JPH0353274B2 - - Google Patents
Info
- Publication number
- JPH0353274B2 JPH0353274B2 JP26185485A JP26185485A JPH0353274B2 JP H0353274 B2 JPH0353274 B2 JP H0353274B2 JP 26185485 A JP26185485 A JP 26185485A JP 26185485 A JP26185485 A JP 26185485A JP H0353274 B2 JPH0353274 B2 JP H0353274B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- crucible
- silicon
- carbon
- silicon melt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 48
- 229910052710 silicon Inorganic materials 0.000 claims description 48
- 239000010703 silicon Substances 0.000 claims description 48
- 239000013078 crystal Substances 0.000 claims description 38
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 37
- 229910052799 carbon Inorganic materials 0.000 claims description 37
- 239000011888 foil Substances 0.000 claims description 18
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 8
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 8
- 238000009826 distribution Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- LOYTUFQOTJYLPX-UHFFFAOYSA-N C1=CC=[Si]C=C1 Chemical compound C1=CC=[Si]C=C1 LOYTUFQOTJYLPX-UHFFFAOYSA-N 0.000 description 1
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
[発明の技術分野]
本発明は結晶端支持材(ストリング)を使用し
た平板状シリコン結晶の成長装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an apparatus for growing flat silicon crystals using crystal end supports (strings).
[発明の技術的背景とその問題点]
近年、太陽電池を安価に製造するため第3図に
示す引上げ方法が開発されている。尚、第3図a
は平面図、同図bは同図のA−A′線断面図であ
る。すなわち、カーボン製るつぼ32中に収容さ
れた多結晶シリコンをヒータ34,35に通電し
て融解し、シリコン融液33をつくる。その後、
前記カーボン製るつぼ32の底の小孔37a,3
7bにホツトチヤンバ36を介して、結晶端支持
材であるカーボン繊維で構成した直径0.5mmのス
トリング31a,31bを通し、シリコン融液3
3の面上にその先端を出す。その後ストリング3
1a,31b間に種結晶(図示せず)を下降し、
シリコン融液33とストリング31a,31b先
端になじませると、ストリング31a,31bと
種結晶によりシリコン融液33は支えられる。種
結晶と伴に2本のストリング31a,31bを引
上げることにより平板状のシリコン結晶が引上げ
られる。ところで、このような装置で引上げられ
た平板状シリコン結晶の厚さが不均一で例えば太
陽電池として使用する場合、素子工程特に電極等
の印刷工程で割れ、素子作成歩留りが30〜40%と
低かつた。さらに引上げ終了後、カーボン製るつ
ぼ中に残つたシリコン融液が固体化する際の体積
膨脹によりカーボン製るつぼが破損し再使用が困
難であつた。[Technical background of the invention and its problems] In recent years, a pulling method shown in FIG. 3 has been developed in order to manufacture solar cells at low cost. Furthermore, Figure 3a
is a plan view, and figure b is a sectional view taken along line A-A' in the same figure. That is, the heaters 34 and 35 are energized to melt the polycrystalline silicon contained in the carbon crucible 32 to form a silicon melt 33. after that,
Small holes 37a, 3 at the bottom of the carbon crucible 32
The silicon melt 3 is passed through the hot chamber 36 through the strings 31a and 31b with a diameter of 0.5 mm made of carbon fiber as a crystal end support material.
Put the tip out on the surface of 3. then string 3
A seed crystal (not shown) is lowered between 1a and 31b,
When the silicon melt 33 is blended with the ends of the strings 31a, 31b, the silicon melt 33 is supported by the strings 31a, 31b and the seed crystal. By pulling up the two strings 31a and 31b together with the seed crystal, a flat silicon crystal is pulled up. By the way, when the flat silicon crystal pulled by such a device has an uneven thickness and is used as a solar cell, for example, it will crack during the device process, especially the printing process for electrodes, etc., resulting in a low device production yield of 30 to 40%. It was. Further, after the completion of pulling, the silicon melt remaining in the carbon crucible was damaged due to volume expansion when it solidified, making it difficult to reuse it.
平板状シリコン結晶の厚さが不均一な原因を調
査した結果、シリコン融液の温度分布が不均一で
あるための判明した。間隔100mmの2本のストリ
ング間のシリコン融液の温度を10mm間隔で測定し
た。測定は熱電対を石英ガラス等の保護管内に挿
入して行つた。第4図aにシリコン融液の温度分
布を示す。すなわち、最も高温な部分(図中測定
点4)で1490±2℃、最も低温な部分で1480±3
℃と約10℃の差がありかつ温度分布の凹凸が観察
された。 After investigating the reason for the non-uniform thickness of the flat silicon crystal, it was found that the temperature distribution of the silicon melt was non-uniform. The temperature of the silicon melt between two strings with a spacing of 100 mm was measured at 10 mm intervals. Measurements were carried out by inserting a thermocouple into a protective tube made of quartz glass or the like. Figure 4a shows the temperature distribution of the silicon melt. In other words, the hottest part (measurement point 4 in the figure) is 1490±2℃, and the coldest part is 1480±3℃.
There was a difference of about 10°C between the two temperatures, and unevenness in the temperature distribution was observed.
このようなシリコン融液の温度分布で引上げ速
度16mm〜18mm/分で成長を試みた。幅100mmの平
板状シリコン結晶の成長は継続するものの、幅方
向に厚さの不均一性が発生した。厚さを測定した
結果を第4図bに示す。最も厚い部分(温度が最
も低い部分、図中測定点10)で510±20μm、
最も薄い部分(温度が最も高い部分、図中測定点
4)で290±20μmで、約220μmの不均一が発生
しかつ図中測定点8で370±20μmの凹凸が観察
された。次に厚みが不均一な平板状シリン結晶を
例えば100mm×100mmのサイズに切断し、太陽電池
素子を作成した。ところが素子のハンドリング、
あるいは電極等の印刷工程の印圧で割れ素子作成
の歩留りが約30%〜40%と低かつた。また成長終
了後、ヒータへの通電を中止し温度を低下させる
際にカーボン製るつぼ中又はストリング孔中に残
つたシリコン融液が固体化する際の体積膨脹によ
りカーボン製るつぼが破損し、再使用が困難であ
り太陽電池素子を安価に製造することができなか
つた。 Attempts were made to grow the silicon melt at a pulling rate of 16 mm/min to 18 mm/min with this temperature distribution. Although the growth of a flat silicon crystal with a width of 100 mm continued, non-uniformity in thickness occurred in the width direction. The results of measuring the thickness are shown in Figure 4b. 510±20μm at the thickest part (the part with the lowest temperature, measurement point 10 in the figure),
At the thinnest part (the part with the highest temperature, measurement point 4 in the figure), the thickness was 290±20 μm, and unevenness of about 220 μm was observed, and at measurement point 8 in the figure, unevenness of 370±20 μm was observed. Next, the flat silin crystal with uneven thickness was cut into a size of, for example, 100 mm x 100 mm to create a solar cell element. However, the handling of the element,
Furthermore, the yield of creating cracked elements was low at about 30% to 40% due to the printing pressure in the printing process of electrodes, etc. In addition, when the heater is turned off and the temperature is lowered after growth, the silicon melt remaining in the carbon crucible or in the string hole solidifies and expands in volume, causing damage to the carbon crucible and reuse. However, it has been difficult to manufacture solar cell elements at low cost.
[発明の目的]
本発明の目的は平板状シリコン結晶の厚さを均
一にすることにより太陽電池素子工程での割れを
防止し素子作成歩留りを大幅に向上させると同時
に、るつぼの破損を防止し、再使用を可能にする
平板状シリコン結晶の成長装置を提供するもので
ある。[Objective of the Invention] The object of the present invention is to prevent cracking in the solar cell element process by making the thickness of a flat silicon crystal uniform, thereby significantly improving the element production yield, and at the same time, preventing damage to the crucible. , provides a flat silicon crystal growth device that allows reuse.
[発明の概要]
本発明は、底部に少なくとも2個の小孔のあい
たるつぼの下部より、少なくとも2本の結晶端支
持材を、前記小孔それぞれを通じて前記るつぼの
上方に配置し、また、前記るつぼにシリコン融液
を収容し、前記結晶端支持材同志間の前記シリコ
ン融液と前記結晶端支持材とに種結晶を接触さ
せ、この種結晶を引上げることにより、前記種結
晶端支持材の間に表面張力により張られたシリコ
ン融液を連続的に結晶化させて平板状シリコン結
晶を成長する装置において、上記るつぼ中の内壁
もしくは上記小孔内壁に粉末状の窒化シリコンを
介してカーボンフオイルで覆うものである。[Summary of the Invention] The present invention provides at least two crystal edge supports disposed above the crucible through each of the small holes from the lower part of the crucible having at least two small holes in the bottom, and A silicon melt is stored in a crucible, a seed crystal is brought into contact with the silicon melt between the crystal edge supports and the crystal edge support, and the seed crystal is pulled up. In an apparatus for growing a flat silicon crystal by continuously crystallizing a silicon melt stretched by surface tension between the crucible and the inner wall of the crucible or the small hole, carbon is applied via powdered silicon nitride to the inner wall of the crucible or the inner wall of the small hole. It is covered with foil.
[発明の実施例]
第1図に本発明の一実施例を示す。図中、第3
図と同一部分は同一符号を付してその説明を省略
する。第1図に示す如く、カーボン製るつぼ32
の内壁を粉末状の窒化シリコン12で約0.5mm厚
の層状に覆いその内部に約2mm厚のカーボンフオ
イル11を敷くように構成した。[Embodiment of the Invention] FIG. 1 shows an embodiment of the present invention. In the figure, the third
The same parts as those in the figures are given the same reference numerals and the explanation thereof will be omitted. As shown in FIG. 1, a carbon crucible 32
The inner wall was covered with a layer of about 0.5 mm thick with powdered silicon nitride 12, and carbon foil 11 about 2 mm thick was laid inside the layer.
原料の多結晶シリコンを上記カーボン製るつぼ
32内に収容し、ヒータ34,35に通電し多結
晶シリコンを融解しシリコン融液33を作成し
た。 Polycrystalline silicon as a raw material was placed in the carbon crucible 32, and the heaters 34 and 35 were energized to melt the polycrystalline silicon and create a silicon melt 33.
前記したと同様な方法で温度分布を測定した結
果を第2図aに示す。最も温度が高い部分(測定
点4)で1488±2℃、最も温度が低い部分(測定
点7)で1485±2℃と温度差は3℃と大幅に減少
し、均一性が向上した。次に、種結晶39を16〜
18mm/分で引上げ、平板状シリコン結晶を作成
し、その厚さを測定した。その結果を第2図bに
示す。最も厚い部分で420±20μm、最も薄い部
分で390±20μmと厚さの差は30μmまで減少し、
凹凸程度は小さく厚さの均一性は約3倍以上に向
上した。 The temperature distribution was measured using the same method as described above, and the results are shown in FIG. 2a. The highest temperature part (measurement point 4) was 1488 ± 2°C, and the lowest temperature part (measurement point 7) was 1485 ± 2°C, the temperature difference was significantly reduced to 3°C, and the uniformity was improved. Next, add the seed crystal 39 to 16~
A flat silicon crystal was created by pulling at a rate of 18 mm/min, and its thickness was measured. The results are shown in Figure 2b. The thickest part is 420 ± 20 μm, the thinnest part is 390 ± 20 μm, and the difference in thickness has decreased to 30 μm.
The level of unevenness was small and the thickness uniformity was improved by about three times or more.
上記平板状シリコン結晶を100mm×100mmのサイ
ズに切断し、太陽電池素子を作成した。平板状シ
リコン結晶の厚さの均一性と平坦度の向上によ
り、素子化のハンドリング、あるいは電極等の印
刷工程での印圧による割れは大幅に減少し、素子
作成歩留りは80〜85%に向上した。 The above flat silicon crystal was cut into a size of 100 mm x 100 mm to create a solar cell element. By improving the uniformity and flatness of the flat silicon crystal, cracks due to handling during device fabrication or printing pressure during the printing process of electrodes, etc. are significantly reduced, and the device production yield is improved to 80-85%. did.
さらに引上げ終了後ヒータ34,35の通電を
中止し、シリコン融液33を固体化させた。室温
までカーボン製るつぼ32を冷却後、カーボンフ
オイル11を取り出したところ、るつぼ32中又
はストリング小孔37a,37b中に残つていた
固体シリコンはカーボンフオイル11と伴にるつ
ぼ32より簡単に除去することができた。再使用
した結果何ら問題は無く数回の再使用が可能とな
り、太陽電池素子を安価に作成する目的にも合致
した。 Further, after the pulling was completed, the heaters 34 and 35 were de-energized to solidify the silicon melt 33. After cooling the carbon crucible 32 to room temperature, the carbon foil 11 was taken out, and the solid silicon remaining in the crucible 32 or in the string holes 37a and 37b was easily removed from the crucible 32 along with the carbon foil 11. I was able to remove it. As a result of reuse, it was possible to reuse it several times without any problems, and it also met the purpose of producing solar cell elements at low cost.
上記、実施例で述べた如く、カーボン製るつぼ
の内壁に粉末状の窒化シリコンを介してカーボン
フオイルで覆うことにより、シリコン融液の温度
分布を均一にして、ひいては平板状シリコン結晶
の厚さの均一性、平坦性を向上させ、太陽電池素
子化歩留りを大幅に向上させることが可能となつ
た。さらにカーボン製るつぼの数回の再使用が出
来る様になり太陽電池素子を安価に作成する目的
も達成した。 As described in the example above, by covering the inner wall of the carbon crucible with carbon foil via powdered silicon nitride, the temperature distribution of the silicon melt is made uniform, and the thickness of the flat silicon crystal is thereby made uniform. It has become possible to improve the uniformity and flatness of the solar cell, and to significantly improve the yield of solar cell devices. Furthermore, the carbon crucible can now be reused several times, achieving the goal of producing solar cell elements at low cost.
シリコン融液の温度分布を均一にする手段を
種々検討した結果簡単な方法を見出したもので、
この方法はカーボン製るつぼの内壁をカーボンフ
オイルで覆いかつカーボンフオイルとカーボン製
るつぼ間に粉末の窒化シリコンを介在させること
である。カーボンフオイルは層状構造を成し、面
方向の熱伝導率は約1100℃で36k・cal/m・hr・
℃と高く、均一であり厚さ方向での熱伝導率は約
1100℃で2.99k・cal/m・hr・℃と小さい。また
カーボンフオイルは柔軟性がありシリコンの融点
(1420℃)以上の温度でも耐える。 After studying various ways to make the temperature distribution of silicon melt uniform, we found a simple method.
This method involves covering the inner wall of a carbon crucible with carbon foil and interposing powdered silicon nitride between the carbon foil and the carbon crucible. Carbon foil has a layered structure, and its in-plane thermal conductivity is 36 k・cal/m・hr・at approximately 1100°C.
℃, uniform, and the thermal conductivity in the thickness direction is approximately
It is as small as 2.99k・cal/m・hr・℃ at 1100℃. Carbon foil is also flexible and can withstand temperatures above the melting point of silicone (1420°C).
従つて、カーボン製るつぼの内壁又はストリン
グ孔中にカーボンフオイルを敷くことにより面方
向の高く均一な熱伝導率を使用してるつぼ中のシ
リコン融液の温度を均一にすることが可能であ
る。さらにカーボンフオイルの柔軟性のため体積
膨脹によりカーボン製るつぼに加わる力を緩和さ
せることができ、かつシリコン融液がカーボンフ
オイルに浸透した場合でも、カーボン製るつぼの
内壁とカーボンフオイル間に介在するシリコン融
液に濡れない窒化シリコンのため、シリコン融液
がカーボン製るつぼの内壁に付着することを防止
することができる。従つて、引上げ終了後、カー
ボンフオイルを取り除くことにより、カーボン製
るつぼの再使用が可能である。 Therefore, by placing carbon foil in the inner wall or string hole of a carbon crucible, it is possible to make the temperature of the silicon melt in the crucible uniform by using high and uniform thermal conductivity in the planar direction. . Furthermore, due to the flexibility of carbon foil, the force applied to the carbon crucible due to volume expansion can be alleviated, and even if the silicon melt penetrates into the carbon foil, there is a gap between the inner wall of the carbon crucible and the carbon foil. Since silicon nitride does not wet the intervening silicon melt, it is possible to prevent the silicon melt from adhering to the inner wall of the carbon crucible. Therefore, the carbon crucible can be reused by removing the carbon foil after finishing pulling.
[発明の効果]
以上述べたように本発明によれば、るつぼの内
壁もしくはストリング小孔の中をカーボンフオイ
ルで覆い、かつるつぼ内壁とカーボンフオイル間
に粉末の窒化シリコンを介在させることにより、
平板状シリコン結晶の厚さを均一にして凹凸を減
少させ、太陽電池素子工程での割れを防止し、素
子作成歩留りを向上させることができる。また引
上げ終了後、るつぼの破損を防止し、再使用が可
能となるため、太陽電池素子を安価に作成するこ
とができる。[Effects of the Invention] As described above, according to the present invention, the inner wall of the crucible or the inside of the string small hole is covered with carbon foil, and powdered silicon nitride is interposed between the inner wall of the crucible and the carbon foil. ,
It is possible to make the thickness of the flat silicon crystal uniform, reduce unevenness, prevent cracks in the solar cell element process, and improve element production yield. In addition, after the pulling is completed, the crucible is prevented from being damaged and can be reused, making it possible to produce solar cell elements at low cost.
第1図は本発明の一実施例を示す断面図、第2
図aは本発明に係るシリコン融液の温度分布の一
例を示す特性図、第2図bは本発明に係る平板状
シリコン結晶の厚さの一例を示す特性図、第3図
aは従来の平板状シリコン結晶の成長装置を示す
平面図、第3図bは同じく断面図、第4図aは従
来装置でのシリコン融液の温度分布を示す特性
図、第4図bは従来の平板状シリコン結晶の厚さ
を示す特性図である。
11……カーボンフオイル、12……窒化シリ
コン、31a,31b……カーボンストリング、
32……カーボン製るつぼ、33……シリコン融
液、34,35……ヒータ、36……ホツトチヤ
ンバ、39……種結晶。
FIG. 1 is a cross-sectional view showing one embodiment of the present invention, and FIG.
Figure a is a characteristic diagram showing an example of the temperature distribution of the silicon melt according to the present invention, Figure 2 b is a characteristic diagram showing an example of the thickness of the flat silicon crystal according to the present invention, and Figure 3 a is a characteristic diagram showing an example of the temperature distribution of the silicon melt according to the present invention. FIG. 3b is a sectional view of the flat silicon crystal growth apparatus, FIG. 4a is a characteristic diagram showing the temperature distribution of silicon melt in the conventional apparatus, and FIG. 4b is the conventional flat silicon crystal growth apparatus. FIG. 3 is a characteristic diagram showing the thickness of silicon crystal. 11...Carbon foil, 12...Silicon nitride, 31a, 31b...Carbon string,
32... Carbon crucible, 33... Silicon melt, 34, 35... Heater, 36... Hot chamber, 39... Seed crystal.
Claims (1)
の下部より、少なくとも2本の結晶端支持材を、
前記小孔それぞれを通じて前記るつぼの上方に配
置し、また、前記るつぼにシリコン融液を収容
し、前記結晶端支持材同志間の前記シリコン融液
と前記結晶端支持材とに種結晶を接触させ、この
種結晶を引上げることにより、前記結晶端支持材
の間に表面張力により張られたシリコン融液を連
続的に結晶化させて平板状シリコン結晶を成長す
る装置において、前記るつぼ中の内壁もしくは前
記小孔内壁に粉末状の窒化シリコンを介してカー
ボンフオイルで覆うことを特徴とする平板状シリ
コン結晶の成長装置。1 At least two crystal edge supports are placed from the bottom of a crucible with at least two small holes in the bottom.
A silicon melt is placed in the crucible through each of the small holes, and a seed crystal is brought into contact with the silicon melt between the crystal edge supports and the crystal edge supports. , in an apparatus for growing a flat silicon crystal by continuously crystallizing a silicon melt stretched between the crystal end supports by surface tension by pulling up the seed crystal, the inner wall in the crucible Alternatively, an apparatus for growing a flat silicon crystal, characterized in that the inner wall of the small hole is covered with carbon foil via powdered silicon nitride.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26185485A JPS62123092A (en) | 1985-11-21 | 1985-11-21 | Growth apparatus for plate silicon crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26185485A JPS62123092A (en) | 1985-11-21 | 1985-11-21 | Growth apparatus for plate silicon crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62123092A JPS62123092A (en) | 1987-06-04 |
| JPH0353274B2 true JPH0353274B2 (en) | 1991-08-14 |
Family
ID=17367671
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26185485A Granted JPS62123092A (en) | 1985-11-21 | 1985-11-21 | Growth apparatus for plate silicon crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62123092A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101688322B (en) * | 2007-07-27 | 2013-03-27 | 长青太阳能股份有限公司 | Wafer/ribbon crystal method and apparatus |
-
1985
- 1985-11-21 JP JP26185485A patent/JPS62123092A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62123092A (en) | 1987-06-04 |
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