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JPH0361756B2 - - Google Patents
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JPH0361756B2 - - Google Patents

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Publication number
JPH0361756B2
JPH0361756B2 JP13432883A JP13432883A JPH0361756B2 JP H0361756 B2 JPH0361756 B2 JP H0361756B2 JP 13432883 A JP13432883 A JP 13432883A JP 13432883 A JP13432883 A JP 13432883A JP H0361756 B2 JPH0361756 B2 JP H0361756B2
Authority
JP
Japan
Prior art keywords
plating
plating solution
solution
chemical copper
copper ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13432883A
Other languages
Japanese (ja)
Other versions
JPS6026671A (en
Inventor
Hitoshi Oka
Hiroshi Kikuchi
Akira Matsuo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13432883A priority Critical patent/JPS6026671A/en
Priority to EP84107191A priority patent/EP0132594B1/en
Priority to US06/623,173 priority patent/US4563217A/en
Priority to DE8484107191T priority patent/DE3473890D1/en
Priority to KR1019840003557A priority patent/KR890002654B1/en
Publication of JPS6026671A publication Critical patent/JPS6026671A/en
Publication of JPH0361756B2 publication Critical patent/JPH0361756B2/ja
Granted legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/31Coating with metals
    • C23C18/38Coating with copper
    • C23C18/40Coating with copper using reducing agents

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  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemically Coating (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

