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JPH049284B2 - - Google Patents
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JPH049284B2 - - Google Patents

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Publication number
JPH049284B2
JPH049284B2 JP56061018A JP6101881A JPH049284B2 JP H049284 B2 JPH049284 B2 JP H049284B2 JP 56061018 A JP56061018 A JP 56061018A JP 6101881 A JP6101881 A JP 6101881A JP H049284 B2 JPH049284 B2 JP H049284B2
Authority
JP
Japan
Prior art keywords
optical fiber
light
sample
objective lens
condensing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56061018A
Other languages
Japanese (ja)
Other versions
JPS57176017A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6101881A priority Critical patent/JPS57176017A/en
Priority to US06/364,911 priority patent/US4500204A/en
Publication of JPS57176017A publication Critical patent/JPS57176017A/en
Publication of JPH049284B2 publication Critical patent/JPH049284B2/ja
Granted legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/26Optical coupling means
    • G02B6/262Optical details of coupling light into, or out of, or between fibre ends, e.g. special fibre end shapes or associated optical elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection
    • G01J2003/064Use of other elements for scan, e.g. mirror, fixed grating
    • G01J2003/065Use of fibre scan for spectral scan

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Microscoopes, Condenser (AREA)

Description

【発明の詳細な説明】 この発明は、投光用と集光用の光フアイバを用
い、光による走査機構を備えた分光顕微鏡装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a spectroscopic microscope apparatus that uses optical fibers for projecting and condensing light and is equipped with a light scanning mechanism.

一般に、微小領域の光学的情報を定量的に計測
する手段として、デンシテイメータ、フライング
スポツトスキヤナーあるいは分光顕微鏡が開発さ
れ実用に供されている。そして、これらのメー
タ、装置、器具等は試料を機械的に走査したり、
集光したレーザ光を鏡によつて走査することによ
り、二次元的な情報を収集する装置であるが、試
料台の機械的な走査精度がそのまま装置の面分解
能となつたり、レーザ走査のために複雑な光学機
構を要しており、測定精度および耐久性の点で問
題を有する欠点があつた。
Generally, a density meter, a flying spot scanner, or a spectroscopic microscope has been developed and put into practical use as a means for quantitatively measuring optical information in a minute area. These meters, devices, instruments, etc. scan the sample mechanically,
This device collects two-dimensional information by scanning the focused laser beam with a mirror, but the mechanical scanning accuracy of the sample stage directly becomes the surface resolution of the device, and the laser scanning This method requires a complicated optical mechanism, which has the drawback of problems in measurement accuracy and durability.

この発明は上記の欠点を解消するためになされ
たもので、観測用の接眼レンズを備え、試料に光
源からの光を対物レンズを介して照射し、試料か
らの反射光を集光して分光器に供給する分光顕微
鏡において、光源からの光を対物レンズにおける
試料の実像面上の一点に導く投光用光フアイバ
と、試料からの反射光を集光し分光器に導く集光
用光フアイバとの端部を一体とした光フアイバ端
部と、さらにこの光フアイバ端部を保持し実像面
上でX、Y方向に走査させる走査機構とを具備さ
せたものである。以下、この発明について説明す
る。
This invention was made in order to eliminate the above-mentioned drawbacks.It is equipped with an observation eyepiece, irradiates the sample with light from a light source through an objective lens, and collects the reflected light from the sample to analyze it into spectroscopy. In a spectroscopic microscope, the light emitting fiber guides the light from the light source to a point on the real image plane of the sample in the objective lens, and the condensing optical fiber collects the reflected light from the sample and guides it to the spectrometer. The optical fiber is provided with an end portion of an optical fiber that is integrated with the end portion of the optical fiber, and a scanning mechanism that holds the end portion of the optical fiber and scans the real image plane in the X and Y directions. This invention will be explained below.

第1図はこの発明の原理を示す説明図である。
この図において、1は投光用フアイバ、1aは出
射端、2は集光用フアイバ、2は入射端、3は実
像面、4は偏向レンズ、5は対物レンズ、6は試
料である。
FIG. 1 is an explanatory diagram showing the principle of this invention.
In this figure, 1 is a light projection fiber, 1a is an output end, 2 is a condensing fiber, 2 is an entrance end, 3 is a real image plane, 4 is a deflection lens, 5 is an objective lens, and 6 is a sample.

光源(図示せず)から投光用光フアイバ1によ
つて実像面3上に導かれ、その出射端1aからの
光は偏向レンズ4を介して対物レンズ5によつて
縮小投影され、試料6の表面上の微小領域に結像
する。この像の直径は投光用光フアイバ1の直径
を対物レンズ5の倍率で除した大きさになる。試
料6の表面上での反射光あるいはフオトルミネセ
ンス光は、対物レンズ5によつて集光され、実像
面3の前方に設置された集光用光フアイバ2の入
射端2aから分光器(図示せず)に導かれる。偏
向レンズ4の焦点は、対物レンズ5の瞳点に設置
され、投光用光フアイバ1から試料6の面への光
路と、試料6の面から集光用光フアイバ2への光
路を一致させる。二次元情報は各光フアイバ1,
2を対物レンズ5の光学的中立線Nを軸として手
動あるいはステツプモータ(図示せず)によりX
軸、Y軸方向に走査することにより収集する。
A light source (not shown) is guided onto a real image plane 3 by a projection optical fiber 1, and the light from its output end 1a is reduced and projected by an objective lens 5 via a deflection lens 4, and is projected onto a sample 6. The image is focused on a minute area on the surface of the The diameter of this image is equal to the diameter of the projection optical fiber 1 divided by the magnification of the objective lens 5. The reflected light or photoluminescence light on the surface of the sample 6 is focused by the objective lens 5, and is passed from the input end 2a of the focusing optical fiber 2 installed in front of the real image plane 3 to the spectroscope (Fig. (not shown). The focal point of the deflection lens 4 is set at the pupil point of the objective lens 5, and the optical path from the projecting optical fiber 1 to the surface of the sample 6 coincides with the optical path from the surface of the specimen 6 to the condensing optical fiber 2. . Two-dimensional information is transmitted through each optical fiber 1,
2 manually or by a step motor (not shown) with the optical neutral line N of the objective lens 5 as the axis.
The data are collected by scanning in the Y-axis and Y-axis directions.

第2図は、この発明の一実施例における光フア
イバの構成を示し、第3図、第4図、第5図に各
光フアイバの端部の詳細を示す。
FIG. 2 shows the configuration of an optical fiber in an embodiment of the present invention, and FIGS. 3, 4, and 5 show details of the ends of each optical fiber.

第2図において、投光用光フアイバ1、集光用
光フアイバ2の素線使用本数は、使用する波長、
分析する領域の面積に応じて選択可能であるが、
本実施例では、コア径80μm、クラツド径125μm
の低損失石英フアイバをそれぞれ投光用に1本、
集光用に6本用いている。これらの石英フアイバ
は、機械的強度を有する7心光フアイバケーブル
7にまとめられ、数m〜数百m離れた分光器8お
よび投光用レーザ9に導かれる。
In FIG. 2, the number of strands used for the light emitting optical fiber 1 and the condensing optical fiber 2 is determined by the wavelength used,
It can be selected depending on the area of the area to be analyzed.
In this example, the core diameter is 80 μm and the cladding diameter is 125 μm.
One low-loss quartz fiber for light emission,
Six lights are used for condensing light. These quartz fibers are assembled into a mechanically strong seven-core optical fiber cable 7, and guided to a spectrometer 8 and a light projecting laser 9, which are several meters to several hundred meters away.

第3図a,bは第2図の7心光フアイバケーブ
ル7の顕微鏡側端面の拡大図および部分断面図で
ある。第3図を第1図の原理図を参照しながら説
明すると、投光用フアイバ1の出射端1aは対物
レンズ5の実像面3に置かれ、励起光が最大限集
束するように考慮されている。集光用光フアイバ
2の入射端2aは実像面3の前方で、投光用光フ
アイバ1の周囲に設置されている。そして、投光
用光フアイバ1と集光用光フアイバ2の端部を一
体として光フアイバ端部が構成されている。集光
用光フアイバ2の本数を増加することにより、集
光効率を向上させることができる。
FIGS. 3a and 3b are an enlarged view and a partial sectional view of the microscope-side end surface of the seven-core optical fiber cable 7 shown in FIG. 2. FIGS. To explain FIG. 3 with reference to the principle diagram of FIG. 1, the output end 1a of the light projection fiber 1 is placed on the real image plane 3 of the objective lens 5, and the excitation light is designed to be focused as much as possible. There is. The input end 2a of the condensing optical fiber 2 is installed around the light projecting optical fiber 1 in front of the real image plane 3. The end portions of the light projecting optical fiber 1 and the condensing optical fiber 2 are integrated to form an optical fiber end portion. By increasing the number of light collecting optical fibers 2, light collecting efficiency can be improved.

第4図は集光用光フアイバ2の分光器8側の端
面を示す。分光器8の入射スリツト8aに沿つて
一列に配置することにより、分光器8との結合効
率を向上させることができる。
FIG. 4 shows the end face of the condensing optical fiber 2 on the spectrometer 8 side. By arranging them in a line along the entrance slit 8a of the spectrometer 8, the coupling efficiency with the spectrometer 8 can be improved.

第5図a,bは投光用光フアイバ1の光源側端
面の拡大図および部分断面図である。投光用光フ
アイバ1の光源側端面にはコネクタ10が接続さ
れており、実験の必要に応じ簡便に光源の種類を
変更できるようになつている。
FIGS. 5a and 5b are an enlarged view and a partial sectional view of the light source side end face of the light projecting optical fiber 1. FIG. A connector 10 is connected to the end face of the light-emitting optical fiber 1 on the light source side, so that the type of light source can be easily changed according to the needs of the experiment.

上記において、集光用光フアイバ2のみを用い
て発光体の面内分布を検出することができる。ま
た、投光用光フアイバ1のみを用いてX軸、Y軸
方向の二次元の光プロープを構成することも可能
である。
In the above, the in-plane distribution of the light emitters can be detected using only the condensing optical fiber 2. Furthermore, it is also possible to construct a two-dimensional optical probe in the X-axis and Y-axis directions using only the light projecting optical fiber 1.

第6図は第2図の光フアイバを用いたこの発明
の分光顕微鏡装置の一実施例を示す構成略図で、
極低温におけるフオトルミネセンスに適用した例
を示す。この図において、第1図と同一符号は同
一構成部分を示し、11は分光顕微鏡、12は
XYステージ、13は落射照明用光源、14は集
光レンズ、15,16はそれぞれ取外し可能の観
察用の半透鏡と照明用の半透鏡、17は接眼レン
ズ、18は特殊環境保持装置で、極低温用の冷却
装置、高温用の加熱装置、真空装置等が使用され
る。
FIG. 6 is a schematic diagram showing an embodiment of the spectroscopic microscope apparatus of the present invention using the optical fiber shown in FIG.
An example of application to photoluminescence at extremely low temperatures is shown. In this figure, the same symbols as in Figure 1 indicate the same components, 11 is a spectroscopic microscope, 12 is
XY stage, 13 is a light source for epi-illumination, 14 is a condensing lens, 15 and 16 are removable semi-transparent mirrors for observation and semi-transparent mirrors for illumination, 17 is an eyepiece, 18 is a special environment holding device, A cooling device for low temperatures, a heating device for high temperatures, a vacuum device, etc. are used.

この実施例において、分光顕微鏡11に投光用
光フアイバ1と集光用光フアイバ2とが組み込ま
れているために観察者は光励起された領域を肉眼
で顕微鏡像中に輝点として観察することができ
る。
In this embodiment, since the light emitting optical fiber 1 and the condensing optical fiber 2 are incorporated into the spectroscopic microscope 11, the observer can observe the optically excited region with the naked eye as a bright spot in the microscope image. I can do it.

そして測定点が確認された後は、分光顕微鏡1
1内の光路から各半透鏡15,16を取り除くこ
とにより光量の損失を除去することができる。ま
た、測定点の走査は、手動または電動のXYステ
ージ12により各光フアイバ1,2を駆動するこ
とにより行われる。
After the measurement point is confirmed, the spectroscopic microscope 1
By removing each of the semi-transparent mirrors 15 and 16 from the optical path within the optical system 1, the loss of light amount can be eliminated. Further, scanning of the measurement point is performed by driving each optical fiber 1, 2 using a manual or electric XY stage 12.

一例として半導体試料の結晶欠陥像を観察する
場合について説明する。投光用光フアイバ1にレ
ーザ光を導入し、投光用光フアイバ1の出射端1
aを分光顕微鏡11のカメラポート上の丁度フイ
ルムが置かれる平面上に置く。この平面上で出射
面1aをステツピングモータ・ステージを用いて
掃引すると、レーザ光は対物レンズ5の倍率の逆
数だけ縮小されて半導体試料の面上を移動する。
そこで、各レーザ・スポツトの位置から反射した
光を分光器8に導入し、光電変換して電気信号に
変換し、この電気信号をデイジタル化して前記各
レーザスポツトの位置に対応する信号として一旦
コンピユータに記録し、適当に規格化した後にデ
イスプレイ上に表示すると、測定した物理量の二
次元トポグラフが作成できる。
As an example, a case will be described in which a crystal defect image of a semiconductor sample is observed. A laser beam is introduced into the light projection optical fiber 1, and the output end 1 of the light projection optical fiber 1 is
A is placed on the camera port of the spectroscopic microscope 11 exactly on the plane where the film is placed. When the exit surface 1a is swept on this plane using a stepping motor stage, the laser beam is reduced by the reciprocal of the magnification of the objective lens 5 and moves on the surface of the semiconductor sample.
Therefore, the light reflected from the position of each laser spot is introduced into a spectroscope 8, photoelectrically converted into an electrical signal, and this electrical signal is digitized and sent to a computer as a signal corresponding to the position of each laser spot. A two-dimensional topography of the measured physical quantity can be created by recording the measured physical quantity on the screen, normalizing it appropriately, and displaying it on a display.

以上説明したようにこの発明は、光源からの光
を対物レンズにおける試料の実像面上の一点に導
く投光用光フアイバと、試料からの反射光を集光
し分光器に導く集光用光フアイバとの端部を一体
とした光フアイバ端部と、さらにこの光フアイバ
端部を保持し実像面上でX、Y方向に走査させる
走査機構とを具備させたので、下記のような優れ
た効果がある。
As explained above, the present invention includes a projection optical fiber that guides light from a light source to a point on the real image plane of a sample in an objective lens, and a condensing optical fiber that collects reflected light from the sample and guides it to a spectrometer. It is equipped with an optical fiber end that is integrated with the fiber, and a scanning mechanism that holds this optical fiber end and scans the real image plane in the X and Y directions. effective.

光学顕微鏡像を接眼レンズで観測しながらレ
ーザー・スポツト位置の確認と焦点合せができ
るので、操作が簡便である。
Operation is simple because the laser spot position can be confirmed and focused while observing the optical microscope image through the eyepiece.

投光、集光に光フアイバを用いているので光
源の交換、着脱が容易であり、かつ光源の種類
も変更も容易である。
Since optical fibers are used for projecting and focusing light, it is easy to replace and attach/detach the light source, and it is also easy to change the type of light source.

投光用光フアイバの出射端またはフアイバ端
部をその可撓性を利用して走査機構によりX、
Y方向に走査し、投光用光フアイバの出射端を
拡大された実像面上で走査できるので、走査の
ための機械的精度をあまり必要とせず、精密な
光軸合せが不必要である。
The output end or fiber end of the light projection optical fiber is scanned by a scanning mechanism using its flexibility.
Since scanning can be performed in the Y direction and the output end of the light projection optical fiber can be scanned on the enlarged real image plane, mechanical precision for scanning is not required much, and precise optical axis alignment is unnecessary.

測定する試料を機械的に駆動する必要がない
ので、低温、高温、真空等の特殊環境保持装置
に保持されている試料に対しても機構的な制限
を受けることなく、使用できる。
Since there is no need to mechanically drive the sample to be measured, it can be used without mechanical limitations even for samples held in special environment holding equipment such as low temperature, high temperature, and vacuum.

また、投光用光フアイバと集光用光フアイバ
とを一体とした光フアイバ端部を走査機構で
X、Y方向に走査させるようにしたので、投光
と集光が同時に行うことができる。
Further, since the end portion of the optical fiber that integrates the light emitting optical fiber and the condensing optical fiber is scanned in the X and Y directions by the scanning mechanism, light emitting and condensing can be performed simultaneously.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の原理を示す説明図、第2図
はこの発明の一実施例における光フアイバの構成
を示す斜視図、第3図a,bは第2図の7心光フ
アイバケーブルの端面の拡大図と部分断面図、第
4図は同じく集光用光フアイバの端面図、第5図
a,bは投光用光フアイバの光源側端面の拡大図
と部分断面図、第6図は第2図の光フアイバを用
いたこの発明の一実施例を示す構成略図である。 図中、1は投光用光フアイバ、1aは出射端、
2は集光用光フアイバ、2aは入射端、3は実像
面、5は対物レンズ、6は試料である。
FIG. 1 is an explanatory diagram showing the principle of the invention, FIG. 2 is a perspective view showing the configuration of an optical fiber in an embodiment of the invention, and FIGS. An enlarged view and a partial sectional view of the end face, FIG. 4 is an end view of the condensing optical fiber, FIGS. 2 is a schematic diagram showing an embodiment of the present invention using the optical fiber of FIG. 2. FIG. In the figure, 1 is an optical fiber for light projection, 1a is an output end,
2 is a condensing optical fiber, 2a is an incident end, 3 is a real image plane, 5 is an objective lens, and 6 is a sample.

Claims (1)

【特許請求の範囲】[Claims] 1 観測用の接眼レンズを備え、試料に光源から
の光を対物レンズを介して照射し、前記試料から
の反射光を集光して分光器に供給する分光顕微鏡
において、前記光源からの光を前記対物レンズに
おける前記試料の実像面上の一点に導く投光用光
フアイバと、前記試料からの反射光を集光し前記
分光器に導く集光用光フアイバとの端部を一体と
した光フアイバ端部と、さらにこの光フアイバ端
部を保持し前記実像面上でX、Y方向に走査させ
る走査機構とを具備させたことを特徴とする光フ
アイバを用いた分光顕微鏡装置。
1 In a spectroscopic microscope equipped with an observation eyepiece, which irradiates a sample with light from a light source through an objective lens, and collects the reflected light from the sample and supplies it to a spectrometer, the light from the light source is Light that integrates the ends of a projecting optical fiber that guides the objective lens to a point on the real image plane of the sample and a condensing optical fiber that collects reflected light from the sample and guides it to the spectrometer. 1. A spectroscopic microscope device using an optical fiber, characterized in that it is equipped with a fiber end and a scanning mechanism that holds the optical fiber end and scans the real image plane in the X and Y directions.
JP6101881A 1981-04-21 1981-04-22 Spectral microscope device using optical fiber Granted JPS57176017A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP6101881A JPS57176017A (en) 1981-04-22 1981-04-22 Spectral microscope device using optical fiber
US06/364,911 US4500204A (en) 1981-04-21 1982-04-02 Scanning-type lithographic and image-pickup device using optical fiber

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6101881A JPS57176017A (en) 1981-04-22 1981-04-22 Spectral microscope device using optical fiber

Publications (2)

Publication Number Publication Date
JPS57176017A JPS57176017A (en) 1982-10-29
JPH049284B2 true JPH049284B2 (en) 1992-02-19

Family

ID=13159155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6101881A Granted JPS57176017A (en) 1981-04-21 1981-04-22 Spectral microscope device using optical fiber

Country Status (1)

Country Link
JP (1) JPS57176017A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0750728Y2 (en) * 1987-01-21 1995-11-15 大塚電子株式会社 microscope
JP2792657B2 (en) * 1988-12-26 1998-09-03 浜松ホトニクス株式会社 Scanning optical microscope
JPH02188711A (en) * 1989-01-18 1990-07-24 Olympus Optical Co Ltd Laser optical device
JP4680337B2 (en) * 1999-09-20 2011-05-11 オリンパス株式会社 Scanning laser microscope
JP2001117007A (en) * 1999-10-21 2001-04-27 Nikon Corp Laser microscope and confocal laser scanning microscope

Also Published As

Publication number Publication date
JPS57176017A (en) 1982-10-29

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