JPH0472391B2 - - Google Patents
Info
- Publication number
- JPH0472391B2 JPH0472391B2 JP57004978A JP497882A JPH0472391B2 JP H0472391 B2 JPH0472391 B2 JP H0472391B2 JP 57004978 A JP57004978 A JP 57004978A JP 497882 A JP497882 A JP 497882A JP H0472391 B2 JPH0472391 B2 JP H0472391B2
- Authority
- JP
- Japan
- Prior art keywords
- type
- layer
- amorphous silicon
- solar cell
- sih
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
- H10F71/103—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material including only Group IV materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Photovoltaic Devices (AREA)
Description
【発明の詳細な説明】
本発明はpin型アモルフアスシリコン太陽電池
に関し、特にジシラン以上の高次シランの分解に
より得られるアモルフアスシリコン(a−Si)膜
をi型a−Si層とする新規な太陽電池に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a pin type amorphous silicon solar cell, and in particular to a novel amorphous silicon (a-Si) film obtained by decomposing a higher order silane than disilane as an i type a-Si layer. Regarding solar cells.
pin型a−Si太陽電池は、第1図に示した如く、
ガラス基板1、透明導電膜2、p型a−Si層3、
i型a−Si層4、n型a−Si層5、背面電極6に
より構成される。この太陽電池にガラス基板側か
ら光が入射するとi型a−Si層においてa−Siの
バンドギヤツプを越えるエネルギーを有する光に
対して電子と正孔とが発生する。この電子と正孔
とは、太陽電池の整流接合により生じる内部電界
により分離される。このように電子と正孔とに分
離されるので光電流及び光電圧が発生する。分離
された電子はn型a−Si層5へ、正孔はp型a−
Si層3へ流れて、電極により収集される。こうし
て外部へ光電流、光電圧として取り出すことがで
きる。すなわち太陽電池の効率は、入射光により
分離生成する電子と正孔をいかに効率よく外部へ
とり出すことができるかにかかつている。 As shown in Figure 1, the pin type A-Si solar cell is
glass substrate 1, transparent conductive film 2, p-type a-Si layer 3,
It is composed of an i-type a-Si layer 4, an n-type a-Si layer 5, and a back electrode 6. When light enters this solar cell from the glass substrate side, electrons and holes are generated in the i-type a-Si layer in response to the light having energy exceeding the band gap of a-Si. These electrons and holes are separated by an internal electric field generated by the rectifying junction of the solar cell. Since the electrons are separated into electrons and holes in this way, a photocurrent and a photovoltage are generated. The separated electrons go to the n-type a-Si layer 5, and the holes go to the p-type a-Si layer 5.
It flows into the Si layer 3 and is collected by the electrode. In this way, it can be extracted to the outside as a photocurrent and a photovoltage. In other words, the efficiency of a solar cell depends on how efficiently electrons and holes, which are separated and generated by incident light, can be extracted to the outside.
空間電荷領域の巾を増大させることにより上記
の目的を達成できることは公知である。このため
に特開昭56−4287号公報には、i型a−Si層がp
型ドープ剤で補償されることが開示されている。 It is known that the above objective can be achieved by increasing the width of the space charge region. For this reason, Japanese Patent Application Laid-open No. 56-4287 discloses that an i-type a-Si layer is
Compensation with type dopants is disclosed.
本発明者らはpin型太陽電池のi型a−si層を
高次シランを用いて形成することにより、p型ド
ープ剤を用いることなしに空間電荷領域の巾を増
大させることができることを見出した。 The present inventors have discovered that by forming the i-type A-SI layer of a pin-type solar cell using high-order silane, the width of the space charge region can be increased without using a p-type dopant. Ta.
すなわち、本発明のpin型アモルフアスシリコ
ン太陽電池は基板上に堆積されたアモルフアスシ
リコン層からなる発電領域を有するpin型アモル
フアスシリコン太陽電池において、p,n型半導
体層はモノシランならびにp,n型不純物をそれ
ぞれ含有するガスのグロー放電分解により形成さ
れ、光活性層である無ドープ(i型)アモルフア
スシリコン層がジシラン以上の高次シランの分解
により形成されることを特徴とするものである。 That is, the pin type amorphous silicon solar cell of the present invention has a power generation region made of an amorphous silicon layer deposited on a substrate, and the p and n type semiconductor layers are composed of monosilane and p and n. It is formed by glow discharge decomposition of gases containing type impurities, and is characterized in that the undoped (i-type) amorphous silicon layer, which is a photoactive layer, is formed by decomposition of a higher-order silane higher than disilane. be.
本発明においては、p型およびn型の半導体層
はモノシランならびにpおよびn型の不純物をそ
れぞれ含有するガスのグロー放電分解により形成
される。本発明者らにより、高次シランを原料と
する場合はドーピング効果が低いことが見出され
たからである。 In the present invention, p-type and n-type semiconductor layers are formed by glow discharge decomposition of gases containing monosilane and p- and n-type impurities, respectively. This is because the present inventors have found that when higher-order silane is used as a raw material, the doping effect is low.
本発明ではジシラン以上の高次シラン(以下ジ
シラン等と称す)として、化学的に合成された物
質あるいはモノシランの無声放電の如き物理的に
合成された物質のいずれも使用可能である。ジシ
ラン等の分解は電気エネルギーは熱エネルギーの
印加の下に行なわれる。好ましい分解例としてグ
ロー放電雰囲気中での分解がある。 In the present invention, as the silane higher than disilane (hereinafter referred to as disilane, etc.), either a chemically synthesized substance or a physically synthesized substance such as a silent discharge of monosilane can be used. The decomposition of disilane and the like is carried out under the application of electrical energy and thermal energy. A preferred example of decomposition is decomposition in a glow discharge atmosphere.
本発明の太陽電池の製造方法を第1図を参照し
て説明する。透明導電膜を有するガラス基板1を
グロー放電装置内に入れる。装置内を10-2Torr
以下好ましくは10-5Torr以下の圧力に減じた後
加熱する。好ましくはモノシラン(SiH4)や水
素のような還元性ガスを適当量、たとえば5〜
100c.c./分の流量で流し基板1を200〜400℃に加
熱する。基板温度が所定の値になつた後、SiH4
にジボラン(B2H6)を適当量混合し、必要に応
じて水素を加えて流し、装置内の圧力をグロー放
電が生じるに適当な圧力、たとえば0.05〜5Torr
に調節してグロー放電を開始する。SiH4に対す
るB2H6の体積割合は10-4〜10-1で適宜選択でき
るが好ましくは10-3〜10-2である。このp型a−
Si層3の厚みは50〜1000Åであるが、好ましくは
100〜500Åである。 A method for manufacturing a solar cell according to the present invention will be explained with reference to FIG. A glass substrate 1 having a transparent conductive film is placed in a glow discharge device. 10 -2 Torr inside the device
Hereinafter, the pressure is preferably reduced to 10 -5 Torr or less and then heated. Preferably, a suitable amount of a reducing gas such as monosilane (SiH 4 ) or hydrogen, for example 5 to
The substrate 1 is heated to 200 to 400° C. by flowing at a flow rate of 100 c.c./min. After the substrate temperature reaches the specified value, SiH 4
Mix an appropriate amount of diborane (B 2 H 6 ) with water, add hydrogen as necessary, and set the pressure inside the device to an appropriate pressure for glow discharge to occur, e.g. 0.05 to 5 Torr.
and start glow discharge. The volume ratio of B 2 H 6 to SiH 4 can be appropriately selected from 10 −4 to 10 −1 , but is preferably from 10 −3 to 10 −2 . This p-type a-
The thickness of the Si layer 3 is 50 to 1000 Å, preferably
It is 100-500 Å.
つぎにSi2H6を用いてi型a−Si層4を堆積さ
せる。i型a−Si層4の厚みは空間電荷領域が拡
大するためであろうが、SiH4を用いて堆積する
場合の2〜5倍に拡大することができる。Si2H6
はH2,ArおよびHe等で希釈して用いることがで
きる。SiH4の共存量は好ましくは10%以下であ
る。 Next, an i-type a-Si layer 4 is deposited using Si 2 H 6 . The thickness of the i-type a-Si layer 4 can be increased by 2 to 5 times when deposited using SiH 4 , probably due to the expansion of the space charge region. Si2H6 _
can be used after being diluted with H 2 , Ar, He, etc. The coexisting amount of SiH 4 is preferably 10% or less.
すなわち本発明においては、0.5〜1μ厚のi型
a−Si層を堆積させることができるので、従来技
術よりもより効果的に入射光のエネルギーを利用
することができる。ジシラン等はSiH4よりも、
グロー放電雰囲気において、より容易に分解され
るらしく堆積速度も大である。堆積速度が大であ
ることは特開昭56−83929号公報に開示されてい
る。しかるにジシラン等からのa−Si層の堆積に
おいては、a−Si層のドーピング効果がp型及び
n型のいずれにおいてもSiH4からのa−Si層よ
りも低い。いいかえればSiH4に対すると同じ量
のp型やn型のドープ剤をジシラン等に添加した
のでは同じドーピングの効果が発現しない。ジシ
ラン等の用いてi型a−Si層を堆積させると、欠
陥による空間電荷密度が小さくなり、より真性に
近い半導体層となるのであろうし、これはまた上
記のようにドーピングのされにくさに関係してい
るのであろう。 That is, in the present invention, since an i-type a-Si layer with a thickness of 0.5 to 1 μm can be deposited, the energy of incident light can be utilized more effectively than in the prior art. Disilane etc. are more effective than SiH 4 .
In a glow discharge atmosphere, it seems to be more easily decomposed and the deposition rate is also high. The fact that the deposition rate is high is disclosed in JP-A-56-83929. However, in the deposition of an a-Si layer made of disilane or the like, the doping effect of the a-Si layer is lower than that of an a-Si layer made of SiH 4 in both p-type and n-type. In other words, adding the same amount of p-type or n-type dopant to disilane or the like as to SiH 4 does not produce the same doping effect. If an i-type a-Si layer is deposited using disilane or the like, the space charge density due to defects will be reduced, resulting in a semiconductor layer that is closer to the intrinsic state, and this also makes it difficult to dope as mentioned above. It's probably related.
ジシラン等の分解条件はSiH4の分解条件と同
じであつてもよいが、よりおだやかな条件でよ
い。すなわち雰囲気圧力は0.01〜5Torr、放電電
力は30〜100Wで充分である。また放電電力を大
きくしてa−Si層の一部を微結晶化させることも
できる。 The decomposition conditions for disilane and the like may be the same as the decomposition conditions for SiH 4 , but milder conditions may be used. That is, an atmospheric pressure of 0.01 to 5 Torr and a discharge power of 30 to 100 W are sufficient. It is also possible to microcrystallize part of the a-Si layer by increasing the discharge power.
ついでn型a−Si層5を堆積させる。n型のド
ープ剤はホスフイン(PH3)、アルシン(AsH3)
等である。このn型a−Si層5は背面電極6との
オーム接触を確実にするものである。n型a−Si
層5が第1図のように光の入射に対し反対側に位
置するときには、n型a−Si層5の厚みは特に限
定されるものではなく、100〜500Åの厚みがあれ
ば充分である。SiH4に対するPH3の体積割合は
10-5〜10-1で適宜選択できるが好ましくは10-4〜
10-3である。 Then, an n-type a-Si layer 5 is deposited. N-type dopants are phosphine (PH 3 ) and arsine (AsH 3 ).
etc. This n-type a-Si layer 5 ensures ohmic contact with the back electrode 6. n-type a-Si
When the layer 5 is located on the opposite side to the incident light as shown in FIG. 1, the thickness of the n-type a-Si layer 5 is not particularly limited, and a thickness of 100 to 500 Å is sufficient. . The volume ratio of PH3 to SiH4 is
It can be selected as appropriate from 10 -5 to 10 -1 , but preferably from 10 -4 to
10 -3 .
n型a−Si層を所定厚みに体積したあとで、蒸
着法、印刷法等当業者に公知の方法により背面電
極6を被着する。 After depositing the n-type a-Si layer to a predetermined thickness, the back electrode 6 is deposited by a method known to those skilled in the art, such as vapor deposition or printing.
本発明のpin型のアモルフアスシリコン太陽電
池においては、p型およびn型の半導体層をモノ
シランとそれぞれp型およびn型不純物とを含有
するガスを原料として形成し、かつ、光活性層を
p型ドープ剤を用いることなく高次シランを原料
として形成することにより、高い光電変換効率が
得られる。 In the pin-type amorphous silicon solar cell of the present invention, the p-type and n-type semiconductor layers are formed using gases containing monosilane and p-type and n-type impurities, respectively, and the photoactive layer is formed using p-type and n-type semiconductor layers as raw materials. High photoelectric conversion efficiency can be obtained by forming the film using high-order silane as a raw material without using a mold doping agent.
次に実施例をあげて本発明をさらに具体的に説
明する。 Next, the present invention will be explained in more detail with reference to Examples.
実施例 1
約500Å厚にインジウム錫酸化物の透明導電膜
が被着せられたガラス基板をRF・容量結合型プ
ラズマ発生装置内に入れて、熱伝達を容易にする
ためSiH4を流しながら約300℃に加熱した。Example 1 A glass substrate coated with a transparent conductive film of indium tin oxide to a thickness of approximately 500 Å was placed in an RF/capacitively coupled plasma generator, and heated for approximately 300 Å while flowing SiH 4 to facilitate heat transfer. heated to ℃.
ついでSiH4とB2H6とをB2H6対SiH4の混合比
が10-2になるように、SiH4とB2H6とを導入し、
厚み約150Åのp型a−Si層を形成した。 Next , SiH 4 and B 2 H 6 were introduced so that the mixing ratio of B 2 H 6 to SiH 4 was 10 -2 ,
A p-type a-Si layer with a thickness of about 150 Å was formed.
つぎにSi2H6(ガスクロマトグラフ法によるSi2
H6含量90%以上、SiH4約7%以下、Si3H8以上
の高次シラン3%以上)を導入し、所定の厚みま
でi型a−Si層を堆積させた。 Next, Si 2 H 6 (Si 2 H 6 by gas chromatography method)
An i - type a - Si layer was deposited to a predetermined thickness.
つぎにSiH4とPH3とをPH3対SiH4の混合比が
10-3になるようにSiH4とPH3とを導入し、厚み
約500Åのn型a−Si層を形成した。この上にア
ルミニウム薄膜を真空蒸着により被着し、背面電
極とした。 Next, SiH 4 and PH 3 are mixed at a mixing ratio of PH 3 to SiH 4 .
SiH 4 and PH 3 were introduced to give a concentration of 10 −3 to form an n-type a-Si layer with a thickness of about 500 Å. A thin aluminum film was deposited on this by vacuum evaporation to form a back electrode.
i型a−Si層の厚みを3000Å,5000Å,7000
Å,10000Åの4種類作成した。この結果5000〜
10000Åのi型a−Si層を有するセルは、従来の
3000Åのa−Si層を有するセルの約2〜3倍の短
絡電流を15Wの蛍光灯照射下に得た。この時、開
放電圧は殆んど変化せず、光電変換効率の向上が
確認された。 The thickness of the i-type a-Si layer is 3000 Å, 5000 Å, 7000 Å.
Four types were created: Å, 10000Å. This result is 5000~
A cell with a 10,000 Å i-type a-Si layer is
A short circuit current about 2 to 3 times higher than that of a cell with a 3000 Å a-Si layer was obtained under 15 W fluorescent lamp illumination. At this time, the open circuit voltage hardly changed, and it was confirmed that the photoelectric conversion efficiency was improved.
第1図はジシランの分解により得られるi型a
−Si層を含むpin型a−Si太陽電池の縦断面図で
ある。
0……入射光、1……ガラス基板、2……透明
導電膜、3……p型a−Si層、4……i型a−Si
層、5……n型a−Si層、6……電極。
Figure 1 shows type i obtained by decomposition of disilane.
FIG. 2 is a longitudinal cross-sectional view of a pin-type a-Si solar cell including a -Si layer. 0... Incident light, 1... Glass substrate, 2... Transparent conductive film, 3... P-type a-Si layer, 4... I-type a-Si
layer, 5... n-type a-Si layer, 6... electrode.
Claims (1)
からなる発電領域を有するpin型アモルフアスシ
リコン太陽電池において、p,n型半導体層はモ
ノシランならびにp,n型不純物をそれぞれ含有
するガスのグロー放電分解により形成され、光活
性層である無ドープ(i型)アモルフアスシリコ
ン層がジシラン以上の高次シランの分解により形
成されることを特徴とするpin型アモルフアスシ
リコン太陽電池。1. In a pin-type amorphous silicon solar cell having a power generation region consisting of an amorphous silicon layer deposited on a substrate, the p- and n-type semiconductor layers are formed by glow discharge decomposition of gases containing monosilane and p- and n-type impurities, respectively. 1. A pin-type amorphous silicon solar cell characterized in that an undoped (i-type) amorphous silicon layer serving as a photoactive layer is formed by decomposing a higher-order silane higher than disilane.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57004978A JPS58122784A (en) | 1982-01-18 | 1982-01-18 | Solar battery |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57004978A JPS58122784A (en) | 1982-01-18 | 1982-01-18 | Solar battery |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58122784A JPS58122784A (en) | 1983-07-21 |
| JPH0472391B2 true JPH0472391B2 (en) | 1992-11-18 |
Family
ID=11598678
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57004978A Granted JPS58122784A (en) | 1982-01-18 | 1982-01-18 | Solar battery |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58122784A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6193675A (en) * | 1984-10-12 | 1986-05-12 | Sanyo Electric Co Ltd | Method of manufacturing photovoltaic device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5671927A (en) * | 1979-11-15 | 1981-06-15 | Canon Inc | Manufacture of amorphous hydro-silicon layer |
| US4363828A (en) * | 1979-12-12 | 1982-12-14 | International Business Machines Corp. | Method for depositing silicon films and related materials by a glow discharge in a disiland or higher order silane gas |
| JPS56107551A (en) * | 1980-01-30 | 1981-08-26 | Fuji Photo Film Co Ltd | Amorphous semiconductor having chemical modification |
-
1982
- 1982-01-18 JP JP57004978A patent/JPS58122784A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58122784A (en) | 1983-07-21 |
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