JPH0338730B2 - - Google Patents
Info
- Publication number
- JPH0338730B2 JPH0338730B2 JP56145713A JP14571381A JPH0338730B2 JP H0338730 B2 JPH0338730 B2 JP H0338730B2 JP 56145713 A JP56145713 A JP 56145713A JP 14571381 A JP14571381 A JP 14571381A JP H0338730 B2 JPH0338730 B2 JP H0338730B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- electrodes
- reaction chamber
- thin film
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3404—Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
- H10P14/3411—Silicon, silicon germanium or germanium
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Photovoltaic Devices (AREA)
Description
【発明の詳細な説明】
本発明は、例えばアモルフアスシリコン太陽電
池の製法に用いられるような一つの反応室内で多
数の基板上に同時に薄膜をプラズマCVD法で生
成する量産型薄膜生成装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a mass-production thin film production apparatus that simultaneously produces thin films on a large number of substrates in one reaction chamber by plasma CVD, such as is used in the production of amorphous silicon solar cells, for example.
第1図は周知のアモルフアスシリコン膜生成装
置を示し、反応槽1内に水平に配置した電極(サ
セプタ)2の上に置かれ、電極2の中のヒータに
よつて加熱される基板3に平板電極3を対向さ
せ、排気口5より真空排気しボンベ6からの
SiH4ガスにボンベ7からのH2ガス、ボンベ8か
らのArガス、さらにはP形膜形成のためにはボ
ンベ9からB2H6ガス、N形膜形成のためにはボ
ンベ10からPH3ガスを混合した反応ガスを導入
管11より反応槽1内に導入し、両電極2,4間
に高周波電源12または直流電源13によつてグ
ロー放電を発生させる。これによりSiH4が分解
して基板上にアモルフアスシリコン膜が生成す
る。しかしこのような装置を拡大して多数の基板
を一つの反応室内で同時に処理する場合には、反
応室が大きな面積を要するようになるため真空室
としては構造上適当でない。また反応室の内壁に
堆積した副生成物の膜が剥離し、基板面に付着し
て生成膜の欠陥になる虞があるが、大面積に広が
つた基板をこのような落下物から遮蔽することは
困難である。このような欠点を除くため、半導体
ウエハ等の基板を支持しかつ電極を兼ねた電極板
を石英管内に鉛直多層に配置し、さらにこれらを
2本の導体棒に交互に電気的に接続して2つの電
極群に分け、この間に電圧を印加する方法が知ら
れている(特開昭53−112066号ないしは実開昭53
−134663号公報参照)。 FIG. 1 shows a well-known amorphous silicon film production apparatus, in which a substrate 3 is placed on an electrode (susceptor) 2 arranged horizontally in a reaction tank 1, and a substrate 3 is heated by a heater in the electrode 2. With the flat electrodes 3 facing each other, the air is evacuated from the exhaust port 5 and the air is discharged from the cylinder 6.
SiH 4 gas, H 2 gas from cylinder 7, Ar gas from cylinder 8, B 2 H 6 gas from cylinder 9 for forming a P-type film, and PH from cylinder 10 for forming an N-type film. A reaction gas containing a mixture of the three gases is introduced into the reaction tank 1 through an introduction pipe 11, and a glow discharge is generated between the electrodes 2 and 4 by a high frequency power source 12 or a DC power source 13. This decomposes SiH 4 and forms an amorphous silicon film on the substrate. However, when such an apparatus is expanded to simultaneously process a large number of substrates in one reaction chamber, the reaction chamber requires a large area and is therefore not structurally suitable as a vacuum chamber. In addition, there is a risk that the film of by-products deposited on the inner wall of the reaction chamber may peel off and adhere to the substrate surface, causing defects in the produced film. That is difficult. In order to eliminate these drawbacks, electrode plates that support substrates such as semiconductor wafers and also serve as electrodes are arranged vertically in multiple layers inside a quartz tube, and these are electrically connected alternately to two conductor rods. A method is known in which the electrodes are divided into two groups and a voltage is applied between them.
-Refer to Publication No. 134663).
しかしながら、この方法では各電極への電圧の
供給が、導体棒により反応管内で分配されつつ行
われなければならないため、高電圧やメガヘルツ
以上の高周波電力を供給した場合には、電極板間
だけでなく導体棒と電極板間あるいは導体棒間で
異常放電が発生し、安定した放電が得られないと
いう欠点がある。しかもこの方法では、基板を反
応管の外側から加熱しているために、大面積の基
板に適用する場合には基板の中心部に比べ外周部
が高温となる上、反応管壁が高温にさらされるた
めに石英管壁で熱CVDが同時に発生するなど、
実用上大きな問題がある。 However, with this method, the voltage must be distributed to each electrode within the reaction tube using conductor rods, so when high voltage or high frequency power of megahertz or higher is supplied, the voltage must be distributed only between the electrode plates. However, there is a drawback that abnormal discharge occurs between the conductor rod and the electrode plate or between the conductor rods, and stable discharge cannot be obtained. Moreover, in this method, the substrate is heated from the outside of the reaction tube, so when applied to a large-area substrate, the outer periphery of the substrate becomes hotter than the center, and the reaction tube wall is exposed to high temperatures. thermal CVD occurs on the quartz tube wall at the same time.
There is a big practical problem.
本発明はこのような欠点を除き、反応室の面積
が小さくてすみ、反応室の内壁からの落下物の基
板面への付着のおそれのない量産型薄膜生成装置
を提供することを目的とする。 It is an object of the present invention to eliminate such drawbacks, provide a mass-produced thin film production device that requires only a small area of the reaction chamber, and is free from the risk of objects falling from the inner wall of the reaction chamber adhering to the substrate surface. .
この目的は、反応室内に収容された第一電極と
それに平行に対向する第二電極との間に電圧を印
加してグロー放電を発生させ、反応ガスを分解し
てその成分を薄膜として第一電極に支持された基
板上に生成する装置において、多数の第一電極と
第二電極とが等間隔で交互にそれぞれ鉛直に配置
され、二つの第二電極にはさまれた第一電極の両
面にそれぞれ基板が支持されることによつて達成
される。 The purpose of this is to generate a glow discharge by applying a voltage between a first electrode housed in the reaction chamber and a second electrode parallel to it, decomposing the reaction gas and converting its components into a thin film. In a device that generates on a substrate supported by electrodes, a large number of first electrodes and second electrodes are alternately arranged vertically at equal intervals, and both sides of the first electrode sandwiched between two second electrodes are used. This is achieved by supporting the substrates respectively.
以下、図面を引用して本発明の実施例について
説明する。第2図は本発明の一実施例の反応室の
底面を部分的に示し、ヒータを内蔵する電極(サ
セプタ)21と対向電極22は交互に平行に反応
室の底面23上に鉛直に立てられている。反応室
の底面23は絶縁部24と導電部25とから成
り、導電部25に電極21および22が固定され
ている。電極21はまた磁石を内蔵し、強磁性材
料、例えばJISSUS430のようなフエライト系ス
テンレス鋼からなる基板26を両面に吸着、支持
する。この両電極21,22間に電圧を印加し
て、プラズマCVD法によりい加熱された基板2
6上に薄膜を生成する。この場合基板26は鉛直
であるため、反応室の内壁から剥離し、鉛直に落
下する副生成物が基板面に付着することがない。
また鉛直電極21の両面に基板26が取付けられ
るので、小さい面積の反応室で多数の基板上に薄
膜を生成でき、床面積効率の点からも真空構造の
点からも有利である。 Embodiments of the present invention will be described below with reference to the drawings. FIG. 2 partially shows the bottom surface of a reaction chamber according to an embodiment of the present invention, in which an electrode (susceptor) 21 containing a heater and a counter electrode 22 are vertically erected alternately and parallel to each other on the bottom surface 23 of the reaction chamber. ing. The bottom surface 23 of the reaction chamber consists of an insulating part 24 and a conductive part 25, and electrodes 21 and 22 are fixed to the conductive part 25. The electrode 21 also has a built-in magnet, and attracts and supports a substrate 26 made of a ferromagnetic material, for example, ferrite stainless steel such as JISSUS430, on both sides. A voltage is applied between these electrodes 21 and 22, and the substrate 2 is heated by plasma CVD method.
A thin film is produced on 6. In this case, since the substrate 26 is vertical, byproducts that peel off from the inner wall of the reaction chamber and fall vertically do not adhere to the substrate surface.
Furthermore, since the substrates 26 are attached to both sides of the vertical electrode 21, thin films can be produced on a large number of substrates in a reaction chamber with a small area, which is advantageous in terms of floor space efficiency and vacuum structure.
第3図は基板の別の鉛直支持方式を示し、電極
21の両面の基部に基板26の端部がガイド板2
7に狭着されている。 FIG. 3 shows another vertical support method for the substrate, in which the ends of the substrate 26 are placed on the bases of both sides of the electrodes 21 by the guide plates 2.
It is narrowly attached to 7.
第4図は第2,3図における対向電極22を除
いて、電極はすべてヒータを内蔵するサセプタ2
1とし、一つおきのサセプタ21を電源の一方の
極に接続して放電を発生させる。各サセプタ21
は両面に基板26が取り付けられるので第2、第
3図の場合に比して約2倍の基板を処理すること
ができる。また低温の電極22が存在しないので
副生成物の付着箇所が減少し、反応室内のふん囲
気は副生成物が混入することが少なく、清浄に保
たれるので生成膜質が良好になる。 In FIG. 4, all electrodes, except for the counter electrode 22 in FIGS. 2 and 3, are mounted on a susceptor 2 with a built-in heater.
1, and every other susceptor 21 is connected to one pole of the power source to generate discharge. Each susceptor 21
Since the substrates 26 are attached to both sides, it is possible to process about twice as many substrates as in the case of FIGS. 2 and 3. Furthermore, since the low-temperature electrode 22 is not present, the number of locations where by-products adhere is reduced, and the ambient air in the reaction chamber is kept clean with less by-products being mixed in, resulting in improved film quality.
上述の例では、電極21、22は反応室の底面
23の上に立てられているが、反応室の側壁に固
定されてもよい。 In the above example, the electrodes 21 and 22 are erected on the bottom surface 23 of the reaction chamber, but they may be fixed to the side wall of the reaction chamber.
以上述べたように、本発明はグロー放電のため
にその間に電圧が印加される二種類の電極を平行
に対向させて交互に、かつ鉛直に立てて一つの反
応室内に多数配置するもので、これにより占有面
積に対比して多数の基板を電極上に支持すること
ができ、また反応室内壁に付着した副生成物が剥
離した際基板表面に落下して付着することがない
ので、欠陥のない良質の膜を生成でき、特にアモ
ルフアスシリコン太陽電池の量産に対して極めて
有効に利用できる。さらに、第1、第2の電極群
に反応室外の配線網を介して第1、第2電極間に
グロー放電を発生するための電圧を印加するよう
にしたことにより、両電極を導体棒で支持した従
来装置と異なつて電極間以外での異常放電がな
く、安定した放電が得られ、特に大面積の基板を
用いる量産型の装置において成膜成能の大幅な向
上が可能である。 As described above, in the present invention, a large number of two types of electrodes to which a voltage is applied between for glow discharge are arranged parallel to each other, alternately and vertically, in one reaction chamber. This allows a large number of substrates to be supported on the electrode compared to the occupied area, and also prevents by-products adhering to the reaction chamber walls from falling and adhering to the substrate surface when peeled off. It is possible to produce high-quality films with high quality, and can be used extremely effectively, especially for mass production of amorphous silicon solar cells. Furthermore, by applying a voltage to generate a glow discharge between the first and second electrode groups via a wiring network outside the reaction chamber, both electrodes can be connected using a conductive rod. Unlike the supported conventional device, there is no abnormal discharge other than between the electrodes, stable discharge is obtained, and film formation performance can be significantly improved, especially in mass-produced devices using large-area substrates.
第1図はアモルフアスシリコン膜生成装置の従
来例の断面図、第2図は本発明の一実施例の薄膜
生成装置の一部分を切断して示した斜視図、第3
図はその電極部の別の実施例の断面図、第4図は
さらに異なる実施例の断面図である。
21……電極(サセプタ)、22……対向電極、
23……反応室底面、26……基板。
FIG. 1 is a sectional view of a conventional example of an amorphous silicon film production device, FIG. 2 is a partially cutaway perspective view of a thin film production device according to an embodiment of the present invention, and FIG.
The figure is a cross-sectional view of another embodiment of the electrode portion, and FIG. 4 is a cross-sectional view of a further different embodiment. 21... Electrode (susceptor), 22... Counter electrode,
23...Bottom surface of the reaction chamber, 26...Substrate.
Claims (1)
する第二電極との間に電圧を印加してグロー放電
を発生させ、反応ガスを分解してその成分を薄膜
として第一電極に支持された基板上に生成するも
のにおいて、多数の第1電極と第2電極とが等間
隔で交互に、しかもそれぞれの電極に放電電圧を
印加することが可能なように反応室壁を兼ねた導
電部を介して反応室壁に鉛直に直接固定され、前
記第1と第2の電極群には反応室外の配線網を介
して第1、第2電極間にグロー放電を発生させる
ための電圧が印加され、しかも二つの第二電極に
はさまれた第一電極の両面にそれぞれ基板が支持
されたことを特徴とする量産型薄膜生成装置。 2 特許請求の範囲第1項記載の装置において、
第一電極が磁石を内蔵し、基板が強磁性材よりな
ることを特徴とする量産型薄膜生成装置。 3 特許請求の範囲第1項記載の装置において、
基板の端部がそれぞれ反応室の一つの壁面に固定
された第一電極の基部とガイド板の間に狭着され
たことを特徴とする量産型薄膜生成装置。 4 特許請求の範囲第1項ないし第3項のいずれ
かに記載の装置において、第二電極にも第一電極
におけると同様に基板が支持されたことを特徴と
する量産型薄膜生成装置。[Claims] 1. Glow discharge is generated by applying a voltage between a first electrode housed in a reaction chamber and a second electrode facing it, decomposing the reaction gas and converting its components into a thin film. In the case where a large number of first electrodes and second electrodes are formed on a substrate supported by one electrode, a large number of first electrodes and second electrodes are arranged on the reaction chamber wall alternately at equal intervals, and a discharge voltage can be applied to each electrode. The first and second electrode groups are directly fixed vertically to the wall of the reaction chamber via a conductive part that also serves as a conductor, and a glow discharge is generated between the first and second electrodes via a wiring network outside the reaction chamber. What is claimed is: 1. A mass-produced thin film production device, characterized in that a voltage is applied thereto, and substrates are supported on both sides of a first electrode sandwiched between two second electrodes. 2. In the device according to claim 1,
A mass-produced thin film production device characterized in that the first electrode has a built-in magnet and the substrate is made of a ferromagnetic material. 3. In the device according to claim 1,
1. A mass-produced thin film production device characterized in that the ends of the substrates are sandwiched between the base of a first electrode and a guide plate, each of which is fixed to one wall of a reaction chamber. 4. A mass-produced thin film production device according to any one of claims 1 to 3, characterized in that a substrate is supported on the second electrode as well as on the first electrode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56145713A JPS5848416A (en) | 1981-09-16 | 1981-09-16 | Mass production type thin film forming device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56145713A JPS5848416A (en) | 1981-09-16 | 1981-09-16 | Mass production type thin film forming device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5848416A JPS5848416A (en) | 1983-03-22 |
| JPH0338730B2 true JPH0338730B2 (en) | 1991-06-11 |
Family
ID=15391397
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56145713A Granted JPS5848416A (en) | 1981-09-16 | 1981-09-16 | Mass production type thin film forming device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5848416A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4423701A (en) * | 1982-03-29 | 1984-01-03 | Energy Conversion Devices, Inc. | Glow discharge deposition apparatus including a non-horizontally disposed cathode |
| JPH0719750B2 (en) * | 1984-06-22 | 1995-03-06 | 鐘淵化学工業株式会社 | Glo-discharge type film forming device |
| JPH0719751B2 (en) * | 1984-07-02 | 1995-03-06 | 鐘淵化学工業株式会社 | Deposition method |
| NL1022489C2 (en) * | 2003-01-24 | 2004-07-28 | Stichting Energie | Coupler for thin-film photovoltaic cells. |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53112066A (en) * | 1977-03-11 | 1978-09-30 | Fujitsu Ltd | Plasma treatment apparatus |
| JPS5729309Y2 (en) * | 1977-03-30 | 1982-06-26 |
-
1981
- 1981-09-16 JP JP56145713A patent/JPS5848416A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5848416A (en) | 1983-03-22 |
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