JPH0479411B2 - - Google Patents
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- Publication number
- JPH0479411B2 JPH0479411B2 JP59007665A JP766584A JPH0479411B2 JP H0479411 B2 JPH0479411 B2 JP H0479411B2 JP 59007665 A JP59007665 A JP 59007665A JP 766584 A JP766584 A JP 766584A JP H0479411 B2 JPH0479411 B2 JP H0479411B2
- Authority
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- Prior art keywords
- measured
- sample plate
- thermocouple
- thickness
- distance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
【発明の詳細な説明】
本発明は厚さが例えば0.5mm以下の肉薄の試料
板の厚さと直角方向の熱拡散率を求める交流カロ
リメトリによる熱拡散率測定方法及び装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method and apparatus for measuring thermal diffusivity using AC calorimetry for determining the thermal diffusivity in a direction perpendicular to the thickness of a thin sample plate having a thickness of, for example, 0.5 mm or less.
従来、熱拡散率の測定には種々の方法が考案さ
れているが、厚さが0.5mm以下の肉薄の試料板の
厚さと直角方向の熱拡散率を求めることは不可能
であつた。しかし近年、エレクトロニクスの技術
の進歩にともない、薄い電気絶縁物、例えばセラ
ミツク板の上に半導体材料を0.5mm以下の膜厚に
蒸着することが多くなつており、これ等の肉薄板
状材料の熱的性質を知ることが必要になつてき
た。 Conventionally, various methods have been devised to measure thermal diffusivity, but it has been impossible to determine the thermal diffusivity in a direction perpendicular to the thickness of a thin sample plate with a thickness of 0.5 mm or less. However, in recent years, with advances in electronics technology, it has become common for semiconductor materials to be deposited on thin electrical insulators, such as ceramic plates, to a thickness of 0.5 mm or less. It has become necessary to know the nature of
本発明は、かかる要求を満す交流カロリメトリ
による熱拡散率の測定方法及び装置を提供するこ
とをその目的とするもので、第1発明は厚さが一
定の薄い被測定試料板の片面の一部を覆い部材で
覆つた状態で該片面に一定振幅の熱エネルギを周
波数fでくりかえし断続照射し、被測定試料板の
被遮蔽部における前記覆い部材の端部から種々の
距離の点の温度波振幅Tacを測定し、該距離を変
数とする温度波振幅Tacの対数の特性線の勾配値
kを求め、次式
k=√
より前記被測定試料板の厚さと直角方向の熱拡散
率Dを得ることを特徴とし、第2発明は厚さが一
定の薄い被測定試料板の片面の一部を覆う覆い部
材と、該覆い部材の上部から一定振幅の熱エネル
ギを被測定試料板の片面に周波数fで断続照射す
るチヨツパを付設した熱源と、該被測定試料板の
被遮蔽部に固着された熱電対と、該覆い部材の端
部と熱電対固着点との距離の変化を測定するマイ
クロメータと、該熱電対の交流出力を増幅するロ
ツクイン増幅器とから構成されたことを特徴とす
る。 An object of the present invention is to provide a method and apparatus for measuring thermal diffusivity by AC calorimetry that satisfies such requirements. With the part covered with a covering member, heat energy of a constant amplitude is repeatedly and intermittently irradiated on one side at a frequency f, and temperature waves are generated at points at various distances from the end of the covering member in the shielded part of the sample plate to be measured. The amplitude T ac is measured, the slope value k of the characteristic line of the logarithm of the temperature wave amplitude T ac is determined using the distance as a variable, and the thermal diffusivity in the direction perpendicular to the thickness of the sample plate to be measured is calculated from the following formula k=√. The second invention is characterized in that D is obtained, and the second invention includes a cover member that covers a part of one side of a thin sample plate to be measured with a constant thickness, and thermal energy of a constant amplitude is applied from the upper part of the cover member to the sample plate to be measured. A heat source equipped with a chopper that irradiates intermittently at a frequency f on one side, a thermocouple fixed to the shielded part of the sample plate to be measured, and changes in the distance between the end of the covering member and the thermocouple fixing point are measured. The thermocouple is characterized in that it is comprised of a micrometer and a lock-in amplifier that amplifies the AC output of the thermocouple.
