JPH032431B2 - - Google Patents
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- Publication number
- JPH032431B2 JPH032431B2 JP13656883A JP13656883A JPH032431B2 JP H032431 B2 JPH032431 B2 JP H032431B2 JP 13656883 A JP13656883 A JP 13656883A JP 13656883 A JP13656883 A JP 13656883A JP H032431 B2 JPH032431 B2 JP H032431B2
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- Prior art keywords
- voltage
- impulse
- phase
- test
- conductors
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Description
【発明の詳細な説明】
〔発明の属する技術分野〕
本発明は遮断器、密閉開閉装置、高圧配電盤等
の電気機器において、対地絶縁の耐電圧を上廻る
可能性のある電圧を印加して行う異相導体間ある
いは同相極間インパルス電圧試験における試験回
路に関する。[Detailed description of the invention] [Technical field to which the invention pertains] The present invention is carried out by applying a voltage that may exceed the withstand voltage of ground insulation in electrical equipment such as circuit breakers, sealed switchgear, and high-voltage switchboards. Concerning test circuits for impulse voltage tests between conductors of different phases or between poles of the same phase.
高電圧電気機器において、異常電圧に対する絶
縁協調としては、一般に、異相間（相間絶縁）ま
たは同相の極間（極間絶縁）の絶縁耐力は、高電
圧導体と容器等の金属体との間（対地絶縁）の絶
縁耐力より高くすることが必要である。たとえ
ば、相間絶縁は対地絶縁の1.5倍、極間絶縁は対
地絶縁の1.15倍にとられるのが普通である。この
ような仕様で設計、製作された電気機器のインパ
ルス電圧試験を行う場合、インパルス電圧発生器
の一方の端子は接地電位であるために、たとえば
相間絶縁試験では必ず他相を接地しなければなら
ない。この場合必然的に対地絶縁側にも電圧が印
加される。相間絶縁の検証は、対地絶縁の場合よ
り1.5倍高い電圧を印加しなければならないので、
試験回路に工夫のない限り相間の試験において対
地絶縁が耐えられなくなるおそれがある。また、
他相または他極が接地されることは実際の運転状
態では有り得ないので、理想的な試験方法とはい
えない欠点がある。
In high-voltage electrical equipment, the dielectric strength between different phases (phase-to-phase insulation) or between poles of the same phase (pole-to-pole insulation) is the dielectric strength between a high-voltage conductor and a metal object such as a container ( It is necessary to have a dielectric strength higher than that of the ground insulation. For example, phase-to-phase insulation is usually 1.5 times the earth insulation, and interpole insulation is 1.15 times the earth insulation. When performing impulse voltage tests on electrical equipment designed and manufactured to such specifications, one terminal of the impulse voltage generator is at ground potential, so for example, during phase-to-phase insulation tests, the other phase must be grounded. . In this case, a voltage is necessarily applied to the ground insulation side as well. Verification of phase-to-phase insulation requires applying a voltage 1.5 times higher than that for ground insulation, so
Unless the test circuit is devised, there is a risk that the ground insulation will not be able to withstand the phase-to-phase test. Also,
Since it is impossible for the other phase or the other pole to be grounded under actual operating conditions, it has the disadvantage that it is not an ideal testing method.
また同相の極間絶縁の検証においても、対地絶
縁の1.15倍の電圧が印加されるために、一方の導
体を接地する試験回路では前記相間試験の場合と
同様な問題点が生ずる。 Also, when verifying insulation between poles of the same phase, a voltage 1.15 times higher than that of the ground insulation is applied, so a test circuit in which one conductor is grounded will have the same problem as in the case of the phase-to-phase test.
第１，２図は前述の問題点を改善した従来のイ
ンパルス電圧試験回路の接続図で、第１図は相間
試験回路、第２図は極間試験回路の例を示し、い
ずれも供試機器が三相一括形遮断器の場合を示し
ている。図において、１はインパルス電圧発生
器、２は直流電圧、交流電圧、インパルス電圧等
の高電圧発生装置、４は供試遮断器で４ａは接地
して使用される容閉容器（金属体）、４ｂは各相
遮断部、４ｃは高電圧導体、５はブツシングであ
る。第１図の相間試験回路の場合、密閉容器４ａ
は接地され、各相遮断部４ｂは閉状態で１相はイ
ンパルス電圧発生器１に接続され、他の２相は高
電圧発生装置２に接続される。このような試験回
路によつて遮断器４の相関には二つの電圧発生装
置１および２によつて電圧が印加されるが、イン
パルス電圧発生器１の発生電圧を遮断器４の対地
絶縁（４ｂ，４ａ間）が耐える電圧以下に制限
し、試験電圧の不足分は他端の発生装置２から逆
極性の電圧を供給する。このように二つの高電圧
発生装置１および２の発生電圧を対地絶縁部の耐
電圧値を考慮して決めることにより対地絶縁部に
過剰な電圧を印加することなく相関インパルス電
圧試験を実施できる。第２図の極間試験において
も遮断部４ｂを開極して二つの発生装置１，２か
ら極間に互いに逆極性の電圧を印加することによ
り相間試験と同様に極間インパルス電圧試験を実
施できる。ところがこの方法は、電圧発生装置を
２台必要とし、かつ両者の電圧発生位相を調整し
て極性が互いに逆になるようにする同期回路８が
必要である。また、供試器４が絶縁破壊した場
合、その破壊電流が相手の発生装置２に流れ込み
発生装置２を損傷させてしまう危険性があるため
に、発生装置２を保護するため、放電ギヤツプな
どの保護回路３を必要とする。さらに両側に電圧
発生装置があるためによく注意しないと回路によ
つては各発生器の発生電圧が供試器４の相間また
は極間の静電容量と相手側発生器のインピーダン
スとで分圧してしまい、供試器４の相間または極
間にかかつた電圧を求める場合に、各発生器の電
圧の単純和とならないことが生じる。 Figures 1 and 2 are connection diagrams of conventional impulse voltage test circuits that have improved the above-mentioned problems. Figure 1 shows an example of a phase-to-phase test circuit, and Figure 2 shows an example of a pole-to-pole test circuit. shows the case of a three-phase lumped circuit breaker. In the figure, 1 is an impulse voltage generator, 2 is a high voltage generator such as DC voltage, AC voltage, or impulse voltage, 4 is a test circuit breaker, and 4a is a closed container (metallic body) that is used while being grounded. Reference numeral 4b represents a phase cutoff portion, 4c represents a high voltage conductor, and 5 represents a bushing. In the case of the phase-to-phase test circuit shown in Figure 1, the closed container 4a
is grounded, each phase cutoff section 4b is in a closed state, one phase is connected to the impulse voltage generator 1, and the other two phases are connected to the high voltage generator 2. With such a test circuit, voltage is applied to the circuit breaker 4 by the two voltage generators 1 and 2, and the voltage generated by the impulse voltage generator 1 is applied to the ground insulation (4b) of the circuit breaker 4. . In this way, by determining the voltages generated by the two high voltage generators 1 and 2 in consideration of the withstand voltage value of the ground insulating section, the correlated impulse voltage test can be performed without applying an excessive voltage to the ground insulating section. In the inter-electrode test shown in Fig. 2, an inter-electrode impulse voltage test is carried out in the same way as the inter-phase test by opening the interrupter 4b and applying voltages of opposite polarity between the two generators 1 and 2 between the electrodes. can. However, this method requires two voltage generators and a synchronization circuit 8 that adjusts the voltage generation phases of both so that the polarities are opposite to each other. In addition, if the test device 4 suffers dielectric breakdown, there is a risk that the breakdown current will flow into the other generator 2 and damage the generator 2, so in order to protect the generator 2, a discharge gap or other Requires protection circuit 3. Furthermore, since there are voltage generators on both sides, depending on the circuit, if you are not careful, the voltage generated by each generator may be divided by the capacitance between phases or poles of the EUT 4 and the impedance of the other generator. Therefore, when determining the voltage applied between the phases or poles of the device under test 4, it may not be a simple sum of the voltages of each generator.
本発明は上述の状況に鑑みてなされたもので、
インパルス電圧発生器１台を用いて対地絶縁部に
過剰な電圧を印加することなく相間および極間の
インパルス電圧発生ができる試験回路を提供する
ことを目的とする。
The present invention was made in view of the above situation, and
It is an object of the present invention to provide a test circuit that can generate impulse voltages between phases and between poles without applying an excessive voltage to a ground insulating part using a single impulse voltage generator.
本発明によれば、上述の目的は、充電部に対向
し常時は接地して使われる供試機器のタンク、ケ
ース、支持台あるいは鉄心等の金属体を絶縁架台
等の絶縁装置を用いて大地から絶縁し、供試機器
の一方の被電圧印加導体をインパルス電圧発生器
の高圧端子に接続し、残る他方の被電圧印加導体
を直接接地し、インパルス電圧発生器に並列に設
けられた分圧手段の中間電位タツプに前記供試機
器の金属体を接続し、インパルス電圧発生器の発
生電圧の一部分を前記絶縁架台等の絶縁装置に負
担させて供試機器の対地絶縁部の負担電圧を減ら
し、前記一方と他方の被電圧印加導体間に所定の
相間または極間インパルス試験電圧が印加される
よう試験回路を構成することにより達成された。
According to the present invention, the above-mentioned object is to ground metal bodies such as tanks, cases, supports, or iron cores of equipment under test that face live parts and are normally grounded using an insulating device such as an insulating frame. Connect one voltage-applying conductor of the equipment under test to the high-voltage terminal of the impulse voltage generator, connect the remaining voltage-applying conductor directly to the A metal body of the equipment under test is connected to the intermediate potential tap of the means, and a portion of the voltage generated by the impulse voltage generator is borne by the insulating device such as the insulating frame to reduce the voltage burden on the ground insulation part of the equipment under test. This was achieved by configuring a test circuit so that a predetermined interphase or interpole impulse test voltage is applied between the one and the other voltage-applied conductors.
以下本発明の実施例を添付図面を参照しつつ説
明する。
Embodiments of the present invention will be described below with reference to the accompanying drawings.
第３，４図は本発明の実施例を示すインパルス
電圧試験回路の接続図で、第３図は相間試験回
路、第４図は極間試験回路である。図において、
供試三相一括遮断器４の密閉容器４ａは絶縁架台
等の絶縁装置１０によつて大地から絶縁されてお
り、印加線１２によりインパルス電圧発生器１と
並列に設けられた放電抵抗器あるいは分圧抵抗器
等の分圧手段１１の中間電位タツプｍに接続され
ている。一方供試器４の遮断部４ｂ、高電圧導体
４ｃ、ブツシング５等からなる被電圧印加導体
は、第３図の相間試験ではたとえばＡ相導体が印
加線６によつてインパルス電圧発生器１の高圧端
子および分圧手段１１の高圧端子Ｈに接続され、
Ｂ相およびＣ相の導体は直接接地される。また第
４図の極間試験では遮断部４ｂが開極されて一方
の極側は各相並列にインパルス電圧発生器の高圧
端に接続され、他方の極側は各相とも接地され
る。このように接続された試験回路においてイン
パルス電圧発生器１の出力電圧は供試遮断器の相
間または極間に印加されるが、密閉容器４ａには
分圧手段１１によつて所定の分圧比で分圧された
中間電位が印加され、その結果インパルス電圧発
生器の出力電圧は供試遮断器４の対地絶縁部（た
とえば４ａと４ｂ間）と絶縁装置１０とによつて
所定の比率で分担される。したがつて供試遮断器
４の対地絶縁部に印加される電圧は、密閉容器
（金属体）４ａを接続する分圧手段１１の中間電
位タツプｍを変えることにより、任意に選択する
ことができ、インパルス電圧発生器１によつて供
試機器の対地絶縁部に過剰な電圧を印加すること
なく、相間または極間のインパルス電圧試験を行
なうという本発明の目的を達成できる。 3 and 4 are connection diagrams of an impulse voltage test circuit showing an embodiment of the present invention. FIG. 3 is a phase-to-phase test circuit, and FIG. 4 is an inter-electrode test circuit. In the figure,
The hermetically sealed container 4a of the three-phase bulk circuit breaker 4 under test is insulated from the ground by an insulating device 10 such as an insulating frame, and connected to a discharge resistor or a divider installed in parallel with the impulse voltage generator 1 by an application line 12. It is connected to an intermediate potential tap m of voltage dividing means 11 such as a piezoresistor. On the other hand, in the phase-to-phase test shown in FIG. connected to a high voltage terminal and a high voltage terminal H of the voltage dividing means 11;
The B-phase and C-phase conductors are directly grounded. Further, in the interpolation test shown in FIG. 4, the interrupting part 4b is opened, one pole side is connected to the high voltage end of the impulse voltage generator in parallel to each phase, and the other pole side is grounded to each phase. In the test circuit connected in this way, the output voltage of the impulse voltage generator 1 is applied between the phases or between the poles of the circuit breaker under test, but the output voltage is applied to the sealed container 4a at a predetermined partial pressure ratio by the voltage dividing means 11. A divided intermediate potential is applied, so that the output voltage of the impulse voltage generator is shared in a predetermined ratio between the ground insulation part of the circuit breaker under test 4 (for example, between 4a and 4b) and the isolation device 10. Ru. Therefore, the voltage applied to the ground insulation part of the test circuit breaker 4 can be arbitrarily selected by changing the intermediate potential tap m of the voltage dividing means 11 connecting the closed container (metallic body) 4a. The object of the present invention, which is to perform an impulse voltage test between phases or between poles, can be achieved without applying an excessive voltage to the ground insulation part of the equipment under test using the impulse voltage generator 1.
第５，６，７図は前述の実施例における分圧手
段の構成を説明するための試験回路の等価回路図
である。図においてCtは供試機器の試験電圧が
印加される相間または極間の静電容量、Cpはイ
ンパルス電圧が印加される導体と密閉容器等の金
属体との間（対地絶縁）の静電容量、Ceは絶縁
装置１０によつて絶縁された金属体の対地静電容
量である。第５図は分圧手段として抵抗分圧器１
１を用いた場合の等価回路で、ｍ−Ｈ間の抵抗１
１ａとｍ−Ｅ間の抵抗１１ｂにそれぞれ静電容量
CpおよびCeが並列接続される形になるため、中
間電位タツプｍの電位は供試機器の静電容量Cp
およびCeの影響を受けることになる。したがつ
て供試機器４の金属体４ａの電位を決める場合に
は静電容量CpおよびCeの影響を考慮して中間電
位タツプｍの位置が決定される。また抵抗分圧器
としてインパルス電圧発生器の放電抵抗器を利用
すれば、一般に抵抗値が低いためにCp，Ceの影
響を少なくできて便利である。 5, 6, and 7 are equivalent circuit diagrams of the test circuit for explaining the configuration of the voltage dividing means in the above-described embodiment. In the figure, Ct is the capacitance between phases or poles to which the test voltage of the equipment under test is applied, and Cp is the capacitance between the conductor to which the impulse voltage is applied and a metal body such as a sealed container (ground insulation). , Ce is the ground capacitance of the metal body insulated by the insulating device 10. Figure 5 shows a resistor voltage divider 1 as a voltage dividing means.
In the equivalent circuit when using 1, the resistance 1 between m and H
1a and the capacitance of the resistor 11b between m-E.
Since Cp and Ce are connected in parallel, the potential of the intermediate potential tap m is the capacitance Cp of the equipment under test.
and will be affected by Ce. Therefore, when determining the potential of the metal body 4a of the device under test 4, the position of the intermediate potential tap m is determined in consideration of the influence of the capacitances Cp and Ce. Furthermore, if the discharge resistor of the impulse voltage generator is used as a resistive voltage divider, it is convenient because the influence of Cp and Ce can be reduced because the resistance value is generally low.
第６図は分圧手段の変形例を示したもので、静
電容量CpとCeの大きさの比が抵抗１１ａと１１
ｂの大きさの比と大幅に異なる場合、静電容量
C1またはC2のいずれかをＨ−ｍ間またはｍ−Ｅ
間に接続することにより、印加電圧波形の変歪を
防ぎ、中間電位タツプｍの電位を抵抗分圧器１１
の分圧比に近づけることができる。 FIG. 6 shows a modification of the voltage dividing means, in which the ratio of the capacitances Cp and Ce is the same as that of the resistors 11a and 11.
If the ratio of the magnitude of b is significantly different, the capacitance
Either C 1 or C 2 between H-m or m-E
By connecting between the resistor voltage divider 11 and the resistor voltage divider 11, the potential of the intermediate potential tap m is
It is possible to approach the partial pressure ratio of
第７図は分圧手段としてコンデンサ形分圧器２
１を用いた場合の例で、インパルス電圧発生器１
の出力電圧波形の調整用に比較的容量の大きい波
頭調整用コンデンサを備える場合には、このコン
デンサを分圧手段として利用することができる。 Figure 7 shows a capacitor type voltage divider 2 as a voltage dividing means.
In this example, impulse voltage generator 1 is used.
When a wavefront adjustment capacitor with a relatively large capacity is provided for adjusting the output voltage waveform of the output voltage waveform, this capacitor can be used as a voltage dividing means.
本発明によれば、実施例を示す第２図における
ように常時接地して使用される供試機器４の容器
等の金属体４ａを、絶縁架台あるいは懸垂碍子等
の絶縁装置１０によつて大地から絶縁してインパ
ルス電圧発生器１に並列に設けられた分圧手段１
１の中間電位タツプｍに接続し、被電圧印加導体
の一方をインパルス電圧発生器の高圧端に、他方
の導体を接地するよう構成した。その結果供試機
器の相間あるいは極間には所定のインパルス試験
電圧が印加され、このとき供試機器の対地絶縁部
には絶縁装置１０に負担される電圧分だけ減つた
電圧が負担されるため、分圧手段１１の中間電位
タツプｍの位置を調整することにより、対地絶縁
部分に過剰な電圧を印加することなく相間あるい
は極間のインパルス電圧試験を実施できる。また
従来の試験回路における高電圧発生装置２、同期
装置８、保護回路３等が不要になると同時に分圧
手段にはインパルス電圧発生器に付属した放電抵
抗器や波頭調整コンデンサを利用できる。このた
め試験設備が簡素化されるとともに試験準備作業
も省力化される利点が得られる。さらに相間また
は極間電圧と対地電圧の比を分圧手段により任意
かつ容易に選択できるとともに、相間または極間
に印加する電圧波形と対地絶縁に印加される電圧
波形がほぼ等しいために信頼性の高い検証試験を
行うことができる。
According to the present invention, as shown in FIG. 2 showing an embodiment, a metal body 4a such as a container of the equipment under test 4, which is used while being grounded at all times, is grounded by an insulating device 10 such as an insulating frame or a suspended insulator. Voltage dividing means 1 provided in parallel with the impulse voltage generator 1 insulated from the
1, one of the voltage applied conductors was connected to the high voltage end of the impulse voltage generator, and the other conductor was connected to the ground. As a result, a predetermined impulse test voltage is applied between the phases or poles of the equipment under test, and at this time, a voltage reduced by the voltage borne by the insulator 10 is applied to the ground insulation part of the equipment under test. By adjusting the position of the intermediate potential tap m of the voltage dividing means 11, it is possible to perform an impulse voltage test between phases or between poles without applying an excessive voltage to the ground insulation part. Further, the high voltage generator 2, synchronizer 8, protection circuit 3, etc. in the conventional test circuit are no longer necessary, and at the same time, the discharge resistor and wavefront adjustment capacitor attached to the impulse voltage generator can be used as the voltage dividing means. Therefore, there are advantages in that the test equipment is simplified and the test preparation work is also labor-saving. Furthermore, the ratio of the phase-to-phase or pole-to-pole voltage to the ground voltage can be arbitrarily and easily selected by the voltage dividing means, and the voltage waveform applied between the phases or poles is almost equal to the voltage waveform applied to the ground insulation, which improves reliability. Can perform high quality verification tests.
第１，２図は従来のインパルス電圧試験回路の
接続図であつて、第１図は相間試験の場合の接続
図、第２図は極間試験の接続図、第３，４図は本
発明の実施例を示すインパルス電圧試験回路の接
続図であつて、第３図は相間試験の場合の接続
図、第４図は極間試験の場合の接続図、第５ない
し第７図は本発明の実施例の試験回路における分
圧手段の詳細を示す等価回路図であつて、第５図
は分圧手段として抵抗分圧器を用いた場合、第６
図は同じく抵抗分圧器とコンデンサとを併用した
変形例、第７図は同じくコンデンサ形分圧器を用
いた場合の等価回路図である。
図において、１……インパルス電圧発生器、２
……高電圧発生装置、３……保護回路、４……供
試機器、４ａ……金属体（たとえば密閉容器）、
４ｂ……遮断部、４ｃ……高電圧導体、５……ブ
ツシング、８……同期装置、１１，２１……分圧
手段、ｍ……中間電位タツプ、C1，C2，C3……
コンデンサ、Ct，Cp，Ce……供試機器の各部静
電容量、である。
Figures 1 and 2 are connection diagrams of a conventional impulse voltage test circuit, in which Figure 1 is a connection diagram for a phase-to-phase test, Figure 2 is a connection diagram for a pole-to-electrode test, and Figures 3 and 4 are for the present invention. FIG. 3 is a connection diagram for a phase-to-phase test, FIG. 4 is a connection diagram for an electrode-to-electrode test, and FIGS. 5 to 7 are connection diagrams for an impulse voltage test circuit according to the present invention. FIG. 5 is an equivalent circuit diagram showing details of the voltage dividing means in the test circuit of the embodiment, and FIG.
The figure similarly shows a modification using a resistive voltage divider and a capacitor, and FIG. 7 is an equivalent circuit diagram when a capacitor type voltage divider is similarly used. In the figure, 1...impulse voltage generator, 2
... High voltage generator, 3... Protection circuit, 4... Equipment under test, 4a... Metal body (for example, airtight container),
4b... Breaking part, 4c... High voltage conductor, 5... Bushing, 8... Synchronizer, 11, 21... Voltage dividing means, m... Intermediate potential tap, C 1 , C 2 , C 3 ...
Capacitor, Ct, Cp, Ce...These are the capacitances of each part of the equipment under test.
Claims (1)
に対向し常時は接地して使用される金属体とを有
する高圧電気機器の異相導体間あるいは同相の極
間導体間のインパルス電圧試験回路において、一
方の被電圧印加導体がインパルス電圧発生器の高
圧端子に導電接続され、他方の被電圧印加導体が
接地され、前記金属体が絶縁装置によつて大地か
ら絶縁されるとともにインパルス電圧発生器に並
列に設けられた分圧手段の中間電位タツプに導電
接続され、前記被電圧印加導体間に印加されるイ
ンパルス電圧より低い所定の電圧が前記金属体と
一方および他方の被電圧印加導体間に印加される
ことを特徴とする電気機器のインパルス電圧試験
回路。 ２ 特許請求の範囲第１項記載の回路において、
分圧手段が抵抗器からなることを特徴とする電気
機器のインパルス電圧試験回路。 ３ 特許請求の範囲第２項記載の回路において、
抵抗器からなる分圧手段が、中間電位タツプと大
地間あるいは高圧端子間に並列に分圧比調整用の
コンデンサを備えることを特徴とする電気機器の
インパルス電圧試験回路。 ４ 特許請求の範囲第１項記載の回路において、
分圧手段がインパルス電圧の波頭を調整するため
に設けられるコンデンサであることを特徴とする
電気機器のインパルス電圧試験回路。[Claims] 1. Between conductors of different phases or between conductors between poles of the same phase in a high-voltage electrical equipment that has a plurality of live parts that are insulated from each other and a metal body that faces the live parts and is normally grounded. In an impulse voltage test circuit, one voltage applying conductor is conductively connected to a high voltage terminal of an impulse voltage generator, the other voltage applying conductor is grounded, and the metal body is insulated from earth by an insulating device. A predetermined voltage lower than the impulse voltage applied between the voltage applied conductors is conductively connected to an intermediate potential tap of a voltage dividing means provided in parallel with the impulse voltage generator, and a predetermined voltage lower than the impulse voltage applied between the voltage applied conductors is connected to the metal body and one and the other voltage applied conductors. An impulse voltage test circuit for electrical equipment, characterized in that an impulse voltage is applied between conductors. 2. In the circuit described in claim 1,
An impulse voltage test circuit for electrical equipment, characterized in that the voltage dividing means consists of a resistor. 3. In the circuit described in claim 2,
An impulse voltage test circuit for electrical equipment, wherein the voltage dividing means consisting of a resistor is provided with a capacitor for voltage division ratio adjustment in parallel between an intermediate potential tap and the ground or a high voltage terminal. 4. In the circuit described in claim 1,
An impulse voltage test circuit for electrical equipment, characterized in that the voltage dividing means is a capacitor provided for adjusting the wavefront of the impulse voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13656883A JPS6027865A (en) | 1983-07-26 | 1983-07-26 | Impulse voltage testing circuit for electric appliance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13656883A JPS6027865A (en) | 1983-07-26 | 1983-07-26 | Impulse voltage testing circuit for electric appliance |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6027865A JPS6027865A (en) | 1985-02-12 |
| JPH032431B2 true JPH032431B2 (en) | 1991-01-16 |
Family
ID=15178292
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13656883A Granted JPS6027865A (en) | 1983-07-26 | 1983-07-26 | Impulse voltage testing circuit for electric appliance |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6027865A (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102721907A (en) * | 2012-06-13 | 2012-10-10 | 南方电网科学研究院有限责任公司 | Method for Power Frequency and Impulse Superimposed Voltage Tests in High Altitude Areas |
| CN105319470B (en) * | 2015-11-27 | 2017-05-10 | 国家电网公司 | System for distribution measurement testing of impulse voltage in transformer winding |
| CN105319488B (en) * | 2015-11-27 | 2017-05-10 | 国家电网公司 | System for testing transformer oil breakdown characteristic under actual impulse voltage waveform function |
| CN105842597B (en) * | 2016-06-02 | 2019-05-24 | 国家电网公司 | Vehicle-mounted mobile test platform for integrated impulse voltage generator |
| CN106405355A (en) * | 2016-12-01 | 2017-02-15 | 国家电网公司 | 110 kV insulation rod calibration device |
-
1983
- 1983-07-26 JP JP13656883A patent/JPS6027865A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6027865A (en) | 1985-02-12 |
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