置38とを備えたものである。 That is, the chip component inspection/counting device of the present invention inspects the chip components 4 transferred from the component supply position (supply feeder 24) to the inspection position (inspection table 26) for quality, counts them, and transfers the chip components 4 to other transported locations. In an inspection/counting device for chip parts to be transferred to a position (magazine 6), there is provided a suction device 18 that sucks the chip parts to be transferred to the other transfer position after inspection at the inspection position, and a negative pressure is applied to this suction device. A negative pressure path 28 that applies negative pressure -P from a source to provide suction force to the chip parts to be suctioned; A pressure sensor (differential pressure sensor 36) that detects a pressure change that occurs and generates a component suction detection signal indicating that the chip component has been suctioned by the suction device; The device is equipped with a counting device 38 for counting the number of chip parts.
以下、この発明を図面に示した実施例を参照し
て詳細に説明する。 Hereinafter, the present invention will be described in detail with reference to embodiments shown in the drawings.
第2図はこの発明のチツプ部品の計数装置の実
施例を示し、この計数装置はチツプ部品を移送す
る移送装置に設置されている。即ち、この移送装
置16には、移送すべきチツプ部品4を吸着して
移送する吸着装置18が設置され、この吸着装置
18には一対の吸着ピン20,22が設置されて
いる。吸着ピン20は部品供給位置を成す供給フ
イーダ24のチツプ部品4を隣接する検査テーブ
ル26に移送し、他方の吸着ピン22は検査テー
ブル26に置かれたチツプ部品4を供給フイーダ
24に対して他の部品移送位置を成すマガジン6
に移送するために設置され、これら吸着ピン2
0,22の移動は図示していない制御装置で制御
されるように成つている。検査テーブル26には
図示しない検査端子が設けられており、チツプ部
品4の良否を検査し、不良の場合には図示してい
ない除去装置でそのテーブル26上から排除する
ように成つている。 FIG. 2 shows an embodiment of the chip parts counting device of the present invention, and this counting device is installed in a transfer device for transporting chip parts. That is, this transfer device 16 is equipped with a suction device 18 that sucks and transfers the chip component 4 to be transferred, and this suction device 18 is equipped with a pair of suction pins 20 and 22. The suction pin 20 transfers the chip component 4 of the supply feeder 24 forming the component supply position to the adjacent inspection table 26, and the other suction pin 22 transfers the chip component 4 placed on the inspection table 26 to the supply feeder 24. Magazine 6 which constitutes the parts transfer position of
These suction pins 2
The movements of 0 and 22 are controlled by a control device (not shown). The inspection table 26 is provided with an inspection terminal (not shown) to inspect whether the chip component 4 is good or not, and if it is defective, it is removed from the table 26 by a removal device (not shown).
また、各吸着ピン20,22にはそれぞれに負
圧路28が樹脂ホース等で形成され、各負圧路2
8には一定の負圧−Pを与える負圧源が接続され
ているとともに、負圧の供給を制御する制御弁3
0,32が個別に設置されている。制御弁30,
32は加圧制御装置34によつて一定の時間間隔
で開閉が制御される。 Further, each suction pin 20, 22 has a negative pressure path 28 formed of a resin hose or the like.
8 is connected to a negative pressure source that provides a constant negative pressure -P, and a control valve 3 that controls the supply of negative pressure.
0 and 32 are installed individually. control valve 30,
32 is controlled to open and close at regular intervals by a pressurization control device 34.
そして、吸着ピン22側の負圧路28には、チ
ツプ部品4を吸着した際の圧力変化を表す部品吸
着検知信号を出力する圧力センサとしての差圧セ
ンサ36が設置され、その部品吸着検知信号は計
数装置38に与えられ、吸着装置18が吸着した
チツプ部品4の個数を表す部品吸着検知信号がそ
の出力端子40から取り出されるように成つてい
る。 A differential pressure sensor 36 is installed in the negative pressure path 28 on the suction pin 22 side as a pressure sensor that outputs a component suction detection signal representing a pressure change when the chip component 4 is suctioned. is applied to the counting device 38, and a component suction detection signal representing the number of chip components 4 suctioned by the suction device 18 is taken out from its output terminal 40.
第3図はこの差圧センサ36及び計数装置38
の具体的な回路構成例を示している。即ち、前記
差圧センサ36は圧力変換素子42及び抵抗4
4,46,48で構成されるブリツジ回路で構成
され、一方の端子間には駆動電源50が接続さ
れ、他方の端子間から取出される。この出力は、
増幅器52で増幅された後、可変抵抗54を介し
て再び増幅器56で増幅されて計数回路58に与
えられるように成つている。計数回路58は前記
制御装置34等の関連で演算装置で構成すること
ができる。 Figure 3 shows this differential pressure sensor 36 and counting device 38.
A specific circuit configuration example is shown. That is, the differential pressure sensor 36 includes a pressure conversion element 42 and a resistor 4.
4, 46, and 48, a drive power source 50 is connected between one terminal and taken out from between the other terminals. This output is
After being amplified by an amplifier 52, the signal is amplified again by an amplifier 56 via a variable resistor 54, and then provided to a counting circuit 58. The counting circuit 58 can be constructed from an arithmetic device in conjunction with the control device 34 and the like.
以上の構成に基づきその動作を説明する。差圧
センサ36はチツプ部品4を吸着した場合に生じ
る吸着ピン22側の負圧路28の圧力変化を電気
信号として取出し、その出力は第4図に示すよう
なパルス信号となる。Poは負圧−Pが作用して
もチツプ部品4を吸着していない場合の負圧路2
8の内部圧力、−P(<Po)はチツプ部品4を吸
着した場合のその内部圧力を示し、このような異
なる圧力からチツプ部品4の吸着の有無を検出
し、その圧力変化を表わす部品吸着検知信号を計
数することでチツプ部品4の計数が可能である。 The operation will be explained based on the above configuration. The differential pressure sensor 36 extracts the pressure change in the negative pressure path 28 on the suction pin 22 side when the chip component 4 is suctioned as an electrical signal, and its output becomes a pulse signal as shown in FIG. Po is the negative pressure path 2 when the chip part 4 is not adsorbed even if negative pressure -P acts.
The internal pressure of 8, -P (<Po) indicates the internal pressure when the chip part 4 is suctioned, and the presence or absence of suction of the chip part 4 is detected from such different pressures, and the part suction value representing the pressure change is detected. The number of chip parts 4 can be counted by counting the detection signals.
第5図はチツプ部品4の移送と負圧−Pの作用
タイミングを示している。この場合、連続したチ
ツプ部品4の移送途上を示し、検査テーブル26
には吸着ピン20で移送されたチツプ部品4が置
かれている。Aに示すように、吸着ピン20,2
2は矢印aの方向にチツプ部品4に向かつて下降
し、Bに示すようにチツプ部品4の上面で停止す
る。この時、又はその僅か前から制御装置34は
そのタイミングを検出して制御弁30,32を開
き、負圧路28に負圧−Pを作用させる。この結
果、チツプ部品4は各吸着ピン20,22に吸着
され、矢印bの方向に上昇させる。次に、一定の
高さまで上昇させた吸着ピン20,22は負圧−
Pを作用させつつ、Cに示すように、矢印cの方
向に移動させ、吸着ピン20は検査テーブル2
6、吸着ピン22はマガジン6の上方に位置させ
た後、Dに示すように矢印dの方向に下降させ
る。なお、供給フイーダ24にはチツプ部品4の
移送に伴い次のチツプ部品4が移送されて来る。
次に、Eに示すように、チツプ部品4を検査テー
ブル26の上面、マガジン6の開口部を位置させ
た状態のタイミングで制御弁30,32を閉じ、
負圧−Pを解除する。各チツプ部品4は吸着ピン
20,22から離れ、検査テーブル26に載置さ
れる一方、マガジン6の内部に収納され、吸着ピ
ン20,22は矢印eの方向に移動する。次に、
各吸着ピン20,22は、Fに示すように、矢印
fの方向に移動し、マガジン6にはチツプ部品4
が矢印gの方向に落下し、吸着ピン20,22は
Aに示す位置に復帰する。検査テーブル26上の
チツプ部品4は、吸着ピン22が来るまでの時間
内において、検査が行われる。 FIG. 5 shows the transfer of the chip part 4 and the timing of application of the negative pressure -P. In this case, it shows that the continuous chip parts 4 are being transferred, and the inspection table 26
A chip component 4 transferred by a suction pin 20 is placed. As shown in A, the suction pins 20, 2
2 descends toward the chip part 4 in the direction of arrow a, and stops on the upper surface of the chip part 4 as shown in B. At this time, or slightly before that time, the control device 34 detects the timing, opens the control valves 30 and 32, and applies negative pressure -P to the negative pressure path 28. As a result, the chip component 4 is sucked by each suction pin 20, 22 and raised in the direction of arrow b. Next, the suction pins 20 and 22 raised to a certain height are subjected to negative pressure.
While applying P, the suction pin 20 is moved in the direction of arrow c as shown in C, and the suction pin 20 is attached to the inspection table 2.
6. After the suction pin 22 is positioned above the magazine 6, it is lowered in the direction of arrow d as shown in D. Incidentally, as the chip component 4 is transferred, the next chip component 4 is transferred to the supply feeder 24.
Next, as shown in E, the control valves 30 and 32 are closed at the timing when the chip component 4 is placed on the top surface of the inspection table 26 and the opening of the magazine 6 is positioned.
Release negative pressure -P. Each chip component 4 is separated from the suction pins 20, 22 and placed on the inspection table 26, while being stored inside the magazine 6, and the suction pins 20, 22 move in the direction of arrow e. next,
Each suction pin 20, 22 moves in the direction of arrow f, as shown in F, and the magazine 6 has chip parts 4.
falls in the direction of arrow g, and the suction pins 20 and 22 return to the positions shown at A. The chip parts 4 on the inspection table 26 are inspected within the time until the suction pins 22 arrive.
このようにチツプ部品4の移送に伴う負圧−P
の作用区間が一定し、且つ負圧−Pが作用しても
チツプ部品4が吸着されない場合には、負圧路2
8の圧力変化が小さいことから、チツプ部品4の
移送の有無、即ちマガジン6への収納を検知する
ことができ、信頼性の高い計数ができる。特に、
移送手段が従来のものと異なつているため、チツ
プ部品4を移送途上で破損する等の不都合がな
く、破損したチツプ部品を正規のものとして計数
する等の不都合も解消することができる。 In this way, the negative pressure -P accompanying the transfer of the chip parts 4
If the working section of the negative pressure path 2 is constant and the chip part 4 is not attracted even if the negative pressure -P acts, the negative pressure path 2
Since the pressure change at 8 is small, it is possible to detect whether or not the chip component 4 is being transferred, that is, whether it is being stored in the magazine 6, and highly reliable counting can be performed. especially,
Since the transfer means is different from the conventional one, there is no inconvenience such as the chip parts 4 being damaged during the transfer, and it is also possible to eliminate the inconvenience of counting damaged chip parts as genuine ones.
実験によれば、第1図に示す従来技術では、
200個に対し、1ないし2個の不足が60ないし70
%を占めていたのに対し、この発明の実施例で
は、1個不足のものが0.5ないし1%以下に改善
された。 According to experiments, the conventional technology shown in FIG.
200 pieces, 1 or 2 pieces missing is 60 or 70
However, in the embodiments of the present invention, the deficiency of one element was improved to less than 0.5 to 1%.
なお、実施例では移送、計数されるものをチツ
プ部品4として説明したが、このチツプ部品4に
はチツプ抵抗器の他、トランジスタ、コンデンサ
等も含まれ、この発明は一定の形状を持つ小物体
の移送、計数にも利用することができる。 In addition, in the embodiment, the thing to be transferred and counted is explained as a chip part 4, but this chip part 4 includes not only a chip resistor but also a transistor, a capacitor, etc., and this invention is applicable to small objects having a certain shape. It can also be used for transporting and counting.
また、実施例ではチツプ部品のマガジンへの収
納を例に取つて説明したが、この発明は移送すべ
きチツプ部品をその移送に伴つて計数しており、
マガジンへの収納に限定されるものではない。 Furthermore, although the embodiment has been described by taking the example of storing chip parts in a magazine, the present invention counts the number of chip parts to be transferred as they are transferred.
It is not limited to storage in a magazine.
以上説明したように、この発明によれば、部品
供給位置から検査位置に移送されたチツプ部品を
その良否の検査後、吸着装置で吸着させて他の移
送位置に移送するとともに、吸着装置に負圧源か
ら負圧を作用させる負圧路に設置した圧力センサ
を以て、チツプ部品の吸着の有無により負圧路に
生じる圧力変化を検知し、その圧力センサに得ら
れた部品吸着検知信号を用いてチツプ部品を計数
するようにしたので、チツプ部品の破損を生じる
ことなくチツプ部品の移送を行うことができると
ともに、検査後のチツプ部品の計数精度を高める
ことができる。 As explained above, according to the present invention, after inspecting the chip parts transferred from the parts supply position to the inspection position, the chip parts are sucked by the suction device and transferred to another transfer position. A pressure sensor installed in a negative pressure path that applies negative pressure from a pressure source is used to detect pressure changes that occur in the negative pressure path depending on whether or not a chip component is attracted, and the component suction detection signal obtained by the pressure sensor is used to detect the change in pressure. Since the chip parts are counted, the chip parts can be transferred without damaging the chip parts, and the accuracy of counting the chip parts after inspection can be improved.
第1図は従来のチツプ部品の自動挿入装置を示
す説明図、第2図はこの発明のチツプ部品の計数
装置の実施例を示す説明図、第3図は差圧センサ
及び計数装置の具体的な回路構成例を示すブロツ
ク図、第4図はその検出出力の波形を示す説明
図、第5図はチツプ部品の移送を示す説明図であ
る。
4…チツプ部品、6…マガジン(他の移送位
置)、18…吸着装置、24…供給フイーダ(部
品供給位置)、26…検査テーブル(検査位置)、
28…負圧路、36…差圧センサ(圧力センサ)、
38…計数装置、−P…負圧。
FIG. 1 is an explanatory diagram showing a conventional automatic chip component insertion device, FIG. 2 is an explanatory diagram showing an embodiment of a chip component counting device of the present invention, and FIG. 3 is a specific diagram of a differential pressure sensor and a counting device. FIG. 4 is an explanatory diagram showing the waveform of the detection output, and FIG. 5 is an explanatory diagram showing the transfer of chip parts. 4... Chip parts, 6... Magazine (other transfer position), 18... Suction device, 24... Supply feeder (components supply position), 26... Inspection table (inspection position),
28... Negative pressure path, 36... Differential pressure sensor (pressure sensor),
38... Counting device, -P... Negative pressure.
Claims (1)
プ部品をその良否の検査後、計数して他の移送位
置に移送するチツプ部品の検査・計数装置におい
て、 前記検査位置で検査後、前記他の移送位置に移
送すべき前記チツプ部品を吸着する吸着装置と、 この吸着装置に負圧源から負圧を作用させ、吸
着すべき前記チツプ部品に対する吸着力を付与す
る負圧路と、 この負圧路に設置されて、前記チツプ部品の吸
着の有無により前記負圧路に生じる圧力変化を検
知し、前記チツプ部品が前記吸着装置に吸着され
たことを表す部品吸着検知信号を発生する圧力セ
ンサと、 この圧力センサが発生した前記部品吸着検知信
号を用いて前記チツプ部品を計数する計数装置
と、 を備えたことを特徴とするチツプ部品の検査・計
数装置。[Scope of Claims] 1. In a chip parts inspection/counting device that inspects chip parts transferred from a parts supply position to an inspection position, counts them, and transfers them to another transfer position after inspecting the chip parts, comprising: inspecting at the inspection position; and a suction device for suctioning the chip parts to be transferred to the other transfer position, and a negative pressure path for applying negative pressure from a negative pressure source to the suction device to apply suction force to the chip parts to be suctioned. and is installed in this negative pressure path, detects pressure changes occurring in the negative pressure path depending on whether or not the chip component is suctioned, and generates a component suction detection signal indicating that the chip component is suctioned by the suction device. A device for inspecting and counting chip components, comprising: a pressure sensor that generates pressure; and a counting device that counts the chip components using the component suction detection signal generated by the pressure sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16304383A JPS6054499A (en) | 1983-09-04 | 1983-09-04 | Counter of chip parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16304383A JPS6054499A (en) | 1983-09-04 | 1983-09-04 | Counter of chip parts |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6054499A JPS6054499A (en) | 1985-03-28 |
| JPH0248160B2 true JPH0248160B2 (en) | 1990-10-24 |
Family
ID=15766094
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16304383A Granted JPS6054499A (en) | 1983-09-04 | 1983-09-04 | Counter of chip parts |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6054499A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0744360B2 (en) * | 1990-08-31 | 1995-05-15 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Absence detection device and monitor on vacuum pickup device and device for monitoring assembly of components |
| JP4509542B2 (en) * | 2003-11-25 | 2010-07-21 | アサヒビール株式会社 | Sorting device and evacuation device |
| CN109878837A (en) * | 2019-04-03 | 2019-06-14 | 安徽盼盼食品有限公司 | A kind of dry clip loading system of soft waffle |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5240303Y2 (en) * | 1972-04-24 | 1977-09-12 | ||
| JPS56122724A (en) * | 1980-02-25 | 1981-09-26 | Sanyo Electric Co Ltd | Goods conveyor |
-
1983
- 1983-09-04 JP JP16304383A patent/JPS6054499A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6054499A (en) | 1985-03-28 |
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