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JPH025241B2 - - Google Patents
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JPH025241B2 - - Google Patents

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Publication number
JPH025241B2
JPH025241B2 JP21334483A JP21334483A JPH025241B2 JP H025241 B2 JPH025241 B2 JP H025241B2 JP 21334483 A JP21334483 A JP 21334483A JP 21334483 A JP21334483 A JP 21334483A JP H025241 B2 JPH025241 B2 JP H025241B2
Authority
JP
Japan
Prior art keywords
light beam
movable
reflector
incident
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP21334483A
Other languages
Japanese (ja)
Other versions
JPS60105903A (en
Inventor
Yoshuki Kakinuma
Masanobu Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP21334483A priority Critical patent/JPS60105903A/en
Publication of JPS60105903A publication Critical patent/JPS60105903A/en
Publication of JPH025241B2 publication Critical patent/JPH025241B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Description

【発明の詳細な説明】 この発明は、一つの光源から発射された光束か
ら複数の平行走査光束を形成する装置に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for forming a plurality of parallel scanning beams from a beam emitted from a single light source.

被測定物体の外形寸法を測定する方法として、
被測定物体を平行光束で走査し、影の部分を検出
して外形寸法を無接触のまゝ測定する方法があ
る。
As a method of measuring the external dimensions of an object to be measured,
There is a method of scanning an object to be measured with a parallel light beam, detecting shadow parts, and measuring external dimensions without contact.

第1図はかゝる測定方法の概要を示した図で、
集束性の高いレーザ光線等を発生する光源1から
発射された光束は、U字形の音叉2の可動反射鏡
2aにおいて反射角θ1〜θ2の間で反射され、コリ
メータレンズ3によつて平行光束となるように変
換される。そして、この平行光束は被測定物体S
に照射され、再び集束レンズ4において集光され
受光素子5に入射される。
Figure 1 shows an overview of such a measurement method.
A light beam emitted from a light source 1 that generates a highly focused laser beam, etc. is reflected at a reflection angle between θ 1 and θ 2 at a movable reflecting mirror 2a of a U-shaped tuning fork 2, and then collimated by a collimator lens 3. It is converted into a luminous flux. Then, this parallel light flux is the object to be measured S
The light is irradiated with light, is focused again by the focusing lens 4, and is incident on the light receiving element 5.

受光素子5で受光された光を電気信号に変換す
ると、受光素子5から出力される信号は一回の走
査で被測定物体Sの外形寸法Rに対応するパルス
波形が得られる。そこで図示しないが走査光束の
動きは、偏向器が音叉2の場合には正弦波状であ
るので、走査光束の一部をハーフミラにより取り
出して走査光束の動きをシミユレートする正弦波
を作つておき、被測定物体Sの外形寸法Rに対応
する前記パルス波形の立下り、立上り時にその正
弦波の電圧を読み出してその電圧の差を取り出す
と正弦波の電圧と走査光束の位置とは同一関係に
あるので、被測定物体Sの外形寸法Rが非接触の
状態で測定することができる。
When the light received by the light receiving element 5 is converted into an electrical signal, a pulse waveform corresponding to the external dimension R of the object to be measured S can be obtained from the signal output from the light receiving element 5 in one scan. Although not shown, since the movement of the scanning light beam is sinusoidal when the deflector is a tuning fork 2, a part of the scanning light beam is taken out by a half mirror to create a sine wave that simulates the movement of the scanning light beam. If we read out the voltage of the sine wave at the falling and rising edges of the pulse waveform corresponding to the external dimension R of the measuring object S and extract the difference between the voltages, we will find that the voltage of the sine wave and the position of the scanning light beam have the same relationship. , the external dimension R of the object to be measured S can be measured in a non-contact manner.

上述したような測定方法はすでに実用化されて
いるが、被測定物体Sの外形寸法Rが大きくなる
と、U字形の音叉2の振動による偏向では平行光
束の走査幅Lを大きくすることが困難であり、測
定不能になるという問題がある。
Although the measurement method described above has already been put into practical use, as the external dimension R of the object to be measured S increases, it becomes difficult to increase the scanning width L of the parallel light beam by deflection due to the vibration of the U-shaped tuning fork 2. However, there is a problem that it becomes impossible to measure.

そこで、第2図に示すように、コリメータレン
ズ3で平行光束とされた光束をハーフミラ6によ
つて2つの光束L1,L2に分離し、分離された光
束L1,L2をそれぞれ反射鏡7,8,9によつて
方向変換し、大きな寸法をもつ被測定物体Sの外
形端部に照射し、第1図の場合と同様に光束(平
行光束)L1,L2を受光素子5によつて検出し被
測定物体Sの外端を検出することによつて外形寸
法Rを測定することが考えられている。
Therefore, as shown in FIG. 2, the collimated light beam made into a parallel light beam by the collimator lens 3 is separated into two light beams L 1 and L 2 by the half mirror 6, and the separated light beams L 1 and L 2 are reflected, respectively. The direction is changed by the mirrors 7, 8, and 9, and the external edge of the object to be measured S having large dimensions is irradiated, and the light beams (parallel light beams) L 1 and L 2 are sent to the light receiving element as in the case of Fig. 1. It is considered that the external dimension R is measured by detecting the outer edge of the object S to be measured by detecting the outer edge of the object S.

しかしながら、このような光学装置は反射鏡
7,8,9、及びハーフミラ6の設置、及びその
調整のために光学系が複雑となり、小形化も困難
になるという欠点がある。
However, such an optical device has the drawback that the optical system becomes complicated due to the installation and adjustment of the reflecting mirrors 7, 8, 9 and the half mirror 6, and it is difficult to miniaturize the optical system.

そこで、偏向器としてU字形の音叉2に代えて
回転多面鏡を前述した第1図の可動反射鏡2aの
位置におき、平行光束の走査幅Lを広くすること
も考えられる。
Therefore, instead of the U-shaped tuning fork 2 as a deflector, a rotating polygon mirror may be placed at the position of the movable reflecting mirror 2a in FIG. 1 described above to widen the scanning width L of the parallel light beam.

しかし、この場合は回転多面鏡の分割数及び回
転数によつて単位時間当りの走査回数が制限され
るので、多面鏡の反射面の数を少なくして走査幅
Lを大きくする程、走査回数が少なくなり、通
常、数回の走査によつて測定値を平均化するの
で、測定時間が長くなるという欠点が生じる。そ
こで更に、第3図に示すように光源Pに対してハ
ーフミラ10、反射鏡11を設け、U字形の音叉
12に取付けてある第1の反射鏡12aに入射さ
せる光源Pからの光束を、先ずハーフミラー10
によつてその一部を反射した第1の光束Aと、ハ
ーフミラ10を透過した第2の光束Bにより形成
し、第1の反射鏡12aでは第1、第2の光束
A,Bが音叉12の振動によつてそれぞれ偏向さ
れるようになし、2つの光束となつてコリメータ
レンズ13に入射させる。そして、このコリメー
タレンズ13によつて第1の平行光束L1と第2
の平行光束L2を形成して走査幅を広くすること
が考えられる。
However, in this case, the number of scans per unit time is limited by the number of divisions and rotation speed of the rotating polygon mirror, so the fewer the number of reflective surfaces of the polygon mirror and the larger the scanning width L, the more the number of scans. The disadvantage is that the measurement time is increased because the measured values are usually averaged over several scans. Therefore, as shown in FIG. 3, a half mirror 10 and a reflector 11 are provided for the light source P, and the luminous flux from the light source P is first made incident on the first reflector 12a attached to the U-shaped tuning fork 12. half mirror 10
It is formed by a first light flux A partially reflected by the mirror 10 and a second light flux B transmitted through the half mirror 10. In the first reflecting mirror 12a, the first and second light fluxes A and B The two beams are deflected by the vibrations of the two beams, and are incident on the collimator lens 13 as two beams of light. Then, by this collimator lens 13, the first parallel light beam L1 and the second parallel light beam L1 are
It is conceivable to widen the scanning width by forming a parallel light beam L 2 of .

しかしながらこのような走査装置の場合は平行
光束を得るためにコリメータレンズ13が必要に
なり、このコリメータレンズ13の収差によつて
精度の高い平行光束とすることが困難になるとい
う問題がある。また、収差のない大口径のレンズ
は高価であつて、光学装置のコストアツプを招く
という問題もある。
However, in the case of such a scanning device, a collimator lens 13 is required to obtain a parallel light beam, and the aberration of the collimator lens 13 makes it difficult to obtain a highly accurate parallel light beam. Another problem is that a large aperture lens with no aberrations is expensive, leading to an increase in the cost of the optical device.

この発明はかかる問題点に鑑みてなされたもの
で、比較的大寸法の披測定物体の外形寸法も測定
できるような平行光束をコリメータレンズを使用
することなく発生できるような光学装置を提供す
ることを目的としてなされたものである。
The present invention has been made in view of the above problems, and an object of the present invention is to provide an optical device that can generate a parallel light beam that can measure the external dimensions of a relatively large object to be measured without using a collimator lens. This was done for the purpose of

第4図はこの発明の第1の実施例を示すもの
で、第3図のコリメータレンズ13を省略して平
行光束を得るようにしたものである。
FIG. 4 shows a first embodiment of the present invention, in which the collimator lens 13 in FIG. 3 is omitted to obtain a parallel light beam.

この実施例の場合は、U字形の音叉12で偏向
される光束が第1、第2の光束A,Bで形成され
る点は共通であるが、U字形の音叉12の振動端
には第1及び第2の可動反射鏡12a,12bが
設けてあり、固定反射鏡14がこれに対峙する位
置におかれている。
In the case of this embodiment, it is common that the light beam deflected by the U-shaped tuning fork 12 is formed by the first and second light beams A and B, but the vibration end of the U-shaped tuning fork 12 has a second First and second movable reflecting mirrors 12a and 12b are provided, and a fixed reflecting mirror 14 is placed in a position facing them.

したがつて、第1の光束Aについて説明する
と、まず、第1の可動反射鏡12aで反射された
光は固定反射鏡14で再び第2の可動反射鏡12
bに入射されこゝで再び偏向される。
Therefore, to explain the first luminous flux A, first, the light reflected by the first movable reflecting mirror 12a passes through the fixed reflecting mirror 14 and returns to the second movable reflecting mirror 12.
When the beam is incident on point b, it is deflected again.

ところで、音叉12が振動しているときの第
1、第2の可動反射鏡12a,12bの偏向角は
同一で、かつ逆相となつているので、一方12a
が+Δθだけ反射面が変化したときは他方12b
は−Δθだけ反射面が変化する。
By the way, when the tuning fork 12 is vibrating, the deflection angles of the first and second movable reflecting mirrors 12a and 12b are the same and have opposite phases, so that one
When the reflecting surface changes by +Δθ, the other 12b
The reflective surface changes by -Δθ.

したがつて、前記第1の光束Aが点線で示すよ
うに光束A′となるように第1の可動反射鏡12
aで反射されると、固定反射鏡14で反射され第
2の可動反射鏡12bに入射される光束A′は第
1の光束Aと異なつた位置に入射される。しか
し、前述したように第1、第2の可動反射鏡12
a,12bが同一角度で逆方向の反射面を形成し
ているので、結局、第2の可動反射鏡12bから
出射される光束A′は、第1の光束Aと同一方向
になり、第1の光束Aと偏向されたときの光束
A′は第1の平行光束L1を形成することになる。
Therefore, the first movable reflecting mirror 12 is adjusted so that the first luminous flux A becomes a luminous flux A' as shown by the dotted line.
When reflected by a, the light beam A' reflected by the fixed reflecting mirror 14 and incident on the second movable reflecting mirror 12b is incident on a different position from the first light beam A. However, as mentioned above, the first and second movable reflecting mirrors 12
Since a and 12b form reflective surfaces at the same angle and in opposite directions, the light flux A' emitted from the second movable reflecting mirror 12b ends up in the same direction as the first light flux A, and The luminous flux A and the luminous flux when deflected
A′ will form the first parallel light beam L 1 .

同様に第2の光束Bについても音叉12の振動
によつて偏向された光束はB′となり反射経路が
異なるが、第2の可動反射鏡12bで反射された
ときの方向は第2の光束Bと同一方向になり、光
束B,B′は第2の平行光束L2を形成する。
Similarly, regarding the second light beam B, the light beam deflected by the vibration of the tuning fork 12 becomes B', and the reflection path is different, but when it is reflected by the second movable reflecting mirror 12b, the direction is the second light beam B. The light beams B and B' form a second parallel light beam L2 .

この実施例の場合はコリメータレンズ13が不
用となるため、レンズの収差の影響がなくなり、
光学装置も安価になるという利点がある。
In the case of this embodiment, the collimator lens 13 is not required, so the influence of lens aberration is eliminated.
The optical device also has the advantage of being cheaper.

第5図は第4図の実施例においてU字形の音叉
に変えて第1および第2の可動反射鏡として回転
多面鏡を採用したこの発明の第2の実施例を示し
たものである。
FIG. 5 shows a second embodiment of the present invention in which rotating polygon mirrors are used as the first and second movable reflecting mirrors in place of the U-shaped tuning fork in the embodiment of FIG.

この図で、18は第1の回転多面鏡、19は前
記第1の回転多面鏡18と同期して逆方向に回転
している第2の回転多面鏡、20は固定反射鏡で
ある。
In this figure, 18 is a first rotating polygon mirror, 19 is a second rotating polygon mirror rotating in the opposite direction in synchronization with the first rotating polygon mirror 18, and 20 is a fixed reflecting mirror.

この実施例は、前述した第4図のU字形の音叉
12の取り付けた第1、第2の可動反射鏡12
a,12bに代えて第1、第2の回転多面鏡1
8,19を設けた場合に相当し、平行光束LA
LBを得る方法も同一である。しかし、マスク1
6を通過した第1、第2の光束A,Bによる平行
光束LA,LBは同一空間に時分割で発生すること
になる。
In this embodiment, the first and second movable reflecting mirrors 12 to which the U-shaped tuning fork 12 shown in FIG.
First and second rotating polygon mirrors 1 in place of a and 12b
This corresponds to the case where 8 and 19 are provided, and the parallel light flux L A ,
The method for obtaining L B is also the same. However, mask 1
Parallel light beams L A and L B due to the first and second light beams A and B that have passed through 6 are generated in the same space in a time-division manner.

以上説明したように、この発明の平行光束走査
装置は、可動反射鏡に入射される光束を複数の光
束に分離した光束を偏向する第1の可動反射鏡に
入射し、この第1の可動反射鏡から反射された光
束を更に、固定反射鏡に入射し、この固定反射鏡
から反射された光束を第2の可動反射鏡に入射す
るように構成し、この第1、第2の可動反射鏡の
偏向角が互いに逆方向となるように駆動して複数
本の平行光束を得るようにし、得られる複数の平
行光束の間隔を任意に設定できるようにしたの
で、実質的に広い範囲を走査できる平行光束をき
わめて容易に得ることができるという利点があ
る。
As explained above, in the parallel beam scanning device of the present invention, the light beam incident on the movable reflector is separated into a plurality of light beams, and the light beam is incident on the first movable reflector that deflects the light beam, and the light beam is incident on the first movable reflector. The light beam reflected from the mirror is further incident on a fixed reflecting mirror, and the light beam reflected from the fixed reflecting mirror is incident on a second movable reflecting mirror, and the first and second movable reflecting mirrors The deflection angles of the two are driven in opposite directions to obtain multiple parallel beams, and the interval between the resulting parallel beams can be set arbitrarily, making it possible to scan a substantially wide range. It has the advantage that parallel light beams can be obtained very easily.

また、高価な収差の少ない、大口径のコリメー
タレンズを使用しないのでレンズの収差の影響が
なくなり、平行性のよい平行光束が安化に精度よ
く得られるという効果がある。
Furthermore, since an expensive collimator lens with a small aberration and a large diameter is not used, the effect of lens aberration is eliminated, and a parallel light beam with good parallelism can be obtained at low cost and with high precision.

【図面の簡単な説明】[Brief explanation of drawings]

第1図、第2図および第3図は従来方法による
被測定物体の外形を測定する方法の概要図、第4
図はこの発明の一実施例を示す装置の概略図、第
5図はこの発明の他の実施例を示す装置の概要図
である。 図中、10はハーフミラ、11は反射鏡、12
はU字形の音叉、12aは可動反射鏡、13,1
7はコリメータレンズ、14,20は固定反射
鏡、15,18,19は回転多面鏡を示す。
Figures 1, 2, and 3 are schematic diagrams of a conventional method for measuring the external shape of an object to be measured.
The figure is a schematic diagram of an apparatus showing one embodiment of the invention, and FIG. 5 is a schematic diagram of an apparatus showing another embodiment of the invention. In the figure, 10 is a half mirror, 11 is a reflective mirror, 12
is a U-shaped tuning fork, 12a is a movable reflector, 13,1
7 is a collimator lens, 14 and 20 are fixed reflecting mirrors, and 15, 18, and 19 are rotating polygon mirrors.

Claims (1)

【特許請求の範囲】 1 異なる入射角を持つた2以上の入射光束を受
ける位置に配置され、該入射光束の反射角を変化
するように配置した第1の可動反射鏡と、概第1
の可動反射鏡で反射された2以上の光束をそれぞ
れ前記入射光束の入射角に比例して異なる角度で
反射する固定反射鏡と、該固定反射鏡で反射され
た2以上の反射光束を受け、概反射光束の反射角
を変化するように配置した第2の可動反射鏡を設
け、前記第1の可動反射鏡の偏向角と前記第2の
可動反射鏡の偏向角が互いに逆方向となるように
駆動する駆動手段を備えていることを特徴とする
平行光束走査装置。 2 駆動手段がU字形の音叉であつて、第1、第
2の可動反射鏡が前記U字形音叉のそれぞれの自
由端に固定されていることを特徴とする特許請求
の範囲第1項に記載の平行光束走査装置。 3 第1、第2の可動反射鏡がそれぞれ逆方向に
回転している回転多面鏡で構成されていることを
特徴とする特許請求の範囲第1項に記載の平行光
束走査装置。
[Scope of Claims] 1. A first movable reflecting mirror disposed at a position to receive two or more incident light beams having different incident angles and arranged so as to change the reflection angle of the incident light beams;
a fixed reflector that reflects two or more light beams reflected by the movable reflector at different angles in proportion to the incident angle of the incident light beam; and a fixed reflector that receives the two or more reflected light beams reflected by the fixed reflector; A second movable reflector arranged to change the reflection angle of the approximately reflected light beam is provided, and the deflection angle of the first movable reflector and the deflection angle of the second movable reflector are in opposite directions. 1. A parallel beam scanning device comprising a driving means for driving the parallel beam scanning device. 2. Claim 1, wherein the driving means is a U-shaped tuning fork, and the first and second movable reflecting mirrors are fixed to respective free ends of the U-shaped tuning fork. parallel beam scanning device. 3. The parallel light beam scanning device according to claim 1, wherein the first and second movable reflecting mirrors are composed of rotating polygon mirrors rotating in opposite directions.
JP21334483A 1983-11-15 1983-11-15 Parallel light flux scanning apparatus Granted JPS60105903A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21334483A JPS60105903A (en) 1983-11-15 1983-11-15 Parallel light flux scanning apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21334483A JPS60105903A (en) 1983-11-15 1983-11-15 Parallel light flux scanning apparatus

Publications (2)

Publication Number Publication Date
JPS60105903A JPS60105903A (en) 1985-06-11
JPH025241B2 true JPH025241B2 (en) 1990-02-01

Family

ID=16637598

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21334483A Granted JPS60105903A (en) 1983-11-15 1983-11-15 Parallel light flux scanning apparatus

Country Status (1)

Country Link
JP (1) JPS60105903A (en)

Also Published As

Publication number Publication date
JPS60105903A (en) 1985-06-11

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