JPH0370176B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a light resistance test in which the phenomenon of deterioration of various industrial materials and products when exposed to sunlight is investigated by artificially accelerating the phenomenon.

[Conventional technology]

In conventional light resistance tests, the specimen is directly irradiated with light from an ultraviolet carbon arc lamp, sunshine carbon arc lamp, xenon lamp, etc. to cause deterioration of the specimen, and the test piece is evaluated based on the amount of light irradiation and the degree of deterioration. A method was used to determine the quality of light resistance. However, in order to go one step further and conduct research to better improve light resistance, it is necessary to know which wavelength range of light from the light source has the strongest effect on causing deterioration. For this purpose, experiments have been attempted in which a spectroscopic device is used to irradiate a sample with light of different wavelengths, but since it was not originally intended for light resistance testing, the irradiation energy was weak and it was difficult to judge the quality of light resistance. However, the irradiation time required for this purpose was long, and the device was insufficient to solve this purpose.

[Problem to be solved by the invention]

In order to separate and irradiate light by wavelength, it is necessary for spectroscopy to collect the light beam into a slit, and if the light beam exiting the slit is separated into wavelengths by passing through a dispersion element, the energy becomes weaker. However, for the purpose of light fastness testing, it is desirable to be able to examine deterioration in as short a time as possible, so something with strong irradiation energy was desired. In addition, when the irradiation energy is increased, the number of heat rays increases, and the equipment inside the device is placed in a situation where the influence of heat exceeds the limit of accurate measurement, causing measurement errors or making measurements impossible. It was necessary to increase the irradiation energy so as not to cause damage.

Furthermore, when a light source is used by dividing the light into wavelengths, the energy at the irradiation surface is obtained as a combination of the spectral characteristics of the light source and the characteristics of the optical system for performing the spectroscopy. For this reason, unless it is known how much energy the irradiated surface has received for each wavelength, it is not possible to accurately determine whether the sample has deteriorated.

In addition, when the wavelength of interest for a characteristic is known, it is important for light resistance test research to extract only that specific wavelength and irradiate the sample.

In this way, it is hoped that a spectroscopic irradiation device will emerge that can confirm the energy of each wavelength received by the sample, has strong irradiation energy, is not affected by heat from irradiation light, and can determine deterioration in a short time. was.

[Means to solve the problem]

In order to solve the above-mentioned problems, the present invention provides an apparatus for determining the wavelength dependence of deterioration of a sample due to separated light, which includes a reflecting mirror that condenses irradiated light in order to irradiate the sample with strong light. A light source is provided, a heat ray absorption filter that circulates a liquid between multiple transparent plates is provided in front of the focal point of this irradiated light to absorb the heat of the irradiated light, a slit is provided at the focal point of this irradiated light, and this slit is The irradiated light is dispersed through a diffraction grating to irradiate the sample with the dispersed light, and a half mirror is installed in the sample irradiation optical path of this dispersed light to measure the energy of each wavelength of a part of this dispersed light. In order to irradiate the sample with light of a specific wavelength, a large number of microsurface photodetectors are arranged in the wavelength dispersion direction to irradiate the integrated photoreceiver group, and a sample surface provided just in front of the sample surface is used to irradiate the sample with light of a specific wavelength. The method is to extract light of a specific wavelength and irradiate it onto the sample through an output slit that can be moved in parallel with the sample.

[Effect]

By employing the above means, the light from the light source can be efficiently focused on the slit by the reflecting mirror, so that more powerful light can be irradiated onto the sample. Also, the light source generates heat and the number of heat rays from the irradiated light increases,
Since this heat is absorbed by a heat ray absorption filter and then focused on a slit, the temperature does not exceed the operating temperature range of the equipment used to disperse the irradiated light, such as a diffraction grating, so it is not affected by heat. ,
Irradiation light can be stably dispersed. Furthermore, since a half mirror is provided in the sample irradiation optical path of the dispersed light to irradiate a portion of the dispersed light to the photoreceiver group, it is possible to simultaneously measure the energy of each wavelength irradiated to the sample.

Furthermore, it is also possible to extract light of a specific wavelength and irradiate the sample, and also to measure this energy.

〔Example〕

Embodiments of the present invention will be described below with reference to the drawings.

(First Embodiment) FIG. 1 is a block diagram showing a first embodiment of the present invention. In the figure, the light source chamber 1 is comprised of a light source 15 equipped with an elliptical mirror 14, a plane mirror 18 that bends this light beam, a heat ray absorption filter 13 that absorbs heat rays, and the like. A spectroscopic chamber 2 connected to the light source chamber 1 transmits a portion of the irradiated light to a slit 12 arranged at the focal point of the light source 15, a concave mirror 3a, a diffraction grating 4, a concave mirror 3b, and a receiver group 6 arranged outside the spectroscopic chamber 2. It is composed of a half mirror 5, etc. that sends the information.

Now, the light source 15 has a continuous emission spectrum in the wavelength range from the ultraviolet region to the near infrared region, and for example, a xenon short arc lamp or the like is used. (In this example, a 5Kw xenon short arc lamp was used as the light source.) An elliptical mirror 14 is used as a reflector for irradiating powerful irradiation light that is a condensed light from the light source. The first of this elliptical mirror 14
If the center of the light source 15 is placed at the focal point, the light beam from the light source will be condensed at the second focal point, so the slit 12 is placed at this position. A plane mirror 18 is placed in front of the second focal point in order to bend this light beam and make the entire device as compact as possible.

Between the plane mirror 18 and the slit 12, a liquid is circulated between two transparent quartz plates, which are materials that absorb only the heat rays of the irradiated light and allow the irradiated light in the short wavelength ultraviolet region to pass through as is. A heat ray absorption filter 13 is placed in the middle of the slit 12 to prevent unnecessary heat rays from passing through the slit 12 and beyond. I have to. The reason why the heat ray absorption filter 13 having the above structure was adopted here is because a commonly used heat ray absorption filter consisting of an ordinary optical filter absorbs heat rays and at the same time removes important ultraviolet rays that degrade the sample. be.

The light beam passing through the slit 12 is turned into a parallel light beam by the concave mirror 3a, and is incident on the diffraction grating 4. The reflected light from here is reflected in slightly different directions depending on the wavelength of the light, and is focused at the position of the sample 7 by the concave mirror 3b. Here, the irradiated surface of the sample is irradiated with light of different wavelengths with wavelength purity determined by the aperture width of the slit 12.

Therefore, when a test piece is set at the position of sample 7 and irradiated continuously, each part of the test piece is irradiated with light of a different wavelength, so if the test piece has characteristics that are weak in a specific wavelength range, The deterioration phenomenon will be observed only in the area irradiated with light in that wavelength range, and it is possible to know the wavelength that affects the deterioration of the test piece.

A half mirror 5 is placed in front of the sample 7, and a part of the irradiated light is bent and taken out of the irradiation light system, and a minute surface receiving light is placed at a position equidistant from the irradiation surface and can receive light at wavelengths of, for example, every 10 nm. A photoreceiver group 6, which is integrally constructed by arranging a large number of elements in the direction of wavelength dispersion, is arranged, and the light is made incident thereon.
This photoreceiver group 6 is configured such that the integrated illuminance value for each wavelength on the irradiation surface can be determined from a previously calibrated intensity ratio. In addition, these processes are carried out by the amplifier 8,
This is performed by an arithmetic circuit 9 and a display device 10, and a CRT or a printer is used as the display device 10.

If the receiver group 6 can be attached not only to the position shown in the figure but also to a part of the irradiation surface, the energy irradiated to the test piece can be measured by removing it and setting it at the position of the sample 7. This is a means for calibrating the intensity ratio in advance as described above.

The half mirror 5 is preferably made of a material that easily transmits light in a wavelength range from the ultraviolet region to the near-infrared region, such as a transparent quartz plate. In addition, for the purpose of the present invention, the ratio of transmission and reflection is that the irradiated light itself is strong, so it is sufficient to make a few percent of the reflected light of the total irradiated light enter the receiver group 6, and most of the light is transmitted and the sample 7 is irradiate.

In this embodiment, light with a wavelength range of 250 nm to 700 nm is dispersed and irradiated over an area of about 9 cm on the irradiation surface, and light of the same wavelength is irradiated over a width of 4 cm in the width direction.

For example, if silicon photocells (size 3 x 15 mm) are used as the receiver group 6, 9
Since 30 pieces can be arranged within cm, by assigning wavelengths from 250 to 700 nm, the amount of light received at each wavelength can be determined at approximately 15 nm intervals.

In this embodiment, in addition to the light source 15 described above,
A starting device 11 and a power supply device 17 for lighting the
Although not shown, there is a cooling device for cooling the light source 15, and cooling is performed through a cooling duct 16. These devices are housed in a light source chamber 1.

[Second Embodiment] FIG. 2 is a block diagram showing a second embodiment of the present invention. This embodiment is the apparatus of the first embodiment, with a part of the sample irradiation part provided in the spectroscopic chamber 2 being modified. In the figure, a slit moving rail 20 is fixed to the outside of the sample irradiation part of the spectroscopic chamber 2, and an exit slit 19 is movably attached to this, so that it can be moved on the moving rail 20 by a slit moving knob 21.

The purpose of this is to extract only light of a specific wavelength and irradiate it to the sample 7. For example, if there is a sample that is weak only at a specific wavelength, it is necessary to irradiate only this wavelength range for improvement research. This is because it would be extremely useful if possible.

[Experiment example]

Next, an example of an experiment conducted using the apparatus of the present invention will be described.

When we conducted an irradiation experiment using light-sensitive paper (LSP) to test the luminosity of a light fastness tester, we found that the device of the first embodiment of the present invention showed strong discoloration in a region centered around a wavelength of 320 nm after 3 hours of irradiation. As a result of the change in reflectance Y%, the unfaded area was Y=20%, while the faded area was Y=38%.

This change in reflectance was measured at a pitch of 2 mm using a colorimeter having a measurement area of about 1.6 mm, and the results are shown in the lower part of FIG. The horizontal axis shows the irradiation wavelength, and the vertical axis shows the reflectance Y%. The upper row conceptually shows the state of the irradiated sample.

The above-mentioned LSP is Y= Y after irradiation for 20 hours in a light resistance tester using a conventional ultraviolet carbon arc lamp.
This shows a change of about 26%. Therefore, compared to this, it can be seen that the apparatus of the present invention can significantly shorten the sample deterioration time.

FIG. 4 is a graph showing the integrated energy for each wavelength during 3-hour irradiation of the sample using the photodetector group of the present invention. The horizontal axis is the wavelength,
The vertical axis shows the integrated energy (MJ/m ² ). Therefore, in the case of the LSP used in this experiment, although the maximum peak of color fading change is around 3200 nm, the peak of the irradiated energy is around 480 nm, and the energy at 320 nm is about half that. I understand that there is something.

By knowing the energy value of irradiation in this way, it is possible to calculate what kind of changes can be predicted if it is irradiated with equal energy light, or to predict the results when irradiated with sunlight distribution. becomes.

〔Effect of the invention〕

Therefore, with the present invention, in the field of light resistance research, where spectral irradiation has traditionally been desired but has not been possible due to the long time it takes, it is possible to significantly shorten the test time and improve the irradiation wavelength. We are able to provide a powerful device that can determine the energy value of each component, which will be of great help in future research on improving the light resistance of industrial materials.

[Brief explanation of drawings]

FIG. 1 is a configuration diagram showing one embodiment of the present invention, and FIG.
The figure is a partial plan view showing another embodiment with some changes.
FIG. 3 is a graph showing changes in reflectance as a result of irradiation and a conceptual diagram of the sample, and FIG. 4 is a graph showing integrated energy values for each wavelength during an irradiation experiment. 1...Light source room, 2...Spectroscopy room, 3...Concave mirror,
4... Diffraction grating, 5... Half mirror, 6... Light receiver group, 7... Sample, 8... Amplifier, 9... Arithmetic circuit, 10... Display device, 11... Starting device, 1
2...Slit, 13...Heat ray absorption filter,
14...Elliptical mirror, 15...Light source, 16...Cooling duct, 17...Power supply device, 18...Plane mirror, 19
...Emission slit, 20...Slit moving rail, 21...Slit moving knob, 22...Light intensity test paper, 23...Irradiation section.

Claims (1)

[Scope of Claims] 1. In an apparatus for determining the wavelength dependence of deterioration of a sample due to spectral light, a light source is provided with a reflecting mirror that condenses the irradiated light in order to irradiate the sample with strong light, and this irradiated light is A heat ray absorption filter that circulates a liquid between multiple transparent plates is provided in front of the focal point of the irradiation light to absorb the heat rays of the irradiation light.A slit is provided at the focal point of this irradiation light, and the irradiation light that has passed through the slit is passed through a diffraction grating. A half mirror is installed in the sample irradiation optical path of this dispersed light, and a micro-surface photodetector is used to measure the energy of each wavelength of a part of this dispersed light. A configuration in which a large number of light receivers are arranged in the wavelength dispersion direction and irradiated onto an integrated photoreceiver group, and the sample is irradiated with continuous light of different wavelengths, and the energy of the light of different wavelengths can be simultaneously measured. A spectroscopic irradiation device featuring: 2. In an apparatus for determining the wavelength dependence of the deterioration of a sample due to separated light, a light source with a reflecting mirror that condenses the irradiated light is installed to irradiate the sample with strong light. A heat ray absorption filter that circulates a liquid between two transparent plates is provided to absorb the heat rays of the irradiation light, a slit is provided at the focal point of this irradiation light, and the irradiation light that has passed through the slit is dispersed through a diffraction grating. Light of a specific wavelength is extracted and irradiated onto the sample through an exit slit that can be moved parallel to the sample surface, which is provided just in front of the surface, and a half mirror is installed in the sample irradiation optical path of this dispersed light. In order to measure the energy of some wavelengths, a large number of microsurface photodetectors are arranged in the direction of wavelength dispersion and configured to irradiate an integrated photoreceiver group, and the sample is irradiated with light of a specific wavelength. A spectral irradiation device characterized by: