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JPH0331219B2 - - Google Patents
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JPH0331219B2 - - Google Patents

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Publication number
JPH0331219B2
JPH0331219B2 JP57179819A JP17981982A JPH0331219B2 JP H0331219 B2 JPH0331219 B2 JP H0331219B2 JP 57179819 A JP57179819 A JP 57179819A JP 17981982 A JP17981982 A JP 17981982A JP H0331219 B2 JPH0331219 B2 JP H0331219B2
Authority
JP
Japan
Prior art keywords
pattern
board
light
wiring
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57179819A
Other languages
Japanese (ja)
Other versions
JPS5970947A (en
Inventor
Yasuhiko Hara
Koichi Tsukazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17981982A priority Critical patent/JPS5970947A/en
Publication of JPS5970947A publication Critical patent/JPS5970947A/en
Publication of JPH0331219B2 publication Critical patent/JPH0331219B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、印刷配線基板のパターン検出方法に
係り、特に上下2面に配線パターンを有する印刷
配線基板についてこの配線パターンのシヨート、
断線、凹凸等を検査する印刷配線基板のパターン
検出方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a pattern detection method for a printed wiring board, and in particular, for a printed wiring board having a wiring pattern on two upper and lower sides, detecting the short,
The present invention relates to a pattern detection method for a printed wiring board for inspecting disconnections, irregularities, etc.

〔従来技術〕[Prior art]

通常、パターンは2次元であるためその検出に
あたつては平面的に取り扱うのが一般的である。
印刷配線基板のパターン検出に於いても、従来、
基板からの透過光又は反射光をとらえてパターン
を検出したり、パターンと基材との反射光強度の
違いを利用してパターンの検出を行つたりする等
のやり方が採用されている。然るに、印刷配線基
板の板厚が厚かつたり、多層化されていたりする
場合には、透過光によるパターンの検出は不可能
である。従つて、反射光を利用することが必要と
なる。然るに、パターンが平坦でなかつたりする
事例では、反射光強度のばらつきが大きく、正確
なパターン検出は困難であつた。
Since a pattern is usually two-dimensional, it is common to treat it as a two-dimensional pattern when detecting it.
Conventionally, in pattern detection of printed wiring boards,
Methods such as detecting a pattern by capturing the transmitted light or reflected light from the substrate, or detecting the pattern by using the difference in the intensity of reflected light between the pattern and the base material are adopted. However, if the printed wiring board is thick or has multiple layers, it is impossible to detect the pattern using transmitted light. Therefore, it is necessary to utilize reflected light. However, in cases where the pattern is uneven or uneven, the intensity of reflected light varies greatly, making accurate pattern detection difficult.

そこで、本出願人は先に「印刷配線基板のパタ
ーン検出方法」(特願昭54−146425号)において、
印刷配線基板上の導体配線パターンに対して斜め
方向および上方から光を照射すると共に、その照
射光による上記配線パターンからの上方への反射
光を撮像して上記導体配線パターンの表面領域を
検出する方法を提案している。これによつて、側
面の広がりのある傾斜領域を持つパターンの正し
い形状検出を可能としているが、なおかつ、パタ
ーン表面や周辺にはきずやしみ等が存在し、それ
を欠陥として検出してしまう欠点があつた。この
点についてさらに説明する。
Therefore, the present applicant previously wrote in "Pattern Detection Method for Printed Wiring Board" (Japanese Patent Application No. 146425-1982),
The conductive wiring pattern on the printed wiring board is irradiated with light from diagonally and from above, and the surface area of the conductive wiring pattern is detected by imaging the light reflected upward from the wiring pattern by the irradiated light. We are proposing a method. This makes it possible to correctly detect the shape of a pattern that has a sloped area with wide lateral sides, but it also has the disadvantage that there are scratches and stains on the pattern surface and its periphery, which are detected as defects. It was hot. This point will be further explained.

第1図はプリント基板内層パターンの断面図で
あつて、本発明が対象とする両面に配線パターン
を有するものである。図中、1は内層パターンを
示し、厚さ0.2mm程度で薄く、ガラス・エポキシ
材で成る基板2の上下面に、導電材で成る上面パ
ターン1aと、下面パターン1bが形成してあ
る。図示の如き内層パターン1を複数枚重ねて多
層のプリント基板を構成するものであるが、この
ような各内層パターン1の表、裏面に前述したパ
ターンの欠陥が時として存在するので、光学的に
パターン検出を行なつてそれを除去しなくてはな
らない。
FIG. 1 is a sectional view of an inner layer pattern of a printed circuit board, which has wiring patterns on both sides, which is the object of the present invention. In the figure, reference numeral 1 indicates an inner layer pattern, in which an upper surface pattern 1a and a lower surface pattern 1b made of a conductive material are formed on the upper and lower surfaces of a thin substrate 2 of about 0.2 mm in thickness and made of a glass epoxy material. A multilayer printed circuit board is constructed by stacking a plurality of inner layer patterns 1 as shown in the figure, but since the above-mentioned pattern defects sometimes exist on the front and back surfaces of each inner layer pattern 1, optical We have to do pattern detection and remove it.

第2図は本出願人が先に提案したそのパターン
検出方法を説明する図であつて、内層パターン1
の上面部には、照明源よりの光Pを直角方向に反
射させる半透鏡5と、集光レンズ3と、パターン
撮像用の撮像器4とを備え、パターン面に対し照
明源より光Pを当てると共に、その部分に斜方向
からも光Qを照射して、パターン1aをレンズ3
で結像し、パターン撮像器4によりパターン検出
し、検出信号6として処理回路へ出力するもので
ある。
FIG. 2 is a diagram for explaining the pattern detection method previously proposed by the applicant, in which the inner layer pattern 1
The upper surface part is equipped with a semi-transparent mirror 5 that reflects the light P from the illumination source in the right angle direction, a condensing lens 3, and an imager 4 for capturing a pattern. At the same time, the pattern 1a is irradiated with the light Q from an oblique direction, and the pattern 1a is focused on the lens 3.
The pattern imager 4 forms an image, detects the pattern using the pattern imager 4, and outputs the detected signal 6 to the processing circuit.

第2図の構成によると表、裏を別々にパターン
検出しなければならないこと、光の照射方向が複
数であることなどの問題があることから第3図に
示すように透過照明光Rを用い、内層パターン1
の下面より照射することも考えられるが、この場
合は、上面パターン以外に下面パターンも映り、
上面のみのパターンを検出できない。第4図は、
第3図の方式によつて得た検出信号6の波形図で
あつて、上面パターン1aに相当する部分は明確
に黒として撮像されるが、下面パターン1bに相
当する部分は上面パターン1aより不明確に黒と
して検出される。このように透過照明方式による
と、上面および下面のパターンが同時に検出され
てしまうので、下面パターンにかくされた部分の
上面パターンを検査できない問題が残る。また、
下面パターンはボケるので安定したパターン検査
ができない。
According to the configuration shown in Figure 2, there are problems such as the need to detect patterns on the front and back sides separately and the fact that there are multiple light irradiation directions. Therefore, as shown in Figure 3, transmitted illumination light R is used. , inner layer pattern 1
It is also possible to irradiate from the bottom surface, but in this case, the bottom surface pattern will be reflected in addition to the top surface pattern.
Unable to detect patterns on the top surface only. Figure 4 shows
This is a waveform diagram of the detection signal 6 obtained by the method shown in FIG. 3, in which the portion corresponding to the upper surface pattern 1a is clearly imaged as black, but the portion corresponding to the lower surface pattern 1b is darker than the upper surface pattern 1a. It is clearly detected as black. According to the transmitted illumination method, the patterns on the upper surface and the lower surface are detected at the same time, so the problem remains that the upper surface pattern in the portion hidden by the lower surface pattern cannot be inspected. Also,
Since the bottom pattern is blurred, stable pattern inspection cannot be performed.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、前述の問題点に鑑みてなされ
たもので、基板の両面に配線パターンを有するプ
リント基板についてその配線パターンの変色等の
表面状態に影響されることなく、はた他面の配線
パターンに影響されることなく配線パターンを正
確に、且つ安定に検出できるようにした印刷配線
基板のパターン検出方法を提供することにある。
The object of the present invention has been made in view of the above-mentioned problems, and it is an object of the present invention to provide a printed circuit board having wiring patterns on both sides of the board without being affected by the surface condition such as discoloration of the wiring pattern. It is an object of the present invention to provide a pattern detection method for a printed wiring board, which enables accurate and stable detection of a wiring pattern without being affected by the wiring pattern.

