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JPH0328775B2 - - Google Patents
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JPH0328775B2 - - Google Patents

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Publication number
JPH0328775B2
JPH0328775B2 JP58016635A JP1663583A JPH0328775B2 JP H0328775 B2 JPH0328775 B2 JP H0328775B2 JP 58016635 A JP58016635 A JP 58016635A JP 1663583 A JP1663583 A JP 1663583A JP H0328775 B2 JPH0328775 B2 JP H0328775B2
Authority
JP
Japan
Prior art keywords
electric field
field
electrode
electrodes
uniform magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58016635A
Other languages
Japanese (ja)
Other versions
JPS59143252A (en
Inventor
Norihiro Naito
Morio Ishihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP58016635A priority Critical patent/JPS59143252A/en
Publication of JPS59143252A publication Critical patent/JPS59143252A/en
Publication of JPH0328775B2 publication Critical patent/JPH0328775B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Description

【発明の詳細な説明】 本発明は電場分布を任意に変更することの出来
る電場発生手段を備えた重畳場質量分析装置に関
する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a superimposed field mass spectrometer equipped with electric field generating means that can arbitrarily change electric field distribution.

重畳場質量分析装置においては、例えば第1図
に示す様に磁極1,1′間に形成される一様磁場
中に同心円筒状電極2,2′を設置し、該磁場と
直交するトロイダル電場を発生させ、重畳場とし
ている。かかる重畳場を分析場として用いた質量
分析装置において電場掃引により質量掃引を行お
うとすると、イオンビームの集束装置が変化して
しまい、その位置変化を打消すために、トロイダ
ル電場の定数C、C′を電場掃引に連動して変化さ
せる必要がある。ところが、第1図に示される様
に同心円筒状電極を用いる従来装置では、電場分
布は電極形状によつて一義的に決まつてしまい、
C、C′を変えることは出来ない。3,3′はその
ために用いられる松田プレートと称される補正電
極で、該電極3,3′に印加する直流電圧を変化
させることにより、トロイダル電場の定数C、
C′を変化させるとが出来る。
In a superimposed field mass spectrometer, for example, as shown in FIG. 1, concentric cylindrical electrodes 2 and 2' are installed in a uniform magnetic field formed between magnetic poles 1 and 1', and a toroidal electric field perpendicular to the magnetic field is installed. is generated as a superimposed field. If an attempt is made to sweep the mass by electric field sweeping in a mass spectrometer that uses such a superimposed field as an analysis field, the ion beam focusing device will change, and in order to cancel the position change, the constants C and C of the toroidal electric field are changed. ′ must be changed in conjunction with the electric field sweep. However, as shown in Fig. 1, in the conventional device using concentric cylindrical electrodes, the electric field distribution is uniquely determined by the electrode shape.
C and C' cannot be changed. 3 and 3' are correction electrodes called Matsuda plates used for this purpose, and by changing the DC voltage applied to the electrodes 3 and 3', the constant C of the toroidal electric field,
By changing C′, we can do this.

一般に質量分析装置においては、分解能あるい
は測定範囲の面で磁場強度が高いことが望まれ、
そのためには磁極間隔は出来るだけ挟くする必要
がある。ところが、上述した従来装置では、磁極
間に電極2,2′及び補正電極3,3′を設置しな
ければならない関係上狭くするものに限度があつ
た。又、補正電極により定数C、C′を変えること
は出来るものの、場の中心から離れるほどの理想
的なトロイダル電場からのズレが大きくなつてし
まい、高次の収差が大きくなるという欠点もあつ
た。
In general, for mass spectrometers, it is desirable for the magnetic field strength to be high in terms of resolution or measurement range.
For this purpose, it is necessary to make the magnetic pole spacing as narrow as possible. However, in the conventional device described above, there is a limit to how narrow the space can be because the electrodes 2, 2' and the correction electrodes 3, 3' must be installed between the magnetic poles. Furthermore, although it is possible to change the constants C and C' using correction electrodes, the further away from the center of the field, the greater the deviation from the ideal toroidal electric field, which also has the disadvantage of increasing higher-order aberrations. .

本発明は上述した点に鑑みてなされたものであ
り、狭い隙間であつても設置することが出来、し
かも電場分布を任意に変えることの出来る電場発
生手段を備えた重畳場質量分析装置を提供するこ
とを目的としている。
The present invention has been made in view of the above points, and provides a superimposed field mass spectrometer that can be installed even in a narrow gap and is equipped with an electric field generating means that can arbitrarily change the electric field distribution. It is intended to.

本発明は、一様磁場を発生させる手段と、該一
様磁場と直交する方向の電場を該末様磁場に重畳
して発生させる電場発生手段を備えた重畳場質量
分析装置において、前記電場発生手段が、一様磁
場に直交する中心平面を挟んで等しい距離にある
一対の平行平面上に該中心平面を挟んで上下対称
に設けられた複数対の同心円弧状の線状電極群
と、該複数対の線状電極の対毎に与える電位に関
する情報を記憶する記憶手段と、該記憶手段から
読出された情報に基づいて各電極対に所定の電位
を与えるための電源手段とから構成されることを
特徴としている。以下本発明の一実施例を添付図
面に基づき詳述する。
The present invention provides a superimposed field mass spectrometer comprising a means for generating a uniform magnetic field and an electric field generating means for generating an electric field in a direction orthogonal to the uniform magnetic field by superimposing it on the uniform magnetic field. The means includes a plurality of pairs of concentric arc-shaped linear electrode groups provided vertically symmetrically across the center plane on a pair of parallel planes that are at equal distances across the center plane that is perpendicular to the uniform magnetic field; It is composed of a storage means for storing information regarding the potential applied to each pair of linear electrodes, and a power supply means for applying a predetermined potential to each electrode pair based on the information read from the storage means. It is characterized by An embodiment of the present invention will be described below in detail with reference to the accompanying drawings.

第2図は本発明の一実施例の構成を示し、図に
おいて1,1′は第1図と同様の磁極である。該
磁極間にはイオンの通る中心平面Lから互いに等
しい距離をおいて絶縁物製の薄い基板4,4′が
平行に設置されている。該基板は、第3図に示す
様にイオンの中心通路Oに沿つた円弧状の形状が
与えられると共に、その対向する表面には例えば
0.5mm幅の7本の同心円弧状電極A1〜An(基板
4)、B1〜Bn(基板4′)が0.5mmのピツチで配列
されている。この電極のパターンは例えば、通常
の電子機器で使用されるプリント基板と同様にパ
ターン露光及びエツチングの技術により作成する
ことが出来る。2枚の基板は中心平面を挟んでパ
ターンが対称になるように、換言すればA1とB1
AnとBnが中心平面を挟んで正対するように配置
され、夫々の基板の各電極から引出された引出し
線は、正対した一対の電極同士が一組として接続
され、更に各組毎に電源5に接続されている。6
はn個の組について印加すべき電圧を記憶させた
メモリで、該メモリ6に記憶された情報は読出し
制御回路7によつて読出され、各組毎の電圧情報
として電源5に供給される。
FIG. 2 shows the structure of an embodiment of the present invention, in which reference numerals 1 and 1' are magnetic poles similar to those in FIG. 1. Between the magnetic poles, thin substrates 4 and 4' made of an insulator are placed in parallel at equal distances from each other from the central plane L through which ions pass. The substrate is given an arcuate shape along the central path O of ions as shown in FIG.
Seven concentric arc-shaped electrodes A 1 to An (substrate 4) and B 1 to Bn (substrate 4') each having a width of 0.5 mm are arranged at a pitch of 0.5 mm. This electrode pattern can be created, for example, by pattern exposure and etching techniques similar to printed circuit boards used in ordinary electronic devices. The patterns of the two substrates should be symmetrical across the center plane, in other words, A 1 and B 1 ,
An and Bn are arranged so as to face each other across the center plane, and the lead wires drawn out from each electrode of each substrate are connected to each pair of directly facing electrodes as a set, and each set is connected to a power source. 5. 6
is a memory in which voltages to be applied for n groups are stored, and the information stored in the memory 6 is read out by a read control circuit 7 and supplied to the power source 5 as voltage information for each group.

上述の如き構成において、n組の電極に電圧を
印加すると、電極に挟まれた空間には、電場が生
成される。その電場内では、等しい電位が与えら
れた各対の電極同士を結ぶ等電位面が存在する
が、その等電位面はお互いに隣合う電極に印加さ
れた電位による影響を受ける。従つて各電極にど
の様な電圧を印加した時にどの様な電場が形成さ
れるかを求めておけば、この電極に挟まれた空間
に任意の分布を持つた電場を生成させることが可
能である。
In the above configuration, when a voltage is applied to n sets of electrodes, an electric field is generated in the space between the electrodes. Within the electric field, there is an equipotential surface connecting each pair of electrodes to which the same potential is applied, but the equipotential surface is influenced by the potentials applied to the adjacent electrodes. Therefore, by finding out what kind of electric field is formed when what kind of voltage is applied to each electrode, it is possible to generate an electric field with an arbitrary distribution in the space between these electrodes. be.

ここで、電極で挟まれた空間に或る電場φが形
成されたとした時、n組の電極の電位について、
第4図を用いて考察する。
Here, when a certain electric field φ is formed in the space between the electrodes, the potentials of the n sets of electrodes are as follows:
Consider using Figure 4.

今、電場φをイオンの回転中心軸qに対して軸
対称なトロイダル電場であると考え、該電場内の
任意の位置における電位(ポテンシヤル)を第4
図に示すx−y座標でφ(x、y)と書けば、次
式が成立する。
Now, consider the electric field φ to be a toroidal electric field that is axially symmetrical with respect to the central axis of rotation q of the ion, and the electric potential at any position within the electric field is expressed as the fourth
If we write φ(x, y) using the x-y coordinates shown in the figure, the following equation holds true.

△φ(x、y)=0 ……(1) 1/(ρ0+x)〓/〓x〔(ρ0+x)〓Φ/〓x〕 +〓2Φ/〓y2=0 ……(2) ここで、ρ0はイオン中心通路の回転半径、φは
任意点(x、y)における電位である。
△φ (x, y) = 0 ......(1) 1/(ρ 0 +x)〓/〓x [(ρ 0 +x)〓Φ/〓x] +〓 2 Φ/〓y 2 = 0 ...( 2) Here, ρ 0 is the rotation radius of the ion center path, and φ is the potential at an arbitrary point (x, y).

上式よりφ(x、y)の一般的な形として下式
が得られる。
From the above equation, the following equation is obtained as a general form of φ(x, y).

φ(x、y) =−E0ρ0Σaij/i〓j〓(x/ρ0i(y/ρ0j
……(3) ここでaijは係数、E0はイオンの中心軌道x=
y=0での電場強度である。
φ(x, y) = −E 0 ρ 0 Σaij/i〓j〓(x/ρ 0 ) i (y/ρ 0 ) j
...(3) where aij is the coefficient and E 0 is the central orbit of the ion x=
This is the electric field strength at y=0.

電極間の距離を2hとすれば、各電極はy=±
hの平面に存在するから、(3)式においてy=hと
おき、xの値の各電極の位置に応じて代入すれ
ば、各電極位置の電位を求めることが出来ること
が解る。逆に言えば、その様にして求めた電位を
各電極に与えるようにすれば、電極に挟まれた空
間にはトロイダル電場が生成されることになる。
尚、該電場の端縁場では場の乱れが生じるが、電
極距離2hを電極の幅wに比べて十分に大きくし
ておけば、イオン中心通路付近における場の乱れ
は無視することが出来る。
If the distance between electrodes is 2h, each electrode is y=±
Since it exists in the plane of h, it is understood that by setting y=h in equation (3) and substituting the value of x according to the position of each electrode, the potential at each electrode position can be obtained. Conversely, if the potential determined in this way is applied to each electrode, a toroidal electric field will be generated in the space between the electrodes.
Incidentally, field disturbance occurs in the edge field of the electric field, but if the electrode distance 2h is made sufficiently larger than the electrode width w, the field disturbance near the ion center path can be ignored.

ここで、実際に各電極の電位を求めるには、係
数aijを求めなければならない。この求め方を以下
に説明する。(3)式を(2)式に代入すると、係数aij
関し次の漸化式(recursion formula)が得られ
る。
Here, in order to actually find the potential of each electrode, the coefficient a ij must be found. How to obtain this will be explained below. By substituting equation (3) into equation (2), the following recursion formula for the coefficient a ij is obtained.

(i+1)ai,j+2+ai+1,j+2 +(i+2)ai+2,j+a+ai+3,j=0 ……(4) ここでi、j≦0の場合は、aij=0とする。(i+1)a i,j+2 +a i+1,j+2 +(i+2)a i+2,j+a +a i+3,j =0 ...(4) Here, i, j≦0 In this case, a ij =0.

又、正対する電極同士の電位が等しいことから
電場は中心平面Lに関し対称であり、そのためy
のべきの奇数項の係数は0である。
Also, since the potentials of directly facing electrodes are equal, the electric field is symmetrical with respect to the central plane L, so y
The coefficient of the odd term of the power is 0.

これらのことを総合すると、j=0でない中心
平面外の場を表すyが含まれる項の係数aijは、す
べて中心平面内のyを含まない項の係数aip(i≧
1)で表すことが出来、個別に求めなくても良
い。4次までの係数について例示すると、下式の
様になる。
Putting these things together, the coefficient a ij of the term that includes y representing a field outside the central plane where j = 0 is not equal to the coefficient a ij of the term that does not include y in the central plane (i
1), and does not need to be calculated individually. An example of coefficients up to the fourth order is as shown in the following equation.

a02=−a10−a20 ……(5) a12=a10−a20−a30 ……(6) a22=−2a10+2a20−a30−a40 ……(7) a04=a10−a20+2a30+a40 ……(8) 質量分析装置におけるイオンの軌道計算では、
通常、3次までの収差について計算を行い3次ま
での収差を十分に小さく抑えれば良く、3次の収
差に影響を与える4次の係数まで検討すれば良
い。
a 02 =−a 10 −a 20 ……(5) a 12 =a 10 −a 20 −a 30 ……(6) a 22 =−2a 10 +2a 20 −a 30 −a 40 ……(7) a 04 =a 10 −a 20 +2a 30 +a 40 ...(8) In the calculation of the ion trajectory in the mass spectrometer,
Normally, it is sufficient to calculate the aberrations up to the 3rd order and keep the aberrations up to the 3rd order sufficiently small, and it is sufficient to consider up to the 4th order coefficients that affect the 3rd order aberrations.

従つて、任意の定数Cを持つトロイダル電場を
発生するために各電極に与えるべき電圧(ポテン
シヤル)を求めるには、a10、a20、a30、a40の4
つの係数を与え、そして(5)〜(8)式により4次まで
のすべての係数を決定し、それらの係数を用いて
(3)式により、各電極位置の電圧(ポテンシヤル)
を求めれば良い。
Therefore, in order to find the voltage (potential) that should be applied to each electrode in order to generate a toroidal electric field with an arbitrary constant C, 4 of a 10 , a 20 , a 30 , and a 40 are required.
Then, determine all the coefficients up to the fourth order using equations (5) to (8), and use those coefficients.
According to equation (3), the voltage (potential) at each electrode position is
All you have to do is ask for it.

このa10、a20、a30、a40の4つの係数は、例え
ば以下のようにして決定される。即ち、磁場及び
電場内を飛行するイオン軌道計算プログラムが作
成されており、このプログラムでは、a10、a20
a30、a40の4つの係数に基づいてイオン光学系に
おけるイオンの収束性を検討評価することができ
る。そこで、所望の重畳場光学系(例えば特定の
定数C1を持つ電場を含む重畳場光学系)につい
て上記プログラムを用い、実際に各係数に数値を
代入して収差を評価する作業を繰り返し、最終的
に収差を総合的に小さくし得る係数の組合わせを
選定することにより、特定の光学系について最適
な係数a10、a20、a30、a40を決定することができ
る。
The four coefficients a 10 , a 20 , a 30 , and a 40 are determined, for example, as follows. That is, a program has been created to calculate the trajectory of ions flying in magnetic and electric fields, and in this program, a 10 , a 20 ,
The ion focusing performance in the ion optical system can be examined and evaluated based on the four coefficients a 30 and a 40 . Therefore, using the above program for a desired superimposed field optical system (for example, a superimposed field optical system including an electric field with a specific constant C 1 ), we repeated the process of actually assigning numerical values to each coefficient and evaluating the aberrations, and finally By selecting a combination of coefficients that can reduce the aberrations overall, it is possible to determine the optimal coefficients a 10 , a 20 , a 30 , and a 40 for a specific optical system.

そして、先に述べたように、このようにして求
めたa10、a20、a30、a40の値及び各電極の位置の
データを用いて前記(5)〜(8)式及び(3)式により、各
電極A1〜An(夫々接続されているB1〜Bnも含
む)に印加すべきの電位の情報V11〜V1oが特定
の定数C1を持つ電場を含む重畳場光学系につい
て計算される。全く同様にして異なる定数C2
C3……を持つ電場を含む重畳場光学系について
各電極に印加する電位の情報V21〜V2o、V31
V3o、……を求め、夫々の情報に基づいて各電極
に電圧を印加すれば、各定数の電場を含む重畳場
を発生させることが出来る。
Then, as mentioned above, using the values of a 10 , a 20 , a 30 , and a 40 obtained in this way and the data on the position of each electrode, the equations (5) to (8) and (3) are calculated. ), information on the potential to be applied to each electrode A 1 ~ An (including B 1 ~ Bn connected to each other) V 11 ~ V 1o is a superimposed field optical system containing an electric field with a specific constant C 1 is calculated for the system. In exactly the same way, different constants C 2 ,
Information on the potential applied to each electrode for a superimposed field optical system containing an electric field with C 3 ...V 21 ~V 2o , V 31 ~
By determining V 3o , . . . and applying a voltage to each electrode based on the respective information, a superimposed field containing electric fields of each constant can be generated.

第2図の実施例において、メモリ6には上述の
様にして求めた複数の情報が格納されており、読
出し制御回路7によつてその中から任意の情報を
読出して電源に供給すると、該電源5は各電極に
該情報に基づいた電圧を印加する。従つて電極に
挟まれた空間には、メモリに格納された情報に従
つた電場が生じることになる。
In the embodiment shown in FIG. 2, a plurality of pieces of information obtained as described above are stored in the memory 6, and when the readout control circuit 7 reads out any information from the information and supplies it to the power supply, the corresponding The power source 5 applies a voltage to each electrode based on the information. Therefore, an electric field is generated in the space between the electrodes in accordance with the information stored in the memory.

尚、上記例ではトロイダル電場を例にとつた
が、中心平面を挟んで対称な電場であれば、いか
なる電場であつても、その電場に関する情報が得
られれば発生可能であることは言うまでもない。
又、基板4,4′は磁極1,1′に夫々取付けるよ
うにしても良い。
In the above example, a toroidal electric field was used as an example, but it goes without saying that any electric field can be generated as long as information regarding the electric field is obtained, as long as it is symmetrical with respect to the central plane.
Further, the substrates 4, 4' may be attached to the magnetic poles 1, 1', respectively.

以上詳述した如く本発明によれば、2枚の基板
上に設置した線状電極により電場を発生させるた
め、従来の様な電極2,2′が不要となり、挟い
間隙にも設置することが可能となる。更に発生さ
せる電場の分布をも任意に変えることが可能であ
る。
As detailed above, according to the present invention, the electric field is generated by the linear electrodes installed on the two substrates, so the conventional electrodes 2 and 2' are not required, and they can be installed even in the gap between them. becomes possible. Furthermore, it is possible to arbitrarily change the distribution of the electric field to be generated.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来例を説明するための図、第2図は
本発明の一実施例の構成を示す図、第3図は基板
及び線状電極を説明するための図、第4図は線状
電極とx−y座標の関係を示す図である。 4,4′:基板、5:電源、6:メモリ、7:
読出し制御回路、A,B:線状電極。
Fig. 1 is a diagram for explaining a conventional example, Fig. 2 is a diagram showing the configuration of an embodiment of the present invention, Fig. 3 is a diagram for explaining a substrate and a linear electrode, and Fig. 4 is a diagram for explaining a linear electrode. It is a figure showing the relationship between a shape electrode and xy coordinates. 4, 4': Board, 5: Power supply, 6: Memory, 7:
Readout control circuit, A, B: linear electrodes.

Claims (1)

【特許請求の範囲】[Claims] 1 一様磁場を発生させる手段と、該一様磁場と
直交する方向の電場を該一様磁場に重畳して発生
させる電場発生手段を備えた重畳場質量分析装置
において、前記電場発生手段は、一様磁場に直交
する中心平面を挟んで等しい距離にある一対の平
行平面上に該中心平面を挟んで上下対称に設けら
れた複数対の同心円弧状の線状電極群と、該複数
対の線状電極の対毎に与える電位に関する情報を
記憶する記憶手段と、該記憶手段から読出された
情報に基づいて各電極対に所定の電位を与えるた
めの電源手段とから構成されることを特徴とする
重畳場質量分析装置。
1. A superimposed field mass spectrometer comprising a means for generating a uniform magnetic field and an electric field generating means for generating an electric field in a direction orthogonal to the uniform magnetic field by superimposing it on the uniform magnetic field, wherein the electric field generating means comprises: A plurality of pairs of concentric arc-shaped linear electrode groups provided vertically symmetrically across the center plane on a pair of parallel planes located at equal distances across the center plane perpendicular to the uniform magnetic field, and the plurality of pairs of wires. It is characterized by being comprised of a storage means for storing information regarding the potential applied to each pair of shaped electrodes, and a power supply means for applying a predetermined potential to each electrode pair based on the information read from the storage means. A superimposed field mass spectrometer.
JP58016635A 1983-02-03 1983-02-03 Electric field generating apparatus Granted JPS59143252A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58016635A JPS59143252A (en) 1983-02-03 1983-02-03 Electric field generating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58016635A JPS59143252A (en) 1983-02-03 1983-02-03 Electric field generating apparatus

Publications (2)

Publication Number Publication Date
JPS59143252A JPS59143252A (en) 1984-08-16
JPH0328775B2 true JPH0328775B2 (en) 1991-04-22

Family

ID=11921814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58016635A Granted JPS59143252A (en) 1983-02-03 1983-02-03 Electric field generating apparatus

Country Status (1)

Country Link
JP (1) JPS59143252A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61110957A (en) * 1984-11-06 1986-05-29 Jeol Ltd Electric field generator
GB8912580D0 (en) * 1989-06-01 1989-07-19 Vg Instr Group Charged particle energy analyzer and mass spectrometer incorporating it
JP3867048B2 (en) * 2003-01-08 2007-01-10 株式会社日立ハイテクノロジーズ Monochromator and scanning electron microscope using the same

Also Published As

Publication number Publication date
JPS59143252A (en) 1984-08-16

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