JPH0262178B2 - - Google Patents
Info
- Publication number
- JPH0262178B2 JPH0262178B2 JP59150641A JP15064184A JPH0262178B2 JP H0262178 B2 JPH0262178 B2 JP H0262178B2 JP 59150641 A JP59150641 A JP 59150641A JP 15064184 A JP15064184 A JP 15064184A JP H0262178 B2 JPH0262178 B2 JP H0262178B2
- Authority
- JP
- Japan
- Prior art keywords
- particle
- scattered light
- light
- analysis device
- particle analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 30
- 238000001514 detection method Methods 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000009652 hydrodynamic focusing Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 239000006285 cell suspension Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
- G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
- G01N33/53—Immunoassay; Biospecific binding assay; Materials therefor
- G01N33/5302—Apparatus specially adapted for immunological test procedures
Landscapes
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Pathology (AREA)
- Urology & Nephrology (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Biomedical Technology (AREA)
- Molecular Biology (AREA)
- Hematology (AREA)
- Cell Biology (AREA)
- Microbiology (AREA)
- Biotechnology (AREA)
- Dispersion Chemistry (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Description
【発明の詳細な説明】
(技術分野)
本発明は粒子解析装置、特に高速で流れる細胞
浮遊溶液を流体力学的に集束させ該箇所にレーザ
光を照射し、前方散乱光及び、側方散乱光若しく
は側方での螢光散乱光を逐時検出して細胞粒子の
性質、構造を解析するようにした、いわゆるフロ
ーサイトメータに関する。Detailed Description of the Invention (Technical Field) The present invention relates to a particle analysis device, in particular, a particle analysis device that hydrodynamically focuses a cell suspension solution flowing at high speed and irradiates a laser beam to the point, and detects forward scattered light and side scattered light. Alternatively, the present invention relates to a so-called flow cytometer that analyzes the properties and structure of cell particles by sequentially detecting fluorescent light scattered from the side.
(従来技術)
従来、第1図、第2図に示すようにフローサイ
トメータにおいては細胞浮遊溶液を、そのまわり
のシース液とともにフローセル1内のフロー部2
に流し、流体力学的に所定箇所3で集束させ、こ
こに入射するレーザ光4も該箇所で光学的に集束
させるようにしている。(Prior Art) Conventionally, as shown in FIGS. 1 and 2, in a flow cytometer, a cell suspension solution is passed through a flow section 2 in a flow cell 1 together with a surrounding sheath fluid.
The laser beam 4 is caused to flow through the laser beam and focused at a predetermined location 3 hydrodynamically, and the laser beam 4 incident thereon is also optically focused at the location.
そして前方散乱光及び、側方散乱光若しくは螢
光散乱光の受光系5乃至8は前記集束箇所が時間
的に変動しないものとして固定して設けられてい
る。なお5,6はレンズ、7,8は光検知器であ
る。しかし流体力学的な集束箇所は時間的に変動
する可能性が高く、レーザ入射方向と直交する方
向すなわち第2図で上下方向に流体力学的な集束
箇所が変位した場合、次のような問題を生ずる。
すなわちレーザ光強度は、厳密には第3図に示す
如く、レーザ入射方向と直交する方向でガウス状
分布を有するため流体力学的な集束箇所がレーザ
入射方向と直交する方向にa〜cの如く変位した
場合、側方散乱光若しくは螢光散乱光の受光出力
更には前方散乱光の受光出力が変化することとな
る。 The light receiving systems 5 to 8 for forward scattered light, side scattered light, or fluorescent light scattered light are fixedly provided so that the focusing points thereof do not change over time. Note that 5 and 6 are lenses, and 7 and 8 are photodetectors. However, the hydrodynamic focusing point is likely to change over time, and if the hydrodynamic focusing point is displaced in the direction perpendicular to the laser incident direction, that is, in the vertical direction in Figure 2, the following problems may occur. arise.
