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JPH0462011B2 - - Google Patents
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JPH0462011B2 - - Google Patents

Info

Publication number
JPH0462011B2
JPH0462011B2 JP58184916A JP18491683A JPH0462011B2 JP H0462011 B2 JPH0462011 B2 JP H0462011B2 JP 58184916 A JP58184916 A JP 58184916A JP 18491683 A JP18491683 A JP 18491683A JP H0462011 B2 JPH0462011 B2 JP H0462011B2
Authority
JP
Japan
Prior art keywords
temperature
mirror
semitransparent
radiation thermometer
semi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58184916A
Other languages
Japanese (ja)
Other versions
JPS6076631A (en
Inventor
Isao Hishikari
Tetsuo Kobari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Corp filed Critical Chino Corp
Priority to JP58184916A priority Critical patent/JPS6076631A/en
Publication of JPS6076631A publication Critical patent/JPS6076631A/en
Publication of JPH0462011B2 publication Critical patent/JPH0462011B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0808Convex mirrors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0813Planar mirrors; Parallel phase plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80Calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J2005/066Differential arrangement, i.e. sensitive/not sensitive

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Description

【発明の詳細な説明】 (1) 発明の分野 この発明は、ガラス、高分子フイルム等の半透
明体の温度を測定する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Field of the Invention The present invention relates to a device for measuring the temperature of a translucent body such as glass or polymer film.

(2) 従来技術 半透明体の温度を測定するには、その物質の吸
収帯に測定波長を限定した放射温度計を用いて行
う方法がある。
(2) Prior Art There is a method of measuring the temperature of a semitransparent material using a radiation thermometer whose measurement wavelength is limited to the absorption band of the material.

しかしながら、この方法では、波長を限定して
いるため、感度が悪く、測定下限温度を低くとれ
ない問題点がある。また、顕著な吸収帯がない場
合は、特に測定が困難となる。
However, in this method, since the wavelength is limited, the sensitivity is poor and the lower limit temperature for measurement cannot be kept low. Furthermore, measurement is particularly difficult when there is no significant absorption band.

(3) 発明の目的 この発明の目的は、以上の点に鏡み、鏡を利用
して半透明体の温度を高精度に測定することがで
きる温度測定装置を提供することである。
(3) Purpose of the Invention The purpose of the present invention is to provide a temperature measuring device that can measure the temperature of a semi-transparent body with high accuracy by using a mirror at the above points.

(4) 発明の実施例 第1図は、この発明の一実施例を示す構成説明
図である。
(4) Embodiment of the Invention FIG. 1 is a configuration explanatory diagram showing an embodiment of the invention.

図において、1は被測定対象であるガラス、高
分子フイルム等の半透明体2をおおう壁、3は半
透明体2の背面に設けられた鏡(ミラー)、4は
半透明体2からの放射エネルギーを受光する放射
温度計、5は放射温度計4の出力を記憶する記憶
手段、6は放射温度計4の出力等から半透明体2
の真温度を演算する演算手段である。
In the figure, 1 is a wall covering a semi-transparent body 2 such as glass or polymer film to be measured, 3 is a mirror provided on the back of the semi-transparent body 2, and 4 is a wall covering a semi-transparent body 2 such as glass or polymer film. A radiation thermometer that receives radiant energy, 5 a storage means for storing the output of the radiation thermometer 4, and 6 a translucent body 2 from which the output of the radiation thermometer 4 is stored.
This is a calculation means for calculating the true temperature of the temperature.

ここで測定原理は次のようである。 The measurement principle here is as follows.

半透明体2の温度をT、表面の反射率をρ1、裏
面の反射率をρ2、透過率をτとし、鏡3の温度を
T0,反射率をρ0、壁面1aの温度をTW、放射率
をεWとし、半透明体2、鏡3、壁面1aからの
放射エネルギーをE(T),E(T0),E(TW)、放射
温度計5の受光する放射エネルギーをE(S)とすれ
ば、半透明体2と鏡3との間の多重反射を考慮し
て次式が成り立つ。
The temperature of the semitransparent body 2 is T, the reflectance of the front surface is ρ 1 , the reflectance of the back surface is ρ 2 , the transmittance is τ, and the temperature of the mirror 3 is
T 0 , the reflectance is ρ 0 , the temperature of the wall 1a is T W , the emissivity is ε W , and the radiant energy from the semi-transparent body 2, the mirror 3, and the wall 1a is E(T), E(T 0 ), If E(T W ) and the radiant energy received by the radiation thermometer 5 are E(S), then the following equation holds in consideration of multiple reflections between the semitransparent body 2 and the mirror 3.

E(S)={(1−ρ1−τ)+(1−ρ2−τ)ρ0〓/
1−ρ0ρ2}E(T)+1−ρ0/1−ρ0ρ2τE(T0) +εW(ρ1+τ2ρ/1−ρ0ρ2)E(TW) =(1
−α−β)E(T)+εWαE(TW)+βE(T0)……(1) ここで、 α=ρ1+ρ0/1−ρ0ρ2τ2,β=1−ρ0/1−ρ0
ρ2τ……(2) である。
E(S)={(1−ρ 1 −τ)+(1−ρ 2 −τ)ρ 0 〓/
1−ρ 0 ρ 2 }E(T)+1−ρ 0 /1−ρ 0 ρ 2 τE(T 0 ) +ε W12 ρ/1−ρ 0 ρ 2 )E(T W ) =( 1
−α−β)E(T)+ε W αE(T W )+βE(T 0 )……(1) Here, α=ρ 10 /1−ρ 0 ρ 2 τ 2 , β=1−ρ 0 /1−ρ 0
ρ 2 τ……(2).

つまり、(1)式において、右辺第1項,第2項,
第3項は、それぞれ、熱放射の半透明体2から、
壁面1aから、背面の鏡3からの寄与分で、その
係数1−α−β,α,βは寄与率を示す。
In other words, in equation (1), the first term, second term on the right side,
The third term is, respectively, from the semitransparent body 2 of thermal radiation,
The coefficients 1-α-β, α, and β represent the contribution rates from the wall surface 1a and the mirror 3 on the back side.

(1)式よりE(T)を求めれば次式となる。 Calculating E(T) from equation (1) yields the following equation.

E(T)=E(S)−εWαE(TW)−βE(T0)/1−α−
β……(3) ところで、半透明体2がないときの放射温度計
4の出力をE(S0)とすれば、鏡3のみを考慮し
て次式が成り立つ。
E(T)=E(S)−ε W αE(T W )−βE(T 0 )/1−α−
β...(3) By the way, if the output of the radiation thermometer 4 when the semitransparent body 2 is not present is E(S 0 ), then the following equation holds true considering only the mirror 3.

E(S0)=ρ0εWE(TW)+(1−ρ0)E(T0
……(4) これより、 εWE(TW)=E(S0)−(1−ρ0)E(T0)/ρ…
…(5) となり、この(5)式を(1)式に代入して整理すると次
式となる。
E(S 0 )=ρ 0 ε W E(T W )+(1−ρ 0 )E(T 0 )
……(4) From this, ε W E(T W )=E(S 0 )−(1−ρ 0 )E(T 0 )/ρ…
...(5), and by substituting this equation (5) into equation (1) and rearranging it, we get the following equation.

E(S)=(1-γ-δ)E(T)+γE(S0)+δE(T0) ……(6) ここで、 γ=α/ρ0,δ=α+β−γ ……(7) である。背面を鏡3で構成すれば、(6)式の第3項
はほぼ無視でき、例えば、ρ1=ρ2=0.2、τ=0.4、
ρ≧0.8とすればδ≒0となり、(6)式は次のよう
になる。
E(S)=(1-γ-δ)E(T)+γE(S 0 )+δE(T 0 ) ……(6) Here, γ=α/ρ 0 , δ=α+β−γ ……(7 ). If the back surface is made up of mirror 3, the third term in equation (6) can be almost ignored; for example, ρ 12 =0.2, τ=0.4,
If ρ≧0.8, then δ≒0, and equation (6) becomes as follows.

E(S)=(1−γ)E(T)+γE(S0) ……(8) これより、E(T)を求めれば次式となる。 E(S)=(1-γ)E(T)+γE(S 0 )...(8) From this, E(T) can be found as follows.

E(T)=E(S)−γE(S0)/1−γ ……(9) (9)式によれば、半透明体2がないときの放射温
度計4の出力E(S0)を記憶手段5に記憶させ、
半透明体2があるときの出力E(S)に補正を加える
ことにより、壁面1aの影響を除去できる。
E(T)=E(S)-γE(S 0 )/1-γ ...(9) According to equation (9), the output E(S 0 ) is stored in the storage means 5,
By correcting the output E(S) when the semitransparent body 2 is present, the influence of the wall surface 1a can be removed.

第1図の装置の動作は次の通りである。 The operation of the apparatus of FIG. 1 is as follows.

あらかじめ、測定前に透明体2の反射率ρ1
ρ2、透過率τ、鏡3の反射率ρ0に基く定数γを演
算手段6の設定値として入力させ、また、半透明
体2がないときの放射温度計4の出力E(S0)を
適当な記憶手段5に記憶させておく。
Before measurement, the reflectance ρ 1 of the transparent body 2,
ρ 2 , the transmittance τ, and the constant γ based on the reflectance ρ 0 of the mirror 3 are input as the set values of the calculation means 6, and the output E (S 0 ) of the radiation thermometer 4 when the semitransparent body 2 is not present. is stored in an appropriate storage means 5.

次に、測定時、演算手段6は放射温度計4の半
透明体2からの出力E(S)に、記憶手段5の出力E
(S0)、定数γに基いて、(9)式のような補正演算を
行つてE(T)を求め、これより透明体2の真温度T
を演算して求めることができる。
Next, during measurement, the calculation means 6 uses the output E(S) from the translucent body 2 of the radiation thermometer 4 as the output E(S) from the storage means 5.
(S 0 ), and based on the constant γ, perform a correction calculation as shown in equation (9) to obtain E(T), and from this, the true temperature T of the transparent body 2
It can be found by calculating.

なお、壁面1aの温度は、測定前、測定中で大
きく変化しないものとし、δ≒0とできない場合
は、(6)式に基いてδ,T0を考慮して温度Tを求
めればよい。また、演算手段6等は、マイクロコ
ンピユータで構成してもよい。
It is assumed that the temperature of the wall surface 1a does not change significantly before and during the measurement, and if it is not possible to set δ≈0, the temperature T may be determined based on equation (6), taking δ and T 0 into consideration. Further, the calculation means 6 and the like may be configured with a microcomputer.

(5) 発明の要約 以上述べたように、この発明は、半透明体の背
面に鏡を設け、放射温度計の半透明体からの放射
エネルギー出力を、半透明体がないときの放射温
度計出力、半透明体の反射率、透過率、鏡の反射
率等で演算手段により補正し、透明体の真温度を
測定するようにした温度測定装置である。
(5) Summary of the Invention As described above, the present invention provides a mirror on the back side of the semitransparent body, and the radiant energy output from the semitransparent body of the radiation thermometer is reflected in the radiation thermometer without the semitransparent body. This is a temperature measurement device that measures the true temperature of a transparent body by correcting the output, reflectance and transmittance of a semi-transparent body, reflectance of a mirror, etc. using calculation means.

(6) 発明の効果 半透明体の背面に鏡を設けることにより、半透
明体のみかけの放射率を高め、背面からの熱放射
の影響を除去するようにしているので、簡単な構
成で半透明体の真温度を高精度に測定することが
できる。また、壁面の温度の測定は不要なので、
いつそう安価、高信頼性のものとなる。特に、特
定の吸収帯がなく、低温測定の場合に有効で、半
透明体全般の温度測定に好適で、実用的効果が大
きい。
(6) Effects of the invention By providing a mirror on the back side of the semitransparent body, the apparent emissivity of the semitransparent body is increased and the influence of heat radiation from the back side is removed. The true temperature of a transparent body can be measured with high precision. In addition, there is no need to measure the temperature of the wall surface.
When will it become so cheap and reliable? In particular, it has no specific absorption band, is effective for low temperature measurements, is suitable for measuring the temperature of semitransparent objects in general, and has great practical effects.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、この発明の一実施例を示す構成説明
図である。 1…壁、2…半透明体、3…鏡、4…放射温度
計、5…記憶手段、6…演算手段。
FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention. 1...Wall, 2...Semi-transparent body, 3...Mirror, 4...Radiation thermometer, 5...Storage means, 6...Calculation means.

Claims (1)

【特許請求の範囲】 1 半透明体の背面に設けられた鏡と、前記半透
明体からの放射エネルギーE(T)などを受光する放
射温度計と、この放射温度計の出力E(S)を、記憶
手段に記憶された前記半透明体がないときの出力
E(S0)ならびに前記半透明体の表面および裏面
の反射率ρ1,ρ2、透過率τ、前記鏡の反射率ρ0に
よる定数γに基いて E(T)=[E(S)−γE(S0)]/(1−γ) なる補正演算を行い、前記半透明体の温度Tを演
算する演算手段とを備えた温度測定装置[ここ
で、 γ=ρ1/ρ0+τ2/(1−ρ0ρ2)]。
[Claims] 1. A mirror provided on the back surface of a semi-transparent body, a radiation thermometer that receives radiant energy E(T) etc. from the semi-transparent body, and an output E(S) of this radiation thermometer. is the output E (S0) when the semitransparent body is not stored in the storage means, the reflectance ρ1, ρ2 of the front and back surfaces of the semitransparent body, the transmittance τ, and the constant γ due to the reflectance ρ0 of the mirror. and a calculation means for calculating the temperature T of the semi-transparent body by performing a correction calculation based on E(T)=[E(S)-γE(S0)]/(1-γ). [Here, γ=ρ1/ρ0+ τ2 /(1−ρ0ρ2)].
JP58184916A 1983-10-03 1983-10-03 Temperature measuring device Granted JPS6076631A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58184916A JPS6076631A (en) 1983-10-03 1983-10-03 Temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58184916A JPS6076631A (en) 1983-10-03 1983-10-03 Temperature measuring device

Publications (2)

Publication Number Publication Date
JPS6076631A JPS6076631A (en) 1985-05-01
JPH0462011B2 true JPH0462011B2 (en) 1992-10-02

Family

ID=16161571

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58184916A Granted JPS6076631A (en) 1983-10-03 1983-10-03 Temperature measuring device

Country Status (1)

Country Link
JP (1) JPS6076631A (en)

Also Published As

Publication number Publication date
JPS6076631A (en) 1985-05-01

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