JPH0327045B2 - - Google Patents
Info
- Publication number
- JPH0327045B2 JPH0327045B2 JP59171112A JP17111284A JPH0327045B2 JP H0327045 B2 JPH0327045 B2 JP H0327045B2 JP 59171112 A JP59171112 A JP 59171112A JP 17111284 A JP17111284 A JP 17111284A JP H0327045 B2 JPH0327045 B2 JP H0327045B2
- Authority
- JP
- Japan
- Prior art keywords
- reflective surface
- prism
- light
- detected
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Image Input (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Collating Specific Patterns (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
この発明は、プリズムの反射面に光を照射し反
射面からの反射光を検出することによつて、反射
面に当接状態にある被検出体の凹凸を検出する凹
凸検出方法及び凹凸検出情報入力装置に関するも
のであり、例えば指の表面にある凹凸模様つまり
指紋を直接に実時間で採取する場合等に利用され
るものである。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention irradiates a reflective surface of a prism with light and detects the reflected light from the reflective surface, thereby detecting a detected object that is in contact with the reflective surface. The present invention relates to an unevenness detection method for detecting body unevenness and an unevenness detection information input device, and is used, for example, when an uneven pattern on the surface of a finger, that is, a fingerprint, is directly collected in real time.
従来の凹凸検出方法を、指紋採取の場合につい
て説明する。第1図は従来の指紋パターン入力装
置を示す構成図で、1は光源、1aは光源1の出
力光である平行光の光線束、2はプリズム、2a
はプリズム2の反射面、2bはプリズム2の入射
面、3は被検出体、即ち指である。3aは被検出
体3の凹凸部、即ち指紋である。4はテレビカメ
ラ、5は処理装置である。
A conventional unevenness detection method will be explained in the case of fingerprint collection. FIG. 1 is a configuration diagram showing a conventional fingerprint pattern input device, in which 1 is a light source, 1a is a parallel beam of light that is the output light of the light source 1, 2 is a prism, 2a
is a reflective surface of the prism 2, 2b is an entrance surface of the prism 2, and 3 is an object to be detected, that is, a finger. 3a is a concavo-convex portion of the object to be detected 3, that is, a fingerprint. 4 is a television camera, and 5 is a processing device.
この第1図に示す従来のものは、光源1と、被
検出体3に対して光源1からの光線束を一定範囲
内の角度をもつて入射させるようにした光学装置
と、この光学装置からの光学情報を電気信号に変
換する変換装置を備え、プリズム2と被検出体3
の凹凸部3aとの接触、非接触によつて生じる全
反射光と非全反射光とに基づいて指紋パターン情
報を得るようにしたものである。なお、一般に、
ガラスその他の透明物質と空気との界面では、光
源からの光線束の入射角θが臨界角θ0を越えた入
射角で全反射光を生じる。これに対して、被検出
体がガラスその他の透明物質に密着している部分
では、媒質相互の屈折率の関係によつて全反射は
生じず、非全反射光を生じる。従つて、第1図に
おいて、プリズム2の反射面2aに、指紋の凹部
に対応して全反射する部分と、指紋の凸部が当接
されたことにより全反射しなくなつた部分が生
じ、指紋パターンがコントラスト像としてテレビ
カメラ4で撮影され、光学信号から電気信号に変
換された後、処理装置5により適宜処理される。 The conventional device shown in FIG. 1 includes a light source 1, an optical device that allows a beam of light from the light source 1 to be incident on an object 3 at an angle within a certain range, and a The prism 2 and the detected object 3 are equipped with a conversion device that converts optical information into electrical signals.
Fingerprint pattern information is obtained based on total reflection light and non-total reflection light caused by contact or non-contact with the uneven portion 3a. Furthermore, in general,
At the interface between glass or other transparent materials and air, total internal reflection occurs when the incident angle θ of the light beam from the light source exceeds the critical angle θ 0 . On the other hand, in a portion where the object to be detected is in close contact with glass or other transparent material, total reflection does not occur due to the relationship between the refractive indexes of the media, and non-totally reflected light is generated. Therefore, in FIG. 1, on the reflective surface 2a of the prism 2, there are parts that undergo total reflection corresponding to the concave portions of the fingerprint, and portions that no longer undergo total reflection due to contact with the convex portions of the fingerprint. The fingerprint pattern is photographed as a contrast image by a television camera 4, converted from an optical signal to an electrical signal, and then processed appropriately by a processing device 5.
しかしこのような従来の検出方法及び装置で
は、手指をプリズム2の反射面2aに密着して指
紋を採取した後に手指を反射面2aから離して
も、指脂などの物質が反射面2aに残留してい
る。従つて、例えば、手指を反射面2aから離し
た状態で反射面に平行光を照射した場合、上記残
留物質が反射面2aにない状態では反射面2aが
完全な鏡面反射をするのであるが、上記残留物質
が反射面2aに残留していると反射面2aは完全
な鏡面反射とはならず、鏡面反射をしている部分
の一部に非鏡面反射部が生じ、これが残像となつ
て、次に得ようと他の手指の指紋パターンの正確
な採取の妨げとなつていた。 However, in such conventional detection methods and devices, even if the finger is removed from the reflective surface 2a after the fingerprint is collected by bringing the finger in close contact with the reflective surface 2a of the prism 2, substances such as finger oil remain on the reflective surface 2a. are doing. Therefore, for example, when the reflective surface 2a is irradiated with parallel light while the fingers are separated from the reflective surface 2a, the reflective surface 2a will reflect perfectly specularly if there is no residual substance on the reflective surface 2a. If the above-mentioned residual substance remains on the reflective surface 2a, the reflective surface 2a will not be completely specularly reflective, and a non-specularly reflective part will occur in a part of the specularly reflective part, which will become an afterimage. This obstructs accurate collection of fingerprint patterns from other fingers to be obtained next.
この発明は上記従来の実情に鑑みてなされたも
ので、被検出体の当接によりプリズムの反射面に
残留物質が存在しても、この残留物質の存在によ
る被検出体の正確な凹凸検出の妨害を抑制できる
ようにすることを目的とし、被検出体が当接され
るプリズムの反射面に拡散光を照射して上記目的
を達成するものである。
This invention was made in view of the above-mentioned conventional situation, and even if there is residual material on the reflective surface of the prism due to contact with the object to be detected, the presence of this residual material makes it impossible to accurately detect the unevenness of the object to be detected. The purpose is to suppress interference, and the above purpose is achieved by irradiating diffused light onto the reflective surface of a prism that is in contact with the object to be detected.
この発明を、指紋採取に適用した場合の一実施
例を第2図によつて説明する。第2図において、
1〜5は第1図のものと同じであり、1は光源、
1aは光源1の出力光である平行光の光線束、2
はプリズム、2aはプリズム2の反射面、2bは
プリズム2の入射面、3は被検出体、例えば手指
である。3aは被検出体3の被検出面に存在する
凹凸部、例えば手指の指紋である。4はプリズム
2の反射面2aからの反射光を受光する位置に配
設された変換装置で、上記反射光、即ち光学情報
を電気信号に変換するものであつて、例えばテレ
ビカメラ等が使用される。5は処理装置で、例え
ば、変換装置4の出力電気信号から被検出体3の
凹凸情報、例えば手指の指紋パターン情報、を例
えば受像機に表示するための処理を行なつたり、
あるいは凹凸情報をビデオテープ、ビデオデイス
ク等の記録媒体(図示せず)に記録するための処
理等を行なうものである。6はプリズム2の入射
面2bと光源1との間の光路途上に配設された光
学的拡散板からなる光学的拡散部である。
An embodiment in which the present invention is applied to fingerprint collection will be described with reference to FIG. In Figure 2,
1 to 5 are the same as those in Figure 1, 1 is the light source,
1a is a ray bundle of parallel light that is the output light of light source 1, 2
is a prism, 2a is a reflective surface of the prism 2, 2b is an entrance surface of the prism 2, and 3 is an object to be detected, for example, a finger. Reference numeral 3a indicates an uneven portion existing on the detection surface of the detection object 3, for example, a fingerprint of a finger. Reference numeral 4 denotes a conversion device disposed at a position to receive the reflected light from the reflective surface 2a of the prism 2, which converts the reflected light, that is, optical information, into an electrical signal. Ru. 5 is a processing device that performs processing for displaying, for example, unevenness information of the detected object 3, such as finger print pattern information, on, for example, a television receiver from the output electric signal of the converting device 4;
Alternatively, it performs processing for recording unevenness information on a recording medium (not shown) such as a videotape or a video disk. Reference numeral 6 denotes an optical diffusing section made of an optical diffusing plate disposed on the optical path between the entrance surface 2b of the prism 2 and the light source 1.
この第2図に示す実施例は、プリズム2の反射
面2aに投射する光束をランダムな拡散光とする
ことにより、プリズム2の反射面全域で全反射と
非全反射とが混在する背景を得、これによつて、
上記被検出体3の反射面2aへの当接による反射
面2aへの残留物質による残像が背景に埋もれる
ようにして、残像による妨害パターンを除去する
ものである。更に詳述すると、光源1からの平行
光が光学的拡散板6を透過することにより、プリ
ズム2の反射面2aに投射される光束がランダム
な拡散光となり、プリズム2の反射面2aでは全
反射と非全反射とが混在する状態になる。すなわ
ち、被検出体が反射面2aに密着していない背景
部分が、見かけ上、光学的拡散面の如く観測され
る。これによつて、背景部分に残存していた残像
の影響が、反射面2aに平行光を投射して背景部
分における全反射を利用していた従来のものに比
べて著しく改善される。つまり、従来のように、
背景部分における全反射が上記残留物質によつて
乱されるということがなくなり、背景部分に残留
物質が残存していても、背景部分における反射光
は、背景部分に残存物質が無い場合と殆んど変ら
ない。 In the embodiment shown in FIG. 2, by making the light beam projected onto the reflective surface 2a of the prism 2 randomly diffused light, a background in which total reflection and non-total reflection coexist over the entire reflective surface of the prism 2 can be obtained. , thereby,
The afterimage caused by the residual substance on the reflective surface 2a caused by the contact of the object 3 with the reflective surface 2a is buried in the background, thereby removing the interference pattern caused by the afterimage. More specifically, when the parallel light from the light source 1 passes through the optical diffuser 6, the light flux projected onto the reflective surface 2a of the prism 2 becomes randomly diffused light, and the reflective surface 2a of the prism 2 undergoes total reflection. This results in a state in which both non-total reflection and non-total reflection coexist. That is, the background portion where the object to be detected is not in close contact with the reflective surface 2a is observed apparently as an optically diffusing surface. As a result, the influence of afterimages remaining in the background portion is significantly improved compared to the conventional method in which parallel light is projected onto the reflective surface 2a and total reflection in the background portion is utilized. In other words, as before,
The total reflection in the background area is no longer disturbed by the residual substance, and even if the residual substance remains in the background area, the reflected light in the background area is almost the same as when there is no residual substance in the background area. Nothing has changed.
一方、被検出体3が反射面2aに密着している
部分は、反射面2aでの全反射は殆んどなく、従
来と同等の特性を示す。 On the other hand, the portion where the object to be detected 3 is in close contact with the reflective surface 2a has almost no total reflection on the reflective surface 2a, and exhibits the same characteristics as the conventional one.
なお、上記実施例では、光源1とプリズム2と
の間に、光学的拡散板6を配設した場合について
説明したが、この光学的拡散板6は、他の手段、
例えばプリズム2の入射面2bを拡散面とする
等、によつて代替し得ることは言うまでもなく、
従つて、この発明で言う拡散光は、実施例に示さ
れる拡散手段のみで得られた拡散光を意味するも
のでは決してない。 In addition, in the above embodiment, the case where the optical diffusion plate 6 is disposed between the light source 1 and the prism 2 has been described, but this optical diffusion plate 6 can be provided by other means,
It goes without saying that this can be replaced by, for example, making the entrance surface 2b of the prism 2 a diffusing surface.
Therefore, the diffused light referred to in this invention does not mean the diffused light obtained only by the diffusion means shown in the examples.
この発明は上記のように、被検出体が反射面に
当接されるプリズムの上記反射面に拡散光を照射
し、上記反射面から反射した反射光から、上記被
検出体の上記反射面に当接している面に存在する
凹凸を検出するものであるので、また、光源と、
この光源からの光が光学的拡散部を透過すること
によつて生じた拡散光が反射面に照射されるよう
に配設され上記反射面に被検出体が当接されるプ
リズムと、このプリズムの上記反射面からの反射
光を受光する位置に配設され上記反射光に応じた
電気信号を発生する変換装置を備えたものである
ので、前に検出した被検出体の凸部がプリズムの
反射面に残留物質として残存していても、その後
に検出する被検出体の凹凸を高性能に検出するこ
とができる効果がある。
As described above, this invention irradiates the reflective surface of the prism against which the object to be detected is brought into contact with diffused light, and the reflected light reflected from the reflective surface is applied to the reflective surface of the object to be detected. Since it detects the unevenness that exists on the surface that is in contact with the light source,
a prism arranged so that a reflective surface is irradiated with diffused light generated by the light from the light source passing through an optical diffusion section, and on which an object to be detected comes into contact with the reflective surface; The converter is disposed at a position to receive the reflected light from the reflective surface of the prism and generates an electrical signal in accordance with the reflected light, so that the previously detected convex portion of the object to be detected is located on the prism. Even if a residual substance remains on the reflective surface, the unevenness of the object to be detected can be detected with high performance.
第1図は従来の凹凸検出方法を実施する従来装
置を示す構成図、第2図はこの発明による凹凸検
出方法を実施する装置の一実施例を示す構成図で
ある。
図において、1は光源、1aは光線束、2はプ
リズム、2aはプリズムの反射面、2bはプリズ
ムの入射面、3は被検出体、3aは被検出体の凹
凸部、4は変換装置、6は光学的拡散部である。
なお、各図中、同一符号は同一又は相当部分を示
す。
FIG. 1 is a block diagram showing a conventional apparatus for carrying out a conventional unevenness detection method, and FIG. 2 is a block diagram showing an embodiment of an apparatus for carrying out the unevenness detection method according to the present invention. In the figure, 1 is a light source, 1a is a beam of light, 2 is a prism, 2a is a reflective surface of the prism, 2b is an entrance surface of the prism, 3 is an object to be detected, 3a is an uneven part of the object to be detected, 4 is a conversion device, 6 is an optical diffusion section.
In each figure, the same reference numerals indicate the same or equivalent parts.
Claims (1)
記反射面に拡散光を照射し、上記反射面から反射
した反射光から、上記被検出体の上記反射面に当
接している面に存在する凹凸を検出することを特
徴とする凹凸検出方法。 2 光源、その光源からの光が光学的拡散部を透
過することにより生じた拡散光が反射面に照射さ
れるように配設され上記反射面に被検出体が当接
されるプリズム、及びこのプリズムの上記反射面
からの反射光を受光する位置に配設され上記反射
光に応じた電気信号を発生する変換装置を備えた
凹凸検出情報入力装置。 3 光学的拡散部がプリズムと光源との間に配設
された光学的拡散板であることを特徴とする特許
請求の範囲第2項に記載の凹凸検出情報入力装
置。 4 光学的拡散部がプリズムの入射面に形成され
ていることを特徴とする特許請求の範囲第2項に
記載の凹凸検出情報入力装置。[Scope of Claims] 1. Diffuse light is irradiated onto the reflective surface of the prism on which the object to be detected comes into contact with the reflective surface, and from the reflected light reflected from the reflective surface, the reflective surface of the object to be detected is applied. An unevenness detection method characterized by detecting unevenness existing on surfaces that are in contact with each other. 2. A light source, a prism arranged so that a reflective surface is irradiated with diffused light generated by the light from the light source passing through an optical diffusion section, and a prism with which a detected object comes into contact with the reflective surface; An unevenness detection information input device including a conversion device disposed at a position to receive reflected light from the reflective surface of a prism and generate an electric signal according to the reflected light. 3. The unevenness detection information input device according to claim 2, wherein the optical diffusion section is an optical diffusion plate disposed between the prism and the light source. 4. The unevenness detection information input device according to claim 2, wherein the optical diffusing section is formed on the entrance surface of the prism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59171112A JPS6148707A (en) | 1984-08-16 | 1984-08-16 | Roughness detecting method and roughness detecting information input device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59171112A JPS6148707A (en) | 1984-08-16 | 1984-08-16 | Roughness detecting method and roughness detecting information input device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6148707A JPS6148707A (en) | 1986-03-10 |
| JPH0327045B2 true JPH0327045B2 (en) | 1991-04-12 |
Family
ID=15917190
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59171112A Granted JPS6148707A (en) | 1984-08-16 | 1984-08-16 | Roughness detecting method and roughness detecting information input device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6148707A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR930001001Y1 (en) * | 1990-11-17 | 1993-03-02 | 주식회사 금성사 | Fingerprint recognition apparatus |
-
1984
- 1984-08-16 JP JP59171112A patent/JPS6148707A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6148707A (en) | 1986-03-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR900006061B1 (en) | Uneuen-surface data detection apparatus | |
| JP2795595B2 (en) | Defect detection method for transparent plate | |
| US4197011A (en) | Defect detection and plotting system | |
| JPH0814544B2 (en) | Floppy disk inspection method | |
| JPH05100413A (en) | Foreign matter inspection device | |
| JPH0787208B2 (en) | Face plate defect detection optical device | |
| JPH0327045B2 (en) | ||
| JPS6129453B2 (en) | ||
| JPH11304724A (en) | Hole detecting device and hole detecting method for light transmitting sheet | |
| JP2005228191A (en) | Fingerprint image input device | |
| JPH0311403B2 (en) | ||
| JPS58184116A (en) | Examining method of defect on surface of light-transmittable object | |
| JP3326276B2 (en) | Method for inspecting protective coating film of optical disk and inspection apparatus using the same | |
| JPH0228815B2 (en) | ||
| JPH09218162A (en) | Surface defect inspection device | |
| JP3369268B2 (en) | Defect detection method inside translucent object | |
| JPS63221483A (en) | Method for detecting ruggedness information | |
| JPH0431748A (en) | Defect inspecting method for transparent plate-shaped body | |
| JP3109709B2 (en) | Inspection method for protective coat film on optical disc and inspection apparatus using the same | |
| JP2001108638A (en) | Defect inspection equipment | |
| JPS5862506A (en) | Inspecting device for micro-unevenness on surface | |
| JPH0414282B2 (en) | ||
| JP2559470B2 (en) | Appearance inspection method | |
| JPS62209686A (en) | Detector for information on ruggedness surface | |
| JPH10293015A (en) | Optical detector |