JPH0459797B2 - - Google Patents
Info
- Publication number
- JPH0459797B2 JPH0459797B2 JP61149777A JP14977786A JPH0459797B2 JP H0459797 B2 JPH0459797 B2 JP H0459797B2 JP 61149777 A JP61149777 A JP 61149777A JP 14977786 A JP14977786 A JP 14977786A JP H0459797 B2 JPH0459797 B2 JP H0459797B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- output
- section
- light
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/0687—Stabilising the frequency of the laser
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/11—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on acousto-optical elements, e.g. using variable diffraction by sound or like mechanical waves
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2/00—Demodulating light; Transferring the modulation of modulated light; Frequency-changing of light
- G02F2/002—Demodulating light; Transferring the modulation of modulated light; Frequency-changing of light using optical mixing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/501—Structural aspects
- H04B10/506—Multiwavelength transmitters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/572—Wavelength control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/1303—Stabilisation of laser output parameters, e.g. frequency or amplitude by using a passive reference, e.g. absorption cell
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Semiconductor Lasers (AREA)
Description
【発明の詳細な説明】
≪産業上の利用分野≫
本発明は、半導体レーザの波長を原子や分子の
吸収線に制御して安定化する半導体レーザ波長安
定化装置の特性等の改善に関する。DETAILED DESCRIPTION OF THE INVENTION <<Industrial Application Field>> The present invention relates to improving the characteristics of a semiconductor laser wavelength stabilizing device that stabilizes the wavelength of a semiconductor laser by controlling it to the absorption line of atoms or molecules.
≪従来の技術≫
第11図は本出願人により特願昭61−11894号
明細書に記載された半導体レーザ波長安定化装置
の先行技術を示す構成ブロツク図である。<<Prior Art>> FIG. 11 is a structural block diagram showing a prior art of a semiconductor laser wavelength stabilizing device described in Japanese Patent Application No. 11894/1989 by the present applicant.
LD1は半導体レーザ、PE1はこの半導体レー
ザLD1を冷却または加熱するペルチエ素子、CT
1はこのペルチエ素子PE1を駆動して前記半導
体レーザLD1の温度を一定に制御する温度制御
手段、TB1はこれらを格納して温度変動を減少
させる恒温槽、BS1は前記半導体レーザLD1の
出力光を2方向に分離するビームスプリツタ、
UM1はこのビームスプリツタBS1の一方の出
射光を入射し変調手段を構成する音響光学変調
器、CL1はこの音響光学変調器UM1の回折光
出力を入射し特定の波長の光を吸収する標準物質
(ここではCs)を封入した吸収セル、PD1はこ
の吸収セルCL1の透過光を入射する光検出器、
A1はこの光検出器PD1の出力電気信号を入力
る増幅器、LA1はこの増幅器A1の電気出力を
入力するロツクインアンプ、CT2はこのロツク
インアンプLA1の出力を入力し前記半導体レー
ザLD1の電流を制御する制御手段を構成する
PIDコントローラ、SW1は前記音響光学変調器
UM1にその一端が接続するスイツチ、SG1は
その出力で前記スイツチSW1が周波数fm(例え
ば2kHz)でオンオフする信号発生器、SG2は前
記スイツチでSW1の他端に接続する周波数fD(例
えば80MHz)の第2の信号発生器である。 LD1 is a semiconductor laser, PE1 is a Peltier element that cools or heats this semiconductor laser LD1, and CT
1 is a temperature control means for controlling the temperature of the semiconductor laser LD1 to be constant by driving the Peltier element PE1, TB1 is a constant temperature bath for storing these and reducing temperature fluctuations, and BS1 is for controlling the output light of the semiconductor laser LD1. Beam splitter that separates into two directions,
UM1 is an acousto-optic modulator that receives the output light from one side of the beam splitter BS1 and constitutes a modulation means, and CL1 is a standard material that receives the diffracted light output of the acousto-optic modulator UM1 and absorbs light of a specific wavelength. PD1 is a photodetector that receives the transmitted light of this absorption cell CL1,
A1 is an amplifier that inputs the output electric signal of this photodetector PD1, LA1 is a lock-in amplifier that inputs the electric output of this amplifier A1, and CT2 inputs the output of this lock-in amplifier LA1 to control the current of the semiconductor laser LD1. Configure the control means to control
PID controller, SW1 is the acousto-optic modulator
A switch whose one end is connected to UM1, SG1 is a signal generator whose output turns the switch SW1 on and off at a frequency fm (e.g. 2kHz), and SG2 is a signal generator whose output is a frequency f D (e.g. 80MHz) connected to the other end of SW1. is the second signal generator.
上記のような構成の半導体レーザ波長安定化装
置の動作を次に説明する。半導体レーザLD1は
恒温槽TB1内で温度検出信号入力する制御手段
CT1によりペルチエ素子PE1を介して一定温度
に制御されている。半導体レーザLD1の出力光
はビームスプリツタBS1で2方向に分離され、
反射光は外部への出力光となり透過光は音響光学
変調器UM1に入射する。スイツチSW1がオン
の時音響光学変調器UM1は信号発生器SG2の
周波数fDの出力で駆動されるので、周波数νOの入
射光の大部分は回折して周波数(ドツプラ)シフ
トを受け、1次回折光といして周波数νO+fDの光
が吸収セルCL1に入射する。スイツチSW1がオ
フのときは入射光は全て0次回折光として周波数
νOで吸収セルCL1に入射する。 The operation of the semiconductor laser wavelength stabilizing device configured as described above will be explained next. Semiconductor laser LD1 is a control means that inputs a temperature detection signal in thermostatic chamber TB1.
The temperature is controlled to be constant by CT1 via Peltier element PE1. The output light of the semiconductor laser LD1 is separated into two directions by the beam splitter BS1.
The reflected light becomes output light to the outside, and the transmitted light enters the acousto-optic modulator UM1. When the switch SW1 is on, the acousto-optic modulator UM1 is driven by the output of the signal generator SG2 at the frequency f D , so most of the incident light with the frequency ν O is diffracted and undergoes a frequency (Doppler) shift. Light with a frequency ν O +f D enters the absorption cell CL1 as the next diffracted light. When the switch SW1 is off, all incident light enters the absorption cell CL1 as 0th-order diffracted light at a frequency ν O.
スイツチSW1は信号発生器SG1の周波数fm
のクロツクで駆動されるので、吸収セルCL1に
入射する光は変調周波数fm、変調深さfDの周波
数変調を受けることになる。吸収セルCL1にこ
の変調光が入射すると、第12図の動作説明図に
示すように、Cs原子の吸収信号の箇所でのみ透
過光量が変調を受けるので、出力に信号が現れ
る。この信号を光検出器PD1で電気信号に変換
し増幅器A1を介してロツクインアンプLA1に
おいて周波数fmで同期整流すれば、第13図の
周波数特性曲線図に示すような1次微分波形が得
られる。PIDコントローラCT2により半導体レ
ーザLD1の電流を制御して、ロツクニンアンプ
LA1の出力を前記1次微分波形の中心にロツク
(制御)すれば半導体レーザの出力光はνs−fD/
2の安定な周波数となる。ここでνsはCs原子の吸
収の中心周波数を示す。 Switch SW1 is the frequency fm of signal generator SG1
Therefore, the light incident on the absorption cell CL1 is subjected to frequency modulation with a modulation frequency fm and a modulation depth fD . When this modulated light enters the absorption cell CL1, as shown in the operational diagram of FIG. 12, the amount of transmitted light is modulated only at the location of the absorption signal of the Cs atoms, so a signal appears in the output. If this signal is converted into an electric signal by the photodetector PD1 and then synchronously rectified at the frequency fm by the lock-in amplifier LA1 via the amplifier A1, a first-order differential waveform as shown in the frequency characteristic curve diagram in Fig. 13 is obtained. . The current of the semiconductor laser LD1 is controlled by the PID controller CT2 to create a locking amplifier.
If the output of LA1 is locked (controlled) to the center of the first-order differential waveform, the output light of the semiconductor laser becomes ν s −f D /
This results in a stable frequency of 2. Here, ν s indicates the center frequency of absorption of Cs atoms.
このような構成の半導体レーザ波長安定化装置
によれば、レーザの発振周波数が変調されていな
いので、瞬時的にも非常に安定な光源となる。 According to the semiconductor laser wavelength stabilizing device having such a configuration, since the oscillation frequency of the laser is not modulated, it becomes an extremely stable light source even momentarily.
≪発明が解決しようとする問題点≫
しかしながら、上記のような構成の半導体レー
ザ波長安定化装置は各要素が単体部品で構成され
ているので、構成が複雑で大型となつてしまうと
いう短所がある。<<Problems to be Solved by the Invention>> However, each element of the semiconductor laser wavelength stabilization device having the above structure is composed of a single component, so it has the disadvantage that the structure is complicated and large. .
本発明はこのような問題点を解決するためにな
されたもので、発振周波数が安定な半導体レーザ
波長安定価装置を小型化して実現することを目的
とする。 The present invention has been made to solve these problems, and an object of the present invention is to miniaturize and realize a semiconductor laser wavelength stabilization device with a stable oscillation frequency.
≪問題点を解決するための手段≫
本発明は標準物質の吸収スペクトル線に半導体
レーザの波長を制御して波長を安定化する半導体
レーザ波長安定化装置に係るもので、その特徴と
するところは
半導体レーザLD2と、
この半導体レーザの出力光を第1の光導波路3
1を介して入射し周波数変調する音響光学変調部
UM2と、
第1の周波数信号を発生する第1の信号発生部
SG3と、
第2の周波数信号を発生してその出力が前記第
1の信号発生部の出力で周波数変調され、この変
調信号で前記音響光学変調部を駆動する第2の信
号発生部SG4と、
前記音響光学変調部が出力する1次回折光およ
び0次回折光を第2の光導波路32を介して入射
し特定の波長での吸収を起こす標準物質を封入し
た吸収部CL2と、
隣接する前記吸収部を透過した前記1次回折光
および0次回折光を電気信号に変換する光検出部
PD2と、
この光検出部の出力電気信号を前記第1の周波
数(fm)またはその整数倍の周波数で同期検波
し、その検波出力に基づいて前記半導体レーザの
発振波長を制御する同期検波手段LA2とを同一
基板1上に形成した点にある。<<Means for Solving the Problems>> The present invention relates to a semiconductor laser wavelength stabilizing device that stabilizes the wavelength by controlling the wavelength of a semiconductor laser according to the absorption spectrum line of a standard substance. A semiconductor laser LD2, and the output light of this semiconductor laser is passed through a first optical waveguide 3.
an acousto-optic modulator that enters through 1 and modulates the frequency.
UM2 and a first signal generator that generates a first frequency signal
SG3, a second signal generator SG4 that generates a second frequency signal, whose output is frequency modulated by the output of the first signal generator, and drives the acousto-optic modulator with this modulated signal; an absorption section CL2 in which the first-order diffraction light and the zero-order diffraction light output from the acousto-optic modulation section enter through the second optical waveguide 32 and enclose a standard substance that causes absorption at a specific wavelength; and the adjacent absorption section. a photodetection unit that converts the first-order diffraction light and zero-order diffraction light transmitted through the
PD2; synchronous detection means LA2 for synchronously detecting the output electrical signal of the photodetector at the first frequency (fm) or an integral multiple thereof, and controlling the oscillation wavelength of the semiconductor laser based on the detected output; and are formed on the same substrate 1.
≪実施例≫ 以下本発明を図面を用いて詳しく説明する。≪Example≫ The present invention will be explained in detail below using the drawings.
第1図は本発明の一実施例を示す構成ブロツク
図である。1は例えばGaAs等からなる光集積回
路(光IC)基板で、以下この光IC基板1上に形
成されたものを説明すると、LD2は半導体レー
ザ部、31はこの半導体レーザ部の出力光を入射
する光導波路、UM2はこの光導波路31の出射
光を入射する音響光学変調部(超音波光変調部)、
32はこの音響光学変調部UM2の出力光を入射
する光導波路、CL2はこの光導波路32の出射
光を入射した特定の波長の光を吸収する標準物質
(ここではCs)を封入した吸収部、PD2はこの
吸収部CL2の出射光を入射する受光部、2はこ
の受光部PD2の出力電気信号を入力する制御部
である。制御部2において、LA2はこの受光部
PD2の出力が入力に接続するロツクインアンプ
回路、CT3はこのロツクニンアンプ回路LA2の
出力が入力に接続しその出力が前記半導体レーザ
部LD2の注入電流入力に接続するPIDコントロ
ーラ回路等からなる電流制御回路、SG3はその
出力の一方が前記ロツクイアンプ回路LA2の参
照信号入力となる周波数fm(例えば2kHz)の信号
発生回路(発振回路)、SG4はこの信号発生回路
SG3の出力により変調され出力が前記音響光学
変調部UM2に接続する周波数fD(例えば80kHz)
の第2の信号発生回路(発振回路)である。 FIG. 1 is a block diagram showing an embodiment of the present invention. Reference numeral 1 denotes an optical integrated circuit (optical IC) substrate made of, for example, GaAs, etc. Below, we will explain what is formed on this optical IC substrate 1. LD 2 is a semiconductor laser section, and 31 is an input device for inputting the output light of this semiconductor laser section. The optical waveguide UM2 is an acousto-optic modulator (ultrasonic light modulator) into which the light emitted from the optical waveguide 31 enters;
32 is an optical waveguide into which the output light of this acousto-optic modulation unit UM2 is input, CL2 is an absorption unit filled with a standard substance (Cs in this case) that absorbs light of a specific wavelength into which the output light of this optical waveguide 32 is input; PD2 is a light receiving section into which the light emitted from the absorption section CL2 is input, and 2 is a control section into which the output electric signal of the light receiving section PD2 is input. In the control section 2, LA2 is this light receiving section.
A lock-in amplifier circuit in which the output of PD2 is connected to the input, CT3 is a PID controller circuit, etc., in which the output of the lock-in amplifier circuit LA2 is connected to the input, and its output is connected to the injection current input of the semiconductor laser section LD2. The control circuit, SG3, is a signal generation circuit (oscillation circuit) with a frequency fm (for example, 2kHz), one of whose outputs is the reference signal input of the lock amplifier circuit LA2, and SG4 is this signal generation circuit.
Frequency f D (e.g. 80kHz) which is modulated by the output of SG3 and whose output is connected to the acousto-optic modulator UM2.
This is a second signal generation circuit (oscillation circuit).
上記の構成の装置の動作は第11図の半導体レ
ーザ波長安定化装置と同様である。 The operation of the device having the above configuration is similar to that of the semiconductor laser wavelength stabilizing device shown in FIG.
このような構成の半導体レーザ波長安定化装置
によれば、1チツプに集積できるので、小型かつ
量産可能で調整が楽という特長を有する。 The semiconductor laser wavelength stabilizing device having such a configuration can be integrated into one chip, so it has the advantage of being compact, mass-producible, and easy to adjust.
また音響光学変調器UM2の回折効率が変化し
ても、変調に寄与しない光の成分(0次回折光)
が増えて信号強度が下がるのみで、中心波長には
影響しない。 Furthermore, even if the diffraction efficiency of the acousto-optic modulator UM2 changes, the light component that does not contribute to modulation (0th-order diffracted light)
increases and the signal strength decreases, but does not affect the center wavelength.
また低い変調周波数fmと高い周波数偏移fDを
同時にとることができるため、レーザ波長の吸収
中心からのずれ検出に関するS/N比が高くな
り、レーザ出力の安定性が優れている。 Furthermore, since a low modulation frequency fm and a high frequency deviation fD can be simultaneously obtained, the S/N ratio for detecting the deviation of the laser wavelength from the absorption center is high, and the stability of the laser output is excellent.
また集積化により、半導体レーザLD2の出力
光が導波路31、音響光学変調部UM2および導
波路32を介して吸収部CL2で吸収され、その
透過光が隣接する受光部PD2に直接入射するの
で、これらの構成要素を単体で構成する場合と比
べて反射面の数が減り、反射光による干渉ノイズ
が大幅に減少する。 Furthermore, due to integration, the output light of the semiconductor laser LD2 is absorbed by the absorption part CL2 via the waveguide 31, the acousto-optic modulator UM2, and the waveguide 32, and the transmitted light directly enters the adjacent light receiving part PD2. The number of reflective surfaces is reduced compared to when these components are used alone, and interference noise due to reflected light is significantly reduced.
また同期検波手段LA2および信号発生部SG
3,SG4等を集積化することにより回路の位相
遅れが小さくなり、位相安定度および周波数安定
度が向上する。 In addition, the synchronous detection means LA2 and the signal generation section SG
By integrating 3, SG4, etc., the phase delay of the circuit is reduced, and the phase stability and frequency stability are improved.
また音響光学変調部UM2を集積化することに
より、低パワー化が可能となり、有効径が小さく
なるので回折効率が高くなり、S/N比が向上す
る。 Further, by integrating the acousto-optic modulator UM2, it becomes possible to lower the power, and since the effective diameter becomes smaller, the diffraction efficiency becomes higher and the S/N ratio improves.
なお上記の実施例ではロツクインアンプLA2
の参照周波数として変調周波数fmを用いたがそ
の整数倍の周波数としてもよい。 In the above embodiment, the lock-in amplifier LA2
Although the modulation frequency fm is used as the reference frequency, a frequency that is an integral multiple of the modulation frequency fm may be used.
また吸収セルCL2の標準物質としては、Csの
ほかに例えばRb、NH3、H2Oなどを用いてもよ
い。 Further, as a standard substance for the absorption cell CL2, in addition to Cs, for example, Rb, NH 3 , H 2 O, etc. may be used.
また上記の実施例では変調手段として音響光学
変調器を用いているが、これに限らず、例えば電
気光学素子を用いた位相変調器を用いてもよい。 Further, in the above embodiment, an acousto-optic modulator is used as the modulation means, but the present invention is not limited to this, and a phase modulator using an electro-optic element may be used, for example.
これには例えば縦型変調器、横型変調器、進行
波形変調器などがある(Amnon Yarif:光エレ
クロニクスの基礎(丸善)、p247〜p253)。 These include, for example, vertical modulators, horizontal modulators, traveling waveform modulators, etc. (Amnon Yarif: Fundamentals of Optical Electronics (Maruzen), p.247-p.253).
また上記の実施例では制御部の出力で半導体レ
ーザの電流を制御しているが、これに限らず半導
体レーザの温度を制御してもよい。 Further, in the above embodiment, the current of the semiconductor laser is controlled by the output of the control section, but the present invention is not limited to this, and the temperature of the semiconductor laser may also be controlled.
第2図は第1図装置の各構成要素の具体的な実
現方法を示す表である。例えば電気回路部分はシ
リコン基板の場合はモノリシツク構成になるが、
他の場合はハイブリツド構成となる。以下具体例
を用いてさらに詳しく説明する。 FIG. 2 is a table showing a concrete implementation method of each component of the apparatus shown in FIG. For example, if the electrical circuit part is made of silicon substrate, it will have a monolithic structure,
In other cases, it is a hybrid configuration. This will be explained in more detail below using specific examples.
第3図は第1図装置において、半導体レーザ
LD2を光IC基板1上にモノリシツクで実現した
具体例を示す要部斜視図である。 Figure 3 shows a semiconductor laser in the apparatus shown in Figure 1.
FIG. 2 is a perspective view of a main part showing a specific example in which an LD 2 is monolithically realized on an optical IC board 1. FIG.
第4図および第5図は第1図装置において、半
導体レーザLD2を外付けしてハイブリツド構成
とした具体例を要部斜視図および要部断面図であ
る(科学新聞社「光通信要覧」499/501を参照)。
第4図は光IC基板1に形成された導波路31の
端面に半導体レーザLD2の出力を直接照射する
構成、第5図はプリズムPRを介して半導体レー
ザLD2の出力光を導波路31に導入する構成と
なつている。 4 and 5 are a perspective view and a sectional view of the main parts of a specific example of a hybrid configuration in which the semiconductor laser LD2 is externally attached to the apparatus shown in FIG. /501).
Figure 4 shows a configuration in which the output of the semiconductor laser LD2 is directly irradiated onto the end face of the waveguide 31 formed on the optical IC substrate 1, and Figure 5 shows the configuration in which the output light of the semiconductor laser LD2 is introduced into the waveguide 31 via a prism PR. It is configured to do this.
第6図は第1図装置において、吸収部CL2が
光IC基板1表面にエツチング等で設けた凹部に
ガラスコーテイングまたは熱酸化によりガラス膜
4を形成し、標準物質を入れた後ガラス板5を融
着して密閉した構成のものの具体例を示す断面図
である。 FIG. 6 shows the apparatus shown in FIG. 1, in which the absorption section CL2 forms a glass film 4 by glass coating or thermal oxidation in a recess provided by etching or the like on the surface of the optical IC substrate 1, and after putting a standard substance therein, the glass plate 5 is attached. FIG. 3 is a cross-sectional view showing a specific example of a structure that is fused and sealed.
第7図は第1図装置において、吸収部CL2の
他の具体例を示す断面図で、GaAsやLiNbO3等
からなる基板1上に導波路32を設け、この導波
路32を通過する半導体レーザからの出力光を導
波路32上の蓋51に封入された標準物質によ
り、エバネセント効果で吸収するように構成して
いる。第6図の構成に比べ、製作が楽という利点
がある。 FIG. 7 is a sectional view showing another specific example of the absorption section CL2 in the device shown in FIG. The standard substance sealed in the lid 51 above the waveguide 32 absorbs the output light from the waveguide 32 by an evanescent effect. Compared to the configuration shown in FIG. 6, this has the advantage of being easier to manufacture.
上記の各具体例で光検出部はモノリシツクまた
はハイブリツド構成とすることができる(前記
「光通信要覧」433/434を参照)。 In each of the above specific examples, the photodetector can have a monolithic or hybrid configuration (see the above-mentioned "Optical Communication Handbook" 433/434).
第8図は第1図装置をさらに狭スペクトル化し
た半導体レーザ波長安定化装置の第2の実施例を
示す構成平面図である。半導体レーザLD2の出
力光の一部を分岐させる光分岐部OB1と、この
光分岐部OB1の分岐出力光を入射するフアブ
リ・ペロー・エタロンからなる光共振部FP1と、
この光共振部FP1の出力光を入射する第2の光
検出部PD3と、この光検出部PD3の電気出力を
増幅して半導体レーザLD2注入電流に帰還する
広帯域増幅部A2とを光IC基板1上に追加して
設けたもので、ここで広帯域増幅部A2は(第8
図で簡略化して示される)制御部21内に設けら
れている。光共振部FP1の共振曲線(の中心周
波数からずれた位置)を半導体レーザLD2の発
振波長に合せ、半導体レーザLD2の出力光に含
まれる位相ノイズを振幅変調信号に変換した後光
検出器PD3で検出し、その電気出力を半導体レ
ーザ光のスヘクトル幅以上の帯域を有する広帯域
増幅器A2を介して半導体レーザLD2の駆動電
流(注入電流)に負帰還することにより、半導体
レーザLD2の位相ノイズを抑制し、狭スペクト
ル化を図つたものである。(参考:古田島他;信
学技報、OQE84−1303(1984))
第9図は第8図装置において、光IC基板1上
に設けるフアブリ・ペロー・共振器FP1の具体
例を示す要部斜視図(第9図A,B)および要部
平面図(第9図C)である。第9図Aは基板1に
設けた導波路61の一部に穴7を設け、この穴7
の対向する2面81に反射膜コーテイングを行つ
て共振器を構成したもの、第9図Bは基板1上に
導波路として2つのリツジ(尾根)部62を直列
に離して設け、このリツジ部62の対向する端面
82に反射膜を形成して共振器を構成したもの、
第9図Cは基板1上に設けた導波路63の一部に
高屈折率材料をドープして共振部83を構成した
ものを示している。 FIG. 8 is a structural plan view showing a second embodiment of the semiconductor laser wavelength stabilizing device, which is the device shown in FIG. 1 with a narrower spectrum. an optical branching part OB1 that branches part of the output light of the semiconductor laser LD2; an optical resonator FP1 made of a Fabry-Perot etalon into which the branched output light of the optical branching part OB1 is incident;
A second photodetector PD3 into which the output light of the optical resonator FP1 is incident, and a broadband amplifier A2 which amplifies the electrical output of the photodetector PD3 and feeds it back to the current injected into the semiconductor laser LD2 are connected to the optical IC substrate 1. The wideband amplification section A2 is provided in addition to the above.
The control unit 21 is provided in the control unit 21 (shown in a simplified manner in the figure). After adjusting the resonance curve (position shifted from the center frequency) of the optical resonator FP1 to the oscillation wavelength of the semiconductor laser LD2 and converting the phase noise contained in the output light of the semiconductor laser LD2 into an amplitude modulation signal, the photodetector PD3 The phase noise of the semiconductor laser LD2 is suppressed by detecting the electrical output and negatively feeding back the electrical output to the drive current (injected current) of the semiconductor laser LD2 via a broadband amplifier A2 having a band wider than the spectral width of the semiconductor laser light. , which aims to narrow the spectrum. (Reference: Furutashima et al.; IEICE Technical Report, OQE84-1303 (1984)) Figure 9 is a perspective view of the main part showing a specific example of the Fabry-Perot resonator FP1 provided on the optical IC board 1 in the device shown in Figure 8. 9A and 9B) and a plan view of the main part (FIG. 9C). In FIG. 9A, a hole 7 is provided in a part of the waveguide 61 provided on the substrate 1.
A resonator is formed by coating two opposing surfaces 81 of a resonator with a reflective film, and FIG. A resonator formed by forming a reflective film on the opposing end surfaces 82 of 62,
FIG. 9C shows a resonator 83 formed by doping a part of the waveguide 63 provided on the substrate 1 with a high refractive index material.
第10図は第9図C装置において、光共振部
FP1の共振周波数を調節する手段の具体例を示
す要部構成斜視図で、基板1上の共振部83の両
側に電極9を設け、この両電極9間に印加される
電流により共振部83の屈折率を変えて共振部8
3の実効的な共振器長を変化させるものである。 Figure 10 shows the optical resonator in the device shown in Figure 9C.
This is a perspective view showing a specific example of a means for adjusting the resonance frequency of the FP 1. Electrodes 9 are provided on both sides of a resonance section 83 on the substrate 1, and the current applied between the two electrodes 9 causes the resonance section 83 to change. Resonant part 8 by changing the refractive index
This changes the effective resonator length of No. 3.
共振周波数を調節する他の手段としては、基板
上の光共振部FP1の近傍にヒータ用薄膜抵抗を
形成し、熱膨脹で共振器長を変化させる方式があ
る。 Another method for adjusting the resonant frequency is to form a heater thin film resistor near the optical resonator FP1 on the substrate and change the resonator length by thermal expansion.
また第10図Cと同様の構成で高屈折率材料と
して強誘電体をドープし、印加電界により屈折率
を変化させる方式もある。 There is also a method in which a ferroelectric material is doped as a high refractive index material in a structure similar to that shown in FIG. 10C, and the refractive index is changed by an applied electric field.
また半導体レーザLD2および光共振部FP1を
所定の温度に制御する場合にそれぞれ薄膜抵抗等
をヒータとして用いるが、両方のヒータが互いに
干渉しないようにできるだけ遠ざけることが好ま
しい。 Further, when controlling the semiconductor laser LD2 and the optical resonator FP1 to a predetermined temperature, a thin film resistor or the like is used as a heater, respectively, but it is preferable that both heaters are placed as far away as possible so that they do not interfere with each other.
なお上記の各実施例では、半導体レーザの波長
を原子や分子の吸収線に制御する方法として線形
吸収法を用いているが、その代わりに音響光学変
調器UM2の出射光の一部をポンプ光として吸収
部CL2に入射し、他の一部を反対の方向から細
い光束でプロープ光として吸収部CL2に入射し
て飽和吸収信号を得る飽和吸収法(堀、角田、北
野、薮崎、小川::飽和吸収分光を用いた半導体
レーザの周波数安定化、信学技報OQE82−116)
を用いれば、より安定な半導体レーザ波長安定化
装置を実現することができる。 In each of the above embodiments, the linear absorption method is used to control the wavelength of the semiconductor laser to the absorption line of atoms or molecules, but instead, a part of the light emitted from the acousto-optic modulator UM2 is converted into pump light. A saturation absorption method (Hori, Tsunoda, Kitano, Yabusaki, Ogawa:: Frequency stabilization of semiconductor lasers using saturated absorption spectroscopy, IEICE Technical Report OQE82-116)
By using this, a more stable semiconductor laser wavelength stabilizing device can be realized.
≪発明の効果≫
以上述べたように本発明によれば、発振周波数
が安定で調整が楽な半導体レーザ波長安定化装置
を小型化・集積化して実現することができる。<<Effects of the Invention>> As described above, according to the present invention, it is possible to miniaturize and integrate a semiconductor laser wavelength stabilizing device that has a stable oscillation frequency and is easy to adjust.
第1図は本発明に係る半導体レーザ波長安定化
装置の一実施例を示す構成斜視図、第2図は第1
図装置の各構成要素の具体的手段の概要を示す
表、第3図〜第7図は第1図装置の構成要素の具
体例を説明するための図、第8図は本発明の第2
の実施例を示す構成平面図、第9図および第10
図は第8図装置の光共振部FP1の具体例を示す
図、第11図は半導体レーザ波長安定化装置の従
来例を示す構成ブロツク図、第12図はこの第1
1図装置の動作を説明するための動作説明図、第
13図は第11図装置の動作を説明するための特
性曲線図である。
1……基板、2……制御部、31,32……導
波路、LD2……半導体レーザ、CL2……吸収
部、PD2……光検出部、UM2……音響光学変
調部、SG3……第1の信号発生部、SG4……第
2の信号発生部、LA2……同期検波手段、fm…
…第1の周波数。
FIG. 1 is a perspective view of the structure of an embodiment of a semiconductor laser wavelength stabilizing device according to the present invention, and FIG.
3 to 7 are diagrams for explaining specific examples of the components of the device shown in FIG. 1. FIG.
FIGS. 9 and 10 are configuration plan views showing examples of the
Figure 8 shows a specific example of the optical resonator part FP1 of the device, Figure 11 is a block diagram showing a conventional example of a semiconductor laser wavelength stabilizing device, and Figure 12 shows this first example.
FIG. 1 is an operation explanatory diagram for explaining the operation of the apparatus, and FIG. 13 is a characteristic curve diagram for explaining the operation of the apparatus shown in FIG. 1...Substrate, 2...Control unit, 31, 32...Waveguide, LD2...Semiconductor laser, CL2...Absorption unit, PD2...Photodetection unit, UM2...Acousto-optic modulation unit, SG3...No. 1 signal generator, SG4...second signal generator, LA2...synchronous detection means, fm...
...first frequency.
Claims (1)
の波長を制御して波長を安定化する半導体レーザ
波長安定化装置において、 半導体レーザLD2と、 この半導体レーザの出力光を第1の光導波路3
1を介して入射し周波数変調する音響光学変調部
UM2と、 第1の周波数信号を発生する第1の信号発生部
SG3と、 第2の周波数信号を発生してその出力が前記第
1の信号発生部の出力で周波数変調され、この変
調信号で前記音響光学変調部を駆動する第2の信
号発生部SG4と、 前記音響光学変調部が出力する1次回折光およ
び0次回折光を第2の光導波路32を介して入射
し特定の波長で吸収を起こす標準物質を封入した
吸収部CL2と、 隣接する前記吸収部を透過した前記1次回折光
および0次回折光を電気信号に変換する光検出部
PD2と、 この光検出部の出力電気信号を前記第1の周波
数fmまたはその整数倍の周波数で同期検波し、
その検波出力に基づいて前記半導体レーザの発振
波長を制御する同期検波手段LA2と を同一基板1上に形成したことを特徴とする半
導体レーザ波長安定化装置。 2 標準物質としてRbまたはCsを用いた特許請
求の範囲第1項記載の半導体レーザ波長安定化装
置。 3 吸収部が基板表面に設けた凹部にガラスコー
テイングまたは熱酸化によりガラス膜を形成し、
標準物質を入れてガラス板で密閉した構成の特許
請求の範囲第1項記載の半導体レーザ波長安定化
装置。 4 吸収部がガラス基板上に導波路を設け、この
導波路上の標準物質によりエバネセント効果で半
導体レーザの出力光に関連する光を吸収するよう
に構成した特許請求の範囲第1項記載の半導体レ
ーザ波長安定化装置。 5 半導体レーザの出力光の一部を分岐させる光
分岐部と、この光分岐部の分岐出力光を入射する
光共振部と、この光共振部の出力光を入射する第
2の光検出部と、この光検出部の電気出力を増幅
して半導体レーザの注入電流に帰還する広帯域増
幅部とを基板上に設けた特許請求の範囲第1項記
載の半導体レーザ波長安定化装置。[Scope of Claims] 1. A semiconductor laser wavelength stabilization device that stabilizes the wavelength by controlling the wavelength of a semiconductor laser according to the absorption spectrum line of a standard substance, comprising: a semiconductor laser LD2; Optical waveguide 3
an acousto-optic modulator that enters through 1 and modulates the frequency.
UM2 and a first signal generator that generates a first frequency signal
SG3, a second signal generator SG4 that generates a second frequency signal, whose output is frequency modulated by the output of the first signal generator, and drives the acousto-optic modulator with this modulated signal; An absorption section CL2 in which the first-order diffraction light and the zero-order diffraction light output from the acousto-optic modulation section enter through the second optical waveguide 32 and enclose a standard substance that causes absorption at a specific wavelength, and the adjacent absorption section. a photodetection unit that converts the transmitted first-order diffraction light and zero-order diffraction light into electrical signals;
synchronously detecting the output electrical signal of the photodetector at the first frequency fm or an integral multiple thereof;
A semiconductor laser wavelength stabilizing device characterized in that a synchronous detection means LA2 for controlling the oscillation wavelength of the semiconductor laser based on the detection output thereof is formed on the same substrate 1. 2. The semiconductor laser wavelength stabilizing device according to claim 1, which uses Rb or Cs as a standard substance. 3 Forming a glass film by glass coating or thermal oxidation in the recesses provided in the substrate surface by the absorption part,
2. A semiconductor laser wavelength stabilizing device according to claim 1, wherein a standard substance is put in and sealed with a glass plate. 4. The semiconductor according to claim 1, wherein the absorption section has a waveguide provided on a glass substrate, and is configured to absorb light related to the output light of a semiconductor laser by means of an evanescent effect using a standard substance on the waveguide. Laser wavelength stabilizer. 5. An optical branching section that branches part of the output light of the semiconductor laser, an optical resonating section that receives the branched output light of this optical branching section, and a second photodetecting section that receives the output light of this optical resonating section. 2. The semiconductor laser wavelength stabilizing device according to claim 1, further comprising: a broadband amplifying section for amplifying the electrical output of the photodetecting section and feeding it back to the injection current of the semiconductor laser on the substrate.
Priority Applications (11)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61149777A JPS637687A (en) | 1986-06-27 | 1986-06-27 | Semiconductor laser wavelength stabilizer |
| GB8627744A GB2187592B (en) | 1985-12-26 | 1986-11-20 | Semiconductor laser wavelength stabilizer |
| US06/937,359 US4833681A (en) | 1985-12-26 | 1986-12-03 | Semiconductor laser wavelength stabilizer |
| US06/942,448 US4893353A (en) | 1985-12-20 | 1986-12-16 | Optical frequency synthesizer/sweeper |
| US06/943,670 US4856899A (en) | 1985-12-20 | 1986-12-18 | Optical frequency analyzer using a local oscillator heterodyne detection of incident light |
| GB8630374A GB2185619B (en) | 1985-12-20 | 1986-12-19 | Optical frequency synthesizer/sweeper |
| DE3643629A DE3643629C2 (en) | 1985-12-26 | 1986-12-19 | Device for stabilizing the wavelength of a semiconductor laser |
| DE3643553A DE3643553C2 (en) | 1985-12-20 | 1986-12-19 | Device for generating and wobbling optical frequencies |
| GB8630375A GB2185567B (en) | 1985-12-20 | 1986-12-19 | Optical frequency analyzer |
| DE3643569A DE3643569C2 (en) | 1985-12-20 | 1986-12-19 | Optical frequency analyzer |
| US07/293,020 US4912526A (en) | 1985-12-20 | 1989-01-03 | Optical frequency synthesizer/sweeper |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61149777A JPS637687A (en) | 1986-06-27 | 1986-06-27 | Semiconductor laser wavelength stabilizer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS637687A JPS637687A (en) | 1988-01-13 |
| JPH0459797B2 true JPH0459797B2 (en) | 1992-09-24 |
Family
ID=15482495
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61149777A Granted JPS637687A (en) | 1985-12-20 | 1986-06-27 | Semiconductor laser wavelength stabilizer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS637687A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02299280A (en) * | 1989-05-15 | 1990-12-11 | Nippon Telegr & Teleph Corp <Ntt> | Oscillation wavelength stabilized semiconductor laser device |
| US7688872B2 (en) * | 2008-03-18 | 2010-03-30 | Alcatel-Lucent Usa Inc. | Self-Calibrating integrated photonic circuit and method of control thereof |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6130088A (en) * | 1984-07-23 | 1986-02-12 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor laser device |
| JPS61123190A (en) * | 1984-10-26 | 1986-06-11 | Anritsu Corp | Manufacture of fixed-output semiconductor laser element |
-
1986
- 1986-06-27 JP JP61149777A patent/JPS637687A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS637687A (en) | 1988-01-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4912526A (en) | Optical frequency synthesizer/sweeper | |
| US4856899A (en) | Optical frequency analyzer using a local oscillator heterodyne detection of incident light | |
| US5917179A (en) | Brillouin opto-electronic oscillators | |
| KR100254640B1 (en) | Optical apparatus and manufacturing method thereof | |
| EP2575220B1 (en) | Tunable laser with integrated wavelength reference | |
| GB2187592A (en) | Semiconductor laser wavelength stabilizer | |
| JPS6254991A (en) | Semiconductor laser | |
| US5384799A (en) | Frequency stabilized laser with electronic tunable external cavity | |
| JPH0459797B2 (en) | ||
| JPH0459796B2 (en) | ||
| JPH0453014Y2 (en) | ||
| JPH02244782A (en) | Frequency stabilized semiconductor laser driver | |
| JPH0453015Y2 (en) | ||
| JPH0436597B2 (en) | ||
| JPH0523512B2 (en) | ||
| JP3072123B2 (en) | Optically integrated tunable semiconductor laser device | |
| JPH0523513B2 (en) | ||
| JP3072124B2 (en) | Optically integrated semiconductor laser device | |
| JPS62213186A (en) | Semiconductor laser wavelength stabilizer | |
| JPS63137494A (en) | Frequency stabilizer for semiconductor laser | |
| JPH0482191B2 (en) | ||
| JPH0296388A (en) | Wavelength stabilized light source | |
| JPH02257026A (en) | Laser frequency stability measuring instrument | |
| JPH08204271A (en) | Tunable semiconductor laser device | |
| Fernandez-Pacheco et al. | Absolute Frequency Stabilization and Phase Noise Reduction of Tunable Lasers via Reference-Stabilized Fiber Interferometer |