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JPH035549B2 - - Google Patents
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JPH035549B2 - - Google Patents

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Publication number
JPH035549B2
JPH035549B2 JP58032246A JP3224683A JPH035549B2 JP H035549 B2 JPH035549 B2 JP H035549B2 JP 58032246 A JP58032246 A JP 58032246A JP 3224683 A JP3224683 A JP 3224683A JP H035549 B2 JPH035549 B2 JP H035549B2
Authority
JP
Japan
Prior art keywords
sample
section
high vacuum
electron beam
nitrogen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58032246A
Other languages
Japanese (ja)
Other versions
JPS59157566A (en
Inventor
Takashi Ootsubo
Shunsuke Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP58032246A priority Critical patent/JPS59157566A/en
Publication of JPS59157566A publication Critical patent/JPS59157566A/en
Publication of JPH035549B2 publication Critical patent/JPH035549B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/202Constituents thereof
    • G01N33/2022Non-metallic constituents
    • G01N33/2025Gaseous constituents

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

本発明は金属中の窒素分析方法および装置に関
する。 金属中の窒素をはじめとするガス成分は金属材
料の性質にさまざまな影響を及ぼすことはよく知
られており、その存在量を知ることの重要性は言
うまでもない。近年、真空脱ガス法などの精錬技
術が進歩し金属中のガス成分量を積極的に制御す
ることが行なわれており、たとえば、ガス成分量
を真空脱ガス法により目標以下に低減させる技術
や、逆に窒素を添加して強度や耐食性を得る技術
が開発されている。このような金属の製造におい
てガス成分量を目的とする値に精度よく制御する
ためには、精錬中の溶融金属のガス成分量を迅速
(3分以内)に知ることがきわめて重要である。 従来金属中のガス分析方法としては、加熱源に
インパルス炉や高周波炉を用いた不活性ガス中融
解−ガスクロマトグラフ分離−熱伝導度法が広く
用いられているが、この方法は定量自体に3〜4
分を要する上、定量のための試料の前処理に長時
間を要する。すなわち、溶融金属から採取した試
料などでは表面に酸化物皮膜が存在して定量誤差
を生ずるので研摩するかあるいは酸化物部分を切
断するなどしてこれを除去する作業、塊状試料は
そのままでは分析できないため切削あるいは細断
して0.3〜1g程度の少量の試料として採取する
作業、さらに採取した試料を正確に秤量する作業
など複雑な前処理が必要であり、迅速分析には不
充分である。 他の従来法である窒素の化学分析法でも不活性
ガス中融解−ガスクロマトグラフ分離−熱伝導度
法と同様の試料の前処が必要であるのに加えて、
試料の溶解や分析操作に長時間を要するために、
不活性ガス中融解.ガスクロマトグラフ分離−熱
伝導度法よりもさらに定量所要時間が長く工程管
理に用いることはできない。 また本発明者らはさきに、高真空中において細
く絞つた電子ビームを金属に照射して該照射部の
みを溶融沸謄撹拌せしめて該溶融部に含まれるガ
スを中性原子および分子として抽出し、ガス分析
計により分析する金属中の局所ガス分析方法を報
告した(特開昭54−124795号)。而してこの方法
は試料の細断や秤量を必要としない有用な方法で
あるが、真空排気にやや時間がかかり工程管理の
ための迅速分析にはあまり適当でない。 本発明者らは、このような現状に鑑み、種々の
検討を行なつた結果、高真空中において金属試料
の一部を電子ビームによつて溶融し該溶融部より
抽出される窒素ガスを定量し金属試料中の窒素含
有率を分析するにあたり、試料を一たん少容量
(高真空部と容積比1/30以下)の試料導入部に入
れたのち、高真空部と独立した排気ポンプ(排気
能力200/min以上)により該導入部中の大気
を真空排気したのち、試料を高真空部に導くとと
もに試料導入部と高真空部とを導通させたままそ
れぞれの真空ポンプによつて排気することによつ
て、試料装入から高真空下での電子ビーム照射に
至るまでの真空排気時間を従来の数時間ないし数
十分のオーダーから数十秒のオーダーまで短縮で
きることと、溶融部の体積が電子ビームの電流と
電圧と照射時間によつて再現性よく決定されるこ
とから一定形状の試料を用い、あらかじめ均質で
窒素量既知の試料を用いて作成した検量線を求め
ておくことによつて窒素定量値を窒素含有率に換
算できるので、試料の切断、研磨、秤量等の操作
が不要となることとあいまつて、高速ガス分析計
をこれに組合せることによつて3分以内で窒素量
を定量できることを見出した。さらに、試料導入
部と高真空部とを隔離する弁を試料移動機構と一
体に形成させることによつて、弁の開閉操作の待
ち時間を省き、分析時間を一層短縮することがで
きる。 本発明は、これらの知見に基づいてなされたも
のであり、その要旨とするところは、1.高真空中
において金属試料の一部を電子ビームによつて溶
融し該溶融部より抽出される窒素ガスを定量し金
属試料中の窒素含有率を分析するにあたり、試料
を高真空部と隔離された試料導入部に入れたの
ち、高真空部排気ポンプと独立した真空ポンプに
より1Torr以下に真空排気したのち高真空部に試
料を導入すると共に試料導入部を高真空部と導通
せしめた状態で、さらに真空排気をおこない、真
空度が5×10-6Torr以下になつた時点で試料に
電子ビーム照射をおこなうことを特徴とする金属
中の窒素分析方法。2.金属試料の一部に電子ビー
ム照射するための高真空部と、該高真空部を真空
排気するための真空ポンプと、高真空部の内容積
との比が1/30以下でかつ1以下の内容積をもち
高真空部ならびに大気と断続自在につくられた試
料導入部と、該導入部を排気するための真空ポン
プと、高真空中で試料を試料導入部から高真空部
へ移動する機構と、電子ビーム照射部と、高速ガ
ス分析計とからなることを特徴とする金属中の窒
素分析装置である。 以下本発明を実施例に示す図面にもとづき詳細
に説明する。第1図および第2図は金属中の窒素
のガス成分のための本発明の装置の一例であつ
て、前者は試料挿入時、後者は分析時の状態を示
したものである。 金属試料1を試料出し入れ口2を経て試料導入
部3内の装着部4に装着した後、試料出し入れ口
2を閉じ弁5を開いて試料導入部3の内部のガス
を真空排気ポンプ(排気能力200/min以上)
6で排気する。導入部3の真空計7のよみが
1Torr以下になつたことを確認したのち、シヤフ
ト駆動部8によりシヤフト9を駆動して該シヤフ
トに固定されたフランジ10を移動させて試料導
入部3を高真空部11と連結すると共に試料1を
あらかじめ決定した電子ビーム照射位置に設置す
る。高真空部11はあらかじめ弁12を介し高真
空排気用ポンプ13により1×10-6Torr以下の
高真空に排気されているが、低真空の導入部3と
連結されることによつて一時的に真空度が悪くな
るので高真空部真空計14が再び5×10-6Torr
以下を示すまで排気をしつつ待機する。所要圧力
以下になつたことを確認し、電子ビーム源15か
ら一定の電圧、ビーム電流、照射時間で試料1に
電子ビームを照射し、試料を局部的に溶融し溶融
部から高真空中に抽出される窒素ガスを高速ガス
分析計16で定量する。溶融部の体積は前記各条
件をそれぞれ±1%以内で一定にすれば、±1%
の精度で一定となる。したがつて秤量をおこなう
ことなく、あらかじめ均質で窒素量既知の試料を
用いて作成した検量線を用いて、窒素定量値を窒
素含有率に換算することができる。また、特に気
孔等を含むことのない均質な試料では3mm以上離
れた位置で2ないし3点照射して窒素量を求めた
結果は相対誤差±5%以内に収まり、それらの平
均を用いると信頼性の高い分析値が得られる。分
析完了後、再びシヤフト駆動部8によりシヤフト
9を駆動して試料を試料導入部3に戻すと共に試
料導入部3と高真空部11とを隔離し、弁5を閉
じたのちリーク弁17を開き試料導入部3へガス
源18中のArガスを導き大気圧とし出し入れ口
2を開き試料を取り出し、必要に応じて新たに別
の試料を装着する。 試料出し入れ口の大きさは挿入すべき試料の径
(10〜40mmφ)と導入部3の容積を勘案すると50
〜100mmφとするのが適当である。試料導入部3
の容積を1以下でかつ高真空部11の容積の1/
30以下と規定したが、本来真空に到達するに要す
る時間だけを考えると導入部3の容積はできるだ
け小さくすることが望ましいが、挿入すべき試料
の形状を考慮すると一定の容積が必要であるこ
と、および試料導入部3と高真空部11とを連結
することによつて試料導入部3の残留ガス圧を低
減させる効果によつて電子ビーム照射可能な真空
度(5×10-6Torr)に到達する時間が充分に短
くできる必要条件として設定した。シヤフト9を
駆動する時間は導入部3の真空度が1Torrを下廻
つたときが望ましく、前記の容積比条件を満足す
る場合には、試料導入部3とあらかじめめ排気さ
れた高真空部11との連結によつて導入部の真空
度よりもよくなることと、連結と同時に弁5を閉
じることにより低真空大容積のポンプ部6を隔絶
すること、シヤフト駆動時間中の排気ポンプ13
によつて排気する効果により、試料が照射位置に
設定されるとほぼ同時に電子ビーム照射をおこな
うことにより分析時間の短縮を図るためにおこな
つたものである。1Torrより低真空時に連結する
と大容積の高真空部11が低真空となるため、こ
れを再び5×10-6Torr以下の電子ビーム照射可
能な高真空に排気するための時間はかえつて延長
される。5×10-6Torr以下にするのは電子ビー
ム照射時の異常放電を防止し分析時のノイズを低
減させるためである。シヤフト駆動部8は、高真
空部11内で直線運動をするシヤフト9を、ベロ
ーズを介して外部より電動モーターとラツクアン
ドピニオン機構で駆動する方式とした。フランジ
10にはOリングを設置した試料導入部3の一部
に、これを受ける面を設けて試料が導入部3に位
置する場合には高真空部11と導入部3とが真空
的に隔離される構造とした。電子ビーム源15と
しては、加速電圧10〜100kV、ビーム電流5〜
50mA、の範囲内で照射時間を含めそれぞれを精
度±1%以内で設定できるものを用いるとよい。
高速ガス分析計16としては、四重極質量分析計
のように、溶融部から高真空中に抽出され再び真
空ポンプで排気される短時間(約1sec)の分圧推
移を追跡できるものを用いるとよい。分析終了
後、試料を試料導入部3に戻しその内部にアルゴ
ンガスを導いて大気圧としたが、大気中の水蒸気
等が内壁に吸着されて真空排気速度を低下させる
ことを防止するためにおこなつたもので、Arガ
スの代りにHe、等その他の不活性なガスを用い
てもよい。 以下本発明の効果を実施例によりさらに具体的
に説明する。 実施例 低炭素鋼を転炉で溶製後、RH脱ガス装置を用
いて脱ガスをおこない脱ガス開始後5分毎に25mm
φ×(70±3)mmの円柱状試料をくみとり、水冷
後第1図の装置を用い前記の実施要領により窒素
量を分析した。 用いた装置では、導入部容積が約0.6、高真
空部容積が約24で、導入部の真空排気ポンプと
して250/minの油回転ポンプ、高真空部の真
空ポンプとして、330/secのターボ分子ポンプ
と250/minの油回転ポンプを用いた。電子ビ
ーム照射条件は、加速電圧30kV、ビーム電流
20mA、照射時間1secとし、同一試料につき、そ
の円柱側面上で3mm間隔で3点照射をおこない、
その平均をもつて窒素定量値とした。同一形状の
窒素量既知の鋼を用いてあらかじめ作成した検量
線によつて窒素定量値を窒素含有率によみかえ
た。 定量した結果を第1表に示す。
The present invention relates to a method and apparatus for analyzing nitrogen in metals. It is well known that gas components such as nitrogen in metals have various effects on the properties of metal materials, and it goes without saying that it is important to know their abundance. In recent years, advances in refining technology such as vacuum degassing have made it possible to actively control the amount of gas components in metals. Conversely, techniques have been developed to add nitrogen to improve strength and corrosion resistance. In order to accurately control the amount of gas components to a desired value in the production of such metals, it is extremely important to quickly (within 3 minutes) know the amount of gas components in the molten metal being refined. Conventional methods for gas analysis in metals include melting in an inert gas using an impulse furnace or high-frequency furnace as a heating source - gas chromatography separation - thermal conductivity method, but this method requires three steps in the determination itself. ~4
In addition, it takes a long time to pre-process the sample for quantification. In other words, in samples collected from molten metal, there is an oxide film on the surface that causes quantitative errors, so this must be removed by polishing or cutting the oxide part, and bulk samples cannot be analyzed as they are. Therefore, complicated pretreatment is required, such as cutting or shredding to collect a small sample of about 0.3 to 1 g, and then accurately weighing the collected sample, which is insufficient for rapid analysis. In addition to the other conventional nitrogen chemical analysis method, which requires the same sample preparation as the inert gas melting-gas chromatographic separation-thermal conductivity method,
Because sample dissolution and analysis operations require a long time,
Melting in inert gas. It takes much longer to quantify than the gas chromatographic separation-thermal conductivity method, so it cannot be used for process control. In addition, the present inventors previously irradiated metal with a narrowly focused electron beam in a high vacuum, melted only the irradiated part, stirred it to boiling, and extracted the gas contained in the molten part as neutral atoms and molecules. He also reported a method for local gas analysis in metals using a gas analyzer (Japanese Patent Application Laid-open No. 124795/1983). Although this method is a useful method that does not require cutting or weighing the sample, it takes some time to vacuum and is not suitable for rapid analysis for process control. In view of the current situation, the inventors of the present invention have conducted various studies, and as a result, have melted a part of a metal sample with an electron beam in a high vacuum and quantitatively determined the amount of nitrogen gas extracted from the melted part. When analyzing the nitrogen content in a metal sample, the sample is first introduced into a sample introduction section with a small volume (volume ratio of 1/30 or less compared to the high vacuum section), and then an exhaust pump (exhaust pump) independent of the high vacuum section After evacuating the atmosphere in the introduction section (with a capacity of 200/min or more), introduce the sample into the high vacuum section and evacuate the sample using the respective vacuum pumps while maintaining continuity between the sample introduction section and the high vacuum section. This allows the vacuum evacuation time from sample loading to electron beam irradiation under high vacuum to be shortened from the conventional several hours or tens of minutes to the order of tens of seconds, and the volume of the molten part can be reduced. Since it is determined with good reproducibility by the electron beam current, voltage, and irradiation time, it is possible to use a sample of a certain shape and obtain a calibration curve prepared in advance using a homogeneous sample with a known nitrogen content. Since the nitrogen quantitative value can be converted into nitrogen content, there is no need to perform operations such as cutting, polishing, and weighing the sample, and by combining this with a high-speed gas analyzer, the amount of nitrogen can be determined within 3 minutes. We found that it is possible to quantify Furthermore, by forming the valve that isolates the sample introduction part and the high vacuum part integrally with the sample moving mechanism, it is possible to eliminate the waiting time for opening and closing the valve and further shorten the analysis time. The present invention was made based on these findings, and its gist is as follows: 1. A part of a metal sample is melted by an electron beam in a high vacuum, and nitrogen extracted from the melted part is To quantify gas and analyze the nitrogen content in metal samples, the sample was placed in a sample introduction section isolated from the high vacuum section, and then evacuated to below 1 Torr using a vacuum pump independent of the high vacuum section exhaust pump. Afterwards, the sample is introduced into the high vacuum section, and with the sample introduction section connected to the high vacuum section, vacuum evacuation is further performed, and when the degree of vacuum becomes 5 × 10 -6 Torr or less, the sample is irradiated with an electron beam. A method for analyzing nitrogen in metals. 2. The ratio of the high vacuum section for irradiating a part of the metal sample with an electron beam, the vacuum pump for evacuating the high vacuum section, and the internal volume of the high vacuum section is 1/30 or less and 1 A sample introduction section with the following internal volume that can be freely connected to the high vacuum section and the atmosphere, a vacuum pump to evacuate the introduction section, and a sample transferred from the sample introduction section to the high vacuum section in high vacuum. This is an apparatus for analyzing nitrogen in metals, which is characterized by consisting of a mechanism for irradiation, an electron beam irradiation section, and a high-speed gas analyzer. Hereinafter, the present invention will be explained in detail based on drawings showing examples. FIGS. 1 and 2 are examples of the apparatus of the present invention for measuring nitrogen gas components in metals, with the former showing the state during sample insertion and the latter showing the state during analysis. After the metal sample 1 is attached to the mounting part 4 in the sample introduction part 3 through the sample inlet/outlet 2, the sample inlet/outlet 2 is closed, the valve 5 is opened, and the gas inside the sample introduction part 3 is removed using a vacuum pump (exhaust capacity). 200/min or more)
Exhaust at 6. The reading of the vacuum gauge 7 in the introduction section 3 is
After confirming that the temperature is 1 Torr or less, the shaft drive unit 8 drives the shaft 9 to move the flange 10 fixed to the shaft to connect the sample introduction unit 3 with the high vacuum unit 11 and to transfer the sample 1. Install it at a predetermined electron beam irradiation position. The high vacuum section 11 is previously evacuated to a high vacuum of 1×10 -6 Torr or less by the high vacuum evacuation pump 13 via the valve 12. Since the degree of vacuum deteriorates, the high vacuum section vacuum gauge 14 returns to 5×10 -6 Torr.
Wait while exhausting the air until the following is shown. After confirming that the pressure is below the required level, the sample 1 is irradiated with an electron beam from the electron beam source 15 at a constant voltage, beam current, and irradiation time to locally melt the sample and extract it from the melted part into a high vacuum. The amount of nitrogen gas is quantified using a high-speed gas analyzer 16. The volume of the melted part is ±1% if each of the above conditions is kept constant within ±1%.
The accuracy is constant. Therefore, without weighing, the nitrogen quantitative value can be converted into nitrogen content using a calibration curve prepared in advance using a homogeneous sample with a known nitrogen content. In addition, especially for homogeneous samples that do not contain pores, the results obtained by irradiating two or three points at positions 3 mm or more apart are within a relative error of ±5%, and using the average of these results is reliable. Highly accurate analytical values can be obtained. After the analysis is completed, the shaft drive section 8 drives the shaft 9 again to return the sample to the sample introduction section 3, isolate the sample introduction section 3 and the high vacuum section 11, close the valve 5, and then open the leak valve 17. The Ar gas in the gas source 18 is introduced into the sample introduction section 3 to bring it to atmospheric pressure, and the inlet/outlet port 2 is opened to take out the sample, and if necessary, another sample is attached. The size of the sample inlet/outlet is 50 mm, taking into account the diameter of the sample to be inserted (10 to 40 mmφ) and the volume of the introduction section 3.
It is appropriate to set the diameter to 100 mmφ. Sample introduction part 3
1 or less and 1/ of the volume of the high vacuum section 11
