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JPH0260972B2 - - Google Patents
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JPH0260972B2 - - Google Patents

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Publication number
JPH0260972B2
JPH0260972B2 JP63274543A JP27454388A JPH0260972B2 JP H0260972 B2 JPH0260972 B2 JP H0260972B2 JP 63274543 A JP63274543 A JP 63274543A JP 27454388 A JP27454388 A JP 27454388A JP H0260972 B2 JPH0260972 B2 JP H0260972B2
Authority
JP
Japan
Prior art keywords
optical
pulse
variable
wavelength
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63274543A
Other languages
Japanese (ja)
Other versions
JPH021526A (en
Inventor
Kyobumi Mochizuki
Hiroharu Wakabayashi
Yasuhiko Niino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Priority to JP63274543A priority Critical patent/JPH021526A/en
Publication of JPH021526A publication Critical patent/JPH021526A/en
Publication of JPH0260972B2 publication Critical patent/JPH0260972B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
  • Optical Communication System (AREA)

Description

【発明の詳細な説明】 (1) 発明の技術分野 本発明はピコ秒オーダの分解能を有する光分散
測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to an optical dispersion measuring device having a resolution on the order of picoseconds.

(2) 従来技術とその問題点 光フアイバ通信に使用する光の波長や中継伝送
する際の中継距離は、光フアイバの伝送損失と帯
域特性とによつて決定される。特に光フアイバの
もつ分散特性は波形歪を生起させ、デイジタル伝
送する際の伝送速度に制限を与える。従つて、極
低損失光フアイバを用いても光フアイバのもつ分
散特性によつて中継距離が制限されることもあ
り、光フアイバの分散特性の測定は伝送損失の測
定と同様非常に重要なことである。これらの測定
は普通短尺のフアイバを使用して行い、得られた
結果の長さの比に基づいて長尺のフアイバに適用
しているので、この場合短尺のフアイバにおける
小さな測定誤差も長尺のフアイバの分散特性には
大きな誤差となつて現れてしまう。以上の理由か
ら短尺のフアイバの分散特性の測定においては、
充分精度の高い測定装置が要求される。
(2) Prior art and its problems The wavelength of light used in optical fiber communication and the relay distance during relay transmission are determined by the transmission loss and band characteristics of the optical fiber. In particular, the dispersion characteristics of optical fibers cause waveform distortion, which limits the transmission speed during digital transmission. Therefore, even if an ultra-low-loss optical fiber is used, the dispersion characteristics of the optical fiber may limit the relay distance, so measuring the dispersion characteristics of the optical fiber is as important as measuring the transmission loss. It is. These measurements are usually made using short fiber lengths and applied to the long fibers based on the length ratio of the results obtained, in which case small measurement errors in the short fibers are also accounted for in the long fibers. This appears as a large error in the fiber's dispersion characteristics. For the above reasons, when measuring the dispersion characteristics of short fibers,
A measuring device with sufficiently high precision is required.

従来のこの種の測定装置は第1図に示すように
構成されている。ピコ秒光パルス発生器1から発
生する光パルスはビームスプリツタ2により2分
岐され、一方は光遅延路8を通つてカーシヤツタ
9に、他方は測定しようとする光フアイバ3に入
る。カーシヤツタ9は互いに直交した偏光子4,
5と、光カー効果により複屈折を生じる物質で満
たされたカーセル6とよりなり、光遅延路8を通
つた光パルスが、カーセル6に入射したときにの
みカーセル6中の物質は複屈折を生じ、カーシヤ
ツタ9は開き受光器7で受光されることになる。
光フアイバ3を通つた後の光パルスがカーシヤツ
タ9の開口時と一致し、最大のパワーが受光され
るように例えばプリズムからなる光遅延路8を動
かし、この光遅延路8が基準とした点からどれだ
け動いたかにより、基準点からのパルスの遅延量
が各波長ごとに測定され、その結果から分散特性
が求められる。この従来技術による測定装置に
は、カーシヤツタ開口のための光パルスのパワー
が数百MW/cm2以上なければ光フアイバからの出
力光を効率良く通すことができず、また1μm以上
の長波長帯において精度良くピコ秒パルスのパワ
ーを測定する受光器7がない。このため、測定波
長帯としては1μm以下に限られており、光フアイ
バ通信に有望視されている1.3μm、1.55μm帯の波
長での測定には使用できないという欠点があつ
た。
A conventional measuring device of this type is constructed as shown in FIG. An optical pulse generated from a picosecond optical pulse generator 1 is split into two by a beam splitter 2, one of which passes through an optical delay path 8 and enters a car shutter 9, and the other enters an optical fiber 3 to be measured. The car shutter 9 has polarizers 4 orthogonal to each other,
5 and a Kerr cell 6 filled with a substance that causes birefringence due to the optical Kerr effect, and the substance in the Kerr cell 6 exhibits birefringence only when the optical pulse that has passed through the optical delay path 8 is incident on the Kerr cell 6. As a result, the car shutter 9 opens and the light is received by the light receiver 7.
The optical delay path 8 made of, for example, a prism is moved so that the optical pulse after passing through the optical fiber 3 coincides with the opening of the car shutter 9 and the maximum power is received, and the optical delay path 8 is set as a reference point. The amount of delay of the pulse from the reference point is measured for each wavelength based on how much it has moved from the reference point, and the dispersion characteristics are determined from the results. This conventional measuring device cannot efficiently pass the output light from the optical fiber unless the optical pulse power for the car shutter aperture is several hundred MW/cm 2 or more, and the long wavelength band of 1 μm or more is required. There is no optical receiver 7 that can accurately measure the power of picosecond pulses. For this reason, the measurement wavelength band is limited to 1 μm or less, and it has the disadvantage that it cannot be used for measurements at wavelengths in the 1.3 μm and 1.55 μm bands, which are considered promising for optical fiber communications.

(3) 発明の目的 本発明は、これら従来技術の欠点を解決するた
めに、カーシヤツタの代わりに非線形結晶を用
い、被測定光伝送媒体を通つてきた光を和周波光
混合を用いて受光器の受光可能な波長帯に変換さ
せて測定する光分散測定装置を提供するものであ
る。
(3) Purpose of the Invention In order to solve the drawbacks of these conventional techniques, the present invention uses a nonlinear crystal instead of a car shutter and converts the light that has passed through the optical transmission medium to be measured into a light receiver using sum frequency optical mixing. The present invention provides an optical dispersion measuring device that converts light into a wavelength band that can receive light and then performs measurement.

(4) 発明の構成と作用 以下図面により本発明を詳細に説明する。(4) Structure and operation of the invention The present invention will be explained in detail below with reference to the drawings.

第2図は本発明の原理を説明するための図であ
つて、光源となるピコ秒光パルス発生器1aは、
光周波数ω1(波長λ1=光速C/周波数ω1)が一定
の参照光パルスを発生する光パルス発生器1−1
と、その参照光パルスに同期する波長可変な可変
光パルスを発生するパラメトリツク発振器1−2
とよりなつている。光周波数(以下、単に「周波
数」という)ω1の光パルスは、参照用として用
いられるもので光遅延路8を通つた後ビームスプ
リツタ10を介して例えばKDPやLiIO3などの非
線形結晶11に導かれる。一方、周波数ω1の参
照光パルスから得られた可変周波数ω2(波長λ2
光速C/周波数ω2)の可変光パルスは分散を測
定しようとする光フアイバ3に入り、その後、非
線形結晶11に入る。この非線形結晶11は、入
力となる周波数ω1と周波数ω2の光パルスが非線
形結晶11中で重ならない場合には、出力として
ω1,ω2,2ω1,2ω2の周波数の光パルスが発生
するだけであるが、両入力光パルスが非線形結晶
11中で重なつた場合には、出力として上記周波
数の光パルス以外に周波数(ω1+ω2)の強い光
パルスが発生する光非線形効果素子である。従つ
て周波数ω1,ω2は既知であるため、(ω1+ω2
の周波数のみに注目して光遅延路8を動かし、2
つのパルスの重なる点を求めることができる。次
に周波数ω2をΔωだけ変化させ、(ω2+Δω)の周
波数をもつ光パルスを光フアイバ3に入射させる
と、光フアイバ3のもつ分散特性により周波数
ω2と周波数(ω2+Δω)の光パルスの遅延量が異
なり、両パルスは非線形結晶11中で重ならなく
なる。そこで光遅延路8を動かし(ω1+ω2
Δω)の周波数に注目して両パルスの重なる点を
求める。この光遅延路8の位置が前回の位置から
例えばLだけずれたとすれば、周波数ω2の光パ
ルスと周波数(ω1+Δω)の可変光パルスとの遅
延差はL/C(C:光速)より求められる。Lは
数十ミクロンの精度で測定可能であるため、遅延
量はピコ秒以下の精度で測定できることになる。
このように周波数ω2を変えることにより、各周
波数での遅延差が測定でき、その値から光分散特
性を求めることができる。
FIG. 2 is a diagram for explaining the principle of the present invention, in which a picosecond optical pulse generator 1a serving as a light source is
Optical pulse generator 1-1 that generates a reference optical pulse with a constant optical frequency ω 1 (wavelength λ 1 = speed of light C/frequency ω 1 )
and a parametric oscillator 1-2 that generates a variable wavelength optical pulse synchronized with the reference optical pulse.
It's getting more and more familiar. A light pulse with an optical frequency (hereinafter simply referred to as "frequency") ω 1 is used as a reference, and after passing through an optical delay path 8, it is sent to a nonlinear crystal 11 such as KDP or LiIO 3 via a beam splitter 10. guided by. On the other hand , the variable frequency ω 2 (wavelength λ 2 =
A variable light pulse of light speed C/frequency ω 2 ) enters the optical fiber 3 whose dispersion is to be measured and then enters the nonlinear crystal 11 . This nonlinear crystal 11 outputs optical pulses with frequencies ω 1 , ω 2 , 2ω 1 , and 2ω 2 when the input optical pulses with frequencies ω 1 and ω 2 do not overlap in the nonlinear crystal 11 . However, when both input optical pulses overlap in the nonlinear crystal 11, an optical nonlinear effect occurs in which a strong optical pulse with a frequency of (ω 12 ) is generated in addition to the optical pulse with the above frequency as an output. It is element. Therefore, since the frequencies ω 1 and ω 2 are known, (ω 12 )
The optical delay path 8 is moved focusing only on the frequency of 2.
The point where two pulses overlap can be found. Next, when the frequency ω 2 is changed by Δω and an optical pulse with a frequency of (ω 2 +Δω) is made to enter the optical fiber 3, the dispersion characteristics of the optical fiber 3 cause the difference between the frequency ω 2 and the frequency (ω 2 +Δω). The amount of delay of the optical pulses is different, and the two pulses no longer overlap in the nonlinear crystal 11. Therefore, the optical delay path 8 is moved (ω 12 +
Focusing on the frequency of Δω), find the point where both pulses overlap. If the position of this optical delay path 8 deviates from the previous position by, for example, L, the delay difference between the optical pulse of frequency ω 2 and the variable optical pulse of frequency (ω 1 +Δω) is L/C (C: speed of light) More demanded. Since L can be measured with an accuracy of several tens of microns, the amount of delay can be measured with an accuracy of picoseconds or less.
By changing the frequency ω 2 in this manner, the delay difference at each frequency can be measured, and the optical dispersion characteristic can be determined from the value.

第2図の系統に従う場合には、被測定光伝送媒
体の光分散特性を高精度に測定することが可能で
あるが、被測定光伝送媒体の外に参照用の光伝送
路が必要であり、かつ、外部環境条件の変化によ
り両光伝送路間を伝播する参照光パルスと測定用
光パルスにばらつきが生じて誤差となつてしま
う。
When following the system shown in Figure 2, it is possible to measure the optical dispersion characteristics of the optical transmission medium to be measured with high precision, but a reference optical transmission path is required outside of the optical transmission medium to be measured. Moreover, variations in the reference light pulse and measurement light pulse propagating between the two optical transmission lines occur due to changes in external environmental conditions, resulting in errors.

本発明は、第2図の系統による測定装置のこの
欠点を解消することができるものであり、第3図
はその実施例である。この実施例では光源1aか
らの周波数ω2の可変光パルスと、波長一定(周
波数ω1)の参照光パルスが入射されている光遅
延路8からのその参照光パルスによる出力とが、
ビームスプリツタ10により合成されて、その合
成出力が被測定光伝送路となる光フアイバ3に入
力されている。
The present invention can overcome this drawback of the measuring device according to the system shown in FIG. 2, and FIG. 3 shows an embodiment thereof. In this embodiment, the variable optical pulse of frequency ω 2 from the light source 1a and the output of the reference optical pulse from the optical delay path 8 into which the reference optical pulse of constant wavelength (frequency ω 1 ) is input are as follows.
The beam splitter 10 combines the signals, and the combined output is input to the optical fiber 3, which serves as the optical transmission path to be measured.

第2図では参照光パルスは光フアイバ3を通ら
ず直接に非線形結晶11に導かれているが、可変
光パルスと参照光パルスの各波長が異なる場合に
は第3図のように参照用光パルスを測定用光パル
スと同様に光フアイバ3に通して測定することも
可能となり、これにより参照用光パルスと測定用
光パルスとのばらつきをなくすことができる。
In FIG. 2, the reference light pulse is guided directly to the nonlinear crystal 11 without passing through the optical fiber 3, but if the wavelengths of the variable light pulse and the reference light pulse are different, the reference light pulse is guided as shown in FIG. It is also possible to measure the pulse by passing it through the optical fiber 3 in the same way as the measurement light pulse, and thereby it is possible to eliminate variations between the reference light pulse and the measurement light pulse.

他の測定原理は第2図により説明されたものと
同様である。
The other measurement principles are similar to those explained with reference to FIG.

光フアイバのうちで伝搬可能なモードが1つし
かないシングルモードフアイバでは、偏波面の方
向によつて伝搬速度が異なることが知られている
が、この速度差が理論的には10〜20ピコ秒/Kmと
小さく、今まで短尺のフアイバでは測定不可能と
されていたが、これらもこの装置を用いることに
より測定可能となる。また、短尺のフアイバを使
用しての張力による光フアイバの伸び率もこの装
置を用いることによつて正確に測定することがで
きる。
It is known that in a single mode fiber, which has only one propagable mode among optical fibers, the propagation speed differs depending on the direction of the polarization plane, but theoretically this speed difference is 10 to 20 pico. It is small (sec/Km), and until now it was considered impossible to measure it with short fibers, but with this device it becomes possible to measure it. Furthermore, the elongation rate of an optical fiber due to tension when using a short fiber can also be accurately measured by using this device.

(5) 発明の効果 以上説明したように、本発明によれば非線形結
晶を波長変換とピコ秒シヤツタ用として用いてい
るため、今迄ピコ秒パルスを用いての分散測定が
不可能とされていた1μm帯の分散が精度良く測定
することができるほか、参照光パルスと測定用光
パルスとが同一光伝送路(光フアイバ3)を伝搬
するための外部環境変化に伴う誤差を防止するこ
とができ、さらに使用するパルスのピークパワー
が数KW/cm2程度でよいため扱いやすいという利
点がある。
(5) Effects of the Invention As explained above, according to the present invention, since a nonlinear crystal is used for wavelength conversion and picosecond shutter, dispersion measurement using picosecond pulses has been considered impossible until now. In addition to being able to measure dispersion in the 1 μm band with high accuracy, it is also possible to prevent errors caused by changes in the external environment because the reference light pulse and measurement light pulse propagate through the same optical transmission path (optical fiber 3). Moreover, it has the advantage that it is easy to handle because the peak power of the pulse used only needs to be about several KW/cm 2 .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の光分散測定装置の1例を示す構
成図、第2図は本発明の原理を説明するための系
統図、第3図は本発明の実施例を示す構成図であ
る。 1,1a……光パルス発生器(光源)、1−1
……光パルス発生器、1−2……パラメトリツク
発振器(光波長変換器)、1−3……ビームスプ
リツタ、1−4……光波長変換器、2……ビーム
スプリツタ、3……光フアイバ(被測定光伝送媒
体)、4,5……偏光子、6……カーセル、7…
…受光器、8……光遅延路、9……カーシヤツ
タ、10……ビームスプリツタ、11……非線形
結晶、12……受光器。
FIG. 1 is a block diagram showing an example of a conventional optical dispersion measuring device, FIG. 2 is a system diagram for explaining the principle of the present invention, and FIG. 3 is a block diagram showing an embodiment of the present invention. 1, 1a... Optical pulse generator (light source), 1-1
...Optical pulse generator, 1-2... Parametric oscillator (optical wavelength converter), 1-3... Beam splitter, 1-4... Optical wavelength converter, 2... Beam splitter, 3... ...Optical fiber (light transmission medium to be measured), 4, 5... Polarizer, 6... Kersel, 7...
... Light receiver, 8 ... Optical delay path, 9 ... Car shutter, 10 ... Beam splitter, 11 ... Nonlinear crystal, 12 ... Light receiver.

Claims (1)

【特許請求の範囲】[Claims] 1 短い時間幅の波長一定の参照光パルスと該参
照光パルスに同期しかつ異なる波長で短い時間幅
の波長可変の可変光パルスとを発生するための光
源と、前記参照光パルスが一端側に入射される遅
延量可変の可変光遅延路と、該可変光遅延路の他
端側の出力と前記可変パルスとが一端側に入射さ
れる被測定光伝送媒体と、前記被測定光伝送媒体
の他端側における各光出力パルスを受けとりそれ
らの各光パルスが重なつたときに該各光パルスの
該波長に対応する各周波数の和の成分が最大出力
となるように前記被測定光伝送媒体の他端側に配
置された光非線形効果素子と、該和の成分を検知
するための受光器とを備え、前記可変光パルスの
波長を順次変化させたときの前記波長に対応する
各周波数に対して前記和の成分が最大出力になる
ように調整される前記可変光遅延路の遅延量か
ら、前記被測定伝送媒体の光分散を測定するよう
に構成された光分散測定装置。
1. A light source for generating a reference light pulse with a constant wavelength and a short time width, and a variable wavelength light pulse with a short time width and a different wavelength in synchronization with the reference light pulse; a variable optical delay path whose delay amount is variable; an optical transmission medium to be measured into which the output of the other end of the variable optical delay path and the variable pulse are input; The optical transmission medium to be measured is configured such that when each optical output pulse at the other end is received and the optical pulses overlap, the component of the sum of each frequency corresponding to the wavelength of each optical pulse becomes the maximum output. an optical nonlinear effect element disposed on the other end side and a light receiver for detecting a component of the sum; An optical dispersion measurement device configured to measure optical dispersion of the transmission medium under test from a delay amount of the variable optical delay path that is adjusted so that the sum component has a maximum output.
JP63274543A 1988-11-01 1988-11-01 Light dispersion measuring instrument Granted JPH021526A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63274543A JPH021526A (en) 1988-11-01 1988-11-01 Light dispersion measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63274543A JPH021526A (en) 1988-11-01 1988-11-01 Light dispersion measuring instrument

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP287280A Division JPS56100324A (en) 1980-01-14 1980-01-14 Measuring device for light dispersion

Publications (2)

Publication Number Publication Date
JPH021526A JPH021526A (en) 1990-01-05
JPH0260972B2 true JPH0260972B2 (en) 1990-12-18

Family

ID=17543179

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63274543A Granted JPH021526A (en) 1988-11-01 1988-11-01 Light dispersion measuring instrument

Country Status (1)

Country Link
JP (1) JPH021526A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0215259A (en) * 1988-07-04 1990-01-18 Toyo Ink Mfg Co Ltd Image forming device and image forming method

Also Published As

Publication number Publication date
JPH021526A (en) 1990-01-05

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