JPH0378944B2 - - Google Patents
Info
- Publication number
- JPH0378944B2 JPH0378944B2 JP58191780A JP19178083A JPH0378944B2 JP H0378944 B2 JPH0378944 B2 JP H0378944B2 JP 58191780 A JP58191780 A JP 58191780A JP 19178083 A JP19178083 A JP 19178083A JP H0378944 B2 JPH0378944 B2 JP H0378944B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- horn
- electromagnetic
- microwaves
- receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
【発明の詳細な説明】
本発明は電子スピン共鳴装置に関し、特に空胴
共振器に代えて電磁ホーンを用いて試料にマイク
ロ波を印加するようにした電子スピン共鳴装置に
関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an electron spin resonance apparatus, and more particularly to an electron spin resonance apparatus in which an electromagnetic horn is used instead of a cavity resonator to apply microwaves to a sample.
一般に電子スピン共鳴装置では、試料を空胴共
振器内に挿入して測定を行う。この方法は測定感
度が高いという大きな特徴を持つものの、(a)空胴
共振器の中に試料を入れる関係上、試料の形状及
び大きさに制限がある(従来の装置では高々10mm
φの円柱状)、(b)共振条件があるため、試料に印
加するマイクロ波の周波数を任意に選ぶことがで
きない、等の欠点があつた。 Generally, in an electron spin resonance apparatus, a sample is inserted into a cavity resonator to perform measurements. Although this method has the great feature of high measurement sensitivity, (a) there are limitations on the shape and size of the sample due to the fact that the sample is placed inside the cavity (conventional equipment has a maximum of 10 mm);
(b) Due to the resonance condition, the frequency of the microwave applied to the sample cannot be arbitrarily selected.
この欠点を除くため、空胴共振器を用いない第
1図に示す基本構成を持つ電子スピン共鳴装置が
特願昭57−215075号(特開昭59−105551号)に提
案されている。同図において、1,2は対向配置
された電磁ホーンである。図示しないマイクロ波
発振器で発生し、導波管を介して導かれたマイク
ロ波は電磁ホーン1から電磁ホーン2へ向けて放
射される。この2つの電磁ホーンの間に試料を入
れた試料管あるいはウエハー状試料などの被験試
料3が配置されると共に、例えば図において矢印
で示す方向に直流磁場が印加される。電子スピン
共鳴共鳴により試料がマイクロ波を吸収すると、
電磁ホーン2に入射するマイクロ波電力が変化す
るため、その変化に基づいて試料の電子スピン共
鳴を検出することができる。 In order to eliminate this drawback, an electron spin resonance apparatus having the basic configuration shown in FIG. 1 without using a cavity resonator has been proposed in Japanese Patent Application No. 57-215075 (Japanese Patent Application Laid-open No. 59-105551). In the figure, numerals 1 and 2 are electromagnetic horns placed opposite each other. Microwaves generated by a microwave oscillator (not shown) and guided through a waveguide are radiated from an electromagnetic horn 1 toward an electromagnetic horn 2. A test sample 3 such as a sample tube containing a sample or a wafer-shaped sample is placed between these two electromagnetic horns, and a DC magnetic field is applied, for example, in the direction indicated by the arrow in the figure. When a sample absorbs microwaves by electron spin resonance,
Since the microwave power incident on the electromagnetic horn 2 changes, the electron spin resonance of the sample can be detected based on the change.
この装置によれば、2つのホーンの比較的大き
な空間に試料を配置すれば良いため、任意の形状
及び大きさの試料について電子スピン共鳴測定を
行うことができ、例えば半導体ウエハー、アモル
フアスシリコンウエハー、バブルメモリウエハー
など大寸法のウエハーについても破壊することな
く測定を行うことができるという大きな効果が得
られる。又、共振器が無いので、マイクロ波の周
波数も任意に選択することが可能となる。 According to this device, since the sample only needs to be placed in a relatively large space between the two horns, electron spin resonance measurements can be performed on samples of any shape and size, such as semiconductor wafers, amorphous silicon wafers, etc. This method has the great effect of being able to measure even large wafers such as bubble memory wafers without destroying them. Furthermore, since there is no resonator, it is possible to arbitrarily select the microwave frequency.
