JPH0436328B2 - - Google Patents
Info
- Publication number
- JPH0436328B2 JPH0436328B2 JP12524785A JP12524785A JPH0436328B2 JP H0436328 B2 JPH0436328 B2 JP H0436328B2 JP 12524785 A JP12524785 A JP 12524785A JP 12524785 A JP12524785 A JP 12524785A JP H0436328 B2 JPH0436328 B2 JP H0436328B2
- Authority
- JP
- Japan
- Prior art keywords
- optical axis
- lens
- parallel
- axis
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 55
- 238000003384 imaging method Methods 0.000 claims description 39
- 238000000034 method Methods 0.000 claims description 9
- 238000006073 displacement reaction Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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- Testing Of Optical Devices Or Fibers (AREA)
Description
【発明の詳細な説明】
[概要]
撮像系のレンズ光軸測定方法であつて、レンズ
光軸と平行な回転軸を中心として撮像系を回転し
つつ平行光を入射して、撮像面での像の軌跡によ
り撮像面における光軸位置を測定することによ
り、撮像面における光軸の位置を容易に測定でき
るようにする。[Detailed Description of the Invention] [Summary] A method for measuring the lens optical axis of an imaging system, in which parallel light is incident on the imaging system while rotating the imaging system about a rotation axis parallel to the lens optical axis, and the optical axis is measured on the imaging surface. By measuring the optical axis position on the imaging plane based on the trajectory of the image, the position of the optical axis on the imaging plane can be easily measured.
[産業上の利用分野]
この発明は撮像系のレンズの光軸の撮像面上の
位置を測定する撮像系レンズの光軸測定方法に関
する。[Industrial Application Field] The present invention relates to a method for measuring the optical axis of an imaging system lens, which measures the position of the optical axis of an imaging system lens on an imaging surface.
一般にレンズは一担組立た後には光軸の位置が
どこにあるかの光軸測定は行なう必要はない。し
かし例えばテレビカメラを用いて立体の三次元認
識を行なう場合等においては、位置測定の基準と
なる光軸が撮像面上のどの画素に対応するかを知
らなければ正確な三次元認識を行なうことはでき
ない。 Generally, once a lens is assembled, there is no need to measure the optical axis to determine where the optical axis is. However, when performing three-dimensional three-dimensional recognition using a television camera, for example, it is difficult to perform accurate three-dimensional recognition unless you know which pixel on the imaging surface corresponds to the optical axis, which is the reference for position measurement. I can't.
[従来の技術]
従来、一般に撮像系としてテレビカメラを用い
て画像認識を行なわせる場合であつても、レンズ
の光軸が厳密にテレビカメラの撮像面のどこに位
置するかを知る必要はなく、カメラとレンズとの
機械的精度によりレンズとカメラとの光軸を一致
させておけば充分であつた。[Prior Art] Conventionally, even when performing image recognition using a television camera as an imaging system, it is not necessary to know exactly where the optical axis of the lens is located on the imaging surface of the television camera. It was sufficient to align the optical axes of the lens and camera using the mechanical precision of the camera and lens.
[発明が解決しようとする問題点]
上述のように、係る技術は従来にはなく光軸が
撮像面のどの位置に対応するかを正確かつ迅速に
知る技術が求められている。[Problems to be Solved by the Invention] As described above, such a technique has not existed in the past, and there is a need for a technique that accurately and quickly determines which position on the imaging surface the optical axis corresponds to.
[問題点を解決するための手段]
本発明は上述の技術を提供するため、撮像系レ
ンズの光軸を測定するに当り、先ず撮像系レンズ
の光軸と回転軸とを平行に設定し、そしてこの撮
像系を回転軸を中心に回転させると共にレンズに
平行光を入射してこの平行光の撮像面上の結像の
軌跡に基づいて撮像面上の光軸の位置を測定する
ようにした。[Means for Solving the Problems] In order to provide the above-mentioned technique, the present invention first sets the optical axis of the imaging system lens and the rotation axis in parallel when measuring the optical axis of the imaging system lens, Then, this imaging system is rotated around the rotation axis, parallel light is incident on the lens, and the position of the optical axis on the imaging surface is measured based on the locus of the image formed on the imaging surface of this parallel light. .
[作用]
第1図1に示したように焦点距離fの薄レンズ
1と撮像面3とからなる撮像系の光軸Aと回転軸
Bとが平行で、平行光2の入射方向が光軸Aと任
意の角θであり、撮像面3に結像している場合、
像5は光軸Aと結像面3との交点4からγ(=f
tanθ)だけ離れた個所に結ばれる。[Function] As shown in FIG. 1, the optical axis A and rotation axis B of the imaging system consisting of the thin lens 1 with the focal length f and the imaging surface 3 are parallel, and the direction of incidence of the parallel light 2 is the optical axis. A and an arbitrary angle θ, and when the image is formed on the imaging surface 3,
The image 5 is generated from the intersection 4 of the optical axis A and the image plane 3 by γ(=f
are connected at points separated by tanθ).
そして、ここでこの光学系を回転軸Bを中心と
して回転すると、平行光2の結像点は移動してそ
の軌跡は、第1図2に示したように光軸Aと結像
面3との交点4を中心として半径γの円を描く。
従つてこの円の軌跡を検出してこの円の中心を求
めれば交点4の撮像面3上での位置を測定するこ
とができる。尚図中Oはレンズの光学中心を示し
ている。 Then, when this optical system is rotated around the rotation axis B, the imaging point of the parallel light 2 moves and its locus changes between the optical axis A and the imaging plane 3 as shown in FIG. Draw a circle with radius γ centered at intersection 4.
Therefore, by detecting the locus of this circle and finding the center of this circle, the position of the intersection point 4 on the imaging plane 3 can be measured. Note that O in the figure indicates the optical center of the lens.
また上述した場合と同様に光軸Aと回転軸Bと
が平行であり、これに加えこれらと、平行光の入
射方向がこれらと平行である場合には、第1図
3,4に示すように、平行光の像5は光軸Aと結
像面との交点4上に結像され、光学系を回転軸B
を中心として回転しても、像5は常に交点4上に
結像される。従つて、光学系を回転しても像5の
位置が結像面上で移動しなければ、その点が光軸
Aと結像面との交点の位置を測定することができ
る。 Further, as in the above case, when the optical axis A and the rotation axis B are parallel, and in addition, when the incident direction of the parallel light is parallel to these, as shown in FIGS. 3 and 4, , an image 5 of parallel light is formed on the intersection 4 of the optical axis A and the imaging plane, and the optical system is rotated along the rotation axis B.
Even when rotating around , the image 5 is always focused on the intersection point 4. Therefore, if the position of the image 5 does not move on the image plane even when the optical system is rotated, the position of the intersection of the optical axis A and the image plane can be measured.
このことは、この例で示した薄レンズだけでは
なく、例えばカメラレンズ等の組合せレンズの場
合もレンズ系の主点、節点の位置から考えれば、
全く同様となる。 This is true not only for the thin lens shown in this example, but also for combination lenses such as camera lenses, if we consider the positions of the principal points and nodes of the lens system.
It will be exactly the same.
[実施例]
以下本発明に係るレンズの光軸測定方法の実施
例を説明する。まず第1の実施例として第1図
1,2に対応するレンズの光軸と回転軸とを平行
とする場合を説明する。本実施例において回転軸
とレンズ光軸とを平行にするには、レンズ11端
面の環状部材の良好な機械精度を利用する。即
ち、第2図に示すように、テレビカメラ10に被
測定レンズ11を取り付けこれを、例えば2軸の
ゴニオメータ等の微動装置を備え、光軸Aの方向
を垂直方向から微小に変化させることができる取
付台12に取り付け、更にこの取付台12を基盤
15に取り付けられる回転台13に光軸が上下方
向に向くように取り付けるようにする。ここで回
転台12の回転軸Bの方向は基盤15に対して略
垂直になつているため、光軸Aと回転軸Bとは略
同方向となつている。[Example] Hereinafter, an example of the method for measuring the optical axis of a lens according to the present invention will be described. First, as a first example, a case will be described in which the optical axis of the lens and the rotation axis are parallel to each other, which corresponds to FIGS. 1 and 2. In this embodiment, in order to make the rotation axis and the lens optical axis parallel, the good mechanical precision of the annular member on the end surface of the lens 11 is utilized. That is, as shown in FIG. 2, a lens to be measured 11 is attached to a television camera 10 and equipped with a fine movement device such as a two-axis goniometer, so that the direction of the optical axis A can be slightly changed from the vertical direction. Furthermore, this mounting base 12 is attached to a rotary table 13 attached to a base 15 so that the optical axis is directed in the vertical direction. Here, since the direction of the rotation axis B of the rotary table 12 is substantially perpendicular to the base 15, the optical axis A and the rotation axis B are substantially in the same direction.
そして回転台12を回転しつつ、レンズ11先
端部に固定される環状部材16の基盤15からの
変位を測定し、取付台12のゴニオメータを調整
して、この端部16の基盤15からの変位の変化
の零とする。 Then, while rotating the turntable 12, the displacement of the annular member 16 fixed to the tip of the lens 11 from the base 15 is measured, and the goniometer of the mounting base 12 is adjusted to determine the displacement of this end 16 from the base 15. Let the change in be zero.
この変位の測定には、第2図に示したように基
盤15上に取り付けられたスタンド17に設けら
れた非接触式のマイクロセンサ18により行な
う。 This displacement is measured by a non-contact type microsensor 18 provided on a stand 17 mounted on a base 15, as shown in FIG.
ここでレンズ11は特殊な場合を除き光軸Aに
対して回転対称であることを前提として設計、製
作されるからその機械的精度は高く、例えば、複
数の単レンズを組合せたシステムレンズにおける
個々の単レンズに与えられる一般的な偏心の公差
は、傾き1′〜2′、変位0.01mm〜0.02mmである(写
真工業1982年8月号第114頁〜第117頁中川治平
「最新レンズ設計講座23」レンズ設計に付随する
諸問題(1)参照)。従つてレンズ先端部の精度も充
分良好なものであり、一例として、直径100mlの
レンズを回転させて、その先端部の光軸方向の変
位が10μm以下のとき、レンズの光軸の振れは
0.006゜以下である。一般的な変位検出機構でその
変位を1μmのオーダで計測することは十分可能
であり、取付台12の微動装置として十分精度の
良いものを用いれば、レンズ先端部の光軸方向の
変位を10μm以下にすることが容易なことは実験
によつて確かめられている。上記の0.006゜という
数字は実用上十分な精度であり、これによつて、
レンズ光軸と、回転軸を平行に設定できたことに
なる。 Here, the lens 11 is designed and manufactured on the assumption that it is rotationally symmetrical with respect to the optical axis A except in special cases, so its mechanical precision is high. The general eccentricity tolerance given to a single lens is 1' to 2' inclination and 0.01 mm to 0.02 mm in displacement. (Refer to ``Lecture 23'' Problems Associated with Lens Design (1)). Therefore, the accuracy of the lens tip is sufficiently good. For example, when a lens with a diameter of 100 ml is rotated and the displacement of the tip in the optical axis direction is 10 μm or less, the optical axis deflection of the lens is
It is less than 0.006°. It is quite possible to measure the displacement on the order of 1 μm with a general displacement detection mechanism, and if a sufficiently accurate fine movement device for the mount 12 is used, the displacement of the lens tip in the optical axis direction can be measured on the order of 10 μm. It has been confirmed through experiments that the following is easy to do. The above figure of 0.006° is accurate enough for practical use, so
This means that the lens optical axis and rotation axis can be set parallel.
次に第3図に示すように、このレンズ11にコ
リメータ19から平行光を光軸Aに対して任意の
角度θで照射しつつ、回転台13を回転して、レ
ンズ11及びカメラ10を回転軸Bを中心として
回転させる。このときレンズ焦点は無限遠に対し
てピント合わせをしておく。 Next, as shown in FIG. 3, the lens 11 is irradiated with parallel light from the collimator 19 at an arbitrary angle θ with respect to the optical axis A, and the rotating table 13 is rotated to rotate the lens 11 and camera 10. Rotate around axis B. At this time, the lens should be focused at infinity.
するとカメラの撮像面には第1図2で示したよ
うな像の軌跡が表われ、この円を撮像面に配置さ
れた撮像素子で検出して、電気的に処理し、この
円の中心を求めれば、撮像面における光軸Aの位
置を求めることができる。従つて本実施例によれ
ば、光軸Aと回転軸Bとを平行にするだけで容易
に撮像面における光軸位置を測定することができ
る。 Then, an image trajectory as shown in Fig. 1 and 2 appears on the camera's imaging surface, and this circle is detected by an image sensor placed on the imaging surface and electrically processed to determine the center of this circle. Once determined, the position of the optical axis A on the imaging plane can be determined. Therefore, according to this embodiment, the optical axis position on the imaging plane can be easily measured by simply making the optical axis A and the rotation axis B parallel.
次に本発明の第2の実施例について説明する。
本実施例は、第1図3,4に示した方法を行な
う。 Next, a second embodiment of the present invention will be described.
In this embodiment, the method shown in FIGS. 3 and 4 is performed.
この実施例においては、先ず、平行光の照射方
向と回転台12の回転軸Bとを平行とする。これ
は第4図に示したように、平面鏡を用いてオート
コリメーシヨンを行なうことにより実現する。即
ち基盤15上には、回転軸Bの方向を微小に変化
させる、例えば2軸のゴニオメータ等の微動機構
を有する回転台20を設け、この回転台20上に
鏡面21aと底面とが平行に形成された平面鏡2
1を設置し、この平面鏡21に基盤15上に設け
たスタンド22に設置したオートコリメータ23
から平行光を照射して、回転台20を回転しても
常に反射光がオートコリメータ23の光源位置に
結像するように接眼部23aをのぞきつつ回転台
20の微動機構を調整する。この調整が完了する
と、オートコリメータ23からの照射光の方向と
回転台20の回転軸とは平行となる。 In this embodiment, first, the irradiation direction of the parallel light and the rotation axis B of the rotary table 12 are made parallel. This is achieved by performing autocollimation using a plane mirror, as shown in FIG. That is, a rotary table 20 having a fine movement mechanism, such as a two-axis goniometer, for minutely changing the direction of the rotation axis B is provided on the base 15, and a mirror surface 21a and a bottom surface are formed parallel to each other on this rotary table 20. flat mirror 2
1 and an autocollimator 23 installed on a stand 22 provided on the base 15 on this plane mirror 21.
The fine movement mechanism of the rotating table 20 is adjusted while looking through the eyepiece 23a so that the reflected light is always focused on the light source position of the autocollimator 23 even when the rotating table 20 is rotated. When this adjustment is completed, the direction of the irradiated light from the autocollimator 23 and the rotation axis of the rotary table 20 become parallel.
次にこの回転台の回転軸Bとレンズ光軸Aとを
平行にするが、これは先の実施例で第2図に基づ
いて説明した通りであり、詳細な説明は省略す
る。 Next, the rotation axis B of this rotary table and the lens optical axis A are made parallel, but this is as explained in the previous embodiment based on FIG. 2, and detailed explanation will be omitted.
そしてこの光軸Aと回転軸Bとが平行となつた
後、これらの軸に平行な平行光を先に用いたオー
トコリメータ23からレンズ11に照射すると共
に回転台を回転する。すると撮像面には第1図4
に示したような像が結像され、レンズ11の回転
によつては移動せず、この点が求める撮像面上の
光軸の位置である。 After the optical axis A and the rotation axis B become parallel, the lens 11 is irradiated with parallel light parallel to these axes from the previously used autocollimator 23, and the rotation table is rotated. Then, the image shown in Fig. 14 appears on the imaging surface.
An image as shown in FIG. 1 is formed and does not move due to the rotation of the lens 11, and this point is the desired position of the optical axis on the imaging surface.
従つて、本実施例によれば、平行光を照射して
像を得た後において、特別な処理は不要であり、
特別な機材を用いることなく、撮像面上における
光軸の位置を求めることができる。 Therefore, according to this embodiment, no special processing is required after irradiating parallel light and obtaining an image.
The position of the optical axis on the imaging plane can be determined without using special equipment.
[発明の効果]
以上説明したように、本発明によれば、レンズ
光軸と回転軸とを平行とし、このレンズに平行光
を入射しつつレンズを回転させ、この平行光の像
の軌跡に基づいて撮像面上の光軸の位置を測定す
るようにしたから、極めて容易かつ正確に撮像面
上における光軸の位置を測定でき、三次元認識等
に用いられる個々のテレビカメラの光軸を迅速に
測定することができ、正確な三次元認識を行なう
ことができる等の効果を奏する。[Effects of the Invention] As explained above, according to the present invention, the optical axis of the lens and the rotation axis are made parallel, the lens is rotated while parallel light is incident on the lens, and the locus of the image of the parallel light is Since the position of the optical axis on the imaging surface can be measured based on the above, it is possible to measure the position of the optical axis on the imaging surface extremely easily and accurately. This provides effects such as rapid measurement and accurate three-dimensional recognition.
第1図1,2,3,4は本発明の原理を説明す
る図、第2図乃至第5図は本発明を実施する場合
の実施例を示すものであつて、第2図はレンズ光
軸と回転軸とを平行とする場合、第3図は平行光
をレンズに任意角度をもつて照射する場合、第4
図は平行光照射方向と回転軸とを平行とする場
合、第5図はレンズ光軸と平行に平行光を照射す
る場合、を夫々示す斜視図である。
A…レンズ光軸、B…回転軸、2…平行光、3
…撮像面、5…軌跡。
1, 2, 3, and 4 are diagrams for explaining the principle of the present invention, and FIGS. 2 to 5 show examples of carrying out the present invention. When the axis and the rotation axis are parallel, Fig. 3 shows that when parallel light is irradiated onto the lens at an arbitrary angle, Fig.
This figure is a perspective view showing the case where the parallel light irradiation direction and the rotation axis are parallel, and FIG. 5 is a perspective view showing the case where parallel light is irradiated parallel to the lens optical axis. A... Lens optical axis, B... Rotation axis, 2... Parallel light, 3
...imaging surface, 5...trajectory.
Claims (1)
化さた撮像系の回転軸とレンズの光軸とを平行に
設定し、 該撮像系をこの回転軸を中心に回転させると共
に、前記光軸に対し角度θの方向からレンズに平
行光線を入射して、この平行光線の撮像面上の結
像の軌跡に基づいて円形像の中心位置を求めるこ
とにより撮像面におけるレンズ光軸位置を測定す
ることを特徴とするレンズの光軸測定方法。[Claims] 1. The rotational axis of an integrated imaging system including a lens and imaging surface with almost no eccentricity is set parallel to the optical axis of the lens, and the imaging system is rotated around this rotational axis. At the same time, a parallel ray is incident on the lens from a direction at an angle θ with respect to the optical axis, and the center position of the circular image is determined based on the locus of the image formed on the imaging surface of the parallel ray. A method for measuring an optical axis of a lens, the method comprising measuring the optical axis position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12524785A JPS61284633A (en) | 1985-06-11 | 1985-06-11 | Measuring method for optical axis of lens |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12524785A JPS61284633A (en) | 1985-06-11 | 1985-06-11 | Measuring method for optical axis of lens |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61284633A JPS61284633A (en) | 1986-12-15 |
| JPH0436328B2 true JPH0436328B2 (en) | 1992-06-15 |
Family
ID=14905407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12524785A Granted JPS61284633A (en) | 1985-06-11 | 1985-06-11 | Measuring method for optical axis of lens |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61284633A (en) |
-
1985
- 1985-06-11 JP JP12524785A patent/JPS61284633A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61284633A (en) | 1986-12-15 |
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| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |