JPH0393620A - Production of oxide superconductor thin film - Google Patents
Production of oxide superconductor thin filmInfo
- Publication number
- JPH0393620A JPH0393620A JP1230758A JP23075889A JPH0393620A JP H0393620 A JPH0393620 A JP H0393620A JP 1230758 A JP1230758 A JP 1230758A JP 23075889 A JP23075889 A JP 23075889A JP H0393620 A JPH0393620 A JP H0393620A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- oxide
- substrate
- oxide superconductor
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 47
- 239000002887 superconductor Substances 0.000 title claims abstract description 25
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000000758 substrate Substances 0.000 claims abstract description 23
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 17
- 239000007789 gas Substances 0.000 claims abstract description 13
- 239000011261 inert gas Substances 0.000 claims abstract description 7
- 229910052747 lanthanoid Inorganic materials 0.000 claims abstract description 3
- 150000002602 lanthanoids Chemical class 0.000 claims abstract description 3
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims description 32
- 239000010408 film Substances 0.000 claims description 16
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 claims description 8
- 229910001882 dioxygen Inorganic materials 0.000 claims description 4
- 238000001513 hot isostatic pressing Methods 0.000 claims description 2
- 229910052727 yttrium Inorganic materials 0.000 claims description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 20
- 239000007788 liquid Substances 0.000 abstract description 10
- 229910052757 nitrogen Inorganic materials 0.000 abstract description 10
- 230000007704 transition Effects 0.000 abstract description 6
- 229910002244 LaAlO3 Inorganic materials 0.000 abstract 1
- 229910002370 SrTiO3 Inorganic materials 0.000 abstract 1
- 238000007731 hot pressing Methods 0.000 abstract 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 14
- 239000001301 oxygen Substances 0.000 description 14
- 238000012545 processing Methods 0.000 description 14
- 239000000203 mixture Substances 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 9
- 239000013078 crystal Substances 0.000 description 7
- 101100235549 Caenorhabditis elegans lin-53 gene Proteins 0.000 description 6
- 238000001771 vacuum deposition Methods 0.000 description 6
- 238000002441 X-ray diffraction Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000001704 evaporation Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 229910002367 SrTiO Inorganic materials 0.000 description 2
- 238000010549 co-Evaporation Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 125000004430 oxygen atom Chemical group O* 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/60—Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment
Landscapes
- Inorganic Compounds Of Heavy Metals (AREA)
- Physical Vapour Deposition (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は新規な酸化物超電導体薄膜を製造する方法に関
し、詳細には超電導遷移温度Tcが液体窒素温度を十分
に超え、且つ高温加工中に酸素が抜け出して上記Tcが
変動するといった問題の少ない酸化物超電導体薄膜を製
造する方法に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for manufacturing a novel oxide superconductor thin film, and in particular, the present invention relates to a method for producing a novel oxide superconductor thin film, and in particular, the superconducting transition temperature Tc sufficiently exceeds the liquid nitrogen temperature, and the method is performed during high-temperature processing. The present invention relates to a method for producing an oxide superconductor thin film that is free from the problem of fluctuations in Tc due to oxygen escape during the process.
[従来の技術]
液体窒素温度を超えるTc(例えば90K)をもつ代表
的酸化物超電導体として、三層構造ベロブスカイトRB
az Cu,07 (但しRはY若しくはランタニド
系列希土類元素からなる群から選択される1種以上の元
素)が発見されている[^ppl. phys. Le
tt. Vol.51 (19+17)P57].しか
しながら上記酸化物超電導体は、構成員である酸素原子
が加工時の熱影響によって抜け出し易いという性質を有
しており、従って加工時の熱処理条件等で酸素含有量が
変化し、それに伴なって斜方晶一正方晶転移を起こし、
この相転移によってTcもOKから90Kまでの範囲で
大きく変動することが知られている[Phys. Re
v. 836(1987) P5719] ,
例えばRBa2 Cu3 07粉末を超電導材とする成
形体では、これを焼結熱処理する時に酸素原子が抜けて
しまい、超電導特性が劣化してしまうという欠点があっ
た.
これに対して、RBa2Cu40a型酸化物は、RBa
2 (u3 0t型酸化物におけるCu−0の1重鎮を
2重鎮Cしたものであり、850℃付近まで加熱しても
酸素の抜け出しが見られず安定である.しかもTcが8
0K付近Cあって、液体窒素温度を上回るというものの
、実用上からすればもう少し高めのTcを有する酸化物
超電導体の開発が求められる.
ところでRBa2 Cu406型酸化物超電導体の製造
方法としては、これまで下記2つの方法が提案されてい
る。[Prior art] As a typical oxide superconductor with Tc exceeding the liquid nitrogen temperature (for example, 90 K), three-layered berovskite RB
az Cu,07 (where R is Y or one or more elements selected from the group consisting of lanthanide series rare earth elements) has been discovered [^ppl. phys. Le
tt. Vol. 51 (19+17)P57]. However, the above-mentioned oxide superconductor has the property that the constituent oxygen atoms easily escape due to the thermal influence during processing, and therefore the oxygen content changes depending on the heat treatment conditions during processing, and accordingly, the oxygen content changes due to the heat treatment conditions during processing. Causes orthorhombic monotetragonal transition,
It is known that Tc varies greatly in the range from OK to 90K due to this phase transition [Phys. Re
v. 836 (1987) P5719], for example, a molded body made of RBa2 Cu3 07 powder as a superconducting material had the disadvantage that oxygen atoms were removed during sintering heat treatment, resulting in deterioration of superconducting properties. On the other hand, RBa2Cu40a type oxide has RBa
2 (U3 0t-type oxide, which has a double chain of Cu-0 and is stable with no oxygen escape even when heated to around 850℃.Moreover, Tc is 8
Although the temperature is around 0 K, which is higher than the liquid nitrogen temperature, from a practical point of view there is a need to develop an oxide superconductor with a slightly higher Tc. By the way, the following two methods have been proposed so far as methods for manufacturing RBa2 Cu406 type oxide superconductors.
(1)仮焼粉を純酸素の高圧雰囲気下で熱処理(例えば
930℃×8時間.酸素圧100atm )する方法[
高圧酸素法;Tcsw81K. Nature 336
(1988) P66G−662またはPhys.
Rev. B39 (19H) P7347−7350
1 .(2)仮焼粉を炭酸ナトリウム等の触媒と混合し
、これを長時間酸素気流中で熱処理する方法[常圧法;
T c sw 7 7 K ; Nature 33
8(19H) P328−330].
しかしながら、本発明者らが実験によって確認しkとこ
ろによると、上記(1) . (2)の方法では下記の
様な欠点があった.
(1)の方法では、温度や圧力条件によってはRBa2
Cus O,−,相やR2 Ba4 Cuy o,相等
が出現してRBaa Cu40aの生成量が極めて少な
くなり、RBa2Cua 06相の特性を期待すること
ができない.また(2)の方法では生成物中に不純物が
残り易く、熱処理にも長時間を要することから、実際の
応用には不向きである.
そればかりでなく、RBa2 Cu4 0a型酸化物は
、Tcが液体窒素温度を上回るという点で注目されてい
るが、前述の如く液体窒素温度に近い為、実用面におい
て種々の障害があり、より高いTcを示す酸化物超電導
体の開発が期待されている.
一方、薄膜状の酸化物超電導体を製造する方法としては
大別して下記2種の方法がある.1つは、スパッタ法.
EB蒸着法,共蒸着法等の真空蒸着法によって適当な組
成のアモルファス酸化物膜を基板上に形成しておき、こ
れを熱処理することにより結晶化させて超電導相を得る
方法であり、この方法では、成膜工程で基板温度は室温
乃至350℃程度までしか上がらず、比較的低温で成膜
することができる.もう1つの方法は、基板温度を60
0〜800℃に高めておき、該基板上に、上記と同様の
真空蒸着法で適当な組成のアモルファス酸化物薄膜を形
成すると共に、基板温度を利用して該薄膜を構成する酸
化物を結晶化させ超電導相に変えていく方法である.
上記2つの方法のうち、前者は、単結晶膜の合成は困難
であるが、成膜後の熱処理条件をコントロールすること
によって結晶構造を制御し得るという利点を有し、これ
に対し後者の方法では、それ自身が熱的に安定なもので
ありさえすれば、たとえばRBat Cu3 of−6
などの単結晶膜が得られるという特長がある.
[発明が解決しようとする課題]
ところが現在の技術では、R B a 2C u 40
6の配合組成を有するアモルファス酸化物薄膜から単
相の結晶膜を得ることはできない.
即ち、例えばRBa箕C u 3 0 7 − 6の配
合組成を有するアモルファス酸化物薄膜の場合は、純酸
素雰囲気中で0.5〜1気圧、800〜950℃で20
〜60分程度加熱し、更に400〜600℃で120〜
600分程度の熱処理を行なうことによって単結晶の薄
膜に変えることができるが、この様な熱処理条件をRB
atCu40@の組成を有するアモルファス酸化物薄膜
に適用して結晶化を行なうと、 RBa.Cu.Ov
BaCuO.,一δ゜
RBaCuOs . ・・・等多数の結晶を含む多相膜
となり、得られる膜は多数の絶縁相を含む多相構造のも
のとなって、意図する様な超電導特性が得られない.
本発明はこうした技術的課題を解決する為になされたも
のであって、高温条件下においても酸素の抜け出しが少
なく、しかも実質的に単相構造で液体窒素温度より十分
高いTcを有する酸化物超電導体薄膜を製造することの
できる方法を確立しようとするものである。(1) A method of heat-treating calcined powder in a high-pressure atmosphere of pure oxygen (for example, 930°C x 8 hours. Oxygen pressure 100 atm) [
Hyperbaric oxygen method; Tcsw81K. Nature 336
(1988) P66G-662 or Phys.
Rev. B39 (19H) P7347-7350
1. (2) A method of mixing calcined powder with a catalyst such as sodium carbonate and heat-treating it in an oxygen stream for a long time [normal pressure method;
T c sw 7 7 K; Nature 33
8 (19H) P328-330]. However, the inventors have confirmed through experiments that (1) above. Method (2) had the following drawbacks. In method (1), depending on the temperature and pressure conditions, RBa2
Cus O,-, phase, R2 Ba4 Cuy o, phase, etc. appear, and the amount of RBaa Cu40a produced becomes extremely small, and the characteristics of the RBa2Cua 06 phase cannot be expected. In addition, method (2) tends to leave impurities in the product and requires a long time for heat treatment, making it unsuitable for practical application. In addition, RBa2 Cu4 0a type oxide is attracting attention because its Tc exceeds the liquid nitrogen temperature, but as mentioned above, since it is close to the liquid nitrogen temperature, there are various obstacles in practical use. The development of oxide superconductors exhibiting Tc is expected. On the other hand, methods for producing thin film oxide superconductors can be broadly classified into the following two types. One is the sputtering method.
This is a method in which an amorphous oxide film of an appropriate composition is formed on a substrate by a vacuum evaporation method such as EB evaporation method or co-evaporation method, and then crystallized by heat treatment to obtain a superconducting phase. In this case, the substrate temperature rises only from room temperature to about 350°C during the film formation process, making it possible to form films at relatively low temperatures. Another method is to lower the substrate temperature to 60
The temperature is raised to 0 to 800°C, and an amorphous oxide thin film of an appropriate composition is formed on the substrate by the same vacuum evaporation method as above, and the oxide constituting the thin film is crystallized using the substrate temperature. This is a method of converting the superconducting phase into a superconducting phase. Of the above two methods, the former has the advantage of being able to control the crystal structure by controlling the heat treatment conditions after film formation, although it is difficult to synthesize a single crystal film. So, as long as it is thermally stable, for example, RBat Cu3 of-6
It has the advantage that single crystal films such as can be obtained. [Problem to be solved by the invention] However, with the current technology, R B a 2C u 40
It is not possible to obtain a single-phase crystalline film from an amorphous oxide thin film having a composition of 6. That is, for example, in the case of an amorphous oxide thin film having a composition of RBa Minoh Cu 307-6, it is heated at 0.5 to 1 atm in a pure oxygen atmosphere at 800 to 950°C for 20
Heat for about 60 minutes and further heat at 400-600℃ for 120-
It is possible to turn the film into a single crystal thin film by performing heat treatment for about 600 minutes, but such heat treatment conditions are not suitable for RB.
When an amorphous oxide thin film having a composition of atCu40@ is crystallized, RBa. Cu. Ov
BaCuO. , one δ°RBaCuOs . ..., etc., resulting in a multiphase film containing many crystals, and the resulting film has a multiphase structure containing many insulating phases, making it impossible to obtain the intended superconducting properties. The present invention has been made to solve these technical problems, and is an oxide superconductor that has a substantially single-phase structure and a Tc sufficiently higher than the temperature of liquid nitrogen. The aim is to establish a method that can produce body thin films.
[ll!題を解決するための手段]
上記課題を解決することのできた本発明の構成は、R(
但しRは前と同じ意味).Ca.Ba,Cu.Oからな
る酸化物超電導体製造用アモルファス酸化物薄膜を真空
成膜法によって基板上に形成した後、不活性ガスと酸素
ガスの混合雰囲気下、850〜1100℃の温度範囲で
熱間静水圧加圧処理することにより、
(Rt−x C a, ) B a2C ua Oa(
但し、Xは0.001 〜0.5、Rは前と同じ意味)
で示される酸化物を含む酸化物超電導体薄膜とするとこ
ろに要旨を有するものである.
[作用]
本発明者らは、液体窒素温度よりも十分高いTcを有し
、且つ高温においても酸素の抜け出しが生じない様な薄
膜状の超電導体を実現すべく、色々な角度から検討を加
えた.
その結果、三層構造ペロブスカイトRBazCu30y
型結晶構造における1重のC u O 鎖を2重のCu
O鎖としたRBa2 Cu40.型酸化物において、R
の0.1〜50原子%をCaに置換した(RI−.Ca
.)Ba,Cu.o,型酸化物は、Tcが液体窒素温度
より十分に高くなり且つ高温条件のもとでも酸素の抜け
がなく安定した超電導特性を発揮し得ることを知った.
そしてこの様な特性を有する薄膜を得るための具体的製
造条件について検討を重ねた結果、R,Ca,Ba.C
u,Oを含む原料(R酸化物,CaやBaの酸化物や炭
酸塩,Cu酸化物等〉を用いて真空成膜法によって基板
上に酸化物超電導体製造用の均一なアモルファス酸化物
薄膜を形成した後、Ar等の不活性ガスと酸素ガスの混
合ガス雰囲気下、850〜ttoo℃の温度範囲で熱間
静水圧加圧処理(H I P処理)すれば、希望する(
Rl −X C ax ) B at C ua Oa
型酸化物超電導体薄膜が得られることを見出し、本発明
を完成した。[ll! Means for Solving the Problems] The configuration of the present invention that can solve the above problems is as follows: R(
However, R has the same meaning as before). Ca. Ba, Cu. After forming an amorphous oxide thin film composed of O for producing an oxide superconductor on a substrate by a vacuum film-forming method, hot isostatic pressing is performed in a temperature range of 850 to 1100°C in a mixed atmosphere of inert gas and oxygen gas. By pressure treatment, (Rt-x Ca, ) Ba2C ua Oa(
However, X is 0.001 to 0.5, R has the same meaning as before)
The gist of this is that it is an oxide superconductor thin film containing the oxide shown in . [Function] The present inventors conducted studies from various angles in order to realize a thin film superconductor that has Tc sufficiently higher than the temperature of liquid nitrogen and does not allow oxygen to escape even at high temperatures. Ta. As a result, a three-layer perovskite RBazCu30y
In the type crystal structure, a single Cu O chain is replaced by a double Cu O chain.
RBa2 Cu40 as O chain. In the type oxide, R
0.1 to 50 atom% of was substituted with Ca (RI-.Ca
.. ) Ba, Cu. It has been found that o-type oxides can exhibit stable superconducting properties with Tc sufficiently higher than the liquid nitrogen temperature and no oxygen loss even under high-temperature conditions.
As a result of repeated studies on specific manufacturing conditions for obtaining a thin film with such characteristics, we found that R, Ca, Ba. C
A uniform amorphous oxide thin film for producing oxide superconductors is formed on a substrate by a vacuum deposition method using raw materials containing u and O (R oxide, Ca and Ba oxides and carbonates, Cu oxide, etc.). After forming , the desired (
Rl -X C ax ) B at C ua Oa
They discovered that a type oxide superconductor thin film could be obtained, and completed the present invention.
本発明においては、まず酸化物超電導体製造用の均一な
アモルファス酸化物薄膜を形成するための手段として真
空成膜法を採用する.真空成膜法自体は、たとえばスパ
ツタ法,CVD法,EB蒸着法,共蒸着法等を包含する
従来公知の方法或はその改良法を適用することができ、
それにより均一な組成のアモルファス酸化物薄膜を容易
に得ることができる.
尚真空蒸着に当たっては、生成するアモルファス酸化物
薄膜の組成は必ずしも(R+Ca):Ba:Cuml:
2:4にしなけらばならない訳ではなく、これから多少
はずれた組成であってもその後のHIP処理によって実
買的に(Rl−X C ax ) B a2 C u4
0B相が生成するものであればよい.しかしこの相を
安定的に生成させるためには、やはりアモルファス酸化
物薄膜の組成を(R+Ca): Ba : Cu=1
: 2 : 4にするのが好ましいので、真空蒸着に当
たってはこうした点を踏まえて蒸着原料組成や真空蒸着
条件等を調整することが望まれる.
このとき使用される基板の種類にも格別の制約はないが
、その後のH I PIA理により優れた超電導特性の
酸化物薄膜を得るうえで好ましいのはS rT i O
,板,LaA10.,MgO板(より好ましくはS r
T i O.板,LaA103板)等であり、これらは
通常鏡面研磨仕上して用いられる.また基板として、N
iやMo等の金属板にSrTiO..LaA10,等の
スパッタリング被膜を形成した複合基板を用いることも
可能である.
本発明ではこの様にして得た均一なアモルファス酸化物
薄膜を、不活性ガスと酸素ガスの混合ガス雰囲気下、所
定の温度範回でHIP処理することによって結晶化せし
め、(Rl−X c aX)Ba,Cu4oa型の酸化
物超電導体薄膜に変換する.この場合HIP処理は、不
活性ガスと酸素ガスの混合ガス雰囲気下の処理で行うの
で、純酸素の場合と同じ圧力(例えば200気圧)を酸
素分圧で達戒しようとすれば混合ガス雰囲気としての全
圧を大幅に高めることができる。例えば不活性ガスと酸
素の混合モル比を1=1にしたときは全圧を400気圧
に、また4:1にしたときは圧圧を1000気圧にする
ことも可能となり、これ社よってCu原子の拡散が更に
高められ、(Rl−w Ca.)Ba2 Cu4 04
1型酸化物超電導体を生成し易くなるものと考えられる
.またこのことは、純酸素によって全圧力を高くする場
合と比べ、操業上の安全性の見地からも大きな利点であ
ると言える.
H I P,l理Cおける温度は、RBa2CllsO
y型酸化物を抑制し、(R,IICa,I)Ba2Cu
40,型酸化物の生成を促進するという観点から、少な
くとも850℃以上であることが必要であるが、110
0℃を超えるとR 2 B a 4 C u t O
zが生成して混相となりやすいので、処理温度の上限は
1100℃とする必要がある.
一方、本発明において.(Rl−XCJIヨ)Ba2
Cu.06型酸化物におけるCa置換量(即ちXの範囲
)をo.ooi〜0.5とした理由は下記の通りである
.即ちCa置換の効果(Tc上昇、熱安定性向上)が現
われるのはXが0.001以上のときであり、また本発
明の製造条件下においてXが0.5を超えて形成される
ことは殆んどないからである.尚好ましいXの範囲は0
.001〜0.2である.
尚本発明で採用されるHIP処理条件は前述の通りであ
るが、このHIP処理条件は使用する基板の種類によっ
ても変わってくるので注意すべきである。たとえば基板
としてのSrTiOsを使用した場合、HIP!A理時
の雰囲気ガスの酸素分圧を40気圧以上、温度を880
〜930℃に設定すると、処理時間20〜40分程度で
Tcの高い高性能の超電導酸化物薄膜を安定して得るこ
とができるが、処理時間が40分を超えると基板中のS
rやTiが酸化物薄膜中へ拡散移行して超電導特性が低
下してくる.これに対し基板としてL a A 1 0
sを用いた場合は、上記と同様の雰囲気ガスや温度条
件の′もとでは゜2“0〜6゜00分といった広い処理
時間範囲でも安定しk超電導特性の酸化物薄膜を得るこ
とができる.この様なところからHIP処理に当たって
は基板の種類(それに伴なう構成元素の拡散等)も考慮
して、HIP処理条件を適当に選択して決定することが
望まれる.
以下本発明を実施例によって詳細に説明するが、下記実
施例は本発明を限定する性貢のものではなく、前・後記
の趣旨に徴して設計変更することはいずれも本発明の技
術的範囲に含まれるものである.
[実施例]
2極RFスバッタ法を採用し、鏡面仕上げ( R @a
ll <0−.08p tn )を施したLaA10.
板よりなる基板上に下記条件でY,Ca,Ba.Cu,
Oを含むアモルファス酸化物薄膜を形成した.このとき
チャンバー圧やスバッタガス混合比等を調整して、薄膜
組成がY.1Ca.,,Ba2±21tCu4±2κと
なる様にコントロールし、成膜時間は膜厚が約1μmと
なる様に調整した.
(スバッタ条件)
ターゲット組成:
(Yo.a Cao.2 8as Cus Oy )チ
ャンパー圧:3Pa
スバッタガス: 0 2 / A r − 5 0 /
5 0基 板 温 度: 200℃
RF電力密度: 3 W / cm”
電極一基板間距11i:31)+m
かくしてアモルファス酸化物薄膜の形成された基板を、
Ar−80%.Ox−20%の混合ガス雰囲気下、10
00at−X900℃で130分間保持してHIP処理
し結晶化を行なった.得られたHIP処理物の酸化物薄
膜にX線を照射して該薄膜のX線回折パターンを測定し
たところ、第1図に示す如< (002n)のピークが
顕著に認められ、該薄膜は超電導性のY06Cao.a
Ba2 Cu4o6阜相構造からなるものであること
が確認された.
また比較のため、上記と同様にして得たY06C a0
.2 B am 2% C ul ±2% oaよ
りなる±
アモルファス酸化物薄膜の形成された基板を、100%
酸素雰囲気下、1atmxa80℃で25分間熱処理し
た後、更に550℃で120分間加熱処理して結晶化を
行なった
得られた酸化物薄膜のX線回折パターンは第2図に示す
通りであり、このパターンからも明らかである様に該酸
化物薄膜にはY2 B a C u OSやB a C
u O 2等を含めた無数のピークが認められ、Yo
.a C ao.z B a4C u40Bの単結晶を
示すピークは殆ど認められず、優れた超電導特性を期待
し得るものではなかった.
[発明の効果]
本発明は以上の様に構成されており、超電導遷移温度が
液体窒素温度より十分高く、しかも高温加工中に酸素の
抜け出しを生じて上記遷移温度が変動するといった問題
のない酸化物超電導薄膜を製造し得ることになった.In the present invention, first, a vacuum deposition method is adopted as a means for forming a uniform amorphous oxide thin film for producing an oxide superconductor. As the vacuum film forming method itself, conventionally known methods including, for example, sputtering method, CVD method, EB evaporation method, co-evaporation method, etc. or improved methods thereof can be applied.
As a result, an amorphous oxide thin film with a uniform composition can be easily obtained. In vacuum deposition, the composition of the amorphous oxide thin film produced is not necessarily (R+Ca):Ba:Cuml:
It does not necessarily have to be 2:4, and even if the composition is slightly different from this, it can be converted to (Rl-X C ax ) B a2 C u4 by subsequent HIP processing.
Any material that generates the 0B phase is sufficient. However, in order to stably generate this phase, the composition of the amorphous oxide thin film must be (R+Ca): Ba: Cu=1.
: 2 : 4 is preferable, so when performing vacuum evaporation, it is desirable to adjust the evaporation raw material composition, vacuum evaporation conditions, etc. with these points in mind. There are no particular restrictions on the type of substrate used at this time, but SrTiO is preferable in order to obtain an oxide thin film with excellent superconducting properties through the subsequent HIPIA process.
, plate, LaA10. , MgO plate (more preferably S r
T i O. plate, LaA103 plate), etc., and these are usually used with a mirror-polished finish. Also, as a substrate, N
SrTiO. .. It is also possible to use a composite substrate on which a sputtering film of LaA10 or the like is formed. In the present invention, the uniform amorphous oxide thin film obtained in this manner is crystallized by HIP treatment at a predetermined temperature range in a mixed gas atmosphere of inert gas and oxygen gas. ) Convert to Ba,Cu4oa type oxide superconductor thin film. In this case, HIP processing is performed in a mixed gas atmosphere of inert gas and oxygen gas, so if you try to achieve the same pressure (for example, 200 atm) with oxygen partial pressure as in the case of pure oxygen, it will be treated as a mixed gas atmosphere. can significantly increase the total pressure. For example, when the mixing molar ratio of inert gas and oxygen is 1=1, the total pressure can be made 400 atm, and when it is 4:1, the pressure can be made 1000 atm. The diffusion is further enhanced and (Rl-w Ca.) Ba2 Cu4 04
This is thought to facilitate the formation of type 1 oxide superconductors. This can also be said to be a major advantage from the standpoint of operational safety compared to increasing the total pressure using pure oxygen. The temperature at H I P,l C is RBa2CllsO
Suppresses y-type oxide, (R,IICa,I)Ba2Cu
From the viewpoint of promoting the production of 40, type oxides, it is necessary that the temperature is at least 850 °C or higher, but 110
When it exceeds 0℃, R 2 B a 4 C u t O
The upper limit of the treatment temperature needs to be 1100°C because z is likely to be generated and a mixed phase is likely to occur. On the other hand, in the present invention. (Rl-XCJIyo) Ba2
Cu. The Ca substitution amount (i.e. the range of X) in the 06 type oxide was set to o. The reason for setting ooi to 0.5 is as follows. In other words, the effect of Ca substitution (increase in Tc, improvement in thermal stability) appears when X is 0.001 or more, and under the production conditions of the present invention, X is not formed when it exceeds 0.5. This is because there are hardly any. The preferred range of X is 0
.. It is 001-0.2. The HIP processing conditions employed in the present invention are as described above, but it should be noted that these HIP processing conditions vary depending on the type of substrate used. For example, when using SrTiOs as a substrate, HIP! During A process, the oxygen partial pressure of the atmospheric gas is 40 atmospheres or more, and the temperature is 880 degrees.
If the temperature is set at ~930°C, a high-performance superconducting oxide thin film with a high Tc can be stably obtained in a processing time of about 20 to 40 minutes, but if the processing time exceeds 40 minutes, S in the substrate will increase.
As r and Ti diffuse into the oxide thin film, the superconducting properties deteriorate. On the other hand, as a substrate, L a A 1 0
When using S, it is possible to obtain an oxide thin film with stable K superconducting properties even over a wide processing time range of 0 to 600 minutes under the same atmospheric gas and temperature conditions as above. From this point of view, it is desirable to appropriately select and determine HIP processing conditions in consideration of the type of substrate (accompanying diffusion of constituent elements, etc.) during HIP processing.Hereinafter, the present invention will be implemented. Although explained in detail by way of example, the following examples are not intended to limit the present invention, and any design changes in accordance with the spirit of the preceding and following are included within the technical scope of the present invention. [Example] Adopts two-pole RF spatter method to achieve mirror finish (R@a
ll<0-. LaA10.08p tn).
Y, Ca, Ba. Cu,
An amorphous oxide thin film containing O was formed. At this time, the chamber pressure, spatter gas mixture ratio, etc. are adjusted so that the thin film composition is Y. 1Ca. ,,Ba2±21tCu4±2κ, and the film formation time was adjusted so that the film thickness was approximately 1 μm. (Sbatter conditions) Target composition: (Yo.a Cao.2 8as Cus Oy) Champer pressure: 3Pa Spatter gas: 02/Ar-50/
50 substrate Temperature: 200°C RF power density: 3 W/cm” Distance between electrode and substrate 11i:31)+m Thus, the substrate on which the amorphous oxide thin film was formed was
Ar-80%. Under a mixed gas atmosphere of Ox-20%, 10
00at-X was held at 900°C for 130 minutes and subjected to HIP treatment for crystallization. When the obtained oxide thin film of the HIP-treated product was irradiated with X-rays and the X-ray diffraction pattern of the thin film was measured, a peak of < (002n) as shown in Fig. 1 was clearly observed. Superconducting Y06Cao. a
It was confirmed that it consists of a Ba2Cu4o6 phase structure. For comparison, Y06C a0 obtained in the same manner as above
.. 2 B am 2% C ul ± 2% oa The substrate on which the amorphous oxide thin film was formed was 100%
The X-ray diffraction pattern of the resulting oxide thin film, which was heat-treated at 80°C for 25 minutes in an oxygen atmosphere and then further heat-treated at 550°C for 120 minutes for crystallization, is shown in Figure 2. As is clear from the pattern, the oxide thin film contains Y2 B a C u OS and B a C
Numerous peaks including u O 2 etc. were observed, and Yo
.. a C ao. Almost no peak indicating the single crystal of z B a4C u40B was observed, and excellent superconducting properties could not be expected. [Effects of the Invention] The present invention is configured as described above, and the superconducting transition temperature is sufficiently higher than the liquid nitrogen temperature, and the oxidation process is free from the problem that the transition temperature fluctuates due to the escape of oxygen during high-temperature processing. It became possible to produce superconducting thin films.
第1図は本発明で得た超電導薄膜のX線回折パターンを
示す図、第2図は真空蒸着後従来の条件で加熱処理して
結晶化させた酸化物薄膜のX線回折パターンを示す図で
ある.Figure 1 shows the X-ray diffraction pattern of the superconducting thin film obtained by the present invention, and Figure 2 shows the X-ray diffraction pattern of the oxide thin film crystallized by heat treatment under conventional conditions after vacuum deposition. It is.
Claims (1)
る群から選択される1種以上の元素)、Ca、Ba、C
u、Oからなる酸化物超電導体製造用アモルファス酸化
物薄膜を真空成膜法によって基板上に形成した後、不活
性ガスと酸素ガスの混合ガス雰囲気下、850〜110
0℃の温度範囲で熱間静水圧加圧処理することにより、 (R_1_−_xCa_x)Ba_2Cu_4O_8(
但し、xは0.001〜0.5、Rは前と同じ意味)で
示される酸化物を含む酸化物超電導体薄膜とすることを
特徴とする酸化物超電導体薄膜の製造方法。[Claims] R (wherein R is one or more elements selected from the group consisting of Y and lanthanide series rare earth elements), Ca, Ba, C
After forming an amorphous oxide thin film for producing an oxide superconductor consisting of u and O on a substrate by a vacuum film forming method, the film was heated to 850 to 110 mL in a mixed gas atmosphere of inert gas and oxygen gas.
By hot isostatic pressing in the temperature range of 0℃, (R_1_-_xCa_x)Ba_2Cu_4O_8(
A method for producing an oxide superconductor thin film, characterized in that the oxide superconductor thin film contains an oxide represented by x = 0.001 to 0.5 and R the same meaning as above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1230758A JPH0393620A (en) | 1989-09-06 | 1989-09-06 | Production of oxide superconductor thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1230758A JPH0393620A (en) | 1989-09-06 | 1989-09-06 | Production of oxide superconductor thin film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0393620A true JPH0393620A (en) | 1991-04-18 |
Family
ID=16912814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1230758A Pending JPH0393620A (en) | 1989-09-06 | 1989-09-06 | Production of oxide superconductor thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0393620A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01172218A (en) * | 1987-12-26 | 1989-07-07 | Tokai Univ | Manufacturing method of superconducting material |
-
1989
- 1989-09-06 JP JP1230758A patent/JPH0393620A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01172218A (en) * | 1987-12-26 | 1989-07-07 | Tokai Univ | Manufacturing method of superconducting material |
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