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JPH0322698B2 - - Google Patents
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JPH0322698B2 - - Google Patents

Info

Publication number
JPH0322698B2
JPH0322698B2 JP15060884A JP15060884A JPH0322698B2 JP H0322698 B2 JPH0322698 B2 JP H0322698B2 JP 15060884 A JP15060884 A JP 15060884A JP 15060884 A JP15060884 A JP 15060884A JP H0322698 B2 JPH0322698 B2 JP H0322698B2
Authority
JP
Japan
Prior art keywords
case
semiconductor
section
semiconductor device
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15060884A
Other languages
Japanese (ja)
Other versions
JPS6130041A (en
Inventor
Kazuya Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP15060884A priority Critical patent/JPS6130041A/en
Publication of JPS6130041A publication Critical patent/JPS6130041A/en
Publication of JPH0322698B2 publication Critical patent/JPH0322698B2/ja
Granted legal-status Critical Current

Links

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  • Die Bonding (AREA)

Description

【発明の詳細な説明】 〔技術分野〕 本発明は半導体装置組立装置、特にセラミツク
ケース、ガラスケース等を対象とする半導体装置
組立装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a semiconductor device assembly apparatus, and particularly to a semiconductor device assembly apparatus for ceramic cases, glass cases, and the like.

〔従来技術〕[Prior art]

従来の装置では、半導体パツケージ(以後ケー
スと略す)の供給、収納はすべてケースが上向き
の状態で行なわれていた。これは、ケースの作業
面(ダイポンデイング、ワイヤーボンデイングが
行なわれる面)が上向きであるので当然の事と思
われていた。しかし、ケースが上向きの状態で
は、作業中にケースのキヤビテイ内に発生する半
導体ペレツト(以後ダイと略す)のシリコンく
ず、混入するワイヤのくず、及び作業待ち時間中
に混入する異物がそのままの状態で残つてしま
う。今日、ダイ表面上のパターン配線は更に微細
化、高密度化し、電極パツドと外部リードを接続
する各ワイヤ間隔もより狭くなつてきている。
In conventional devices, semiconductor packages (hereinafter referred to as cases) are supplied and stored with the cases facing upward. This was thought to be natural since the work surface of the case (the surface on which die bonding and wire bonding are performed) faces upward. However, when the case is facing upward, silicon chips from semiconductor pellets (hereinafter referred to as dies) that are generated inside the case cavity during work, wire scraps that get mixed in, and foreign objects that get mixed in while waiting for work remain as they are. It will remain. Today, pattern wiring on the surface of a die is becoming finer and denser, and the distance between each wire connecting an electrode pad and an external lead is also becoming narrower.

従つて、ケースのキヤビテイ内にダイのシリコ
ンくず、ワイヤのくず及び異物が入つた状態はダ
イ表面、各ワイヤ間の短絡、ワイヤの裂傷等の原
因となり、製品としての品質、信頼性が著しく低
下する。
Therefore, if silicon chips from the die, wire chips, or other foreign objects get inside the case cavity, this can cause short circuits on the die surface, wires, and tearing of the wires, significantly reducing the quality and reliability of the product. do.

〔発明の目的〕[Purpose of the invention]

本発明の目的はケース供給部と作業部(ダイボ
ンデイング部、ワイヤボンデイング部)との間と
作業部とケース収納部との間にケース反転機構を
設け、作業部以外ではケースを下向きに置くこと
により、作業待ち時間に異物が混入することを防
止すると共に、作業時に発生、混入する、ダイの
くず、ワイヤのくずを落下させ、ケースキヤビテ
イ内から異物を除去することにより、高信頼性、
高品質の製品を製造することを可能とした半導体
装置組立装置を提供することにある。
The purpose of the present invention is to provide a case reversing mechanism between the case supply section and the working section (die bonding section, wire bonding section) and between the working section and the case storage section, and to place the case downward in areas other than the working section. This prevents foreign objects from entering during work waiting time, and also removes die scraps and wire scraps that are generated and mixed during work, and removes foreign objects from inside the case cavity, resulting in high reliability.
The purpose of the present invention is to provide a semiconductor device assembly device that enables the manufacture of high-quality products.

〔発明の構成〕[Structure of the invention]

本発明によると半導体パツケージのキヤビテイ
内に半導体ペレツトを接着するダイボンダと、そ
の接着された半導体ペレツトの電極パツドとケー
スのキヤビテイ内のリードを金属ワイヤで接合す
るワイヤボンダとを含む半導体装置組立装置にお
いて、前記半導体パツケージが供給側から収納側
に到る間に反転される機構を付加した事を特徴と
する半導体装置組立装置が得られる。
According to the present invention, a semiconductor device assembly apparatus includes a die bonder for bonding a semiconductor pellet in a cavity of a semiconductor package, and a wire bonder for bonding an electrode pad of the bonded semiconductor pellet and a lead in a case cavity with a metal wire. There is obtained a semiconductor device assembly apparatus characterized in that a mechanism is added for inverting the semiconductor package while the semiconductor package goes from the supply side to the storage side.

〔実施例〕〔Example〕

次に本発明の実施例を図面を用いて説明する。 Next, embodiments of the present invention will be described using the drawings.

第1図は本発明の一実施例のうち反転機構の構
成図、第2図は本発明の構成を示す概略図で、a
はケース供給部、cはケース収納部、bは作業部
(ダイボンデイング部又はワイヤーボンデイング
部)、d,d′はケース反転部、7,7′,8,8′
はケース搬送用レール(レール)である。
FIG. 1 is a configuration diagram of a reversing mechanism in an embodiment of the present invention, and FIG. 2 is a schematic diagram showing the configuration of the present invention.
is the case supply part, c is the case storage part, b is the working part (die bonding part or wire bonding part), d, d' are the case reversing part, 7, 7', 8, 8'
is a case transport rail.

第1図、第2図においてケース収納部c(第2
図)に下向き(作業面が下)に配置されているケ
ース10は順次取出され図示しないケース送り機
構によりレール8上を通つて反転部1に達する。
反転部1は真空吸着口2(配管は図示せず)を持
ち、これによりケース10は固定される。ケース
10が反転部1内へ入ると図示しないセンサ系に
よりモータ6が回転し、モータ軸3の延長上にあ
るスリツトカム4のスリツトがセンサ5に入ると
モータ6は止まる。このことにより、ケース10
は180度回転、すなわち反転させられ、作業面が
上のケース9となる。
In Figs. 1 and 2, case storage section c (second
The cases 10, which are disposed facing downward (with the working surface facing downwards) as shown in FIG.
The reversing section 1 has a vacuum suction port 2 (piping not shown), and the case 10 is fixed by this. When the case 10 enters the reversing section 1, the motor 6 is rotated by a sensor system (not shown), and when the slit of the slit cam 4, which is an extension of the motor shaft 3, enters the sensor 5, the motor 6 stops. Due to this, case 10
is rotated 180 degrees, that is, inverted, and becomes case 9 with the working surface facing upward.

この後、ケース9は作業部(第2図b)で作業
終了後、レール7′(第2図)を通つて反転部
d′(第2図)で再び反転され下向きのケース10
の状態で、収納部a(第2図)に収納される。
After this, the case 9 passes through the rail 7' (Fig. 2) to the reversing part after completing the work in the working part (Fig. 2b).
Case 10 is reversed again at d′ (Figure 2) and faces downward.
It is stored in storage section a (Fig. 2) in this state.

〔発明の効果〕〔Effect of the invention〕

以上のように、本発明は、作業待ち時間に異物
がケースキヤビテイ内に混入することを防止する
と共に、作業時に発生、又は混入するダイのくず
やワイヤのくずを落下させ、ケースキヤビテイ内
からこれら異物を除去させ高信頼性、高品質の半
導体製品の製造が可能となる効果がある。
As described above, the present invention prevents foreign matter from entering the case cavity while waiting for work, and also allows die scraps and wire scraps generated or mixed in during work to fall, thereby preventing foreign matter from entering the case cavity. This has the effect of removing these foreign substances from the substrate and making it possible to manufacture highly reliable and high quality semiconductor products.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の機構のうち反転用
機構部の構成図、第2図は本発明の一実施例の構
成概略図である。 1……反転部、2……真空吸着口、3……駆動
軸、4……スリツトカム、5……センサ、6……
モータ、7,8,7′,8′……搬送用レール、
9,10……ケース、a……収納部、b……作業
部、c……供給部、d,d′……反転機構部。
FIG. 1 is a block diagram of a reversing mechanism part of a mechanism according to an embodiment of the present invention, and FIG. 2 is a schematic diagram of the structure of an embodiment of the present invention. 1... Reversing part, 2... Vacuum suction port, 3... Drive shaft, 4... Slit cam, 5... Sensor, 6...
Motor, 7, 8, 7', 8'... Conveyance rail,
9, 10... Case, a... Storage section, b... Working section, c... Supply section, d, d'... Reversing mechanism section.

Claims (1)

【特許請求の範囲】[Claims] 1 半導体パツケージのキヤビテイ内に半導体ペ
レツトを接着するダイボンダと、その接着された
半導体ペレツトの電極パツドとケースのキヤビテ
イ内のリードを金属ワイヤで接合するワイヤボン
ダとを含む半導体装置組立装置において、前記半
導体パツケージが供給側から収納側に到る間に反
転される機構を付加した事を特徴とする半導体装
置組立装置。
1. A semiconductor device assembly apparatus including a die bonder for bonding a semiconductor pellet in a cavity of a semiconductor package, and a wire bonder for bonding an electrode pad of the bonded semiconductor pellet and a lead in a cavity of a case with a metal wire. 1. A semiconductor device assembly apparatus characterized in that a mechanism is added for inverting the semiconductor device from the supply side to the storage side.
JP15060884A 1984-07-20 1984-07-20 Semiconductor device assembling apparatus Granted JPS6130041A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15060884A JPS6130041A (en) 1984-07-20 1984-07-20 Semiconductor device assembling apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15060884A JPS6130041A (en) 1984-07-20 1984-07-20 Semiconductor device assembling apparatus

Publications (2)

Publication Number Publication Date
JPS6130041A JPS6130041A (en) 1986-02-12
JPH0322698B2 true JPH0322698B2 (en) 1991-03-27

Family

ID=15500600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15060884A Granted JPS6130041A (en) 1984-07-20 1984-07-20 Semiconductor device assembling apparatus

Country Status (1)

Country Link
JP (1) JPS6130041A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6156078A (en) * 1991-09-16 2000-12-05 Sgs-Thomson Microelectronics Sdn. Bhd. Testing and finishing apparatus for integrated circuit package units
JP3499375B2 (en) * 1996-07-02 2004-02-23 ユニ・チャーム株式会社 Absorbent sheet and method for producing the same
JP3675601B2 (en) * 1996-09-12 2005-07-27 ユニ・チャーム株式会社 Absorber
JP4599063B2 (en) * 2004-01-15 2010-12-15 株式会社東芝 Coil winding insulation tape

Also Published As

Publication number Publication date
JPS6130041A (en) 1986-02-12

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