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JPH0361637B2 - - Google Patents
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JPH0361637B2 - - Google Patents

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Publication number
JPH0361637B2
JPH0361637B2 JP7656384A JP7656384A JPH0361637B2 JP H0361637 B2 JPH0361637 B2 JP H0361637B2 JP 7656384 A JP7656384 A JP 7656384A JP 7656384 A JP7656384 A JP 7656384A JP H0361637 B2 JPH0361637 B2 JP H0361637B2
Authority
JP
Japan
Prior art keywords
ascl
light
source
gaas
reaction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7656384A
Other languages
Japanese (ja)
Other versions
JPS60221393A (en
Inventor
Junichi Nishizawa
Yoshihiro Kokubu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP7656384A priority Critical patent/JPS60221393A/en
Publication of JPS60221393A publication Critical patent/JPS60221393A/en
Publication of JPH0361637B2 publication Critical patent/JPH0361637B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 発明の属する技術分野 本発明はGaAs単結晶を気相エピタキシヤル法
により低温で成長させる方法に関する。
DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a method for growing GaAs single crystals at low temperatures by vapor phase epitaxial method.

従来技術およびその問題点 GaAsの気相エピタキシヤル成長法として、ハ
ロゲン輸送法が知られている。この方法ではあら
かじめAsで飽和したGaソースを800〜900℃に加
熱し、このソース上にAsCl3とH2を導入する。そ
して、この導入されたAsCl3は、一般に AsCl3+3/2H2→1/4As4+3HCl にしたがつてAs4とHClに分解し、この分解生成
物とGaソース表面に形成されているGaAs被膜と
が、 GaCl+1/4As4+1/2H2←→GaAs+HCl の反応を通して平衡すると言われている。この状
態のガスを下流に導いて温度の低い基板表面に供
給すると、前記の平衡反応式が右向きに進行し、
GaAs結晶が気相から析出し、エピタキシヤル成
長が起る。この方法では、前記のようにAsCl3
水素還元が必要であり、そのためには本発明者等
による測定結果の第2図に基づくと、少なくとも
約700℃以上の高温に加熱しなければならない。
しかし、高温にするにつれて石英反応管等から生
じるSiなどによる汚染が増大するため、高純度結
晶を得るうえで一つの障害になる。そのため、で
きるだけ反応管等全体の温度を低温化できる成長
方法が要求される。
Prior Art and its Problems A halogen transport method is known as a vapor phase epitaxial growth method for GaAs. In this method, a Ga source previously saturated with As is heated to 800-900°C, and AsCl 3 and H 2 are introduced onto this source. The introduced AsCl 3 generally decomposes into As 4 and HCl as follows: AsCl 3 +3/2H 2 →1/4As 4 +3HCl, and this decomposition product and the GaAs coating formed on the Ga source surface It is said that these are brought into equilibrium through the reaction GaCl+1/4As 4 +1/2H 2 ←→GaAs+HCl. When the gas in this state is guided downstream and supplied to the low temperature substrate surface, the equilibrium reaction equation described above proceeds to the right.
GaAs crystals are precipitated from the gas phase and epitaxial growth occurs. This method requires hydrogen reduction of AsCl 3 as described above, and for this purpose, it must be heated to a high temperature of at least about 700° C. or higher, based on the measurement results in FIG. 2 by the present inventors.
However, as the temperature increases, contamination from Si and other substances generated from quartz reaction tubes increases, which becomes an obstacle to obtaining high-purity crystals. Therefore, a growth method that can lower the temperature of the entire reaction tube and the like as much as possible is required.

発明の目的 本発明は、高純度のGaAs単結晶を低温で気相
エピタキシヤル成長させる方法を提供するもので
ある。
OBJECTS OF THE INVENTION The present invention provides a method for vapor phase epitaxial growth of high purity GaAs single crystals at low temperatures.

発明の構成 本発明は、前記特許請求の範囲に記載されたこ
とを要旨とするもので、Ga/AsCl3/H2系のハ
ロゲン輸送法によりGaAs単結晶をエピタキシヤ
ル成長させるに際し、AsCl3の水素還元反応を光
を照射することにより促進することを特徴として
いる。
Structure of the Invention The present invention has the gist set forth in the claims, and is directed to the epitaxial growth of GaAs single crystals using the Ga/AsCl 3 /H 2 system halogen transport method . It is characterized by promoting the hydrogen reduction reaction by irradiating it with light.

以下本発明を具体的に説明する。まず、AsCl3
の水素還元反応に及ぼす光照射の効果について赤
外吸収法で調べてみた。
The present invention will be specifically explained below. First, AsCl3
The effect of light irradiation on the hydrogen reduction reaction of was investigated using infrared absorption method.

