JPH0371397B2 - - Google Patents
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- Publication number
- JPH0371397B2 JPH0371397B2 JP60211849A JP21184985A JPH0371397B2 JP H0371397 B2 JPH0371397 B2 JP H0371397B2 JP 60211849 A JP60211849 A JP 60211849A JP 21184985 A JP21184985 A JP 21184985A JP H0371397 B2 JPH0371397 B2 JP H0371397B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- semiconductor
- type
- gas
- diamond
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Crystals, And After-Treatments Of Crystals (AREA)
Description
〔産業上の利用分野〕
本発明は電子機器等に利用されるn型半導体特
性を示すダイヤモンド膜の製造法に関する。
〔従来技術の背景〕
炭素(C)は周期律表でb族に属しており、同族
のSiと同様に半導体材料として使用できる可能性
があると考えられている。しかしながらグラフア
イトでは導電性が高く半導体としては用いること
はできない。これに対しダイヤモンドは絶縁性で
あるので不純物添加等の方法によつて半導体とし
ての使用が理論的には考えられる。
天然に産する大部分のダイヤモンドは電気的に
1011Ωcm以上の絶縁体であるが、ごく一部に100〜
104Ωcmと低い抵抗値のものがありb型と呼ば
れている。そしてこのb型はその詳しい調査に
よつてp型半導体であることが明らかになつてお
り、超高圧高温合成によつて人工的に製造するこ
とができるものである。しかしながらn型半導体
のダイヤモンドは天然に存在しないばかりでなく
超高圧合成でも製造例は現在のところない。
ダイヤモンド半導体素子の作製の為にはp.n両
型の半導体が不可欠であり、これを可能にする為
に、イオン注入法によつてn型半導体の作製が試
みられてきた。その結果、Sb、Ar、C等のイオ
ン注入層とB注入層との接合が整流作用に近い
−特性を持つことが報告されている。しかしn
型半導体の確認までは至つてない。
〔発明の開示〕
本発明は、上述の課題を解決する為に薄膜法を
用いたn型半導体層の製造法を提供するものであ
る。
本発明の特徴は、炭化水素と水素との混合ガス
からダイヤモンド膜の気相合成時にP、As等の
不純物(ドーパンド)を分解放出し易いガスを導
入することにある。このような気相合成に不純物
を入れると高圧合成に比べてはるかに均一に含有
されると共にイオン注入法に比べて無理のない位
置に不純物原子が入り込み、ドーパントとしての
効果を出し易いと考えた。本発明はこの考えによ
り実現したもので従来の高圧合成法やイオン注入
法によつて合成されなかつたn型半導体を合成す
ることに成功した。
本発明を実施するには薄膜ダイマの合成手法を
利用する必要があるが、炭素が残留せず結晶質の
良い膜の形成には、プラズマCVDもしくはCVD
法が望ましい。
この場合の反応ガスは炭化水素のCとH2との
モル比が0.001以上0.02以下が適当である。0.001
以下では膜の成長速度は極めて遅く経済的でな
く、又0.02以上では膜の結晶性が悪く半導体層と
して十分な性能を付加することができない。
又、ドーパント元素としてはP、As、Sbが通
常のSiをn型にする場合と同じく効果があつた。
ドーパンド元素とCとのモル比は0.0001以上
0.002とすべきである。0.0001以下では半導体と
して十分な導電率を出せない。又0.002以上では
膜中に歪が生じ、欠陥の多い膜となり半導体素子
への適用が困難になる。
このようにして作製した膜はダイヤモンド単結
晶上に形成させればエピタキシヤル成長して単結
晶膜が得られるため半導体素子としての利用が可
能となる。
又薄膜形成法としてはプラズマCVD、CVDの
いずれにおいても可能である。ガスの励起手段と
しては高周波、マイクロ波、電子線、レーザー等
いずれの手段でも効果に変わりはなく、磁場によ
り励起をさらに強くすることも本発明の範囲であ
る。
次に実施例によつて詳しく説明をする。
実施例 1
公知プラズマCVD(マイクロ波で2.45GHzを用
いてプラズマを点火する。)法にて、CH4:0.5
%、PH3:0.05%残H2からなる反応ガスよりダイ
ヤモンド単結晶基板上の(111)面に0.5μmの厚
さのダイヤモンド膜を形成した。この膜の電気抵
抗は1×103Ωcmと計測され、ホール効果を測定
した結果n型半導体であることを確認した。
実施例 2
実施例1と同じ方法にて第1表に示す組成の反
応ガスより、各0.3μmのダイヤモンド膜を作成し
て電気抵抗と電子の移動度を測定した。その結果
を第1表に示す。
[Industrial Field of Application] The present invention relates to a method for producing a diamond film exhibiting n-type semiconductor characteristics used in electronic devices and the like. [Background of the Prior Art] Carbon (C) belongs to group b in the periodic table, and is thought to have the potential to be used as a semiconductor material like Si, which is in the same group. However, graphite has high conductivity and cannot be used as a semiconductor. On the other hand, since diamond is insulating, it is theoretically possible to use it as a semiconductor by adding impurities or the like. Most naturally occurring diamonds are electrically
It is an insulator with a resistance of 10 11 Ωcm or more, but there are a small number of insulators with a resistance of 10 0 to
There is a type with a resistance value as low as 10 4 Ωcm, and it is called type b. Detailed investigation has revealed that this b-type is a p-type semiconductor, which can be artificially produced by ultra-high pressure and high temperature synthesis. However, not only does diamond, an n-type semiconductor, not exist naturally, but there is currently no example of its production by ultra-high pressure synthesis. For the production of diamond semiconductor devices, both pn and pn type semiconductors are essential, and in order to make this possible, attempts have been made to produce n-type semiconductors by ion implantation. As a result, it has been reported that the junction between the ion-implanted layer of Sb, Ar, C, etc. and the B-implanted layer has characteristics close to rectifying action. But n
We have not yet been able to confirm the type of semiconductor. [Disclosure of the Invention] In order to solve the above-mentioned problems, the present invention provides a method for manufacturing an n-type semiconductor layer using a thin film method. A feature of the present invention is to introduce a gas that easily decomposes and releases impurities (dopants) such as P and As during vapor phase synthesis of a diamond film from a mixed gas of hydrocarbons and hydrogen. We believe that when impurities are introduced in this type of vapor phase synthesis, they are contained much more uniformly than in high-pressure synthesis, and the impurity atoms can enter into more reasonable positions than in ion implantation, making it easier to produce the effect as a dopant. . The present invention was realized based on this idea, and succeeded in synthesizing an n-type semiconductor that could not be synthesized by conventional high-pressure synthesis methods or ion implantation methods. In order to carry out the present invention, it is necessary to use a thin film dimer synthesis method, but plasma CVD or CVD can be used to form a film with good crystallinity without residual carbon.
Law is preferable. In this case, it is appropriate that the reaction gas has a molar ratio of hydrocarbon C to H 2 of 0.001 or more and 0.02 or less. 0.001
If it is less than 0.02, the growth rate of the film will be extremely slow and uneconomical, and if it is more than 0.02, the crystallinity of the film will be poor and it will not be possible to add sufficient performance as a semiconductor layer. Further, as dopant elements, P, As, and Sb had the same effect as when converting ordinary Si to n-type. The molar ratio between the dopant element and C is 0.0001 or more
Should be 0.002. If it is less than 0.0001, it cannot provide sufficient conductivity as a semiconductor. Moreover, if it is more than 0.002, strain will occur in the film, resulting in a film with many defects, making it difficult to apply to semiconductor devices. If the film produced in this manner is formed on a diamond single crystal, it can be epitaxially grown to obtain a single crystal film, and thus can be used as a semiconductor element. Further, as a thin film forming method, either plasma CVD or CVD is possible. As a gas excitation means, any means such as high frequency, microwave, electron beam, laser, etc. will have the same effect, and it is also within the scope of the present invention to further strengthen the excitation using a magnetic field. Next, a detailed explanation will be given using examples. Example 1 CH 4 : 0.5 using a known plasma CVD method (in which plasma is ignited using microwaves at 2.45 GHz).
A diamond film with a thickness of 0.5 μm was formed on the (111) plane of a diamond single-crystal substrate using a reaction gas containing 0.05 % residual H2 . The electrical resistance of this film was measured to be 1×10 3 Ωcm, and Hall effect measurements confirmed that it was an n-type semiconductor. Example 2 Using the same method as in Example 1, diamond films each having a thickness of 0.3 μm were prepared from the reaction gas having the composition shown in Table 1, and the electrical resistance and electron mobility were measured. The results are shown in Table 1.
【表】
実施例 3
公知CVD(約2100℃に加熱したタングステンフ
イラメントにより熱分解)により、C/H2=
0.005、As/C=0.001となるようにC2H6、
AsH3、H2ガスを混合し、0.3μmの膜を人工ダイ
ヤ単結晶上に形成して電気抵抗値とホール効果を
測定したところ、抵抗が1.5×102Ωcmでn型と同
定され、電子の移動度は720cm2/v.secであつた。
実施例 4
実施例2と同様の方法で、As、Sbの添加濃度
を変えて比較した。AsはAsH3として、Sbは
SbCl5としてガス状態で添加した。[Table] Example 3 C/H 2 =
0.005, C 2 H 6 so that As/C=0.001,
When AsH 3 and H 2 gases were mixed and a 0.3 μm film was formed on an artificial diamond single crystal and the electrical resistance value and Hall effect were measured, the resistance was 1.5 × 10 2 Ωcm and it was identified as n-type The mobility was 720cm 2 /v.sec. Example 4 Comparisons were made in the same manner as in Example 2, with different concentrations of As and Sb added. As is AsH3 , Sb is
It was added in gaseous state as SbCl 5 .
【表】
本願範囲の試料はn型半導体ダイヤモンド膜が
得られた。[Table] An n-type semiconductor diamond film was obtained from the samples covered in the present application.
Claims (1)
1種以上のドーパント元素を含むガス、炭化水素
ガス及び水素から成る反応ガス中の炭化水素ガス
が含有する炭素原子と水素分子のモル比が0.001
〜0.02であり、ドーパント原子と該炭素原子との
モル比が0.0001〜0.002である反応ガスを熱分解、
もしくはプラズマ分解して基板上に蒸着すること
を特徴とするn型半導体ダイヤモンド膜の製造
法。1 A reaction gas consisting of a gas containing one or more dopant elements selected from the group consisting of P, As, or Sb, a hydrocarbon gas, and hydrogen, in which the molar ratio of carbon atoms to hydrogen molecules contained in the hydrocarbon gas is 0.001.
~0.02, and the molar ratio of the dopant atoms to the carbon atoms is 0.0001 to 0.002, thermally decomposing the reaction gas,
Alternatively, a method for producing an n-type semiconductor diamond film characterized by plasma decomposition and vapor deposition on a substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21184985A JPS6270295A (en) | 1985-09-24 | 1985-09-24 | Manufacturing method of n-type semiconductor diamond film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21184985A JPS6270295A (en) | 1985-09-24 | 1985-09-24 | Manufacturing method of n-type semiconductor diamond film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6270295A JPS6270295A (en) | 1987-03-31 |
| JPH0371397B2 true JPH0371397B2 (en) | 1991-11-13 |
Family
ID=16612606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21184985A Granted JPS6270295A (en) | 1985-09-24 | 1985-09-24 | Manufacturing method of n-type semiconductor diamond film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6270295A (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5274268A (en) * | 1987-04-01 | 1993-12-28 | Semiconductor Energy Laboratory Co., Ltd. | Electric circuit having superconducting layered structure |
| JPH0196094A (en) * | 1987-10-07 | 1989-04-14 | Tokai Univ | Method for manufacturing P-type semiconductor diamond film |
| US5304461A (en) * | 1989-01-10 | 1994-04-19 | Kabushiki Kaisha Kobe Seiko Sho | Process for the selective deposition of thin diamond film by gas phase synthesis |
| JP2730144B2 (en) * | 1989-03-07 | 1998-03-25 | 住友電気工業株式会社 | Single crystal diamond layer formation method |
| JP2813363B2 (en) * | 1989-03-13 | 1998-10-22 | 日本特殊陶業株式会社 | Diamond semiconductor and manufacturing method thereof |
| WO1992001314A1 (en) * | 1990-07-06 | 1992-01-23 | Advanced Technology Materials, Inc. | N-type semiconducting diamond, and method of making the same |
| US6162412A (en) * | 1990-08-03 | 2000-12-19 | Sumitomo Electric Industries, Ltd. | Chemical vapor deposition method of high quality diamond |
| JP3568394B2 (en) * | 1998-07-07 | 2004-09-22 | 独立行政法人 科学技術振興機構 | Method for synthesizing low-resistance n-type diamond |
| JP4949493B2 (en) * | 2010-02-18 | 2012-06-06 | 日本電信電話株式会社 | N-type semiconductor diamond and method for producing the same |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58135117A (en) * | 1982-01-29 | 1983-08-11 | Natl Inst For Res In Inorg Mater | Diamond manufacturing method |
| JPS5930709A (en) * | 1982-08-13 | 1984-02-18 | Toa Nenryo Kogyo Kk | Method for synthesizing carbon film and carbon granule in vapor phase |
-
1985
- 1985-09-24 JP JP21184985A patent/JPS6270295A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6270295A (en) | 1987-03-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |