JPH0462332B2 - - Google Patents
Info
- Publication number
- JPH0462332B2 JPH0462332B2 JP7679285A JP7679285A JPH0462332B2 JP H0462332 B2 JPH0462332 B2 JP H0462332B2 JP 7679285 A JP7679285 A JP 7679285A JP 7679285 A JP7679285 A JP 7679285A JP H0462332 B2 JPH0462332 B2 JP H0462332B2
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- inspection
- reflected light
- amount
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 17
- 230000007547 defect Effects 0.000 claims description 15
- 230000003287 optical effect Effects 0.000 claims description 4
- 239000000463 material Substances 0.000 description 9
- 238000001514 detection method Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Closed-Circuit Television Systems (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、非接触光学式の表面欠陥検査方法に
関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a non-contact optical surface defect inspection method.
製品の表面に、許容限度を越える欠陥があるか
否かを検査するための方法として、製品(以下、
被検査物と称す)の検査対象表面に対して特定方
向から光を照射し、その拡散反射光をテレビカメ
ラ等の撮像素子をもつて受光し、該反射光量を電
気的に検知することにより欠陥部を検出する非接
触光学式の表面欠陥検査方法が知られている。こ
の種の表面欠陥検査方法においては、検査対象部
を背景部から分離して識別することが望まれてお
り、従来、たとえば第7図に示すように、被検査
物が連続したシート11である場合には、該シー
ト11と反射率の異なる材質よりなるローラ12
を用い、第8図のグラフに示すように、両者1
1,12の反射光量の違いによつて検査対象部
(シート11)を検査対象外の背景部(ローラ1
2)から分離識別している。また、シート11が
一定の色彩で彩色された製品である場合には、ロ
ーラ12をシート11と異なる色彩のものを用い
ることにより、同様に分離識別を行なう。前記第
7図において、シート11はローラ12上をX方
向に蛇行するため、確実にその動きに追随して欠
陥検出を行ない、検査精度を維持する必要上、上
記のような検査対象部の分離識別はきわめて重要
である。
The product (hereinafter referred to as
Defects are detected by irradiating light from a specific direction onto the surface of the object to be inspected (referred to as the object to be inspected), receiving the diffusely reflected light using an imaging device such as a television camera, and electrically detecting the amount of reflected light. A non-contact optical surface defect inspection method for detecting defects is known. In this type of surface defect inspection method, it is desired to separate and identify the inspection object part from the background part, and conventionally, for example, as shown in FIG. 7, the inspection object is a continuous sheet 11. In this case, the roller 12 is made of a material having a different reflectance from that of the sheet 11.
As shown in the graph of Figure 8, both 1
Due to the difference in the amount of reflected light from the rollers 1 and 12, the part to be inspected (sheet 11) is compared to the background part (roller 1) which is not to be inspected.
It is separated and identified from 2). Further, if the sheet 11 is a product colored in a certain color, separation and identification can be similarly performed by using a roller 12 of a different color from the sheet 11. In FIG. 7, since the sheet 11 meanderes in the X direction on the roller 12, it is necessary to reliably follow the movement to detect defects and maintain inspection accuracy, so the separation of the parts to be inspected as described above is necessary. Identification is extremely important.
上記第7図の例のように、表面の全面が検査対
象部となつているような簡単な形状の被検査物の
場合、換言すれば、検査しようとする方向から見
て、被検査物の輪郭と検査対象部が一致している
場合には、該検査対象部と異なる反射率、色相を
背景部に与えることによりコントラストを大きく
し、該背景部からの検査対象部の分離識別を行な
うことができる。
In the case of a simple-shaped object to be inspected where the entire surface is the part to be inspected, as in the example in Fig. 7 above, in other words, when viewed from the direction of inspection, the object to be inspected is When the outline and the inspection target part match, the contrast is increased by giving the background part a different reflectance and hue from the inspection target part, and the inspection target part is separated and identified from the background part. I can do it.
しかしながら、被検査物の形状が複雑である場
合には、上記のように簡単に、かつ確実に背景か
らの検査対象部の分離別を行ない得る方法がな
く、それぞれの形状に応じた工夫が必要とされて
いるのが現状である。たとえば、第9図および第
10図に示すように、検査対象部14が被検査物
13の表面の一部に形成されている場合には、背
景となる部分15も被検査物13の一部であるた
め、反射率等は固定されてしまい、両部14,1
5に任意のコントラストを与えることが困難であ
る。また、なんらかの方法により、適当なコント
ラストが得られたとしても、背景となる部分15
に該印16等が刻設表示されている場合には、該
背景部分15に明るさの変動が生じるため、第1
1図のグラフニ示すように確実な検査対象部の分
離識別を行ない難いという問題点を有していた。 However, when the shape of the object to be inspected is complex, there is no way to easily and reliably separate the part to be inspected from the background as described above, and it is necessary to devise ways to separate the part to be inspected from the background. The current situation is that. For example, as shown in FIGS. 9 and 10, when the inspection target portion 14 is formed on a part of the surface of the inspection object 13, the background portion 15 is also a part of the inspection object 13. Therefore, the reflectance etc. are fixed and both parts 14 and 1
It is difficult to give any contrast to 5. Furthermore, even if an appropriate contrast is obtained by some method, the background portion 15
When the mark 16 etc. is engraved and displayed on the background part 15, the brightness of the background part 15 varies.
As shown in the graph of FIG. 1, there is a problem in that it is difficult to reliably separate and identify the parts to be inspected.
本発明は、上記問題点に鑑みて、検査対象部が
被検査物の一部分に形成されている場合、上記第
9図および第10図の例のように、一般に、検査
対象部と他の部分との間に段差を有していること
に着目し、該段差による空間的余裕を利用して、
確実に、かつ容易に検査対象部の識別を行なう方
法を提供することを目的としてなされたものであ
る。 In view of the above-mentioned problems, the present invention provides that, when the part to be inspected is formed in a part of the object to be inspected, the part to be inspected and other parts are generally Focusing on the fact that there is a step between the
The purpose of this invention is to provide a method for reliably and easily identifying a portion to be inspected.
上記目的を達成する本発明は、非接触光学式の
表面欠陥検査方法において、被検査物を回転せし
め、該被検査物と反射率を異にする部材を弾性的
に配設して回転する前記被検査物の検査対象部外
端部に回転接触もしくは摺接せしめ、該接触部の
反射光量差を検知することにより検査対象部の識
別を行なうことを特徴としている。
To achieve the above object, the present invention provides a non-contact optical surface defect inspection method in which an object to be inspected is rotated, and a member having a different reflectance from that of the object to be inspected is elastically arranged. It is characterized in that the inspection object part is identified by rotating or slidingly contacting the outer end of the inspection object part of the object to be inspected and detecting the difference in the amount of reflected light at the contact part.
上記本発明方法によれば、反射率を異にする部
材との接触部における反射光量の違いによつて検
査対象部外端縁を検知し、被検査物が1回転する
ことによつて検査対象部の全面を明確に分離識別
することができ、回転する被検査物が偏心等によ
り芯振れしても、検知された検査対象部外端縁の
動きに追随して検査機の検査領域マスクを動かす
ことが可能であるため、安定した欠陥検出性能を
得ることができる。
According to the above-mentioned method of the present invention, the outer edge of the inspection object is detected based on the difference in the amount of reflected light at the contact portion with members having different reflectances, and the outer edge of the inspection object is detected by one rotation of the inspection object. Even if the rotating inspection object deviates from its center due to eccentricity, the inspection area mask of the inspection machine can follow the detected movement of the outer edge of the inspection object. Since it can be moved, stable defect detection performance can be obtained.
以下、本発明に係る表面欠陥検査方法の好適な
実施例を図面にもとづいて説明する。
Hereinafter, preferred embodiments of the surface defect inspection method according to the present invention will be described based on the drawings.
まず第1図ないし第3図は第1の実施例による
方法を示すもので、符号1は図示しない回転盤上
に載置固定され、凸段部2を有する円盤状の被検
査物で、検査対象部3は前記凸段部2の上面に形
成されている。4は検査対象部3と反射率を異に
する材料(たとえば検査対象部3が黒色等低反射
率である場合にはテフロン等白色高反射率の材質
のもの、また検査対象部3が白色等高反射等であ
る場合にはカーボン等黒色低反射率の材質のも
の)をもつて製せられた円盤状の反射部材で、コ
イルスプイング5によつて弾性付勢されてなる支
持部材6に対して回転自在に軸着され、その外周
は検査対象部3の外周端縁7(凸端部2の立上り
面)に一定の押圧力で回転接触している。また、
図示しないテレビカメラ、ラインカメラ等撮像素
子は、第3図に斜線部で示す領域Aからの反射光
量を計測しており、被検査物1が1回転すること
によつて検査対象部3全面を検査するよう構成さ
れている。第4図のグラフは、検査対象部3が低
反射率、反射部材4が高反射率の場合の、前記領
域Aからの反射光量を表わすもので、両者3,4
間において反射光量に著差が生じている。被検査
物1が回転すると、これに伴つて反射部材4も回
転するが、その反射光量レベルはほぼ一定である
ため、前記反射光量差によつて検査対象部3を背
景とすべき反射部材4から明確に分離別すること
ができ、したがつて被検査物1の偏心等を原因と
する芯振れが起こつても、検出された検査対象部
3の端部の動きに対応させて、領域Aを制定する
検査領域マスクを動かすことにより、検査精度を
維持し、安定した欠陥検出性能を得ることができ
る。 First of all, FIGS. 1 to 3 show a method according to the first embodiment, in which reference numeral 1 is a disk-shaped object to be inspected, which is placed and fixed on a rotating disk (not shown) and has a convex step 2. The target portion 3 is formed on the upper surface of the convex step portion 2 . 4 is a material having a different reflectance from the part to be inspected 3 (for example, if the part to be inspected 3 is black or other low reflectance material, it is made of a white material with high reflectance such as Teflon, or if the part to be inspected is white or other material) A disc-shaped reflective member made of a black material with low reflectivity such as carbon (if the material is highly reflective), and is elastically biased by the coil spring 5 to support the supporting member 6. It is rotatably attached to the shaft, and its outer periphery is in rotational contact with the outer peripheral edge 7 (rising surface of the convex end 2) of the portion to be inspected 3 with a constant pressing force. Also,
An imaging device (not shown) such as a television camera or a line camera measures the amount of reflected light from the area A shown in the shaded area in FIG. configured to inspect. The graph in FIG. 4 shows the amount of light reflected from the area A when the inspection target part 3 has a low reflectance and the reflective member 4 has a high reflectance.
There is a significant difference in the amount of reflected light between the two. When the inspected object 1 rotates, the reflecting member 4 also rotates, but the level of reflected light is almost constant. Therefore, even if center runout occurs due to eccentricity of the inspected object 1, the area A can be clearly separated from the By moving the inspection area mask that establishes this, inspection accuracy can be maintained and stable defect detection performance can be obtained.
つぎに、第5図および第6図は、本発明方法の
第2の実施例を示し、往復動自在に支持されコイ
ルスプリング5によつて弾性付勢されてなる反射
部材8の端部を、回転する被検査物1の検査対象
部3の外周端縁7に一定の押圧力で摺接せしめ、
既述第1の実施例と同様、反射光量の差によつて
検査対象部3を識別検出するもので、背景となる
反射部材8が回転するものではないため、該反射
部材8からの反射光量は一定値となる、よつて、
より安定した識別性を得ることができる。なお、
この場合、反射部材8は摺動によつて摩耗するた
め、テフロン等耐摩耗性の優れた材料を用いるこ
とが望ましい。 Next, FIGS. 5 and 6 show a second embodiment of the method of the present invention. Slide it into contact with the outer peripheral edge 7 of the inspection target part 3 of the rotating inspection object 1 with a constant pressing force,
Similar to the first embodiment described above, the inspection target part 3 is identified and detected based on the difference in the amount of reflected light, and since the reflecting member 8 serving as the background does not rotate, the amount of reflected light from the reflecting member 8 is a constant value, therefore,
More stable identifiability can be obtained. In addition,
In this case, since the reflective member 8 is worn out by sliding, it is desirable to use a material with excellent wear resistance such as Teflon.
本発明の表面欠陥検査方法は、以上説明したと
おり、検査対象部外端縁に、検査対象部と反射率
の異なる部材を接触せしめ、該両者からの反射光
量の差によつて検査対象部を明確に分離検出し、
複雑な形状の被検査物に対しても安定した精度で
欠陥検出を行なうことができ、また、本発明方法
は、前記反射率の異なる材質を検査対象部の反射
率とのコントラストを考慮して選択することによ
り、あらゆる反射率の被検査物に対して適用可能
である等の特徴を有している。
As explained above, in the surface defect inspection method of the present invention, a member having a different reflectance from the inspection target part is brought into contact with the outer edge of the inspection target part, and the inspection target part is detected by the difference in the amount of reflected light from both. clearly separated detection,
Defects can be detected with stable accuracy even for objects to be inspected with complex shapes, and the method of the present invention takes into consideration the contrast between the reflectance of the inspected part and the materials with different reflectances. It has the feature that it can be applied to objects to be inspected with any reflectance depending on the selection.
第1図は本発明方法の第1の実施例を示す略平
面図、第2図は同略正面図、第3図は同一部切欠
した略平面図、第4図は同実施例における反射光
量のグラフ、第5図は第2の実施例を示す略平面
図、第6図は同略正面図、第7図はシート状の被
検査物の検査方法を示す斜視図、第8図は同方法
における反射光量のグラフ、第9図は従来方法の
一例を示す略平面図、第10図は同略正面図、第
11図は同方法における反射光量のグラフであ
る。
1……被検査物、3……検査対象部、4,8…
…反射部材、5……コイルスプリング、7……外
周端縁。
Fig. 1 is a schematic plan view showing a first embodiment of the method of the present invention, Fig. 2 is a schematic front view of the same, Fig. 3 is a schematic plan view with the same part cut away, and Fig. 4 is the amount of reflected light in the same embodiment. FIG. 5 is a schematic plan view showing the second embodiment, FIG. 6 is a schematic front view thereof, FIG. 7 is a perspective view showing a method for inspecting a sheet-like object to be inspected, and FIG. 8 is a schematic plan view showing the second embodiment. FIG. 9 is a schematic plan view showing an example of the conventional method, FIG. 10 is a schematic front view of the same, and FIG. 11 is a graph of the amount of reflected light in the method. 1...Object to be inspected, 3...Part to be inspected, 4, 8...
... Reflection member, 5 ... Coil spring, 7 ... Outer peripheral edge.
Claims (1)
の検査対象部からの反射光量を電気的に検知・測
定することにより欠陥を検出する非接触光学式の
表面欠陥検査方法において、被検査物を回転せし
め、該被検査物と反射率を異にする部材を弾性的
に配設して回転する前記被検査物の検査対象部外
端縁に回転接触もしくは摺接せしめ、該接触部の
反射光量差を検知することにより検査対象部の識
別を行なうことを特徴とする表面欠陥検査方法。1 In a non-contact optical surface defect inspection method that detects defects by electrically detecting and measuring the amount of reflected light from the inspection target part of the inspection object using an image sensor such as a television camera, A rotating object is rotated, and a member having a reflectance different from that of the object to be inspected is elastically disposed and brought into rotational contact or sliding contact with the outer edge of a portion to be inspected of the rotating object to be inspected, and the amount of reflected light from the contact portion is adjusted. A surface defect inspection method characterized by identifying a portion to be inspected by detecting a difference.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7679285A JPS61235740A (en) | 1985-04-12 | 1985-04-12 | Inspecting method for surface defect |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7679285A JPS61235740A (en) | 1985-04-12 | 1985-04-12 | Inspecting method for surface defect |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61235740A JPS61235740A (en) | 1986-10-21 |
| JPH0462332B2 true JPH0462332B2 (en) | 1992-10-06 |
Family
ID=13615474
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7679285A Granted JPS61235740A (en) | 1985-04-12 | 1985-04-12 | Inspecting method for surface defect |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61235740A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0212646U (en) * | 1988-07-06 | 1990-01-26 |
-
1985
- 1985-04-12 JP JP7679285A patent/JPS61235740A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61235740A (en) | 1986-10-21 |
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