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JPH0335824B2 - - Google Patents
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JPH0335824B2 - - Google Patents

Info

Publication number
JPH0335824B2
JPH0335824B2 JP59278881A JP27888184A JPH0335824B2 JP H0335824 B2 JPH0335824 B2 JP H0335824B2 JP 59278881 A JP59278881 A JP 59278881A JP 27888184 A JP27888184 A JP 27888184A JP H0335824 B2 JPH0335824 B2 JP H0335824B2
Authority
JP
Japan
Prior art keywords
jig
wafer
rod
heat treatment
inner tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59278881A
Other languages
Japanese (ja)
Other versions
JPS60167322A (en
Inventor
Masakuni Akiba
Hiroto Nagatomo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59278881A priority Critical patent/JPS60167322A/en
Publication of JPS60167322A publication Critical patent/JPS60167322A/en
Publication of JPH0335824B2 publication Critical patent/JPH0335824B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3311Horizontal transfer of a batch of workpieces

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

【発明の詳細な説明】 本発明は熱処理室内に埃塵を生じさせたり、室
温を変化させることのない熱処理治具の挿入取出
し方法及びその装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for inserting and removing a heat treatment jig and an apparatus therefor without causing dust or dust in a heat treatment chamber or changing the room temperature.

半導体製造工業においては、ウエハを拡散炉に
入れて拡散処理を施す工程が含まれている。
The semiconductor manufacturing industry includes a step in which wafers are placed in a diffusion furnace and subjected to a diffusion process.

従来、ウエハを拡散炉(内管)に出し入れする
方法としては、次の二通りの方法が知られてい
る。
Conventionally, the following two methods are known as methods for loading and unloading wafers into a diffusion furnace (inner tube).

その1つはボートローダ方法、もう1つはパド
ル方法であつて、前者の方法は、第1図に示すよ
うにウエハ1を載置したウエハ治具2を、拡散炉
3の延長方向に往復動可能な挿入引出し棒4を治
具2の端部に引つかけて、拡散炉3の内管5に治
具2を接触したまま挿入または引出す方法で、後
者の方法は、第2図に示すようにウエハ収容部6
aを有する長棒(パドル)6の先端にローラ6b
を設けたものをつかつて、収容部6aにウエハ1
を載置した長棒6を内管に沿うように挿入または
取出す方法である。
One is the boat loader method, and the other is the paddle method. In the former method, as shown in FIG. The movable insertion/drawing rod 4 is hooked to the end of the jig 2, and the jig 2 is inserted or pulled out while in contact with the inner tube 5 of the diffusion furnace 3. The latter method is shown in FIG. As shown, the wafer storage section 6
A roller 6b is attached to the tip of the long rod (paddle) 6 having a
The wafer 1 is placed in the accommodating section 6a using a
This is a method of inserting or taking out the long rod 6 carrying the inside tube along the inner tube.

しかしながら、前者の方法においては、ウエハ
治具2と内管5が接触した状態での挿入または取
出しであるために、接触部から埃塵が発生し、ウ
エハ欠陥の原因をつくる欠点がある。
However, in the former method, since the wafer jig 2 and the inner tube 5 are inserted or removed in a state in which they are in contact with each other, dust is generated from the contact portion, which causes wafer defects.

また、後者の方法においては、長棒6を内管5
内に挿入したまま拡散処理するために、内管5内
の熱が長棒6に奪われ、内管5内の温度に変化を
生じさせ、一定した温度下で拡散処理ができない
こと、また内管5とローラ6bは接触状態にある
きから、ボートローダ方法まではいかないまで
も、管内5に埃塵を発生させる欠点がある。
In addition, in the latter method, the long rod 6 is connected to the inner tube 5.
Since the diffusion treatment is performed while the inner tube 5 is inserted, the heat inside the inner tube 5 is absorbed by the long rod 6, causing a change in the temperature inside the inner tube 5, which makes it impossible to perform the diffusion treatment at a constant temperature. Since the tube 5 and the roller 6b are in contact with each other, there is a drawback that dust is generated inside the tube 5, although this method is not a boat loader method.

本発明はこのような従来の欠点を解消し、拡散
炉など熱処理室内に埃塵を生じさせることがな
く、かつ熱処理室内の室温に変化をきたすことの
ない熱処理治具の挿入取出し方法及びその装置を
提供するにある。
The present invention solves these conventional drawbacks and provides a method and device for inserting and extracting a heat treatment jig that does not generate dust in a heat treatment chamber such as a diffusion furnace and does not cause a change in the room temperature inside the heat treatment chamber. is to provide.

このような目的を達成するための本発明の一実
施例は、熱処理治具をスクエア・モーシヨン的に
熱処理室内に挿入することを特徴とする。
One embodiment of the present invention for achieving this purpose is characterized by inserting the heat treatment jig into the heat treatment chamber in a square motion.

以下、第3図ないし第5図に示す一実施例によ
り本発明を詳細に説明する。
Hereinafter, the present invention will be explained in detail with reference to an embodiment shown in FIGS. 3 to 5.

第3図において、熱処理治具の挿入取出し装置
10は並列かつ上向きに配設した摺動杆17,1
7に支えられた基板18をする。
In FIG. 3, the heat treatment jig insertion/removal device 10 includes sliding rods 17 and 1 arranged in parallel and upward.
The substrate 18 supported by 7 is removed.

この基板18の一側面には適当な間隔を置いて
袖部18a,18aを設けて、この袖部18a,
18aの大面積側面には、貫通穴18b,18b
をあけて、これらの貫通穴18b,18bを連絡
するように直線状の挿入引出し棒19を摺動自在
に嵌挿している。
Sleeves 18a, 18a are provided on one side of the substrate 18 at appropriate intervals.
Through holes 18b, 18b are provided on the large side surface of 18a.
A straight insertion/extraction rod 19 is slidably inserted into the through holes 18b, 18b so as to communicate with each other.

挿入引出し棒19は円管状のもので、この長さ
方向の一端には、二本からなるホーク状の治具持
上部19aを形成して、ウエハ治具12の翼部1
2aを下方から支え上げられるようにするととも
に、棒19の長さを拡散炉13の内管15に充分
入り込める寸法にとつて、しかも拡散炉13の処
理温度に充分耐え得るように石英など耐熱材質の
ものでつくつている。
The insertion/drawing rod 19 has a circular tubular shape, and at one end in the longitudinal direction, two jig-shaped jig holding parts 19a are formed to hold the wing part 1 of the wafer jig 12.
The rod 19 is made of heat-resistant material such as quartz so that the rod 2a can be supported from below, the rod 19 is long enough to fit into the inner tube 15 of the diffusion furnace 13, and it can withstand the processing temperature of the diffusion furnace 13. It's made of.

また、この挿入引出し棒19を、その延長方法
に往復動作させるための横方向送り駆動モータ2
0,20を袖部18a,18aの小面積側面に各
1個あて設けている。
Also, a lateral feed drive motor 2 is provided for reciprocating the insertion/drawing rod 19 in its extension direction.
0 and 20 are respectively provided on the small area side surfaces of the sleeve portions 18a and 18a.

さらに、基板18の背面側には、挿入引出し棒
19、袖部18a,18aを含む基板18の全体
を高さ方向に往復動作させるための高さ方向駆動
モータ21を配置し、このモータ21に高さ幅調
整カム22を取付けて、このカム22の周面を該
基板18の背面に取付けたカムフオロア23に係
合させている。
Further, on the back side of the board 18, a height direction drive motor 21 is disposed for reciprocating the entire board 18 including the insertion/extraction rod 19 and the sleeve parts 18a, 18a in the height direction. A height and width adjusting cam 22 is attached, and the circumferential surface of this cam 22 is engaged with a cam follower 23 attached to the back surface of the substrate 18.

第4図において、20は横方向送り駆動モータ
で、18cは該駆動モータ20を装着させる袖部
18aの小面積側面(壁)で、24は該袖部18
a内に収容され、かつ横方向送り駆動モータ20
の回転軸20aに直結した挿入引出し棒送りロー
ラで、これは挿入引出棒19の下部に接触させて
いる。
In FIG. 4, 20 is a lateral feed drive motor, 18c is a small side surface (wall) of the sleeve portion 18a to which the drive motor 20 is attached, and 24 is a side surface (wall) of a small area of the sleeve portion 18.
a, and a lateral feed drive motor 20
is an insertion/extraction rod feeding roller directly connected to the rotating shaft 20a, which is brought into contact with the lower part of the insertion/extraction rod 19.

また、25,25は挿入引出し棒19の周面側
に沿つて配置したガイドローラで、これらのガイ
ドローラ25,25は該送りローラ24と一緒に
なつて挿入引出し棒19を支持できるように該袖
部18a内に内蔵させている。
Further, reference numerals 25 and 25 indicate guide rollers arranged along the circumferential surface of the insertion and withdrawal rod 19, and these guide rollers 25 and 25 are arranged so that the insertion and extraction rod 19 can be supported together with the feed roller 24. It is built into the sleeve portion 18a.