AsCl3をH2をキヤリアガスとして導入、それに
光を照射しながら赤外吸収スペクトルを測定し
た。第1図は温度を約500℃に保つてエキシマレ
ーザーからの249nmの光を照射したときの赤外吸
収スペクトルの変化を示したものである。光照射
によりAsCl3の濃度が減少し、新たにHClが生じ
ている。すなわち、光照射によつてAsCl3の水素
還元反応が促進される。第2図はAsCl3の水素還
元の温度依存性について249nmの光を照射した場
合と照射しない場合の比較を示したものである。
縦軸はAsCl3の吸光度を示しており、ほぼ濃度に
対応している。高温側ではAsCl3がH2と熱的に反
応してHClを生じるため減少し、700℃以上の高
温では完全に熱的に水素還元されてしまう。しか
し、光照射をした場合には325℃という低温でも
導入したAsCl3の約30%が還元されてHClを生じ
ており、この値は光照射しない場合の615℃に相
当するもので、温度にして290℃相当の効果を及
ぼしていることになる。第3図はレーザー光のパ
ワーを0.35Wおよび2Wと一定にして照射光の波
長を変化させたときのAsCl3の水素還元の様子を
示したものである。300nmより短波長側の光が水
素還元に有効である。
AsCl 3 was introduced with H 2 as a carrier gas, and the infrared absorption spectrum was measured while irradiating it with light. Figure 1 shows the change in the infrared absorption spectrum when the temperature was maintained at approximately 500°C and 249 nm light from an excimer laser was irradiated. The concentration of AsCl 3 decreases due to light irradiation, and HCl is newly generated. That is, the hydrogen reduction reaction of AsCl 3 is promoted by light irradiation. Figure 2 shows a comparison of the temperature dependence of hydrogen reduction of AsCl 3 with and without irradiation with 249 nm light.
The vertical axis indicates the absorbance of AsCl 3 , which approximately corresponds to the concentration. At high temperatures, AsCl 3 thermally reacts with H 2 to generate HCl, which decreases, and at high temperatures of 700°C or higher, it is completely thermally reduced by hydrogen. However, in the case of light irradiation, approximately 30% of the introduced AsCl 3 is reduced to HCl even at a low temperature of 325°C, and this value is equivalent to 615°C without light irradiation. This means that the effect is equivalent to that of 290℃. Figure 3 shows the hydrogen reduction of AsCl 3 when the wavelength of the irradiated light was varied while keeping the power of the laser light constant at 0.35W and 2W. Light with wavelengths shorter than 300 nm is effective for hydrogen reduction.

次に前記の光照射によるAsCl3の水素還元反応
をGaAs単結晶のエピタキシヤル成長に適用して
みた。第4図に使用する装置の概略図を示した。
光導入窓1を有する石英反応管2内の所定の位置
にあらかじめAsで飽和したGaソース3とGaAs
結晶基板4を設置する。電気炉5によりGaソー
ス3と基板4をそれぞれ所定の温度に加熱する。
照射光源6からの光を光導入窓1を通して反応管
2内に導入する。H2ガスが流量計7を通つてか
ら恒温槽8により所定の温度に保たれたAsCl3
ブラ9を通り、反応管2内に導入されることによ
つて、GaAs単結晶がエピタキシヤル成長させら
れる。
Next, we applied the hydrogen reduction reaction of AsCl 3 by light irradiation described above to the epitaxial growth of GaAs single crystals. FIG. 4 shows a schematic diagram of the apparatus used.
A Ga source 3 saturated with As and GaAs are placed in a predetermined position in a quartz reaction tube 2 having a light introduction window 1.
A crystal substrate 4 is installed. The electric furnace 5 heats the Ga source 3 and the substrate 4 to predetermined temperatures.
Light from an irradiation light source 6 is introduced into the reaction tube 2 through the light introduction window 1. GaAs single crystal is epitaxially grown by passing H 2 gas through a flow meter 7 and then through an AsCl 3 bubbler 9 kept at a predetermined temperature by a constant temperature bath 8 into the reaction tube 2. It will be done.

第4図の装置を用い、Gaソースの温度を600
℃、基板の温度を550℃とし、AsCl3バブラの温
度は0℃に保ち、H2ガスの流量は100ml/minと
して結晶成長を行なつた。この際エキシマレーザ
からの3Wの強度を有する249nmの光を光導入窓
から反応管内に導入した。2時間の成長の結果、
基板上に4μmの厚さのGaAs単結晶が成長してい
た。そして、このようにして得られた結晶のキヤ
リア密度は1×1013cm-3であつた。
Using the device shown in Figure 4, the temperature of the Ga source was set to 600℃.
Crystal growth was performed with the substrate temperature at 550°C, the AsCl 3 bubbler temperature maintained at 0°C, and the H 2 gas flow rate at 100 ml/min. At this time, 249 nm light with an intensity of 3 W from an excimer laser was introduced into the reaction tube through the light introduction window. As a result of 2 hours of growth,
A GaAs single crystal with a thickness of 4 μm was grown on the substrate. The carrier density of the crystal thus obtained was 1×10 13 cm −3 .

また、第5図は前記第4図の装置において、光
の導入方向をガスの流れ方向に対して直角方向に
変えた装置であり、この第5図の装置を用いて前
記と同様の成長を行なつたところ、全く同様の結
晶が得られた。
In addition, FIG. 5 shows a device in which the direction of light introduction is changed to the direction perpendicular to the gas flow direction in the device shown in FIG. When this process was carried out, completely similar crystals were obtained.

さらに、第6図は前記第5図の装置において、
光導入窓の部分を反応管本体から引出した構造に
なつており、光導入窓への反応生成物の付着によ
る照射光の減衰を防ぐことができる。
Furthermore, FIG. 6 shows that in the apparatus shown in FIG.
The structure is such that the light introduction window is drawn out from the reaction tube main body, and it is possible to prevent the irradiated light from being attenuated due to adhesion of reaction products to the light introduction window.

発明の効果 以上のように本発明によれば、従来AsCl3の水
素還元のために必要とされた高温に加熱する必要
がなく、反応管等全体の温度を低温化でき、高純
度のGaAs単結晶のエピタキシヤル成長が容易と
なり、その工業上の効果は大きい。
Effects of the Invention As described above, according to the present invention, there is no need to heat to the high temperatures conventionally required for hydrogen reduction of AsCl 3 , the temperature of the entire reaction tube etc. can be lowered, and high purity GaAs monomers can be produced. The epitaxial growth of crystals becomes easier, and its industrial effects are significant.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はAsCl3とH2の混合ガスに光照射したと
きの吸収スペクトルの変化を示す図であり、Aは
AsCl3をBはHClの吸収スペクトルを示してい
る。第2図はAsCl3の水素還元の温度依存性を示
す図である。第3図は光照射によるAsCl3の水素
還元の波長依存性を示す図である。第4図はこの
発明の一実施の成長装置を概略的に示す図であ
り、第5図は第4図と同様な効果が得られる成長
装置を概略的に示す図、第6図は第5図の変形例
を示す図である。 1……光導入窓、2……石英反応管、3……
Gaソース、4……GaAs結晶基板、5……電気
炉、6……照射光源、7……流量計、8……恒温
槽、9……AsCl3バブラ。
Figure 1 shows the change in the absorption spectrum when a mixed gas of AsCl 3 and H 2 is irradiated with light.
AsCl 3 B shows the absorption spectrum of HCl. FIG. 2 is a diagram showing the temperature dependence of hydrogen reduction of AsCl 3 . FIG. 3 is a diagram showing the wavelength dependence of hydrogen reduction of AsCl 3 by light irradiation. FIG. 4 is a diagram schematically showing a growth apparatus according to one embodiment of the present invention, FIG. It is a figure which shows the modification of a figure. 1...Light introduction window, 2...Quartz reaction tube, 3...
Ga source, 4...GaAs crystal substrate, 5...Electric furnace, 6...Irradiation light source, 7...Flowmeter, 8...Thermostatic chamber, 9...AsCl 3 bubbler.

Claims (1)

【特許請求の範囲】 1 AsCl3蒸気及び水素ガスをGaソースあるいは
Asで飽和されたGaソースあるいはGaAs固体ソ
ースに導入して反応させ、この反応によつて生じ
たガスを前記ソースより下流に設置された基板結
晶の表面に供給することにより、前記基板結晶表
面上にGaAs単結晶をエピタキシヤル成長させる
際、AsCl3の水素還元反応を光を照射することに
より促進させることを特徴とするGaAs単結晶の
製造方法。 2 照射する光の波長が300nmより短い光である
特許請求の範囲第1項記載のGaAs単結晶の製造
方法。
[Claims] 1. AsCl 3 vapor and hydrogen gas are used as Ga source or
By introducing a Ga source or a GaAs solid source saturated with As to cause a reaction, and supplying the gas generated by this reaction to the surface of a substrate crystal installed downstream of the source, 1. A method for producing a GaAs single crystal, which comprises promoting the hydrogen reduction reaction of AsCl 3 by irradiating light when epitaxially growing the GaAs single crystal. 2. The method for producing a GaAs single crystal according to claim 1, wherein the irradiated light has a wavelength shorter than 300 nm.
JP7656384A 1984-04-18 1984-04-18 Manufacture of gaas single crystal Granted JPS60221393A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7656384A JPS60221393A (en) 1984-04-18 1984-04-18 Manufacture of gaas single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7656384A JPS60221393A (en) 1984-04-18 1984-04-18 Manufacture of gaas single crystal

Publications (2)

Publication Number Publication Date
JPS60221393A JPS60221393A (en) 1985-11-06
JPH0361637B2 true JPH0361637B2 (en) 1991-09-20

Family

ID=13608707

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7656384A Granted JPS60221393A (en) 1984-04-18 1984-04-18 Manufacture of gaas single crystal

Country Status (1)

Country Link
JP (1) JPS60221393A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0630339B2 (en) * 1984-07-16 1994-04-20 新技術事業団 Method for producing GaAs single crystal
JP2743970B2 (en) * 1988-03-19 1998-04-28 住友電気工業株式会社 Molecular beam epitaxial growth of compound semiconductors.

Also Published As

Publication number Publication date
JPS60221393A (en) 1985-11-06

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