JPH041621B2 - - Google Patents

Description

[Detailed description of the invention]

(Industrial Application Field) The present invention relates to an apparatus for inspecting disorders of the human eye, and particularly to an apparatus for inspecting the crystalline lens of the human eye. In more detail,
The present invention relates to an eye disorder testing device by observing or recording an optical cross-sectional image of the crystalline lens of a human eye. (Prior art) There is already an eyeball lens cross-section observation device that can observe an optical cross-sectional image of the crystalline lens by projecting a slit light onto the human eye lens and observing the lens from a direction oblique to the projection axis of the slit light. It is publicly known. In this case, the imaging plane of the observation optical system is set on a plane containing the intersection line between the slit plane containing the slit light projected onto the eyeball and the main plane of the imaging optical system in the observation optical system. It is also known that by arranging the lenses, the entire optical cross-sectional image of the crystalline lens can be observed in a focused state. This optical arrangement is known as the Shear Impulf principle, and a crystalline lens cross-section observation device that utilizes this principle is
For example, it is disclosed in Japanese Patent Application No. 52-18511.
This known device has the advantage of being able to observe the entire optical cross-sectional image of the lens formed by the slit projection light in a focused state, but it can only observe one cross-section at a time, and that cross-section is There is also the inconvenience that it is not possible to display or record what is being done. (Object of the invention) The present invention provides a method for observing a cross section of the crystalline lens of an eye to be examined.
An object of the present invention is to provide an eye disorder testing device that can display the position of a cross section being observed. (Configuration of the Invention) In order to achieve the above object, an eye disorder testing device according to the present invention has the following configuration. That is, the apparatus of the present invention has a slit projection means for projecting slit light onto the subject's eye, and a crystalline lens cross section observation optical system for observing or recording the optical cross section of the crystalline lens of the subject's eye caused by the slit light. a polarizer is disposed in the slit projection means; and an imaging lens having an optical axis substantially coaxial with the slit light projection optical axis and forming an intermediate image of the pupil image of the eye to be examined; a reticle having an index disposed on a surface and parallel to the longitudinal direction of the slit light; and a relay optical system having an analyzer whose polarization direction is perpendicular to the polarizer for imprinting the intermediate image and the index image onto a recording means. and a slit projection position observation optical system for observing the intermediate image, the index image, and the corneal reflection image of the slit light. In this configuration of the present invention, when the analyzer is retracted from the optical path, the corneal reflected light of the slit projection light enters the observation optical system, so this corneal reflected light is observed together with an intermediate image of the pupil of the eye to be examined. The alignment of the device with respect to the eye to be examined and the slit light projection position can be confirmed. In addition, when observing and photographing, by inserting an analyzer into the optical path, the action of the polarizer and analyzer blocks corneal reflected light, allowing observation and recording without the effects of harmful light. .
In a preferred embodiment of the present invention, the slit projection position is displayed on the same recording surface as the observation optical system, for example, on the photographic film surface. (Effects of the Invention) According to the present invention, the position where the slit light is projected, that is, the position of the crystalline lens cross section to be observed and recorded, is recorded or observed by the slit projection position recording optical system and the slit projection position observation optical system. Monitoring of eye disorders such as cataracts over time can be conveniently performed. (Description of Embodiments) Overall Configuration Referring to FIG. 1, the eye disorder testing apparatus embodying the present invention includes a slit projection optical system 10, a crystalline lens cross-section imaging optical system 20, and a transillumination imaging optical system 30.
, an observation optical system 40, and a density chart photographing system 45.
These optical systems are all housed within the housing 100. Slit Projection Optical System 10 The slit projection optical system 10 has a tungsten bulb 101 for observation and a xenon lamp 103 for photography as light sources, and a condenser lens 10 is provided between the tungsten bulb 101 and the xenon lamp 103.
2 is placed. Further, a condenser lens 104 is provided to guide the light beam from the light source along the projection optical path 10a, and an aperture 105 and a slit diaphragm 106 are arranged along the projection optical path 10a. The slit diaphragm 106 passes the light beam from the light source through a thin slit, and the slit light beam that has passed through the slit diaphragm 106 is
After passing through the objective lens 107 and being reflected at a right angle by a mirror 110, passing through a second objective lens 108 and being reflected at a right angle by a half mirror 109,
It is projected onto the subject's eye Et in the direction of the projection optical axis _O0 . A filter 111 is provided in the projection optical path 10a as necessary.
is arranged so that it can be taken in and taken out. The condensing lens 102 is a tungsten light bulb 101
The filament image is focused on the electrode gap of the xenon lamp 103, that is, on the light emitting point position, and the condenser lens 104 converts the light from these light sources into a parallel beam of light. The first objective lens 107 has a slit aperture 10
The front focal point is at position 6, and the slit aperture is 106.
The light flux passing through is considered to be a parallel light flux. The second objective lens 108 focuses the light beam passing through the first objective lens 107 on the anterior main crystalline lens of the eye Et to be examined as a slit image _S0 . As is well known in general slit lamps, it is desirable that the slit length and slit width of the slit diaphragm 106 can be arbitrarily adjusted. Place it and
It is desirable to be able to project a circular spot light of any size onto the anterior segment of the subject's eye. moreover,
A polarizer 112 made of a polarizing filter is inserted into the projection optical path 10a for the purpose described later. Crystalline lens cross-section imaging optical system 20 This optical system 20 has an imaging lens 201, a flip-up mirror 202, and a photographic film surface 203. The optical axis 20a of the imaging lens 201 is aligned with the eye to be examined.
It is arranged obliquely with respect to the slit image _S0 on Et, and the photographic film surface 203 is also arranged obliquely with respect to the optical axis 20a. The imaging lens 201 and the film surface 203 are arranged so that the principal surface 201a of the imaging lens 201 and the extension of the film surface 203 form a slit so as to satisfy the principle of shear improvement with respect to the slit image _S0 on the eye Et. They are arranged so that they intersect on the plane containing the image _S0 . With this arrangement, the slit cross-sectional image _S1 formed on the film surface 203 can be brought into focus over almost the entire cross section. The flip-up mirror 202 is the photographic film surface 203
It is normally inserted in the photographing optical path as shown by the solid line in the figure, and reflects the light beam passing through the imaging lens 201 toward the observation optical system 40 in the direction of the optical axis 20b. This mirror 202 is synchronized with a shutter (not shown) and is flipped up to the position shown by the imaginary line in the figure, allowing the light beam from the imaging lens 201 to pass through the film surface 203. Transillumination photography optical system 30 This optical system 30 has an objective lens 301 arranged so that its optical axis O ₁ is on the transmission optical axis of the slit projection optical system 10, that is, the projection optical axis O ₀ of the slit light beam. A reticle 302 is provided to form an image of the light beam passing through the objective lens 301. The light beam from the reticle 302 is transmitted to the mirror 303
, and is directed to the flip-up mirror 202 via relay lenses 304 and 307. The light flux from the relay lens 307 is directed toward the film surface 203 by the mirror 202 during imaging, that is, when the flip-up mirror 202 is in the flip-up position shown by the imaginary line in the figure, and the lens of the eye Et to be examined is exposed to the film surface 203. Visualize the whole picture. An analyzer 306 made of a polarizing plate is provided between the relay lenses 304 and 304, and this analyzer 306 is arranged so that its polarization axis is perpendicular to the polarization axis of the polarizer 112, and the analyzer 306 is arranged so that the direction of its polarization axis is perpendicular to the polarization axis of the polarizer 112. Prevents reflected light from the cornea of the eye to be examined from reaching the film surface. A half mirror 305 is located behind the relay lens 304.
A part of the light beam passing through the relay lens 304 is reflected toward the observation optical system 40. Observation Optical System 40 This optical system 40 has a reticle 401 arranged on the reflection optical axis 20b of the flip-up mirror 202 of the optical system 20. This reticle 401 is arranged conjugately with the film surface 203, and for the purpose described later, index lines 401a and 402 are placed as shown in FIG.
It has b. When the mirror 202 is at the solid line position in the figure, the slit cross-sectional image S ₁ ' corresponding to the slit image S ₀ on the eye Et is on this reticle 401.
imaged on top. There is a mirror 402 on the optical axis 20b, and this mirror 402 reflects the light flux incident along the optical axis 20b along the observation optical axis _O2 . The observation optical axis _O2 is coaxial with the optical axis _O1 of the objective lens 301, and a relay lens 403 and a rotating reticle 404 are provided on this optical axis _O2 . The relay lens 403 and the rotating reticle 404 are optically arranged with respect to the reticle 401 based on the principle of shear improvement, and the slit cross-sectional image S ₁ ' on the reticle 401 is created by the lens 403 on the reticle ₄₀₄ . An eyepiece lens 405 is provided to observe the image on the rotating reticle 404. A relay lens 406 is disposed in the reflected optical path of the half mirror 305 of the transillumination photography optical system 30.
The light beam passing through the relay lens 406 is transferred to the mirror 407
is reflected towards the optical axis O ₂ . A half mirror 408 is arranged on the optical axis O ₂ and reflects the light beam from the mirror 407 toward the rotating reticle 404.
A transillumination image of the eye Et to be examined is formed on the reticle 404. In addition, in the reflected optical path of the half mirror 305,
An analyzer 409 similar to analyzer 306 is disposed such that it can be moved in and out of the optical path. The observation optical system 40 is also provided with a switching shutter 410 for selectively guiding either the light beam from the reticle 401 or the light beam from the half mirror 305 to the rotating reticle 404. Index projection system As shown in FIGS. 5 and 6, the reticle 3
02 consists of a holding frame 500 and a transparent glass plate 501 that is fitted and bonded to the holding frame 500.
There are grooves 502, 503 at 90° intervals in the circumferential direction.
504 and 505 are formed. This groove 5
Semicircular tubes 530, 531, 532, and 533 whose inner walls have light reflective properties are bonded onto each of the tubes 02 to 505. On the other hand, the holding frame 500 has grooves 51 along the circumferential direction.
0, 511, 512, 513 are formed, and optical fibers 52 are formed in these grooves, respectively.
0, 521, 522, and 523 are fitted and bonded, respectively. Injection end surfaces 520a, 521a, 522a, 523a of these optical fibers
is cut diagonally, and is placed at the end of the scored groove so that the diagonally cut surface faces upward. 4 optical fibers 520-523
are assembled into a bundle of fibers 524, wired to the projection optical system 10, and branched into two parts in the middle, with one input end 525 facing the xenon lamp 103 and the other input end 526 facing the tungsten lamp 101. A monochromatic filter 540 of green color, for example, is arranged between the entrance end 526 and the tungsten lamp 101 . Light from the tungsten lamp 101 is converted into green light by a filter 540, enters the optical fiber, and is emitted from the exit end. At this time, since the exit end face is obliquely cut, most of the emitted light is refracted and emitted toward the grooves 502 to 505 of the glass plate 501, and is further diffused by the diffusion surface of the groove wall before passing through the glass plate 501. and ejects it to the mirror 303 side. Further, the light flux emitted to the groove and the reflection side is reflected by the reflective inner walls of the semicircular tubes 530 to 533 and enters the groove. The rotating reticle 404 has two horizontal black lines 404d on a transparent glass plate as shown in FIGS.
The observation field part 404a is composed of an optical or magnetic code plate part 404b formed along the circumferential direction of the observation field part 404a, and a detection head 404c that detects the code of this code plate.
04a is held rotatably about the observation optical axis as a rotation axis, and the detection head 404c is fixed to the eyepiece tube. The detection head 404c detects the amount of rotation of the reticle, and the detection circuit 1000 converts it into a rotation angle value, which is digitally displayed on the display 1100.
On the other hand, the rotation angle value from the circuit 1000 is sent to the film 2 via the data imprint controller 1200.
Data recording head 1300 located directly on 03
emits light and digitally photographs the rotation angle value on film. Density Chart Imaging System 45 As shown in FIG. 1, an optical fiber 451 is arranged with one end facing the xenon lamp 103, and the other end of the optical fiber 451 consists of a relay lens 452, an ND filter 453, and a density chart 454. It is placed opposite the optical system. The light flux that has passed through the density chart 454 is reflected by a mirror 456, passes through an imaging lens 455, is reflected by the mirror 202 in the raised state, and forms an image on the film surface 203. A density chart photographing system 45 is formed by these optical arrangements. Housing 100 and its holding means As mentioned above, the above-mentioned optical system is housed in the housing 100, and the housing 100
are rotatably supported around coaxial optical axes O ₀ , O ₁ , O ₂ by suitable support means 5 such as U-shaped arms. The eyepiece lens 405 and the detection head 404c of the rotating reticle 404 are fixed to a fixed portion of the holding means 5, and are configured to remain stationary even when the housing 100 rotates. Operation After operating the shutter 410, opening the transillumination observation system, and retracting the analyzer 409 from the optical path,
The observation light source 101 of the projection optical system 10 is turned on, and the slit light from the slit 106 is projected onto the eye to be examined. The light from the light source 10 passes through the green color filter 5
40 and optical fiber 524 to illuminate the marked lines 502 to 505 of the reticle 302, the examiner can observe green crosshair images 502' to 505' within the visual field of the eyepiece as shown in FIG. When the alignment between the eye to be examined and this device is incomplete, the second
As shown in FIG.
It is also observed to be shifted from the center of the intersection of 505'. By vertically and horizontally adjusting the holding means 5, the center of the pupil image P is aligned with the center of the slit image intersection, and the slit image R is aligned with the horizontal slit images 503' to 505' (FIG. 2b). Next, analyzer 310 is inserted into the optical path. The slit image R formed by the slit light reflected from the cornea is cut by the analyzer 310 because its polarization axis is perpendicular to the polarization axis of the analyzer 310. On the other hand, the reflected light of the slit light from the fundus of the eye becomes an unpolarized light beam that has almost lost its polarization due to the diffusion effect of the fundus, and is illuminated by this reflected light to form a transillumination image of the eye to be examined. Therefore, analyzer 31
The examiner can observe the transillumination image created by the light beam that is not cut off at zero, and the observation is not affected by the corneal reflected light. Focusing of the transillumination image is achieved by moving the holding means back and forth. Next, when it is desired to observe a cross-sectional image of a cataract region, for example, an opaque area indicated by C, based on the transillumination image, the rotary reticle 404 is rotated to set the black line 404d at the desired cross-sectional meridian. (Figure 2c). The analyzer 310 is retracted from the optical path again, the housing is rotated, and the corneal reflection image R of the slit light and the horizontal slit images 503' and 50 that match this are obtained.
5' is moved to the position where it coincides with the black line 404d (Fig. 2d). Next, the optical path switching shutter 410 is switched to open the optical path on the crystalline lens cross section observation optical system side. An optical cross-sectional image of the crystalline lens produced by the slit light is once formed onto a reticle 401 by an imaging lens 201. This reticle 401 has index lines 4 as shown in FIG.
01a and 401b are formed. The front surface of the corneal cross-sectional image _C S ₁ ' is located at this index line 401a.
Check that the crystalline lens cross-sectional image _L S ₁ ' coincides with 1b. If they do not match, move the housing 100 back and forth to make them match. By this operation, the transillumination imaging position can be kept constant at all times. The cross-sectional image _L S ₁ ' on the reticle 401 is formed on the rotating reticle 404 via the mirror 402, the relay lens 403, and the half mirror 408, and the image S ₁ '' is observed through the eyepiece lens. When photographing an illuminated image or a cross-sectional image, the flip-up mirror 20 is activated by operating a photographic release switch (not shown).
At the same time as 2 is flipped up, the xenon lamp 10
3 lights up. By flipping up the flip-up mirror 202, the optical path for photographing the crystalline lens cross section is opened, and the cross-sectional image is transferred to the film 2.
03 as shown in FIG. At the same time, the transillumination image passes through the half mirror 305 together with the crosshair image of the reticle 302, and after a corneal reflection slit image is cut out by the analyzer 306, it is reflected at the flip-up position of the flip-up mirror and onto the film 203. Imprinted in the photo. The film 203 is rotated by the rotation of the housing 100.
The positions of the crosshair images 502' to 505' on the film 203 do not change because they are rotated together, but the crystalline lens transillumination image P is imprinted at a relative rotational position as the housing 100 rotates. Therefore, the positions of the horizontal crosshair images 503' and 505' indicate the slit cutting plane, that is, the crystalline lens cross-sectional position. When you want to observe and record a cross section along the same lens meridian based on the previous photographic record in order to observe and record changes in cataract over time, first change the rotation angle to the value of the crosshair rotation angle data 1500a in the film. Align the black line 404d of the reticle while looking at the display on the display 1100, then look through the eyepiece, rotate the housing 100 so that the horizontal crosshair image is at the position of the set black line 404d, and perform slit projection. Set the direction. At the same time, the density chart image 454a is reflected at the flip-up position of the flip-up mirror via the density chart photographing optical system, and is imprinted on the film 203. Furthermore, the rotation angle amount of the black line 404d, ie, the slit incident angle amount 1300a, is imprinted on this film as a digital value by the data imprinting head. Other Embodiments As shown in FIGS. 8a and 8b, a reflective prism 2000 is attached after the grooves 502 to 505, and an optical fiber 524 is adhered to one surface of the reflective prism 2000, so that the light from the fiber is The light may be reflected by the reflective surface of the prism 2000 and transmitted through the grooves. Further, a photographic tube may be provided in place of the eyepiece, and the observation irradiation may be performed using infrared light, and a VTR device may be used in place of the photographic film.
Furthermore, transillumination observation may be performed using a circular light beam instead of a slit light beam.

[Brief explanation of drawings]

Fig. 1 is a schematic diagram of the optical system of an eye disorder testing device showing one embodiment of the present invention, Figs. 4 is a schematic diagram showing an example of a captured image; FIG. 5 is a front view of the reticle in the transillumination photographing optical system; and FIG. 6 is a diagram of the reticle in FIG. 5. 7 is a front view of the rotating reticle of the eyepiece, FIG. 8a is a partial front view of the reticle of the transillumination photography optical system, and FIG. 8b is a part of the reticle in FIG. 8a. FIG. 10... Slit projection optical system, 20... Crystalline lens cross section imaging optical system, 30... Transillumination imaging optical system, 4
0... Observation optical system, 45... Density chart photographing system, 106... Slit diaphragm, 201... Imaging lens, 202... Lifting mirror, 203... Photographing film surface, 301... Objective lens, 403...
...Imaging lens, 405...Eyepiece lens.

Claims (1)

[Scope of Claims] 1. An eye disorder testing device having a slit projection means for projecting slit light onto the crystalline lens of an eye to be examined, and a crystalline lens cross section observation optical system for observing or recording the optical cross section of the crystalline lens by the slit light. a polarizer is disposed in the slit projection means; an imaging lens having an optical axis substantially coaxial with the slit light projection optical axis and forming an intermediate image of the pupil image of the eye to be examined; a reticle having an index disposed on a surface and parallel to the longitudinal direction of the slit light; and a relay optical system having an analyzer whose polarization direction is perpendicular to the polarizer for imprinting the intermediate image and the index image onto a recording means. and a slit projection position observation optical system for observing the intermediate image, the index image, and the corneal reflection image of the slit light. Fault testing equipment. 2. The inspection device according to claim 1, wherein the slit projection means and the crystalline lens cross-section observation optical system are configured to be rotatable together with the projection optical axis as a rotation axis. 3. The inspection device according to claim 1 or 2, wherein the imaging surface of the crystalline lens cross section observation optical system and the imaging surface of the slit projection position recording optical system are the same imaging surface. 4. Claims 1 to 3, characterized in that there are at least four indicators arranged in a cross.
Inspection device according to any one of paragraphs. 5. The indicators are arranged in a straight line in a direction perpendicular to the arrangement direction of the first indicator pair and the first indicator pair arranged on the same straight line, and each indicator has a length with respect to each indicator of the first indicator pair. 5. The inspection device according to claim 4, further comprising a pair of second indicators having different values. 6. The inspection device according to any one of claims 1 to 7, wherein the indicator is a luminescent indicator. 7. The inspection device according to claim 6, wherein the index comprises a marked line engraved on the reticle and illumination means for illuminating the marked line. 8. The slit projection position observation optical system includes a relay optical system that relays the intermediate image and the index image to the second imaging point;
and a rotating reticle having a second index that is arranged on the second imaging point and is rotatable around the optical axis. Inspection equipment.