Specifically, as shown in Figure 3, the laser light intensity has a Gaussian distribution in the direction perpendicular to the laser incidence direction, so the hydrodynamic focusing point is in the direction perpendicular to the laser incidence direction as shown in a to c. If it is displaced, the received light output of side scattered light or fluorescent light scattered light as well as the received light output of forward scattered light will change.
なお流体力学的な集束箇所がレーザ入射方向に
変位する場合は、前方散乱光及び、側方散乱光若
しくは螢光散乱光の受光出力は殆んど変化しない
と考えて良い。 Note that when the hydrodynamic focusing point is displaced in the laser incident direction, it can be considered that the received light output of forward scattered light, side scattered light, or fluorescent light scattered light hardly changes.
(目 的)
本発明は従来例の欠点に鑑み例えばフローサイ
トメータにおいて、流体力学的な集束箇所がレー
ザ入射方向と直交する方向に変位しても側方散乱
光若しくは螢光散乱光、更には前方散乱光の受光
出力に該変位が影響を与えないような粒子解析装
置を提供することを目的とする。(Purpose) In view of the drawbacks of the conventional examples, the present invention is intended to solve the problem of side scattered light, fluorescent light scattered light, It is an object of the present invention to provide a particle analysis device in which the displacement does not affect the received light output of forward scattered light.
(実施例)
第4図は本発明の実施例を示す。ここで既述し
た符合と同一のものは同一部材を示す。(Example) FIG. 4 shows an example of the present invention. Here, the same reference numerals as those already mentioned indicate the same members.
さて第4図で前方散乱光はビームスプリツター
9で分割され位置検出器10に入り、流体力学的
な集束位置の位置ずれを検出する。後述するよう
に位置検出器10の中心は予めレーザ入射中心位
置に設定されており流体力学的な集束位置は、出
力が最小となる位置として検出されレーザ入射中
心からの位置ずれ量がわかる。 Now, in FIG. 4, the forward scattered light is split by a beam splitter 9 and enters a position detector 10, which detects a positional shift in the hydrodynamic focusing position. As will be described later, the center of the position detector 10 is set in advance at the laser incidence center position, and the hydrodynamic focusing position is detected as the position where the output is minimum, and the amount of positional deviation from the laser incidence center can be determined.
本発明において、この検出された位置ずれ量に
応じて側方散乱光若しくは螢光散乱光の受光出力
更には前方散乱光の受光出力を補正する。 In the present invention, the received light output of side scattered light or fluorescent light scattered light and the received light output of forward scattered light are corrected according to the detected positional deviation amount.
前述の如く流体力学的な集束位置すなわち粒子
の位置によつて、粒子にあたる光強度はガウス分
布状に変化するから光検知器7,8から得られる
散乱光検出信号も第5図に示すようにガウス分布
状に変化する。 As mentioned above, depending on the hydrodynamic focusing position, that is, the position of the particles, the intensity of the light hitting the particles changes in a Gaussian distribution, so the scattered light detection signals obtained from the photodetectors 7 and 8 are also as shown in FIG. Changes in a Gaussian distribution.
粒子が本来の位置にあるときに得られる散乱光
受光出力をI0、該位置からレーザ入射方向と直交
方向にdだけずれたときに得られる散乱光受光出
力をIdとするとIdにI0/Idなる係数を掛けて補正
すれば変位に影響されない粒子解析ができる。こ
のI0/Idは第5図に示す如くガウス分布より予め
知り得る値である。なお側方散乱光若しくは螢光
散乱光の場合、前方散乱光を異なり光強度が弱く
このため受光レンズの開口数が大きいためにその
焦点深度が浅く、レーザ光強度が一定とした場合
にレーザ入射方向と直交方向にずれたときの受光
出力変化を補正するための係数を更に掛けると良
い。 Let I 0 be the scattered light receiving output obtained when the particle is in its original position, and Id be the scattered light receiving output obtained when the particle is shifted by d in the direction orthogonal to the laser incident direction from this position, then I 0 / By multiplying and correcting by a coefficient called Id, particle analysis that is not affected by displacement can be performed. This I 0 /Id is a value that can be known in advance from the Gaussian distribution as shown in FIG. Note that in the case of side scattered light or fluorescent light scattered light, unlike forward scattered light, the light intensity is weak, so the numerical aperture of the receiving lens is large, so its focal depth is shallow, and when the laser light intensity is constant, the laser incidence It is preferable to further multiply by a coefficient for correcting the change in the received light output when shifted in the direction orthogonal to the direction.
さて、位置検出器10は例えばCCDの如き光
センサーであつて、フロー部の中心に粒子があれ
ば、丁度その像が位置検出器10の中心に結ぶよ
うに配置されているため、位置検出器8上での光
強度分布は第6図に示す如くなる。 Now, the position detector 10 is an optical sensor such as a CCD, and is arranged so that if there is a particle at the center of the flow part, its image will be focused on the center of the position detector 10. The light intensity distribution on 8 is as shown in FIG.
aは第3図で粒子がaの位置すなわちフロー部
の中心にある時の光検出信号であり、b,cは
各々第3図のb,cの位置にある時の光検出信号
である。 In FIG. 3, a is a photodetection signal when the particle is at position a, that is, at the center of the flow section, and b and c are photodetection signals when the particle is at positions b and c in FIG. 3, respectively.
光検出信号は粒子の位置で最小出力となるから
粒子の位置のずれが検出できる。11は補正部で
あり、補正部11で粒子の位置に応じて光検知器
7,8のデータが補正され記憶部12に逐時記憶
される。 Since the optical detection signal has a minimum output at the position of the particle, a shift in the position of the particle can be detected. Reference numeral 11 denotes a correction section, which corrects the data of the photodetectors 7 and 8 according to the position of the particle, and stores the corrected data in the storage section 12 one by one.
そして記憶されたデータは最終的に例えばヒス
トグラムデータとして表示部13に表示される。 The stored data is finally displayed on the display section 13 as, for example, histogram data.
なお上記実施例においてはビームスプリツタ9
を光路中レンズ5と光検知器7の間に設けたがフ
ローセル1とレンズ5の間に設けても良い。 Note that in the above embodiment, the beam splitter 9
is provided between the lens 5 and the photodetector 7 in the optical path, but it may also be provided between the flow cell 1 and the lens 5.
そしてこの場合ビームスプリツタとレンズ5の
間に前方散乱光受光用の開口を設け、光検知器7
と位置検出器10への相互の受光画角を変えるこ
とが可能となる。 In this case, an aperture for receiving forward scattered light is provided between the beam splitter and the lens 5, and a photodetector 7 is provided.
It becomes possible to change the angle of view of light received by the position detector 10.
(効 果)
以上、本発明によれば被検体粒子の位置の測定
を行なうことによりその情報から測光量の補正を
行なうことによつて精度の高い粒子解析を行なう
ことができる。(Effects) As described above, according to the present invention, highly accurate particle analysis can be performed by measuring the position of the object particle and correcting the photometric amount from that information.
第1図はフローセルの外観図、第2図は従来例
の説明図、第3図はフロー部内の被検粒子とレー
ザ光強度分布の関係を示した図、第4図は本発明
の実施例の図、第5図は光検知器の受光面上での
散乱光強度分布の図、第6図は位置検出器から得
られる信号波形の図。
図中、1はフローセル、2はフロー部、7,8
は光検知器、9はビームスプリツタ、10は位置
検出器、11は補正部、12は記憶部、13は表
示部である。
Figure 1 is an external view of a flow cell, Figure 2 is an explanatory diagram of a conventional example, Figure 3 is a diagram showing the relationship between test particles in the flow section and laser light intensity distribution, and Figure 4 is an embodiment of the present invention. FIG. 5 is a diagram of the scattered light intensity distribution on the light receiving surface of the photodetector, and FIG. 6 is a diagram of the signal waveform obtained from the position detector. In the figure, 1 is a flow cell, 2 is a flow section, 7, 8
9 is a photodetector, 9 is a beam splitter, 10 is a position detector, 11 is a correction section, 12 is a storage section, and 13 is a display section.
Claims (1)
光を照射し、その散乱光又は蛍光を受光して粒子
解析を行なう粒子解析装置において、 被検位置に対する粒子位置を検出する位置検出
部と、該位置検出部で検出される粒子位置に応じ
て前記受光される散乱光又は蛍光の出力を補正す
る補正部を備えることを特徴とする粒子解析装
置。 2 前記位置検出部は前方散乱光の光路を分岐し
た光路内に設けられる特許請求の範囲第1項記載
の粒子解析装置。 3 前記粒子は照射光方向と垂直方向に1粒ずつ
流れる特許請求の範囲第1項記載の粒子解析装
置。 4 前記位置検出部の検出方向は照射光方向と粒
子の流れ方向に垂直である特許請求の範囲第3項
記載の粒子解析装置。[Claims] 1. In a particle analysis device that performs particle analysis by irradiating particles near a test position with light having a predetermined intensity distribution and receiving the scattered light or fluorescence, the particle position relative to the test position is determined. A particle analysis device comprising: a position detection section for detecting particles; and a correction section for correcting the output of the received scattered light or fluorescence according to the position of the particle detected by the position detection section. 2. The particle analysis device according to claim 1, wherein the position detection section is provided in an optical path that branches off the optical path of forward scattered light. 3. The particle analysis device according to claim 1, wherein the particles flow one by one in a direction perpendicular to the direction of the irradiation light. 4. The particle analysis device according to claim 3, wherein the detection direction of the position detection section is perpendicular to the irradiation light direction and the particle flow direction.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15064184A JPS6129737A (en) | 1984-07-20 | 1984-07-20 | Particle analysis device |
| US06/753,871 US4643566A (en) | 1984-07-20 | 1985-07-11 | Particle analyzing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15064184A JPS6129737A (en) | 1984-07-20 | 1984-07-20 | Particle analysis device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6129737A JPS6129737A (en) | 1986-02-10 |
| JPH0262178B2 true JPH0262178B2 (en) | 1990-12-25 |
Family
ID=15501287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15064184A Granted JPS6129737A (en) | 1984-07-20 | 1984-07-20 | Particle analysis device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6129737A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04129984U (en) * | 1991-05-21 | 1992-11-30 | 本田技研工業株式会社 | electromagnetic actuator |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2582797B2 (en) * | 1987-08-18 | 1997-02-19 | 新技術事業団 | Particle identification / separation method and device |
| US7821636B2 (en) | 2006-05-18 | 2010-10-26 | Massachusetts Institute Of Technology | Method and apparatus for measuring a position of a particle in a flow |
| US7772579B2 (en) | 2006-05-18 | 2010-08-10 | Massachusetts Institute Of Technology | Method and apparatus for simultaneously measuring a three dimensional position of a particle in a flow |
| JP4981569B2 (en) * | 2007-07-24 | 2012-07-25 | リオン株式会社 | Particle counter |
| US7920261B2 (en) | 2008-02-11 | 2011-04-05 | Massachusetts Institute Of Technology | Method and apparatus for detecting and discriminating particles in a fluid |
| JPWO2013145836A1 (en) * | 2012-03-30 | 2015-12-10 | ソニー株式会社 | Microchip type optical measuring apparatus and optical position adjusting method in the apparatus |
| EP3408643B1 (en) * | 2016-01-25 | 2021-12-01 | Plair SA | Method and device for detection and/or morphologic analysis of individual fluid-borne particles |
-
1984
- 1984-07-20 JP JP15064184A patent/JPS6129737A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04129984U (en) * | 1991-05-21 | 1992-11-30 | 本田技研工業株式会社 | electromagnetic actuator |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6129737A (en) | 1986-02-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |