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JPH0412432B2 - - Google Patents
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JPH0412432B2 - - Google Patents

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Publication number
JPH0412432B2
JPH0412432B2 JP58160634A JP16063483A JPH0412432B2 JP H0412432 B2 JPH0412432 B2 JP H0412432B2 JP 58160634 A JP58160634 A JP 58160634A JP 16063483 A JP16063483 A JP 16063483A JP H0412432 B2 JPH0412432 B2 JP H0412432B2
Authority
JP
Japan
Prior art keywords
voltage
pressure
air
insulation
corona
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58160634A
Other languages
Japanese (ja)
Other versions
JPS6050460A (en
Inventor
Yoichi Kawasumi
Osamu Hashimoto
Akio Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP16063483A priority Critical patent/JPS6050460A/en
Publication of JPS6050460A publication Critical patent/JPS6050460A/en
Publication of JPH0412432B2 publication Critical patent/JPH0412432B2/ja
Granted legal-status Critical Current

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  • Testing Relating To Insulation (AREA)

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は、電気機器の絶縁構成および絶縁性
能の良否を誘電正接の測定により診断する非破壊
絶縁試験方法、特に、被試験機器を圧力容器に入
れ、この圧力容器内の圧力または気体の種類を変
えることによりコロナ開始電圧を被試験機器の定
格電圧以下に引き下げておこなうようにした非破
壊絶縁試験方法に関するものである。
Detailed Description of the Invention [Technical Field of the Invention] The present invention relates to a nondestructive insulation testing method for diagnosing the quality of the insulation configuration and insulation performance of electrical equipment by measuring dielectric loss tangent, and in particular, to a method for diagnosing the quality of the insulation structure and insulation performance of electrical equipment. This relates to a non-destructive insulation testing method in which the corona onset voltage is lowered to below the rated voltage of the equipment under test by changing the pressure or type of gas in the pressure vessel.

〔従来技術〕 従来のこの種の非破壊絶縁試験方法としては、
例えば誘電正接試験における誘電正接tanδと印加
電圧との関係を調べる方法がある。第1図は、そ
のtanδ−印加電圧特性を示したものであり、縦軸
には誘電正接tanδがパーセンテージ(%)で、ま
た横軸には印加電圧がキロボルト(kv)で示さ
れている。高電圧の乾式絶縁に対しては、tanδ−
印加電圧特性の測定が一般におこなわれており、
絶縁物内部にギヤツプ(ボイド)がある場合等、
電圧が増加するとここでコロナ放電が発生するた
め、誘電正接tanδが増加する。そこで、コロナ放
電が起らない従つて誘電正接tanδが一定である比
較的低い電圧V0における誘電正接の値tanδoと、
電圧Vnでの電圧上昇による誘電正接の増加分
Δtanδの値とを求め、絶縁の劣化、吸湿の度合、
ボイド含有程度およびコロナ放電の発生状態を判
定する。なお、誘電正接tanδがtanδ0から所定の
値、増加した時の印加電圧をコロナ開始電圧V1
としており、また、コロナ放電が起らない上限の
電圧をV0maxとすると、電圧Vnでの増加分は
Δtanδ=tanδ(Vn−V0max)と表わすことができ
る。誘電正接tanδを測定する装置としては、例え
ば第2図に示すシエーリング・ブリツジがある。
第2図のシエーリング・ブリツジにおいて、Vは
電源、CxおよびRxはそれぞれ被試験機器に当る
測定試料の等価直列静電容量および等価直列抵抗
である。また、Csは無損失の標準コンデンサ、
R3は平衡用可変抵抗、C4は平衡用可変コンデン
サ、R4は無誘導抵抗、そしてGは検流器である。
ブリツジの接続点aとbの間には等価直列静電容
量Cxと等価直列抵抗Rxが直列に、接続点bとc
の間には平衡用可変抵抗R3が、また接続点cと
dの間には平衡用可変コンデンサC4と無誘導抵
抗R4が並列に、そして接続点dとaの間には無
損失の標準コンデンサCsがそれぞれ接続されて
いる。また、接続点bとdの間には検流器Gが接
続されている。電源Vは接続点aとcの間に接続
されており、接続点cはアースされている。い
ま、平衡用可変抵抗R3および平衡用可変コンデ
ンサC4の値を加減して、ブリツジの平衡が得ら
れたとすると、次式が成立する。
[Prior art] Conventional non-destructive insulation testing methods of this type include:
For example, there is a method of examining the relationship between the dielectric loss tangent tan δ and the applied voltage in a dielectric loss tangent test. FIG. 1 shows the tan δ-applied voltage characteristic, where the vertical axis shows the dielectric loss tangent tan δ in percentage (%), and the horizontal axis shows the applied voltage in kilovolts (kv). For high voltage dry insulation, tanδ−
Measurement of applied voltage characteristics is generally carried out.
If there is a gap (void) inside the insulator, etc.
As the voltage increases, corona discharge occurs here, so the dielectric loss tangent tan δ increases. Therefore, the value tanδo of the dielectric loss tangent at a relatively low voltage V 0 where no corona discharge occurs and therefore the dielectric loss tangent tanδ is constant,
Find the increase in dielectric loss tangent Δtanδ due to the voltage rise at voltage Vn, and calculate the deterioration of insulation, the degree of moisture absorption,
Determine the degree of void inclusion and the state of occurrence of corona discharge. In addition, the applied voltage when the dielectric loss tangent tan δ increases from tan δ 0 by a predetermined value is called the corona starting voltage V1.
Further, if the upper limit voltage at which corona discharge does not occur is V 0 max, the increase in voltage Vn can be expressed as Δtan δ = tan δ (Vn - V 0 max). An example of a device for measuring the dielectric loss tangent tan δ is a shearing bridge shown in FIG.
In the Schering bridge shown in FIG. 2, V is the power supply, and Cx and Rx are the equivalent series capacitance and equivalent series resistance of the measurement sample corresponding to the device under test, respectively. Also, Cs is a lossless standard capacitor,
R 3 is a variable resistor for balancing, C 4 is a variable capacitor for balancing, R 4 is a non-inductive resistor, and G is a galvanometer.
An equivalent series capacitance Cx and an equivalent series resistance Rx are connected in series between the bridge connection points a and b, and the connection points b and c
A balancing variable resistor R3 is connected between them, a balancing variable capacitor C4 and a non-inductive resistor R4 are connected in parallel between connection points c and d, and a lossless resistance is connected between connection points d and a. Standard capacitors Cs are connected to each. Further, a galvanometer G is connected between connection points b and d. A power supply V is connected between connection points a and c, and connection point c is grounded. Now, assuming that the bridge balance is obtained by adjusting the values of the variable balancing resistor R 3 and the variable balancing capacitor C 4 , the following equation holds true.

Cx=R4/R3Cs …(1) Rx=C4/CsR3 …(2) 従つて、測定試料の誘電正接tanδxは tanδx=ωR4C4 …(3) となる。 Cx=R4/R3Cs…(1) Rx=C4/CsR3…(2) Therefore, the dielectric loss tangent tanδx of the measurement sample is tanδx=ωR4C4 …(3) becomes.

そこで、印加電圧を変えながら、測定試料の静
電容量変化および抵抗変化を測定し、tanδ−印加
電圧特性を求めることにより絶縁構成および絶縁
性能の試験をおこなつていた。
Therefore, the insulation configuration and insulation performance were tested by measuring capacitance changes and resistance changes of the measurement sample while changing the applied voltage, and determining tan δ - applied voltage characteristics.

しかし、従来の誘電正接による試験方法では、
低圧機器の場合のようにコロナ開始電圧が機器の
定格電圧以上にある場合、第1図に示す誘電正接
の増加分Δtanδの測定のために印加電圧を上昇さ
せていくと、機器自体を絶縁破壊させる危険性が
あり、特に劣化後の機器の非破壊試験方法として
は不適当であつた。
However, in the conventional test method using dielectric loss tangent,
When the corona onset voltage is higher than the rated voltage of the equipment, as in the case of low-voltage equipment, when the applied voltage is increased to measure the increase in dielectric loss tangent Δtanδ shown in Figure 1, the equipment itself may break down. There was a risk that this method would cause damage to the equipment, making it inappropriate as a non-destructive testing method for equipment, especially after it has deteriorated.

〔発明の概要〕[Summary of the invention]

この発明は、上記のような従来のものの欠点を
除去するためになされたもので、被試験機器を圧
力容器内に入れ、圧力容器内気体圧を減圧させる
は、または、圧力容器内の気体を空気より最小火
花電圧の低い気体にすることにより、コロナ開始
電圧を定格電圧以下に引き下げた非破壊絶縁試験
方法を提供することを目的としている。
This invention was made in order to eliminate the drawbacks of the conventional ones as described above. The purpose of the present invention is to provide a non-destructive insulation testing method in which the corona onset voltage is lowered to below the rated voltage by using a gas with a lower minimum spark voltage than air.

〔発明の実施例〕[Embodiments of the invention]

そこで、この発明の試験方法の一実施例を図に
ついて説明する。第3図はこの発明による試験に
用いた測定試料10を示しており、1は導体、2
は導体1の絶縁物で、芳香族ポリアミド繊維を主
絶縁材料としている。また3は絶縁物2の回りに
密着して取り付けられた電極である。第4図と第
5図にそれぞれ劣化前の測定試料10と劣化後の
測定試料10′の断面図が示されており、第4図
の劣化前の測定試料10では導体1と絶縁物2が
よく密差しているが、250℃で48時間加熱劣化さ
せた第5図の測定試料10′では導体1と熱劣化
した絶縁物の間に空隙4が生じている。第6図は
第5図の劣化後の測定試料10′の長手方向の断
面図を示しており、導体1と電極3との間には電
圧Vが印加されている。図中、dは絶縁物2の厚
み、lgは空隙4の距離を示している。また、第7
図は第6図の電気的等価回路を示しており、Ca
は空隙4のない部分の絶縁物2の静電容量、Cg
は空隙4の静電容量、Ciは空隙4と直列の絶縁物
2の静電容量である。この時、空隙4でのコロナ
開始電圧をVgとすると、空隙4にコロナを発生
させうる印加電圧Vは、 V=(1+Cg/Ci)Vg …(4) となる。コロナ開始電圧Vgは、よく知られてい
るパツシエン(Paschen)の法則により雰囲気の
圧力と空隙4の距離lgの積に比例し、また、空
隙4の静電容量Cgは雰囲気の比誘電率と空隙4
により決まる。また、(4)式は、圧力Pの関数とし
て(5)式のように表わせる。
Therefore, one embodiment of the test method of the present invention will be described with reference to the drawings. FIG. 3 shows a measurement sample 10 used in the test according to the present invention, where 1 is a conductor, 2 is a conductor, and 2 is a conductor.
is the insulator of the conductor 1, and the main insulating material is aromatic polyamide fiber. Further, reference numeral 3 denotes an electrode attached closely around the insulator 2. FIGS. 4 and 5 show cross-sectional views of the measurement sample 10 before deterioration and the measurement sample 10' after deterioration, respectively. In the measurement sample 10 before deterioration in FIG. However, in the measurement sample 10' shown in FIG. 5, which was heat-degraded at 250° C. for 48 hours, a gap 4 was formed between the conductor 1 and the heat-deteriorated insulator. FIG. 6 shows a longitudinal cross-sectional view of the measurement sample 10' after deterioration in FIG. 5, and a voltage V is applied between the conductor 1 and the electrode 3. In the figure, d indicates the thickness of the insulator 2, and lg indicates the distance of the gap 4. Also, the seventh
The figure shows the electrical equivalent circuit of Figure 6, and Ca
is the capacitance of insulator 2 in the part without void 4, Cg
is the capacitance of the air gap 4, and Ci is the capacitance of the insulator 2 in series with the air gap 4. At this time, if the corona starting voltage in the gap 4 is Vg, the applied voltage V that can generate corona in the gap 4 is as follows: V=(1+Cg/Ci)Vg (4). The corona starting voltage Vg is proportional to the product of the atmospheric pressure and the distance lg of the air gap 4 according to the well-known Paschen's law, and the capacitance Cg of the air gap 4 is proportional to the relative dielectric constant of the atmosphere and the air gap. 4
Determined by Furthermore, equation (4) can be expressed as a function of pressure P as shown in equation (5).

V=(1+Cg/Ci)Vg(P) …(5) (5)式により、減圧された雰囲気中ではある一定
減圧値まではコロナを発生しうる印加電圧Vは減
少すると予想され、誘電正接tanδ測定時のコロナ
開始電圧も当然大気圧に比べれば小さくなること
が期待できる。また、空気よりも最小火花電圧の
低い雰囲気中で同様に測定をおこなえば、コロナ
を発生しうる印加電圧Vはさらに減少することが
期待される。
V=(1+Cg/Ci)Vg(P)...(5) From equation (5), it is expected that in a reduced pressure atmosphere, the applied voltage V that can generate corona will decrease up to a certain reduced pressure value, and the dielectric loss tangent tanδ Naturally, it can be expected that the corona start voltage during measurement will be lower than atmospheric pressure. Further, if similar measurements are performed in an atmosphere with a lower minimum spark voltage than air, it is expected that the applied voltage V that can generate corona will be further reduced.

第8図には実際の試験装置が示されている。第
8図において、10は第3図ないし第5図に示さ
れた測定試料(実際には10,10′)20は圧
力容器、21は圧力容器20内の圧力を示す圧力
計、22は第2図に示したシエーリング・ブリツ
ジのようなtanδ測定器、23は真空ポンプ、24
は真空ポンプ23と圧力容器20とをつなぐ管に
設けられたバルブ、25はヘリウムガスボンベ、
そして、26はヘリウムガスボンベ25と圧力容
器20とをつなぐ管に設けられたバルブである。
測定試料10は圧力容器20の中に入れられ、
tanδ測定器22によつて導体1と電極3(第3〜
6図参照)の間に電圧が印加され、そのtanδ−印
加電圧特性が測定される。圧力容器20内の空気
圧は真空ポンプ23により所望の圧力にすること
ができる。また、空気より火花発生電圧の低い例
えば、ヘリウムガス中で同様な試験をおこなう時
には、ヘリウムガスボンベ25を使つて圧力容器
20内の空気をヘリウムガスに交換し、かつこれ
を所望の圧力にすることができる。なお、ヘリウ
ムガスは圧力容器20の耐圧力漏れ試験等によく
用いられる。そこで、圧力容器20内に第4図、
第5図に示したそれぞれ劣化前、劣化後の測定試
料10,10′を入れ、空気圧を大気圧から減圧
した場合のtanδ−印加電圧特性、さらに、圧力容
器20内にヘリウムガスを入れ、そのヘリウムガ
ス圧を減圧した場合のtanδ−印加電圧特性をそれ
ぞれについて求めてみた。その結果は以下の通り
である。なお、気圧はミリメートルエツチジー
(mmHg)を単位とした。
FIG. 8 shows an actual test device. In FIG. 8, 10 is the measurement sample shown in FIGS. 3 to 5 (actually 10, 10') 20 is a pressure vessel, 21 is a pressure gauge that indicates the pressure inside the pressure vessel 20, and 22 is a pressure gauge. A tan δ measuring device such as the Schering Bridge shown in Figure 2, 23 a vacuum pump, 24
is a valve installed in a pipe connecting the vacuum pump 23 and the pressure vessel 20, 25 is a helium gas cylinder,
Further, 26 is a valve provided in a pipe connecting the helium gas cylinder 25 and the pressure vessel 20.
The measurement sample 10 is placed in a pressure vessel 20,
The tanδ measuring device 22 measures the conductor 1 and electrode 3 (third to third
(See Figure 6), a voltage is applied between them, and the tan δ-applied voltage characteristic is measured. The air pressure inside the pressure vessel 20 can be adjusted to a desired pressure by a vacuum pump 23. In addition, when performing a similar test in, for example, helium gas, which has a lower spark generation voltage than air, it is necessary to use a helium gas cylinder 25 to exchange the air in the pressure vessel 20 with helium gas and bring it to the desired pressure. I can do it. Note that helium gas is often used for pressure leakage tests of the pressure vessel 20 and the like. Therefore, inside the pressure vessel 20, as shown in FIG.
The test samples 10 and 10' before and after deterioration shown in FIG. The tanδ-applied voltage characteristics were determined for each when the helium gas pressure was reduced. The results are as follows. Note that the atmospheric pressure is expressed in units of millimeter Hg (mmHg).

まず、第9図は空気圧を減圧した場合のtanδ−
印加電圧特性曲線図である。曲線A1,A2,A3
劣化前の測定試料10のそれぞれ765mmHg(大
気圧)、100mmHg、10mmHgにおけるものであ
り、曲線B1,B2,B3は劣化後の測定試料10′の
それぞれ765mmHg(大気圧)、100mmHg、10mm
Hgにおけるものである。tanδの立ち上がりは、
765tmmHg(大気圧)のものに比べて圧力が100
mmHg、10mmHgと減圧されるに従い急峻とな
り、かつ、コロナ開始電圧が減圧と共に低くなる
のがわかる。また、劣化前と劣化後のtanδの曲線
のパターンを比べてみると、減圧していくに従つ
て印加電圧軸方向に圧縮されたパターンとなる
が、それぞれの傾向は同じであり劣化前と劣化後
の有意差がわかる。
First, Figure 9 shows tanδ− when the air pressure is reduced.
It is an applied voltage characteristic curve diagram. Curves A 1 , A 2 , and A 3 are for the measurement sample 10 before deterioration at 765 mmHg (atmospheric pressure), 100 mmHg, and 10 mmHg, respectively, and curves B 1 , B 2 , and B 3 are for the measurement sample 10' after deterioration. 765mmHg (atmospheric pressure), 100mmHg, 10mm respectively
This is in Hg. The rise of tanδ is
The pressure is 100% lower than that of 765tmmHg (atmospheric pressure).
It can be seen that as the pressure decreases from mmHg to 10 mmHg, it becomes steeper, and that the corona start voltage decreases as the pressure decreases. Also, when comparing the tanδ curve patterns before and after deterioration, the pattern becomes compressed in the axial direction of the applied voltage as the pressure decreases, but the respective trends are the same. You can see the significant difference afterward.

次の第10図は、ヘリウムガスの、圧力を減圧
した場合のtanδ−印加電圧特性曲線図である。曲
線A1とB1はそれぞれ第9図の曲線A1とB1と同じ
もの、すなわち空気中における劣化前、劣化後の
測定試料765mmHg(大気中)におけるものであ
り、曲線Ah1,Ah2は、ヘリウムガス中での劣化
前の測定試料10のそれぞれヘリウムガス圧765
mmHg(大気圧)、100mmHg、におけるものであ
り、また曲線Bh1,Bh2は劣化後の測定試料1
0′のそれぞれヘリウムガス圧765mmHg(大気
圧)、100mmHgにおけるものである。空気中とヘ
リウムガス中のコロナ開始電圧をそれぞれの765
mmHgで比べてみると、ヘリウムガスを使用した
時はコロナ開始電圧がかなり低くなつていること
がわかる。また、ヘリウムガス中においても、劣
化前、劣化後のそれぞれのtanδの曲線パターンは
同じ傾向である。
The following FIG. 10 is a tan δ-applied voltage characteristic curve diagram when the pressure of helium gas is reduced. Curves A 1 and B 1 are the same as curves A 1 and B 1 in Fig. 9, respectively, that is, the measurement samples were measured at 765 mmHg (in the atmosphere) before and after deterioration in the air, and the curves Ah 1 and Ah 2 is the helium gas pressure 765 of each measurement sample 10 before deterioration in helium gas
mmHg (atmospheric pressure) and 100 mmHg, and curves Bh1 and Bh2 are for measurement sample 1 after deterioration.
0' at a helium gas pressure of 765 mmHg (atmospheric pressure) and 100 mmHg, respectively. The corona starting voltage in air and helium gas is 765, respectively.
Comparing in mmHg, it can be seen that the corona initiation voltage is considerably lower when helium gas is used. Furthermore, even in helium gas, the curve patterns of tan δ before and after degradation have the same tendency.

また、第11図には劣化前の測定試料10を使
つて、空気中およびヘリウムガス中においてそれ
ぞれ気体圧を減圧した場合の気体圧とコロナ開始
電圧との関係が示されている。図において、縦軸
にはコロナ開始電圧がキロボルト(kV)で、ま
た横軸には気体圧がミリメートルエツチジ−(mm
Hg)でとつてあり、曲線Aは空気中のもの、曲
線Ahはヘリウムガス中のものである。なお、気
体圧は対数目盛でとつてある。空気中の76.5mmH
g(大気圧)におけるコロナ開始電圧に比べて、
空気中の100mmHgでのコロナ開始電圧は約1/2、
そして、ヘリウムガス中の765mmHgでは約1/3に
なつている。
Further, FIG. 11 shows the relationship between gas pressure and corona start voltage when the gas pressure is reduced in air and helium gas using the measurement sample 10 before deterioration. In the figure, the vertical axis shows the corona onset voltage in kilovolts (kV), and the horizontal axis shows the gas pressure in millimeter etchings (mm).
Curve A is in air, and curve Ah is in helium gas. Note that gas pressure is measured on a logarithmic scale. 76.5mmH in air
Compared to the corona onset voltage at g (atmospheric pressure),
The corona starting voltage at 100 mmHg in air is approximately 1/2,
And at 765 mmHg in helium gas, it is about 1/3.

以上のことから、圧力容器内の圧力を減圧する
こと、或はガスの種類を変えることにより、コロ
ナ開始電圧を下げてtanδ−印加電圧特性の測定が
でき、かつ、そのtanδの曲線のパターンが空気中
の大気圧の場合のものと相似形であることから、
非破壊絶縁試験方法として利用できることが立証
された。
From the above, by reducing the pressure inside the pressure vessel or changing the type of gas, it is possible to lower the corona initiation voltage and measure the tanδ-applied voltage characteristic, and the pattern of the tanδ curve can be changed. Since it is similar to the case of atmospheric pressure in air,
It has been proven that this method can be used as a non-destructive insulation testing method.

なお、使用されるガスはヘリウムに限られるも
のではない。
Note that the gas used is not limited to helium.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によれば、絶縁構成お
よび絶縁性態の良否を診断する非破壊絶縁試験方
法において、被測定機器の雰囲気の圧力およびそ
の種類を変えることにより、コロナ開始電圧を被
測定機器の定格電圧以下に下げることができ、低
圧電気機器の非破壊絶縁試験を容易におこなうこ
とができるという効果が得られる。
As described above, according to the present invention, in a non-destructive insulation test method for diagnosing the quality of the insulation configuration and insulation state, the corona initiation voltage can be adjusted by changing the pressure and type of the atmosphere of the equipment under test. It is possible to lower the voltage below the rated voltage of the equipment, and it is possible to easily perform non-destructive insulation tests on low-voltage electrical equipment.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はtanδ−印加電圧特性曲線図、第2図は
シエーリング・ブリツジの回路図、第3図はこの
発明による絶縁試験に用いた測定試料の斜視図、
第4図は劣化前の測定試料の断面図、第5図は劣
化後の測定試料の断面図、第6図は劣化後の測定
試料の長手方向の断面図、第7図は第6図の測定
試料の電気的等価回路図、第8図はこの発明の一
実施例の試験装置の概略図、第9図は空気中での
tanδ−印加電圧特性曲線図、第10図はヘリウム
ガス中でのtanδ−印加電圧特性曲線図、第11図
は気体圧とコロナ開始電圧の関係を示す線図であ
る。 10…測定試料、20…圧力容器、22…tanδ
測定器、23…真空ポンプ、25…ヘリウムガス
ボンベ。尚、図中、同一符号は、同一又は相当部
分を示す。
Fig. 1 is a tan δ-applied voltage characteristic curve diagram, Fig. 2 is a circuit diagram of a Schering bridge, and Fig. 3 is a perspective view of a measurement sample used in an insulation test according to the present invention.
Figure 4 is a sectional view of the measurement sample before deterioration, Figure 5 is a sectional view of the measurement sample after deterioration, Figure 6 is a longitudinal sectional view of the measurement sample after deterioration, and Figure 7 is the same as in Figure 6. Fig. 8 is a schematic diagram of a test device according to an embodiment of the present invention, and Fig. 9 is an electrical equivalent circuit diagram of a measurement sample.
FIG. 10 is a tan δ-applied voltage characteristic curve diagram in helium gas, and FIG. 11 is a diagram showing the relationship between gas pressure and corona starting voltage. 10...Measurement sample, 20...Pressure vessel, 22...tanδ
Measuring instrument, 23...vacuum pump, 25...helium gas cylinder. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】 1 電気機器の絶縁構成および絶縁性能の良否を
誘電正接の測定により診断する非破壊絶縁試験方
法において、被試験機器を圧力容器内に入れ、こ
の圧力容器内の空気の圧力を減圧するか或は前記
空気をその最小火花電圧よりも低い最小火花電圧
を有する気体に変えることによりコロナ開始電圧
を前記被試験機器の定格電圧以下に引き下げてお
こなう非破壊絶縁試験方法。 2 空気よりも最小火花電圧が低い気体がヘリウ
ムガスである特許請求の範囲第1項記載の非破壊
絶縁試験方法。
[Claims] 1. In a nondestructive insulation testing method for diagnosing the quality of the insulation configuration and insulation performance of electrical equipment by measuring the dielectric loss tangent, the equipment under test is placed in a pressure vessel, and the pressure of the air in the pressure vessel is measured. A non-destructive insulation testing method in which the corona onset voltage is lowered to below the rated voltage of the equipment under test by reducing the pressure of the air or changing the air to a gas having a minimum spark voltage lower than the minimum spark voltage. 2. The non-destructive insulation testing method according to claim 1, wherein the gas having a lower minimum spark voltage than air is helium gas.
JP16063483A 1983-08-30 1983-08-30 Method of non-destructive insulation test Granted JPS6050460A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16063483A JPS6050460A (en) 1983-08-30 1983-08-30 Method of non-destructive insulation test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16063483A JPS6050460A (en) 1983-08-30 1983-08-30 Method of non-destructive insulation test

Publications (2)

Publication Number Publication Date
JPS6050460A JPS6050460A (en) 1985-03-20
JPH0412432B2 true JPH0412432B2 (en) 1992-03-04

Family

ID=15719163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16063483A Granted JPS6050460A (en) 1983-08-30 1983-08-30 Method of non-destructive insulation test

Country Status (1)

Country Link
JP (1) JPS6050460A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257572A (en) * 1987-04-15 1988-10-25 北上製紙株式会社 Deodorizing aromatic composition

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5535657B2 (en) * 1974-06-03 1980-09-16

Also Published As

Publication number Publication date
JPS6050460A (en) 1985-03-20

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