以下本発明の実施例を図面につき説明する。第
1図及び第2図は本発明の測定装置の一実施例を
示す。同図において1は厚さが例えば0.1〜0.5mm
程度の薄い被測定試料板で、該試料板1の上部に
は試料板1の片面の一部を覆う覆い板2を試料板
1の面に沿つて移動自在に配置し更に覆い板2の
上部にチヨツパ3を付設した例えばタングステン
ランプのような熱源を配置した。該チヨツパ3は
第2図示のように直径上の中心で回転自在に軸支
され、図示されないモータにより所定の回転数で
回転される半円形板から成る。5は前記覆い板2
と連結されたマイクロメータ、6は覆い板2で熱
源4の熱エネルギの照射から遮蔽される被測定試
料板1の面における、覆い板2の端部から距離L
の点に点溶接した熱電対で、該熱電対6を例えば
フオトトランジスタからなるセンサ7の出力を参
照信号とするロツクイン増幅器8に接続し、該ロ
ツクイン増幅器8により熱電対6の交流出力を増
幅するようにした。以上の、チヨツパ3を付設し
た熱源4、試料板1に点溶接される熱電対6及び
該熱電対6に接続され且つセンサ7の出力を参照
信号とするロツクイン増幅器8は、周知の交流カ
ロリメトリ装置を構成するもので、この他に図示
していないが、試料板1を内部に配置する熱浴が
設けられている。交流カロリメトリは、図示しな
い熱浴(大きな熱容量をもち一定温度に保たれて
いる中空の金属などのブロツク)中に、熱浴に対
して所定の熱抵抗で接続された状態で配置された
被測定試料板1にチヨツパなどで一定周波数、例
えば0.1〜10Hzで且つ照射範囲に亘つて熱エネル
ギが同じのくりかえし断続熱を与えて該試料板1
を交流的に加熱したとき、該試料板1の温度の交
流成分が該試料板1の比熱に逆比例するという原
理により該試料板1の比熱を求める方法であり、
被測定試料板1の厚さは、温度波の波長に対して
著しく薄く、例えば0.3〜0.5mmに選定されてい
る。 Embodiments of the present invention will be described below with reference to the drawings. 1 and 2 show an embodiment of the measuring device of the present invention. In the same figure, 1 has a thickness of 0.1 to 0.5 mm, for example.
A cover plate 2 that covers a part of one side of the sample plate 1 is arranged on the top of the sample plate 1 so as to be movable along the surface of the sample plate 1. A heat source such as a tungsten lamp with a chopper 3 attached thereto was placed. As shown in the second figure, the chopper 3 is comprised of a semicircular plate that is rotatably supported at its diametrical center and rotated at a predetermined number of revolutions by a motor (not shown). 5 is the cover plate 2
6 is a distance L from the end of the cover plate 2 on the surface of the sample plate 1 to be measured that is shielded from the thermal energy irradiation of the heat source 4 by the cover plate 2.
With a thermocouple spot-welded to the point, the thermocouple 6 is connected to a lock-in amplifier 8 that uses the output of a sensor 7 made of, for example, a phototransistor as a reference signal, and the AC output of the thermocouple 6 is amplified by the lock-in amplifier 8. I did it like that. The heat source 4 equipped with the chopper 3, the thermocouple 6 spot-welded to the sample plate 1, and the lock-in amplifier 8 connected to the thermocouple 6 and using the output of the sensor 7 as a reference signal are the well-known AC calorimetry device. Although not shown, there is also a heat bath in which the sample plate 1 is placed. In AC calorimetry, the object to be measured is placed in a heat bath (not shown) (a hollow metal block that has a large heat capacity and is kept at a constant temperature) and is connected to the heat bath with a predetermined thermal resistance. The sample plate 1 is repeatedly subjected to intermittent heat using a chipper or the like at a constant frequency, for example, 0.1 to 10 Hz, and with the same thermal energy over the irradiation range.
A method for determining the specific heat of the sample plate 1 based on the principle that when heated in an alternating current manner, the alternating current component of the temperature of the sample plate 1 is inversely proportional to the specific heat of the sample plate 1,
The thickness of the sample plate 1 to be measured is significantly thinner than the wavelength of the temperature wave, and is selected to be, for example, 0.3 to 0.5 mm.
次に本発明による熱拡散率の測定方法及び装置
の作動について説明する。 Next, the method and apparatus for measuring thermal diffusivity according to the present invention will be explained.
上述の交流カロリメトリの測定原理に基づき、
被測定試料板1の片面の露出部に、チヨツパ3に
より交流化された単位面積当り振幅Qの、照射領
域に亘つて熱エネルギが一様なくりかえし断続熱
を照射する。被測定試料板1の厚さは上述のよう
に温度波の波長に対して著しく薄くして、被測定
試料板1の一面を他の一面における温度波の位相
及び振幅が同じになるようにし、また被測定試料
板1の熱が覆い板2の端部から被測定試料板1の
面方向に伝導するとき熱浴に熱が逃げない程度に
熱抵抗を大とする。 Based on the measurement principle of AC calorimetry mentioned above,
The exposed portion of one side of the sample plate 1 to be measured is irradiated with intermittent heat, which is converted into alternating current by a chopper 3, and the thermal energy is uniformly repeated over the irradiation area with an amplitude Q per unit area. As mentioned above, the thickness of the sample plate 1 to be measured is made significantly thinner than the wavelength of the temperature wave, so that the phase and amplitude of the temperature wave on one side of the sample plate 1 to be measured are the same as on the other side, Further, the thermal resistance is made large enough to prevent the heat from escaping into the heat bath when the heat of the sample plate 1 to be measured is conducted from the end of the cover plate 2 in the surface direction of the sample plate 1 to be measured.
被測定試料板1は無限に長いと仮定したとき、
熱電対6で検出される温度波振幅Tacは、熱伝導
の微分方程式を解くことにより、前記距離Lの関
数として次式で与えられる。 Assuming that the sample plate 1 to be measured is infinitely long,
The temperature wave amplitude T ac detected by the thermocouple 6 is given by the following equation as a function of the distance L by solving a differential equation of heat conduction.
但しf(=ω/2π)はチヨツパによる熱エネル
ギQの交流周波数
cは試料(1)の単位体積当りの比熱
dは試料(1)の厚さ
Dは試料(1)の厚さと直角方向の熱拡散率
τeは試料(1)から熱浴へ熱が逃げるのに要する緩
和時間
前記緩和時間を大きくすると、(1)式は次のよう
になる。 However, f (=ω/2π) is the AC frequency of the thermal energy Q due to the chopper, c is the specific heat per unit volume of sample (1), d is the thickness of sample (1), and D is the frequency perpendicular to the thickness of sample (1). Thermal diffusivity τ e is the relaxation time required for heat to escape from the sample (1) to the heat bath. When the relaxation time is increased, equation (1) becomes as follows.
Tac=Q/2ωcde-kL-i(kL+〓 2) ……(2) k=√ ……(3) kは熱拡散長の逆数である。T ac =Q/2ωcde -kL-i(kL+ 〓 2) ...(2) k=√...(3) k is the reciprocal of the thermal diffusion length.
(2)式から明らかなように距離Lにおける被測定
試料(1)の温度波振幅Tacの絶対値|Tac|は
|Tac|=Q/2ωcd・e-KL ……(4)
であり、この値は熱電対(6)の出力信号をロツクイ
ン増幅器8で増幅することにより測定される。す
なわちロツクイン増幅器8は、センサ7の出力を
参照信号とすることにより熱電対(6)の交流出力を
増幅すると共に直流にして出力、すなわち温度波
振幅として出力するので、この値を測定すること
により温度波振幅|Tac|を求めることができ
る。(4)式を変形すると
log|Tac|=logQ/2ωcd−KL ……(5)
(5)式はLに関する一次式であり、kはLを変数
とする関数log|Tac|の勾配である。 As is clear from equation (2), the absolute value of the temperature wave amplitude T ac of the measured sample (1) at distance L |T ac | is |T ac | =Q/2ωcd・e -KL ……(4) This value is measured by amplifying the output signal of the thermocouple (6) with a lock-in amplifier 8. In other words, the lock-in amplifier 8 uses the output of the sensor 7 as a reference signal to amplify the AC output of the thermocouple (6) and converts it into DC output, that is, outputs it as a temperature wave amplitude, so by measuring this value, The temperature wave amplitude |T ac | can be determined. Transforming equation (4), log | T ac | = logQ/2ωcd−KL ...(5) Equation (5) is a linear equation regarding L, and k is the gradient of the function log | T ac | with L as a variable. It is.
被測定試料板(1)は有限長であると仮定したとき
は、熱電対(6)で検出される温度波振幅Tacは、熱
伝導の微分方程式を解くことにより、前記距離L
の関数として次式で与えられる。 Assuming that the sample plate (1) to be measured has a finite length, the temperature wave amplitude T ac detected by the thermocouple (6) can be determined by solving the differential equation of heat conduction, and the distance L
It is given by the following equation as a function of
Tac=QR/cosh[kL(1+i)]+RSk(1+i)sinh[
kL(1+i)]……(1′)
但し kL≧1
RSk>1
Sは試料(1)の厚さと直角方向の熱伝導率
k=√
kは熱拡散長の逆
但し、fはチヨツパによる熱エネルギの交流周
波数
Dは試料(1)の厚さと直角方向の熱拡散率
前記熱抵抗Rを大きくし、また交流周波数を高
くすると、(1′)式は次のようになる。T ac = QR/cosh[kL(1+i)]+RSk(1+i)sinh[
kL(1+i)]...(1') However, kL≧1 RSk>1 S is the thermal conductivity in the direction perpendicular to the thickness of sample (1) k=√ k is the inverse of the thermal diffusion length However, f is the heat due to the chopper AC frequency of energy D is thermal diffusivity in the direction perpendicular to the thickness of sample (1) When the thermal resistance R is increased and the AC frequency is increased, equation (1') becomes as follows.
Tac√2Q/Sk・e-kL-i(kL+〓 4) ……(2′)
この式から明らかなように距離Lにおける被測
定試料(1)の交流温度Tacの絶対値|Tac|は
|Tac|=√2Q/Sk・e-kL ……(4′)
であり、(4′)式を変形すると、
log|Tac|=log√2Q/Sk−kL ……(5′)
(5′)式はLに関する一次式であり、kはLを
変数とする関数log|Tac|の勾配である。T ac √2Q/Sk・e -kL-i(kL+ 〓 4) ...(2') As is clear from this equation, the absolute value of the AC temperature T ac of the measured sample (1) at the distance L | T ac | is |T ac |=√2Q/Sk・e -kL ……(4′), and by transforming equation (4′), log|T ac |=log√2Q/Sk−kL ……(5 ') Equation (5') is a linear equation regarding L, and k is the gradient of the function log|T ac | with L as a variable.
(5)式と(5′)式とを対比して明らかなように、
被測定試料板(1)に対する仮定は異なるが、いずれ
も、kは前記距離Lを変数とする関数log|Tac|
の勾配であることに変りはない。 As is clear from comparing equations (5) and (5′),
Although the assumptions for the sample plate (1) to be measured are different, in both cases, k is a function log |T ac | with the distance L as a variable.
There is no change in the fact that the slope is .
かくてマイクロメータ(5)により覆い部材(2)を多
数回微動させ、その度毎の温度波振幅Tacをロツ
クイン増幅器(8)の出力から求めてプロツトすると
第3図示のように直線が得られるから、この直線
の勾配からkを求める。このk値を(2)式又は
(2′)式に代入し、熱拡散率Dを得る。第3図示
の特性は、厚さ0.1mmのAl2O3につき交流周波数f
=10Hz、L=0.7mmにして測定したものであり、
これから得たkを(2)式又は(2′)式に代入し、得
られた熱拡散率Dは0.0798cm2/secであつた。覆
い板2の端部から距離Lの位置の温度波振幅を測
定するために、該距離Lを計測し、該距離Lに熱
電対6を取り付けてもよいが、距離Lが変わる度
に熱電対を付け変えなければならないので、手数
を要し、また取り付けるたびに被測定試料板1の
実効熱容量が変化し易いので、測定誤差を生じや
すい。 Thus, when the cover member (2) is slightly moved a number of times using the micrometer (5), and the temperature wave amplitude T ac for each movement is determined from the output of the lock-in amplifier (8) and plotted, a straight line is obtained as shown in Figure 3. Therefore, k is determined from the slope of this straight line. The thermal diffusivity D is obtained by substituting this k value into equation (2) or equation (2'). The characteristics shown in Figure 3 are the AC frequency f for Al 2 O 3 with a thickness of 0.1 mm.
= 10Hz, L = 0.7mm,
By substituting k obtained from this into equation (2) or (2'), the obtained thermal diffusivity D was 0.0798 cm 2 /sec. In order to measure the temperature wave amplitude at a distance L from the end of the cover plate 2, the distance L may be measured and a thermocouple 6 may be attached to the distance L. This requires a lot of work, and since the effective heat capacity of the sample plate 1 to be measured tends to change each time it is attached, measurement errors are likely to occur.
これに対し上述のように、被測定試料板1の被
遮蔽部に熱電対6を固着し、マイクロメータによ
り覆い板2の端部と熱電対6の固着点との距離を
測定するようにしたので、距離Lが変わつても熱
電対を変える必要がなく、取扱が簡単であり、ま
た熱電対を取り付けたことにより、被測定試料板
1の実効熱電容量が変わるにしても、距離Lに関
係なく該実効熱容量は一定であるから、前記(4)、
(4′)式または(5)(5′)式から明らかなように測
定誤差を生じない。 In contrast, as described above, the thermocouple 6 was fixed to the shielded part of the sample plate 1 to be measured, and the distance between the end of the cover plate 2 and the fixed point of the thermocouple 6 was measured using a micrometer. Therefore, even if the distance L changes, there is no need to change the thermocouple, and handling is easy.Also, even if the effective thermocapacitance of the sample plate 1 to be measured changes due to the installation of the thermocouple, it will not be affected by the distance L. Since the effective heat capacity is constant, the above (4),
As is clear from equation (4') or equation (5) (5'), no measurement error occurs.
このように本発明によるときは、厚さが例えば
0.5mm以下の肉薄の試料板の、厚さと直角方向の
熱拡散率を得ることができる効果を有する。 According to the present invention, the thickness may be, for example,
It has the effect of being able to obtain the thermal diffusivity in the direction perpendicular to the thickness of a thin sample plate of 0.5 mm or less.
また、手数を要しないで且つ誤差を少なく熱拡
散率を測定することができる測定装置が得られる
効果を有する。 Moreover, there is an effect that a measuring device can be obtained which can measure thermal diffusivity without requiring any trouble and with less error.
第1図は本発明装置の一実施例の線図、第2図
は熱源及びロツクイン増幅器を除いた第1図は平
面図、第3図は覆い板の移動に対する試料板の温
度波振幅の対数特性図をしめす。
1……被測定試料板、2……覆い部材、3……
チヨツパ、4……熱源、5……マイクロメータ、
6……熱電対、7……センサ、8……ロツクイン
増幅器。
Fig. 1 is a diagram of an embodiment of the device of the present invention, Fig. 2 is a plan view excluding the heat source and lock-in amplifier, and Fig. 3 is the logarithm of the temperature wave amplitude of the sample plate with respect to the movement of the cover plate. The characteristic diagram is shown. 1... Sample plate to be measured, 2... Covering member, 3...
Chiyotupa, 4...Heat source, 5...Micrometer,
6...Thermocouple, 7...Sensor, 8...Lock-in amplifier.
Claims (1)
を覆い部材で覆つた状態で該片面に一定振幅の熱
エネルギを周波数fでくりかえし断続照射し、被
測定試料板の被遮蔽部における前記覆い部材の端
部から種々の距離の点の温度波振幅Tacを測定
し、該距離を変数とする温度波振幅Tacの対数の
特性線の勾配値kを求め、次式 k=√ より前記被測定試料板の厚さと直角方向の熱拡散
率Dを得ることを特徴とする交流カロリメトリに
よる熱拡散率測定方法。 2 厚さが一定の薄い被測定試料板の片面の一部
を覆う覆い部材と、該覆い部材の上部から一定振
幅の熱エネルギを被測定試料板の片面に周波数f
で断続照射するチヨツパを付設した熱源と、該被
測定試料板の被遮蔽部に固着された熱電対と、該
覆い部材の端部と熱電対固着点との距離の変化を
測定するマイクロメータと、該熱電対の交流出力
を増幅するロツクイン増幅器とから構成されたこ
とを特徴とする交流カロリメトリによる熱拡散率
測定装置。[Scope of Claims] 1. One side of a thin sample plate to be measured with a constant thickness is covered with a covering member, and thermal energy of a constant amplitude is repeatedly and intermittently irradiated to the one side at a frequency f, and the sample plate to be measured is Measure the temperature wave amplitude T ac at various distances from the end of the cover member in the shielded part of the plate, and find the slope value k of the characteristic line of the logarithm of the temperature wave amplitude T ac with the distance as a variable. , a method for measuring thermal diffusivity by AC calorimetry, characterized in that the thermal diffusivity D in a direction perpendicular to the thickness of the sample plate to be measured is obtained from the following equation k=√. 2. A cover member that covers a part of one side of a thin sample plate to be measured with a constant thickness, and thermal energy of a constant amplitude is applied from the top of the cover member to one side of the sample plate to be measured at a frequency f.
a heat source equipped with a chopper that irradiates intermittently, a thermocouple fixed to a shielded portion of the sample plate to be measured, and a micrometer that measures changes in the distance between the end of the covering member and the thermocouple fixing point; and a lock-in amplifier for amplifying the AC output of the thermocouple.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP766584A JPS60155950A (en) | 1984-01-19 | 1984-01-19 | Method and apparatus for measuring heat diffusion by intermittent heating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP766584A JPS60155950A (en) | 1984-01-19 | 1984-01-19 | Method and apparatus for measuring heat diffusion by intermittent heating |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60155950A JPS60155950A (en) | 1985-08-16 |
| JPH0479411B2 true JPH0479411B2 (en) | 1992-12-15 |
Family
ID=11672102
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP766584A Granted JPS60155950A (en) | 1984-01-19 | 1984-01-19 | Method and apparatus for measuring heat diffusion by intermittent heating |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60155950A (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0726925B2 (en) * | 1985-08-30 | 1995-03-29 | 真空理工株式会社 | Thermal diffusivity measurement method |
| JPS6250652A (en) * | 1985-08-30 | 1987-03-05 | Res Dev Corp Of Japan | Method and instrument for measuring thermal diffusivity |
| JPS62134547A (en) * | 1985-12-07 | 1987-06-17 | Toshiba Corp | Apparatus for measuring thermal diffusivity |
| JPS6358242A (en) * | 1986-08-29 | 1988-03-14 | Toshiba Corp | Method and instrument for measuring thermal diffusivity |
| JPS63206645A (en) * | 1987-02-24 | 1988-08-25 | Fuji Electric Co Ltd | Evaluation of composite film |
| JPS63241457A (en) * | 1987-03-30 | 1988-10-06 | Kawasaki Steel Corp | Instrument for measuring thermal property of thin film-like material |
| JPH0210145A (en) * | 1988-06-28 | 1990-01-12 | Nec Corp | Measuring instrument for thermal diffusivity |
| JPH0687037B2 (en) * | 1990-07-09 | 1994-11-02 | 浜松ホトニクス株式会社 | Non-contact temperature measuring device |
| JPH0659008A (en) * | 1992-08-06 | 1994-03-04 | Sumitomo Electric Ind Ltd | Physical property measuring device and its measuring method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5912425B2 (en) * | 1974-02-22 | 1984-03-23 | 株式会社井上ジャパックス研究所 | Grinding wheel inspection method |
| JPS5612819A (en) * | 1979-07-06 | 1981-02-07 | Hiroichi Hamaguchi | Overcurrent detecting circuit |
-
1984
- 1984-01-19 JP JP766584A patent/JPS60155950A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60155950A (en) | 1985-08-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |