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JPH046276B2 - - Google Patents
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JPH046276B2 - - Google Patents

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Publication number
JPH046276B2
JPH046276B2 JP58075632A JP7563283A JPH046276B2 JP H046276 B2 JPH046276 B2 JP H046276B2 JP 58075632 A JP58075632 A JP 58075632A JP 7563283 A JP7563283 A JP 7563283A JP H046276 B2 JPH046276 B2 JP H046276B2
Authority
JP
Japan
Prior art keywords
light emitting
emitting layer
insulating layer
light
electrodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58075632A
Other languages
Japanese (ja)
Other versions
JPS59201391A (en
Inventor
Yoshiharu Harada
Kunyasu Sowa
Susumu Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soken Inc
Original Assignee
Nippon Soken Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Soken Inc filed Critical Nippon Soken Inc
Priority to JP58075632A priority Critical patent/JPS59201391A/en
Publication of JPS59201391A publication Critical patent/JPS59201391A/en
Publication of JPH046276B2 publication Critical patent/JPH046276B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 本発明は印加電圧に応答して電場発光をする薄
膜エレクトロルミネツセンス素子に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thin film electroluminescent device that emits electroluminescence in response to an applied voltage.

従来、薄膜エレクトロルミネツセンス素子(以
下EL素子とする)の構造は印加電圧に応答して
発光する発光層の両面を絶縁層で被覆した三層構
造を一対の電極の間にはさんだものである。とこ
ろが形成したEL素子の発光パターンが大きい場
合発光層が印加電圧により絶縁破壊を生じると、
この絶縁破壊を起こした部分を中心に破壊が周囲
に拡大していく性質があり、発光パターンが変わ
つてしまう。そこで絶縁破壊を防止するため、全
体の絶縁層の厚さを増して絶縁破壊を防止する耐
電圧を高くする方法を用いることが考えられる。
しかしそれでは発光の輝度が低下してしまうので
印加電圧を上げねばならず、やはり絶縁破壊が起
こることとなり、消費電力も多くなつてしまう。
Conventionally, the structure of thin-film electroluminescent devices (hereinafter referred to as EL devices) consists of a three-layer structure in which a light-emitting layer that emits light in response to an applied voltage is coated with insulating layers on both sides, and is sandwiched between a pair of electrodes. be. However, if the light-emitting pattern of the formed EL element is large and the light-emitting layer undergoes dielectric breakdown due to the applied voltage,
The breakdown tends to spread around the area where this dielectric breakdown occurred, changing the light emission pattern. Therefore, in order to prevent dielectric breakdown, it is conceivable to use a method of increasing the thickness of the entire insulating layer to increase the withstand voltage to prevent dielectric breakdown.
However, in this case, the brightness of the emitted light decreases, so the applied voltage has to be increased, resulting in dielectric breakdown and increasing power consumption.

本発明は上記問題点に鑑みて、一対の平板電極
の間にあつて電圧の印加に応答して発光する発光
層を区切つて配置された絶縁体でこの発光層にか
かる電界の強度を弱めることによつて、発光層の
発光パターンの広範囲にわたる絶縁破壊の拡大を
防止して発光表示手段としての信頼性の高いEL
素子の提供を目的とするものである。
In view of the above-mentioned problems, the present invention reduces the intensity of the electric field applied to the light-emitting layer with an insulator placed between a pair of flat electrodes to separate the light-emitting layer that emits light in response to the application of voltage. This prevents the expansion of dielectric breakdown over a wide range of the light-emitting pattern of the light-emitting layer, making it highly reliable as a light-emitting display means.
The purpose is to provide devices.

以下本発明を図に示す実施例について説明す
る。第1図は本発明のEL素子の第1実施例の斜
視図である。1はEL素子を片側の表面に形成し
ているガラス基板、2はガラス基板1の表面に形
成した透明電極、3はY2O3等の絶縁材料を使用
した下部絶縁層、4は微小な分割間〓(以下、微
小間〓という)を介して複数個に分割されて独立
した小片状の発光層、5は発光層4の上に積層し
た下部絶縁層3と同じ材料を使用した上部絶縁
層、6はAl等を使用して、透明電極2と一対に
なつた電極、7は発光層4の微小間隔に充てんさ
れ、格子状に厚くなつた上部絶縁層の格子部であ
る。なお、絶縁層3,5は発光層4と一対の電極
2,6との間に位置していて、各図より厚みの
厚、薄構成を有している。また、各図よりわかる
ごとく、絶縁層3,5による厚みの厚い部分で発
光層4が複数の領域に区画されることになる。
The present invention will be described below with reference to embodiments shown in the drawings. FIG. 1 is a perspective view of a first embodiment of the EL element of the present invention. 1 is a glass substrate with an EL element formed on one surface, 2 is a transparent electrode formed on the surface of glass substrate 1, 3 is a lower insulating layer using an insulating material such as Y 2 O 3 , and 4 is a microscopic A light emitting layer is divided into a plurality of independent small pieces through a dividing space (hereinafter referred to as a micro space), and 5 is an upper part made of the same material as the lower insulating layer 3 laminated on the light emitting layer 4. The insulating layer 6 is an electrode made of Al or the like and paired with the transparent electrode 2, and 7 is a lattice part of the upper insulating layer which is filled in minute intervals in the light emitting layer 4 and thickened in a lattice shape. Note that the insulating layers 3 and 5 are located between the light emitting layer 4 and the pair of electrodes 2 and 6, and are thicker and thinner than those shown in each figure. Further, as can be seen from each figure, the light emitting layer 4 is divided into a plurality of regions by the thick portions of the insulating layers 3 and 5.

次に上記構成においてその作用を説明する。
EL素子の透明電極2と電極6の間に電圧が印加
されると発光層4が発光する。発光層4のうちど
れか1個が絶縁破壊を生ずると破壊はその1個の
発光層4の小片全体に拡がる。しかし発光層4の
小片と小片の間には絶縁材料の格子部7があり、
同じ厚さの発光層4よりも絶縁破壊を起こしにく
い。したがつて発光層4の絶縁破壊は拡がつたと
しても小片1個のみで止まる。このように発光層
4の小片の面積を充分小さくして格子部7の目を
細分することにより、どこか一箇所で絶縁破壊が
生じたとしても発光パターンの広範囲にわたる破
壊を防止することが可能で、EL素子の発光表示
手段としての信頼性を向上できる。
Next, the operation of the above configuration will be explained.
When a voltage is applied between the transparent electrode 2 and the electrode 6 of the EL element, the light emitting layer 4 emits light. When any one of the light-emitting layers 4 undergoes dielectric breakdown, the breakdown spreads to the entire small piece of that one light-emitting layer 4. However, there are lattice parts 7 of insulating material between the small pieces of the light emitting layer 4,
Dielectric breakdown is less likely to occur than the light emitting layer 4 of the same thickness. Therefore, even if the dielectric breakdown of the light emitting layer 4 spreads, it is limited to only one small piece. In this way, by making the area of the small pieces of the light emitting layer 4 sufficiently small and subdividing the mesh of the lattice portion 7, even if dielectric breakdown occurs in one place, it is possible to prevent the light emitting pattern from being destroyed over a wide range. Therefore, the reliability of the EL element as a light emitting display means can be improved.

第2図と第3図に本発明のEL素子の製法を示
す。ガラス基板1上に透明電極2と下部絶縁層3
及びMn、TbF3等をドープしたZnSを積層して形
成した後、フオトエツチング等の方法で発光層4
を小片に分割する微小間隔を設ける。次に上部絶
縁層5と、上部絶縁層5を厚くして発光層4の微
小間隔に充てんした格子部7が下部絶縁層3と同
材料の絶縁物を蒸着等の方法を用いることによつ
て形成される。(第2図に示す)ここで発光層4
はその微小間隔には蒸着等で均等な厚さに上部絶
縁層5が形成されるため発光層4の上部に凸部が
できる。そしてこの凸部をフオトエツチング等の
方法で除去して平坦にする。(第3図に示す)そ
してAl等の電極6を形成すればEL素子の構造が
完成する。
FIGS. 2 and 3 show the method for manufacturing the EL element of the present invention. Transparent electrode 2 and lower insulating layer 3 on glass substrate 1
After forming a layer of ZnS doped with Mn, TbF 3 , etc., the light-emitting layer 4 is formed by a method such as photo etching.
A minute interval is provided to divide the material into small pieces. Next, the upper insulating layer 5 and the lattice portions 7, which are made thicker and filled in minute intervals in the light emitting layer 4, are formed by using a method such as vapor deposition of an insulator made of the same material as the lower insulating layer 3. It is formed. (shown in FIG. 2) where the light emitting layer 4
Since the upper insulating layer 5 is formed with a uniform thickness by vapor deposition or the like at such minute intervals, a convex portion is formed on the upper part of the light emitting layer 4. This convex portion is then removed by photoetching or the like to make it flat. (As shown in FIG. 3) Then, by forming an electrode 6 made of Al or the like, the structure of the EL element is completed.

なお第2実施例として第4図に示すようなもの
がある。これは下部絶縁層3と上部絶縁層5に誘
電率の高いTiO2、BaTiO3、Ta2O5等の材料を使
用し、発光層4を分割する微小間隔にある絶縁物
の格子部7には下部絶縁層3と上部絶縁層5で使
用した材料よりも低誘導率であるが破壊電圧の高
いSi3N4、Y2O3、Al2O3等の材料を使用したもの
である。
Note that there is a second embodiment as shown in FIG. This uses a material with a high dielectric constant such as TiO 2 , BaTiO 3 , or Ta 2 O 5 for the lower insulating layer 3 and the upper insulating layer 5 , and insulator lattice parts 7 at minute intervals dividing the light emitting layer 4 . This uses materials such as Si 3 N 4 , Y 2 O 3 , and Al 2 O 3 which have a lower dielectric constant than the materials used for the lower insulating layer 3 and the upper insulating layer 5 but have a higher breakdown voltage.

また、上記格子部7はいずれも正方格子である
がこの形状は特に規定はない。しかも格子部の設
定位置は一対になつた電極、すなわち透明電極2
と電極6の間であればよく、第1、第2実施例に
おいて下部絶縁層3と上部絶縁層5のどちらか一
方あるいは両方とも省いて絶縁材料の格子部と発
光層だけが電極間に存在する構造にすることもで
きる。
Furthermore, although the lattice portions 7 are all square lattice shapes, there is no particular regulation regarding this shape. Moreover, the setting position of the grid portion is a pair of electrodes, that is, transparent electrode 2.
and the electrode 6; in the first and second embodiments, one or both of the lower insulating layer 3 and the upper insulating layer 5 is omitted, and only the lattice portion of the insulating material and the light emitting layer are present between the electrodes. It is also possible to have a structure that

以上述べたように本発明によれば、発光層を複
数に分割してその分割間〓に絶縁体を配置した構
成であるため、発光層の破壊を各分割発光層内に
止め、他の領域の発光層への連鎖的伝播を防ぐこ
とができ、信頼性を向上できて実用上の効果は絶
大である。
As described above, according to the present invention, since the light emitting layer is divided into a plurality of parts and an insulator is placed between the divided parts, destruction of the light emitting layer is stopped within each divided light emitting layer, and destruction of the light emitting layer is prevented from occurring in other areas. It is possible to prevent chain propagation of light to the light-emitting layer, improve reliability, and have a great practical effect.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第1実施例の斜視図、第2、
第3図は第1実施例のEL素子の製法を示す断面
図、第4図は第2実施例の断面図、である。 1……ガラス基板、2……透明電極、3……下
部絶縁層、4……発光層、5……上部絶縁層、6
……電極、7……格子部。
FIG. 1 is a perspective view of the first embodiment of the present invention;
FIG. 3 is a sectional view showing the method for manufacturing the EL element of the first embodiment, and FIG. 4 is a sectional view of the second embodiment. DESCRIPTION OF SYMBOLS 1...Glass substrate, 2...Transparent electrode, 3...Lower insulating layer, 4...Light emitting layer, 5...Upper insulating layer, 6
...electrode, 7...grid section.

Claims (1)

【特許請求の範囲】 1 一対の電極と、この一対の電極間に位置し、
かつ電圧の印加に応答して発光する複数個に分割
された発光層と、この分割された前記発光層の
個々の間の分割間〓に配置された絶縁体と、を具
備したことを特徴とする薄膜エレクトロルミネツ
センス素子。 2 前記一対の電極と前記発光層との間には絶縁
層が配置されていることを特徴とする特許請求の
範囲第1項記載の薄膜エレクトロルミネツセンス
素子。 3 前記絶縁層は一対の電極の少なくとも一方の
側に位置していることを特徴とする特許請求の範
囲第2項記載の薄膜エレクトロルミネツセンス素
子。 4 複数に分割された前記発光層の前記分割間〓
に配置された前記絶縁体は、前記絶縁層よりも低
誘電率、かつ高破壊電圧の特性を有する材料によ
り構成されていることを特徴とする特許請求の範
囲第3項記載の薄膜エレクトロルミネツセンス素
子。 5 前記一対の電極は表面が平板状であることを
特徴とする特許請求の範囲第1項〜第4項何れか
一つに記載の薄膜エレクトロルミネツセンス素
子。
[Claims] 1. A pair of electrodes, located between the pair of electrodes,
and a light emitting layer divided into a plurality of parts that emit light in response to the application of a voltage, and an insulator disposed between the divisions of each of the divided light emitting layers. Thin film electroluminescent device. 2. The thin film electroluminescent device according to claim 1, wherein an insulating layer is disposed between the pair of electrodes and the light emitting layer. 3. The thin film electroluminescent device according to claim 2, wherein the insulating layer is located on at least one side of the pair of electrodes. 4 Between the divisions of the luminescent layer divided into a plurality of parts〓
The thin film electroluminescent device according to claim 3, wherein the insulator disposed in the insulating layer is made of a material having a lower dielectric constant and a higher breakdown voltage than the insulating layer. sense element. 5. The thin film electroluminescent device according to any one of claims 1 to 4, wherein the pair of electrodes has a flat surface.
JP58075632A 1983-04-28 1983-04-28 Thin film electroluminescent element Granted JPS59201391A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58075632A JPS59201391A (en) 1983-04-28 1983-04-28 Thin film electroluminescent element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58075632A JPS59201391A (en) 1983-04-28 1983-04-28 Thin film electroluminescent element

Publications (2)

Publication Number Publication Date
JPS59201391A JPS59201391A (en) 1984-11-14
JPH046276B2 true JPH046276B2 (en) 1992-02-05

Family

ID=13581816

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58075632A Granted JPS59201391A (en) 1983-04-28 1983-04-28 Thin film electroluminescent element

Country Status (1)

Country Link
JP (1) JPS59201391A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814556Y2 (en) * 1979-01-22 1983-03-23 オムロン株式会社 electroluminescent device
JPS58137882A (en) * 1982-02-10 1983-08-16 富士通株式会社 El display

Also Published As

Publication number Publication date
JPS59201391A (en) 1984-11-14

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