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JPH0476491B2 - - Google Patents
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JPH0476491B2 - - Google Patents

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Publication number
JPH0476491B2
JPH0476491B2 JP60068281A JP6828185A JPH0476491B2 JP H0476491 B2 JPH0476491 B2 JP H0476491B2 JP 60068281 A JP60068281 A JP 60068281A JP 6828185 A JP6828185 A JP 6828185A JP H0476491 B2 JPH0476491 B2 JP H0476491B2
Authority
JP
Japan
Prior art keywords
tank
gaalas
semiconductor solution
solution
type semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60068281A
Other languages
Japanese (ja)
Other versions
JPS61225821A (en
Inventor
Akio Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP60068281A priority Critical patent/JPS61225821A/en
Publication of JPS61225821A publication Critical patent/JPS61225821A/en
Publication of JPH0476491B2 publication Critical patent/JPH0476491B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • H10P14/2907Materials being Group IIIA-VA materials
    • H10P14/2911Arsenides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/26Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using liquid deposition
    • H10P14/265Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using liquid deposition using solutions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3414Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
    • H10P14/3421Arsenides

Landscapes

  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は液相エピタキシヤル成長方法に係り、
特に複数の半導体溶液槽を用いた液相エピタキシ
ヤル成長により多層のエピタキシヤル結晶層を形
成する方法に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a liquid phase epitaxial growth method,
In particular, the present invention relates to a method for forming multilayer epitaxial crystal layers by liquid phase epitaxial growth using a plurality of semiconductor solution baths.

近時において半導体装置のエピトキシヤル成長
方法として液相エピタキシヤル成長方法が実用化
されているが、特に、ガリウム砒素(GaAs)化
合物半導体結晶を使用する高速度な素子を形成す
るためには、GaAs化合物半導体結晶上に高純度
の半導体材料であつて、かつ高濃度のn型及びp
型の結晶層を多層にエピタキシヤル成長させる必
要があり、これが実現できる液相エピタキシヤル
成長方法が要望されている。
Recently, liquid phase epitaxial growth method has been put into practical use as an epitaxial growth method for semiconductor devices. A high-purity semiconductor material on a semiconductor crystal and a high concentration of n-type and p-type
It is necessary to epitaxially grow multiple crystal layers of the mold, and there is a need for a liquid phase epitaxial growth method that can achieve this.

〔従来の技術〕[Conventional technology]

第2図は、従来の液相エピタキシヤル成長装置
の要部斜視図である。
FIG. 2 is a perspective view of essential parts of a conventional liquid phase epitaxial growth apparatus.

図において、1はカーボンボート台であり、そ
のカーボンボート台1に設けた溝2に、その深さ
よりややや低めに、エピタキシヤル成長用の
GaAs単結晶基板3と、それに隣接してGaAs多
結晶からなるソース結晶板4が連続的に配置され
ている。
In the figure, 1 is a carbon boat stand, and a groove 2 provided in the carbon boat stand 1 has a groove for epitaxial growth slightly lower than the depth of the groove 2.
A GaAs single crystal substrate 3 and a source crystal plate 4 made of GaAs polycrystal are successively arranged adjacent thereto.

また、前記カーボンボート台1上には、複数の
半導体溶液槽6が形成された半導体溶液槽群5が
スライドして移動するように載置されており、各
半導体溶液槽6の内部における側壁面8はGaAs
多結晶により形成され、そのカーボンボート台1
とスライドする底面部は開口していて、該カーボ
ンボート台1上の前記ソース結晶板4に接してい
る。
Further, on the carbon boat stand 1, a semiconductor solution tank group 5 in which a plurality of semiconductor solution tanks 6 are formed is placed so as to slide and move. 8 is GaAs
Formed from polycrystalline carbon boat stand 1
The bottom surface portion that slides is open and in contact with the source crystal plate 4 on the carbon boat stand 1.

そして、これらの各半導体溶液槽6内にはそれ
ぞれ所定のGaAsからなる半導体溶液7が充填さ
れ、これらの装置全体が図示しない石英管の内部
に収容され、外部から約800〜900℃の温度に加熱
することにより、側壁面8と底部からのGaAs多
結晶が高温に加熱されて半導体溶液7内に溶け込
んで常にGaAsの過飽和溶液状態となつており、
更に成長すべき半導体層に対応する成分に応じた
ドーパントが適宜に混入されて、所定のn型、ま
たはp型の半導体溶液から成つている。
Each of these semiconductor solution tanks 6 is filled with a semiconductor solution 7 made of GaAs, and the entire device is housed inside a quartz tube (not shown) and heated to a temperature of about 800 to 900°C from the outside. By heating, the GaAs polycrystals from the side wall surface 8 and the bottom are heated to a high temperature and dissolved into the semiconductor solution 7, so that the GaAs polycrystal is always in a supersaturated solution state of GaAs.
Furthermore, a dopant according to the components corresponding to the semiconductor layer to be grown is appropriately mixed to form a predetermined n-type or p-type semiconductor solution.

第3図は、一例として液相エピタキシヤル成長
によつて多層に形成されたガリウム・アルミニウ
ム・砒素化合物(GaAlAs)半導体結晶層の要部
断面図であり、300〜400μmの厚さのGaAs単結
晶基板3の表面に、液層エピタキシヤル成長によ
り順次、40〜55μmの厚さのn−GaAlAs層12
と、0.8〜2.0μmの厚さの第1のp−GaAlAs層1
3と、0.8〜2.0μmの厚さの第2のp−GaAlAs層
14と、0.8〜2.0μmの厚さの第3のp−GaAlAs
層15とが積層状に形成されている。
FIG. 3 is a cross-sectional view of a main part of a gallium-aluminum-arsenide compound (GaAlAs) semiconductor crystal layer formed in multiple layers by liquid phase epitaxial growth, as an example, and shows a GaAs single crystal layer with a thickness of 300 to 400 μm. An n-GaAlAs layer 12 with a thickness of 40 to 55 μm is sequentially formed on the surface of the substrate 3 by liquid layer epitaxial growth.
and a first p-GaAlAs layer 1 with a thickness of 0.8 to 2.0 μm.
3, a second p-GaAlAs layer 14 with a thickness of 0.8 to 2.0 μm, and a third p-GaAlAs layer 14 with a thickness of 0.8 to 2.0 μm.
The layers 15 are formed in a laminated manner.

第4図a〜第4図cは、従来の液相エピタキシ
ヤル成長方法により第3図のGaAlAs半導体結晶
層の多層構造を形成する工程を順に示す要部断面
図である。
FIGS. 4a to 4c are cross-sectional views of essential parts sequentially showing the steps of forming the multilayer structure of the GaAlAs semiconductor crystal layer of FIG. 3 by a conventional liquid phase epitaxial growth method.

第4図aに示すようにカーボンボート台1の表
面の所定位置に設けた溝2内にはエピタキシヤル
成長用のGaAs単結晶基板3と、それに隣接して
GaAs多結晶からなる複数枚のソース結晶板4
a,4b,4c,4d,4eが連続的に配置され
ている。
As shown in FIG. 4a, a GaAs single crystal substrate 3 for epitaxial growth is placed in a groove 2 provided at a predetermined position on the surface of the carbon boat stand 1, and a GaAs single crystal substrate 3 for epitaxial growth is placed adjacent to the groove 2.
Multiple source crystal plates 4 made of GaAs polycrystal
a, 4b, 4c, 4d, and 4e are consecutively arranged.

そしてその上部には、複数の半導体溶液槽6
a,6b,6c,6d,6eからなる半導体溶液
槽群5を備えたカーボンスライダ10が、図示の
ように前記GaAs単結晶基板3の表面を該カーボ
ンスライダ10の一部で覆い、かつ複数枚のソー
ス結晶板4a,4b,4c,4d,4eに前記各
半導体溶液槽6a,6b,6c,6d,6eが接
して、底部を構成するように載置されている。
At the top, there are multiple semiconductor solution tanks 6.
A carbon slider 10 equipped with a semiconductor solution bath group 5 consisting of a, 6b, 6c, 6d, and 6e covers the surface of the GaAs single crystal substrate 3 with a part of the carbon slider 10 as shown in the figure. The semiconductor solution tanks 6a, 6b, 6c, 6d, and 6e are placed in contact with the source crystal plates 4a, 4b, 4c, 4d, and 4e so as to form a bottom portion.

また、その半導体溶液槽群5の先頭の半導体溶
液槽6a内にはn−GaAlAs溶液7aが充填さ
れ、以下順に隣接する各半導体溶液槽6b,6
c,6d,6e内にはそれぞれ第1のp−
GaAlAs溶液7b、第2のp−GaAlAs溶液7c、
第3のp−GaAlAs溶液7d、第4のp−
GaAlAs溶液7eが充填されている。
Further, the leading semiconductor solution tank 6a of the semiconductor solution tank group 5 is filled with an n-GaAlAs solution 7a, and each adjacent semiconductor solution tank 6b, 6 is filled in the following order.
The first p-
GaAlAs solution 7b, second p-GaAlAs solution 7c,
Third p-GaAlAs solution 7d, fourth p-
It is filled with GaAlAs solution 7e.

そしてこれら半導体溶液槽群5を有するカーボ
ンスライダ10が載置された状態のカーボンボー
ト台1を図示しない石英管内に収容して約900℃
の温度に加熱し、全体がその温度に昇温された状
態で第4図bに示すようにカーボンスライダ10
を矢印の方向に前記半導体溶液槽の一槽分の長さ
だけスライドして移動し、前記GaAs単結晶基板
3の表面に半導体溶液槽6a内のn−GaAlAs溶
液7aを接触させる。
Then, the carbon boat stand 1 on which the carbon slider 10 having the semiconductor solution tank group 5 is mounted is housed in a quartz tube (not shown) and heated to approximately 900°C.
The carbon slider 10 is heated to a temperature of
is slid in the direction of the arrow by the length of one tank of the semiconductor solution tank to bring the n-GaAlAs solution 7a in the semiconductor solution tank 6a into contact with the surface of the GaAs single crystal substrate 3.

その時点で基板温度を所定に下げて成長温度に
設定することにより、該GaAs単結晶基板3の表
面に40〜55μmの厚さのn−GaAlAs層12(第
3図)を形成する。この厚さのn−GaAlAs層1
2を形成するのに約250分間の成長時間を必要と
する。
At that point, the substrate temperature is lowered to a predetermined value and set to the growth temperature, thereby forming an n-GaAlAs layer 12 (FIG. 3) with a thickness of 40 to 55 μm on the surface of the GaAs single crystal substrate 3. n-GaAlAs layer 1 with this thickness
Approximately 250 minutes of growth time is required to form 2.

次に第4図cに示すようにカーボンスライダ1
0を矢印の方向に更に前記半導体溶液槽の一槽分
の長さだけスライドして移動し、該GaAs単結晶
基板3上のn−GaAlAs槽12の表面に半導体溶
液槽6b内の第1のp−GaAlAs溶液7bを接触
させることにより、0.8〜2.0μmの厚さの第1の
p−GaAlAs層13(第3図)を形成する。
Next, as shown in Fig. 4c, the carbon slider 1
0 further in the direction of the arrow by the length of one tank of the semiconductor solution tank, and the first layer in the semiconductor solution tank 6b is placed on the surface of the n-GaAlAs tank 12 on the GaAs single crystal substrate 3. By contacting the p-GaAlAs solution 7b, a first p-GaAlAs layer 13 (FIG. 3) having a thickness of 0.8 to 2.0 μm is formed.

以下、同様にして該第1のp−GaAlAs層13
(第3図)上に、0.8〜2.0μmの厚さの第2、第3
のp−GaAlAs層14,15(第3図)を順に積
層形成することによつて、p−n接合を有する多
層構造のエピタキシヤルGaAlAs半導体結晶層を
得るようにしている。
Hereinafter, in the same manner, the first p-GaAlAs layer 13
(Fig. 3) On top, there are second and third layers with a thickness of 0.8 to 2.0 μm.
By sequentially stacking p-GaAlAs layers 14 and 15 (FIG. 3), an epitaxial GaAlAs semiconductor crystal layer having a multilayer structure having a p-n junction is obtained.

なお、これら各第1〜第3のp−GaAlAs層1
3,14,15を形成するに要するに成長時間は
2〜15分間程度である。
Note that each of these first to third p-GaAlAs layers 1
In short, the growth time for forming Nos. 3, 14, and 15 is about 2 to 15 minutes.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところで上記したような従来の液相エピタキシ
ヤル成長方法では、カーボンボート台1上の溝2
に配置されたGaAs多結晶からなる複数枚のソー
ス結晶板4a,4b,4c,4d,4eは移動し
ないように固定されているため、例えばソース結
晶板4a上半導体溶液層6aが位置するときには
該ソース結晶板4aにn‐GaAlAs溶液7aが接
触しており、次にその半導体溶液槽群5が移動し
て該ソース結晶板4a上に半導体溶液槽6bが位
置したときに該ソース結晶板4a上に僅かに残さ
れたn−GaAlAs溶液7aが、次に接触する第1
のp−GaAlAs溶液7bと混合することになる。
By the way, in the conventional liquid phase epitaxial growth method as described above, the groove 2 on the carbon boat stand 1
The plurality of source crystal plates 4a, 4b, 4c, 4d, and 4e made of GaAs polycrystals arranged in The n-GaAlAs solution 7a is in contact with the source crystal plate 4a, and when the semiconductor solution tank group 5 is moved and the semiconductor solution tank 6b is positioned above the source crystal plate 4a, the source crystal plate 4a is The n-GaAlAs solution 7a slightly left in the
p-GaAlAs solution 7b.

しかも、このn−GaAlAs溶液7aの接触によ
りGaAs単結晶基板3の表面にn−GaAlAs層1
2を成長させる時間は長く、またそのときの加熱
温度が900℃近くもあることからその混合する度
合いが大きくなり、そのために前記第1のp−
GaAlAs溶液7bの純度(p導電性)が劣化して
しまうという問題がある。
Moreover, due to the contact with this n-GaAlAs solution 7a, the n-GaAlAs layer 1 is formed on the surface of the GaAs single crystal substrate 3.
2 is grown for a long time, and the heating temperature at that time is nearly 900°C, the degree of mixing becomes large, and as a result, the first p-
There is a problem in that the purity (p conductivity) of the GaAlAs solution 7b deteriorates.

そしてこのような第1のp−GaAlAs溶液7b
によつてn−GaAlAs層12上に第1のp−
GaAlAs層13が積層された半導体結晶では、p
−n接合が不均一となり、p型層と型層との障壁
電圧が低くなるという欠点があつた。
And such a first p-GaAlAs solution 7b
A first p- layer is formed on the n-GaAlAs layer 12 by
In the semiconductor crystal in which the GaAlAs layer 13 is stacked, p
There was a drawback that the -n junction became non-uniform and the barrier voltage between the p-type layer and the type layer became low.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、上記した問題点を解消した液相エピ
タルシヤル成長方法を提供するもので、その手段
は、n(またはp)型半導体溶液を収容した1槽
のn(p)型半導体溶液槽とp(たまはn)型半導体
溶液を収容した少なくとも2層以上のp(n)型半導
体溶液層とが直列に配列された半導体溶液層群
が、カーボンボート台上に順次配置されたエピタ
キシヤル成長用の結晶基板と各溶液槽内材料に対
応するソース結晶板上を一方向に移動しながら、
該結晶基板上にn(p)型半導体層とp(n)型半導体層
を成長させる液相エピタキシヤル成長方法におい
て、上記半導体駅槽群の1槽目のn(p)型半導体溶
液槽と次槽のp(n)型半導体溶液槽との境界に位置
する半導体溶液槽を空槽状態として、1槽目のエ
ピタキシヤル成長時に当該半導体溶液が成長前に
位置していた位置に前記空槽が位置するように
し、次いで、次槽のp(n)型半導体溶液によるエピ
タキシヤル成長を行う方法によつて達成される。
The present invention provides a liquid phase epitaxial growth method that solves the above-mentioned problems. For epitaxial growth, a semiconductor solution layer group in which at least two or more p(n) type semiconductor solution layers containing an (sometimes n) type semiconductor solution are arranged in series is sequentially arranged on a carbon boat stand. While moving in one direction over the crystal substrate and the source crystal plate corresponding to the material in each solution tank,
In the liquid phase epitaxial growth method for growing an n(p) type semiconductor layer and a p(n) type semiconductor layer on the crystal substrate, the first n(p) type semiconductor solution tank of the semiconductor station tank group and The semiconductor solution tank located at the boundary with the p(n) type semiconductor solution tank of the next tank is set to an empty state, and the empty tank is placed at the position where the semiconductor solution was located before the growth during the epitaxial growth of the first tank. This is achieved by a method in which epitaxial growth is performed using a p(n) type semiconductor solution in the next bath.

〔作用〕[Effect]

本発明では、半導体溶液槽群の1槽目のn(p)型
半導体溶液槽と次槽のp(n)型半導体溶液槽との境
界に位置する半導体溶液槽を空槽状態にすること
によつて、例えば該1槽目のn型半導体溶液槽内
のn型半導体溶液によりエピタキシヤル成長用の
結晶基板上にn型半導体結晶層をエピタキシヤル
成長時に、前記n型半導体溶液が結晶基板上に接
触する前に接触していたソース結晶板の位置に前
記空槽が位置するようになる。
In the present invention, the semiconductor solution tank located at the boundary between the first n(p) type semiconductor solution tank and the next p(n) type semiconductor solution tank in the semiconductor solution tank group is left in an empty state. Therefore, for example, when an n-type semiconductor crystal layer is epitaxially grown on a crystal substrate for epitaxial growth using an n-type semiconductor solution in the first n-type semiconductor solution tank, the n-type semiconductor solution is The empty tank comes to be located at the position of the source crystal plate that was in contact with the source crystal plate before contacting the source crystal plate.

このため、そのn型半導体溶液が結晶基板上に
接触する前に接触していたソース結晶板上に次槽
のp型半導体溶液槽内のp型半導体溶液が長時間
に接触することがなくなり、該ソース結晶板上に
僅かに残されたn型半導体溶液が前記p型半導体
溶液に混入するという問題が防止される。
Therefore, the p-type semiconductor solution in the p-type semiconductor solution tank of the next tank does not come into contact for a long time on the source crystal plate that was in contact with the n-type semiconductor solution before it came into contact with the crystal substrate. This prevents the problem that a small amount of n-type semiconductor solution left on the source crystal plate mixes into the p-type semiconductor solution.

従つて、n型半導体結晶層上にn型半導体溶液
の混入による劣化した導電性の影響のないp型半
導体結晶層をエピタキシヤル成長することが可能
となる。
Therefore, it is possible to epitaxially grow a p-type semiconductor crystal layer on the n-type semiconductor crystal layer without being affected by the deteriorated conductivity caused by the mixing of the n-type semiconductor solution.

〔実施例〕〔Example〕

以下図面を参照して本発明の実施例について詳
細に説明する。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第1図a〜第1図cは本発明に係る液相エピタ
キシヤル成長方法の一実施例を順に説明するため
の要部断面図である。
FIGS. 1a to 1c are sectional views of essential parts for sequentially explaining an embodiment of the liquid phase epitaxial growth method according to the present invention.

先ず第1図aに示すようにカーボンボート台1
上の所定位置に設けた溝2内には、従来例と同様
にエピタキシヤル成長用のGaAs単結晶基板3と
GaAs多結晶からなる複数枚のソース結晶板4
a,4b,4c,4d,4eが連続的に配置され
ている。
First, as shown in Figure 1a, the carbon boat stand 1
In the groove 2 provided at a predetermined position on the top, a GaAs single crystal substrate 3 for epitaxial growth is placed, as in the conventional example.
Multiple source crystal plates 4 made of GaAs polycrystal
a, 4b, 4c, 4d, and 4e are consecutively arranged.

またその上部には、複数の半導体溶液槽6a,
6b,6c,6d,6eからなる半導体溶液槽群
5を備えたカーボンスライダ10が、図示のよう
に前記GaAs単結晶基板3の表面を該カーボンス
ライダ10の一部で覆い、がつ複数枚のソース結
晶板4a,4b,4c,4d,4eに前記各半導
体溶液槽6a,6b,6c,6d,6eが接して
底部の構成するように載置されている。
Further, on the top thereof, there are a plurality of semiconductor solution tanks 6a,
A carbon slider 10 equipped with a semiconductor solution bath group 5 consisting of semiconductor solution baths 6b, 6c, 6d, and 6e covers the surface of the GaAs single crystal substrate 3 with a part of the carbon slider 10 as shown in the figure. The respective semiconductor solution tanks 6a, 6b, 6c, 6d, and 6e are placed in contact with the source crystal plates 4a, 4b, 4c, 4d, and 4e so as to form a bottom portion.

更に、その半導体溶液槽群5の先頭の半導体溶
液槽6a内にはn−GaAlAs溶液21が充填さ
れ、その隣の半導体溶液槽6bは空槽(以下空槽
6bと称する)とされ、それに隣接する各半導体
溶液槽6c,6d,6e内にそれぞれ第1のp−
GaAlAs溶液22、第2のp−CaAlAs溶液23、
第3のp−GaAlAs溶液24が充填されている。
Further, the leading semiconductor solution tank 6a of the semiconductor solution tank group 5 is filled with the n-GaAlAs solution 21, and the semiconductor solution tank 6b next to it is an empty tank (hereinafter referred to as empty tank 6b). The first p-
GaAlAs solution 22, second p-CaAlAs solution 23,
A third p-GaAlAs solution 24 is filled.

そして前記したようにカーボンスライダ10が
載置された状態のカーボンボート台1を石英管内
に収容して約900℃の温度に加熱し、全体がその
温度に昇温された状態で、第1図bに示すように
カーボンスライダ10を矢印の方向に前記半導体
溶液槽の一槽分の長さだけスライドして移動し、
前記CaAs単結晶基板3の表面に半導体溶液槽6
a内のn−GaAlAs溶液21を接触させる。
Then, as described above, the carbon boat stand 1 with the carbon slider 10 mounted thereon was housed in a quartz tube and heated to a temperature of about 900°C. As shown in b, slide the carbon slider 10 in the direction of the arrow by the length of one tank of the semiconductor solution tank,
A semiconductor solution bath 6 is provided on the surface of the CaAs single crystal substrate 3.
Contact the n-GaAlAs solution 21 in a.

その時点で基板温度を所定に下げて成長温度に
設定して、該GaAs単結晶基板3の表面に40〜
50μmの厚さn−GaAlAs層12(第3図)を形
成する。
At that point, the substrate temperature is lowered to a predetermined value and set to the growth temperature, and the surface of the GaAs single crystal substrate 3 is
A 50 μm thick n-GaAlAs layer 12 (FIG. 3) is formed.

一方、このエピタキシヤル成長時には該n−
GaAlAs溶液21がGaAs単結晶基板3上に接触
する前に接触していたソース結晶板4a上に次の
空槽6bが位置しているので、従来の如き次槽の
半導体溶液層6c内の第1のp−GaAlAs溶液2
2が、n−GaAlAs溶液21を僅かに残した前記
ソース結晶板4a上に接触、或いは長時間に接触
することがなくなり、該第1のp−GaAlAs溶液
22にn−GaAlAs溶液21が混入することが防
止される。
On the other hand, during this epitaxial growth, the n-
Since the next empty tank 6b is located on the source crystal plate 4a that the GaAlAs solution 21 was in contact with before it came into contact with the GaAs single crystal substrate 3, the second empty tank 6b is located in the semiconductor solution layer 6c of the next tank as in the conventional case. 1 p-GaAlAs solution 2
2 no longer comes into contact with the source crystal plate 4a on which a small amount of n-GaAlAs solution 21 remains, or comes into contact for a long time, and the n-GaAlAs solution 21 is mixed into the first p-GaAlAs solution 22. This will be prevented.

次に第1図cに示すように前記カーボンスライ
ダ10を矢印の方向に前記半導体溶液槽の二槽分
の長さだけ移動して、該GaAs単結晶基板3上に
形成されたn−GaAlAs層12の表面に半導体溶
液槽6c内の第1のp−GaAlAs溶液22を接触
することにより、n−GaAlAs溶液21の混入の
ない純度の良い0.8〜2.0μmの厚さの第1のp−
GaAlAs層13(第3図)を形成することができ
る。
Next, as shown in FIG. 1c, the carbon slider 10 is moved in the direction of the arrow by the length of two of the semiconductor solution baths to form an n-GaAlAs layer on the GaAs single crystal substrate 3. By bringing the first p-GaAlAs solution 22 in the semiconductor solution tank 6c into contact with the surface of the semiconductor solution tank 6c, the first p-GaAlAs solution 22 with a thickness of 0.8 to 2.0 μm and having good purity and no contamination with the n-GaAlAs solution 21 is brought into contact with the surface of the semiconductor solution tank 6c.
A GaAlAs layer 13 (FIG. 3) can be formed.

以下、同様にして該第1のp−GaAlAs層13
(第3図)上に、0.8〜2.0μmの厚さの第2、第3
のp−GaAlAs層14,15(第3図)を順に積
層形成することによつて、均一なp−n接合を有
し、かつ第1のp−GaAlAs層13側からn−
GaAlAs層12に印加する電圧を高めた多層構造
のGaAlAsエピタキシヤル半導体結晶層を得るこ
とが可能となる。
Hereinafter, in the same manner, the first p-GaAlAs layer 13
(Fig. 3) On top, there are second and third layers with a thickness of 0.8 to 2.0 μm.
By sequentially stacking the p-GaAlAs layers 14 and 15 (FIG. 3), a uniform p-n junction is formed, and the n-
It becomes possible to obtain a GaAlAs epitaxial semiconductor crystal layer with a multilayer structure in which the voltage applied to the GaAlAs layer 12 is increased.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように、本発明に係る
液相エピタキシヤル成長方法によれば、直列に配
列された1槽のn(p)型半導体溶液層と少なくとも
2槽以上のp(n)型半導体溶液槽との間に空槽を設
けたカーボンスライダを用い、一方向に移動させ
てエピタキシヤル成長を行うことにより、p(n)型
半導体溶液槽内のp(n)型半導体溶液にn(p)型半導
体溶液を混入する恐れが防止され、均一なp−n
接合を有する良質な多層構造のGaAlAsエピタキ
シヤル結晶層を得ることが可能となる。
As is clear from the above description, according to the liquid phase epitaxial growth method according to the present invention, one tank of n(p) type semiconductor solution layer and at least two or more p(n) type semiconductor solution layers arranged in series can be used. By using a carbon slider with an empty tank between it and the semiconductor solution tank and moving it in one direction to perform epitaxial growth, n is added to the p(n) type semiconductor solution in the p(n) type semiconductor solution tank. This prevents the possibility of contamination with (p) type semiconductor solution, resulting in uniform p-n
It becomes possible to obtain a high-quality GaAlAs epitaxial crystal layer with a multilayer structure having junctions.

従つて、かかる多層構造のGaAlAsエピタキシ
ヤル結晶層を用いた半導体装置は高性能な機能を
供し得るという実用上、効果大なるものがある。
Therefore, a semiconductor device using such a multilayered GaAlAs epitaxial crystal layer has a great practical effect in that it can provide high performance functions.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図a〜第1図cは本発明に係る液相エピタ
キシヤル成長方法の一実施例を順に説明するため
の要部断面図、第2図は従来の液相のエピタキシ
ヤル成長装置を示す要部斜視図、第3図は液相エ
ピタキシヤル成長により多層に形成された
GaAlAs半導体結晶層を示す要部断面図、第4図
a〜第4図cは従来の液相エピタキシヤル成長方
法により第3図に示すGaAlAs半導体結晶層の多
層構造を形成する工程を順に示す要部断面図、第
1図a〜第1図c及び第3図において、 1はカーボンボート台、2は溝、3はGaAs単
結晶基板、4a〜4eはソース結晶板、5は半導
体溶液槽群、6a〜6eは半導体溶液槽、108
カーボンスライダ、12はn−GaAlAs層、13
は第1のp−GaAlAs層、14は第2のp−
GaAlAs層、15は第3のp−GaAlAs層、21
はn−GaAlAs溶液、22は第1のp−GaAlAs
溶液、23は第2のp−GaAlAs溶液、24は第
3のp−GaAlAs溶液をそれぞれ示す。
Figures 1a to 1c are cross-sectional views of essential parts for sequentially explaining an embodiment of the liquid phase epitaxial growth method according to the present invention, and Figure 2 shows a conventional liquid phase epitaxial growth apparatus. A perspective view of the main part, Figure 3 is a multilayer structure formed by liquid phase epitaxial growth.
4a to 4c, cross-sectional views of main parts showing a GaAlAs semiconductor crystal layer, are sequential steps of forming the multilayer structure of the GaAlAs semiconductor crystal layer shown in FIG. 3 by a conventional liquid phase epitaxial growth method. In the partial sectional views, Figures 1a to 1c and 3, 1 is a carbon boat stand, 2 is a groove, 3 is a GaAs single crystal substrate, 4a to 4e are source crystal plates, and 5 is a group of semiconductor solution baths. , 6a to 6e are semiconductor solution tanks, 10 8
Carbon slider, 12 is n-GaAlAs layer, 13
14 is the first p-GaAlAs layer, and 14 is the second p-GaAlAs layer.
GaAlAs layer, 15 is the third p-GaAlAs layer, 21
is n-GaAlAs solution, 22 is first p-GaAlAs
23 represents the second p-GaAlAs solution, and 24 represents the third p-GaAlAs solution.

Claims (1)

【特許請求の範囲】 1 n(またはp)型半導体溶液21を収容した
1槽のn(p)型半導体溶液槽6aとp(またはn)
型半導体溶液22〜24を収容した少なくとも2
槽以上のp(n)型半導体溶液槽6c〜6eとが直列
に配列された半導体溶液槽群5が、カーボンボー
ド台1上に順次配置されたエピタキシヤル成長用
の結晶基板3と各溶液槽内材料に対応するソース
結晶板4a〜4e上を一方向に移動しながら、該
結晶基板3上にn(p)型半導体層12とp(n)型半導
体層13〜15を成長させる液相エピタキシヤル
成長方法において、 上記半導体溶液槽群5の1槽目のn(p)型半導体
溶液槽6aと次槽のp(n)型半導体溶液槽6cとの
境界に位置する半導体溶液槽6bを空槽状態と
し、1槽目のエピタキシヤル成長時に当該半導体
溶液21が成長前に位置していた位置に前記空槽
6bが位置するようにし、次いで、次槽のp(ま
たはn)型半導体溶液22によるエピタキシヤル
成長を行うことを特徴とする液相エピタキシヤル
成長方法。
[Claims] 1. One n(p) type semiconductor solution tank 6a containing an n(or p) type semiconductor solution 21 and p(or n)
at least two containing type semiconductor solutions 22-24.
A semiconductor solution tank group 5 in which more than one p(n) type semiconductor solution tanks 6c to 6e are arranged in series includes a crystal substrate 3 for epitaxial growth sequentially arranged on a carbon board stand 1 and each solution tank. A liquid phase that grows an n(p) type semiconductor layer 12 and p(n) type semiconductor layers 13 to 15 on the crystal substrate 3 while moving in one direction over the source crystal plates 4a to 4e corresponding to the inner material. In the epitaxial growth method, a semiconductor solution tank 6b located at the boundary between the first n(p) type semiconductor solution tank 6a and the next p(n) type semiconductor solution tank 6c of the semiconductor solution tank group 5 is The empty tank 6b is placed in the position where the semiconductor solution 21 was located before the growth during epitaxial growth in the first tank, and then the p (or n) type semiconductor solution in the next tank is placed in the empty tank state. A liquid phase epitaxial growth method characterized by performing epitaxial growth according to No. 22.
JP60068281A 1985-03-29 1985-03-29 Apparatus for liquid phase epitaxial growth Granted JPS61225821A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60068281A JPS61225821A (en) 1985-03-29 1985-03-29 Apparatus for liquid phase epitaxial growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60068281A JPS61225821A (en) 1985-03-29 1985-03-29 Apparatus for liquid phase epitaxial growth

Publications (2)

Publication Number Publication Date
JPS61225821A JPS61225821A (en) 1986-10-07
JPH0476491B2 true JPH0476491B2 (en) 1992-12-03

Family

ID=13369222

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60068281A Granted JPS61225821A (en) 1985-03-29 1985-03-29 Apparatus for liquid phase epitaxial growth

Country Status (1)

Country Link
JP (1) JPS61225821A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5185288A (en) * 1988-08-26 1993-02-09 Hewlett-Packard Company Epitaxial growth method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940858A (en) * 1972-08-25 1974-04-17
JPS4977573A (en) * 1972-11-27 1974-07-26
JPS5056873A (en) * 1973-09-14 1975-05-17
JPS584833B2 (en) * 1975-11-19 1983-01-27 三菱電機株式会社 Method for manufacturing G↓aA↓s light emitting diode
JPS61185921A (en) * 1985-02-13 1986-08-19 Matsushita Electric Ind Co Ltd Liquid-phase epitaxial growth method

Also Published As

Publication number Publication date
JPS61225821A (en) 1986-10-07

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