JPH0435004B2 - - Google Patents
Info
- Publication number
- JPH0435004B2 JPH0435004B2 JP6085285A JP6085285A JPH0435004B2 JP H0435004 B2 JPH0435004 B2 JP H0435004B2 JP 6085285 A JP6085285 A JP 6085285A JP 6085285 A JP6085285 A JP 6085285A JP H0435004 B2 JPH0435004 B2 JP H0435004B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- axis direction
- probe
- length
- tip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、被測定物の寸法や形状等を計測する
計測装置に係り、水平に支持された計測主軸の上
下方向の傾きによて生じる計測プローブ先端の位
置誤差の補正に利用できる。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a measuring device that measures the dimensions, shape, etc. of an object to be measured, and the present invention relates to a measuring device that measures the size, shape, etc. of an object to be measured. It can be used to correct positional errors at the tip of the measurement probe.
[背景技術とその問題点]
従来の計測装置は、ベツドにX軸ユニツトをX
軸方向へ移動自在に、このX軸ユニツトにコラム
をZ軸方向へ移動自在に、このコラムに主軸頭を
Y軸方向へ移動自在にそれぞれ設け、前記主軸頭
に先端に計測プローブを取付けた計測主軸を回転
可能に収納した構造である。[Background technology and its problems] Conventional measuring devices have an X-axis unit attached to the bed.
A column is provided on the X-axis unit so as to be movable in the axial direction, a column is provided on the X-axis unit so as to be movable in the Z-axis direction, and a spindle head is provided on this column so as to be movable in the Y-axis direction, and a measurement probe is attached to the tip of the spindle head. It has a structure in which the main shaft is rotatably housed.
ところが、計測主軸を水平に支持しようとする
と、計測主軸の先端には計測プローブが取付けら
れるため、計測主軸の基端側が主軸頭に支持され
る構造となるので、必然的に計測プローブの先端
が下方へ傾斜することになる。 However, when trying to support the measurement spindle horizontally, the measurement probe is attached to the tip of the measurement spindle, so the proximal end of the measurement spindle is supported by the spindle head, so the tip of the measurement probe inevitably becomes It will slope downward.
従つて、計測プローブのY軸方向の移動位置を
検出するに当つては、計測プローブ先端の位置を
検出すれば、正確な位置データが得られるが、実
際には計測プローブ先端の位置を検出することは
不可能である。 Therefore, when detecting the moving position of the measurement probe in the Y-axis direction, accurate position data can be obtained by detecting the position of the tip of the measurement probe, but in reality, the position of the tip of the measurement probe is detected. That is impossible.
そこで、現在では、計測プローブの近傍の主軸
頭の部分を計測しているが、計測位置から計測プ
ローブ先端までの距離によつて誤差が生じている
のが実状である。 Therefore, at present, the part of the spindle head near the measurement probe is measured, but the reality is that errors occur depending on the distance from the measurement position to the tip of the measurement probe.
[発明の目的]
ここに、本発明の目的は、このような従来の欠
点を解消すべくなされたもので、水平に支持され
た計測主軸の上下方向の傾きによつて生じる計測
プローブ先端の上下方向の位置誤差を補正する傾
き補正機能付計測装置を提供することにある。[Object of the Invention] It is an object of the present invention to solve the above-mentioned conventional drawbacks, and to solve the above-mentioned problem of the above-mentioned conventional problems. An object of the present invention is to provide a measuring device with a tilt correction function that corrects positional errors in directions.
[問題点を解決するための手段および作用]
そのため、本発明では、計測主軸を増感へ移動
させる部材の主軸方向における異なる部分の上下
方向の移動量をそれぞれ求め。この移動量の差か
ら計測プローブ先端の位置を求めるようにしたも
のである。[Means and effects for solving the problem] Therefore, in the present invention, the amount of vertical movement of different parts in the direction of the main axis of the member that moves the main measurement axis toward sensitization is determined. The position of the tip of the measurement probe is determined from the difference in the amount of movement.
