JPH0330829B2 - - Google Patents
Info
- Publication number
- JPH0330829B2 JPH0330829B2 JP16608481A JP16608481A JPH0330829B2 JP H0330829 B2 JPH0330829 B2 JP H0330829B2 JP 16608481 A JP16608481 A JP 16608481A JP 16608481 A JP16608481 A JP 16608481A JP H0330829 B2 JPH0330829 B2 JP H0330829B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- resistance
- contact
- electrode
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 27
- 238000000034 method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
【発明の詳細な説明】
本発明は、四端子法による接点接触抵抗回路に
関するもので、その目的とするところは、測定誤
差を減少することにある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a contact resistance circuit using a four-terminal method, and its purpose is to reduce measurement errors.
四端子法による接触抵抗測定は、接点を介して
導通した2個の端子に定電流を流す電流電極を当
接すると共に同端子に電圧電極を当接して両端子
間の電圧降下を測定して接点の接触抵抗を測定す
るのであるが、電流電極の端子への当接が適当で
なく当接部分の抵抗が高いと定電流回路が正常に
動作せず誤測定の原因になり、また電圧電極の当
接部分の抵抗が高いと電圧電極が電気的に浮いた
状態となりこれまた誤測定の原因になるものであ
つた。 Contact resistance measurement using the four-terminal method involves contacting two terminals connected through a contact with a current electrode that flows a constant current, and also contacting a voltage electrode with the same terminal to measure the voltage drop between the two terminals. The contact resistance of the current electrode is measured, but if the contact of the current electrode with the terminal is not proper and the resistance of the contact part is high, the constant current circuit will not operate properly and cause erroneous measurements. If the resistance of the contact portion is high, the voltage electrode will be in an electrically floating state, which may also cause erroneous measurements.
したがつて四端子法では電極の当接抵抗を可能
なかぎり低くすることが誤測定を防止するもとに
なるのであるから、本願はこれらの当接抵抗が許
容値以下であることを加味した精度の高い接点の
抵抗測定回路を提供するものであつて、以下本発
明の実施例を第1図乃至第5図を参照して説明す
る。 Therefore, in the four-terminal method, reducing the contact resistance of the electrodes as low as possible is the basis for preventing erroneous measurements, so this application takes into account that these contact resistances are below the allowable value. DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention, which provide a highly accurate contact resistance measuring circuit, will be described below with reference to FIGS. 1 to 5.
リレー、マイクロスイツチ等の測定対象である
有接点の電気的スイツチ1の端子2,3に電流電
極4,5の電圧電極6,7を夫々当接してある。 Voltage electrodes 6 and 7 of current electrodes 4 and 5 are brought into contact with terminals 2 and 3 of an electrical switch 1, which is a contact point to be measured, such as a relay or a microswitch, respectively.
これら電極4,5,6,7は、第2図に示すよ
うに、制御回路11により操作される切換スイツ
チ12,12,……に接続してある。電流電極
4,5は切換スイツチ12を介して定電流回路8
と導通判定回路13,13に選択的に接続してあ
る。また電圧電極6,7は切換スイツチ12を介
して接点接触抵抗Rを測定する抵抗測定回路に選
択的に接続してある。そして導通判定回路13,
13の導通判定信号と抵抗測定回路の測定抵抗信
号および制御回路の状態の信号とを良否判定回路
に接続してあり、導通判定信号と測定抵抗信号と
をアンドゲートに入力して良否の判定の出力する
ようにしてある。ここで抵抗測定回路9は、接点
接触抵抗Rの実測値と、予め設定した判定基準と
なる抵抗値であるところの設定値とを比較して、
デジタル信号化して良否判定回路10に入力する
ようにしてもよい。尚導通判定回路13として第
3図に示すコンパレータ14のマイナス端子に基
準電圧を与え、プラス端子を抵抗(図中10KΩ)
を介して検出端12bを切換スイツチ12に接続
してある。ここで基準電圧を与える抵抗rは数オ
ームとしているが、電気的スイツチの端子の表面
処理状態、接点接触抵抗値、測定精度等により変
動するものである。 These electrodes 4, 5, 6, 7 are connected to changeover switches 12, 12, . . . operated by a control circuit 11, as shown in FIG. The current electrodes 4 and 5 are connected to a constant current circuit 8 via a changeover switch 12.
and are selectively connected to continuity determination circuits 13, 13. Further, the voltage electrodes 6 and 7 are selectively connected via a changeover switch 12 to a resistance measuring circuit for measuring the contact resistance R of the contacts. And continuity determination circuit 13,
The continuity judgment signal No. 13, the measured resistance signal of the resistance measuring circuit, and the state signal of the control circuit are connected to the pass/fail judgment circuit, and the continuity judgment signal and the measured resistance signal are input to the AND gate to perform the pass/fail judgment. It is set to output. Here, the resistance measuring circuit 9 compares the actual value of the contact contact resistance R with a preset value which is a resistance value serving as a judgment criterion set in advance.
It is also possible to convert the signal into a digital signal and input it to the pass/fail judgment circuit 10. A reference voltage is applied to the negative terminal of the comparator 14 shown in Figure 3 as the continuity determination circuit 13, and the positive terminal is connected to a resistor (10KΩ in the figure).
The detection end 12b is connected to the changeover switch 12 via. Here, the resistance r that provides the reference voltage is set to several ohms, but it varies depending on the surface treatment condition of the terminals of the electrical switch, the contact resistance value, the measurement accuracy, etc.
次に測定について述べると、切換スイツチ12
が定電流回路側と抵抗測定回路側に接触してお
り、第4図に示すように、定電流が電流電極4,
5間に流れ、電圧電極6,7でその電圧降下を検
出して抵抗測定回路9で設定値に対し高抵抗或は
低抵抗であるかのデジタル化信号を発生させる。 Next, regarding measurement, selector switch 12
are in contact with the constant current circuit side and the resistance measuring circuit side, and as shown in FIG.
5, the voltage drop is detected by the voltage electrodes 6 and 7, and the resistance measuring circuit 9 generates a digitized signal indicating whether the resistance is high or low relative to the set value.
次に切換スイツチ12を導通判定回路側とアー
ス側に切換えると、第5図に示すように、電極の
当接抵抗rv,riがアースと第3図の導通判定回路
13との間に挿入されるので、もし当接抵抗rv,
riが抵抗rよりも大きくなつて測定誤差を生ずる
ようになつたときには、コンパレータ14のプラ
ス端子が高電位となつてコンパレータがHに反転
して、出力端13aから誤差発生の異常信号が良
否判定回路10に入力され、先の抵抗実測値は誤
差の大きい測定値とみなすよう測定される。もし
当接抵抗rv,riが抵抗rより小さければ、良否判
定回路から外部へ正常な接点接触測定作業が行な
われたことが出力され、或は接点抵抗値が外部プ
リンタや他の測定回路、検査回路と共にCPUに
転送される。もし正常な測定であつても抵抗実測
値が不合格なら、記録され、或は外部へ電気的ス
イツチの合否選別回路へ不合格指示が出力され
る。 Next, when the changeover switch 12 is switched between the continuity judgment circuit side and the ground side, the contact resistances rv and ri of the electrodes are inserted between the ground and the continuity judgment circuit 13 shown in Fig. 3, as shown in Fig. 5. Therefore, if the contact resistance rv,
When ri becomes larger than the resistance r, causing a measurement error, the positive terminal of the comparator 14 becomes a high potential, the comparator is inverted to H, and an error signal indicating the occurrence of an error is sent from the output terminal 13a to make a pass/fail judgment. It is input to the circuit 10 and measured so that the previously measured resistance value is regarded as a measurement value with a large error. If the contact resistances rv and ri are smaller than the resistance r, the pass/fail judgment circuit outputs to the outside that normal contact contact measurement work has been performed, or the contact resistance value is output to the outside by an external printer, other measuring circuit, or inspection. Transferred to the CPU along with the circuit. If the measured resistance value fails even if the measurement is normal, it is recorded or a failure indication is outputted to the pass/fail selection circuit of the electrical switch to the outside.
もちろん測定時の当接抵抗が高ければ、電極
4,5,6,7の表面の汚れ除去や電極へのリー
ド線の断線チエツク等の保守が行なわれ、常に正
常な測定が無人で行なわれるようになされるので
ある。 Of course, if the contact resistance during measurement is high, maintenance such as removing dirt from the surfaces of electrodes 4, 5, 6, and 7 and checking for breaks in the lead wires to the electrodes will be performed to ensure that normal measurements are always performed unattended. It will be done.
尚、本実施例外に、切換スイツチと制御回路1
1を、電磁リレーにおきかえても或は半導体化し
てもよい。また接点抵抗の設定値と実測値との比
較及びデジタル的判定処理を抵抗測定回路かまた
は良否判定回路のいずれに含めてもよい。また制
御回路の状態を良否判定回路に入力して、判定の
信頼性を向上すると共により自動的測定を行なえ
るようにしてもよい。 In addition, as an exception to this implementation, the changeover switch and control circuit 1
1 may be replaced with an electromagnetic relay or may be made into a semiconductor. Further, the comparison between the set value and the measured value of the contact resistance and the digital determination process may be included in either the resistance measurement circuit or the quality determination circuit. Furthermore, the state of the control circuit may be input to the pass/fail judgment circuit to improve the reliability of the judgment and to enable more automatic measurement.
以上説明したように本発明によれば、接点を介
して導通した2個の端子2,3間に、一対の電流
電極4,5と電圧電極6,7とを各別に当接して
なる四端子による抵抗測定回路において、電流電
極4,5に定電流回路8を接続して端子2,3間
の電圧降下を電圧電極6,7で検出して接点接触
抵抗Rを測定する抵抗測定回路9と、1個の端子
に当接する電流電極と電圧電極間に接続する電極
の導通判定回路13と、前記抵抗測定回路9の信
号と導通判定回路13の信号とをアンド判定する
良否判定回路10と、前記端子に当接する電極を
抵抗測定回路9と導通判定回路13,13とに切
換接続する制御回路11とからなる構成としてお
り、誤差の原因となる電極の当接抵抗をも測定す
ることにより測定精度を高められ、かつ抵抗測定
と当接状態の測定とを制御回路11により切換測
定するようにしたから端子との当接状態をかえな
いで計測でき、誤差の入る余地はないうえ能率的
に行える。 As explained above, according to the present invention, four terminals are formed by separately abutting a pair of current electrodes 4, 5 and a pair of voltage electrodes 6, 7 between two terminals 2, 3 which are electrically connected through contacts. In the resistance measuring circuit according to the present invention, a constant current circuit 8 is connected to current electrodes 4 and 5, and a voltage drop between terminals 2 and 3 is detected by voltage electrodes 6 and 7 to measure contact contact resistance R. , a continuity determination circuit 13 for an electrode connected between a current electrode and a voltage electrode that are in contact with one terminal, and a quality determination circuit 10 that performs AND determination between the signal from the resistance measurement circuit 9 and the signal from the continuity determination circuit 13; The structure consists of a control circuit 11 that switches and connects the electrode that contacts the terminal to a resistance measurement circuit 9 and continuity determination circuits 13, 13, and the measurement is performed by also measuring the contact resistance of the electrode, which can cause errors. Accuracy is improved, and since the control circuit 11 switches between resistance measurement and contact state measurement, measurements can be made without changing the contact state with the terminal, leaving no room for error and efficient. I can do it.
そして電気的スイツチの接点接触抵抗測定が高
精度でしかも連続して行なえるようになつたか
ら、リレーやマイクロスイツチ等の組立工程に直
接結合して測定作業が無人で行えることともなつ
て、飛躍的能率向上を得られるのである。 Now that it has become possible to measure the contact resistance of electrical switches with high precision and continuously, it has become possible to directly connect the assembly process of relays, microswitches, etc., and to perform measurement work unattended. This results in improved efficiency.
第1図乃至第5図は本発明の実施例を示し、第
1図は正面図、第2図、第3図は回路図、第4,
5図は測定時の等価回路図である。
2,3:端子、4,5:電流電極、6,7:電
圧電極、8:定電流回路、9:抵抗測定回路、1
0:良否判定回路、11:制御回路、13:導通
判定回路、R:接点接触抵抗。
1 to 5 show embodiments of the present invention, with FIG. 1 being a front view, FIGS. 2 and 3 being circuit diagrams, and FIGS.
Figure 5 is an equivalent circuit diagram during measurement. 2, 3: terminal, 4, 5: current electrode, 6, 7: voltage electrode, 8: constant current circuit, 9: resistance measurement circuit, 1
0: Good/failure judgment circuit, 11: Control circuit, 13: Continuity judgment circuit, R: Contact resistance.
Claims (1)
の電流電極と電圧電極とを各別に当接してなる四
端子による抵抗測定回路において、電流電極に定
電流回路を接続して端子間の電圧降下を電圧電極
で検出して接点接触抵抗を測定する抵抗測定回路
と、1個の端子に当接する電流電極と電圧電極間
に接続する電極の導通判定回路と、前記抵抗測定
回路の信号と導通判定回路の信号とをアンド判定
する良否判定回路と、前記端子に当接する電極を
抵抗測定回路と導通判定回路とに切換接続する制
御回路とからなる抵抗測定回路。1 In a four-terminal resistance measurement circuit consisting of a pair of current electrodes and a voltage electrode in contact with each other between two terminals that are electrically connected via contacts, a constant current circuit is connected to the current electrodes to measure the resistance between the terminals. a resistance measurement circuit that detects a voltage drop with a voltage electrode and measures contact resistance; a continuity determination circuit for an electrode connected between a current electrode and a voltage electrode that are in contact with one terminal; and a signal of the resistance measurement circuit. A resistance measuring circuit comprising: a pass/fail determining circuit that performs an AND determination with a signal from a continuity determining circuit; and a control circuit that switches and connects an electrode in contact with the terminal to the resistance measuring circuit and the continuity determining circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16608481A JPS5866870A (en) | 1981-10-16 | 1981-10-16 | Resistance measuring circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16608481A JPS5866870A (en) | 1981-10-16 | 1981-10-16 | Resistance measuring circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5866870A JPS5866870A (en) | 1983-04-21 |
| JPH0330829B2 true JPH0330829B2 (en) | 1991-05-01 |
Family
ID=15824682
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16608481A Granted JPS5866870A (en) | 1981-10-16 | 1981-10-16 | Resistance measuring circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5866870A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5057772A (en) * | 1990-05-29 | 1991-10-15 | Electro Scientific Industries, Inc. | Method and system for concurrent electronic component testing and lead verification |
| CN104977469B (en) * | 2014-04-04 | 2018-03-23 | 中芯国际集成电路制造(上海)有限公司 | Measuring circuit and method for IC design |
-
1981
- 1981-10-16 JP JP16608481A patent/JPS5866870A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5866870A (en) | 1983-04-21 |
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