JPH0371797B2 - - Google Patents
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- Publication number
- JPH0371797B2 JPH0371797B2 JP57099619A JP9961982A JPH0371797B2 JP H0371797 B2 JPH0371797 B2 JP H0371797B2 JP 57099619 A JP57099619 A JP 57099619A JP 9961982 A JP9961982 A JP 9961982A JP H0371797 B2 JPH0371797 B2 JP H0371797B2
- Authority
- JP
- Japan
- Prior art keywords
- quantum well
- carrier confinement
- layer
- layers
- well layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2203—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure with a transverse junction stripe [TJS] structure
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Description
本発明は、量子井戸型半導体レーザの改良に関
する。
The present invention relates to improvements in quantum well semiconductor lasers.
量子井戸型半導体レーザは、活性層として作用
する量子井戸層がキヤリア閉込め層で挾まれ、キ
ヤリアを、キヤリア閉込め層を通つて量子井戸層
に注入させることによつて、量子井戸層内で光が
発生し乃至その光が増幅され、これに基ずきレー
ザ発振が得られる、という構成を有するのを普通
とする。
このような量子井戸型半導体レーザは、他の型
の半導体レーザに比し、低い閾値電流で動作させ
ることができ、また、レーザ発振波長を容易に制
御することができるなどの特徴を有する。
しかしながら、従来の量子井戸型半導体レーザ
においては、キヤリアがキヤリア閉込め層を通つ
て量子井戸層に入る過程で、量子井戸層及びキヤ
リア閉込め層間のエネルギバンドギヤツプの差の
ために、量子井戸層の、光が発生する乃至その光
を増幅する領域で、フオノンが放出されるのを余
儀なくされる構成を有しているのを普通としてい
た。
このため、従来の量子井戸型半導体レーザの場
合、電子準位間のエネルギに対応する波長を有す
る光の外に、上述したフオノンと、キヤリアと、
光との相互作用によつて、フオノン介在遷移のエ
ネルギに対応する波長を有する光が発生し、レー
ザ発振が、きれいなスペクトルで、安定に得られ
ないとともに、良好な電流−光出力特性を呈しな
い、などの欠点を有していた。
また、従来の量子井戸型半導体レーザにおいて
は、量子井戸層の各部に均一的にキヤリアを注
入・蓄積させることができないというのを余儀な
くされる構成を有しているのを普通としていた。
このため、従来の量子井戸型半導体レーザの場
合、レーザ発振の発振効率が悪いとともに、レー
ザ発振の閾値電流値が高い、という欠点などを有
していた。
よつて、本発明は、上述した欠点のない、新規
な量子井戸型半導体レーザを提案せんとするもの
である。
In a quantum well type semiconductor laser, a quantum well layer that acts as an active layer is sandwiched between carrier confinement layers, and carriers are injected into the quantum well layer through the carrier confinement layer. It is common to have a configuration in which light is generated, the light is amplified, and based on this, laser oscillation is obtained. Such a quantum well type semiconductor laser has features such as being able to operate with a lower threshold current and being able to easily control the laser oscillation wavelength compared to other types of semiconductor lasers. However, in conventional quantum well type semiconductor lasers, in the process of carriers passing through the carrier confinement layer and entering the quantum well layer, due to the difference in energy band gap between the quantum well layer and the carrier confinement layer, quantum It has been common practice to have a structure in which phonons are forced to be emitted in the region of the well layer where light is generated or where the light is amplified. Therefore, in the case of a conventional quantum well semiconductor laser, in addition to light having a wavelength corresponding to the energy between electronic levels, the above-mentioned phonons and carriers are
Interaction with light generates light with a wavelength corresponding to the energy of the phonon-mediated transition, making it difficult to stably obtain laser oscillation with a clean spectrum and not exhibiting good current-light output characteristics. It had drawbacks such as. Furthermore, conventional quantum well type semiconductor lasers typically have a configuration that makes it impossible to uniformly inject and accumulate carriers in each part of the quantum well layer. For this reason, conventional quantum well type semiconductor lasers have disadvantages such as poor laser oscillation efficiency and high threshold current value for laser oscillation. Therefore, the present invention aims to propose a novel quantum well type semiconductor laser that does not have the above-mentioned drawbacks.
図は本発明による量子井戸型半導体レーザの実
施例を示し、2つの量子井戸層部a1及びa2が
互に連接して並置している、複数M個の量子井戸
層A1〜AMと、2つのキヤリア閉込め層部b1及
びb2が互に連接して並置している、複数(M+
1)個のキヤリア閉込め層B1〜BM+1とを有する。
この場合、量子井戸層A1〜AMは、キヤリア閉
込め層B1〜BM+1に比し、小さいエネルギバンド
ギヤツプを有し、例えばGaAsでなる。また、キ
ヤリア閉込め層B1〜BM+1は、Al1-XGaXAs(但し
0<X<1)でなる。
また、量子井戸層A1〜AMは、例えば100Åオ
ーダの厚さを有する。
さらに、量子井戸層A1〜AMの量子井戸層部a
1、及びキヤリア閉込め層B1〜BM+1のキヤリア
閉込め層部b1は、p+型を有する。また、量子
井戸層A1〜AMの量子井戸層部a2はn型を有
し、またキヤリア閉込め層B1〜BM+1のキヤリア
閉込め層部b2は量子井戸層A1〜AMの量子井戸
層部a2に比し高い不純物濃度を有することによ
つてn+型を有する。
上述した量子井戸層A1〜AM、及びキヤリア閉
込め層B1〜BM+1は、キヤリア閉込め層Bi及び
Bi+1(但し、i=1、2、………M)を、それぞ
れ量子井戸層Aiの相対向する主面上に配し、且つ
キヤリア閉込め層Bi及びBi+1のキヤリア閉込め層
部b1を、量子井戸層Aの量子井戸層部a1に、
キヤリア閉込め層Bi及びBi+1のキヤリア閉込め層
b2とを、量子井戸層Aiの量子井戸層部a2に連
接されている状態で、積層されている。
実際上、このような構成は、キヤリア閉込め層
B1〜BM+1のキヤリア閉込め層部b2となる複数
(M+1)個の第1の半導体層と、量子井戸層A1
〜AMの量子井戸層部a2となる複数M個の第2
の半導体層とを、例えば分子線エピタキシヤル結
晶成長法によつて、交互順次に積層して形成し、
次にその積層体内に、その積層方向の一方側か
ら、選択的に、例えば硫黄、錫等のp型不純物を
拡散することによつて製造することができる。
また、キヤリア閉込め層B1のキヤリア閉込め
層部b2に、電極E1がオーミツクに連結され、
また、キヤリア閉込め層BM+1のキヤリア閉込め
層部b1に、電極E2がオーミツクに連結されて
いる。
以上が、本発明による量子井戸型半導体レーザ
の実施例の構成である。
このような構成を有する本発明による量子井戸
型半導体レーザによれば、電極E1及びE2間
に、直流電源を、電極E2側を正としている極性
で接続すれば、電子が、電極E1からキヤリア閉
込め層Biのキヤリア閉込め層部b2内を通つて、
量子井戸層Aiの量子井戸層部a2内に入り、次で
量子井戸層Aiの量子井戸層部a1及びa2間の接
合(この場合、pn接合)Jiを通つて、量子井戸層
Aiの量子井戸層部a1に入る。
従つて、電子が量子井戸層A1〜AMの量子井戸
層部a1に入る。
一方、正孔が、電極E2からキヤリア閉込め層
Bi+1のキヤリア閉込め層部b1内を通つて、量子
井戸層Aiの量子井戸層部a1に入る。
従つて、正孔が量子井戸層A1〜AMの量子井戸
層部a1に入る。
このため、量子井戸層Aiの量子井戸層部a1内
で、電子と正孔が再結合し、光が発生し乃至その
光が増幅される。なお、この場合の光の発生乃至
その光の増幅は、主として、量子井戸層Aiの量子
井戸層部a1内の、接合Jiの近傍領域で生ずる。
従つて、少くとも量子井戸層A1〜AMの相対向
する端面(紙面と平行な面)をフアブリペローの
反射面にしておくことによつて、レーザ発振を得
ることができ、そのレーザ発振光を、量子井戸層
Aiの相対向する端面の一方から、外部に出射させ
ることができる。
よつて、上述した本発明による量子井戸型半導
体レーザによれば、半導体レーザとしての機能が
得られる。
ところで、本発明による量子井戸型半導体レー
ザにおいては、上述したように、電子が、キヤリ
ア閉込め層B1〜BM+1のキヤリア閉込め層部b2
から、それぞれ量子井戸層A1〜AMの量子井戸層
部a2に入り、次で、量子井戸層A1〜AMの量子
井戸層部a1に入る機構で、上述した半導体レー
ザとしての機能が得られるが、キヤリア閉込め層
部b2及び量子井戸層部a2間にエネルギバンド
ギヤツプの差があるため、電子が、キヤリア閉込
め層B1〜BM+1のキヤリア閉込め層部b2から、
それぞれ量子井戸層A1〜AMの量子井戸層部a2
に入る過程で、量子井戸層部a2において、フオ
ノンの放出を伴なう。
しかしながら、電子が、量子井戸層A1〜AMの
量子井戸層部a2から、量子井戸層部a1に接合
J1〜JMを通つて入る過程では、量子井戸層部a1
及びa2間にエネルギバンドギヤツプの差がない
ため、フオノンの放出を実質的に伴なわない。従
つて、光の発生乃至その光を増幅する、量子井戸
層A1〜AMの量子井戸層部a1の、接合J1〜JMの
近傍領域において、実質的に、フオノンの放出を
伴なわない。
従つて、本発明による量子井戸型半導体レーザ
によれば、フオノンとキヤリアと、光との相互作
用によつて、フオノン介在遷移のエネルギに対応
する波長を有する光が発生する、ということが実
質的になく、電子準位間のエネルギに対応する波
長を有する光のみが実質的に発生する。
よつて、上述した本発明による量子井戸型半導
体レーザによれば、レーザ発振光が、きれいなス
ペクトルで、安定に得られるとともに、良好な電
流−光出力特性を呈する。
また、量子井戸層がA1〜AMと複数M個有し、
また、キヤリア閉込め層B1〜BM+1と複数の(M
+1)個有し、そして、量子井戸層A1〜AMの量
子井戸層部a1とキヤリア閉込め層B1〜BM+1の
キヤリア閉込め層部b1とが、交互順次に積層さ
れて電極E2に連結され、また、量子井戸層A1
〜AMの量子井戸層部a2とキヤリア閉込め層B1
〜BM+1のキヤリア閉込め層部b2とが、同様に
交互順次に積層されて電極E1に連結され、しか
も、この場合、キヤリア閉込め層B1〜BM+1のキ
ヤリア閉込め層部b2が量子井戸層A1〜AMの量
子井戸層部b2に比し高いn型不純物濃度を有す
るので、キヤリア閉込め層Biのキヤリア閉込め
層部b2と量子井戸層Aiの量子井戸層部a2との
間の障壁高さが、キヤリア閉込め層B1〜BM+1の
キヤリア閉込め層部b2が量子井戸層A1〜AMの
量子井戸層部a2と同じn型不純物濃度を有する
場合に比し低く、従つて、量子井戸層A1〜AMの
量子井戸層部a2に、電子が、互にほぼ等しい量
で、キヤリア閉込め層B1〜BM+1のキヤリア閉込
め層部b2が量子井戸層A1〜AMの量子井戸層部
a2と同じn型不純物濃度を有する場合に比し多
量に注入され、また、キヤリア閉込め層Biのキ
ヤリア閉込め層部b1及びb2間のビルトイン電
圧と量子井戸層Aiの量子井戸層部a1及びa2間
のビルトイン電圧(キヤリア閉込め層Biのキヤリ
ア閉込め層部b1及びb2間のビルトイン電圧に
比し低い)との差が、キヤリア閉込め層B1〜
BM+1のキヤリア閉込め層部b2が量子井戸層A1
〜AMの量子井戸層部a2と同じn型不純物濃度
を有する場合に比し大きく、従つて、この分、キ
ヤリア閉込め層Biのキヤリア閉込め層部b2から
キヤリア閉込め層部b1への電子の漏れ量が、キ
ヤリア閉込め層B1〜BM+1のキヤリア閉込め層部
b2が量子井戸層A1〜AMの量子井戸層部a2と
同じn型不純物濃度を有する場合に比し小さい。
このため、上述した本発明による量子井戸型半
導体レーザによれば、上述したレーザ発振が、従
来の量子井戸型半導体レーザに比し高い発振効率
で得られ、また、レーザ発振の閾値電流値を、従
来の量子井戸型半導体レーザ、及びキヤリア閉込
め層B1〜BM+1のキヤリア閉込め層部b2が量子
井戸層A1〜AMの量子井戸層部a2と同じn型不
純物濃度を有する場合に比し低くすることができ
る、などの大なる特徴を有する。
なお、上述においては、本発明の一例を示した
に留まり、電極E1及びE2を、それぞれ電極付
用層を介してキヤリア閉込め層B1のキヤリア閉
込め層部b2及びキヤリア閉込め層BM+1のキヤ
リア閉込め層部b1に連結した構成とすることも
でき、さらには、電極E1及びE2を、それぞれ
キヤリア閉込め層B1のキヤリア閉込め層部b1
及びキヤリア閉込め層BM+1のキヤリア閉込め層
部b2に連結した構成とすることもでき、その
他、本発明の精神を脱することなしに、種々の変
型、変更をなし得るであろう。
The figure shows an embodiment of a quantum well type semiconductor laser according to the present invention, in which a plurality of M quantum well layers A 1 to A M in which two quantum well layer parts a1 and a2 are arranged in parallel with each other, A plurality (M+
1) carrier confinement layers B 1 to B M+1 . In this case, the quantum well layers A 1 to A M have a smaller energy band gap than the carrier confinement layers B 1 to B M+1 , and are made of, for example, GaAs. Further, the carrier confinement layers B 1 to B M+1 are made of Al 1-X Ga X As (0<X<1). Further, the quantum well layers A 1 to A M have a thickness on the order of 100 Å, for example. Furthermore, quantum well layer portion a of quantum well layers A 1 to A M
1, and the carrier confinement layer portions b1 of the carrier confinement layers B 1 to B M+1 have a p + type. Further, the quantum well layer portions a2 of the quantum well layers A 1 to A M have n-type, and the carrier confinement layer portions b2 of the carrier confinement layers B 1 to B M+1 have the quantum well layers A 1 to A Since it has a higher impurity concentration than the quantum well layer a2 of M , it has n + type. The quantum well layers A 1 to A M and the carrier confinement layers B 1 to B M+1 described above are the carrier confinement layers B i and
B i+1 (where i=1, 2, ......M) are respectively arranged on the opposing main surfaces of the quantum well layer A i , and the carrier confinement layers B i and B i+1 are carrier confinement layer part b1 to quantum well layer part a1 of quantum well layer A,
The carrier confinement layers B i and the carrier confinement layer b2 of B i+1 are laminated in a state in which they are connected to the quantum well layer portion a2 of the quantum well layer A i . In practice, such a configuration requires a carrier confinement layer.
A plurality of ( M+1 ) first semiconductor layers serving as the carrier confinement layer portion b2 of B 1 to B M+1 and a quantum well layer A 1
A plurality of M second quantum well layer portions a2 of ~A M
and semiconductor layers are alternately stacked one after another by, for example, molecular beam epitaxial crystal growth,
Next, it can be manufactured by selectively diffusing p-type impurities, such as sulfur or tin, into the laminate from one side in the stacking direction. Further, the electrode E1 is ohmicly connected to the carrier confinement layer portion b2 of the carrier confinement layer B1 ,
Further, an electrode E2 is ohmicly connected to the carrier confinement layer portion b1 of the carrier confinement layer B M+1 . The above is the configuration of the embodiment of the quantum well type semiconductor laser according to the present invention. According to the quantum well type semiconductor laser according to the present invention having such a configuration, if a DC power source is connected between the electrodes E1 and E2 with the polarity of the electrode E2 being positive, electrons can be transferred from the electrode E1 to a carrier closed state. Passing through the carrier confinement layer part b2 of the confinement layer B i ,
It enters the quantum well layer part a2 of the quantum well layer A i , and then passes through the junction (pn junction in this case) J i between the quantum well layer parts a1 and a2 of the quantum well layer A i.
It enters the quantum well layer a1 of A i . Therefore, electrons enter the quantum well layer portion a1 of the quantum well layers A 1 to A M. On the other hand, holes are transferred from the electrode E2 to the carrier confinement layer.
It passes through the carrier confinement layer b1 of B i+1 and enters the quantum well layer a1 of the quantum well layer A i . Therefore, holes enter quantum well layer portion a1 of quantum well layers A 1 to A M. Therefore, electrons and holes are recombined within the quantum well layer portion a1 of the quantum well layer Ai , and light is generated and the light is amplified. Note that in this case, the generation of light and the amplification of the light mainly occur in a region near the junction J i in the quantum well layer portion a1 of the quantum well layer A i . Therefore, laser oscillation can be obtained by making at least the opposing end surfaces (planes parallel to the plane of the paper) of the quantum well layers A 1 to A M as Fabry-Perot reflecting surfaces, and the laser oscillation light , quantum well layer
The light can be emitted to the outside from one of the opposing end faces of A i . Therefore, the quantum well type semiconductor laser according to the present invention described above can function as a semiconductor laser. By the way, in the quantum well type semiconductor laser according to the present invention, as described above, electrons enter the carrier confinement layer portion b2 of the carrier confinement layers B 1 to B M+1.
, enters the quantum well layer portion a2 of the quantum well layers A 1 to A M , respectively, and then enters the quantum well layer portion a1 of the quantum well layers A 1 to A M , and the function as the semiconductor laser described above is achieved. However, since there is a difference in energy band gap between the carrier confinement layer part b2 and the quantum well layer part a2, the electrons are transferred to the carrier confinement layer part b2 of the carrier confinement layers B 1 to B M+1. from,
Quantum well layer portions a2 of quantum well layers A 1 to A M , respectively.
In the process of entering the quantum well layer a2, phonons are emitted. However, electrons are bonded from quantum well layer portion a2 of quantum well layers A 1 to A M to quantum well layer portion a1.
In the process of entering through J 1 to J M , the quantum well layer part a1
Since there is no difference in energy band gap between and a2, phonon emission is not substantially accompanied. Therefore, in the region near the junctions J 1 to J M of the quantum well layer portions a1 of the quantum well layers A 1 to A M , which generate light or amplify the light, phonon emission is substantially not accompanied. do not have. Therefore, according to the quantum well semiconductor laser according to the present invention, it is substantially possible to generate light having a wavelength corresponding to the energy of the phonon-mediated transition through the interaction of phonons, carriers, and light. Instead, substantially only light having a wavelength corresponding to the energy between the electronic levels is generated. Therefore, according to the above-described quantum well type semiconductor laser according to the present invention, laser oscillation light can be stably obtained with a clean spectrum, and exhibits good current-light output characteristics. In addition, there are a plurality of M quantum well layers A 1 to A M ,
In addition, carrier confinement layers B 1 to B M+1 and multiple (M
+1) The quantum well layer portions a1 of the quantum well layers A 1 to A M and the carrier confinement layer portions b1 of the carrier confinement layers B 1 to B M+1 are laminated in alternating order. connected to the electrode E2, and also has a quantum well layer A 1
~A M quantum well layer a2 and carrier confinement layer B 1
〜B M+1 carrier confinement layer portion b2 are similarly stacked alternately and connected to the electrode E1, and in this case, the carrier confinement layer portion b2 of 〜B M+1 Since the part b2 has a higher n-type impurity concentration than the quantum well layer part b2 of the quantum well layers A 1 to A M , the carrier confinement layer part b2 of the carrier confinement layer B i and the quantum well of the quantum well layer A i The carrier confinement layer part b2 of the carrier confinement layers B 1 to B M+1 has the same barrier height with the well layer part a2 as the quantum well layer part a2 of the quantum well layers A 1 to A M The impurity concentration is lower than that when the impurity concentration is present, and therefore, the quantum well layer portions a2 of the quantum well layers A 1 to A M have substantially equal amounts of electrons, and the carrier confinement layers B 1 to B M+1 A larger amount of carrier confinement layer b2 is implanted than in the case where the n-type impurity concentration is the same as that of quantum well layer a2 of quantum well layers A 1 to A M. The built-in voltage between the confinement layer parts b1 and b2 and the built-in voltage between the quantum well layer parts a1 and a2 of the quantum well layer A i (compared to the built-in voltage between the carrier confinement layer parts b1 and b2 of the carrier confinement layer B i carrier confinement layer B 1 ~
The carrier confinement layer part b2 of B M+1 is the quantum well layer A 1
It is larger than the case where the n-type impurity concentration is the same as the quantum well layer portion a2 of ~A M , and therefore, the carrier confinement layer portion b2 of the carrier confinement layer B i is transferred from the carrier confinement layer portion b1 of the carrier confinement layer B i by this amount. The amount of electron leakage is when the carrier confinement layer portion b2 of the carrier confinement layers B 1 to B M+1 has the same n-type impurity concentration as the quantum well layer portion a2 of the quantum well layers A 1 to A M Comparatively small. Therefore, according to the quantum well semiconductor laser according to the present invention, the above-described laser oscillation can be achieved with higher oscillation efficiency than the conventional quantum well semiconductor laser, and the threshold current value of the laser oscillation can be In the conventional quantum well semiconductor laser, the carrier confinement layer portion b2 of the carrier confinement layers B 1 to B M+1 has the same n-type impurity concentration as the quantum well layer portion a2 of the quantum well layers A 1 to A M It has great features such as being able to lower the cost compared to other cases. Note that the above description merely shows an example of the present invention, and the electrodes E1 and E2 are connected to the carrier confinement layer portion b2 of the carrier confinement layer B1 and the carrier confinement layer B M through the electrode attachment layer, respectively. +1 carrier confinement layer section b1, and furthermore, the electrodes E1 and E2 can be connected to the carrier confinement layer section b1 of carrier confinement layer B1, respectively.
The carrier confinement layer B M+1 may be connected to the carrier confinement layer part b2 of the carrier confinement layer B M+1, and various other modifications and changes may be made without departing from the spirit of the present invention. .
図は、本発明による量子井戸型半導体レーザの
実施例を示す略線的断面図である。
A1〜AM……量子井戸層、a1,a2……量子
井戸層A1〜AMの量子井戸層部、B1〜BM+1……キ
ヤリア閉込め層、b1,b2……キヤリア閉込め
層B1〜BM+1のキヤリア閉込め層部、J1〜JM……
接合。
The figure is a schematic cross-sectional view showing an embodiment of a quantum well type semiconductor laser according to the present invention. A 1 to A M ... quantum well layer, a1, a2... quantum well layer A 1 to quantum well layer part of A M , B 1 to B M+1 ... carrier confinement layer, b1, b2... carrier Carrier confinement layer portion of confinement layer B 1 to B M+1 , J 1 to J M ……
Junction.
Claims (1)
並置されている複数M個の量子井戸層A1,A2,
……AMと、 第1及び第2のキヤリア閉込め層部が互に連接
して並置されている複数(M+1)個のキヤリア
閉込め層B1,B2,……BM+1とを有し、 上記量子井戸層A1〜AMの第1の量子井戸層
部、及び上記キヤリア閉込め層B1〜BM+1の第1
のキヤリア閉込め層部は、p型を有し、 上記量子井戸層A1〜AMの第2の量子井戸層部
は、n型を有し、 上記キヤリア閉込め層部B1〜BM+1の第2のキ
ヤリア閉込め層部は、上記量子井戸層A1〜AMの
第2の量子井戸層部に比し高い不純物濃度を有す
ることによつてn+型を有し、 上記量子井戸層A1〜AM、及び上記キヤリア閉
込め層B1〜BM+1が、上記キヤリア閉込め層Bi及
びBi+1(但し、i=1、2、……M)を、それぞ
れ上記量子井戸層Aiの相対向する第1及び第2の
主面上に配し、且つ上記キヤリア閉込め層Bi及び
Bi+1の第1のキヤリア閉込め層部を、上記量子井
戸層Aiの第1の量子井戸層部に、上記キヤリア閉
込め層Bi及びBi+1の第2のキヤリア閉込め層部
を、上記量子井戸層Aiの第2の量子井戸層部に連
接させている関係で、積層され、 上記キヤリア閉込め層B1の第2のキヤリア閉
込め層部に、第1の電極が連結され、上記キヤリ
ア閉込め層BM+1の第1のキヤリア閉込め層部に、
第2の電極が連結されていることを特徴とする量
子井戸型半導体レーザ。[Scope of Claims] 1. A plurality of M quantum well layers A 1 , A 2 , in which the first and second quantum well layer portions are arranged in parallel with each other.
... A M , and a plurality of (M+1) carrier confinement layers B 1 , B 2 , ... B M+1 in which the first and second carrier confinement layer portions are arranged in parallel with each other. a first quantum well layer portion of the quantum well layers A 1 to A M and a first quantum well layer portion of the carrier confinement layers B 1 to B M+1 ;
The carrier confinement layer portion of has p type, the second quantum well layer portion of the quantum well layers A 1 to A M has n type, and the carrier confinement layer portion B 1 to B M has n type. The second carrier confinement layer portion of +1 has an n + type by having a higher impurity concentration than the second quantum well layer portions of the quantum well layers A 1 to A M , and The quantum well layers A 1 to A M and the carrier confinement layers B 1 to B M+1 have the carrier confinement layers B i and B i+1 (where i=1, 2,...M). , respectively arranged on the opposing first and second main surfaces of the quantum well layer A i , and the carrier confinement layers B i and
The first carrier confinement layer part of B i+1 is placed in the first quantum well layer part of the quantum well layer A i , and the second carrier confinement layer part of the carrier confinement layers B i and B i+1 is The first carrier confinement layer part is stacked in such a manner that the layer part is connected to the second quantum well layer part of the quantum well layer A i , and the first carrier confinement layer part is connected to the second carrier confinement layer part of the carrier confinement layer B1 . An electrode is connected to the first carrier confinement layer portion of the carrier confinement layer B M+1 ;
A quantum well semiconductor laser characterized in that a second electrode is connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9961982A JPS58216489A (en) | 1982-06-10 | 1982-06-10 | Quantum well type semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9961982A JPS58216489A (en) | 1982-06-10 | 1982-06-10 | Quantum well type semiconductor laser |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58216489A JPS58216489A (en) | 1983-12-16 |
| JPH0371797B2 true JPH0371797B2 (en) | 1991-11-14 |
Family
ID=14252103
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9961982A Granted JPS58216489A (en) | 1982-06-10 | 1982-06-10 | Quantum well type semiconductor laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58216489A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0712103B2 (en) * | 1985-07-26 | 1995-02-08 | 株式会社日立製作所 | Semiconductor laser device |
| USRE36431E (en) * | 1992-02-05 | 1999-12-07 | Mitsui Chemicals, Inc. | Semiconductor laser element and laser device using the same element |
| US5467364A (en) * | 1992-02-05 | 1995-11-14 | Mitsui Petrochemical Industries, Ltd. | Semiconductor laser element and laser device using the same element |
| CA2138912C (en) * | 1993-12-24 | 1999-05-04 | Shoji Ishizaka | Semiconductor laser device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56164588A (en) * | 1980-05-23 | 1981-12-17 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor light amplifier |
-
1982
- 1982-06-10 JP JP9961982A patent/JPS58216489A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58216489A (en) | 1983-12-16 |
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