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JPH0473662B2 - - Google Patents
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JPH0473662B2 - - Google Patents

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Publication number
JPH0473662B2
JPH0473662B2 JP23977783A JP23977783A JPH0473662B2 JP H0473662 B2 JPH0473662 B2 JP H0473662B2 JP 23977783 A JP23977783 A JP 23977783A JP 23977783 A JP23977783 A JP 23977783A JP H0473662 B2 JPH0473662 B2 JP H0473662B2
Authority
JP
Japan
Prior art keywords
relay
line
contact
lines
relays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP23977783A
Other languages
Japanese (ja)
Other versions
JPS60132450A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP23977783A priority Critical patent/JPS60132450A/en
Publication of JPS60132450A publication Critical patent/JPS60132450A/en
Publication of JPH0473662B2 publication Critical patent/JPH0473662B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M3/00Automatic or semi-automatic exchanges
    • H04M3/22Arrangements for supervision, monitoring or testing
    • H04M3/26Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、自動交換機の回線対応に局内線、局
外線を開閉する継電器を設けた本配線盤におい
て、局外線を試験装置へ引込む方式に関するもの
である。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a system for leading outside lines to testing equipment in a distribution board equipped with relays for switching on and off internal lines and outside lines corresponding to the lines of an automatic exchange. It is.

〔発明の背景〕 従来、加入者線などの局外線を試験装置に引込
むには、局外線対応の試験引込み継電器を用い
て、その継電器の選択により任意の局外線を試験
装置を引込む方法をとつている。このため、試験
引込みのための専用の引込み継電器を必要とし、
不経済であつた。
[Background of the Invention] Conventionally, in order to connect an external line such as a subscriber line to a test equipment, a test lead-in relay compatible with the external line is used, and by selecting the relay, an arbitrary external line is connected to the test equipment. It's on. For this reason, a dedicated pull-in relay is required for test pull-in.
It was uneconomical.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、被試験局外線の任意の1回線
を極めて経済的に試験装置へ引込む方式を提供す
ることにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a method for very economically introducing any one external line under test to a test device.

〔発明の概要〕[Summary of the invention]

本発明は、上記目的を達するため、回線対応に
局内線、局外線を開閉する継電器を設けた本配線
盤において、2回線を1組としてその空接点を利
用し、継電器の動作、復旧の組合せにより1回線
を試験装置へ引込む試験パターンを作成するよう
にしたものである。
In order to achieve the above-mentioned object, the present invention utilizes the empty contacts of two lines as one set in this distribution board equipped with relays for switching internal and external lines for each line, and combines relay operation and restoration. This method creates a test pattern for connecting one line to the test equipment.

〔発明の実施例〕[Embodiments of the invention]

以下、図面に従い本発明の一実施例を説明す
る。第1図において、SUBA,Bは加入者、
LINEA,Bは局外線、LINEa,bは局内線、
NWは自動交換機、S,tは継電器接点、TST
は試験装置を示す。また、第2図は第1図の継電
器の動作状態を示す図である。
An embodiment of the present invention will be described below with reference to the drawings. In Figure 1, SUBA,B is a subscriber,
LINEA, B are external lines, LINEa, b are internal lines,
NW is automatic exchange, S, t are relay contacts, TST
indicates the test equipment. Further, FIG. 2 is a diagram showing the operating state of the relay shown in FIG. 1.

まず、第1図において局外線LINEA,Bは、
2回線を1組とし継電器接点s,tを経由し、局
内線LINEa,bと接続されている。これにより
S,T継電器(図示されていない)の動作・復旧
により、加入者SUBA,Bについて、それぞれ
局内線と局外線の切分けが可能となる。第1図で
はS,T継電器両方復旧している状態すなわち、
加入者SUBA,Bともに使用中の状態を図示し
ている。
First, in Figure 1, the external lines LINEA and B are
A set of two lines is connected to local office lines LINEa and LINEb via relay contacts s and t. As a result, by operating and restoring the S and T relays (not shown), it becomes possible to separate the internal and external lines for subscribers SUBA and B, respectively. In Figure 1, both S and T relays are restored, that is,
Both subscribers SUBA and B are shown in use.

次に加入者SUBBを使用中に加入者SUBAを試
験装置TSTへ引込むためにはS継電器(図示さ
れていない)だけ動作の状態にすれば、SUBA
−LINEA−S−t−TSTの径路で接続される。
Next, in order to pull subscriber SUBA into the test equipment TST while subscriber SUBB is in use, only the S relay (not shown) needs to be activated.
-LINEA-S-t-TST.

これにより試験装置TSTは局外線LINEA及
び、加入者SUBAの試験が可能となる。
This allows the test equipment TST to test the outside line LINEA and the subscriber SUBA.

同様に加入者SUBBを試験装置へ引込むために
は、T継電器(図示されていない)動作、S継電
器(図示されていない)復旧の状態とすればよ
い。また、加入者SUBA,Bともに空の時は、
T,S継電器(図示されていない)を両方動作の
状態とすれば、自動交換機NW、及び試験装置
TSTから切り離される。しかし第1図では、2
回線(1組)を図示しているが同一組内で使用中
と空が混在した組が多数存在すると空回線は試験
中と同じ状態となり、全空回線が複式となつてし
まう。よつて、実際に試験する回線以外は一時的
に使用中の状態にする必要があり継電器の制御が
複雑となる問題がある。
Similarly, in order to draw subscriber SUBB into the test equipment, the T relay (not shown) may be activated and the S relay (not shown) restored. Also, when both subscribers SUBA and B are empty,
If both T and S relays (not shown) are in operation, the automatic switch NW and test equipment
Disconnected from TST. However, in Figure 1, 2
Although lines (one set) are shown in the figure, if there are many pairs in the same group that are both in use and empty, the empty lines will be in the same state as during the test, and the all-air lines will become multiple lines. Therefore, lines other than those to be actually tested must be temporarily kept in use, complicating relay control.

上記問題点を解決したのが第3図である。以
下、第3図を説明する。第1図と同一名称のもの
は同一機能を有する。SUBC,Dは加入者、
LINEC,Dは局外線、LINEc,dは局内線、s
0,t0,s1,t1,st,chは継電器接点であ
る。s0,t0,s1,t1継電器接点は第1図
のs,t継電器接点と同様の機能であり説明は省
略する。
Figure 3 shows a solution to the above problem. FIG. 3 will be explained below. Items with the same names as in FIG. 1 have the same functions. SUBC, D is subscriber,
LINEC, D is an outside line, LINEc, d is an internal line, s
0, t0, s1, t1, st, ch are relay contacts. The s0, t0, s1, and t1 relay contacts have the same functions as the s and t relay contacts in FIG. 1, and their explanation will be omitted.

ここでは、局外線LINEA,BとLINEC,Dを
それぞれ1組とし、2組の回線を継電器接点stに
より試験装置TSTへ接続することとし、継電器
接点chにより、局外線LINEA,B又は局外線
LINEC,Dを選択する構成とする。
Here, the outside lines LINEA, B and LINEC, D are each set as one set, and the two sets of lines are connected to the test equipment TST by relay contact st, and the outside lines LINEA, B or outside line
The configuration is such that LINEC and D are selected.

例えば、加入者SUBA,Cが使用中、加入者
SUBBが空の状態、すなわち、S0,S1継電器
(図示されていない)復旧中、T0,T1継電器
(図示されていない)動作中に、加入者SUBA及
び局外線LINEDを試験装置TSTへ接続する場合
は、ST,CH継電器(図示されていない)を動作
させればよい。加入者SUBD及び局外線LINED
は、SUDG−LINED−t1−s1−st−ch−
TSTの径路で接続される。以上、説明したよう
に、ST,CH継電器(図示されていない)を設け
ることにより、空と使用中が混在する組であつて
も容易に複式とすることができる。
For example, while subscriber SUBA,C is using
When connecting subscriber SUBA and external line LINED to test equipment TST while SUBB is empty, that is, S0 and S1 relays (not shown) are being restored and T0 and T1 relays (not shown) are operating. , simply operate the ST and CH relays (not shown). Subscriber SUBD and outside line LINED
is SUDG-LINED-t1-s1-st-ch-
Connected by TST path. As described above, by providing ST and CH relays (not shown), it is possible to easily create a duplex system even if the set is empty and in use.

〔発明の効果〕〔Effect of the invention〕

以上説明した如く、本発明により、回線対応に
局内、局外を開閉する継電器を設けた本配線盤に
おいて、局外線を試験装置へ引込むことが経済的
に実現可能であるなどの効果がある。
As explained above, the present invention has the effect that it is economically possible to lead the outside line to the test equipment in this distribution board which is provided with a relay that switches between inside and outside the station corresponding to the line.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の1実施例を示す図、第2図は
第1図の継電器の動作状態を示す図、第3図は本
発明の他の実施例を示す図である。 SUBA〜D……加入者、LINEA〜D……局外
線、LINEa〜d……局内線、NW……自動交換
機、TST……試験装置、s,t,s0,s1,
t0,t1……継電器接点。
FIG. 1 is a diagram showing one embodiment of the present invention, FIG. 2 is a diagram showing the operating state of the relay of FIG. 1, and FIG. 3 is a diagram showing another embodiment of the present invention. SUBA~D...Subscriber, LINEA~D...Outside line, LINEa~d...Internal line, NW...Automatic switchboard, TST...Test equipment, s, t, s0, s1,
t0, t1...Relay contacts.

Claims (1)

【特許請求の範囲】 1 加入者端末に接続された2回線を1組とする
局外線と自動交換機に接続された2回線を1組と
する局内線との開閉及び局外線と試験装置との開
閉を行う接点を有する第1、第2の継電器を具え
た本配線盤において、 上記局外線の一方の回線と上記局内線の一方の
回線との間に上記第1の継電器の第1接点を設
け、 上記局外線の他方の回線と上記局内線の他方の
回線との間に上記第2の継電器の第1接点を設
け、 上記第1の継電器の第1接点と上記試験装置と
の間に上記第2の継電器の第2接点を接続し、上
記第2の継電器の第1接点と上記試験装置との間
に上記第1の継電器の第2接点を接続し、 上記1組の局外線の一方及び他方を上記第1、
第2の継電器の第1接点を介して上記自動交換機
に接続可能とすると共に上記第1、第2の継電器
の第1、第2の接点を介して上記試験装置に接続
可能に構成し、 上記第1、第2の継電器の一方が第1の状態に
あり、他方が第2の状態にある時にのみ、該第1
の状態にある継電器の第1接点に接続されている
側の局外線を上記第1、第2の継電器の第1、第
2接点を介して上記試験装置側に引き込むことを
特徴とする被試験回路引込み方式。
[Scope of Claims] 1. Opening/closing of an outside line, which consists of two lines connected to a subscriber terminal, and an internal line, which consists of two lines connected to an automatic exchange, and between the outside line and the test equipment. In this distribution board equipped with first and second relays having contacts for opening and closing, the first contact of the first relay is connected between one line of the outside line and one line of the internal line. providing a first contact of the second relay between the other line of the outside line and the other line of the internal line, and between the first contact of the first relay and the test device. a second contact of the second relay is connected, a second contact of the first relay is connected between a first contact of the second relay and the test device, and a second contact of the first relay is connected between the first contact of the second relay and the test device; One and the other are the above-mentioned first,
The second relay is configured to be connectable to the automatic exchange through the first contact and also connectable to the test device through the first and second contacts of the first and second relays, Only when one of the first and second relays is in the first state and the other is in the second state, the first relay
The outside line on the side connected to the first contact of the relay in the state of is drawn into the test apparatus side through the first and second contacts of the first and second relays. Circuit lead-in method.
JP23977783A 1983-12-21 1983-12-21 Leading-in system for circuit to be tested Granted JPS60132450A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23977783A JPS60132450A (en) 1983-12-21 1983-12-21 Leading-in system for circuit to be tested

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23977783A JPS60132450A (en) 1983-12-21 1983-12-21 Leading-in system for circuit to be tested

Publications (2)

Publication Number Publication Date
JPS60132450A JPS60132450A (en) 1985-07-15
JPH0473662B2 true JPH0473662B2 (en) 1992-11-24

Family

ID=17049737

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23977783A Granted JPS60132450A (en) 1983-12-21 1983-12-21 Leading-in system for circuit to be tested

Country Status (1)

Country Link
JP (1) JPS60132450A (en)

Also Published As

Publication number Publication date
JPS60132450A (en) 1985-07-15

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