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JPH0371652B2 - - Google Patents
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JPH0371652B2 - - Google Patents

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Publication number
JPH0371652B2
JPH0371652B2 JP14973486A JP14973486A JPH0371652B2 JP H0371652 B2 JPH0371652 B2 JP H0371652B2 JP 14973486 A JP14973486 A JP 14973486A JP 14973486 A JP14973486 A JP 14973486A JP H0371652 B2 JPH0371652 B2 JP H0371652B2
Authority
JP
Japan
Prior art keywords
chamber
pressure
sensor
pressure transmitter
differential pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14973486A
Other languages
Japanese (ja)
Other versions
JPS636431A (en
Inventor
Keizo Ootani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Azbil Corp
Original Assignee
Azbil Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Azbil Corp filed Critical Azbil Corp
Priority to JP14973486A priority Critical patent/JPS636431A/en
Publication of JPS636431A publication Critical patent/JPS636431A/en
Publication of JPH0371652B2 publication Critical patent/JPH0371652B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、差圧発信器等の圧力発信器に生ずる
封入液の漏洩による異常の発生を診断する方法に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for diagnosing the occurrence of an abnormality caused by leakage of a sealed liquid in a pressure transmitter such as a differential pressure transmitter.

〔従来の技術〕[Conventional technology]

圧力、差圧等の計測を用いる圧力発信器は、セ
ンタダイヤフラムを介する高圧室と低圧室とを備
え、各室をバリアダイヤフラムにより密閉すると
共に、各室中へシリコン液等の封入液を封入して
おり、これが各室から漏洩を生じないものとして
製造されているが、計測現場へ設置後、何等かの
原因により外部に対する漏洩または各室相互間の
漏洩を生ずることがあり、この際には圧力発信器
の検出々力が不正確となるため、従来は、経験的
に検出々力の値に応じて異常の有無を判断し、あ
るいは、定期点検により圧力発信器をチエツク
し、封入液の漏洩等に基づく異常の有無を診断し
ている。
A pressure transmitter that measures pressure, differential pressure, etc. is equipped with a high pressure chamber and a low pressure chamber via a center diaphragm, each chamber is sealed by a barrier diaphragm, and a liquid such as silicone liquid is filled into each chamber. This is manufactured to prevent leakage from each room, but after installation at the measurement site, leakage to the outside or between each room may occur for some reason, and in this case, Since the detection force of the pressure transmitter is inaccurate, conventionally, the presence or absence of an abnormality was determined empirically according to the detection force value, or the pressure transmitter was checked during periodic inspection, and the amount of sealed liquid was checked. Diagnosing the presence or absence of abnormalities based on leaks, etc.

〔発明が解決しよとする問題点〕[Problem that the invention seeks to solve]

しかし、経験による判断では、不正確な結果し
か得られず、定期点検による場合は別途に各種の
測定器を要すると共に、異常を発見しても、封入
液の漏洩がいずれにおいて発生しているかを判断
するには分解検査を行なうほかなく、いずれにし
ても診断が面倒かつ多大な工数を要するものとな
る問題を生じている。
However, judgment based on experience can only provide inaccurate results, and periodic inspections require various measuring instruments, and even if an abnormality is detected, it is difficult to determine where the leakage of the sealed liquid is occurring. The only way to determine this is to carry out a disassembly inspection, and in any case, the problem arises that diagnosis is troublesome and requires a large amount of man-hours.

〔問題点を解決するための手段〕[Means for solving problems]

前述の問題を解決するため、本発明はつぎの手
段により構成するものとなつている。
In order to solve the above-mentioned problem, the present invention is constructed by the following means.

すなわち、封入液の封入された高圧室および低
圧室を備えかつ前記各室間にセンタダイヤフラム
を備えた圧力発信器の前記各室毎の容積変化量を
算出するのに必要とする初期定数をメモリへ格納
し、前記各室中の少くとも一方の静圧を検出する
静圧センサおよび圧力発信器の温度を検出する温
度センサを設け、圧力発信器へ既知圧力を印加
し、このときにおける圧力発信器の検出々力と静
圧センサの検出々力と温度センサの検出々力とメ
モリの初期定数とを用いて前記各室の容積変化量
を算出し、これら各室の容積変化量に応じて封入
液の漏洩有無を判断するものとなつている。
In other words, the initial constants required to calculate the volume change of each chamber of a pressure transmitter that is equipped with a high pressure chamber and a low pressure chamber filled with liquid and a center diaphragm between the chambers are stored in memory. A static pressure sensor that detects the static pressure in at least one of the chambers and a temperature sensor that detects the temperature of the pressure transmitter are provided, and a known pressure is applied to the pressure transmitter, and the pressure is transmitted at this time. The amount of change in volume of each chamber is calculated using the detected force of the chamber, the detected force of the static pressure sensor, the detected force of the temperature sensor, and the initial constant of the memory, and the amount of change in volume of each chamber is calculated. It is designed to determine whether there is any leakage of the sealed liquid.

〔作用〕[Effect]

したがつて、高圧室および低圧室の容積変化量
に基づき、封入液の漏洩有無を判断することがで
きる。
Therefore, it is possible to determine whether or not the sealed liquid has leaked based on the amount of change in volume of the high-pressure chamber and the low-pressure chamber.

〔実施例〕〔Example〕

以下、実施例を示す図によつて本発明の詳細を
説明する。
Hereinafter, details of the present invention will be explained with reference to figures showing examples.

第2図は差圧発信器に断面図であり、計測すべ
き圧力の印加される透孔1a,1bを有するカバ
ー2a,2bが両側方からガスケツト3a,3b
により密閉状として披着されたボデイ4a,4b
には、透孔1a,1bと対向してバリアダイヤフ
ラム5a,5bが周囲をボデイ4a,4bと密着
のうえ設けてあり、これの各内側に間隙6a,6
bが形成され、これらの中央部と連通孔7a,7
bにより連通する内室8a,8bの中間には、各
内室8a,8b間を密閉状に隔離するセンタダイ
ヤフラム9が設けてある。
FIG. 2 is a cross-sectional view of the differential pressure transmitter, in which covers 2a and 2b having through holes 1a and 1b to which the pressure to be measured is applied are connected to gaskets 3a and 3b from both sides.
The bodies 4a and 4b are sealed in a sealed manner.
, barrier diaphragms 5a, 5b are provided in close contact with the bodies 4a, 4b around the periphery, facing the through holes 1a, 1b, and gaps 6a, 6 are provided inside each of the barrier diaphragms 5a, 5b.
b are formed, and these central parts and communication holes 7a, 7
A center diaphragm 9 is provided between the inner chambers 8a and 8b, which communicate with each other through b, for sealingly separating the inner chambers 8a and 8b.

また、ボデイ4a,4bと下方には、間隙6
a,6bおよび内室8a,8bと連通し、かつ、
封入液10a,10bの注入口11a,11bと
連通する連通孔12a,12bが設けてあると共
に、ボデイ4a,4bの上方には、内室8a,8
bと上面側との連通孔13a,13bが穿設して
あり、カバー2a,2bとボデイ4a,4bと
は、ボルト14およびナツト15により密着して
係止されている。
In addition, there is a gap 6 between the bodies 4a and 4b and below.
communicates with a, 6b and inner chambers 8a, 8b, and
Communication holes 12a, 12b are provided which communicate with the injection ports 11a, 11b for the filled liquids 10a, 10b, and inner chambers 8a, 8 are provided above the bodies 4a, 4b.
The covers 2a, 2b and the bodies 4a, 4b are tightly secured to each other by bolts 14 and nuts 15, respectively.

一方、ボデイ4a,4bの上面には、熔接によ
り固着された外筒21中に、これと環状の間隙2
2を形成して同様に固着された筒状部材23が設
けてあり、外筒21の上端周囲と密着されて外筒
21の上端開放部を密閉し、かつ、筒状部材23
の上端周囲と密着してこれの内部へ嵌合するセン
サベース24の下面に、ガラス製の支持筒25が
固定されており、センサベース24と支持筒25
とには、間隙22と支持筒25の下面とを連絡す
る連通孔26が穿設されていると共に、支持筒2
5の下面へ連通孔26を周囲から密閉する状態と
してダイヤフラム形の複合センサ27が固定され
ている。
On the other hand, an annular gap 2 is provided between the outer cylinder 21 fixed to the upper surface of the bodies 4a and 4b by welding.
A cylindrical member 23 is provided which forms a cylindrical member 2 and is fixed in the same manner.
A support cylinder 25 made of glass is fixed to the lower surface of the sensor base 24 that fits into the interior of the sensor base 24 in close contact with the periphery of the upper end, and the sensor base 24 and the support cylinder 25
A communication hole 26 connecting the gap 22 and the lower surface of the support tube 25 is bored in the support tube 2.
A diaphragm-shaped composite sensor 27 is fixed to the lower surface of the sensor 5 to seal the communication hole 26 from the surroundings.

また、支持筒25および筒状部材23と各々間
隙を形成し、また、複合センサ27より下方まで
突出してスリーブ28がセンサベース24の下面
へ固着されており、これの下端開放面には多数の
透孔を有する雑音防止用のシールド板29が被着
されている。
Further, a sleeve 28 is fixed to the lower surface of the sensor base 24, forming a gap with the support cylinder 25 and the cylindrical member 23, and protruding downward from the composite sensor 27. A shield plate 29 for noise prevention having a through hole is attached.

なお、複合センサ27のリード線は、スリーブ
28、サンサベース24中を貫通し、上面のピン
20a,20bへ導出され、上方へ係止された圧
力伝送器30中の回路と接続されている。
Note that the lead wire of the composite sensor 27 passes through the sleeve 28 and the sensor base 24, is led out to the pins 20a and 20b on the upper surface, and is connected to a circuit in the pressure transmitter 30 that is locked upward.

第1図は、複合センサ27の拡大平面図であ
り、シリコン等の基板31が用いられ、これの中
央部にダイヤフラム32が形成してあると共に、
これらの絶縁皮膜面上へ集積回路技術により、ダ
イヤフラム32と基板31との境界近傍かつ互に
対角線上の四方に差圧センサ33a〜33dが形
成され、これらの近傍かつ基板31上に静圧セン
サ34a〜34dが形成されている一方、差圧セ
ンサ33aと33bとのほヾ中間かつ基板31上
に温度センサ35が形成されており、差圧センサ
33a〜33dおよび静圧センサ34a〜34d
には、ストレインゲージとして作用する半導体素
子が用いられ、温度センサ35としては、サーミ
スタとしての作用を呈する半導体素子が用いられ
ている。
FIG. 1 is an enlarged plan view of the composite sensor 27, in which a substrate 31 made of silicon or the like is used, and a diaphragm 32 is formed in the center of the substrate 31.
Differential pressure sensors 33a to 33d are formed near the boundary between the diaphragm 32 and the substrate 31 on four diagonal sides using integrated circuit technology on these insulating film surfaces, and static pressure sensors are formed near these and on the substrate 31. 34a to 34d are formed, while a temperature sensor 35 is formed on the substrate 31 and approximately between the differential pressure sensors 33a and 33b, and the temperature sensor 35 is formed on the substrate 31, and the differential pressure sensors 33a to 33d and the static pressure sensors 34a to 34d.
For the temperature sensor 35, a semiconductor element that functions as a strain gauge is used, and as the temperature sensor 35, a semiconductor element that functions as a thermistor is used.

また、差圧センサ33a〜33dと静圧センサ
34a〜34dとは、導体36によりブリツジ状
に接続され、各接続点がランド37によりリード
線と接続されるものとなつており、ダイヤフラム
32の歪に応ずる差圧センサ33a〜33dの抵
抗値変化により、ダイヤフラム32の両面間差圧
の検出する一方、静圧センサ34a〜34dの形
成面へ印加される静圧に応ずる基板31と静圧セ
ンサ34a〜34dとの圧縮率差により、静圧セ
ンサ34a〜34dの抵抗値が変化するため、こ
れによつて静圧の検出を行なうものとなつてい
る。
Further, the differential pressure sensors 33a to 33d and the static pressure sensors 34a to 34d are connected in a bridge shape by a conductor 36, and each connection point is connected to a lead wire by a land 37, so that the strain on the diaphragm 32 is reduced. The differential pressure between the two surfaces of the diaphragm 32 is detected by the resistance value change of the differential pressure sensors 33a to 33d in response to the change in the resistance value of the substrate 31 and the static pressure sensor 34a in response to the static pressure applied to the surfaces on which the static pressure sensors 34a to 34d are formed. Since the resistance values of the static pressure sensors 34a to 34d change due to the difference in compression ratio between the static pressure sensors 34a to 34d, the static pressure is detected based on this.

なお、温度センサ35は、周囲の温度に応じて
抵抗値が変化し、これによつて差圧センサ33a
〜33dを含む差圧発信器全体の温度を検出する
ものとなつている。
Note that the temperature sensor 35 has a resistance value that changes depending on the ambient temperature, which causes the differential pressure sensor 33a to
It is designed to detect the temperature of the entire differential pressure transmitter including 33d to 33d.

したがつて、第2図の透孔1a側へ高圧PH
印加すると共に、透孔1b側へ低圧PLを印加す
れば、これに応じてバリアダイヤフラム5a,5
bが変位し、この変位が封入液10a,10bを
介してセンタダイヤフラム9へ印加され、PH
PLとの差圧にしたがつてセンタダイヤフラム9
が変位し、これによつて差圧の大部分が吸収され
る一方、連通孔13a,13b、間隙22、連通
孔26を経て差圧の一部が複合センサ27のダイ
ヤフラム32へ印加され、これの歪に応じて差圧
センサ33a〜33dによりPHとPLとの差圧が
検出されると共に、複合センサ27の取付方向に
したがい、静圧センサ34a〜34dによりPH
またはPLの静圧が検出され、これらの検出状況
が第2図において破断線により示す圧力伝送器3
0を介して、電気信号として送出される。
Therefore, if high pressure P H is applied to the through hole 1a side in FIG. 2 and low pressure P L is applied to the through hole 1b side, the barrier diaphragms 5a, 5
b is displaced, this displacement is applied to the center diaphragm 9 via the filled liquids 10a and 10b, and P H and
According to the differential pressure with P L , the center diaphragm 9
is displaced, thereby absorbing most of the differential pressure, while a portion of the differential pressure is applied to the diaphragm 32 of the composite sensor 27 via the communication holes 13a, 13b, the gap 22, and the communication hole 26, and this The differential pressure between P H and P L is detected by the differential pressure sensors 33a to 33d according to the strain of
Or the static pressure of P L is detected, and these detection conditions are shown by the broken line in Figure 2 of the pressure transmitter 3.
0 as an electrical signal.

第3図は、以上の差圧発信器を示す模式図であ
り、封入液10a,10bの漏洩状況を診断する
原理を説明するため、つぎのとおりに信号を定め
る。
FIG. 3 is a schematic diagram showing the differential pressure transmitter described above, and in order to explain the principle of diagnosing the leakage situation of the sealed liquids 10a and 10b, the signals are determined as follows.

VH:内室8aおよびこれと連通する各部を含む
高圧室41の全容積 VL:内室8bおよびこれと連通する各部を含む
低圧室42の全容積 PH:印加高圧 PL:印加低圧 Ph:高圧室41内の静圧 Pl:低圧室42内 〃 ΔVH:バリアダイヤフラム5aの変位量 ΔVC:センタダイヤフラム9の変位量 ΔVL:バリアダイヤフラム5bの変位量 φH:バリアダイヤフラム5aのコンプライアン
ス φC:センタダイヤフラム9の 〃 φL:バリアダイヤフラム5bの 〃 Δv1:高圧室41の容積変化量 Δv2:低圧室42の 〃 α:封入液10a,10bの温度膨張係数 ΔT:工場出荷時の初期温度との温度差 また、前述の各記号を用いれば、第3図の構成
においては、一般的に次式が成立するものとなつ
ている。
V H : Total volume of the high pressure chamber 41 including the inner chamber 8a and parts communicating with it V L : Total volume of the low pressure chamber 42 including the inner chamber 8b and parts communicating with it P H : Applied high pressure P L : Applied low pressure P h : Static pressure in the high pressure chamber 41 P l : In the low pressure chamber 42 〃 ΔV H : Amount of displacement of the barrier diaphragm 5a ΔV C : Amount of displacement of the center diaphragm 9 ΔV L : Amount of displacement of the barrier diaphragm 5b φ H : Amount of displacement of the barrier diaphragm 5b Compliance of 5a φ C : Center diaphragm 9 〃 φ L : Barrier diaphragm 5b 〃 Δv 1 : Volume change of high pressure chamber 41 Δv 2 : Low pressure chamber 42 〃 α: Temperature expansion coefficient ΔT of sealed liquids 10a, 10b: Temperature difference from the initial temperature at the time of shipment from the factory Furthermore, using the above-mentioned symbols, the following formula generally holds true in the configuration of FIG. 3.

PH−Ph=1/φHΔVH ……(1) Pl−PL=1/φLΔVL ……(2) Ph−Pl=1/φCΔVC ……(3) Δv1=ΔVC−ΔVH+α・VH・ΔT ……(4) Δv2=ΔVL−ΔVC+α・VL・ΔT ……(5) こゝにおいて、工場出荷時に圧力伝送器30中
のメモリへ、設計値または実測値に基づくVH
VL、φH、φC、φL、α、および、このときの実測
温度T0を各々初期定数として格納しておき、差
圧発信器へ印加する圧力PH、PLをこれに通ずる
管路の開閉により各々例えばKgf/cm3の既知圧
力とし、このときにおける差圧センサ33a〜3
3bにより求めた差圧発信器としての検出々力
(Ph−Pl)と、静圧センサ34a〜34bによる
検出々力PhまたはPlと、温度センサ35による検
出々力Tとを求めれば、上式に基づき各室41,
42の容積変化量Δv1およびΔv2を算出する。こ
とができる。
P H −P h =1/φ H ΔV H …(1) P l −P L =1/φ L ΔV L …(2) P h −P l =1/φ C ΔV C …(3 ) Δv 1 = ΔV C −ΔV H +α・V H・ΔT ……(4) Δv 2 = ΔV L −ΔV C +α・V L・ΔT ……(5) Here, the pressure transmitter 30 is installed at the factory. to the internal memory, V H based on the design value or measured value,
V L , φ H , φ C , φ L , α, and the actual measured temperature T 0 at this time are each stored as initial constants, and the pressures P H and P L applied to the differential pressure transmitter are passed through these. By opening and closing the pipes, a known pressure of, for example, Kgf/cm 3 is established, and the differential pressure sensors 33a to 3 at this time are
3b, the detected force P h or P l by the static pressure sensors 34a to 34b , and the detected force T by the temperature sensor 35. For example, based on the above formula, each chamber 41,
The volume change amounts Δv 1 and Δv 2 of 42 are calculated. be able to.

すなわち、(1)〜(3)式より次式が得られる。 That is, the following equation is obtained from equations (1) to (3).

ΔVH=φH(PH−Ph) ……(6) ΔVL=φL(Pl−PL) ……(7) ΔVC=φC(Ph−Pl) ……(8) なお、PhまたはPlのいずれか一方を求めれば、
差圧発信基の検出々力 (Ph−Pl)が既知であ
り、 (Ph−Pl)=Kとしたとき、 Ph=K+Pl Pl=Ph−K ……(9) により他方を求めることができる。
ΔV HH (P H −P h )……(6) ΔV LL (P l −P L )……(7) ΔV CC (P h −P l )……(8 ) Furthermore, if you find either P h or P l , then
When the detection force (P h - P l ) of the differential pressure transmitter is known and (P h - P l ) = K, P h = K + P l P l = P h - K ……(9) The other can be found by

このため、(4)、(5)式および(6)〜(8)式から、各室
41,42の容積変化量Δv1、Δv2は次式により
与えられる。
Therefore, from equations (4), (5) and equations (6) to (8), the volume changes Δv 1 and Δv 2 of each chamber 41, 42 are given by the following equations.

Δv1=φC(Ph−Pl)−φH(PH−Pl) +α・VH・ΔT ……(10) Δv2=φL(Pl−PL)−φC(Ph−Pl) +α・VL・ΔT ……(11) たゞし、ΔT=T−T0 したがつて、メモリ中の各初期設定VH、VL
φH、φC、φL,α、T0を読み出して用いると共に、
各センサの検出々力(Ph−Pl)、PhまたはPl、お
よび、を用いる演算により、Δv1、Δv2を算出す
ることができる。
Δv 1C (P h −P l )−φ H (P H −P l ) +α・V H・ΔT ……(10) Δv 2L (P l −P L )−φ C (P h − P l ) +α・V L・ΔT ……(11) Therefore, ΔT=T−T 0 Therefore, each initial setting V H , V L ,
Read and use φ H , φ C , φ L , α, and T 0 , and
Δv 1 and Δv 2 can be calculated by calculation using the detection force (P h −P l ) of each sensor, P h or P l , and .

このΔv1、Δv2は、各室41,42中の封入液
10a,10bの体積変化量を示し、各々の減少
が外部へのまたは他方の室側への漏洩を意味する
ものとなり、これらの変化状況よりつぎの判断を
行なうことができる。
These Δv 1 and Δv 2 indicate the amount of change in volume of the sealed liquids 10a and 10b in each chamber 41 and 42, and each decrease means leakage to the outside or to the other chamber side, and these decreases mean leakage to the outside or to the other chamber side. The following judgment can be made based on the changing situation.

(A) Δv1<0、Δv2=0 高圧室41の外部に対する漏洩発生 (B) Δv1=0、Δv2<0 低圧室42の外部に対する漏洩発生 (C) Δv1<0、Δv2<0 各室41,42の外部に対する漏洩発生 (D) Δv1+Δv2=0 各室41,42間の漏洩発生 すなわち、(A)〜(C)のとおり、少くともいずれか
一方の容積減少により、外部に対する漏洩発生と
判断できるのに対し、(D)のとおり、各室41,4
2の容積変化量の和を求め、この値がほゞ零であ
れば、各室41,42相互間の漏洩発生と判断す
ることができる。
(A) Δv 1 <0, Δv 2 =0 Occurrence of leakage to the outside of the high pressure chamber 41 (B) Δv 1 =0, Δv 2 <0 Occurrence of leakage to the outside of the low pressure chamber 42 (C) Δv 1 <0, Δv 2 <0 Occurrence of leakage to the outside of each chamber 41, 42 (D) Δv 1 + Δv 2 = 0 Occurrence of leakage between each chamber 41, 42 In other words, as shown in (A) to (C), the volume of at least one of them decreases As shown in (D), it can be determined that a leak has occurred to the outside.
If the sum of the two volume changes is found and this value is approximately zero, it can be determined that leakage has occurred between the chambers 41 and 42.

また、単に容積の変化を生じたことのみによつ
ても、いずれかに漏洩を生じたものと判断するこ
とができる。
In addition, it can be determined that leakage has occurred in one of the parts simply by the fact that a change in volume has occurred.

第4図は、以上の原理に基づく回路構成例のブ
ロツク図であり、第2図の差圧発信器(以下、
DPT)51と連結された圧力伝送器(以下、
PTR)30においては、第1図の差圧センサ
(以下、DPS)33、静圧センサ(以下、SPS)
34、および、温度センサ(以下、TS)35の
各抵抗値変化を検出する検出回路(以下、DET)
52からの各検出々力を、マルチプレクサ(以
下、MPX)53により順次にかつ反復して選択
し、アナログ・デイジタル変換器(以下、ADC)
54によりデイジタル信号としてからマイクロプ
ロセツサ等のプロセツサ(以下、CPU)55を
与え、こゝにおいて、常時はDPS33の検出々
力を所定の演算により差圧計測値へ変換し、デイ
ジタル・アナログ変換器(以下、DAC)56お
よび駆動回路(以下、DR)57を介し、トラジ
ンスタ(以下、TR)Q1へ計測値と対応する順方
向バイアスとして与え、TR・Q1のコレクタ・エ
ミツタ間抵抗値を制御し、線路L1,L2からなる
2線式伝送路へ抵抗器Rを介して印加されている
電源Eに基づき、例えば4〜20mAの統一信号に
よる電流を通じ、これの電流値により計測値の送
出を行なうものとなつており、この電流値は、抵
抗器Rの端子電圧として検出され、これが計測信
号Snとして制御装置等へ与えられる。
FIG. 4 is a block diagram of an example of a circuit configuration based on the above principle, and shows the differential pressure transmitter (hereinafter referred to as
DPT) 51 and a pressure transmitter (hereinafter referred to as
PTR) 30, the differential pressure sensor (hereinafter referred to as DPS) 33 and the static pressure sensor (hereinafter referred to as SPS) in Fig. 1 are used.
34, and a detection circuit (hereinafter referred to as TS) that detects each resistance value change of temperature sensor (hereinafter referred to as TS) 35 (hereinafter referred to as DET).
Each detection power from 52 is sequentially and repeatedly selected by a multiplexer (hereinafter referred to as MPX) 53, and then connected to an analog-to-digital converter (hereinafter referred to as ADC).
54 converts the signal into a digital signal and supplies it to a processor (hereinafter referred to as CPU) 55 such as a microprocessor, which normally converts the detected force of the DPS 33 into a differential pressure measurement value by a predetermined calculation and converts it into a digital-to-analog converter. (hereinafter referred to as DAC) 56 and drive circuit (hereinafter referred to as DR) 57, a forward bias corresponding to the measured value is applied to transistor (hereinafter referred to as TR) Q 1 , and the collector-emitter resistance value of TR Q 1 is determined. Based on the power supply E applied to the two-wire transmission line consisting of lines L 1 and L 2 via the resistor R, a current is passed through a unified signal of, for example, 4 to 20 mA, and the measured value is determined based on the current value. This current value is detected as the terminal voltage of the resistor R, and this is given to the control device etc. as a measurement signal S n .

また、線路L1,L2間の電圧変化は、比較器
(以下、CP)58において基準電圧ES1と比較の
うえ検出され、ADC59を介してCPU55へ与
えられ、これを受信々号としてCPU55が解読
し、これの内容に応動するものとなつている。
Further, the voltage change between the lines L 1 and L 2 is detected by a comparator (hereinafter referred to as CP) 58 after comparing it with the reference voltage E S1 , and is given to the CPU 55 via the ADC 59, and this is used as a received signal to the CPU 55. is to be deciphered and to respond to the contents.

なお、CPU55は、固定メモリ(以下、
ROM)59中の命令を実行し、必要とするデー
タを可変メモリ(以下、RAM)60へアクセス
しながら所定の演算および制御を行なうものとな
つており、不揮発性メモリ(以下、NVM)61
には、工場出荷時において上述の各初期定数が格
納されるものとなつている。
Note that the CPU 55 has fixed memory (hereinafter referred to as
It executes the instructions in the non-volatile memory (hereinafter referred to as NVM) 61 while accessing the necessary data to variable memory (hereinafter referred to as RAM) 60.
Each of the above-mentioned initial constants is stored in the initial constants at the time of shipment from the factory.

一方、リード線l1,l2により、線路L1,L2へ橋
絡接続される携帯試験器(以下、PST)70は、
線路L1,L2間の電圧変化に基づく信号送受信が
自在となつており、キーボード(以下、KB)7
1の操作に応じてCPU55と同様のCPU72が
応動し、DAC73およびDR74を介してTR・
Q2を制御し、TR・Q1に通ずる電流以外の電流を
電源Eから通じさせ、これをコード化されたパル
ス状として行なうことにより、線間電圧をパルス
状に変化させ、PTR30に対する送信を行なう
と共に、TR・Q1の制御による電流値変化に応ず
る線間電圧をCP75において基準電圧ES2との比
較により検出し、ADC76を介してCPU72に
より解読し、表示器(以下、DP)77により表
示を行なうものとなつている。
On the other hand, the portable tester (hereinafter referred to as PST) 70 is bridge-connected to the lines L 1 and L 2 by lead wires l 1 and l 2 .
It is possible to freely transmit and receive signals based on voltage changes between lines L 1 and L 2 , and keyboard (hereinafter referred to as KB) 7
The CPU 72, which is similar to the CPU 55, responds to the operation of 1, and transmits TR/TR via the DAC 73 and DR 74.
By controlling Q 2 and passing a current other than the current flowing through TR/Q 1 from the power source E as a coded pulse, the line voltage is changed in a pulse, and the transmission to PTR 30 is changed. At the same time, the line voltage corresponding to the current value change controlled by TR Q 1 is detected by comparison with the reference voltage E S2 in the CP75, decoded by the CPU 72 via the ADC 76, and displayed by the display (hereinafter referred to as DP) 77. It is designed to display information.

なお、CPU72も、ROM78中の命令の実行
し、RAM79に対する必要なデータのアクセス
により演算および制御を行なうものとなつてい
る。
Note that the CPU 72 also performs calculations and control by executing instructions in the ROM 78 and accessing necessary data from the RAM 79.

したがつて、PST70により、PTR30の計
測値をチエツクできると共に、PTR30に対し
各種の指令を送信し、かつ、これに応ずる応答送
信を受信できるものとなつており、KB71によ
り漏洩チエツクの指令を行なえば、これがPTR
30のCPU55により受信され、これに応じて
CPU55がNVM61中の各初期定数をパルスコ
ードの電流変化により送信すると共に、DPS3
3,SPS34,TS35の各検出々力をDET52
およびMPX53を介して順次に取入れ、これら
に基づく各検出値を同様に送信するため、これら
がCPU72において受信されるものとなり、こ
れらを用いてCPU72が上述の(10)、(11)式によ
る演算を実行し、かつ、この結果に応じて上述の
(A)〜(D)に示す判断を行ない、これによる診断状況
をDP77により表示する。
Therefore, the PST 70 can check the measured values of the PTR 30, send various commands to the PTR 30, and receive response transmissions in response to these commands, and the KB 71 can issue leak check commands. If so, this is the PTR
received by CPU 55 of 30, and in response
The CPU 55 transmits each initial constant in the NVM 61 by changing the current of the pulse code, and the DPS 3
3. DET52 each detection force of SPS34 and TS35
and MPX53, and each detected value based on these is transmitted in the same way, so these are received by the CPU 72, and the CPU 72 uses them to perform calculations according to equations (10) and (11) above. and, depending on this result, the above
The judgments shown in (A) to (D) are made, and the diagnostic status based on the judgment is displayed on the DP 77.

第5図はPTS70の外形を示し、(A)は正面図、
(B)は側面図であり、手持形の外筐81へ全回路お
よび電源を収容し、正面に複数の押ボタンキー8
2からなるKB71を設けると共に、これの上方
へ液晶表示素子等のDP77を装着しており、先
端ヘクリツプ83a,83bを接続したリード線
l1,l2からなるコード84を導出し、これにより、
線路L1,L2の端子板等に対する接続を自在とし
ている。
Figure 5 shows the external shape of PTS70, (A) is a front view,
(B) is a side view, in which all the circuits and power supply are housed in a hand-held outer case 81, and a plurality of pushbutton keys 8 are provided on the front.
A KB71 consisting of 2 parts is provided, and a DP77 such as a liquid crystal display element is attached above this, and lead wires connected to tip helicips 83a and 83b are provided.
A code 84 consisting of l 1 and l 2 is derived, and from this,
The lines L 1 and L 2 can be freely connected to terminal boards, etc.

したがつて、クリツプ83a,83bを用いて
前述の接続を行なつたうえ、「LEAK CHECK」
キー82を押下すれば、内部のCPU72による
送受信および演算により上述の判断がなされ、
DP77において例えば「LP LEAK」の表示が
なされ、低圧室42の外部に対する漏洩であるこ
とが直ちに示されるため、特別な測定器の準備お
よびDPT51の分解等を行なうことなく、容易
にかつ正確にDPT51の異常を診断するとがで
きる。
Therefore, after making the above connection using the clips 83a and 83b, "LEAK CHECK"
When the key 82 is pressed, the above-mentioned judgment is made through transmission/reception and calculation by the internal CPU 72.
For example, "LP LEAK" is displayed on the DP 77, which immediately indicates that there is a leak to the outside of the low pressure chamber 42. Therefore, the DPT 51 can be easily and accurately detected without preparing a special measuring device or disassembling the DPT 51. It is possible to diagnose abnormalities in

たゞし、NVW61は、DPT51に付帯するも
のであればよく、長期的に内容を保持できる他の
メモリ素子を用いても同様であり、上述の演算お
よび判断をPTR30のCPU55において行ない、
または、制御装置等のCPUにより行ない、別途
の表示器により診断結果の表示を行なつてもよ
く、SPS34およびTS35の配設状況は、第1
図に示すほか、条件に応じて選定すればよい等、
種々の変形が自在である。
However, the NVW 61 only needs to be attached to the DPT 51, and it is also possible to use other memory elements that can retain the contents for a long time.The above-mentioned calculations and judgments are performed in the CPU 55 of the PTR 30,
Alternatively, it may be performed by a CPU such as a control device, and the diagnosis results may be displayed on a separate display.
In addition to what is shown in the figure, you can select according to the conditions, etc.
Various modifications are possible.

〔発明の効果〕〔Effect of the invention〕

以上の説明により明らかなとおり本発明によれ
ば、容易にかつ正確に差圧発信器等の封入液漏洩
状況を診断できるため、同等の構成を有する各種
圧力発信器の異常診断において顕著な効果が得ら
れる。
As is clear from the above explanation, according to the present invention, it is possible to easily and accurately diagnose the leakage situation of the sealed liquid in differential pressure transmitters, etc., and therefore it has a remarkable effect in diagnosing abnormalities in various pressure transmitters having the same configuration. can get.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明の実施例を示し、第1図は複合セン
サの平面図、第2図は差圧発信器の断面図、第3
図は差圧発信器の模式図、第4図は回路構成のブ
ロツク図、第5図は携帯試験器の外形図である。 5a,5b……バリアダイヤフラム、7a,7
b,13a,13b,26……連通孔、8a,8
b……内室、9……センタダイヤフラム、10
a,10b……封入液、27……複合センサ、3
0……圧力伝送器、31……基板、32……ダイ
ヤフラム、33,33a〜33d……DPS(差圧
センサ)、34,34a〜34d……SPS(静圧セ
ンサ)、35……TS(温度センサ)、41……高圧
室、42……低圧室、51……DPT(差圧発信
器)、55,72……CPU(プロセツサ)、59,
78……ROM(固定メモリ)、60,79……
RAM(可変メモリ)、61……NVM(不揮発性メ
モリ)、58,75……CP(比較器)、71……
KB(キーボード)、77……DP(表示器)、Q1
Q2……TR(トランジスタ)、L1,L2……線路、
l1,l2……リード線、E……電源。
The figures show embodiments of the present invention, in which Figure 1 is a plan view of a composite sensor, Figure 2 is a sectional view of a differential pressure transmitter, and Figure 3 is a cross-sectional view of a differential pressure transmitter.
The figure is a schematic diagram of the differential pressure transmitter, FIG. 4 is a block diagram of the circuit configuration, and FIG. 5 is an outline diagram of the portable tester. 5a, 5b... Barrier diaphragm, 7a, 7
b, 13a, 13b, 26...Communication hole, 8a, 8
b...Inner chamber, 9...Center diaphragm, 10
a, 10b...Filled liquid, 27...Composite sensor, 3
0... Pressure transmitter, 31... Board, 32... Diaphragm, 33, 33a to 33d... DPS (differential pressure sensor), 34, 34a to 34d... SPS (static pressure sensor), 35... TS ( temperature sensor), 41...high pressure chamber, 42...low pressure chamber, 51...DPT (differential pressure transmitter), 55, 72...CPU (processor), 59,
78...ROM (fixed memory), 60, 79...
RAM (variable memory), 61...NVM (non-volatile memory), 58, 75...CP (comparator), 71...
KB (keyboard), 77...DP (display), Q 1 ,
Q 2 ...TR (transistor), L 1 , L 2 ... line,
l 1 , l 2 ... Lead wire, E ... Power supply.

Claims (1)

【特許請求の範囲】[Claims] 1 封入液の封入された高圧室および低圧室を備
えかつ前記各室間にセンタダイヤフラムを備えた
圧力発信器の前記各室毎の容積変化量を算出する
のに必要とする初期定数をメモリへ格納し、前記
各室中の少くとも一方の静圧を検出する静圧セン
サおよび前記圧力発信器の温度を検出する温度セ
ンサを設け、前記圧力発信器へ既知圧力を印加
し、このときにおける前記圧力発信器の検出々力
と前記静圧センサの検出々力と前記温度センサの
検出々力と前記メモリの初期定数とを用いて前記
各室の容積変化量を算出し、該各室の容積変化量
に応じて前記封入液の漏洩有無を判断することを
特徴とした圧力発信器の異常診断方法。
1 Store in memory the initial constants required to calculate the volume change for each chamber of a pressure transmitter that is equipped with a high-pressure chamber and a low-pressure chamber filled with liquid and a center diaphragm between the chambers. a static pressure sensor for detecting the static pressure in at least one of the chambers and a temperature sensor for detecting the temperature of the pressure transmitter; applying a known pressure to the pressure transmitter; The amount of change in volume of each chamber is calculated using the detection force of the pressure transmitter, the detection force of the static pressure sensor, the detection force of the temperature sensor, and the initial constant of the memory, and the volume of each chamber is calculated. A method for diagnosing an abnormality in a pressure transmitter, comprising determining whether or not the sealed liquid has leaked according to the amount of change.
JP14973486A 1986-06-27 1986-06-27 Abnormality diagnosing method for pressure transmitter Granted JPS636431A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14973486A JPS636431A (en) 1986-06-27 1986-06-27 Abnormality diagnosing method for pressure transmitter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14973486A JPS636431A (en) 1986-06-27 1986-06-27 Abnormality diagnosing method for pressure transmitter

Publications (2)

Publication Number Publication Date
JPS636431A JPS636431A (en) 1988-01-12
JPH0371652B2 true JPH0371652B2 (en) 1991-11-14

Family

ID=15481644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14973486A Granted JPS636431A (en) 1986-06-27 1986-06-27 Abnormality diagnosing method for pressure transmitter

Country Status (1)

Country Link
JP (1) JPS636431A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3384457B2 (en) * 1993-04-01 2003-03-10 横河電機株式会社 Differential pressure measuring device
AU4110596A (en) * 1994-11-30 1996-06-19 Rosemount Inc. Pressure transmitter with fill fluid loss detection
US11243134B2 (en) * 2019-09-30 2022-02-08 Rosemount Inc. Pressure sensing device isolation cavity seal monitoring

Also Published As

Publication number Publication date
JPS636431A (en) 1988-01-12

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