ところで、この装置においては、電磁ホーン1
から放射され試料に印加されたマイクロ波のほと
んど全部が電磁ホーン2によつて受信されるが、
受信器として用いられる検波ダイオードは、高々
10mW程度のマイクロ波電力しか許容できない。
そのため、電磁ホーン1から試料に印加するマイ
クロ波の電力もその許容電力に見合つた低いレベ
ルに設定せざるを得ず、従つて試料に高電力のマ
イクロ波を印加して感度の良い測定を行うことが
困難であつた。 By the way, in this device, the electromagnetic horn 1
Almost all of the microwaves emitted from the sample and applied to the sample are received by the electromagnetic horn 2.
The detection diode used as a receiver has at most
It can only tolerate microwave power of about 10mW.
Therefore, the power of the microwave applied to the sample from the electromagnetic horn 1 has to be set at a low level commensurate with the allowable power, and therefore high-power microwaves are applied to the sample to perform sensitive measurements. It was difficult.
本発明は、この点に鑑みてなされたものであ
り、上記提案装置において、送信用及び受信用電
磁ホーンを、夫々の端面の長さ方向が交差するよ
うに配置することにより、試料に高電力のマイク
ロ波を印加して感度の良い測定を行うことが可能
な電子スピン共鳴装置を提供することを目的とし
ている。以下、図面を用いて本発明を詳説する。 The present invention has been made in view of this point, and by arranging the transmitting and receiving electromagnetic horns in such a manner that the length directions of their respective end faces intersect in the proposed device, high power can be applied to the sample. The purpose of the present invention is to provide an electron spin resonance apparatus that can perform sensitive measurements by applying microwaves. Hereinafter, the present invention will be explained in detail using the drawings.
第2図は本発明の一実施例の構成を示し、図に
おいて4は磁石である。該磁石4内には、送信用
電磁ホーン1と受信用電磁ホーン2が対向配置さ
れ、その間に試料3が挿入されている。又、該磁
石4内には、磁場変調用の変調コイル5が設置さ
れ、該コイル5には例えば100KHz程度の周波数
を持つ変調電流が増幅器6を介して発振器7から
供給されている。 FIG. 2 shows the configuration of an embodiment of the present invention, and in the figure, 4 is a magnet. Inside the magnet 4, a transmitting electromagnetic horn 1 and a receiving electromagnetic horn 2 are arranged facing each other, and a sample 3 is inserted between them. Further, a modulation coil 5 for magnetic field modulation is installed inside the magnet 4, and a modulation current having a frequency of, for example, about 100 KHz is supplied from an oscillator 7 via an amplifier 6 to the coil 5.
ガン発信器等のマイクロ波発振器8から発生し
たマイクロ波は、アイソレータ9、アツテネータ
10を介して上記送信用電磁ホーン1へ送られ
る。受信用電磁ホーン2に入射したマイクロ波
は、検波ダイオード11へ送られて検出される。
本実施例では、検波ダイオードの動作点を適切な
レベルに設定するため、方向性結合器12により
送信系から適宜なレベルのマイクロ波を取出し、
方向性結合器13により受信系へ送るようにして
いる。14は位相を調整するための移相器であ
る。ダイオード11から得られた検出信号は、増
幅器15を介して復調器(例えば位相敏感検出
器)16へ送られる。該復調器16には、前記発
振器7からの変調信号が移相器17を介して供給
されており、検出信号は該変調信号に基づいて復
調される。復調された検出信号は、増幅器18を
介してレコーダ等の記録器19へ送られ、前記磁
石4を励磁する励磁電源20による磁場掃引に関
連して記録される。 Microwaves generated from a microwave oscillator 8 such as a gun oscillator are sent to the transmitting electromagnetic horn 1 via an isolator 9 and an attenuator 10. The microwave incident on the receiving electromagnetic horn 2 is sent to the detection diode 11 and detected.
In this embodiment, in order to set the operating point of the detection diode to an appropriate level, microwaves of an appropriate level are extracted from the transmission system by the directional coupler 12.
A directional coupler 13 is used to send the signal to the receiving system. 14 is a phase shifter for adjusting the phase. The detection signal obtained from the diode 11 is sent via an amplifier 15 to a demodulator (for example a phase sensitive detector) 16. A modulation signal from the oscillator 7 is supplied to the demodulator 16 via a phase shifter 17, and the detection signal is demodulated based on the modulation signal. The demodulated detection signal is sent to a recorder 19 such as a recorder via an amplifier 18, and is recorded in relation to the magnetic field sweep by the excitation power source 20 that excites the magnet 4.
上述の如き構成において、送信用電磁ホーン1
の受信用電磁ホーン2が同一の扇形H面ホーンで
あるとする。このH面ホーンでは、接続される方
形導波管のH面(磁界に平行な面、換言すれば方
形導波管の幅の広い方の面)が広げられ、E面
(電界に平行な面、換言すれば方形導波管の幅の
狭い方の面)はそのままである。そして、2つの
ホーンは第3図の斜視図から分るように略直交し
て、換言すれば、夫々のH面同士が直交するよう
に(ということはE面同士も)、対向配置されて
いる。 In the configuration as described above, the transmitting electromagnetic horn 1
It is assumed that the receiving electromagnetic horns 2 are the same fan-shaped H-plane horn. In this H-plane horn, the H-plane (the plane parallel to the magnetic field, in other words, the wide side of the rectangular waveguide) of the connected rectangular waveguide is widened, and the E-plane (the plane parallel to the electric field) is widened. , in other words, the narrower side of the rectangular waveguide) remains unchanged. As can be seen from the perspective view in Fig. 3, the two horns are substantially orthogonal, in other words, they are arranged facing each other so that their H planes are orthogonal to each other (which means that their E planes are also perpendicular to each other). There is.
方形導波管内を伝送されて来たマイクロ波は、
ホーン1によつて、ほとんど反射波を発生させず
効率良く、鋭い指向性を持つうちわ状のビームと
して試料の存在する自由空間中にホーン2に向け
て放射される。そのうちわの面はH面に対し垂直
の方向である。この時、ホーン2がホーン1に対
してH面及びE面が夫々向き合うように対向配置
されている提案装置(第1図)では、2つのホー
ンの指向性が一致し、ホーン1から放射され試料
部分を通過したマイクロ波ビームが、相反定理に
従いホーン2によつてほとんど反射波を発生せず
効率良く受信されるため、先に述べたような不都
合が生じていた。 Microwaves transmitted in a rectangular waveguide are
The horn 1 efficiently radiates a fan-shaped beam with sharp directivity into the free space where the sample exists, toward the horn 2, with almost no reflected waves. The plane of the fan is perpendicular to the H plane. At this time, in the proposed device (Fig. 1) in which the horn 2 is arranged to face the horn 1 so that the H plane and the E plane face each other, the directivity of the two horns is the same, and the radiation from the horn 1 is The microwave beam that has passed through the sample portion is efficiently received by the horn 2 with almost no reflected waves according to the reciprocity theorem, resulting in the above-mentioned inconvenience.
その点、本発明では、受信用のホーン2をホー
ン1に対して略90°回転させて配置しており、ホ
ーン2の指向性がホーン1から放射されたビーム
の方向と一致しないため、試料によつて何の影響
も受けないマイクロ波がホーン2に到着する電子
スピン共鳴が起きていない状態では、そのマイク
ロ波は殆んど受信されない。しかしながら、電源
20による掃引により、磁場強度が共鳴条件の成
立する値に到達すると、静磁界に垂直な平面内の
マイクロ波照射方向(x)及びそれに垂直方向
(y)にマイクロ波磁場によつて振動磁化Mx,
Myが試料に誘起され、、ホーン1とH面同士及
びE面同士が交差するように配置されているホー
ン2はこの内のMy成分のマイクロ波電力を受信
することができる。 In this regard, in the present invention, the receiving horn 2 is arranged approximately 90 degrees rotated with respect to the horn 1, and since the directivity of the horn 2 does not match the direction of the beam emitted from the horn 1, In a state where electron spin resonance is not occurring, in which microwaves that are not affected in any way arrive at the horn 2, the microwaves are hardly received. However, when the magnetic field strength reaches a value that satisfies the resonance condition due to the sweeping by the power supply 20, the microwave magnetic field is activated in the microwave irradiation direction (x) in the plane perpendicular to the static magnetic field and in the direction (y) perpendicular to it. Vibration magnetization Mx,
My is induced in the sample, and the horn 2, which is arranged so that the H plane and the E plane intersect with the horn 1, can receive the microwave power of the My component.
このように、本発明では、提案装置のようにホ
ーン1から放射されたマイクロ波が定常的に全て
受信用ホーンに入射することがないため、ホーン
1から試料に印加するマイクロ波の強度を高めて
も受信用ダイオードが破壊するようなことはな
く、従つて測定感度を飛躍的に高めることが可能
である。 In this way, in the present invention, unlike the proposed device, all the microwaves emitted from the horn 1 do not constantly enter the receiving horn, so the intensity of the microwaves applied to the sample from the horn 1 is increased. However, the receiving diode will not be destroyed even if the receiving diode is damaged, so it is possible to dramatically increase the measurement sensitivity.
尚、上述した実施例では扇形H面電磁ホーンを
送受信ホーンとして用いたが、扇形E面に電磁ホ
ーンを送受信ホーンとして用いても良く、更に
は、H面及びE面を広げた角錐形電磁ホーンを用
いても良いことは言うまでもない。 In the above-described embodiment, a fan-shaped H-plane electromagnetic horn was used as the transmitting and receiving horn, but an electromagnetic horn on the fan-shaped E-plane may also be used as the transmitting-receiving horn. It goes without saying that you may also use .
又、送受信ホーンは必ずしも直交させる必要は
なく、交差角度は適宜設定すれば良い。 Further, the transmitting and receiving horns do not necessarily have to be orthogonal, and the crossing angle may be set as appropriate.
第1図は提案装置を説明するための図、第2図
は本発明の一実施例の構成を示す図、第3図は第
2図における送受信ホーンの配置を説明するため
の斜視図である。
1:送信用電磁ホーン、2:受信用電磁ホー
ン、3:試料、4:磁石、8:マイクロ波発振
器、11:検波ダイオード。
Fig. 1 is a diagram for explaining the proposed device, Fig. 2 is a diagram showing the configuration of an embodiment of the present invention, and Fig. 3 is a perspective view for explaining the arrangement of the transmitting and receiving horns in Fig. 2. . 1: Electromagnetic horn for transmission, 2: Electromagnetic horn for reception, 3: Sample, 4: Magnet, 8: Microwave oscillator, 11: Detection diode.
Claims (1)
と、該試料に印加するマイクロ波を発生する手段
と、該マイクロ波を試料に向けて放射する送信用
扇形又は角錐形電磁ホーンと、試料を挟んで該送
信用電磁ホーン対向配置される受信用扇形又は角
錐形電磁ホーンとを備え、前記送信用及び受信用
電磁ホーンは、夫々のH面同士及びE面同士が交
差するように対向配置されることを特徴とする電
子スピン共鳴装置。1. A means for generating a magnetic field to be applied to a sample, a means for generating microwaves to be applied to the sample, a transmitting fan-shaped or pyramid-shaped electromagnetic horn for emitting the microwaves toward the sample, and a means for sandwiching the sample. and a receiving fan-shaped or pyramidal electromagnetic horn arranged opposite to the transmitting electromagnetic horn, and the transmitting and receiving electromagnetic horns are arranged oppositely so that their respective H planes and E planes intersect with each other. An electron spin resonance device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58191780A JPS6082981A (en) | 1983-10-14 | 1983-10-14 | Electron spin resonance device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58191780A JPS6082981A (en) | 1983-10-14 | 1983-10-14 | Electron spin resonance device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6082981A JPS6082981A (en) | 1985-05-11 |
| JPH0378944B2 true JPH0378944B2 (en) | 1991-12-17 |
Family
ID=16280409
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58191780A Granted JPS6082981A (en) | 1983-10-14 | 1983-10-14 | Electron spin resonance device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6082981A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5665914B2 (en) * | 2013-05-13 | 2015-02-04 | 株式会社東芝 | Magnetic resonance measuring device |
-
1983
- 1983-10-14 JP JP58191780A patent/JPS6082981A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6082981A (en) | 1985-05-11 |
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