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JPH0250985B2 - - Google Patents
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JPH0250985B2 - - Google Patents

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Publication number
JPH0250985B2
JPH0250985B2 JP12271785A JP12271785A JPH0250985B2 JP H0250985 B2 JPH0250985 B2 JP H0250985B2 JP 12271785 A JP12271785 A JP 12271785A JP 12271785 A JP12271785 A JP 12271785A JP H0250985 B2 JPH0250985 B2 JP H0250985B2
Authority
JP
Japan
Prior art keywords
ultrafine particle
film
chamber
film forming
particle beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12271785A
Other languages
Japanese (ja)
Other versions
JPS61281866A (en
Inventor
Tosha Ichihashi
Sumio Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shingijutsu Kaihatsu Jigyodan
Original Assignee
Shingijutsu Kaihatsu Jigyodan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shingijutsu Kaihatsu Jigyodan filed Critical Shingijutsu Kaihatsu Jigyodan
Priority to JP12271785A priority Critical patent/JPS61281866A/en
Publication of JPS61281866A publication Critical patent/JPS61281866A/en
Publication of JPH0250985B2 publication Critical patent/JPH0250985B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】[Detailed description of the invention]

(産業上の利用分野) 本発明は、超微粒子ビームを用いた基板上への
膜形成法及び装置に関するものである。 (従来技術) 従来の基板上への膜形成法は、主に真空蒸着に
よるものであり、成膜速度が遅く、これを上げる
には、高電圧電子ビーム等の高出力の装置を必要
とした。また、蒸発原子を有効に利用するために
は、大容量の容器を必要とし、かつ、膜質を制御
するためには基板の加熱以外に方法がなく、膜質
の制御は難しいものであつた。 (発明が解決しようとする問題点) 本発明は、これら従来の膜形成法の欠点であ
る、成膜速度が遅いこと、高出力装置を必要とす
ること、膜質制御が困難なこと等を解決するため
に、ガス中蒸発法による超微粒子を用いて、迅速
に、低出力で、膜を形成し、かつ、その膜質を制
御する方法と装置を提供することを目的とする。 (問題点を解決するための手段) 本発明の超微粒子ビームを用いた膜形成法は、
膜形成物質をガス中で蒸発させて超微粒子を生成
し、圧力差により生成した超微粒子をノズルを通
して真空容器中へ吹き出し、真空容器内を飛行中
の超微粒子ビームを加熱し、その後膜形成基板へ
付着させて膜を形成する膜形成法である。 膜形成物質の蒸発は加熱によつて行うことが好
適である。 また、真空容器内を飛行中の超微粒子ビームの
加熱は輻射加熱によることが好ましい。 真空容器内を飛行中の超微粒子ビームの加熱温
度、加熱時間、超微粒子を真空容器中へノズルを
通して吹き出す時の圧力差等の膜形成条件を調節
することにより、膜の結晶構造、密度、電気抵
抗、基板への密着等の膜質を制御するのが都合が
よい。 本発明の超微粒子ビームを用いた膜形成装置
は、超微粒子生成室、超微粒子生成室と微小孔ノ
ズルを通して連通している膜形成室、微小孔ノズ
ルの出口近辺に設けられた加熱部、及び、超微粒
子生成室、膜形成室それぞれに連結している圧力
差発生装置から構成されている。 超微粒子生成室と膜形成室の間に圧力差発生装
置に連結している差圧室を設けることが望まし
い。 圧力差発生装置は、超微粒子生成室、差圧室、
膜形成室それぞれに連結している排気系と超微粒
子生成室に連結しているガス供給系とからなつて
いるのが好都合である。 また、加熱部として輻射加熱装置を用いると都
合がよい。 (実施例) 以下、本発明の超微粒子ビームを用いた膜形成
法とそのための装置を、第1図を参照にしながら
詳しく説明する。 本発明の超微粒子ビームを用いた膜形成装置
は、主として、超微粒子生成室1、超微粒子生成
室1と微小孔ノズル15を通して連通している差
圧室2、差圧室2と加熱部16を通して連通して
いる膜形成室3、及び、これら超微粒子生成室
1、差圧室2、膜形成室3それぞれに連結してい
る排気系(後述)と超微粒子生成室1に連結して
いるガス供給系(後述)とからなる圧力差発生装
置、から構成されている。微小孔ノズル15と加
熱部16とは整列しているのが望ましい。なお、
差圧室2を省略して、微小孔ノズル15の出口近
辺に加熱部16を設けてもよい。 まず、超微粒子生成室1、差圧室2、膜形成室
3それぞれの内部を、これらそれぞれに連結して
いるロータリーポンプ4,5,6、及び、超微粒
子生成室1、膜形成室3に連結している油拡散ポ
ンプ7,8によつて、5×10-6Torr程度までに
真空排気する。真空排気後、超微粒子生成室1と
ポンプ4,7を結ぶバルブ9を閉め、この生成室
1とガスボンベ11の間のバルブ10を開けて、
ガスボンベ11より不活性ガス(アルゴンあるい
はヘリウム)を生成室1内へ流し込む。この際、
差圧室2、膜形成室3は、それぞれ、メカニカル
ブースタポンプ12とロータリーポンプ5、油拡
散ポンプ8とロータリー6によつて排気し、超微
粒子生成室1と差圧室2、膜形成室3との間に圧
力差を生じさせる。この時、所定の圧力差になる
ように、バルブ10により不活性ガスの流量を調
節する。 所定の圧力となると、超微粒子生成室1内に設
けてあるタングステンあるいはタンタル等の高融
点金属のボート13に通電し、ボート13上の金
属塊14を加熱して蒸発させ、超微粒子Aを生成
する。この際、金属塊14の加熱法は、前記の高
融点金属の抵抗加熱法に限らず、アーク放電、レ
ーザ、電子ビーム、高周波等による加熱であつて
もよい。 生成した超微粒子Aは、ガス圧差により、微小
孔ノズル15へと集中して吸い込まれ、差圧室2
を通り、膜形成室3に設けられた加熱部16を通
過する。この際、加熱部16の輻射によつて、超
微粒子は高温になる。この実施例の場合、加熱部
16は、アルミナ管にタングステン線を巻いて構
成したもので、タングステン線に通電することに
よつて抵抗加熱が行われる。なお、加熱部は抵抗
加熱に限らず、赤外光等の輻射加熱であつてもよ
い。 加熱部16を通過後、超微粒子Bは膜形成室3
に取付けられた基板17に付着し、膜を形成す
る。このように、ガス中蒸発法で生成した超微粒
子を微小孔ノズルへと吸い込み、基板上に集中す
ることで、優れた成膜速度が得られ、かつ、加熱
部16の長さ、太さ、加熱温度、加熱時間、超微
粒子生成室1、差圧室2、膜形成室3の圧力等の
膜形成条件を調節することにより、膜の結晶構
造、密度、電気抵抗、基板への密着度等の膜質を
制御することができる。 本発明によつて形成した膜の成膜速度と、現在
工業的に利用されている高出力の電子ビームによ
る真空蒸着法の成膜速度との比較を次表に示す。
(Industrial Application Field) The present invention relates to a method and apparatus for forming a film on a substrate using an ultrafine particle beam. (Prior art) Conventional methods for forming films on substrates are mainly based on vacuum evaporation, which has a slow film formation rate, and to increase this speed, high-power equipment such as a high-voltage electron beam is required. . Furthermore, in order to effectively utilize the evaporated atoms, a large-capacity container is required, and the only way to control the film quality is to heat the substrate, making it difficult to control the film quality. (Problems to be Solved by the Invention) The present invention solves the disadvantages of these conventional film forming methods, such as slow film forming speed, need for high output equipment, and difficulty in controlling film quality. In order to achieve this goal, the present invention aims to provide a method and apparatus for forming a film quickly and with low output using ultrafine particles by evaporation in a gas, and controlling the quality of the film. (Means for solving the problem) The film forming method using an ultrafine particle beam of the present invention is as follows:
The film-forming substance is evaporated in a gas to generate ultrafine particles, the generated ultrafine particles are blown out through a nozzle into a vacuum container by the pressure difference, the ultrafine particle beam flying inside the vacuum container is heated, and then the film-forming substrate is heated. This is a film forming method in which a film is formed by adhering to the surface. It is preferable to evaporate the film-forming substance by heating. Furthermore, it is preferable that the ultrafine particle beam be heated by radiation heating while it is flying within the vacuum container. By adjusting the film formation conditions such as the heating temperature and heating time of the ultrafine particle beam while it is flying in the vacuum container, and the pressure difference when the ultrafine particles are blown out through the nozzle into the vacuum container, we can improve the crystal structure, density, and electrical properties of the film. It is convenient to control film properties such as resistance and adhesion to the substrate. A film forming apparatus using an ultrafine particle beam according to the present invention includes an ultrafine particle generation chamber, a film formation chamber communicating with the ultrafine particle generation chamber through a micropore nozzle, a heating section provided near the exit of the micropore nozzle, and , an ultrafine particle generation chamber, and a pressure difference generation device connected to each of the film formation chamber. It is desirable to provide a differential pressure chamber connected to a pressure differential generator between the ultrafine particle generation chamber and the film formation chamber. The pressure difference generator includes an ultrafine particle generation chamber, a differential pressure chamber,
Advantageously, it consists of an exhaust system connected to each of the film formation chambers and a gas supply system connected to the ultrafine particle generation chamber. Further, it is convenient to use a radiation heating device as the heating section. (Example) Hereinafter, a film forming method using an ultrafine particle beam of the present invention and an apparatus therefor will be explained in detail with reference to FIG. The film forming apparatus using an ultrafine particle beam of the present invention mainly consists of an ultrafine particle generation chamber 1, a differential pressure chamber 2 communicating with the ultrafine particle generation chamber 1 through a microhole nozzle 15, and a heating section 16 between the differential pressure chamber 2 and a heating section 16. The ultrafine particle generation chamber 1, the differential pressure chamber 2, and the film formation chamber 3 are connected to an exhaust system (described later) connected to the ultrafine particle generation chamber 1, the differential pressure chamber 2, and the film formation chamber 3, respectively. It consists of a pressure difference generating device consisting of a gas supply system (described later). It is desirable that the microhole nozzle 15 and the heating section 16 are aligned. In addition,
The differential pressure chamber 2 may be omitted and the heating section 16 may be provided near the outlet of the microhole nozzle 15. First, the inside of the ultrafine particle generation chamber 1, the differential pressure chamber 2, and the film formation chamber 3 are connected to the rotary pumps 4, 5, and 6, which are connected to the ultrafine particle generation chamber 1, and the film formation chamber 3, respectively. The vacuum is evacuated to about 5×10 -6 Torr using the connected oil diffusion pumps 7 and 8. After evacuation, the valve 9 connecting the ultrafine particle generation chamber 1 and the pumps 4 and 7 is closed, and the valve 10 between the generation chamber 1 and the gas cylinder 11 is opened.
Inert gas (argon or helium) is flowed into the generation chamber 1 from the gas cylinder 11. On this occasion,
The differential pressure chamber 2 and the film forming chamber 3 are evacuated by a mechanical booster pump 12, a rotary pump 5, an oil diffusion pump 8 and a rotary 6, respectively. A pressure difference is created between the two. At this time, the flow rate of the inert gas is adjusted by the valve 10 so that a predetermined pressure difference is achieved. When a predetermined pressure is reached, electricity is applied to a boat 13 made of high melting point metal such as tungsten or tantalum provided in the ultrafine particle generation chamber 1, and the metal lump 14 on the boat 13 is heated and evaporated to generate ultrafine particles A. do. At this time, the method of heating the metal lump 14 is not limited to the above-mentioned resistance heating method for high-melting point metals, but may also be heating using arc discharge, laser, electron beam, high frequency, or the like. The generated ultrafine particles A are concentrated and sucked into the microhole nozzle 15 due to the gas pressure difference, and are sucked into the differential pressure chamber 2.
and passes through a heating section 16 provided in the film forming chamber 3. At this time, the ultrafine particles become high in temperature due to radiation from the heating section 16. In the case of this embodiment, the heating section 16 is constructed by winding a tungsten wire around an alumina tube, and resistance heating is performed by applying electricity to the tungsten wire. Note that the heating section is not limited to resistance heating, and may be radiant heating such as infrared light. After passing through the heating section 16, the ultrafine particles B enter the film forming chamber 3.
It adheres to the substrate 17 attached to the substrate 17 to form a film. In this way, by sucking the ultrafine particles generated by the in-gas evaporation method into the microhole nozzle and concentrating them on the substrate, an excellent film formation rate can be obtained, and the length and thickness of the heating section 16 can be adjusted. By adjusting film formation conditions such as heating temperature, heating time, and pressure in ultrafine particle generation chamber 1, differential pressure chamber 2, and film formation chamber 3, the crystal structure, density, electrical resistance, degree of adhesion to the substrate, etc. of the film can be adjusted. The film quality can be controlled. The following table shows a comparison between the deposition rate of the film formed according to the present invention and the deposition rate of the vacuum evaporation method using a high-power electron beam, which is currently used industrially.

【表】 さらに、本発明によつて形成した銀超微粒子に
よる薄膜の走査型電子顕微鏡写真を第2図に示
す。aは飛行中に加熱したものの膜であり、bは
比較のための加熱をしないで形成した膜である。
これらa,bを比較すると、飛行中の加熱によ
り、緻密な膜が形成されることがわかる。 (発明の効果) 上記の実施例の説明から明らかなように、本発
明の超微粒子ビームを用いた膜形成法及び装置に
よると、簡単な構造の低出力装置により優れた成
膜速度で良質の膜を形成することができ、かつ、
簡単な操作で、膜の結晶構造、密度、電気抵抗、
基板への密着度等の膜質を制御することができ
る。
[Table] Further, FIG. 2 shows a scanning electron micrograph of a thin film made of ultrafine silver particles formed according to the present invention. A is a film that was heated during flight, and b is a film that was formed without heating for comparison.
Comparing these a and b, it can be seen that a dense film is formed due to heating during flight. (Effects of the Invention) As is clear from the description of the above embodiments, the film forming method and device using an ultrafine particle beam of the present invention can achieve excellent film formation speed and high quality using a simple structure and low output device. capable of forming a film, and
With simple operations, you can determine the crystal structure, density, electrical resistance,
Film quality such as degree of adhesion to the substrate can be controlled.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の膜形成装置の模式図、第2図
は形成された銀超微粒子による薄膜の金属組織を
示す走査型電子顕微鏡写真である。 1:超微粒子生成室、2:差圧室、3:膜形成
室、4,5,6:ロータリーボンプ、7,8:油
拡散ポンプ、9,10,18,19:バルブ、1
1:ガスボンベ、12:メカニカルブースタポン
プ、13:抵抗加熱用ボート、14:金属塊、1
5:微小孔ノズル、16:加熱部、17:基板、
A:発生した超微粒子、B:ノズルに吸い込まれ
た後の超微粒子の流れ(ビーム)。
FIG. 1 is a schematic diagram of the film forming apparatus of the present invention, and FIG. 2 is a scanning electron micrograph showing the metal structure of the thin film formed by ultrafine silver particles. 1: Ultrafine particle generation chamber, 2: Differential pressure chamber, 3: Film formation chamber, 4, 5, 6: Rotary pump, 7, 8: Oil diffusion pump, 9, 10, 18, 19: Valve, 1
1: Gas cylinder, 12: Mechanical booster pump, 13: Resistance heating boat, 14: Metal lump, 1
5: Microhole nozzle, 16: Heating section, 17: Substrate,
A: Generated ultrafine particles, B: Flow (beam) of ultrafine particles after being sucked into the nozzle.

Claims (1)

【特許請求の範囲】 1 膜形成物質をガス中で蒸発させて超微粒子を
生成し、圧力差により生成した超微粒子をノズル
を通して真空容器中へ吹き出し、真空容器内を飛
行中の超微粒子ビームを加熱し、その後膜形成基
板に付着させて膜を形成することを特徴とする超
微粒子ビームを用いた膜形成法。 2 膜形成物質を加熱して蒸発させることを特徴
とする特許請求の範囲第1項の超微粒子ビームを
用いた膜形成法。 3 真空容器内を飛行中の超微粒子ビームの加熱
は輻射加熱によることを特徴とする特許請求の範
囲第1項又は第2項の超微粒子ビームを用いた膜
形成法。 4 真空容器内を飛行中の超微粒子ビームの加熱
温度、加熱時間、超微粒子を真空容器中へノズル
を通して吹き出す時の圧力差等の膜形成条件を調
節することにより、膜の結晶構造、密度、電気抵
抗、基板への密着度等の膜質を制御することを特
徴とする特許請求の範囲第1項から第3項いずれ
かの超微粒子ビームを用いた膜形成法。 5 超微粒子生成室、超微粒子生成室と微小孔ノ
ズルを通して連通している膜形成室、微小孔ノズ
ルの出口近辺に設けられた加熱部、及び、超微粒
子生成室、膜形成室それぞれに連結している圧力
差発生装置から構成されていることを特徴とする
超微粒子ビームを用いた膜形成装置。 6 超微粒子生成室と膜形成室の間に圧力差発生
装置に連結している差圧室を設けたことを特徴と
する特許請求の範囲第5項の超微粒子ビームを用
いた膜形成装置。 7 圧力差発生装置は、超微粒子生成室、差圧
室、膜形成室それぞれに連結している排気系と超
微粒子生成室に連結しているガス供給系とからな
ることを特徴とする特許請求の範囲第5項又は第
6項の超微粒子ビームを用いた膜形成装置。 8 加熱部として輻射加熱装置を用いていること
を特徴とする特許請求の範囲第5項から第7項い
ずれかの超微粒子ビームを用いた膜形成装置。
[Claims] 1. A film-forming substance is evaporated in a gas to generate ultrafine particles, and the generated ultrafine particles are blown out into a vacuum container through a nozzle due to a pressure difference, and the ultrafine particle beam flying inside the vacuum container is A film forming method using an ultrafine particle beam, which is characterized by heating and then adhering to a film forming substrate to form a film. 2. A film forming method using an ultrafine particle beam according to claim 1, characterized in that the film forming substance is heated and evaporated. 3. A film forming method using an ultrafine particle beam according to claim 1 or 2, wherein the ultrafine particle beam is heated by radiation heating while flying in a vacuum container. 4 By adjusting the film formation conditions such as the heating temperature and heating time of the ultrafine particle beam while it is flying in the vacuum container, and the pressure difference when the ultrafine particles are blown out through the nozzle into the vacuum container, the crystal structure, density, A film forming method using an ultrafine particle beam according to any one of claims 1 to 3, characterized in that film properties such as electrical resistance and adhesion to a substrate are controlled. 5. An ultrafine particle generation chamber, a film formation chamber that communicates with the ultrafine particle generation chamber through a micropore nozzle, a heating section provided near the exit of the micropore nozzle, and a membrane formation chamber that communicates with the ultrafine particle generation chamber and the film formation chamber, respectively. 1. A film forming apparatus using an ultrafine particle beam, characterized in that it is comprised of a pressure difference generator. 6. A film forming apparatus using an ultrafine particle beam according to claim 5, characterized in that a differential pressure chamber connected to a pressure difference generator is provided between the ultrafine particle generation chamber and the film forming chamber. 7. A patent claim characterized in that the pressure difference generation device comprises an exhaust system connected to each of an ultrafine particle generation chamber, a differential pressure chamber, and a film formation chamber, and a gas supply system connected to the ultrafine particle generation chamber. A film forming apparatus using an ultrafine particle beam in the range 5 or 6. 8. A film forming apparatus using an ultrafine particle beam according to any one of claims 5 to 7, characterized in that a radiation heating device is used as the heating section.
JP12271785A 1985-06-07 1985-06-07 Method and apparatus for forming film using ultrafine particle beam Granted JPS61281866A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12271785A JPS61281866A (en) 1985-06-07 1985-06-07 Method and apparatus for forming film using ultrafine particle beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12271785A JPS61281866A (en) 1985-06-07 1985-06-07 Method and apparatus for forming film using ultrafine particle beam

Publications (2)

Publication Number Publication Date
JPS61281866A JPS61281866A (en) 1986-12-12
JPH0250985B2 true JPH0250985B2 (en) 1990-11-06

Family

ID=14842848

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12271785A Granted JPS61281866A (en) 1985-06-07 1985-06-07 Method and apparatus for forming film using ultrafine particle beam

Country Status (1)

Country Link
JP (1) JPS61281866A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0425175U (en) * 1990-06-25 1992-02-28

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0425175U (en) * 1990-06-25 1992-02-28

Also Published As

Publication number Publication date
JPS61281866A (en) 1986-12-12

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