〔発明の概要〕 即ち、本発明は上記目的を達成するために、両
面に配線パターンを形成した基板の一方面側より
上記基板面の垂直方向に対して傾いた斜めの少な
くとも四方向から照明光束でもつて上記一方面側
の配線パターンの両側から上記基板内に入り込む
ように、即ち一方面側の配線パターンにかからな
いように照射し、上記基板内で散乱しながら(光
散乱効果により)透過して基板の他方面から出射
される光像を撮像手段で撮像して上記基板の他方
面側に設けられた配線パターンのみをネガテイブ
パターン画像として検知することを特徴とする印
刷配線基板のパターン検出方法である。
[Summary of the Invention] That is, in order to achieve the above-mentioned object, the present invention provides illumination light beams from one side of a substrate having wiring patterns formed on both sides from at least four directions oblique to the direction perpendicular to the substrate surface. The light is irradiated so that it enters the board from both sides of the wiring pattern on the one side, that is, so as not to hit the wiring pattern on the one side, and is transmitted while being scattered within the board (due to the light scattering effect). A pattern detection method for a printed wiring board, characterized in that a light image emitted from the other side of the board is captured by an imaging means, and only the wiring pattern provided on the other side of the board is detected as a negative pattern image. be.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を第5図〜第8図に従
つて説明する。第5図は上下両面に配線パターン
を有する基板にパターン検出のための光を照射し
た場合の図であつて、基板2の上、下面には上面
パターン1a,1bが形成してある。この下面パ
ターン1bが配線された下面側で、かつ下面パタ
ーン1bを照射しない位置より角度θを有して照
射光Sが斜照射できるようにしてある。これによ
つて、基板2の上面において透過光を検出すれ
ば、上面パターン1aの上部は光が遮断される故
に全く光検知されないが、上面パターン1a間の
基板上には、何も光遮断するものがないので入射
光Sは内層パターン1の内部で乱反射し、その光
が上面に光S′として出力される。すなわち、第6
図の波形図に示すように、撮像器で撮像され、出
力される検出信号6としては、上面パターン1a
の部分は低電圧レベルとして検出され、また下面
パターン1bの部分は高電圧レベルとして検出さ
れる。このレベル差が確実に検知できるように、
2値化レベルVaを設定し、そのレベルVaより低
いか高いかによつて上面パターンのみを正確に検
知できる。
An embodiment of the present invention will be described below with reference to FIGS. 5 to 8. FIG. 5 is a diagram when a substrate having wiring patterns on both upper and lower surfaces is irradiated with light for pattern detection, and upper surface patterns 1a and 1b are formed on the upper and lower surfaces of the substrate 2. In FIG. On the lower surface side where the lower surface pattern 1b is wired, the irradiation light S can be obliquely irradiated at an angle θ from a position where the lower surface pattern 1b is not irradiated. As a result, if transmitted light is detected on the upper surface of the substrate 2, no light is detected at all because the upper part of the upper surface pattern 1a is blocked, but nothing on the substrate between the upper surface patterns 1a is blocked. Since there is no object, the incident light S is diffusely reflected inside the inner layer pattern 1, and the light is outputted to the upper surface as light S'. That is, the sixth
As shown in the waveform diagram in the figure, the detection signal 6 captured by the imager and outputted includes the upper surface pattern 1a.
The portion of the lower surface pattern 1b is detected as a low voltage level, and the portion of the lower surface pattern 1b is detected as a high voltage level. In order to reliably detect this level difference,
A binarization level Va is set, and only the upper surface pattern can be accurately detected depending on whether it is lower or higher than the level Va.

第7図は、具体的な装置の構成例を示したもの
であつて、7,7′は検査すべきパターンを形成
した基板で、それぞれは同一形状のパターンを有
する。8,8′はそれに対応して設けたレンズ、
9,9′はレンズ8,8′を介して得たパターンを
検出する撮像器、10は撮像器9,9′より得た
検出信号6,6′を比較するパターン比較回路で
ある。また基板7,7′は中空のテーブル11に
固定してあつてこのテーブル11内にはランプ1
2,13が設けられ基板7の下面部を斜め方向か
ら照射するように設置してある。この構成は、基
板7′の下面部を照射する部分も同一である。そ
して、テーブル11はX−Yステージ14に取付
けられ、図示していないモータにより基板7,
7′のパターン形状に沿つてスライド移動する。
なお、基板7,7′の下面部を照射する光源とし
て、第7図では2個のランプ12,13を設けて
説明しているが、実際には第8図に示す如く、4
個のランプ12,13,15,16により照射し
ている。
FIG. 7 shows a specific example of the configuration of the apparatus, in which 7 and 7' are substrates on which patterns to be inspected are formed, each having a pattern of the same shape. 8, 8' are lenses provided correspondingly,
Reference numerals 9 and 9' denote imagers that detect patterns obtained through lenses 8 and 8', and 10 a pattern comparison circuit that compares detection signals 6 and 6' obtained from the imagers 9 and 9'. Further, the substrates 7 and 7' are fixed to a hollow table 11, and a lamp 1 is placed inside this table 11.
2 and 13 are provided so as to illuminate the lower surface of the substrate 7 from an oblique direction. This configuration is also the same for the portion that irradiates the lower surface of the substrate 7'. The table 11 is attached to the X-Y stage 14, and the substrate 7,
Slide along the pattern shape of 7'.
In addition, in FIG. 7, two lamps 12 and 13 are provided as light sources for illuminating the lower surfaces of the substrates 7 and 7', but in reality, as shown in FIG.
The light is irradiated by three lamps 12, 13, 15, and 16.

同構成によると、前述の説明でもわかるよう
に、同一形状の配線パターンを有する基板7,
7′をテーブル11の穴あき面上に取付け、ラン
プ12,13,15,16により下面部を照射す
ることにより行なわれるが、その場合、基板7,
7′のパターンを互いに位置合せし、2つのパタ
ーンの対応部分を撮像基9,9′で検出し、第6
図に示す如きの検出信号を得る。そして、その検
出信号6,6′をパターン比較器10で比較し、
2つのパターンの不一致部分を欠陥、すなわち、
傷、ほこり等があるものと判定する。
According to the same configuration, as can be seen from the above explanation, the substrates 7 having wiring patterns of the same shape,
7' is mounted on the perforated surface of the table 11, and the lower surface is irradiated with the lamps 12, 13, 15, 16. In this case, the substrate 7,
7' are aligned with each other, the corresponding parts of the two patterns are detected by the imaging bases 9 and 9', and the 6th pattern is detected.
A detection signal as shown in the figure is obtained. Then, the detection signals 6 and 6' are compared by a pattern comparator 10,
The mismatched portion of the two patterns is called a defect, i.e.
It is determined that there are scratches, dust, etc.

テーブル11はX−Yステージ14上をスライ
ドしつつ、基板7,7′の配線パターン全面を検
査する。
The table 11 slides on the XY stage 14 and inspects the entire wiring pattern of the substrates 7, 7'.

パターン比較器の具体的な構成については、す
でに出願されている特願昭53−40328号について
示されている。
The specific structure of the pattern comparator is disclosed in Japanese Patent Application No. 40328/1983, which has already been filed.

〔発明の効果〕〔Effect of the invention〕

上述の実施例からも明らかなように本発明によ
るプリント基板パターンの検出方法は、両面に配
線パターンを有する基板パターンを透過照射して
パターンを検出する場合、その基板の下面側よ
り、下面側パターンに光照射することなく斜め方
向より照射し、検出側上面のパターンのみを照射
してパターン検出するようにしたものであるか
ら、両面に配線パターンを有する基板の検出側パ
ターンのみを明確、かつ安定に検出することがで
きる。また、パターンを自動検査する場合もパタ
ーン表面に変色、傷等がつかないように特別な配
慮を施す必要はなくなり、検査工程の効率向上が
図れると共に、経済的でもある。
As is clear from the above-described embodiments, in the method for detecting a printed circuit board pattern according to the present invention, when detecting a pattern by transmitting irradiation of a circuit board pattern having wiring patterns on both sides, the lower surface side pattern is detected from the lower surface side of the substrate. Since the pattern is detected by irradiating only the pattern on the top surface of the detection side by irradiating it from an oblique direction without irradiating the light on the surface of the substrate, it is possible to clearly and stably detect only the pattern on the detection side of a board that has wiring patterns on both sides. can be detected. Further, when automatically inspecting a pattern, there is no need to take special precautions to prevent discoloration, scratches, etc. on the pattern surface, which improves the efficiency of the inspection process and is also economical.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明が検査対象とする両面に配線パ
ターンを有する基板の側面断面図、第2図、第3
図は本出願人等が先に開発したパターン検出方法
によりパターン検出する装置の全体的概$略構成
図、第4図は第3図の方法によりパターン検出し
た場合の検出信号波形図、第5図は本発明による
パターン検出方法を説明するための原理図であつ
て、基板の側面断面図、第6図は第5図の方法で
パターン検出した場合の検出信号波形図、第7図
は具体的な構成図、第8図は第7図の一部平面図
である。 1……内層パターン、1a,1b……配線パタ
ーン、2,7,7′……基板、3,8,8′……レ
ンズ、4,9,9′……撮像器、6……検出信号、
10……パターン比較回路、11……テーブル、
12,13,15,16……ランプ、14……X
−Yステージ。
FIG. 1 is a side cross-sectional view of a board with wiring patterns on both sides, which is the object of the present invention, and FIGS.
The figure is an overall schematic configuration diagram of an apparatus for detecting a pattern using the pattern detection method previously developed by the applicant, FIG. 4 is a detection signal waveform diagram when a pattern is detected using the method shown in FIG. The figure is a principle diagram for explaining the pattern detection method according to the present invention, and is a side sectional view of the substrate, FIG. 6 is a detection signal waveform diagram when pattern is detected by the method of FIG. 5, and FIG. FIG. 8 is a partial plan view of FIG. 7. 1... Inner layer pattern, 1a, 1b... Wiring pattern, 2, 7, 7'... Board, 3, 8, 8'... Lens, 4, 9, 9'... Imager, 6... Detection signal ,
10...Pattern comparison circuit, 11...Table,
12, 13, 15, 16...lamp, 14...X
-Y stage.

Claims (1)

【特許請求の範囲】[Claims] 1 両面に配線パターンを形成した基板の一方面
側より上記基板面の垂直方向に対して傾いた斜め
の少なくとも四方向から照明光束でもつて上記一
方面側の配線パターンの両側から上記基板内に入
り込むように照射し、上記基板内で散乱しながら
透過して基板の他方面から出射される光像を撮像
手段で撮像して上記基板の他方面側に設けられた
配線パターンのみをネガテイブパターン画像とし
て検知することを特徴とする印刷配線基板のパタ
ーン検出方法。
1. Illumination light flux enters the substrate from both sides of the wiring pattern on the one side from at least four diagonal directions inclined with respect to the perpendicular direction of the substrate surface from one side of the substrate with wiring patterns formed on both sides. A light image is captured by an image pickup means, and a light image that is scattered and transmitted through the board and then emitted from the other side of the board is used to capture only the wiring pattern provided on the other side of the board as a negative pattern image. A method for detecting a pattern on a printed wiring board, the method comprising: detecting a pattern on a printed wiring board;
JP17981982A 1982-10-15 1982-10-15 Method for detecting pattern of printed-wiring board Granted JPS5970947A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17981982A JPS5970947A (en) 1982-10-15 1982-10-15 Method for detecting pattern of printed-wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17981982A JPS5970947A (en) 1982-10-15 1982-10-15 Method for detecting pattern of printed-wiring board

Publications (2)

Publication Number Publication Date
JPS5970947A JPS5970947A (en) 1984-04-21
JPH0331219B2 true JPH0331219B2 (en) 1991-05-02

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP17981982A Granted JPS5970947A (en) 1982-10-15 1982-10-15 Method for detecting pattern of printed-wiring board

Country Status (1)

Country Link
JP (1) JPS5970947A (en)

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Publication number Priority date Publication date Assignee Title
CN103175841B (en) * 2011-12-21 2015-03-18 北京兆维电子(集团)有限责任公司 CTP (Computer to Plate) plate surface detection method and system based on machine vision
CN103175840B (en) * 2011-12-21 2016-01-20 北京兆维电子(集团)有限责任公司 Based on offset plate surface detection method and the system of machine vision
CN103175850A (en) * 2011-12-21 2013-06-26 北京兆维电子(集团)有限责任公司 Detection method and system for material surface detects of wide-range high-speed production line

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Publication number Priority date Publication date Assignee Title
ZA754657B (en) * 1974-07-27 1976-07-28 Beecham Group Ltd Adhesive composition
JPS5555204A (en) * 1978-10-20 1980-04-23 Fujitsu Ltd Pattern detection method of printed board for lamination

Also Published As

Publication number Publication date
JPS5970947A (en) 1984-04-21

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