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JPH0363694B2 - - Google Patents
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JPH0363694B2 - - Google Patents

Info

Publication number
JPH0363694B2
JPH0363694B2 JP11686284A JP11686284A JPH0363694B2 JP H0363694 B2 JPH0363694 B2 JP H0363694B2 JP 11686284 A JP11686284 A JP 11686284A JP 11686284 A JP11686284 A JP 11686284A JP H0363694 B2 JPH0363694 B2 JP H0363694B2
Authority
JP
Japan
Prior art keywords
unbalance
circuit
specimen
signal
correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11686284A
Other languages
Japanese (ja)
Other versions
JPS60259925A (en
Inventor
Katsuyoshi Nishimura
Koji Arahori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP11686284A priority Critical patent/JPS60259925A/en
Publication of JPS60259925A publication Critical patent/JPS60259925A/en
Publication of JPH0363694B2 publication Critical patent/JPH0363694B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M1/00Testing static or dynamic balance of machines or structures
    • G01M1/14Determining imbalance
    • G01M1/16Determining imbalance by oscillating or rotating the body to be tested
    • G01M1/22Determining imbalance by oscillating or rotating the body to be tested and converting vibrations due to imbalance into electric variables
    • G01M1/225Determining imbalance by oscillating or rotating the body to be tested and converting vibrations due to imbalance into electric variables for vehicle wheels
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M1/00Testing static or dynamic balance of machines or structures
    • G01M1/14Determining imbalance
    • G01M1/16Determining imbalance by oscillating or rotating the body to be tested
    • G01M1/22Determining imbalance by oscillating or rotating the body to be tested and converting vibrations due to imbalance into electric variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Balance (AREA)

Description

【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は、つりあい試験に基づいて供試体に修
正を加える為に、供試体の不つりあいの存在する
角度位置を所定の位置に位置決めする装置に関す
る。
[Detailed Description of the Invention] (a) Industrial Application Field The present invention involves positioning a specimen at a predetermined angular position where an unbalance exists in order to make corrections to the specimen based on a balance test. Regarding equipment.

(ロ) 従来技術 従来のこの種の装置は、供試体の不つりあい角
度位置を、所定の定位置、例えば修正用ドリルの
配設位置に位置決めさせていた。ところで、供試
体に修正加工を施すに当り、その不つりあいの大
きさによつて1箇所の修正ではつりあわせきれな
い場合がよくある。このような場合、不つりあい
角度位置を中心として、複数箇所に修正加工が施
される。従来の位置決め装置では、不つりあいの
大きさに関係なく、不つりあい角度位置が定位置
に位置決めされるから、1箇所の修正で良ければ
問題はないが、複数箇所の修正を施す必要のある
場合、作業者が感覚的にその停止位置を中心に修
正点を振り分けて修正を行つており、この場合に
はつりあわせ誤差が発生しやすい。また、例えば
修正加工を施す為の角度ピツチを10°と決めてお
いて、供試体の位置とメータ等を連動させるよう
構成しても、これだけでは以下のような問題があ
つて、加工の誤りが発生しやすく、また非能率的
である。すなわち、奇数の修正を要するときに
は、第4図に示す如く、停止位置すなわち不つり
あい角度位置とその両側10°ごとに修正加工を施
す必要があり、偶数の修正を要するときには、停
止位置には修正加工を施さず、その位置から両側
に5°、15°…の位置に修正加工を施さなければな
らない。作業者はこの判断をした後に修正作業を
行わねばならないから、判断ミスの発生や能率的
な問題は解消することができない。
(b) Prior Art In this type of conventional device, the unbalance angle position of the specimen is positioned at a predetermined fixed position, for example, at a position where a correction drill is installed. By the way, when modifying a specimen, it is often not possible to balance it out by modifying one location, depending on the magnitude of the imbalance. In such a case, correction processing is performed at a plurality of locations centered on the unbalanced angular position. With conventional positioning devices, the unbalance angle position is positioned at a fixed position regardless of the size of the unbalance, so there is no problem if only one location needs to be corrected, but if multiple locations need to be corrected. , the operator intuitively allocates correction points around the stop position and makes corrections, and in this case, a balancing error is likely to occur. Furthermore, even if the angle pitch for corrective machining is determined to be 10 degrees, and the position of the specimen is linked to the meter, etc., this alone will cause the following problems, resulting in machining errors. This is likely to occur and is inefficient. In other words, when an odd number needs to be corrected, it is necessary to make corrections at the stop position, that is, the unbalance angle position, and every 10 degrees on both sides of it, as shown in Figure 4.When an even number needs to be corrected, the correction must be made at the stop position. Without any machining, correction machining must be performed at positions 5°, 15°, etc. on both sides from that position. Since the operator has to perform correction work after making this judgment, errors in judgment and efficiency problems cannot be resolved.

(ハ) 目的 本発明は上記に鑑みなされたもので、不つりあ
い角度位置を定位置に停止させるのではなく、不
つりあいの大きさに基づく修正箇所の数に応じ、
あらかじめ設定されたピツチに基づく1又は複数
の修正箇所のうち、最端の修正箇所を定位置に位
置決めすることができ、その位置から上述の一定
のピツチごとに修正を加えることにより、修正誤
差がなく、かつ、能率的な修正作業を行うことの
できる位置決め装置の提供を目的としている。
(c) Purpose The present invention has been made in view of the above, and instead of stopping the unbalance angle position at a fixed position, it adjusts the angle position according to the number of correction points based on the magnitude of the unbalance.
Among one or more correction points based on a preset pitch, the most extreme correction point can be positioned at a fixed position, and correction errors can be reduced by making corrections at the above-mentioned constant pitch from that position. It is an object of the present invention to provide a positioning device that can perform correction work efficiently and without any problems.

(ニ) 構成 本発明の特徴とするところは、つりあい試験に
より得られた供試体の不つりあいベクトルの90°
分力成分に相当する2種の直流信号を、それぞれ
基準位相信号に同期する互に90°の位相差を持つ
方形波信号によつてチヨツピングして合成するこ
とにより、不つりあいの大きさと角度位置を求め
る装置において、求められた不つりあいの大きさ
を、あらかじめ設定された修正箇所の数に対応す
る複数のランクに弁別し、その弁別結果に応じ
て、上述の基準位相信号の位相を所定の角度分だ
けシフトすることにより、不つりあいの大きさに
基づく修正箇所の数に応じて、あらかじめ設定さ
れたピツチに基づく1又は複数の修正箇所のう
ち、最端の修正箇所が定位置に位置決めされるよ
う構成したことにある。
(d) Structure The feature of the present invention is that the unbalance vector of the specimen obtained by the balance test is 90°.
The magnitude and angular position of the unbalance can be determined by chopping and combining two types of DC signals corresponding to component force components using square wave signals that are synchronized with the reference phase signal and have a phase difference of 90°. In the device for determining the magnitude of the unbalance, the magnitude of the unbalance is discriminated into a plurality of ranks corresponding to the number of correction points set in advance, and the phase of the above-mentioned reference phase signal is adjusted to a predetermined value according to the discrimination result. By shifting by the angle, the farthest correction point among one or more correction points based on the preset pitch is positioned at the fixed position depending on the number of correction points based on the size of the unbalance. The reason is that it is configured so that

(ホ) 実施例 本発明の実施例を、以下、図面に基づいて説明
する。
(e) Examples Examples of the present invention will be described below based on the drawings.

第1図は本発明実施例の回路構成を示すブロツ
ク図である。
FIG. 1 is a block diagram showing the circuit configuration of an embodiment of the present invention.

この本発明実施例の従来装置に対する特徴部分
は、位相シフト回路7とランク弁別回路6を設け
たことにあり、基準位相信号の位相を、ランク弁
別回路6による弁別結果に応じた量だけ位相シフ
ト回路7によつてシフトするよう構成したことに
ある。
The characteristic feature of this embodiment of the present invention over the conventional device is that a phase shift circuit 7 and a rank discrimination circuit 6 are provided, and the phase of the reference phase signal is phase shifted by an amount corresponding to the discrimination result by the rank discrimination circuit 6. The reason is that the shift is performed by the circuit 7.

2成分合成回路1は、つりあい試験によつて得
られた供試体の不つりあいベルトルの90°分力成
分に相当する直流信号xおよびyを、方形波整形
回路2から供給される互に90°の位相差を持つ方
形波信号およびによつてそれぞれチヨツピン
グしてこれらを合成した信号を出力する。方形波
整形回路2は、位相シフト回路7を経由した基準
位相信号を入力し、その入力信号に対してそれぞ
れ0°および90°の位相差を持ち、180°の開閉比を持
つ方形波信号およびを出力する。
A two-component synthesis circuit 1 receives direct current signals x and y corresponding to 90° component force components of the unbalanced belt of the specimen obtained by the balance test, and converts them into 90° A square wave signal having a phase difference of 1 and 2 is chopped, respectively, and a signal obtained by combining these signals is output. The square wave shaping circuit 2 inputs the reference phase signal via the phase shift circuit 7, and generates a square wave signal and a square wave signal having a phase difference of 0° and 90° with respect to the input signal, respectively, and a switching ratio of 180°. Output.

2成分合成回路1の出力4は、整流回路3で整
流された後、記憶回路4に導入されて記憶され
る。また、出力Aは位相比較回路5に導入されて
おり、位相比較回路5はその出力Aと、供試体の
回転と連動するレゾルバの出力信号との位相を比
較し、その差に応じた信号を出力する。レゾルバ
の1次側入力信号は、基準位相信号が用いられて
いる。
The output 4 of the two-component synthesis circuit 1 is rectified by the rectifier circuit 3, and then introduced into the storage circuit 4 and stored therein. In addition, the output A is introduced into a phase comparator circuit 5, which compares the phase of the output A with the output signal of the resolver that is linked to the rotation of the specimen, and outputs a signal according to the difference. Output. A reference phase signal is used as the primary side input signal of the resolver.

記憶回路4の記憶内容はランク弁別回路6によ
つて、あらかじめ設定された複数のランクのう
ち、どのランクの大きさを持つかが判別される。
その判別結果により、位相シフト回路7のシフト
量が決定されるよう構成されている。
A rank discriminating circuit 6 determines which rank the size of the stored contents of the memory circuit 4 has among a plurality of preset ranks.
The shift amount of the phase shift circuit 7 is determined based on the determination result.

次に作用を述べる。位相シフト回路7によるシ
フト量が0°である場合の、各部の信号波形を第2
図に示す。この場合、方形波信号およびの基
準位相信号に対する位相差はそれぞれ0°および
90°となる。2成分合成回路1は直流信号xおよ
びyと、方形波波信号およびにより、次のよ
うな手順で信号Aを出力する。すなわち、直流信
号xを方形波信号で、信号yを信号でそれぞ
れチヨツピングし、得られた信号BおよびCを加
算して信号Dを得る。その信号Dをフイルタを通
すことにより、基準位相信号の基本波成分のみの
正弦波信号Aを得る。この信号Aの振巾Uは供試
体の不つりあいの大きさに比例し、また、信号A
の基準位相信号に対する位相差θは、供試体の不
つりあいの存在する角度位置にある一定の関係を
持つ。以上は公知技術であつて、この信号Aを整
流した信号を記憶する記憶回路4の内容は、供試
体の不つりあいの大きさの検出値となり、また、
信号Aとレゾルバの出力信号との位相を比較して
その差が0となるところで供試体を位置決めする
ことにより、すなわち、位相比較回路5の出力を
角度位置決め信号として供することにより、供試
体の不つりあい角度位置を定位置に位置決めする
ことができる。
Next, we will discuss the effect. The signal waveform of each part when the shift amount by the phase shift circuit 7 is 0° is
As shown in the figure. In this case, the square wave signal and the phase difference with respect to the reference phase signal are 0° and
It becomes 90°. The two-component synthesis circuit 1 outputs a signal A using the DC signals x and y and the square wave signal according to the following procedure. That is, the DC signal x is chopped with a square wave signal, and the signal y is chopped with a square wave signal, and the obtained signals B and C are added to obtain a signal D. By passing the signal D through a filter, a sine wave signal A containing only the fundamental wave component of the reference phase signal is obtained. The amplitude U of this signal A is proportional to the magnitude of the unbalance of the specimen;
The phase difference θ with respect to the reference phase signal has a certain relationship with the angular position where the unbalance of the specimen exists. The above is a known technique, and the contents of the memory circuit 4 that stores the rectified signal A is a detected value of the magnitude of unbalance of the specimen, and
By comparing the phases of the signal A and the output signal of the resolver and positioning the specimen at a point where the difference becomes 0, that is, by using the output of the phase comparator circuit 5 as an angular positioning signal, the defect of the specimen is determined. The balance angle position can be positioned in a fixed position.

さて、不つりあいの大きさによつて、修正箇所
が1以上複数に亘る場合において、修正箇所数と
対応してランク弁別回路6の基準電圧が設定され
る。すなわち、修正が1箇所でよい不つりあいの
大きさであればランク1、2箇所ならランク2…
と、記憶回路4の内容により、ランク弁別回路6
の出力が変化する。この出力により、修正箇所数
を表示するとともに、位相シフト回路7による基
準位相信号のシフト量を変化させる。例えば、
10°のピツチで修正するように定めておく場合、
ランク別によるシフト量を、ランク1(修正箇所
数1)では0°、ランク2(同2)では5°、ランク
3(同3)では10°…と設定する。位相シフト回路
7によつて基準位相信号の位相をα°シフトさせて
方形波整形回路2に入力すれば、2成分合成回路
1の出力信号Aは、元の基準位相信号に対してθ
+α°の位相差を持つことになる。従つて、この信
号Aと、元の基準位相信号を1次側入力信号とす
るレゾルバの出力信号の位相とが一致するよう、
供試体を位置決めすれば、供試体の不つりあい角
度位置は定位置に対してα°だけずれた位置に位置
決めされることになる。このα°上述の如く要修正
箇所数に対応するランクごとに設定しておくこと
により、第3図に示す如く、要修正箇所の一方の
最端の箇所が定位置に位置決めされることにな
る。従つて作業者は、先ずその位置に修正を施
し、要修正箇所数に応じて所定方向に10°づつ供
試体を順次ずらせて、修正を施せばよい。
Now, when the number of correction points is one or more depending on the magnitude of the imbalance, the reference voltage of the rank discrimination circuit 6 is set in correspondence with the number of correction points. In other words, if the size of the unbalance requires correction in one place, it will be ranked 1, if it is in two places, it will be ranked 2...
According to the contents of the memory circuit 4, the rank discrimination circuit 6
output changes. With this output, the number of correction points is displayed and the amount of shift of the reference phase signal by the phase shift circuit 7 is changed. for example,
If it is specified to be corrected at a pitch of 10°,
The shift amount for each rank is set to 0° for rank 1 (number of correction points is 1), 5° for rank 2 (same 2), 10° for rank 3 (same 3), etc. If the phase of the reference phase signal is shifted by α° by the phase shift circuit 7 and input to the square wave shaping circuit 2, the output signal A of the two-component synthesis circuit 1 will be shifted by θ with respect to the original reference phase signal.
There will be a phase difference of +α°. Therefore, so that this signal A matches the phase of the output signal of the resolver whose primary side input signal is the original reference phase signal,
When the specimen is positioned, the unbalance angular position of the specimen is shifted by α° from the normal position. By setting this α° for each rank corresponding to the number of points requiring correction as described above, one of the extreme points of the points requiring correction is positioned at a fixed position, as shown in Figure 3. . Therefore, the operator first needs to correct the position, and then sequentially shifts the specimen by 10 degrees in a predetermined direction depending on the number of points that require correction.

なお、供試体を例えば10°づつ所定方向にずら
せるに当つては、次の3つの方式によつて正確に
その角度を割り出すことができる。その1つは、
位相比較回路5の出力でメータを振らせ、その指
示値が0°となるよう供試体を手で回動させる。こ
れにより最初の位置決め停止が行われたことにな
る。そしてメータに10°毎の目盛を付しておき、
指示値が10°づつ変化するように順次供試体を回
動させる方式である。2つ目は、位相比較回路5
の出力信号を、供試体を駆動するモータの制御回
路に供給し、位相比較回路5の出力信号が0とな
るようモータを停止させて、最初の位置決め停止
を行う。そして、供試体の回転主軸に5°毎の切欠
を設け、その切欠に嵌り込むノツチを配設して、
最初の位置決め停止位置から供試体を手で回動さ
せて2個目の切欠にノツチが嵌り込むごとに修正
を行う方式である。更に、3つ目は、最初の位置
決めは上述の2つ目と同様に位相比較回路7の出
力が0となるようモータを自動的に停止させた
後、位相シフト回路7によるシフト量を2ランク
づつ減らすことにより、自動的にモータを10°づ
つ回動させる方式である。本発明では、以上の3
つの位置決め方式のいずれにでも適用することが
できる。
In addition, when shifting the specimen in a predetermined direction by, for example, 10 degrees, the angle can be accurately determined by the following three methods. One of them is
The meter is caused to swing by the output of the phase comparison circuit 5, and the specimen is rotated by hand so that the indicated value becomes 0°. This means that the first positioning stop has been performed. Then, attach a scale every 10 degrees to the meter,
This method involves sequentially rotating the specimen so that the indicated value changes by 10 degrees. The second is the phase comparator circuit 5
The output signal is supplied to the control circuit of the motor that drives the specimen, and the motor is stopped so that the output signal of the phase comparator circuit 5 becomes 0, thereby performing the first positioning stop. Then, a notch was provided at every 5° on the rotating main shaft of the specimen, and a notch that fit into the notch was provided.
In this method, the specimen is rotated by hand from the initial positioning stop position, and corrections are made each time the notch fits into the second notch. Furthermore, thirdly, in the first positioning, the motor is automatically stopped so that the output of the phase comparator circuit 7 becomes 0, as in the second position above, and then the shift amount by the phase shift circuit 7 is changed by two ranks. This method automatically rotates the motor in 10° increments by decreasing the amount by 10°. In the present invention, the above three
It can be applied to any of the two positioning methods.

(ヘ) 効果 以上説明したように、本発明によれば、不つり
あいの大きさに基づく修正箇所の数に応じて、供
試体の不つりあい角度位置が定位置に対して所定
の角度だけずれた位置に位置決めされ、その位置
決めによつて定位置には1又は複数の修正箇所の
うち、所定方向の最端の修正箇所が停止されるの
で、その停止位置から所定の方向に所定ピツチご
とに修正を加えることにより、正確な修正が施さ
れ、従来のように作業者の感覚や判断に頼ること
なく、誤差のない能率的な修正作業を行うことが
できる。
(F) Effect As explained above, according to the present invention, the unbalance angular position of the specimen deviates from the normal position by a predetermined angle depending on the number of correction points based on the magnitude of the unbalance. As a result of this positioning, among the one or more correction points, the farthest correction point in a predetermined direction is stopped at the fixed position, so corrections are made every predetermined pitch in a predetermined direction from the stopped position. By adding , accurate corrections can be made, and error-free and efficient correction work can be performed without relying on the operator's sense and judgment as in the past.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明実施例の回路構成を示すブロツ
ク図、第2図はその各部の信号波形図、第3図は
その作用説明図、第4図は従来の位置決め装置の
作用説明図である。 1……2成分合成回路、2……方形波整形回
路、3……整流回路、4……記憶回路、5……位
相比較回路、6……ランク弁別回路、7……位相
シフト回路。
Fig. 1 is a block diagram showing the circuit configuration of an embodiment of the present invention, Fig. 2 is a signal waveform diagram of each part thereof, Fig. 3 is an explanatory diagram of its operation, and Fig. 4 is an explanatory diagram of the operation of a conventional positioning device. . DESCRIPTION OF SYMBOLS 1... Two-component synthesis circuit, 2... Square wave shaping circuit, 3... Rectifier circuit, 4... Memory circuit, 5... Phase comparison circuit, 6... Rank discrimination circuit, 7... Phase shift circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 つりあい試験により得られた供試体の不つり
あいベクトルの90°分力成分に相当する2種の直
流信号を、それぞれ基準位相信号に同期する互に
90°の位相差を持つ方形波によつてチヨツピング
して合成することにより、供試体に存在する不つ
りあいの大きさと角度位置を求め、供試体に修正
を加えるべく上記角度位置を所定の定位置に位置
決め停止させる装置において、上記不つりあいの
大きさを、あらかじめ設定された複数のランクに
弁別する回路と、その弁別結果に応じて上記基準
位相信号の位相を所定の角度分だけシフトする回
路を有し、上記ランクを不つりあいの大きさに基
づく修正箇所の数に対応させるとともに、その数
に応じて、あらかじめ定められたピツチに基づく
1又は複数の修正箇所のうち、最端の修正箇所が
上記定位置に位置決めされるよう構成したことを
特徴とする不つりあい修正位置の位置決め装置。
1. Two types of DC signals corresponding to the 90° component of the unbalance vector of the specimen obtained in the balance test are each synchronized with the reference phase signal.
By chopping and synthesizing square waves with a phase difference of 90°, the magnitude and angular position of the unbalance existing in the specimen are determined, and the above angular position is set at a predetermined position in order to make corrections to the specimen. A device for positioning and stopping at a position includes a circuit that discriminates the magnitude of the unbalance into a plurality of preset ranks, and a circuit that shifts the phase of the reference phase signal by a predetermined angle in accordance with the discrimination result. The above rank corresponds to the number of correction points based on the size of the imbalance, and according to the number, the most extreme correction point among one or more correction points based on a predetermined pitch is determined. A positioning device for an unbalance correction position, characterized in that it is configured to be positioned at the above-mentioned fixed position.
JP11686284A 1984-06-06 1984-06-06 Positioning device for unbalance correction position Granted JPS60259925A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11686284A JPS60259925A (en) 1984-06-06 1984-06-06 Positioning device for unbalance correction position

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11686284A JPS60259925A (en) 1984-06-06 1984-06-06 Positioning device for unbalance correction position

Publications (2)

Publication Number Publication Date
JPS60259925A JPS60259925A (en) 1985-12-23
JPH0363694B2 true JPH0363694B2 (en) 1991-10-02

Family

ID=14697465

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11686284A Granted JPS60259925A (en) 1984-06-06 1984-06-06 Positioning device for unbalance correction position

Country Status (1)

Country Link
JP (1) JPS60259925A (en)

Also Published As

Publication number Publication date
JPS60259925A (en) 1985-12-23

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