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JPH0439640B2 - - Google Patents
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JPH0439640B2 - - Google Patents

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Publication number
JPH0439640B2
JPH0439640B2 JP8313083A JP8313083A JPH0439640B2 JP H0439640 B2 JPH0439640 B2 JP H0439640B2 JP 8313083 A JP8313083 A JP 8313083A JP 8313083 A JP8313083 A JP 8313083A JP H0439640 B2 JPH0439640 B2 JP H0439640B2
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JP
Japan
Prior art keywords
peak
magnet
magnetic
magnetic pole
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8313083A
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Japanese (ja)
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JPS59206800A (en
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Filing date
Publication date
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Priority to JP8313083A priority Critical patent/JPS59206800A/en
Publication of JPS59206800A publication Critical patent/JPS59206800A/en
Publication of JPH0439640B2 publication Critical patent/JPH0439640B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 本発明は例えば核融合炉用材、高速増殖炉用炉
材の中性子損傷試験或いはその他の材料に軽イオ
ン照射下のクリープ試験等に使用するビーム電流
分布均一化マグネツト装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a beam current distribution homogenizing magnet device used, for example, in neutron damage tests of fusion reactor materials, fast breeder reactor materials, or creep tests under light ion irradiation of other materials. .

核融合炉用炉材、高速増殖炉用炉材の中性子損
傷のシユミレーシヨンとして、サイクロトロンよ
り射出する軽イオンによる照射下クリープ試験が
行なわれている。
As a simulation of neutron damage to reactor materials for fusion reactors and fast breeder reactors, creep tests under irradiation using light ions ejected from a cyclotron have been conducted.

この照射下クリープ試験は、一定温度、一定荷
重のもとで試料に軽イオンビームを照射し、軽イ
オンビームを照射しない場合(熱クリープのみ)
との、試料のクリープ速度の差異を検出すること
により、軽イオン照射下のクリープ特性を得るこ
とを目的としている。この材料クリープ特性は、
温度に最も敏感なために、試料の温度制御が重要
となる。この試験では、試料中心から発する赤外
線の波長を検出し、その温度特性から試料温度を
求め、これを試料加熱電源にフイードバツクする
ことにより、温度制御を行なつている。しかしな
がら上記サイクロトロンから取り出される軽イオ
ンビームは、ビーム輸送系四極電磁石群の集束作
用によりビーム電流分布はガウス分布となる。こ
のようなガウス分布をした軽イオンビームを試料
に照射した場合、試料中心付近の温度は、試料端
の温度に比べて上昇する。したがつて、試料に与
える加熱を実際よりも小さく制御し、熱クリープ
のみの場合よりも試料の平均温度は低下するため
に、軽イオン照射によるクリープが見かけ上小さ
くなる。この理由により、ビーム電流分布がガウ
ス分布の場合には、精密な軽イオン照射下クリー
プ試験は困難であつた。
In this irradiation creep test, the sample is irradiated with a light ion beam at a constant temperature and under a constant load, and the sample is not irradiated with a light ion beam (thermal creep only).
The aim is to obtain the creep characteristics under light ion irradiation by detecting the difference in the creep rate of the sample. This material creep property is
Since it is most sensitive to temperature, temperature control of the sample is important. In this test, the temperature is controlled by detecting the wavelength of infrared rays emitted from the center of the sample, determining the sample temperature from its temperature characteristics, and feeding this back to the sample heating power source. However, the beam current distribution of the light ion beam taken out from the cyclotron becomes a Gaussian distribution due to the focusing action of the group of quadrupole electromagnets in the beam transport system. When a sample is irradiated with a light ion beam having such a Gaussian distribution, the temperature near the center of the sample increases compared to the temperature at the edges of the sample. Therefore, the heating applied to the sample is controlled to be smaller than it actually is, and the average temperature of the sample is lower than in the case of only thermal creep, so that the creep caused by light ion irradiation appears to be smaller. For this reason, precise creep tests under light ion irradiation are difficult when the beam current distribution is Gaussian.

軽イオン照射下クリープ試験において、照射ビ
ーム電流分布は照射試料面で均一であることが要
求される。
In the creep test under light ion irradiation, the irradiation beam current distribution is required to be uniform on the irradiated sample surface.

本発明はかかる目的を達成するもので、加速器
より取り出され、ビーム輸送系により輸送される
ガウス分布のビーム電流分布を台形分布のビーム
電流分布に変換するビーム電流均一化マグネツト
装置を提供するものである。
The present invention achieves this object by providing a beam current uniformizing magnet device that converts a Gaussian beam current distribution taken out from an accelerator and transported by a beam transport system into a trapezoidal beam current distribution. be.

すなわち、本発明は、ビームの進行方向に第1
の磁石と第2の磁石を前後2椴に配置し、これら
前段、後段の磁石の各磁極片の位置はビームの電
流分布方向において互いにずれた位置に配置さ
れ、その磁場は各磁極片の領域のみで部分的に高
く、前段、後段の各磁石の磁極は互いに逆向きで
それらの磁場の極性は互いに逆になつており、前
段、後段を通じて、前段の磁石はビームの半部の
働く力がビーム中心のピーク付近で発散性、ビー
ム端付近で集束性を持つようにし、後段の磁石は
ビームの残りの半部に働く力がビーム中心のピー
ク付近で発散性、ビーム端付近で集束性をもつよ
うにし、これによつてこれら前段と後段の磁石は
夫々ビームのピーク半部を夫々端の方にそらせる
ピーク発散用の磁極片と夫々ビームの端部を夫々
中心に向かつてそらせる端寄せ用の磁極片とを構
成するようにしたことを特徴とするビーム電流分
布均一化マグネツト装置である。
That is, in the present invention, the first
A magnet and a second magnet are arranged in two positions, front and rear, and the positions of the magnetic pole pieces of the front and rear magnets are shifted from each other in the beam current distribution direction, and the magnetic field is distributed in the area of each magnetic pole piece. The magnetic poles of the front and rear magnets are opposite to each other, and the polarities of their magnetic fields are opposite to each other. The force acting on the remaining half of the beam is made to have divergence near the peak at the beam center and convergence near the beam end, and the subsequent magnet causes the force acting on the remaining half of the beam to become divergent near the peak at the beam center and converge near the beam end. The front and rear magnets each have a peak diverging pole piece that deflects the peak half of the beam toward the respective ends, and an end-clamping pole piece that deflects the beam end toward the center, respectively. A beam current distribution uniformizing magnet device is characterized in that the beam current distribution is made uniform.

すなわち本発明の実施例においては、ビーム進
行方向に、前後2段に配置された磁石で構成さ
れ、個々の磁石は、夫々2組の磁極片、ヨーク、
励磁用コイル、リターンヨーク、位置調整機構等
で構成されており、これら前段、後段の磁石の各
磁極片の位置はビームの電流分布方向において互
いにずれた位置に配置され、その磁場は各磁極片
の領域のみで部分的に高く、前段、後段の各磁石
の磁極は互いに逆向きで、それらの磁場の極性は
互いに逆になつており、前段、後段を通じて、ビ
ームに働く力がビーム中心のピーク付近で発散
性、ビーム端付近で集束性を持つようにするもの
である。
That is, in the embodiment of the present invention, the magnets are arranged in two stages, front and rear, in the beam traveling direction, and each magnet has two sets of pole pieces, a yoke, and a yoke.
It consists of an excitation coil, a return yoke, a position adjustment mechanism, etc., and the positions of the magnetic pole pieces of the front and rear magnets are shifted from each other in the beam current distribution direction, and the magnetic field is The magnetic poles of the magnets in the front and rear stages are opposite to each other, and the polarities of their magnetic fields are opposite to each other. The beam has divergence near the beam and convergence near the edge.

なお本発明においては電磁石の代りに永久磁石
を用いてもよく、また本発明は単に材料の試験の
みならず、例えばラジオアイソトープ(RI)製
造装置におけるそのRI合成の効率の向上或いは
ピークによるフオイルの破断防止等にも適用しう
ることは勿論である。
In the present invention, a permanent magnet may be used instead of an electromagnet, and the present invention is not limited to simply testing materials. Of course, it can also be applied to breakage prevention, etc.

以下図面につき、本発明の一実施例を詳細に説
明する。
An embodiment of the present invention will be described in detail below with reference to the drawings.

第1図示のように、サイクロトロンの加速箱1
より射出する縦長の帯状軽イオンのビーム2は第
2図示のアルミニウム等の非磁性体よりなる縦長
矩形状のダクト3を通してターゲツト4に案内す
る。このターゲツト4に例えば軽イオン照射下で
クリープ試験を行なうための上下方向に荷重した
試料をおくものとする。なお、第2図中5はその
ダクト3を包囲する支持枠である。
As shown in the first diagram, the acceleration box 1 of the cyclotron
A beam 2 of emitted vertically elongated light ions is guided to a target 4 through a vertically elongated rectangular duct 3 made of a non-magnetic material such as aluminum as shown in the second figure. Assume that a sample loaded in the vertical direction is placed on the target 4 for performing a creep test under light ion irradiation, for example. Note that 5 in FIG. 2 is a support frame surrounding the duct 3.

第2〜4図示のように上記ダクト3の両側には
そのビーム2の進行方向に向つて第1及び第2の
電磁コイル10,10,11,11を前後2段に
順次設け、これら第1及び第2の電磁コイル1
0,10,11,11は上記支持枠5に固定する
と共に互いに逆向きに直流電流を流す。第2〜4
図では前段の第1の電磁コイル10のみを示す
が、後段の第2の電磁コイル10,11も全く同
じ構造で、これらの電磁コイル10,11は磁界
が互いに干渉しないだけ、前後方向に離間させ
る。
As shown in Figures 2 to 4, first and second electromagnetic coils 10, 10, 11, 11 are sequentially provided on both sides of the duct 3 in two stages, front and rear, in the direction of movement of the beam 2. and second electromagnetic coil 1
0, 10, 11, and 11 are fixed to the support frame 5, and direct current flows in opposite directions to each other. 2nd to 4th
In the figure, only the first electromagnetic coil 10 at the front stage is shown, but the second electromagnetic coils 10 and 11 at the rear stage have exactly the same structure, and these electromagnetic coils 10 and 11 are spaced apart in the front and rear direction so that their magnetic fields do not interfere with each other. let

第3図示のように、上記第1の電磁コイル1
0,10の中心のヨーク13,13のダクト3に
対向する面には上下方向に延びるあり溝14,1
4をレール15,15により夫々形成し、これら
のあり溝14,14には夫々上下の磁極片16,
16,17,17を上下動すべく嵌合する。
As shown in the third diagram, the first electromagnetic coil 1
Dovetail grooves 14, 1 extending in the vertical direction are provided on the surfaces of the yokes 13, 13 at the center of the yokes 13, 10 facing the duct 3.
4 are formed by rails 15, 15, respectively, and these dovetail grooves 14, 14 are provided with upper and lower magnetic pole pieces 16, respectively.
16, 17, and 17 are fitted together to move up and down.

上記上下の磁極片16,16,17,17には
夫々上下の調節棒18,18,19,19の下端
及び上端に回動するのが、上下には拘束するよう
に連結し、これらの上下の調節棒18,18,1
9,19は夫々ヨーク13,13に固定した固定
ナツト20,20,21,21に螺合し、それら
の上下の突出端部は回転工具係合用の角軸部2
2,22,23,23を形成する。
The upper and lower magnetic pole pieces 16, 16, 17, and 17 are connected to the lower and upper ends of the upper and lower adjusting rods 18, 18, 19, and 19 to rotate, respectively, and are restrained at the upper and lower ends. Adjustment rod 18, 18, 1
Numerals 9 and 19 are screwed into fixing nuts 20, 20, 21, and 21 fixed to the yokes 13 and 13, respectively, and their upper and lower protruding ends are square shaft portions 2 for engaging rotary tools.
2, 22, 23, 23 are formed.

第5図示のように第1の電磁コイル10の上の
磁極片16,16はピーク分散用の磁極で、ビー
ム2中心のピークより僅かに上に対向するよう位
置させ、また下の磁極片17,17は端寄せ用の
磁極で、ビーム2の下端に対向するように位置さ
せる。第2の電磁コイル11の下の磁極片24,
24はピーク分散用の磁極で、ビーム2中心のピ
ークより僅かに下に対向するように位置させ、ま
た上の磁極片25,25は端寄せ用の磁極で、ビ
ーム2の上端に対向するように位置させる。
As shown in FIG. 5, the upper magnetic pole pieces 16, 16 of the first electromagnetic coil 10 are magnetic poles for peak dispersion, and are positioned slightly above the central peak of the beam 2 and opposite to each other, and the lower magnetic pole piece 17 , 17 are magnetic poles for end alignment, and are positioned opposite to the lower end of the beam 2. a magnetic pole piece 24 under the second electromagnetic coil 11;
24 is a magnetic pole for peak dispersion, which is positioned slightly below the peak at the center of the beam 2 and opposed to it; upper magnetic pole pieces 25, 25 are magnetic poles for edge alignment, and are positioned so as to oppose the upper end of the beam 2. to be located.

次にこの装置の動作を説明する。 Next, the operation of this device will be explained.

サイクロトロンの加速箱1より射出した軽イオ
ンのビーム2は帯状で、第5,6,8図の曲線a
で示すようにその強度は上下方向にガウス分布し
ており、その強度分布は中心近くが強く、その上
下の周辺に到るに従つて弱くなつている。
The beam 2 of light ions ejected from the acceleration box 1 of the cyclotron is band-shaped, and is represented by curves a in Figures 5, 6, and 8.
As shown in , the intensity has a Gaussian distribution in the vertical direction, and the intensity distribution is strong near the center and becomes weaker toward the upper and lower peripheries.

而してこのビーム2が第1の電磁コイル10の
磁極片16,17間を通過すると第6図示のよう
なその磁界h1がビーム2の部分的領域に作用し、
そのピークの上半部と下端に同図矢印のような上
向きの力を与える。したがつて上の磁極片16の
磁界によりビーム2のピークの上半部が上方にそ
らされてそのピークが分散され、また下端の磁極
片17の磁界によりビーム2の下端が上方にそれ
されて下端のビームは中心に寄る。したがつてビ
ーム2の強度分布は第7図の曲線bのようにな
る。
When this beam 2 passes between the magnetic pole pieces 16 and 17 of the first electromagnetic coil 10, the magnetic field h1 acts on a partial region of the beam 2 as shown in FIG.
Apply upward force as shown by the arrows in the figure to the upper and lower ends of the peak. Therefore, the magnetic field of the upper pole piece 16 deflects the upper half of the peak of the beam 2 upward, thereby dispersing the peak, and the magnetic field of the lower pole piece 17 deflects the lower end of the beam 2 upward. The beam at the bottom is centered. Therefore, the intensity distribution of beam 2 becomes as shown by curve b in FIG.

次にビーム2が第2の電磁コイル11の磁極片
24,25間を通過すると第7図示のような磁界
h2がビーム2の部分的領域に作用し、その磁界h2
の向きは前記磁界h1の向きとは反対となるので、
そのピークの下半部と上端に同図点線矢印のよう
な下向きの力を与える。したがつて下の磁極片2
4によりビーム2のピークの下半部が下方にそら
されてそのピークが分散し、また上端の磁極片2
5の磁界によりビーム2の上端が下方にそらされ
て上端のビームは中心による。したがつてビーム
2の強度分布は第5,8図示の曲線cのように平
坦な台形分布となる。
Next, when the beam 2 passes between the magnetic pole pieces 24 and 25 of the second electromagnetic coil 11, a magnetic field as shown in FIG.
h 2 acts on a partial region of beam 2, and its magnetic field h 2
Since the direction of is opposite to the direction of the magnetic field h1 ,
Apply a downward force to the lower half and upper end of the peak, as shown by the dotted arrows in the figure. Therefore the lower pole piece 2
4 deflects the lower half of the peak of beam 2 downward, dispersing the peak, and also dispersing the upper pole piece 2.
The upper end of the beam 2 is deflected downward by the magnetic field 5, so that the upper end beam is centered. Therefore, the intensity distribution of the beam 2 becomes a flat trapezoidal distribution as shown by the curve c shown in the fifth and eighth figures.

したがつてビーム2における照射試料の負荷荷
重方向(クリープ方向)の電流分布をガウス分布
から台形分布に補正することができるものであ
る。
Therefore, the current distribution in the load direction (creep direction) of the irradiated sample in the beam 2 can be corrected from a Gaussian distribution to a trapezoidal distribution.

以上のように本発明によれば各前段、後段の磁
石の磁極片の位置の違いにより、ビームは前段、
後段磁石を通じてビーム中心のピーク付近は発散
性、ビーム端付近は集束性となるような力を受
け、ガウス分布のビーム電流分布を台形分布のビ
ーム電流分布にできる。したがつて、材料負荷荷
重試験においては負荷荷重方向に台形のビーム電
流分布をした軽イオンビームとして試料に照射で
きるので、試料の負荷荷重方向での温度分布は均
一となり、試料中心での温度制御のみで、試料全
体の温度制御が正確に行なえ、ビーム照射下の材
料クリープ特性が精密に測定でき、核融合炉用炉
材、高速増殖炉用炉材の開発に大いに寄与するも
のである。
As described above, according to the present invention, due to the difference in the position of the magnetic pole pieces of the magnets in the front and rear stages, the beam is
Through the latter-stage magnet, a force is applied that causes the beam to become divergent near the peak at the center of the beam and convergent near the ends of the beam, thereby changing the Gaussian beam current distribution to a trapezoidal beam current distribution. Therefore, in material loading tests, the sample can be irradiated with a light ion beam with a trapezoidal beam current distribution in the loading direction, so the temperature distribution of the sample in the loading direction is uniform, making it possible to control the temperature at the center of the sample. With this method, the temperature of the entire sample can be accurately controlled, and the creep characteristics of the material under beam irradiation can be precisely measured.This will greatly contribute to the development of reactor materials for fusion reactors and fast breeder reactors.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明を適用したサイクロトロンの平
面図、第2図は第1図A―A線断面における端面
図、第3図は第1図の平面図、第4図は第3図B
―B線よりみた側面図、第5図イはビームの磁極
間の関係を示す側面図的説明図、第5図ロは同平
面図的説明図、第6図はその第1の電磁コイル部
分における磁界とビームの強度分布の関係を示す
説明図、第7図はその第2の電磁コイル部分にお
ける磁界とビームの強度分布を示す説明図、第8
図は本発明によるビームの強度分布を示すグラフ
である。 2……ビーム、10,11……第1、第2の磁
石、16,24……磁極片、17,25……磁極
片。
Fig. 1 is a plan view of a cyclotron to which the present invention is applied, Fig. 2 is an end view taken along the line A--A in Fig. 1, Fig. 3 is a plan view of Fig. 1, and Fig. 4 is Fig. 3 B.
-A side view as seen from line B, Figure 5A is a side view explanatory diagram showing the relationship between the magnetic poles of the beam, Figure 5B is a top view explanatory diagram of the same, and Figure 6 is the first electromagnetic coil portion thereof. FIG. 7 is an explanatory diagram showing the relationship between the magnetic field and the beam intensity distribution in the second electromagnetic coil portion, and FIG.
The figure is a graph showing the intensity distribution of the beam according to the present invention. 2... Beam, 10, 11... First and second magnets, 16, 24... Magnetic pole piece, 17, 25... Magnetic pole piece.

Claims (1)

【特許請求の範囲】[Claims] 1 ビームの進行方向に第1の磁石と第2の磁石
を前後2段に配置し、これら前段、後段の磁石の
各磁極片の位置はビームの電流分布方向において
互いにずれた位置に配置され、その磁場は各磁極
片の領域のみで部分的に高く、前段、後段の各磁
石の磁極は互いに逆向きでそれらの磁場の極性は
互いに逆になつており、前段、後段を通じて、前
段の磁石はビームの半部に働く力がビーム中心の
ピーク付近で発散性、ビーム端付近で集束性を持
つようにし、後段の磁石はビームの残りの半部に
働く力がビーム中心のピーク付近で発散性、ビー
ム端付近で集束性をもつようにし、これによつて
これら前段と後段の磁石は夫々ビームのピークの
半部を夫々端の方にそらせるピーク発散用の磁極
片と夫々ビームの端部を夫々中心に向かつてそら
せる端寄せ用の磁極片とを構成するようにしたこ
とを特徴とするビーム電流分布均一化マグネツト
装置。
1. A first magnet and a second magnet are arranged in two stages, front and rear, in the beam traveling direction, and the positions of the magnetic pole pieces of the front and rear magnets are shifted from each other in the beam current distribution direction, The magnetic field is partially high only in the area of each magnetic pole piece, and the magnetic poles of the front and rear magnets are in opposite directions, so the polarity of their magnetic fields is opposite to each other. The force acting on one half of the beam is diverging near the peak at the beam center and convergent near the beam end, and the subsequent magnet is designed so that the force acting on the other half of the beam is diverging near the peak at the beam center. , focusing near the ends of the beam, so that these front and rear magnets each have a peak divergent pole piece that deflects half of the peak of the beam toward the ends, respectively. 1. A beam current distribution equalizing magnet device, characterized in that it comprises magnetic pole pieces for end-approaching, each of which is deflected toward the center.
JP8313083A 1983-05-11 1983-05-11 Beam current distribution uniforming magnet device Granted JPS59206800A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8313083A JPS59206800A (en) 1983-05-11 1983-05-11 Beam current distribution uniforming magnet device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8313083A JPS59206800A (en) 1983-05-11 1983-05-11 Beam current distribution uniforming magnet device

Publications (2)

Publication Number Publication Date
JPS59206800A JPS59206800A (en) 1984-11-22
JPH0439640B2 true JPH0439640B2 (en) 1992-06-30

Family

ID=13793613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8313083A Granted JPS59206800A (en) 1983-05-11 1983-05-11 Beam current distribution uniforming magnet device

Country Status (1)

Country Link
JP (1) JPS59206800A (en)

Also Published As

Publication number Publication date
JPS59206800A (en) 1984-11-22

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