30 or less, but considering only the time required to reach vacuum, it is desirable to make the volume of the introduction section 3 as small as possible, but considering the shape of the sample to be inserted, a certain volume is required. By connecting the sample introduction section 3 and the high vacuum section 11, the residual gas pressure in the sample introduction section 3 can be reduced to a degree of vacuum (5×10 -6 Torr) that allows electron beam irradiation. This was set as a necessary condition that the time required to reach this point could be sufficiently short. It is desirable to drive the shaft 9 when the degree of vacuum in the introduction section 3 is less than 1 Torr, and if the above-mentioned volume ratio condition is satisfied, the sample introduction section 3 and the pre-evacuated high vacuum section 11 are The degree of vacuum is better than that of the introduction part by the connection, and the low vacuum and large volume pump part 6 is isolated by closing the valve 5 at the same time as the connection.
This was done in order to shorten the analysis time by irradiating the sample with the electron beam almost at the same time as the sample is set at the irradiation position. When connected when the vacuum is lower than 1 Torr, the large volume high vacuum section 11 becomes a low vacuum, so the time to evacuate it again to a high vacuum capable of electron beam irradiation of 5×10 -6 Torr or less is extended. Ru. The reason for setting it below 5×10 -6 Torr is to prevent abnormal discharge during electron beam irradiation and reduce noise during analysis. The shaft drive section 8 has a system in which a shaft 9 that moves linearly within the high vacuum section 11 is driven from the outside via a bellows using an electric motor and a rack-and-pinion mechanism. The flange 10 is provided with a surface that receives the O-ring in a part of the sample introduction section 3, so that when the sample is located in the introduction section 3, the high vacuum section 11 and the introduction section 3 are vacuum-isolated. The structure was designed to be The electron beam source 15 has an accelerating voltage of 10 to 100 kV and a beam current of 5 to 100 kV.
It is best to use one that can be set within a range of 50 mA, including the irradiation time, with an accuracy of ±1%.
As the high-speed gas analyzer 16, a device such as a quadrupole mass spectrometer that can track partial pressure changes over a short period of time (approximately 1 sec) when the melt is extracted into a high vacuum and evacuated by a vacuum pump is used. Good. After the analysis, the sample was returned to the sample introduction section 3 and argon gas was introduced into it to bring it to atmospheric pressure. Other inert gases such as He may be used instead of Ar gas. Hereinafter, the effects of the present invention will be explained in more detail with reference to Examples. Example: After melting low carbon steel in a converter, degassing is performed using an RH degassing device, and 25 mm is removed every 5 minutes after the start of degassing.
A cylindrical sample of φ×(70±3) mm was taken, and after cooling with water, the amount of nitrogen was analyzed using the apparatus shown in FIG. 1 according to the procedure described above. The equipment used has an inlet volume of approximately 0.6, a high vacuum part volume of approximately 24, a 250/min oil rotary pump as the inlet vacuum evacuation pump, and a 330/sec turbo molecular pump as the high vacuum pump. A pump and a 250/min oil rotary pump were used. Electron beam irradiation conditions are acceleration voltage 30kV, beam current
At 20 mA and irradiation time of 1 sec, irradiation was performed at 3 points on the side of the cylinder at 3 mm intervals on the same sample.
The average was taken as the nitrogen quantitative value. The quantitative nitrogen value was converted into the nitrogen content using a calibration curve prepared in advance using steel of the same shape and known nitrogen content. The quantitative results are shown in Table 1.

【表】 本発明方法で分析したのち、試料の非溶融部の
一部を切断、研摩、秤量し従来の不活性ガス溶融
−ガスクロマトグラフ分離−熱伝導度検出法で窒
素を定量した結果をあわせて示す。従来法とよく
一致した結果が得られていることが明らかであ
る。なお、本発明方法で上記分析値を得るに要し
た時間はいづれも約120秒であつた。したがつて、
本発明方法によつてRH脱ガスの効果を迅速に把
握することができ、RH脱ガス操業を必要にして
十分な時間に制御することができ、材料の特性向
上は勿論、省エネルギーに寄与するところ大であ
る。
[Table] After analysis using the method of the present invention, a part of the unmelted part of the sample was cut, polished, and weighed, and the results of nitrogen quantitative determination using the conventional inert gas melting-gas chromatography separation-thermal conductivity detection method are also included. Shown. It is clear that the results are in good agreement with the conventional method. The time required to obtain the above analytical values using the method of the present invention was approximately 120 seconds in each case. Therefore,
By the method of the present invention, the effect of RH degassing can be quickly grasped, and the RH degassing operation can be controlled for a sufficient time, which not only improves the properties of the material but also contributes to energy saving. It's large.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図は金属中の窒素を分析する
ための本発明装置の一例で、前者は試料挿入時、
後者は分析時の状態を示したものである。 1……金属試料、2……試料出し入れ口、3…
…試料導入部、4……試料装着部、5……弁、6
……真空排気ポンプ、7……真空計、8……シヤ
フト駆動部、9……シヤフト、10……フラン
ジ、11……高真空部、12……弁、13……排
気用ポンプ、14……真空計、15……電子ビー
ム源、16……高速ガス分析計、17……リーク
弁、18……ガス源。
Figures 1 and 2 show an example of the device of the present invention for analyzing nitrogen in metals;
The latter shows the state at the time of analysis. 1...metal sample, 2...sample inlet/outlet, 3...
...Sample introduction part, 4...Sample mounting part, 5...Valve, 6
... Vacuum exhaust pump, 7 ... Vacuum gauge, 8 ... Shaft drive section, 9 ... Shaft, 10 ... Flange, 11 ... High vacuum section, 12 ... Valve, 13 ... Exhaust pump, 14 ... ...Vacuum gauge, 15...Electron beam source, 16...High speed gas analyzer, 17...Leak valve, 18...Gas source.

Claims (1)

【特許請求の範囲】 1 高真空中において金属試料の一部を電子ビー
ムによつて溶融し該溶融部より抽出される窒素ガ
スを定量し金属試料中の窒素含有料を分析するに
あたり、試料を高真空部と隔離された試料導入部
に入れたのち、高真空部排気ポンプと独立した真
空ポンプにより1Torr以下に真空排気したのち高
真空部に試料を導入すると共に試料導入部を高真
空部と導通せしめた状態で、さらに真空排気をお
こない、真空度が5×10-6Torr以下になつた時
点で試料に電子ビーム照射をおこなうことを特徴
とする金属中の窒素分析方法。 2 金属試料の一部に電子ビーム照射するための
高真空部と、該高真空部を真空排気するための真
空ポンプと、高真空部の内容積との比が1/30以下
でかつ1以下の内容積をもち高真空部ならびに
大気と断続自在につくられた試料導入部と、該導
入部を排気するための真空ポンプと、高真空中で
試料を試料導入部から高真空部へ移動する機構
と、電子ビーム照射部と、高速ガス分析計とから
なることを特徴とする金属中の窒素分析装置。 3 試料導入部と高真空部とをを隔離する弁が試
料移動機構と一体に形成されていることを特徴と
する特許請求の範囲第2項記載の金属中の窒素分
析装置。
[Claims] 1. When a part of a metal sample is melted by an electron beam in a high vacuum and the nitrogen gas extracted from the melted part is quantified and the nitrogen content in the metal sample is analyzed, the sample is After placing the sample in the sample introduction section that is isolated from the high vacuum section, the sample is evacuated to 1 Torr or less using a vacuum pump independent of the high vacuum section exhaust pump, and then the sample is introduced into the high vacuum section and the sample introduction section is separated from the high vacuum section. A method for analyzing nitrogen in metals, which is characterized by further evacuation in a conductive state, and irradiating the sample with an electron beam when the degree of vacuum reaches 5 x 10 -6 Torr or less. 2 The ratio of the high vacuum section for irradiating a part of the metal sample with an electron beam, the vacuum pump for evacuating the high vacuum section, and the internal volume of the high vacuum section is 1/30 or less and 1 or less A sample introduction section with an inner volume of An apparatus for analyzing nitrogen in metals, comprising a mechanism, an electron beam irradiation section, and a high-speed gas analyzer. 3. An apparatus for analyzing nitrogen in metals according to claim 2, characterized in that a valve for isolating the sample introduction section and the high vacuum section is formed integrally with the sample moving mechanism.
JP58032246A 1983-02-28 1983-02-28 Method and device for analyzing nitrogen in metal Granted JPS59157566A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58032246A JPS59157566A (en) 1983-02-28 1983-02-28 Method and device for analyzing nitrogen in metal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58032246A JPS59157566A (en) 1983-02-28 1983-02-28 Method and device for analyzing nitrogen in metal

Publications (2)

Publication Number Publication Date
JPS59157566A JPS59157566A (en) 1984-09-06
JPH035549B2 true JPH035549B2 (en) 1991-01-25

Family

ID=12353641

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58032246A Granted JPS59157566A (en) 1983-02-28 1983-02-28 Method and device for analyzing nitrogen in metal

Country Status (1)

Country Link
JP (1) JPS59157566A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH065627Y2 (en) * 1985-11-12 1994-02-09 昭和アルミニウム株式会社 Gas analyzer for aluminum material
JPS6437663U (en) * 1987-08-29 1989-03-07
JPH02254335A (en) * 1989-03-28 1990-10-15 Showa Alum Corp Analyzer for gas in metallic material

Also Published As

Publication number Publication date
JPS59157566A (en) 1984-09-06

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