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JPH0475467B2 - - Google Patents
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JPH0475467B2 - - Google Patents

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Publication number
JPH0475467B2
JPH0475467B2 JP11990883A JP11990883A JPH0475467B2 JP H0475467 B2 JPH0475467 B2 JP H0475467B2 JP 11990883 A JP11990883 A JP 11990883A JP 11990883 A JP11990883 A JP 11990883A JP H0475467 B2 JPH0475467 B2 JP H0475467B2
Authority
JP
Japan
Prior art keywords
differential
peak
value
difference
slope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP11990883A
Other languages
Japanese (ja)
Other versions
JPS6011172A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11990883A priority Critical patent/JPS6011172A/en
Publication of JPS6011172A publication Critical patent/JPS6011172A/en
Publication of JPH0475467B2 publication Critical patent/JPH0475467B2/ja
Granted legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は分光的測定において得られるスペクト
ルとかクロマトグラフイにおけるクロマトグラム
等でピーク位置を検出する回路に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a circuit for detecting a peak position in a spectrum obtained in spectroscopic measurement or a chromatogram in chromatography.

(ロ) 従来技術 通常、スペクトルとかクロマトグラムでピーク
位置を検出する装置の動作原理はスペクトル等の
一次微分のゼロクロス点を検出するものである。
しかしこの方法では第1図に1で示すように大き
なピークの斜面上に小さなピークが乗つているよ
うな場合とか、ベースラインの傾斜が大きい場
合、その一次微分は第1図に2で示すようなカー
ブとなり、ピークロ,ハのような比較的大きなピ
ークに対してはゼロクス点が存在するが、イ,ニ
のような小さなピークの場合ゼロクロス点は現わ
れず、この方法では斜面上に乗つている小さなピ
ークは検出できないことがある。
(b) Prior Art Usually, the operating principle of an apparatus for detecting a peak position in a spectrum or chromatogram is to detect a zero-crossing point of a first-order differential of a spectrum or the like.
However, with this method, if a small peak is on top of the slope of a large peak, as shown by 1 in Figure 1, or if the slope of the baseline is large, the first derivative will be calculated as shown by 2 in Figure 1. There is a zero-crossing point for relatively large peaks such as peaks Kuro and C, but zero-crossing points do not appear for small peaks such as A and D, and with this method, the curve is on a slope. Small peaks may not be detected.

(ハ) 目的 本発明は第1図にイ,ニで示したような斜面上
のきわめて小さなピークでも検出できるようなピ
ーク検出回路を提供しようとするものである。
(c) Purpose The present invention aims to provide a peak detection circuit that can detect even extremely small peaks on a slope as shown by A and D in FIG.

(ニ) 構成 微分演算は従属変数の微分dyを独立変数の微
分dxで割算するものであるが、測定データの微
分を装置的に求める場合の一般的方法はdxとし
て独立変数でΔxだけ距つた2点をとり、それに
対する測定出力の差Δyをyの微分としつΔy/
Δxを算出するものである。本発明は微分演算を
行うための独立変数上の2点の間隔として大、小
2種を用意し、小なる方の間隔Δx1を検出しよう
とするピークの幅より充分小さな値とし、他方の
大なる方のΔx2を例えば検出しようとするピーク
の幅と同程度とかそれ以上に設定し、これらの独
立変数の微分を用いて算出された測定データの一
次微分関数の差において、ゼロクロス点を検出す
るものである。
(d) Structure Differential operation is to divide the differential dy of the dependent variable by the differential dx of the independent variable, but the general method when calculating the differential of measurement data using an instrument is to divide the independent variable by a distance of Δx as dx. 2 points are taken, and the difference Δy of the measured output between them is taken as the differential of y, and Δy/
This is to calculate Δx. In the present invention, two types of intervals, large and small, are prepared for the interval between two points on an independent variable for performing a differential operation, and the interval Δx 1 of the smaller one is set to a value sufficiently smaller than the width of the peak to be detected, and the interval of the other For example, set the larger Δx2 to the same level or greater than the width of the peak to be detected, and detect the zero-crossing point at the difference between the first-order differential functions of the measured data calculated using the differentials of these independent variables. It is something to do.

今第2図に示す関数の一次微分をΔx1、Δx2を
用いて求めることを考える。Δx1を用いた場合の
一次微分Δy1/Δx1の最大値は、この関数の最大
傾斜点の接線aの勾配にきわめて近い値である。
これに対してΔx2を用いて求めた一次微分の最大
値は図に示す接線bの勾配であり、aの勾配に比
し小さい。これに対して第3図のような傾斜線に
対してはΔx1、Δx2何れを用いた一次微分も同じ
値になる。そこで第4図に示すように傾斜したベ
ースラインB上に低いピークAが乗つている場合
を考えると、ベースラインに対する微分はΔx1、
Δx2何れによつて求めた値も等しいから引算によ
り消去される。他方ピーク成分に対する微分値は
Δx1によるものが大でΔx2により求めたものは0
に近くなり、両方の微分の差はベースラインを除
いたピーク成分Aのみに対してΔx1を用いて求め
た一次微分にきわめて近く、ゼロクロス点を検出
することが可能となる。第1図のカーブ1におけ
るイとかニのピークはこの第4図の場合に相当す
るのである。
Now consider finding the first derivative of the function shown in Figure 2 using Δx1 and Δx2. When Δx1 is used, the maximum value of the first-order differential Δy1/Δx1 is very close to the slope of the tangent a at the maximum slope point of this function.
On the other hand, the maximum value of the first-order differential obtained using Δx2 is the slope of the tangent line b shown in the figure, which is smaller than the slope of the tangent line a. On the other hand, for a slope line as shown in FIG. 3, the first-order differential using either Δx1 or Δx2 has the same value. Therefore, if we consider the case where a low peak A is on a sloped baseline B as shown in Fig. 4, the differential with respect to the baseline is Δx1,
Since the values obtained by both Δx2 are equal, they are eliminated by subtraction. On the other hand, the differential value for the peak component is largely due to Δx1, and the value calculated using Δx2 is 0.
The difference between the two differentials is very close to the first-order differential obtained using Δx1 only for the peak component A excluding the baseline, and it becomes possible to detect the zero-crossing point. The peaks A and D in curve 1 in FIG. 1 correspond to the case in FIG. 4.

(ホ) 実施例 測定出力にはノイズが含まれていることが多い
から微分塩算を行う場合、ノイズを平均化する必
要がある。ノイズ平均化の方法は色々あるが、そ
の一つに価重平均法がある。第5図でx1、x2…
xn…は測定値のサンプリング点であり、縦軸は
測定値に価重を示す。今xn点における測定値の
平均値を求めるとする。xn点を中心に前後2k+
1個のサンプリング点のデータに図に縦棒で示し
た比率の価重を掛けて平均を求め、それをxnの
測定値とするのが価重平均法である。この方法を
xn、xn+1、xn+d、…の各点について行つて
ゆく。この考え方を微分演算に拡張したものがザ
ビツキー及びゴーレイ(Savi−tzky,Golay)に
よつて提案されている。第6図も第5図と同様横
軸にサンプリング点を示し、縦軸に測定値に掛け
る価重を示す。xn点の一次微分を求める場合、
xn点を中心に前後同数のサンプリング点を採つ
て図のように正負点対称的な価重を設定して、測
定値に掛算したものを加え合せ、(サンプリング
間隔)×(サンプリング点数−1)で割算する。こ
の場合、前項で述べたΔxに相当するものは図に
Δxで示した幅である。
(E) Example Since the measured output often contains noise, it is necessary to average the noise when performing differential salt calculation. There are various methods of noise averaging, one of which is the weighted average method. In Figure 5, x1, x2...
xn... is the sampling point of the measured value, and the vertical axis indicates the weight of the measured value. Let us now calculate the average value of the measured values at xn points. 2k+ around point xn
The value weighted averaging method multiplies the data of one sampling point by the value weight of the ratio shown in the vertical bar in the figure to find the average, and uses it as the measured value of xn. This method
We will proceed for each point xn, xn+1, xn+d,... An extension of this idea to differential operations has been proposed by Savitzky and Golay. Similarly to FIG. 5, FIG. 6 also shows the sampling points on the horizontal axis, and the weight applied to the measured value on the vertical axis. When finding the first derivative at xn point,
Take the same number of sampling points before and after the xn point, set the positive and negative points as shown in the figure, and add the multiplied values to the measured value, (sampling interval) x (number of sampling points - 1) Divide by. In this case, what corresponds to Δx mentioned in the previous section is the width indicated by Δx in the figure.

こゝに述べる実施例はこのザビツキー、ゴーレ
イの方法を利用している。第7図に実施例の構成
を示す。MAは測定装置、SHはサンプルホール
ド回路で測定装置出力サンプリング、ADはA/
D変換器で、サンプルホールド回路SHによつて
ホールドされている測定値をデイジタルデータに
変換する。Mはメモリで上記デイジタルデータを
記憶せしめられる。CPUは装置全体を制御し、
上述した微分演算、引算の演算を行う演算制御回
路、Dは記録計、プリンタ等の表示装置である。
The embodiment described here utilizes the Zavitsky and Golay method. FIG. 7 shows the configuration of the embodiment. MA is the measurement device, SH is the sample and hold circuit for sampling the measurement device output, and AD is the A/
A D converter converts the measured value held by the sample and hold circuit SH into digital data. M is a memory in which the digital data is stored. The CPU controls the entire device,
The arithmetic control circuit that performs the differential and subtraction operations described above, and D is a display device such as a recorder or printer.

演算制御回路CPUは測定装置を駆動し、サン
プルホールド回路SH、A/D変換器ADを作動
させて、測定出力を一定間隔でサンプリングしメ
モリMに記憶させる。同時にメモリMに記憶させ
た測定データを読出して上述した微分演算を大小
2種のΔxを用いて行い、同一測定点に対応する
二つの微分値の差を算出する演算を実行し、その
結果をメモリMに格納して行く。或る点の微分を
求めるのに、その前後幾つかのサンプリング点の
データが必要なので、上述した演算は測定動作の
進行より若干後れて進行する。CPUは上述演算
の進行に従い、引算結果からゼロクロス点を検索
し、その点に対応する波長値とき時間でデータを
表示装置に出力し、表示装置によつて測定出力及
び各ピークに関するデータを表示する。
The arithmetic control circuit CPU drives the measuring device, operates the sample hold circuit SH and the A/D converter AD, samples the measurement output at regular intervals, and stores it in the memory M. At the same time, the measurement data stored in the memory M is read out, the above-mentioned differential calculation is performed using two types of large and small Δx, the calculation is executed to calculate the difference between the two differential values corresponding to the same measurement point, and the result is Store it in memory M. In order to obtain the differential of a certain point, data of several sampling points before and after the certain point are required, so the above-mentioned calculation proceeds a little later than the progress of the measurement operation. According to the progress of the above calculation, the CPU searches for a zero-crossing point from the subtraction result, outputs the data at the wavelength value and time corresponding to that point to the display device, and displays the measurement output and data regarding each peak on the display device. do.

本発明において微分演算方式は任意である。ま
た上の実施例では測定と演算とは略同時進行の実
時間方式を採つているが、測定データを一旦全部
メモリに入れ、後で読出して上述演算を行うよう
にしてもよい。
In the present invention, the differential calculation method is arbitrary. Further, in the above embodiment, a real-time method is adopted in which measurement and calculation are performed substantially simultaneously, but it is also possible to temporarily store all the measurement data in a memory and read it out later to perform the above-mentioned calculation.

(ヘ) 効果 本発明によるときは、傾斜したベースラインと
が大きなピークの斜面に乗つている小さなピーク
を鋭敏に検出することが可能となる。
(F) Effects According to the present invention, it is possible to sensitively detect a small peak whose sloped baseline is on the slope of a large peak.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の目的を説明するグラフ、第2
図は微分感度の違いを説明するグラフ、第3図は
一定傾斜に対しては微分感度に関係なく同じ微分
値が得られることを説明するグラフ、第4図は斜
面上のピークを示すグラフ、第5図は価重平均法
における価重のかけ方を示すグラフ、第6図は微
分演算のための価重を示すグラフ、第7図は本発
明の一実施例装置のブロツク図である。 MA……測定装置、SH……サンプルホールド
回路、M……メモリ、D……表示装置。
Figure 1 is a graph explaining the purpose of the present invention, Figure 2 is a graph explaining the purpose of the invention.
The figure is a graph explaining the difference in differential sensitivity, Figure 3 is a graph explaining that the same differential value is obtained regardless of the differential sensitivity for a constant slope, Figure 4 is a graph showing the peak on the slope, FIG. 5 is a graph showing how to apply weights in the weighted average method, FIG. 6 is a graph showing weights for differential calculations, and FIG. 7 is a block diagram of an apparatus according to an embodiment of the present invention. MA...Measuring device, SH...Sample and hold circuit, M...Memory, D...Display device.

Claims (1)

【特許請求の範囲】[Claims] 1 測定回路出力をサンプリングして二種類の微
分演算を行う微分演算手段と、得られた二種の微
分演算値の差を求める差演算手段と、その差にお
けるゼロクロス点をピーク位置として検出する制
御回路よりなり、上記二種類の微分演算は微分演
算に用いる独立変数の微分の値が、一方は検出し
ようとするピークの幅より充分小さな値とし、他
方は検出しようとするピークの幅と同程度又はそ
れ以上の値であることを特徴とする測定出力のピ
ーク検出回路。
1 Differential calculation means for sampling the measurement circuit output and performing two types of differential calculations, difference calculation means for calculating the difference between the two types of differential calculation values obtained, and control for detecting the zero-crossing point of the difference as the peak position The above two types of differential calculations are based on a circuit in which the value of the differential of the independent variable used in the differential calculation is sufficiently smaller than the width of the peak to be detected for one, and the same as the width of the peak to be detected for the other. 1. A peak detection circuit for a measured output, characterized in that the peak detection circuit has a value equal to or greater than that.
JP11990883A 1983-06-30 1983-06-30 Measurement output peak detection circuit Granted JPS6011172A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11990883A JPS6011172A (en) 1983-06-30 1983-06-30 Measurement output peak detection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11990883A JPS6011172A (en) 1983-06-30 1983-06-30 Measurement output peak detection circuit

Publications (2)

Publication Number Publication Date
JPS6011172A JPS6011172A (en) 1985-01-21
JPH0475467B2 true JPH0475467B2 (en) 1992-11-30

Family

ID=14773174

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11990883A Granted JPS6011172A (en) 1983-06-30 1983-06-30 Measurement output peak detection circuit

Country Status (1)

Country Link
JP (1) JPS6011172A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62231165A (en) * 1986-03-31 1987-10-09 Shimadzu Corp Detecting device for peak position of measurement output
JP2808449B2 (en) * 1992-11-21 1998-10-08 株式会社堀場製作所 How to find the peak position of the spectrum
US5745369A (en) * 1995-05-30 1998-04-28 Horiba Ltd. Method and apparatus for determining a peak position of a spectrum
JP2010540965A (en) * 2007-12-05 2010-12-24 オールテック・アソシエイツ・インコーポレーテッド Method and apparatus for collecting sample fractions and analyzing samples

Also Published As

Publication number Publication date
JPS6011172A (en) 1985-01-21

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