JPH0259880B2 - - Google Patents
Info
- Publication number
- JPH0259880B2 JPH0259880B2 JP18659184A JP18659184A JPH0259880B2 JP H0259880 B2 JPH0259880 B2 JP H0259880B2 JP 18659184 A JP18659184 A JP 18659184A JP 18659184 A JP18659184 A JP 18659184A JP H0259880 B2 JPH0259880 B2 JP H0259880B2
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- chromium
- zinc
- copper
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 99
- 239000011889 copper foil Substances 0.000 claims description 89
- 239000011651 chromium Substances 0.000 claims description 37
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 31
- 229910052804 chromium Inorganic materials 0.000 claims description 31
- 239000010409 thin film Substances 0.000 claims description 30
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 25
- 229910052725 zinc Inorganic materials 0.000 claims description 25
- 239000011701 zinc Substances 0.000 claims description 25
- 238000004519 manufacturing process Methods 0.000 claims description 15
- 239000007864 aqueous solution Substances 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 12
- 239000010408 film Substances 0.000 claims description 10
- 229910001430 chromium ion Inorganic materials 0.000 claims description 7
- PTFCDOFLOPIGGS-UHFFFAOYSA-N Zinc dication Chemical compound [Zn+2] PTFCDOFLOPIGGS-UHFFFAOYSA-N 0.000 claims description 5
- JOPOVCBBYLSVDA-UHFFFAOYSA-N chromium(6+) Chemical compound [Cr+6] JOPOVCBBYLSVDA-UHFFFAOYSA-N 0.000 claims description 4
- 230000005611 electricity Effects 0.000 claims 2
- 239000003929 acidic solution Substances 0.000 claims 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 26
- 239000010410 layer Substances 0.000 description 24
- 238000005530 etching Methods 0.000 description 12
- 239000002585 base Substances 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- 239000010949 copper Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 10
- 239000002184 metal Substances 0.000 description 10
- 238000005868 electrolysis reaction Methods 0.000 description 7
- 238000010438 heat treatment Methods 0.000 description 6
- 230000003647 oxidation Effects 0.000 description 6
- 238000007254 oxidation reaction Methods 0.000 description 6
- 239000000047 product Substances 0.000 description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 230000002378 acidificating effect Effects 0.000 description 4
- 238000011282 treatment Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 239000002253 acid Substances 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 239000003792 electrolyte Substances 0.000 description 3
- 239000008151 electrolyte solution Substances 0.000 description 3
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 2
- 241001274216 Naso Species 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 229910000423 chromium oxide Inorganic materials 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 229910000365 copper sulfate Inorganic materials 0.000 description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- 229910000906 Bronze Inorganic materials 0.000 description 1
- JJLJMEJHUUYSSY-UHFFFAOYSA-L Copper hydroxide Chemical compound [OH-].[OH-].[Cu+2] JJLJMEJHUUYSSY-UHFFFAOYSA-L 0.000 description 1
- 239000005750 Copper hydroxide Substances 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 239000005751 Copper oxide Substances 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- -1 ZnSO 4.6H 2 O Chemical compound 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000001479 atomic absorption spectroscopy Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- 229920005549 butyl rubber Polymers 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 229910001956 copper hydroxide Inorganic materials 0.000 description 1
- 229910000431 copper oxide Inorganic materials 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 229960003280 cupric chloride Drugs 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 125000002924 primary amino group Chemical class [H]N([H])* 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 125000000467 secondary amino group Chemical class [H]N([*:1])[*:2] 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
- Electroplating Methods And Accessories (AREA)
Description
産業上の利用分野
この発明は、高温における耐酸化性を備え、耐
塩酸性においてすぐれ、しかも量産に適したプリ
ント回路用銅箔と、その製造方法に関するもので
ある。
従来の技術
電子機器の配線に用いるプリント回路板は、銅
箔と合成樹脂含浸基材とを加熱、加圧処理して銅
張積層板とし、ついで該銅箔の回路作成部分以外
の銅をエツチングにより溶解除去して、基板上に
銅の回路を形成することにより製造されていた。
そして銅張積層板製作の際には、銅箔と合成樹
脂含浸基材との接着力を増強するために、基材と
積層する銅箔面に、予じめ電解処理により樹枝状
の銅を析出させておくこが必要である。しかしな
がら、前記状態の銅箔を大気中に放置すると、次
第に酸化して、銅箔の基材と積層する側の面に
は、樹枝状銅の上に薄い酸化銅の被膜ができ、プ
リント回路板を作製した場合に、銅箔と基板との
間の剥離強度が低下する。一方、銅箔の光沢面、
すなわちプリント回路作製側の面では、表面変色
が起り外観不良となるばかりか、該面への半田の
りが悪くなり、銅の導電率を低下し、プリント回
路板としての使用が不能となる。従つて、プリン
ト回路用銅箔の防錆力を向上させることは、銅箔
の製造に当り、極めて重要な課題と言い得る。さ
て、銅箔の防錆力向上のための公知の技術とし
て、銅箔を6価のクロム塩の水溶液中で処理し、
その面にクロム薄膜を形成させる処理法がある。
しかし、この方法はプリント回路板の使用条件が
苛酷な場合、とりわけ高温において使用する場
合、その効果が乏しく、その改善が要望されてい
た。そして、その対策の1つとして、例えばアメ
リカ特許第3585010号公報には、銅箔面にインジ
ウム、亜鉛、錫、ニツケル、コバルト、真鍮或い
は青銅の薄層を形成したプリント回路用銅箔が提
案されている。上記金属のうち、亜鉛は防錆力、
特に高温での耐酸化性において優れているが、プ
リント回路作製の際の必須要件とされる耐塩酸性
の点において劣り、実用上問題がある。
また特公昭58−7077号公報には、銅箔の少くと
も一面に、亜鉛または酸化亜鉛とクロム酸化物か
らなる混合物の被覆層を形成させたプリント回路
用銅箔が開示されている。この方法は、アルカリ
性浴を用い電解して該層を形成することがその主
力と考えられる。しかし、プリント回路用銅箔の
製造に当つては、銅箔表面に樹枝状の銅を電析さ
せる工程と、該箔面に亜鉛などの薄膜を形成させ
る工程とは、通常同一処理機を用い連続的に行な
われ、その際樹枝状銅の電析は、公知の酸性硫酸
銅メツキ浴中において銅箔に通電して行う。従つ
て、次工程において例えばアルカリ浴を用いて亜
鉛などの被膜を作製した場合、これらの洗篠廃液
が合流するような場合には、排水溝中では水酸化
銅が沈積しやすくなるため、勢い排水溝を別個に
設けるという設備上の難点があり、加えて、銅箔
面の残留アルカリ分の洗篠には、多量の水が必要
であるという作業上の欠点もある。しかも前記の
銅箔面に亜鉛または酸化亜鉛とクロム酸化物との
混合被膜を形成するこの二層構造の銅箔は、高温
における耐酸化性能は備えるものの、銅箔として
要求される耐塩酸性が劣り、この銅箔を用いてプ
リント回路板を作製すると、サイドエツチングを
起すなど実用上の問題を含む方法であつた。
発明が解決しようとする問題点
本発明は、高温における耐酸化性の点では、銅
箔面に亜鉛などの薄膜を形成した前記公知の二層
構造の銅箔と同等の特性をもち、耐塩酸性の点に
おいては、これらよりも著しく優れた特性を示
し、かつプリント回路作製の場合、サイドエツチ
ングの起らない銅箔と、これを量産できるような
製造方法を提供することを目的とするものであ
る。
問題点を解決するための手段
本発明者等は、上記問題を解決するため銅箔防
錆処理のための電解液には、アルカリ浴の使用に
代えて酸性浴の使用を基本的前提として研究を続
けた。その結果、銅箔の少くとも一方の面に公知
のクロム薄膜を形成後、引続き、その上に6価ク
ロムイオンと亜鉛イオンとを含む酸性浴を用いて
クロムと亜鉛との混合薄膜を形成した三層構造の
銅箔となせば、上記諸問題を解決できることを確
認したので、ここに本発明を完成した。
作 用
つぎに本発明をさらに詳しく説明する。本発明
において防錆力を付与する処理の対象となる銅箔
は、電解、圧延のいずれの方法で作製した銅箔で
あつてもよく、該銅箔の合成樹脂含浸基材との積
層面を、公知の酸性硫酸銅メツキ浴を用いて電解
処理し、その表面に樹枝状の銅を電析させたもの
である。
従来の防錆処理を施した銅箔は、上記のような
銅箔の表面に、亜鉛などの薄膜を形成させた二層
構造であるのに対し、本発明のものは、銅箔の少
くとも一方の面に、クロム薄膜を形成し、さらに
その上にクロムと亜鉛との混合薄膜を形成して三
層構造となすと共に、これら薄膜形成処理を、こ
とごとく酸性浴によつて行うものである。
そしてクロム薄膜の形成には、公知の6価クロ
ムイオンを含む水溶液、例えばNa2Cr2O7・2H2O
濃度を0.5〜10g/、浴のPHを4〜6に保持し、
室温においてこの浴中で銅箔に通電するか、或い
はこの浴に銅箔を浸漬させるだけでクロム薄膜を
形成させ、ついでこの薄膜上に形成させるクロム
と亜鉛との混合薄膜は、電解液として6価のクロ
ムイオン、例えばNa2Cr2O7・2H2Oと亜鉛イオ
ン、例えばZnSO4・6H2Oを含む混合水溶液を用
い、さらに必要の場合は、この混合溶液に
NaSO4を添加した浴中において、銅箔をを陰極
として通電して形成させる。ここにNaSO4を添
加するのは、使用する電解液中のクロムイオンと
亜鉛イオンが少量の場合、水溶液の電導度を向上
させるものであるので付記する。
つぎに浴温につき述べると、室温で良く特に厳
密な温度管理は必要でない。またNa2Cr2O7・
2H2OおよびZnSO4・6H2O添加量についても、特
に制限する必要はないが、一般にこれらの濃度
は、1〜10g/の範囲において行う場合が多
い。また電解により析出する混合薄膜中のクロム
と亜鉛との割合は、使用する電解液中のクロムイ
オンと亜鉛イオンの比率と相関々係がある。従つ
て、これを考慮に入れ配合量を選択することが望
ましい。また、の電解液のPHは3〜6の範囲で行
うことが好適である。その理由は、PHを3以下に
すると、電解の結果、生成したクロムと亜鉛との
混合薄膜が、酸により溶解しやすくなり、一方、
そのPHを6以上となすと電解により析出する亜鉛
の割合が減少するからである。
なお、本発明により銅箔に析出させるクロムと
亜鉛との混合薄膜は、樹枝状の銅箔面、すなわち
銅箔の粗面側またはその光沢面のいずれに形成し
てもよく、また銅箔の両面に形成させてもよい。
また電解後の銅箔は、水洗して残留水を除去する
ため、例えば105〜110℃の乾燥機中で約5分間乾
燥すれば、プリント回路用銅箔が得られる。
以下、実施例を掲げて本発明をさらに具体的に
説明する。
実施例 1
厚さ33μmの銅箔を、Na2Cr2O7・2H2Oの濃度
を5g/とし、PHを5〜6の間に保持した水溶
液中に室温において浸漬し、電流密度0.3A/d
m2で5秒間通電を行い、銅箔粗面側にクロム薄膜
を形成後、引続き該銅箔を陰極としてZnSO4・
6H2O2g/、Na2Cr2O7・2H2O5g/からな
り、PHを4〜5の間に保持した水溶液中で室温に
おいて電流密度を0.15A/dm2と0.3A/dm2の2
種類とし、通電時間はいずれも5秒と一定とし、
前記銅箔のクロム薄膜上に、クロムと亜鉛の混合
薄膜を形成させた。
このようにして得た三層構造銅箔のクロムと亜
鉛との混合薄膜面を、ガラス−エポキシ樹脂含浸
基材(硬化剤として第2級アミンを使用)と重ね
合わせ、160℃、圧力100Kg/cm2において40分間加
熱、加圧して250×250×1.2mmの銅張積層板試片
を試作した。
また上記試片の性能と比較するため、別に前記
と同一厚みの銅箔粗面側に、クロム薄膜を形成さ
せることなく、該銅箔を陰極として、直接前記と
同一組成のクロムと亜鉛とからなる水溶液中にお
いて、前記と同一処理条件を採用してクロムと亜
鉛との混合薄膜を形成して従来の二層構造銅箔を
作製し、該面を前記と同様の樹脂基材と重ね、同
一処理条件により同一大きさの銅張積層板を試作
し、これらの試作板について、それぞれ剥離強
度、耐塩酸性(試作板を試薬塩酸:水=1:1の
水溶液中に室温で1時間浸漬後の剥離強度の劣化
率である。)および高温における耐酸化性評価の
ための加熱後剥離試験(試作板を180℃において
48時間保持後、放冷した後の剥離強度である。)
を行うと共に、試作板の銅箔に生成したクロムお
よび亜鉛の付着量(銅箔1dm2当りのこれらの金
属の付着重量である。)を参考までに原子吸光分
析法で測定してみた。結果は表1の通りである。
INDUSTRIAL APPLICATION FIELD This invention relates to a copper foil for printed circuits that has oxidation resistance at high temperatures, excellent hydrochloric acid resistance, and is suitable for mass production, and a method for manufacturing the same. Prior Art Printed circuit boards used for wiring electronic devices are made by heating and pressurizing copper foil and a synthetic resin-impregnated base material to form a copper-clad laminate, and then etching the copper in areas other than the circuit forming portion of the copper foil. It was manufactured by dissolving and removing copper and forming a copper circuit on the substrate. When manufacturing copper-clad laminates, in order to strengthen the adhesion between the copper foil and the synthetic resin-impregnated base material, dendritic copper is pre-electrolytically treated on the surface of the copper foil that will be laminated with the base material. It is necessary to let it precipitate. However, if the copper foil in the above state is left in the air, it will gradually oxidize, and a thin copper oxide film will form on the dendritic copper on the side of the copper foil that will be laminated with the base material, resulting in a printed circuit board. When this is done, the peel strength between the copper foil and the substrate decreases. On the other hand, the shiny side of copper foil,
That is, on the printed circuit production side, not only does surface discoloration occur and the appearance is poor, but also solder adhesion to the surface becomes poor, lowering the conductivity of the copper, and making it impossible to use it as a printed circuit board. Therefore, it can be said that improving the antirust ability of copper foil for printed circuits is an extremely important issue in the production of copper foil. Now, as a known technique for improving the rust prevention ability of copper foil, copper foil is treated in an aqueous solution of hexavalent chromium salt,
There is a treatment method that forms a thin chromium film on that surface.
However, this method is not very effective when the printed circuit board is used under severe conditions, particularly when it is used at high temperatures, and an improvement has been desired. As one of the countermeasures, for example, U.S. Patent No. 3,585,010 proposes a copper foil for printed circuits in which a thin layer of indium, zinc, tin, nickel, cobalt, brass, or bronze is formed on the copper foil surface. ing. Among the above metals, zinc has anti-rust ability,
Although it is particularly excellent in oxidation resistance at high temperatures, it is inferior in hydrochloric acid resistance, which is an essential requirement in the production of printed circuits, which poses a practical problem. Further, Japanese Patent Publication No. 7077/1983 discloses a copper foil for printed circuits in which a coating layer of zinc or a mixture of zinc oxide and chromium oxide is formed on at least one surface of the copper foil. The main feature of this method is considered to be that the layer is formed by electrolysis using an alkaline bath. However, in manufacturing copper foil for printed circuits, the process of electrodepositing dendritic copper on the surface of the copper foil and the process of forming a thin film of zinc or the like on the surface of the foil are usually performed using the same processing machine. This is carried out continuously, with the electrodeposition of the dendritic copper being carried out by passing an electric current through the copper foil in a known acidic copper sulfate plating bath. Therefore, when a coating of zinc or the like is created using an alkaline bath in the next process, if these washing effluents are combined, copper hydroxide tends to deposit in the drain, and the momentum is reduced. There is an equipment disadvantage in that a drainage channel is provided separately, and in addition, there is an operational disadvantage in that a large amount of water is required to wash away residual alkali from the copper foil surface. Moreover, although this two-layered copper foil, in which a mixed film of zinc or zinc oxide and chromium oxide is formed on the copper foil surface, has oxidation resistance at high temperatures, it has poor hydrochloric acid resistance required for copper foil. However, when a printed circuit board was manufactured using this copper foil, the method involved practical problems such as side etching. Problems to be Solved by the Invention In terms of oxidation resistance at high temperatures, the present invention has properties equivalent to the above-mentioned known two-layer structure copper foil in which a thin film of zinc or the like is formed on the copper foil surface, and has hydrochloric acid resistance. The purpose of the present invention is to provide a copper foil that exhibits significantly superior properties than those described above, and that does not cause side etching when manufacturing printed circuits, and a manufacturing method that allows mass production of the same. be. Means for Solving the Problems In order to solve the above problems, the present inventors conducted research based on the basic premise of using an acidic bath instead of an alkaline bath for the electrolyte solution for anti-corrosion treatment of copper foil. continued. As a result, after forming a known chromium thin film on at least one side of the copper foil, a mixed thin film of chromium and zinc was subsequently formed thereon using an acidic bath containing hexavalent chromium ions and zinc ions. It was confirmed that the above-mentioned problems could be solved by using a copper foil with a three-layer structure, and thus the present invention was completed. Function Next, the present invention will be explained in more detail. In the present invention, the copper foil to be treated to impart rust prevention ability may be a copper foil produced by either electrolysis or rolling. , electrolytic treatment was performed using a known acidic copper sulfate plating bath, and dendritic copper was electrodeposited on the surface. Conventional rust-prevention treated copper foil has a two-layer structure in which a thin film of zinc or the like is formed on the surface of the copper foil as described above, whereas the one of the present invention has at least A thin chromium film is formed on one side, and a mixed thin film of chromium and zinc is formed on top of that to form a three-layer structure, and all of these thin film formation treatments are performed in an acid bath. To form a chromium thin film, a well-known aqueous solution containing hexavalent chromium ions, such as Na 2 Cr 2 O 7.2H 2 O
Maintain the concentration at 0.5-10g/, the pH of the bath at 4-6,
A thin chromium film is formed by simply energizing the copper foil in this bath at room temperature or by immersing the copper foil in this bath, and then a mixed thin film of chromium and zinc is formed on this thin film using 6.0% as an electrolyte. A mixed aqueous solution containing valent chromium ions, such as Na 2 Cr 2 O 7.2H 2 O, and zinc ions, such as ZnSO 4.6H 2 O, is used, and if necessary, this mixed solution is added.
A copper foil is used as a cathode and current is applied in a bath to which NaSO 4 is added. The reason why NaSO 4 is added here is to improve the electrical conductivity of the aqueous solution when the electrolyte used contains small amounts of chromium ions and zinc ions. Next, regarding the bath temperature, room temperature is sufficient and no particularly strict temperature control is required. Also, Na 2 Cr 2 O 7・
The amounts of 2H 2 O and ZnSO 4 .6H 2 O added do not need to be particularly limited either, but their concentrations are generally in the range of 1 to 10 g/in many cases. Furthermore, the ratio of chromium and zinc in the mixed thin film deposited by electrolysis is correlated with the ratio of chromium ions to zinc ions in the electrolytic solution used. Therefore, it is desirable to take this into consideration when selecting the blending amount. Further, it is preferable that the pH of the electrolytic solution is in the range of 3 to 6. The reason for this is that when the pH is lower than 3, the mixed thin film of chromium and zinc produced as a result of electrolysis becomes more easily dissolved by acid;
This is because when the pH is set to 6 or more, the proportion of zinc deposited by electrolysis decreases. The mixed thin film of chromium and zinc deposited on copper foil according to the present invention may be formed on either the dendritic copper foil surface, that is, the rough surface side of the copper foil or the shiny surface thereof. It may be formed on both sides.
Further, the copper foil after electrolysis is washed with water to remove residual water, so that if it is dried for about 5 minutes in a dryer at 105 to 110° C., a copper foil for printed circuits can be obtained. Hereinafter, the present invention will be explained in more detail with reference to Examples. Example 1 A copper foil with a thickness of 33 μm was immersed at room temperature in an aqueous solution containing Na 2 Cr 2 O 7 .2H 2 O at a concentration of 5 g/ and a pH between 5 and 6 at a current density of 0.3 A. /d
After forming a thin chromium film on the rough surface of the copper foil by applying current for 5 seconds at m 2 , ZnSO 4 was then applied using the copper foil as a cathode.
6H 2 O 2 g/, Na 2 Cr 2 O 7・2H 2 O 5 g/, and current density of 0.15 A/dm 2 and 0.3 A/dm 2 at room temperature in an aqueous solution with pH maintained between 4 and 5.
type, and the energization time is constant at 5 seconds.
A mixed thin film of chromium and zinc was formed on the chromium thin film of the copper foil. The mixed thin layer of chromium and zinc of the thus obtained three-layer copper foil was layered on a glass-epoxy resin-impregnated base material (using a secondary amine as a hardening agent) at 160℃ and under a pressure of 100Kg/ A copper clad laminate specimen measuring 250 x 250 x 1.2 mm was fabricated by heating and pressurizing it at cm 2 for 40 minutes. In addition, in order to compare the performance of the above sample, without forming a thin chromium film on the rough side of a copper foil of the same thickness as above, we directly applied chromium and zinc with the same composition as above, using the copper foil as a cathode. In an aqueous solution of Copper-clad laminates of the same size were trial-produced under different processing conditions, and the peel strength and hydrochloric acid resistance of these trial boards were determined (after immersing the prototype board in an aqueous solution of reagent hydrochloric acid:water = 1:1 for 1 hour at room temperature). (This is the rate of deterioration of peel strength.) and a peel test after heating to evaluate oxidation resistance at high temperatures (a prototype board was heated to 180°C).
This is the peel strength after being allowed to cool after being held for 48 hours. )
At the same time, the amount of chromium and zinc deposited on the copper foil of the prototype board (the weight of these metals deposited per 1 dm 2 of copper foil) was measured using atomic absorption spectrometry for reference. The results are shown in Table 1.
【表】
表から実施例に示した三層構造の銅箔は、従来
の二層のものに較べ剥離強度と加熱後剥離試験結
果においては、同等またはそれ以上であると共
に、耐塩酸性においては本発明品が著しく優れた
性能を有していることを知り得た。
実施例 2
実施例1で述べたと同様の銅箔の粗面側に、実
施例1と同一条件においてクロム薄膜を形成後、
引続き該銅箔をZnSO4・6H2O2g/、
Na2Cr2O7・2H2O1g/、Na2SO42g/とか
らなりPHを4〜5の間に保持した水溶液中で室温
において電流密度を0.15A/dm2と0.5A/dm2の
2種類とし、通電時間は実施例1と同様にいずれ
も5秒間として電解し、前記銅箔のクロム薄膜上
に、クロムと亜鉛との混合薄膜を形成し、この銅
箔の混合薄膜面を実施例1で述べたと同様の樹脂
含浸基材と重ね、同一成形条件を採用して250×
250×1.2mmの銅張積層板試片を試作した。また、
上記試片と、その性能を比較するため、上記と同
一銅箔の粗面側に、クロム薄膜を形成することな
く、直接同一電解液を用いてクロムと亜鉛との混
合薄膜を形成した銅箔からも銅張積層板を試作
し、これら各試片について実施例1で述べたと同
様の特性と、参考までに銅箔に形成させた薄膜の
金属付着量も求めてみた。結果は表2に示す通り
である。[Table] From the table, the three-layer structure copper foil shown in the examples has peel strength and post-heat peel test results that are equal to or higher than the conventional two-layer copper foil, and has a superior hydrochloric acid resistance. We learned that the invented product has extremely superior performance. Example 2 After forming a chromium thin film on the rough side of the same copper foil as described in Example 1 under the same conditions as Example 1,
Subsequently, the copper foil was treated with ZnSO 4.6H 2 O2g/,
A current density of 0.15 A/dm 2 and 0.5 A/dm 2 at room temperature in an aqueous solution consisting of Na 2 Cr 2 O 7・2H 2 O 1 g/, Na 2 SO 4 2 g/, and the pH was maintained between 4 and 5. Electrolysis was carried out with the energization time being 5 seconds as in Example 1, and a mixed thin film of chromium and zinc was formed on the chromium thin film of the copper foil, and the mixed thin film surface of the copper foil was Layered with the same resin-impregnated base material as described in Example 1, and using the same molding conditions, 250×
A 250×1.2mm copper-clad laminate specimen was fabricated. Also,
In order to compare the performance with the above specimen, we created a copper foil with a mixed thin film of chromium and zinc directly using the same electrolyte without forming a chromium thin film on the rough side of the same copper foil as above. Copper-clad laminates were also made as prototypes, and the same characteristics as described in Example 1 were obtained for each of these specimens, and for reference, the amount of metal deposited in the thin film formed on the copper foil was also determined. The results are shown in Table 2.
【表】
表から実施例のものは、加熱後剥離試験結果に
おいては、比較例のものと同等またはそれ以上で
あると共に、耐塩酸性においては著しく優れた特
性を備えていることを認めた。
実施例 3
実施例1で述べたと全く同一の条件にて本発明
の三層構造の銅箔と比較例である従来の二層構造
の銅箔とを作製し、これら銅箔の混合薄膜面を、
硬化剤として第1級アミンを用いたガラス−エポ
キシ樹脂含浸基材と重ね、実施例1と同一条件で
銅張積層板試片を試作し、それら試片の特性と、
銅箔に形成させた金属薄膜の付着量を実施例1で
述べたと同様の方法で測定してみた。結果は表3
に示す通りである。[Table] From the table, it was found that the samples of Examples had the same or better properties than those of Comparative Examples in the post-heating peel test results, and had significantly superior properties in terms of hydrochloric acid resistance. Example 3 A three-layer structure copper foil of the present invention and a conventional two-layer structure copper foil as a comparative example were produced under exactly the same conditions as described in Example 1, and the mixed thin film surface of these copper foils was ,
Copper-clad laminate specimens were produced under the same conditions as in Example 1 by laminating a glass-epoxy resin-impregnated base material using a primary amine as a hardening agent, and the characteristics of these specimens were determined.
The amount of adhesion of the metal thin film formed on the copper foil was measured in the same manner as described in Example 1. The results are in Table 3
As shown.
【表】
表3から実施例のものは、従来のものに較べ加
熱後剥離試験結果においては同等またはそれ以上
であると共に、耐塩酸性を著しく向上できるもの
であることがわかる。特に本実施例により、従来
の二層構造のものでは、耐塩酸性の実用的な認定
試験値である剥離強度の劣化率15%の基準に合格
できない点を三層構造となしたことにより、充分
合格し得るものとなし得ることを知り得た。
実施例 4
実施例2において述べたと同一条件で本発明の
三層構造の銅箔と従来の二層構造の銅箔を作製
後、これらの試作銅箔を用いて実施例3において
述べたと同一条件で銅張積層板試片を試作し、そ
れら試片の特性と、銅箔に形成させた金属薄膜の
付着量を実施例1で述べたと同一条件で測定して
みた。
結果は表4に示す通りである。[Table] From Table 3, it can be seen that the samples of the examples are equivalent to or better than the conventional samples in terms of peeling test results after heating, and can significantly improve hydrochloric acid resistance. In particular, with this example, the three-layer structure is sufficient to overcome the point where the conventional two-layer structure cannot pass the standard of 15% deterioration rate of peel strength, which is a practical certification test value for hydrochloric acid resistance. I learned what it is possible to pass and what I can achieve. Example 4 After producing a three-layer structure copper foil of the present invention and a conventional two-layer structure copper foil under the same conditions as described in Example 2, the same conditions as described in Example 3 were carried out using these prototype copper foils. Test specimens of copper-clad laminates were made, and the characteristics of these specimens and the amount of adhesion of the metal thin film formed on the copper foil were measured under the same conditions as described in Example 1. The results are shown in Table 4.
【表】
表4から実施例のものは、従来のものに較べ加
熱後剥離試験結果においては同等ないしそれ以上
であり、その耐塩酸性においては、従来品に較べ
顕著に優れていることを認めた。
特に本実施例によれば、従来の二層構造のもの
が、耐塩酸性の実用的な認定試験値である剥離強
度の劣化率15%の基準に合格できなかつた点を三
層構造としたことにより合格するようなし得た点
に意義があると考える。
実施例 5
本発明の三層構造銅箔は、回路板にした場合、
回路板にサイドエツチングが発生しないことを示
すための実施例として、銅箔の光沢側面に実施例
1で述べたと同一の条件で、まずクロム薄膜を、
ついでその上に同一条件でクロムと亜鉛との混合
薄膜を形成して三層構造とし、一方、これと比較
のため該銅箔の光沢面に直接クロムと亜鉛との混
合薄膜のみを形成させた従来の二層構造の銅箔も
試作し、これら銅箔粗面に、それぞれブチルゴム
〜フエノール樹脂系接着剤を塗布し、その塗布面
を紙〜フエノール樹脂含浸基材と積層して、銅張
積層板試片を試作した。つぎに、この試片の銅箔
面に、市販のエツチングレジストにより配線パタ
ーンを印刷し、公知の塩化第二銅エツチング液を
用いてプリント回路部以外の銅箔を溶解除去し、
回路巾1mmのプリント回路板を試作した。。つい
で上記試作板に、前記サイドエツチングが発生し
ているかどうかを回路板の回路と基材との境界部
の金属組織を撮影した写真(倍率150倍)により
判定して見た。なお、第1図に示した写真は本発
明の三層構造のものであり、第2図は従来の二層
構造のものである。そして両写真の中央付近に白
く光つて見える連続線状部(以下、単に白線とい
う。)は境界部で、その上方は銅箔部またその下
方はエツチング処理により露出させた基材部分で
ある。両写真を対比すると、第1図では境界部の
金属組織(白線)は、略々直線であり、金属組織
にサイドエツチングがないことを示している。一
方、第2図の従来品は金属組織(白線)がジグザ
グとなつておりサイドエツチングが発生している
ことを認め得た。すなわち、本発明の銅箔は、プ
リント回路作製時のサイドエツチング発生防止に
も極めて効果があることを知り得た。
発明の効果
本発明の銅箔をプリント回路用に実用すれば、
従来の二層構造銅箔に較べ、その高温における耐
酸化性能は、同等ないしそれ以上であるばかり
か、耐塩酸性能においては、顕著にすぐれている
ことが明らかである。しかも、本発明のものはプ
リント回路板としてもサイドエツチングの発生が
ない。
さらに、本発明の銅箔は、その製造に当つて一
貫して酸性浴を使用するため、その量産にも好適
である。従つて、本発明は、プリント回路用とし
ての好適銅箔と、その製造方法を提供する発明で
あると考える。[Table] From Table 4, the products of the example were found to be equivalent to or better than the conventional products in terms of peeling test results after heating, and were significantly superior to the conventional products in terms of hydrochloric acid resistance. . In particular, according to this example, the conventional two-layer structure was unable to pass the standard of 15% deterioration rate of peel strength, which is a practical certification test value for hydrochloric acid resistance, but the three-layer structure was adopted. I think it is significant that we were able to pass the exam. Example 5 When the three-layer copper foil of the present invention is made into a circuit board,
As an example to demonstrate that side etching does not occur on the circuit board, a thin chromium film was first applied to the shiny side of the copper foil under the same conditions as described in Example 1.
Next, a mixed thin film of chromium and zinc was formed on top of it under the same conditions to create a three-layer structure, while for comparison, only a mixed thin film of chromium and zinc was directly formed on the shiny surface of the copper foil. We also prototyped conventional two-layer copper foils, coated the rough surfaces of these copper foils with butyl rubber and phenolic resin adhesives, and laminated the coated surfaces with paper and phenolic resin-impregnated base materials to create copper-clad laminates. A prototype plate was made. Next, a wiring pattern is printed on the copper foil surface of this sample using a commercially available etching resist, and the copper foil other than the printed circuit portion is dissolved and removed using a known cupric chloride etching solution.
We prototyped a printed circuit board with a circuit width of 1 mm. . Next, whether or not the side etching had occurred in the prototype board was determined by taking a photograph (150x magnification) of the metal structure at the boundary between the circuit of the circuit board and the base material. The photograph shown in FIG. 1 is of the three-layer structure of the present invention, and the photograph shown in FIG. 2 is of the conventional two-layer structure. The continuous linear area (hereinafter referred to simply as the white line) that appears near the center of both photographs is the boundary area, and above it is the copper foil section, and below it is the base material exposed by the etching process. Comparing the two photographs, the metal structure (white line) at the boundary in FIG. 1 is approximately straight, indicating that there is no side etching in the metal structure. On the other hand, in the conventional product shown in FIG. 2, the metal structure (white line) was zigzag, and it was recognized that side etching had occurred. In other words, it has been found that the copper foil of the present invention is extremely effective in preventing the occurrence of side etching during the production of printed circuits. Effects of the invention If the copper foil of the invention is put to practical use in printed circuits,
It is clear that the oxidation resistance at high temperatures is equal to or higher than that of conventional two-layer copper foils, and the hydrochloric acid resistance is significantly superior. Moreover, the product of the present invention does not cause side etching even when used as a printed circuit board. Furthermore, since the copper foil of the present invention uses an acid bath throughout its production, it is suitable for mass production. Therefore, the present invention is considered to provide a copper foil suitable for use in printed circuits and a method for manufacturing the same.
第1図および第2図は、本発明実施例5を説明
するため、本発明と従来銅箔に設けたプリント回
路と基材との境界部の金属組織を、それぞれ150
倍の拡大写真で示したものである。
In order to explain Example 5 of the present invention, FIGS. 1 and 2 show the metal structure of the boundary between the printed circuit and the substrate provided on the copper foil of the present invention and the conventional copper foil at 150°C, respectively.
This is shown in a double enlarged photograph.
Claims (1)
薄膜上に、さらにクロムと亜鉛とからなる混合薄
膜を形成させたことを特徴とするプリント回路用
銅箔。 2 銅箔を、6価クロムイオンを含む水溶液中に
浸漬するか或いは該水溶液中において通電して少
くとも、その一方の面にクロム薄膜を形成後、引
続きこれをクロムイオンおよび亜鉛イオンを含む
酸性水溶液中において通電し、前記クロム薄膜の
上に、さらにクロムと亜鉛とからなる混合薄膜を
形成させることを特徴とするプリント回路用銅箔
の製造方法。[Claims] 1. A copper foil for printed circuits, characterized in that a mixed thin film of chromium and zinc is further formed on a thin chromium film formed on at least one side of the copper foil. 2. After forming a thin chromium film on at least one surface of the copper foil by immersing it in an aqueous solution containing hexavalent chromium ions or by applying electricity in the aqueous solution, the copper foil is then immersed in an acidic solution containing chromium ions and zinc ions. A method for manufacturing copper foil for printed circuits, which comprises applying electricity in an aqueous solution to form a mixed thin film of chromium and zinc on the chromium thin film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18659184A JPS6167796A (en) | 1984-09-07 | 1984-09-07 | Copper foil for printed circuit and its production |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18659184A JPS6167796A (en) | 1984-09-07 | 1984-09-07 | Copper foil for printed circuit and its production |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6167796A JPS6167796A (en) | 1986-04-07 |
| JPH0259880B2 true JPH0259880B2 (en) | 1990-12-13 |
Family
ID=16191226
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18659184A Granted JPS6167796A (en) | 1984-09-07 | 1984-09-07 | Copper foil for printed circuit and its production |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6167796A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW208110B (en) * | 1990-06-08 | 1993-06-21 | Furukawa Circuit Foil Kk | |
| US5908544A (en) | 1997-09-04 | 1999-06-01 | Gould Electronics, Inc. | Zinc-chromium stabilizer containing a hydrogen inhibiting additive |
-
1984
- 1984-09-07 JP JP18659184A patent/JPS6167796A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6167796A (en) | 1986-04-07 |
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