具体的には、水平に支持されかつ先端に計測プ
ローブを取付けた計測主軸を、予め設定された手
順に従つて三次元方向へ自動的に移動させつつ、
計測プローブが被測定物に関与したときの計測主
軸の移動量から被測定物の寸法や形状等を計測す
る計測装置において、前記計測主軸を上下方向へ
移動させる部材の主軸方向の異なる部分の上下方
向の移動量をそれぞれ検出する一対の測長手段を
設け、この一対の測長手段で検出された測長値か
ら計測プローブ先端の上下方向位置を求める手段
を設けた、ことを特徴としている。 Specifically, the measurement spindle, which is supported horizontally and has a measurement probe attached to its tip, is automatically moved in three-dimensional directions according to a preset procedure.
In a measuring device that measures the dimensions, shape, etc. of an object to be measured based on the amount of movement of the measurement spindle when a measurement probe is involved in the measurement object, the upper and lower parts of the member that moves the measurement spindle in the vertical direction differ in the main axis direction. The present invention is characterized in that a pair of length measuring means for detecting the amount of movement in each direction is provided, and means is provided for determining the vertical position of the tip of the measurement probe from the length measurement values detected by the pair of length measuring means.
[実施例]
第1図は本発明の計測装置の一実施例を示して
いる。同図において、ベツド1の上面後部には、
案内溝2に沿つてサドル3が駆動装置4の駆動に
よりベツド1の左右方向(X軸方向)へ移動自在
に設けられている。前記駆動装置4は、前記ベツ
ド1の上面にX軸方向に沿つて回転可能に支持さ
れかつ前記サドル3と螺合する送りねじ軸5と、
この送りねじ軸5を回転させるモータ6とから構
成されている。[Embodiment] FIG. 1 shows an embodiment of the measuring device of the present invention. In the same figure, at the rear of the top surface of bed 1,
A saddle 3 is provided along the guide groove 2 so as to be movable in the left-right direction (X-axis direction) of the bed 1 by driving a drive device 4. The drive device 4 includes a feed screw shaft 5 rotatably supported on the upper surface of the bed 1 along the X-axis direction and screwed into the saddle 3;
It is composed of a motor 6 that rotates this feed screw shaft 5.
また、前記サドル3の上面には、案内溝12に
沿つてコラム13が駆動装置14の駆動によりベ
ツド1の前後方向(Z軸方向)へ移動自在に設け
られている。前記駆動装置14は、前記サドル3
の上面にZ軸方向に沿つて回転可能に支持されか
つ前記コラム13と螺合する送りねじ軸15と、
この送りねじ軸15を回転させるモータ16とか
ら構成されている。 Further, a column 13 is provided on the upper surface of the saddle 3 along the guide groove 12 so as to be movable in the front-rear direction (Z-axis direction) of the bed 1 by driving a drive device 14. The drive device 14 drives the saddle 3
a feed screw shaft 15 rotatably supported along the Z-axis direction on the upper surface and screwed into the column 13;
It is composed of a motor 16 that rotates this feed screw shaft 15.
また、前記コラム13には、図示しない案内を
介して主軸頭21が駆動装置24の駆動により前
記ベツド1の上下方向(Y軸方向)へ移動可能に
設けられている。前記駆動装置24は、前記コラ
ム13にY軸方向に沿つて回転可能に支持されか
つ前記主軸頭21と螺合する送りねじ軸25と、
この送りねじ軸25を回転させるモータ26とか
ら構成されている。更に、前記主軸頭21には、
先端に複数種の計測プローブ221〜224,22
oを選択的に装着する計測主軸23が回転可能に
支持されている。 Further, a spindle head 21 is provided on the column 13 so as to be movable in the vertical direction (Y-axis direction) of the bed 1 by driving a drive device 24 via a guide (not shown). The drive device 24 includes a feed screw shaft 25 rotatably supported by the column 13 along the Y-axis direction and screwed into the spindle head 21;
It is composed of a motor 26 that rotates this feed screw shaft 25. Furthermore, in the spindle head 21,
Multiple types of measurement probes 22 1 to 22 4 , 22 at the tip
A measuring main shaft 23 to which the o is selectively mounted is rotatably supported.
一方、前記ベツド1の上面前部には、予め複数
種の計測プローブ221〜224,22oをストツ
クしそれを選択的に前記計測主軸23へ取付ける
計測プローブ自動交換装置31と、較正スタンド
32とがそれぞれ設けられている。計測プローブ
自動交換装置31は、複数種の計測プローブ22
1〜224,22oを予め保持する複数のプローブ
ストツカ331〜335を有し、これらが選択的に
上下方向へ昇降できるようになつている。プロー
ブ交換に当つて、計測プローブ221〜224,2
2oのうち、例えば計測プローブ221が次の計測
工程で指定されると、その計測プローブ221の
プローブストツカ331と空のプローブストツカ
335とが上昇される。この状態において、計測
主軸23に装着されている計測プローブ22oが
空のプローブストツカ335に保持された後、計
測主軸23の三次元方向への移動によりプローブ
ストツカ331の計測プローブ221が計測主軸2
3へ装着される。この後、上昇したプローブスト
ツカ331,335が元の位置まで下降され、一連
のプローブ交換が終了する。 On the other hand, at the front of the upper surface of the bed 1, there is provided an automatic measurement probe exchanger 31 that stores a plurality of types of measurement probes 22 1 to 22 4 , 22 o in advance and selectively attaches them to the measurement spindle 23, and a calibration stand. 32 are provided respectively. The measurement probe automatic exchange device 31 replaces multiple types of measurement probes 22.
It has a plurality of probe stockers 33 1 to 33 5 that hold probes 1 to 22 4 and 22 o in advance, and these can be selectively raised and lowered in the vertical direction. When replacing the probes, the measurement probes 22 1 to 22 4 , 2
For example, when the measurement probe 22 1 among the 2 o is designated in the next measurement process, the probe stocker 33 1 of the measurement probe 22 1 and the empty probe stocker 33 5 are raised. In this state, after the measurement probe 22 o attached to the measurement spindle 23 is held in the empty probe stocker 33 5 , the measurement probe 22 o of the probe stocker 33 1 is moved in the three-dimensional direction of the measurement spindle 23 . 1 is measurement spindle 2
It is attached to 3. Thereafter, the raised probe stockers 33 1 and 33 5 are lowered to their original positions, completing a series of probe exchanges.
第2図は前記サドル3、コラム13および主軸
頭21の各軸方向における移動量を検出する測長
系を示している。同図において、前記ベツド1に
設けられたレーザ発振器Lからのレーザ光は、ス
プリツタS1によりX軸方向とZ軸方向とに分光さ
れる。Z軸方向へ分光されたレーザ光は、ベツド
1上に固定された干渉計I1によりX軸方向へ屈折
され、続いて前記サドル3の側面前部に固定され
たミラーM1で反射された後、干渉計I1を通つて
レシーバR1で受光される。ここにおいて、以上
述べた干渉計I1、ミラーM1およびレシーバR1に
より、X軸方向の測長手段41が構成されてい
る。 FIG. 2 shows a length measuring system for detecting the amount of movement of the saddle 3, column 13, and spindle head 21 in each axial direction. In the figure, a laser beam from a laser oscillator L provided in the bed 1 is split into two directions in the X-axis direction and the Z-axis direction by a splitter S1 . The laser beam separated in the Z-axis direction was refracted in the X-axis direction by an interferometer I 1 fixed on the bed 1, and then reflected by a mirror M 1 fixed on the front side of the saddle 3. After that, the light passes through the interferometer I1 and is received by the receiver R1 . Here, the interferometer I 1 , mirror M 1 and receiver R 1 described above constitute a length measuring means 41 in the X-axis direction.
また、前記スプリツタS1において、X軸方向へ
分光されたレーザ光は、前記サドル3に固定され
たベンダB1,B2,B3で順次屈折され、続いて前
記コラム13の側面下部に固定されたベンダB4
でY軸方向へ屈折された後、前記コラム13の側
面下部に固定されたスプリツタS2によりY軸方向
とZ軸方向とに分光される。Z軸方向へ分光され
たレーザ光は、干渉計I2を経て、前記サドル3の
上面前端縁に固定されたミラーM2で反射された
後、干渉計I2を通つてレシーバR2で受光される。
ここにおいて、前記干渉計I2、ミラーM2および
レシーバR2により、Z軸方向の測長手段42が
構成されている。 Further, in the splitter S 1 , the laser beam split in the X-axis direction is sequentially refracted by benders B 1 , B 2 , and B 3 fixed to the saddle 3, and then fixed to the lower side of the column 13. Vendor B 4
After being refracted in the Y-axis direction, the light beam is split into the Y-axis direction and the Z-axis direction by a splitter S2 fixed to the lower side of the column 13. The laser beam separated in the Z-axis direction passes through an interferometer I 2 and is reflected by a mirror M 2 fixed to the front edge of the upper surface of the saddle 3, and then passes through an interferometer I 2 and is received by a receiver R 2 . be done.
Here, the interferometer I 2 , the mirror M 2 and the receiver R 2 constitute a length measuring means 42 in the Z-axis direction.
また、前記スプリツタS2において、Y軸方向へ
分光されたレーザ光は、前記コラム13の側面上
部に固定されたベンダB5によりZ軸方向へ屈折
された後、スプリツタS3によりZ軸方向とX軸方
向とに分光される。X軸方向へ分光されたレーザ
光は、前記コラム13の上面に固定された干渉計
I3でY軸方向へ屈折され、続いて主軸頭21に固
定されたミラーM3で反射された後、干渉計I3を
通つてレシーバR3で受光される。ここにおいて、
前記干渉計I3、ミラーM3およびレシーバR3によ
り、Y軸方向の第1の測長手段43が構成されて
いる。 Further, in the splitter S 2 , the laser beam split in the Y-axis direction is refracted in the Z-axis direction by a bender B 5 fixed to the upper side of the column 13, and then split in the Z-axis direction and in the Z-axis direction by the splitter S 3 . The light is dispersed in the X-axis direction. The laser beam separated in the X-axis direction is passed through an interferometer fixed to the top surface of the column 13.
The light is refracted by I 3 in the Y-axis direction, then reflected by a mirror M 3 fixed to the spindle head 21, passes through an interferometer I 3 , and is received by a receiver R 3 . put it here,
The interferometer I 3 , mirror M 3 and receiver R 3 constitute a first length measuring means 43 in the Y-axis direction.
一方、前記スプリツタS3において、Z軸方向へ
分光されたレーザ光は、前記コラム13の側面上
部に固定されたベンダB6でX軸方向へ屈折され、
続いて前記コラム13の上面に固定された干渉計
I4でY軸方向へ屈折され、更に主軸頭21に固定
されたミラーM4で反射された後、干渉計I4を通
つてレシーバR4で受光される。ここにおいて、
前記干渉計I4、ミラーM4およびレシーバR4によ
り、Y軸方向の第2の測長手段44が構成されて
いる。 On the other hand, in the splitter S3 , the laser beam split in the Z-axis direction is refracted in the X-axis direction by a bender B6 fixed to the upper side of the column 13.
Next, an interferometer fixed to the top surface of the column 13
After being refracted in the Y-axis direction by I 4 and further reflected by a mirror M 4 fixed to the spindle head 21, the light passes through an interferometer I 4 and is received by a receiver R 4 . put it here,
The interferometer I 4 , mirror M 4 and receiver R 4 constitute a second length measuring means 44 in the Y-axis direction.
前記X軸方向の測長手段41の検出された測長
値つまりサドル3のX軸方向の移動量、前記Z軸
方向の測長手段42で検出された測長値つまりコ
ラム13のZ軸方向の移動量および前記Y軸方向
の第1、第2の測長手段41,42で検出された
測長値つまり主軸頭21のY軸方向の各移動量
は、第3図に示す如く、NC装置61へ与えられ
ている。 The length measurement value detected by the length measurement means 41 in the X-axis direction, that is, the amount of movement of the saddle 3 in the X-axis direction, and the length measurement value detected by the length measurement means 42 in the Z-axis direction, that is, the Z-axis direction of the column 13. As shown in FIG. device 61.
NC装置61は、前記X軸方向の測長手段41
から与えられる測長値とX軸方向の指令値とを比
較し、その差分だけ制御装置62を介して戦記駆
動装置4を駆動させる。また、前記Z軸方向の測
長手段42から与えられる測長値とZ軸方向の指
令値とを比較し、その差分だけ制御装置63を介
して前記駆動装置14を駆動させる。更に、前記
Y軸方向の第1、第2の測長手段43,44から
与えられる測長値と記憶装置65内に予め記憶さ
れたデータとからY軸方向の移動量を求め、この
移動量とY軸方向の指令値との差分だけ制御装置
64を介して前記駆動装置24を駆動させる。こ
のほか、各計測プローブからデータ取込み指令信
号が与えられたとき、各軸方向の測長値を被測定
物の計測値として記憶装置65内へ記憶させる。 The NC device 61 includes the length measuring means 41 in the X-axis direction.
The length measurement value given from the X-axis direction is compared with the command value in the X-axis direction, and the military drive device 4 is driven by the difference via the control device 62. Further, the length measurement value given from the length measuring means 42 in the Z-axis direction is compared with the command value in the Z-axis direction, and the drive device 14 is driven by the difference thereof via the control device 63. Furthermore, the amount of movement in the Y-axis direction is determined from the length measurement values given from the first and second length measuring means 43 and 44 in the Y-axis direction and the data stored in advance in the storage device 65, and this amount of movement is calculated. The drive device 24 is driven via the control device 64 by the difference between the command value and the command value in the Y-axis direction. In addition, when a data acquisition command signal is given from each measurement probe, the length measurement values in each axis direction are stored in the storage device 65 as measurement values of the object to be measured.
前記記憶装置65には、第4図に示す如く、計
測データが記憶されるほか、前記Y軸方向の第2
の測長手段44のレーザ光が主軸頭21に照射さ
れる位置から各計測プローブ221〜224,22
oの先端までの距離L1〜Loが記憶されているとと
もに、Y軸方向の第1、第2の測長手段43,4
4のレーザ光が主軸頭21に照射される間隔1が
記憶されている。 As shown in FIG. 4, the storage device 65 stores measurement data as well as the second data in the Y-axis direction.
Each measurement probe 22 1 to 22 4 , 22
The distances L 1 to L o to the tip of the o are stored, and the first and second length measuring means 43, 4 in the Y-axis direction are stored.
The interval 1 at which the spindle head 21 is irradiated with the 4 laser beams is stored.
次に、本実施例の作用を説明する。計測では、
計測プローブ自動交換装置31の各プローブスト
ツカ331〜335に保持された複数の計測プロー
ブ221〜224,22oが選択的に計測主軸23
に取付けられ、計測主軸23の三次元方向への移
動によりワークの形状や寸法が自動的に計測され
る。 Next, the operation of this embodiment will be explained. In measurement,
A plurality of measurement probes 22 1 to 22 4 , 22 o held in each probe stocker 33 1 to 33 5 of the measurement probe automatic exchange device 31 selectively move the measurement main shaft 23
The shape and dimensions of the workpiece are automatically measured by moving the measuring spindle 23 in three-dimensional directions.
この際、計測主軸23に装着された計測プロー
ブ221〜224,22oの検出端の三次元方向へ
の移動のうち、その計測プローブの検出端のX軸
方向への移動量つまりサドル3のX軸方向への移
動量は、X軸方向の測長手段41で検出される。
また、計測プローブの検出端のZ軸方向への移動
量つまりコラム13のZ軸方向への移動量は、Z
軸方向の測長手段42で検出される。更に、計測
プローブの検出端のY軸方向への移動量つまり主
軸頭21のY軸方向への移動量については、次の
ようにして求められる。 At this time, among the movements in the three-dimensional direction of the detection ends of the measurement probes 22 1 to 22 4 , 22 o attached to the measurement spindle 23, the amount of movement of the detection ends of the measurement probes in the X-axis direction, that is, the saddle 3 The amount of movement in the X-axis direction is detected by the length measuring means 41 in the X-axis direction.
In addition, the amount of movement of the detection end of the measurement probe in the Z-axis direction, that is, the amount of movement of the column 13 in the Z-axis direction, is
It is detected by the length measuring means 42 in the axial direction. Furthermore, the amount of movement of the detection end of the measurement probe in the Y-axis direction, that is, the amount of movement of the spindle head 21 in the Y-axis direction, is determined as follows.
いま、第5図に示す如く、第1の測長手段43
の測長値をy1、第2の測長手段44の測長値を
y2、計測プローブ先端の測長値を仮にy0とする
と、
y1−y2/y2−y0=1/L
の関係が成立するので、これから計測プローブ先
端の位置を求めることができる。 Now, as shown in FIG. 5, the first length measuring means 43
The length measurement value of y 1 is the length measurement value of the second length measurement means 44.
If y 2 is the measured length value of the tip of the measurement probe as y 0 , then the following relationship holds: y 1 - y 2 /y 2 -y 0 = 1/L, so the position of the tip of the measurement probe can be determined from this. .
要するに、第1、第2の測長手段43,44で
求められた測長値の差と、両測長手段43,44
間の計測主軸23方向の間隔1および第2の測長
手段44から計測プローブ先端までの距離Lとか
らプローブ先端の上下方向の位置を求めることが
できる。 In short, the difference between the length measurement values obtained by the first and second length measurement means 43 and 44, and the difference between the length measurement values obtained by the first and second length measurement means 43 and 44
The vertical position of the probe tip can be determined from the distance 1 in the measurement main axis 23 direction between the two and the distance L from the second length measuring means 44 to the measurement probe tip.
従つて、本実施例のよれば、水平に支持された
計測主軸23の上下方向への傾斜によつて生じる
計測プローブ先端の上下方向の位置誤差を補正で
きるので、高精度な計測が達成できる。 Therefore, according to the present embodiment, it is possible to correct the vertical positional error of the measuring probe tip caused by the vertical tilting of the horizontally supported measurement main shaft 23, so that highly accurate measurement can be achieved.
しかも、これには、計測主軸23の軸方向の異
なる位置の上下方向の移動量を検出する一対の測
長手段43,44を設ければよいので、構成的に
も比較的簡易で済む利点がある。 Furthermore, since it is sufficient to provide a pair of length measuring means 43 and 44 for detecting the amount of vertical movement of different positions in the axial direction of the main measuring shaft 23, it has the advantage of being relatively simple in terms of configuration. be.
なお、実施に当つて、X,Z,Y軸方向の測長
手段としては、上記実施例で述べたレーザ測長計
に限らず、例えばインダクトシン等でもよい。 In addition, in implementation, the length measuring means in the X, Z, and Y axis directions is not limited to the laser length measuring device described in the above embodiment, but may be, for example, an inductosyn or the like.
[発明の効果]
以上の通り、本発明によれは、水平に支持され
た計測主軸の上下方向の傾きによるプローブ先端
の上下方向の誤差を補正して高精度な計測が達成
できる計測装置を提供することができる。[Effects of the Invention] As described above, the present invention provides a measuring device that can achieve highly accurate measurement by correcting the vertical error of the probe tip caused by the vertical tilt of the horizontally supported measurement main shaft. can do.
図は本発明の計測装置の一実施例を示すもの
で、第1図は全体の外観を示す斜視図、第2図は
測長手段を示す斜視図、第3図は回路構成を示す
ブロツク図、第4図はY軸方向の測長手段のレー
ザ光と主軸頭との関係を示す説明図、第5図は計
測主軸の傾斜による補正原理を示す図である。
21……主軸頭、221〜224,22o,23
……計測主軸、43,44……第1、第2の測長
手段、61……NC装置。
The drawings show an embodiment of the measuring device of the present invention. Fig. 1 is a perspective view showing the overall appearance, Fig. 2 is a perspective view showing the length measuring means, and Fig. 3 is a block diagram showing the circuit configuration. , FIG. 4 is an explanatory diagram showing the relationship between the laser beam of the length measuring means in the Y-axis direction and the spindle head, and FIG. 5 is a diagram showing the principle of correction based on the inclination of the measurement spindle. 21... Spindle head, 22 1 to 22 4 , 22 o , 23
... Measurement main axis, 43, 44 ... First and second length measuring means, 61 ... NC device.
Claims (1)
付けた計測主軸を、予め設定された手順に従つて
三次元方向へ自動的に移動させつつ、計測プロー
ブが被測定物に関与したときの計測主軸の移動量
から被測定物の寸法や形状等を計測する計測装置
において、 前記計測主軸を上下方向へ移動させる部材の主
軸方向の異なる部分の上下方向の移動量をそれぞ
れ検出する一対の測長手段を設け、 この一対の測長手段で検出された測長値から計
測プローブ先端の上下方向位置を求める手段を設
けた、 ことを特徴とする傾き補正機能付計測装置[Claims] 1. A measuring spindle that is supported horizontally and has a measuring probe attached to its tip is automatically moved in a three-dimensional direction according to a preset procedure, while the measuring probe touches the object to be measured. In a measuring device that measures the dimensions, shape, etc. of an object to be measured from the amount of movement of a measurement spindle when A measuring device with a tilt correction function, characterized in that a pair of length measuring means is provided, and means for determining the vertical position of the tip of the measuring probe from the length measurement values detected by the pair of length measuring means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6085285A JPS61219813A (en) | 1985-03-27 | 1985-03-27 | Measuring apparatus with inclination correcting function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6085285A JPS61219813A (en) | 1985-03-27 | 1985-03-27 | Measuring apparatus with inclination correcting function |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61219813A JPS61219813A (en) | 1986-09-30 |
| JPH0435004B2 true JPH0435004B2 (en) | 1992-06-09 |
Family
ID=13154322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6085285A Granted JPS61219813A (en) | 1985-03-27 | 1985-03-27 | Measuring apparatus with inclination correcting function |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61219813A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111336966B (en) * | 2020-05-18 | 2020-11-06 | 南京泰普森自动化设备有限公司 | Measuring device and measuring brace for shaft parts |
-
1985
- 1985-03-27 JP JP6085285A patent/JPS61219813A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61219813A (en) | 1986-09-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5467289A (en) | Method of and an apparatus for measuring surface contour | |
| EP1327495B1 (en) | Measuring method and device, machine tool having such device, and work processing method | |
| US5446545A (en) | Method of and apparatus for calibrating machines including a measuring probe and a measuring apparatus | |
| US4838696A (en) | Pulsed robotic inspection | |
| JP5745646B2 (en) | Error measuring method and machine tool | |
| GB1597842A (en) | Indexing mechanism | |
| JP2006509194A (en) | Workpiece inspection method | |
| JP2020139948A (en) | How to calibrate the measuring probe of the gear cutting machine | |
| JPS6128921B2 (en) | ||
| JPS5916202B2 (en) | Measuring and positioning device using interference fringes | |
| JP4799472B2 (en) | Measuring method and apparatus for tool edge position, workpiece processing method and machine tool | |
| JP5235284B2 (en) | Measuring method and machine tool | |
| JP3524385B2 (en) | 3D shape measuring device | |
| JPS63292005A (en) | Travel amount detection device with running error correction | |
| JP2005121370A (en) | Surface shape measuring apparatus and surface shape measuring method | |
| JP2755346B2 (en) | Method and apparatus for measuring motion accuracy of automatic machine tool | |
| JPH0435004B2 (en) | ||
| JPH0123041B2 (en) | ||
| JP2005114549A (en) | Surface shape measuring apparatus and surface shape measuring method | |
| JPH0663760B2 (en) | Three-dimensional measuring method and measuring device | |
| JPH11344330A (en) | 3D shape measuring device | |
| JP2000193429A (en) | Shape measuring device | |
| JP2000298011A (en) | Shape measuring method and device | |
| JP2975434B2 (en) | Shape measuring device | |
| JP2758810B2 (en) | Shape measurement method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |