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JPH0350264B2 - - Google Patents
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JPH0350264B2 - - Google Patents

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Publication number
JPH0350264B2
JPH0350264B2 JP57174319A JP17431982A JPH0350264B2 JP H0350264 B2 JPH0350264 B2 JP H0350264B2 JP 57174319 A JP57174319 A JP 57174319A JP 17431982 A JP17431982 A JP 17431982A JP H0350264 B2 JPH0350264 B2 JP H0350264B2
Authority
JP
Japan
Prior art keywords
amorphous silicon
hydrogenated amorphous
gas
silicon oxide
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57174319A
Other languages
Japanese (ja)
Other versions
JPS5962863A (en
Inventor
Hideji Yoshizawa
Genichi Adachi
Masao Obara
Takeshi Matsuo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP17431982A priority Critical patent/JPS5962863A/en
Publication of JPS5962863A publication Critical patent/JPS5962863A/en
Publication of JPH0350264B2 publication Critical patent/JPH0350264B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Physical Vapour Deposition (AREA)
  • Photoreceptors In Electrophotography (AREA)

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、電子複写機や電子プリンタ等に用い
られる電子写真装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Field of Industrial Application) The present invention relates to an electrophotographic device used in an electronic copying machine, an electronic printer, or the like.

(従来の技術) アモルフアスシリコン(a−Si)は、主として
太陽電池などの半導体応用技術において利用され
つつあるが、近年この種のアモルフアスシリコン
を電子写真技術に応用する提案がなされている。
(Prior Art) Amorphous silicon (a-Si) is being used mainly in semiconductor application technology such as solar cells, but in recent years there have been proposals to apply this type of amorphous silicon to electrophotography technology.

これは、この種のアモルフアスシリコンの耐摩
耗性、長波長光に対する感度性から、複写機、ノ
ンインパクトプリンタ等における静電潜像担持体
である電子写真感光体の材料としての有用性が認
められていることによる。
This type of amorphous silicon has been recognized to be useful as a material for electrophotographic photoreceptors, which are electrostatic latent image carriers in copiers, non-impact printers, etc., due to its wear resistance and sensitivity to long wavelength light. Depends on what is being done.

(発明が解決しようとする課題) ところで、このアモルフアスシリコンも用いた
電子写真感光体は、導電性基板上に、SiH4ガス
のグロー放電分解によりアモルフアスシリコン
(a−Si)膜を形成してなる。しかし、純SiH4
スを用いて形成された水素化アモルフアスシリコ
ン(a−Si:H)膜は、暗中での比抵抗が1011Ω
cmと小さいため、電子写真プロセス中の直流コロ
ナ帯電を行なつても充分な表面電位を保持するこ
とが出来ない。
(Problem to be Solved by the Invention) By the way, an electrophotographic photoreceptor using amorphous silicon also forms an amorphous silicon (a-Si) film on a conductive substrate by glow discharge decomposition of SiH 4 gas. It becomes. However, a hydrogenated amorphous silicon (a-Si:H) film formed using pure SiH4 gas has a specific resistance of 10 11 Ω in the dark.
Because of its small size (cm), it is not possible to maintain a sufficient surface potential even when DC corona charging is performed during the electrophotographic process.

そこで、アモルフアスシリコン膜の大暗抵抗化
を図るべく酸素をドーピングすることが考えられ
ている。すなわち、SiH4ガスとO2ガスの混合ガ
スを用いて形成された水素化アモルフアスシリコ
ン酸化膜(a−Si:O:H膜)では、O2濃度を
コントロールすることにより暗中での抵抗を1011
Ωcm以上にすることができる。ところが、同時に
光照射時の抵抗が1011Ωcm以上になつてしまい、
充分な光感度が得られないので、電子写真感光体
としては使用できない。
Therefore, it has been considered to dope oxygen to increase the dark resistance of the amorphous silicon film. In other words, in a hydrogenated amorphous silicon oxide film (a-Si:O:H film) formed using a mixed gas of SiH 4 gas and O 2 gas, the resistance in the dark can be reduced by controlling the O 2 concentration. 10 11
It can be made more than Ωcm. However, at the same time, the resistance during light irradiation became more than 10 11 Ωcm.
Since sufficient photosensitivity cannot be obtained, it cannot be used as an electrophotographic photoreceptor.

本発明は、上記事情に基づいてなされたもの
で、その目的は、帯電特性、暗減衰特性、及び光
感度特性に優れた電子写真感光体を提供すること
にある。
The present invention has been made based on the above circumstances, and an object thereof is to provide an electrophotographic photoreceptor having excellent charging characteristics, dark decay characteristics, and photosensitivity characteristics.

[発明の構成] (課題を解決するための手段) 本発明の電子写真感光体は、導電性基板と、こ
の導電性基板上に形成された第1の水素化アモル
フアスシリコン酸化膜と、この第1の水素化アモ
ルフアスシリコン酸化膜上に形成された水素化ア
モルフアスシリコン膜と、この水素化アモルフア
スシリコン膜上に形成された第2の水素化アモル
フアスシリコン酸化膜とを具備し、前記第1及び
第2の水素化アモルフアスシリコン酸化膜は、シ
リコンを含むガスと、このガスに対して流量比で
0.5%以上の酸素との混合ガスのグロー放電を用
いて形成され、前記水素化アモルフアスシリコン
膜は、シリコン含み、酸素を含まないガスのグロ
ー放電を用いて形成されたことを特徴とする。
[Structure of the Invention] (Means for Solving the Problems) The electrophotographic photoreceptor of the present invention includes a conductive substrate, a first hydrogenated amorphous silicon oxide film formed on the conductive substrate, and a first hydrogenated amorphous silicon oxide film formed on the conductive substrate. A hydrogenated amorphous silicon oxide film formed on the first hydrogenated amorphous silicon oxide film, and a second hydrogenated amorphous silicon oxide film formed on the hydrogenated amorphous silicon oxide film, The first and second hydrogenated amorphous silicon oxide films are coated with a silicon-containing gas at a flow rate ratio to this gas.
The hydrogenated amorphous silicon film is formed using a glow discharge of a gas mixed with 0.5% or more of oxygen, and the hydrogenated amorphous silicon film is characterized in that it is formed using a glow discharge of a gas containing silicon but not containing oxygen.

(作用) 酸素ガスの存在下で水素化アモルフアスシリコ
ン膜を形成すると、水素化アモルフアスシリコン
酸化膜が形成され、Si−Si結合の中にSi=O結合
が形成され、これが電子を局在化させ、そのため
光導電性が低下してしまう。
(Function) When a hydrogenated amorphous silicon film is formed in the presence of oxygen gas, a hydrogenated amorphous silicon oxide film is formed, and Si=O bonds are formed in the Si-Si bonds, which localize electrons. , resulting in a decrease in photoconductivity.

これに対し、水素化アモルフアスシリコンは、
Si−Si結合を中心とした3次元構造を形成し、ダ
ングリングボンドをSi−H結合により補償してお
り、電子の局在化の少ない状態で高い光導電性を
維持することが出来る。
In contrast, hydrogenated amorphous silicon
A three-dimensional structure centered on Si-Si bonds is formed, and dangling bonds are compensated for by Si-H bonds, making it possible to maintain high photoconductivity with less electron localization.

そこで、本発明の電子写真感光体では、酸素を
含まない水素化アモルフアスシリコン膜を、酸素
を含む第1及び第2の水素化アモルフアスシリコ
ン酸化膜で挟む構造とすることにより、酸素を含
む第1及び第2の水素化アモルフアスシリコン酸
化膜により暗抵抗を向上させるとともに、酸素を
含まない水素化アモルフアスシリコン膜により光
感度を向上させている。
Therefore, in the electrophotographic photoreceptor of the present invention, a hydrogenated amorphous silicon oxide film that does not contain oxygen is sandwiched between first and second hydrogenated amorphous silicon oxide films that contain oxygen. The dark resistance is improved by the first and second hydrogenated amorphous silicon oxide films, and the photosensitivity is improved by the hydrogenated amorphous silicon film which does not contain oxygen.

(実施例) 以下、本発明の一実施例を、図面を参照して説
明する。
(Example) An example of the present invention will be described below with reference to the drawings.

第1図は、本発明に係る電子写真感光体の製造
装置を示すもので、図中、参照数字1は、装置本
体のベースを示し、このベース1上には真空チヤ
ンバ2が設けられている。真空チヤンバ2内には
対向電極が設けられ、この対向電極3の内部には
ガス通路4が設けられている。また、対向電極3
の円周面には上記ガス通路4に連通する噴出孔5
が多数穿設され、されに上記ガス通路4にはガス
導入管6が接続されている。このガス導入管6に
はバルブ7ガ配設されているとともに、このバル
ブ7より上流側において、シラン(SiH4)を収
容するガスボンベ8及び酸素(O2)を収容する
ガスボンベ9が、それぞれバルブ10,11を介
して接続されている。これらバルブ10,11を
の開口度を調整することにより、一方のガスの
み、または両方のガスを必要な流量で、バルブ7
を介してチヤンバ2内に導入することが出来るよ
うになつている。
FIG. 1 shows an apparatus for manufacturing an electrophotographic photoreceptor according to the present invention. In the figure, reference numeral 1 indicates a base of the apparatus main body, and a vacuum chamber 2 is provided on this base 1. . A counter electrode is provided within the vacuum chamber 2, and a gas passage 4 is provided within the counter electrode 3. In addition, the counter electrode 3
A jet hole 5 communicating with the gas passage 4 is provided on the circumferential surface of the
A large number of gas passages 4 are drilled therein, and a gas introduction pipe 6 is connected to the gas passage 4. A valve 7 is disposed in the gas introduction pipe 6, and on the upstream side of the valve 7, a gas cylinder 8 containing silane (SiH 4 ) and a gas cylinder 9 containing oxygen (O 2 ) are installed at the respective valves. They are connected via 10 and 11. By adjusting the opening degrees of these valves 10 and 11, only one gas or both gases can be supplied to the valve 7 at the required flow rate.
It can be introduced into the chamber 2 through the.

また、上記チヤンバ2内の底部には、図示しな
いモータによつて駆動されるターンテーブル12
が設けられ、このターンテーブル12上には、導
電性基板としてのAlドラム基板13が配置され
ているとともに、ヒータ14が上記Alドラム基
板13内に固設されている。また、上記ベース1
には、上記チヤンバ2内と連通する排出管15が
接続され、この排出管15には、拡散ポンプ16
及びロータリーポンプ17が配設されている。
Further, at the bottom of the chamber 2, there is a turntable 12 driven by a motor (not shown).
An Al drum substrate 13 as a conductive substrate is disposed on the turntable 12, and a heater 14 is fixedly installed inside the Al drum substrate 13. In addition, the above base 1
A discharge pipe 15 communicating with the inside of the chamber 2 is connected to the discharge pipe 15, and a diffusion pump 16 is connected to the discharge pipe 15.
and a rotary pump 17 are provided.

次に、以上のように構成された製造装置を用い
て、電子写真感光体を製造する手順について説明
する。
Next, a procedure for manufacturing an electrophotographic photoreceptor using the manufacturing apparatus configured as described above will be described.

まず、チヤンバ2内にセツトしたAlドラム基
板13をヒータ14のより加熱し、250℃に保持
し、導入管6を介して酸素(O2)ガスと、シリ
コンを含むガスである純シランガスとの混合ガス
をチヤンバ2内に導入した。このとき、混合ガス
はシランガスに対して流量比で0.5%以上の酸素
を含み、またシランガスの流量は50SCCMとし
た。
First, the Al drum substrate 13 set in the chamber 2 is heated by the heater 14 and maintained at 250°C, and oxygen (O 2 ) gas and pure silane gas, which is a gas containing silicon, are heated through the introduction pipe 6. A mixed gas was introduced into chamber 2. At this time, the mixed gas contained oxygen at a flow rate ratio of 0.5% or more to the silane gas, and the flow rate of the silane gas was 50 SCCM.

次いで、チヤンバ2内を0.1Torr.に減圧したと
ころでRF電源19を作動させ、対向電極3に
10Wの高周波電力を印加し、チヤンバ2内のガス
をグロー放電によるプラズマ状態とし、15分間成
膜を行なつた。その結果、第2図に示すように、
Alドラム基板13上には第1の水素化アモルフ
アスシリコン酸化膜19が厚さ0.1μm程形成され
た。
Next, when the pressure inside the chamber 2 is reduced to 0.1 Torr, the RF power supply 19 is activated, and the counter electrode 3 is
A high frequency power of 10 W was applied to bring the gas in the chamber 2 into a plasma state due to glow discharge, and film formation was performed for 15 minutes. As a result, as shown in Figure 2,
A first hydrogenated amorphous silicon oxide film 19 was formed on the Al drum substrate 13 to a thickness of about 0.1 μm.

次に、酸素(O2)ガスのみ流入を止めて、同
一圧力で、高周波電力を100W印加し、グロー放
電を生ぜしめ、チヤンバ2内のガスをプラズマ状
態とした。この状態を5時間維持し、第1の水素
化アモルフアスシリコン酸化膜19上に水素化ア
モルフアスシリコン膜20を厚さ15μmで形成し
た。
Next, the inflow of only oxygen (O 2 ) gas was stopped, and high frequency power of 100 W was applied at the same pressure to generate a glow discharge, and the gas in the chamber 2 was brought into a plasma state. This state was maintained for 5 hours, and a hydrogenated amorphous silicon film 20 was formed on the first hydrogenated amorphous silicon oxide film 19 to a thickness of 15 μm.

次いで、最初と同じ状態、即ちシランガスに加
えて酸素を混入せしめ、高周波電力を10Wとし
て、15分間成膜を行ない、水素化アモルフアスシ
リコン膜20上に第2の水素化アモルフアスシリ
コン酸化膜21を形成した。
Next, film formation is performed for 15 minutes under the same conditions as the beginning, that is, oxygen is mixed in addition to silane gas, and the high frequency power is 10 W, to form a second hydrogenated amorphous silicon oxide film 21 on the hydrogenated amorphous silicon film 20. was formed.

このようにして製造された電子写真感光体は、
第1と第2の水素化アモルフアスシリコン酸化膜
19,21が、導電性基板13からの電荷の注
入、表面電荷の流出を阻止し、暗抵抗を大きくし
て電荷保持能力を高める電荷注入阻止機能を有
し、水素化アモルフアスシリコン膜20が光を受
けて電荷を発生し、光導電体としての作用をなす
電荷発生機能を有するため、優れた帯電特性、暗
減衰特性及び光感度特性を示した。
The electrophotographic photoreceptor manufactured in this way is
The first and second hydrogenated amorphous silicon oxide films 19 and 21 prevent charge injection from the conductive substrate 13 and prevent surface charge from flowing out, increasing dark resistance and increasing charge retention ability. The hydrogenated amorphous silicon film 20 generates a charge upon receiving light and has a charge generation function that acts as a photoconductor, so it has excellent charging characteristics, dark decay characteristics, and photosensitivity characteristics. Indicated.

この感光体に+8kVのコロナ放電を行なつた時
の表面電位と100ルツクス照射後の露光残留電位
の変化を、第1及び第2の水素化アモルフアスシ
リコン酸化膜19,21の形成の際の酸素(O2
の流量比に対してプロツトしたのが第3図のグラ
フである。第3図から明らかなように、酸素流量
比の増加に従つて表面電位が増加しており、従つ
て電荷保持能力が増加することがわかる。一方、
残留電位は、酸素流量比に依存せずに、一様に低
い。
The changes in the surface potential when a +8kV corona discharge was applied to this photoreceptor and the exposure residual potential after 100 lux irradiation were measured during the formation of the first and second hydrogenated amorphous silicon oxide films 19 and 21. Oxygen ( O2 )
The graph in FIG. 3 is plotted against the flow rate ratio. As is clear from FIG. 3, the surface potential increases as the oxygen flow rate ratio increases, and therefore the charge retention ability increases. on the other hand,
The residual potential is uniformly low, independent of the oxygen flow rate ratio.

次に、第1及び第2の水素化アモルフアスシリ
コン酸化膜19,21の形成の際の酸素量は変化
させずに、水素化アモルフアスシリコン膜20の
形成の際にシランガスに酸素を含有せしめ、その
量を変化させたことを除き、上述と同様の条件で
同様に感光体を製造した。これら感光体に+8kV
のコロナ放電を行なつた時の表面電位と100ルツ
クス照射後の露光残留電位の変化を求めたとこ
ろ、第4図に示す結果を得た。
Next, oxygen is added to the silane gas when forming the hydrogenated amorphous silicon film 20 without changing the amount of oxygen during the formation of the first and second hydrogenated amorphous silicon oxide films 19 and 21. A photoreceptor was similarly produced under the same conditions as described above, except that the amount was changed. +8kV to these photoreceptors
The changes in the surface potential during corona discharge and the exposure residual potential after 100 lux irradiation were determined, and the results shown in FIG. 4 were obtained.

第4図のグラフから、シランガスに酸素を含有
せしめて膜20を形成した場合には、酸素を含有
させない場合(第3図)に比べ、残留電位が急速
に上昇し、光導電性が低下していることがわか
る。
From the graph in Figure 4, it can be seen that when the film 20 is formed by adding oxygen to the silane gas, the residual potential increases rapidly and the photoconductivity decreases, compared to the case where oxygen is not included (Figure 3). It can be seen that

[発明の効果] 以上説明したように、本発明によれば、導電性
基板上に酸素とシリコンを含むガスとの混合ガス
のグロー放電を用いて第1の水素化アモルフアス
シリコン酸化膜を形成し、この第1の水素化アモ
ルフアスシリコン酸化膜上に少なくともシリコン
を含み、酸素を含まないガスのグロー放電を用い
て水素化アモルフアスシリコン膜を形成し、この
水素化アモルフアスシリコン膜上に上記第1の水
素化アモルフアスシリコン酸化膜と同様にして第
2の水素化アモルフアスシリコン酸化膜を形成す
ることにより、優れた帯電特性、暗減衰特性及び
光感度特性を売ることが出来る等、優れた効果を
奏する。
[Effects of the Invention] As explained above, according to the present invention, a first hydrogenated amorphous silicon oxide film is formed on a conductive substrate using glow discharge of a mixed gas of a gas containing oxygen and silicon. A hydrogenated amorphous silicon film is formed on this first hydrogenated amorphous silicon oxide film using glow discharge of a gas that contains at least silicon and does not contain oxygen, and on this hydrogenated amorphous silicon film. By forming the second hydrogenated amorphous silicon oxide film in the same manner as the first hydrogenated amorphous silicon oxide film, excellent charging characteristics, dark decay characteristics, and photosensitivity characteristics can be obtained. It has excellent effects.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る電子写真感光体の製造装
置の一例を示す縦断面図、第2図は同装置により
製造された本発明の電子写真感光体を示す断面
図、第3図は第1及び第2の水素化アモルフアス
シリコン酸化膜の形成の際のSiO4ガスに対する
O2ガス流量比と帯電電位及び残留電位との関係
を示すグラフ図、及び第4図は水素化アモルフア
スシリコン膜の形成の際のSiO4ガスに対するO2
ガス流量比と帯電電位及び残留電位との関係を示
すグラフ図である。 13……導電性基板(Alドラム基板)、19…
…第1の水素化アモルフアスシリコン酸化膜、2
0……水素化アモルフアスシリコン膜、21……
第2の水素化アモルフアスシリコン酸化膜。
FIG. 1 is a longitudinal sectional view showing an example of an apparatus for manufacturing an electrophotographic photoreceptor according to the present invention, FIG. 2 is a sectional view showing an electrophotographic photoreceptor of the invention manufactured by the same apparatus, and FIG. Regarding SiO 4 gas during formation of the first and second hydrogenated amorphous silicon oxide films
A graph showing the relationship between O 2 gas flow rate ratio, charging potential, and residual potential, and FIG .
FIG. 2 is a graph diagram showing the relationship between gas flow rate ratio, charging potential, and residual potential. 13... Conductive substrate (Al drum substrate), 19...
...first hydrogenated amorphous silicon oxide film, 2
0... Hydrogenated amorphous silicon film, 21...
Second hydrogenated amorphous silicon oxide film.

Claims (1)

【特許請求の範囲】[Claims] 1 導電性基板と、この導電性基板上に形成され
た第1の水素化アモルフアスシリコン酸化膜と、
この第1の水素化アモルフアスシリコン酸化膜上
に形成された水素化アモルフアスシリコン膜と、
この水素化アモルフアスシリコン膜上に形成され
た第2の水素化アモルフアスシリコン酸化膜とを
具備し、前記第1及び第2の水素化アモルフアス
シリコン酸化膜は、シリコンを含むガスと、この
ガスに対して流量比で0.5%以上の酸素との混合
ガスのグロー放電を用いて形成され、前記水素化
アモルフアスシリコン膜は、シリコンを含み、酸
素を含まないガスのグロー放電を用いて形成され
たことを特徴とする電子写真感光体。
1 a conductive substrate, a first hydrogenated amorphous silicon oxide film formed on the conductive substrate,
A hydrogenated amorphous silicon film formed on the first hydrogenated amorphous silicon oxide film,
a second hydrogenated amorphous silicon oxide film formed on the hydrogenated amorphous silicon film, and the first and second hydrogenated amorphous silicon oxide films contain a gas containing silicon; The hydrogenated amorphous silicon film is formed using a glow discharge of a gas mixed with oxygen at a flow rate ratio of 0.5% or more to the gas, and the hydrogenated amorphous silicon film is formed using a glow discharge of a gas containing silicon but not containing oxygen. An electrophotographic photoreceptor characterized by:
JP17431982A 1982-10-04 1982-10-04 Electrophotographic receptor Granted JPS5962863A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17431982A JPS5962863A (en) 1982-10-04 1982-10-04 Electrophotographic receptor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17431982A JPS5962863A (en) 1982-10-04 1982-10-04 Electrophotographic receptor

Publications (2)

Publication Number Publication Date
JPS5962863A JPS5962863A (en) 1984-04-10
JPH0350264B2 true JPH0350264B2 (en) 1991-08-01

Family

ID=15976564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17431982A Granted JPS5962863A (en) 1982-10-04 1982-10-04 Electrophotographic receptor

Country Status (1)

Country Link
JP (1) JPS5962863A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150042200A (en) * 2012-08-09 2015-04-20 봇슈 가부시키가이샤 Pressure sensor type glow plug

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57115557A (en) * 1981-01-09 1982-07-19 Canon Inc Photoconductive material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150042200A (en) * 2012-08-09 2015-04-20 봇슈 가부시키가이샤 Pressure sensor type glow plug

Also Published As

Publication number Publication date
JPS5962863A (en) 1984-04-10

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