該横方向送り駆動モータ20は、左右両方向の
駆動が可能なモータにしている。
The lateral direction feed drive motor 20 is a motor capable of driving in both left and right directions.

第5図において、19は挿入引出し棒で、19
aは二又形成した治具持上部、また12は該治具
持上部19aによつて持上げられるウエハ治具
で、11はウエハを示し、治具持上部19aの相
互の間隔は、ウエハ治具12の翼部12aの付け
根の幅に見合う寸法にとつて、長さも治具12に
見合う長さにとつている。
In Fig. 5, 19 is an insertion/drawing rod;
12 is a wafer jig that is lifted by the jig holder 19a, 11 is a wafer, and the distance between the jig holders 19a is the same as the wafer jig. The length is set to match the width of the base of the wing portion 12a of the blade 12, and the length matches the jig 12.

また、ウエハ治具12は凹状の横断面を有し、
底部が開口部よりも幾分小寸法にとつている。さ
らに、ウエハ治具12は石英からできている。
Further, the wafer jig 12 has a concave cross section,
The bottom is somewhat smaller in size than the opening. Further, the wafer jig 12 is made of quartz.

つぎに、このような構造をもつ装置10の動作
を説明する。
Next, the operation of the device 10 having such a structure will be explained.

まず、基板18は高さ方向駆動モータ21を作
動させることで、カム22がカムフオロア23を
介して垂直方向に往復動作される。この場合の往
復動作幅は、ウエハ治具12を治具持上部19a
で支えた状態で、ウエハ治具12が内管15の触
れない位置から、ウエハ治具12を内管15に置
いて幾分、下がつた位置に相当する範囲において
いる。
First, the substrate 18 operates the height direction drive motor 21, so that the cam 22 is reciprocated in the vertical direction via the cam follower 23. In this case, the width of the reciprocating movement is such that the wafer jig 12 is
While the wafer jig 12 is being supported by the inner tube 15, the wafer jig 12 is placed in the inner tube 15 and placed in a range corresponding to a slightly lowered position.

つぎに、第6図a〜bをつかつて、本装置10
をつかつてのウエハ治具12の挿入および取出し
方法を説明する。
Next, using FIGS. 6a to 6b, the present device 10
A method for inserting and removing the wafer jig 12 will be explained.

まず、同図aにおいて、あらかじめウエハ11
を載置したウエハ治具12を挿入引出し棒19の
治具持上部19aで支持して、治具12の底が内
管15に接しない高さ位置まで持ち上げた状態
で、内管15の中程まで水平移動させる。
First, in Figure a, the wafer 11
The wafer jig 12 on which the horizontally as far as possible.

ついで、同図bに示すように、挿入引出し棒1
9を下方に下げて、治具12の底が内管15に接
触する位置にもつていく。
Next, as shown in Figure b, insert and pull out the rod 1.
Lower the jig 9 to a position where the bottom of the jig 12 contacts the inner tube 15.

ついで、同図cに示すように、挿入引出し棒1
9を、もう1段下方に下げて、治具持上部19a
を翼部12aから離し、そのままの高さ位置のま
ま、矢印方向に引抜く。
Next, as shown in FIG.
9, lower it one more step and lower the jig holding part 19a.
Separate it from the wing part 12a and pull it out in the direction of the arrow while keeping the same height position.

この状態で、ウエハ11の拡散処理を所定の時
間行う。
In this state, the wafer 11 is subjected to a diffusion process for a predetermined period of time.

ついで、同図dに示すように、挿入引出し棒1
9を該cの引抜時の高さ位置と同様な高さを保つ
て内管15に挿入し、治具持上部19aを翼部1
2aに対応するように差し込む。
Next, as shown in FIG. d, insert and pull out the rod 1.
9 into the inner tube 15 while maintaining the same height as the height position when the jig holding part 19a is pulled out.
Insert it so that it corresponds to 2a.

ついで、同図eに示すように、挿入引出し棒1
9を上方に移動させて、治具12が完全に内管1
5から離れた位置までもつて行く。
Next, as shown in Figure e, insert and pull out the rod 1.
9 upward so that the jig 12 is completely attached to the inner tube 1.
Take it to a position far away from 5.

ついで、同図bに示すように、治具12を支持
した挿入引出し棒19を水平移動させて矢印方向
に取り出す。
Then, as shown in FIG. 2B, the insertion/drawing rod 19 supporting the jig 12 is moved horizontally and taken out in the direction of the arrow.

第7図aは、治具12を内管15内に挿入する
際の挿入引出し棒19の移動状態を示す線図で、
符号aは第6図aに、符号bは第6図bに、符号
cは第6図cにそれぞれ対応され、総合ではスク
ウエア・モーシヨン(矩形動作)する。
FIG. 7a is a diagram showing the movement state of the insertion/drawing rod 19 when inserting the jig 12 into the inner tube 15.
The symbol a corresponds to FIG. 6a, the symbol b corresponds to FIG. 6b, and the symbol c corresponds to FIG. 6c, respectively, and the overall movement is a square motion.

また、第7図bは、治具12を内管15から取
り出す際の挿入引出し棒19の移動状態を示す線
図で、符号dは第7図dに、符号eは第7図e
に、符号fは第7図fにそれぞれ対応され、第7
図aとは逆回りのスクウエア・モーシヨン(矩形
動作)する。
Further, FIG. 7b is a diagram showing the movement state of the insertion/drawing rod 19 when the jig 12 is taken out from the inner tube 15, and the symbol d is in FIG. 7d, and the symbol e is in FIG. 7e.
, the symbol f corresponds to FIG. 7 f, respectively, and
Make a square motion in the opposite direction to that shown in figure a.

以上の説明から明らかなように、本発明によれ
ば、処理室に熱処理治具を挿入する場合、一旦、
熱処理治具を処理室の壁(内面)から離れた位置
に動かして、横行動作を行つているから、従来の
ような熱処理治具を処理室の内壁に接触させたま
まで挿入方法と異なり、熱処理治具と処理室の内
壁とが接触したままでずらされることがない。
As is clear from the above description, according to the present invention, when inserting the heat treatment jig into the processing chamber,
Since the heat treatment jig is moved away from the wall (inner surface) of the processing chamber and the lateral movement is performed, unlike the conventional method of inserting the heat treatment jig while keeping it in contact with the inner wall of the processing chamber, the heat treatment The jig and the inner wall of the processing chamber remain in contact with each other and are not displaced.

したがつて、熱処理治具の処理室への挿入時
に、処理室内に熱処理治具と処理室内面との接触
部分から埃塵が発生することもなく、よつて半導
体ウエハなど熱処理物に埃塵による欠陥を生じさ
せることもない。これにより特性的に優れた熱処
理物(拡散処理物)を得ることができる。
Therefore, when the heat treatment jig is inserted into the process chamber, no dust is generated in the process chamber from the contact area between the heat treatment jig and the inside of the process chamber, and therefore, the heat treatment objects such as semiconductor wafers are prevented from being contaminated by dust and dust. It does not cause any defects. Thereby, a heat-treated product (diffusion-treated product) with excellent characteristics can be obtained.

また、本発明によれば、処理室に熱処理物を挿
入する際に用いる挿入引出し棒は、処理中(拡散
処理中)では処理室外においていることから、従
来のように、処理中においても長棒(パレル)を
処理室内に入れたままにしておく方法とは異な
り、処理室内の温度を奪つて温度を変化させるこ
とがない。したがつて、一定した温度下での熱処
理(拡散処理)が可能となり、処理物(拡散処理
物)に安定した処理(拡散処理)を施すことがで
きる。
Furthermore, according to the present invention, the insertion/drawing rod used when inserting the heat-treated material into the processing chamber is outside the processing chamber during the processing (diffusion processing), so unlike the conventional method, the long rod is used even during the processing. Unlike the method of leaving the (parallel) inside the processing chamber, the temperature inside the processing chamber is not taken away and the temperature is not changed. Therefore, heat treatment (diffusion treatment) can be performed at a constant temperature, and stable treatment (diffusion treatment) can be performed on the treated object (diffusion treatment object).

【図面の簡単な説明】[Brief explanation of drawings]

第1図ないし第2図は従来の熱処理物の挿入取
出し方法を示す説明斜視図、第3図は本発明の実
施に用いる装置の斜視図、第4図は第3図の1要
部を取り出し拡大しての斜視図、第5図は第3図
の第4図に示すと異なる1要部を示す拡大斜視
図、第6図a〜fは本発明の一実施例方法を示す
作業動作説明図、第7a,b図は本発明の実施に
用いる装置の挿入引出し棒の動きを示す線図であ
る。 1……ウエハ、2……ウエハ治具、3……拡散
炉、4……挿入引出し棒、5……内管、6……長
棒、6a……ウエハ収容部、6b……ローラ、1
0……挿入取出し装置、11…ウエハ、12……
ウエハ治具、12a……翼部、13……拡散炉、
15……内管、17……摺動杆、18……基板、
18a……袖部、18b……貫通穴、18c……
小面積側面、19……挿入引出し棒、19a……
治具持上部、20……横方向送り駆動モータ、2
0a……回転軸、21……高さ方向駆動モータ、
22……高さ幅調整カム、23……カムフオロ
ア、24……挿入引出し棒送りローラ、25……
ガイドローラ。
Figures 1 and 2 are explanatory perspective views showing a conventional method for inserting and removing heat-treated materials, Figure 3 is a perspective view of the apparatus used to carry out the present invention, and Figure 4 is a perspective view of one main part of Figure 3. FIG. 5 is an enlarged perspective view showing one main part that is different from that shown in FIG. 3 and FIG. 4. FIGS. Figures 7a and 7b are diagrams illustrating the movement of the insertion and withdrawal rod of the device used in the practice of the invention. DESCRIPTION OF SYMBOLS 1...Wafer, 2...Wafer jig, 3...Diffusion furnace, 4...Insertion/drawing rod, 5...Inner tube, 6...Long bar, 6a...Wafer storage section, 6b...Roller, 1
0...Insertion/extraction device, 11...Wafer, 12...
Wafer jig, 12a...wing section, 13...diffusion furnace,
15... Inner pipe, 17... Sliding rod, 18... Board,
18a...Sleeve part, 18b...Through hole, 18c...
Small area side, 19... Insertion/drawing rod, 19a...
Jig holding part, 20... Lateral direction feed drive motor, 2
0a... Rotating shaft, 21... Height direction drive motor,
22... Height and width adjustment cam, 23... Cam follower, 24... Insertion and pull-out rod feeding roller, 25...
guide roller.

Claims (1)

【特許請求の範囲】[Claims] 1 横型炉内に複数の半導体ウエハを載置したウ
エハ治具を挿入したり、前記横型炉内から前記ウ
エハ治具を取り出したりする工程を有する半導体
ウエハの熱処理方法において、石英ガラスから成
る円筒状の挿入取出し部を用いるとともに前記挿
入取出し部の先端部の2点で前記ウエハ治具を支
持し、その状態で前記ウエハ治具と前記横型炉内
面との間に実質的に動摩擦を生じることなく前記
ウエハ治具を前記横型炉内に挿入し及び前記横型
炉内から取り出すことを特徴とする半導体ウエハ
の熱処理方法。
1. In a semiconductor wafer heat treatment method that includes a step of inserting a wafer jig with a plurality of semiconductor wafers placed into a horizontal furnace and taking out the wafer jig from the horizontal furnace, a cylindrical wafer made of quartz glass is used. The wafer jig is supported at two points at the tip of the insertion/ejection part, and in this state substantially no dynamic friction is generated between the wafer jig and the inner surface of the horizontal furnace. A method for heat processing a semiconductor wafer, comprising inserting the wafer jig into the horizontal furnace and taking it out from the horizontal furnace.
JP59278881A 1984-12-28 1984-12-28 Heat treatment of semiconductor wafer Granted JPS60167322A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59278881A JPS60167322A (en) 1984-12-28 1984-12-28 Heat treatment of semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59278881A JPS60167322A (en) 1984-12-28 1984-12-28 Heat treatment of semiconductor wafer

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP4445677A Division JPS53129964A (en) 1977-04-20 1977-04-20 Method and device for inserting and taking out of heat treatment jig

Publications (2)

Publication Number Publication Date
JPS60167322A JPS60167322A (en) 1985-08-30
JPH0335824B2 true JPH0335824B2 (en) 1991-05-29

Family

ID=17603410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59278881A Granted JPS60167322A (en) 1984-12-28 1984-12-28 Heat treatment of semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS60167322A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10879095B2 (en) * 2018-02-26 2020-12-29 Samsung Electronics Co., Ltd. Jig for evaluating semiconductor processing chamber

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53129964A (en) * 1977-04-20 1978-11-13 Hitachi Ltd Method and device for inserting and taking out of heat treatment jig

Also Published As

Publication number Publication date
JPS60167322A (en) 1985-08-30

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