〔発明の利用分野〕 本発明は化学銅めつき液に係り、長寿命、高安
定な化学銅めつき液に関する。 〔発明の背景〕 化学銅めつき液は2価銅イオン、2価銅イオン
の錯化剤、2価銅イオンの還元剤、PH調整剤を主
成分として含み、液安定化のため、少量の1価銅
イオンの錯化剤、ポリオキシエチレン鎖、を有す
る非イオン界面活性剤などを添加して使用され
る。化学銅めつきの反応メカニズムは明らかでは
ないが、上記の添加物の使用によつて、事実上、
液が安定化され、めつき反応に基づく主成分濃度
の減少を来たすことが無いように、常時主成分濃
度を管理すれば、連続的にめつきが可能となり、
実用に供せられる。 上記、化学銅めつき液には以下の欠点があつ
た。化学銅めつき液は、めつき反応によつて、液
中の2価銅イオン、水酸イオン、還元剤が消費さ
れる。このため、液成分の濃度が最適値の一定と
なるよう、2価銅イオン、水酸イオン、還元剤を
常時、不足分だけ補給する。これらの補給源は、
一般に経済的理由によつて、硫酸銅、水酸化ナト
リウムなどの水溶液、還元剤がホルムアルデヒド
の場合はホルマリンが使用される。めつきが継さ
れるにしたがつて、これらの補給量も増加し、め
つき液中にはめつきの反応と関係しない硫酸イオ
ン、ナトリウムイオン、ホルムアルデヒドの反応
生成物であるギ酸イオンが蓄積する。すなわち、
化学銅めつき液では、めつきが繰り返えされると
液中に、硫酸、ギ酸のナトリウム塩が蓄積し、液
が劣化する。液劣化が進行すると、液が不安定と
なり、めつき槽への析出、被めつき物の中で、め
つきされてはならない部分へのめつき析出(例え
ば、めつきレジスト上へのめつき析出)が生じ、
めつき液として使用不可能となり、廃棄されるも
のであつた。この可使時間は、一般に全めつき厚
みとして、150μm以内であつた。 〔発明の目的〕 発明の目的は、長寿命、高安定な化学銅めつき
液を提供することにある。 〔発明の概要〕 本発明は前記した化学銅めつき液の液劣が、前
記したアルカリ金属塩の蓄積に基づく、ポリオキ
シエチレン系非イオン界面活性剤の凝集に原因が
あることを見出し、凝集を抑止する化合物を種々
検討した結果、めつき液中、陽イオン性を示すイ
オン性界面活性剤の添加、併合使用が極めて効果
あることを見出したところにある。 〔発明の実施例〕 本発明を実施例を用いて具体的に説明する。化
学銅めつき液の液劣化が、前記したアルカリ金属
塩類の蓄積の進行とともに激しくなることに着目
し、これら塩類の蓄積濃度と前記した化学銅めつ
き液必須成分(添加物を含む)の物性変化の程合
を各種の観点から追求した結果、ポリオキシエチ
レン系非イオン界面活性剤の凝集が開始する温度
との間に相関々係を得ることを見出した。すなわ
ち、以下に示す化学銅めつき液; CuSO4・5H2O ……10g EDTA−2Na ……30g NaOH ……PH;12.2とする量 α,α′−ジピリジル ……50mg ポリオキシエチレン系非イオン界面活性剤
……100mg 水 ……1とする量 に、液中の蓄積成分として硫酸ナトリウム、ギ酸
ナトリウムを各種の濃度で加えたとき、ポリオキ
シエチレン系非イオン界面活性剤としてポリエチ
レングリコールステアリルアミンの凝集温度を、
めつき液が濁る曇点として測定した。その測定結
果は表1のようで、硫酸ナトリウム、ギ酸ナトリ
ウムの添加量とともに直線的に曇点が低くなつ
た。そこで、図に示すように、前記のめつき液1
当り、硫酸ナトリウム:28.0g、ギ酸ナトリウ
ム:20.4g含むめつき液に、本発明のイオン性界
面活性剤を添加すると、添加量の増大とともに、
曇点が上昇した。各種のイオン性界面活性剤の中
で、曇点上昇の添加効果の度合は、陽イオン性界
面活性剤(セチルトリメチルアンモニウムクロラ
イド、ドデシルピリジニウムクロライド)が最も
大きく、次いで両性イオン界面活性剤(ステアリ
ルベタイン)であつた。陰イオン性界面活性剤
(ドデシルベンゼンスルホン酸、スルホコハク酸
エステル、ポリオキシエチレンラウリル硫酸ナト
リウム)は、曇点上昇に効果があるが、上記2種
よりも小さかつた。 次に、図の中で、最も添加効果の大きいセチル
トリメチルアンモニウムクロライドを前記のめつ
き液1当り、50mg、硫酸ナトリウム:28.0g、
ギ酸ナトリウム:20.4gを前記の化学銅めつき液
に加え、各種のポリオキシエチレン系非イオン界
面活性剤の曇点上昇効果を測定した。その結果、
表2のごとく、いずれのポリオキシエチレン系非
イオン界面活性剤の場合も、セチルトリメチルア
ンモニウムクロライドの添加で曇点が上昇した。 以上の結果、化学銅めつき液中のポリオキシエ
チレン系非イオン界面活性剤のめつき液の劣化に
伴う凝集防止には、イオン性界面活性剤の添加が
極めて有効であることを明白にできた。 以下に実施例を用い、本発明が化学銅めつき液
の寿命と安定性向上に著しい効果あることを具体
的に説明する。なお、化学銅めつきを実施した装
置は、容量20のめつき槽で、ウオーターバスに
浸漬して、所定のめつき温度とした。めつき液は
小型ポンプで、5μmの細孔度を有するフイルター
を通して常時循環した。めつき液の主成分濃度は
自動管理、補給装置を用いて、常時一定となるよ
うにした。めつき液の寿命、安定性は、めつきが
めつき槽壁に生じるとき、もしくは、10cm角の銅
板(厚さ0.3mm)上に、5mm間隔でエポキシ樹脂
系のめつきレジストを印刷塗布したものに、めつ
きして、めつきレジスト上にもめつきが析出した
度合で判定した。なお、めつき面積は1dm2
の一定とした。 比較例 化学銅めつき液組成 CuSO4・5H2O ……10g EDTA−2Na ……30g NaOH ……PH:12.2とする量 α,α′−ジピリジル ……40mg ポリエチレングリコールステアリルアミン
……100mg 水 ……1とする量 めつき温度 70℃ 上記めつき液を用いて、連続的にめつきを行な
つた。その結果、めつき液1当り、硫酸ナトリ
ウム:37.5g、ギ酸ナトリウム:30.2g蓄積した時
点で、めつきレジスト上にめつき析出が認められ
た。この間の全めつき時間すなわち、めつき液寿
命は50時間であつた。この時点でのめつき液は、
界面活性剤添加のための、発泡性が認められなく
なつた。 実施例 1 比較例のめつき液1にセチルトリメチルアン
モニウムクロライド50mg添加した。全めつき時間
50時間に達しても、液の発泡性が認められるとと
もに、めつきレジスト上のめつき析出を認めなか
つた。全めつき時間100時間まで、めつきを継続
したが、めつきの析出異常を認めなかつた。めつ
き皮膜は、無添加のものに比較して差異が無く、
良いめつき皮膜が得られた。 実施例 2 化学銅めつき液組成 CuSO4・5H2O ……10g ヒドロキシエチルエチレンジアミン三酢酸三ナ
トリウム(HEDTA) ……30g NaOH ……PH:12.2とする量 α,α′−ジピリジル ……50mg ポリオキシエチレン・ポリオキシプロピレンブ
ロツポリマー(旭電化工業製プルロニツク
F68) ……100mg 水 ……1とする量 めつき温度 70℃ 上記めつき液は硫酸ナトリウム:28.0g、ギ酸
ナトリウム:24.5g蓄積した時点でめつきレジス
ト上にめつきが析出した。この場合の全めつき時
間は35時間であつた。本めつき液1当り、ステ
アリルベタイン100mgを添加してめつきした。そ
の結果、めつきレジスト上へのめつき析出がめつ
き時間80時間の間生じることが無かつた。 実施例 3 CuSO4・5H2O ……10g EDTA−2Na ……30g NaOH ……PH:12.1とする量 O−フエナントロリン ……1mg ポリオキシエチレンラウリルアミン ……200mg 水 ……1とする量 上記めつき液は、めつき時間70時間、すなわち
硫酸ナトリウム:42g、ギ酸ナトリウム:46.9g蓄
積した時、めつきレジスト上にめつきが生じた。
本液にラウリルベンジルメチルアンモニウムクロ
ライド50mg添加したところ、120時間めつきして
もめつきの析出異常を認めなかつた。 上記したごとく、本発明は実施例に限定されな
いことは言うまでもない。すなわち、イオン性界
面活性剤の添加効果はポリオキシエチレン系非イ
オン界面活性剤、めつき液劣化に伴う凝集を防止
するに有るので、めつき液の主要成分、例えば還
元剤、錯化剤などの種類とは関係しない。ただ、
めつき液に適用するポリオキシエチレン系非イオ
ン界面活性剤の種類と添加濃度に適合したイオン
性界面活性剤の添加濃度を選べば良いことは述べ
るまでもない。
[Field of Application of the Invention] The present invention relates to a chemical copper plating solution, and more particularly, to a chemical copper plating solution that has a long life and is highly stable. [Background of the Invention] A chemical copper plating solution contains divalent copper ions, a complexing agent for divalent copper ions, a reducing agent for divalent copper ions, and a PH adjuster as main components. It is used by adding a complexing agent for monovalent copper ions, a nonionic surfactant having a polyoxyethylene chain, and the like. Although the reaction mechanism of chemical copper plating is not clear, the use of the above additives effectively
If the concentration of the main component is constantly controlled so that the liquid is stabilized and the concentration of the main component does not decrease due to the plating reaction, continuous plating becomes possible.
Can be put to practical use. The chemical copper plating solution mentioned above had the following drawbacks. In a chemical copper plating solution, divalent copper ions, hydroxide ions, and a reducing agent in the solution are consumed by the plating reaction. For this reason, divalent copper ions, hydroxide ions, and reducing agents are constantly replenished in amounts corresponding to the shortages so that the concentration of the liquid components remains constant at the optimum value. These sources are
Generally, for economic reasons, an aqueous solution of copper sulfate, sodium hydroxide, etc., or formalin when the reducing agent is formaldehyde, is used. As plating continues, the amount of these supplies increases, and sulfate ions, sodium ions, and formate ions, which are reaction products of formaldehyde, which are unrelated to the plating reaction, accumulate in the plating solution. That is,
With chemical copper plating solutions, when plating is repeated, sodium salts of sulfuric acid and formic acid accumulate in the solution, causing the solution to deteriorate. As liquid deterioration progresses, the liquid becomes unstable, causing precipitation in the plating tank and on parts of the object to be plated that should not be plated (for example, plating on the plating resist). precipitation) occurs,
It became unusable as a plating solution and was discarded. This pot life was generally within 150 μm based on the total plating thickness. [Object of the Invention] The object of the invention is to provide a long-life, highly stable chemical copper plating solution. [Summary of the Invention] The present invention has discovered that the liquid deterioration of the chemical copper plating solution described above is caused by the aggregation of the polyoxyethylene nonionic surfactant based on the accumulation of the alkali metal salt, and As a result of various studies on compounds that inhibit this, it has been found that the addition or combined use of an ionic surfactant exhibiting cationic properties to the plating solution is extremely effective. [Examples of the Invention] The present invention will be specifically described using examples. Focusing on the fact that the deterioration of the chemical copper plating solution becomes more severe as the accumulation of the alkali metal salts described above progresses, we investigated the accumulated concentration of these salts and the physical properties of the essential components (including additives) of the chemical copper plating solution described above. As a result of investigating the degree of change from various viewpoints, it was found that there is a correlation between the temperature at which aggregation of polyoxyethylene nonionic surfactants starts. In other words, the chemical copper plating solution shown below: CuSO 4・5H 2 O ...10g EDTA-2Na ...30g NaOH ...Amount to make PH 12.2 α,α'-dipyridyl ...50mg Polyoxyethylene nonionic surfactant
……100mg water ……When sodium sulfate and sodium formate were added at various concentrations as accumulated components in the liquid to an amount of 1, the aggregation temperature of polyethylene glycol stearylamine as a polyoxyethylene nonionic surfactant was determined. ,
It was measured as the cloud point at which the plating solution becomes cloudy. The measurement results are shown in Table 1, and the cloud point decreased linearly with the amount of sodium sulfate and sodium formate added. Therefore, as shown in the figure, the plating solution 1
When the ionic surfactant of the present invention is added to a plating solution containing 28.0 g of sodium sulfate and 20.4 g of sodium formate, as the amount added increases,
Cloud point increased. Among various ionic surfactants, cationic surfactants (cetyltrimethylammonium chloride, dodecylpyridinium chloride) have the greatest effect on increasing the cloud point, followed by zwitterionic surfactants (stearyl betaine). ). Anionic surfactants (dodecylbenzenesulfonic acid, sulfosuccinate, sodium polyoxyethylene lauryl sulfate) were effective in raising the cloud point, but the effect was smaller than the above two types. Next, in the figure, cetyltrimethylammonium chloride, which has the greatest addition effect, is added at 50 mg per plating solution, sodium sulfate: 28.0 g,
Sodium formate: 20.4 g was added to the above chemical copper plating solution, and the cloud point raising effect of various polyoxyethylene nonionic surfactants was measured. the result,
As shown in Table 2, the cloud point of all polyoxyethylene nonionic surfactants increased with the addition of cetyltrimethylammonium chloride. The above results clearly demonstrate that the addition of ionic surfactants is extremely effective in preventing the agglomeration of polyoxyethylene nonionic surfactants in chemical copper plating solutions due to deterioration of the plating solution. Ta. EXAMPLES Below, using Examples, it will be specifically explained that the present invention has a remarkable effect on improving the life and stability of chemical copper plating solutions. The device used for chemical copper plating was a plating tank with a capacity of 20, and was immersed in a water bath to reach a predetermined plating temperature. The plating solution was constantly circulated using a small pump through a filter having a pore size of 5 μm. The concentration of the main components of the plating solution was kept constant at all times using automatic management and a replenishment device. The lifespan and stability of the plating solution are determined when plating occurs on the wall of the plating tank, or when an epoxy resin plating resist is printed and applied at 5 mm intervals on a 10 cm square copper plate (thickness 0.3 mm). Then, plating was performed, and judgment was made based on the degree to which plating was deposited on the plating resist. The plating area is 1dm 2 /
was kept constant. Comparative example Chemical copper plating liquid composition CuSO 4・5H 2 O ……10g EDTA−2Na ……30g NaOH ……Amount to make PH: 12.2 α, α′-Dipyridyl ……40mg Polyethylene glycol stearylamine
...100mg water ...amount equal to 1 Plating temperature 70°C Plating was carried out continuously using the above plating solution. As a result, plating precipitation was observed on the plating resist when 37.5 g of sodium sulfate and 30.2 g of sodium formate were accumulated per plating solution. The total plating time during this period, that is, the life of the plating solution was 50 hours. At this point, the plating solution is
Due to the addition of surfactant, foaming properties were no longer observed. Example 1 50 mg of cetyltrimethylammonium chloride was added to plating solution 1 of Comparative Example. Complete time
Even after 50 hours, foaming properties of the liquid were observed, and no plating precipitation was observed on the plating resist. Plating was continued for a total plating time of 100 hours, but no abnormalities in plating precipitation were observed. There is no difference in the plating film compared to the one without additives,
A good plating film was obtained. Example 2 Chemical copper plating solution composition CuSO 4・5H 2 O ...10g Hydroxyethylethylenediaminetriacetic acid trisodium (HEDTA) ...30g NaOH ...Amount to make PH: 12.2 α,α'-dipyridyl ...50mg Poly Oxyethylene/polyoxypropylene block polymer (Pluronic manufactured by Asahi Denka Kogyo)
F68)...100mg Water...Amount to be 1 Plating temperature 70°C When the above plating solution accumulated 28.0g of sodium sulfate and 24.5g of sodium formate, plating precipitated on the plating resist. The total plating time in this case was 35 hours. Plating was carried out by adding 100 mg of stearyl betaine per 1 portion of the main plating solution. As a result, no plating precipitation occurred on the plating resist during a plating time of 80 hours. Example 3 CuSO 4・5H 2 O ...10g EDTA-2Na ...30g NaOH ...Amount to make PH: 12.1 O-phenanthroline ...1mg Polyoxyethylene laurylamine ...200mg Water ...Amount to make 1 The above plating solution caused plating on the plating resist when the plating time was 70 hours, that is, 42 g of sodium sulfate and 46.9 g of sodium formate were accumulated.
When 50 mg of laurylbenzylmethylammonium chloride was added to this solution, no abnormal plating precipitation was observed even after 120 hours of plating. As mentioned above, it goes without saying that the present invention is not limited to the examples. In other words, the effect of adding an ionic surfactant is to prevent polyoxyethylene-based nonionic surfactants from agglomerating as the plating solution deteriorates. It has nothing to do with the type of just,
Needless to say, it is sufficient to select the concentration of the ionic surfactant that is compatible with the type and concentration of the polyoxyethylene nonionic surfactant used in the plating solution.

【表】【table】

【表】 テトロニツク、プルロニツク:ポリオキシ
エチレン・ポリオキシプロピレンブロツクポ
リマー(旭電化工業製)
〔発明の効果〕 本発明によれば、2価銅イオン、2価銅イオン
の錯化剤、2価銅イオンの還元剤、PH調整剤、1
価銅イオンの錯化剤、ポリオキシエチレン系非イ
オン界面活性剤を必須成分として含む化学銅めつ
き液にイオン性界面活性剤を添加することによつ
て、めつき反応に伴う陰イオンの蓄積によつて生
じるポリオキシエチレン系非イオン界面活性剤の
凝集を抑止するので、めつき液の寿命が長くな
り、かつ安定性が著しく向する効果がある。よつ
て、めつき不良が低減し、めつきコストが低くな
り、工業的に著しい効果を有する。
[Table] Tetronic, Pluronic: Polyoxyethylene/polyoxypropylene block polymer (manufactured by Asahi Denka Kogyo)
[Effects of the Invention] According to the present invention, divalent copper ions, complexing agents for divalent copper ions, reducing agents for divalent copper ions, PH regulators, 1
By adding an ionic surfactant to a chemical copper plating solution that contains a complexing agent for valence copper ions and a polyoxyethylene nonionic surfactant as an essential component, it is possible to reduce the accumulation of anions associated with the plating reaction. Since the agglomeration of the polyoxyethylene nonionic surfactant caused by this process is suppressed, the life of the plating solution is extended and the stability is significantly improved. Therefore, plating defects are reduced, plating costs are reduced, and this has significant industrial effects.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は配合要素の状態を示す線図である。 FIG. 1 is a diagram showing the state of the compounding elements.

Claims (1)

【特許請求の範囲】[Claims] 1 2価銅イオン、2価銅イオンの錯化剤、2価
銅イオンの還元剤、PH調整剤、1価銅イオンの錯
化剤、ポリオキシエチレン系非イオン界面活性剤
を必須成分として含んで成る化学銅めつき液にお
いて、イオン性界面活性剤を含むことを特徴とす
る化学銅めつき液。
1 Contains divalent copper ions, complexing agents for divalent copper ions, reducing agents for divalent copper ions, PH regulators, complexing agents for monovalent copper ions, and polyoxyethylene nonionic surfactants as essential ingredients. A chemical copper plating solution comprising an ionic surfactant.
JP13432883A 1983-07-25 1983-07-25 Chemical copper plating solution Granted JPS6026671A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP13432883A JPS6026671A (en) 1983-07-25 1983-07-25 Chemical copper plating solution
EP84107191A EP0132594B1 (en) 1983-07-25 1984-06-22 Electroless copper plating solution
US06/623,173 US4563217A (en) 1983-07-25 1984-06-22 Electroless copper plating solution
DE8484107191T DE3473890D1 (en) 1983-07-25 1984-06-22 Electroless copper plating solution
KR1019840003557A KR890002654B1 (en) 1983-07-25 1984-06-23 Electroless Copper Plating Solution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13432883A JPS6026671A (en) 1983-07-25 1983-07-25 Chemical copper plating solution

Publications (2)

Publication Number Publication Date
JPS6026671A JPS6026671A (en) 1985-02-09
JPH0361756B2 true JPH0361756B2 (en) 1991-09-20

Family

ID=15125754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13432883A Granted JPS6026671A (en) 1983-07-25 1983-07-25 Chemical copper plating solution

Country Status (1)

Country Link
JP (1) JPS6026671A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2784181B1 (en) * 2013-03-27 2015-12-09 ATOTECH Deutschland GmbH Electroless copper plating solution
US20150024123A1 (en) * 2013-07-16 2015-01-22 Rohm And Haas Electronic Materials Llc Catalysts for electroless metallization containing iminodiacetic acid and derivatives
CN117878196A (en) * 2024-03-12 2024-04-12 深圳市松柏科工股份有限公司 A photovoltaic solar N-type oxide semiconductor ITO chemical copper plating production process

Also Published As

Publication number Publication date
JPS6026671A (en) 1985-02-09

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