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JPH049370B2 - - Google Patents
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JPH049370B2 - - Google Patents

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Publication number
JPH049370B2
JPH049370B2 JP57050543A JP5054382A JPH049370B2 JP H049370 B2 JPH049370 B2 JP H049370B2 JP 57050543 A JP57050543 A JP 57050543A JP 5054382 A JP5054382 A JP 5054382A JP H049370 B2 JPH049370 B2 JP H049370B2
Authority
JP
Japan
Prior art keywords
plane
wafer
silicon
turntable
melt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57050543A
Other languages
Japanese (ja)
Other versions
JPS58166716A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP57050543A priority Critical patent/JPS58166716A/en
Priority to AU83147/82A priority patent/AU562656B2/en
Priority to US06/373,039 priority patent/US4561486A/en
Priority to EP82302246A priority patent/EP0065373B1/en
Priority to DE8282302246T priority patent/DE3277974D1/en
Publication of JPS58166716A publication Critical patent/JPS58166716A/en
Publication of JPH049370B2 publication Critical patent/JPH049370B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • C30B11/008Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method using centrifugal force to the charge
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/60Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
    • C30B29/605Products containing multiple oriented crystallites, e.g. columnar crystallites
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/546Polycrystalline silicon PV cells

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Photovoltaic Devices (AREA)

Description

【発明の詳細な説明】 《産業上の利用分野》 本発明は太陽電池その他の光電変換素子等に用
いられている多結晶シリコンウエハの製造方法に
関する。
DETAILED DESCRIPTION OF THE INVENTION <<Industrial Application Field>> The present invention relates to a method for manufacturing polycrystalline silicon wafers used in solar cells and other photoelectric conversion elements.

《従来の技術》 従来から多結晶シリコンウエハは各種の方法に
よつて製造されており、最も一般的にはシリコン
母材により一たん所定形状のインゴツトをを鋳造
し、これをスライスすることによつてウエハを得
るようにしているが、これではスライス作業に大
変な時間をかけなければならないだけでなく、イ
ンゴツトの約50%がスライス時のロスとなつてし
まうため、製品がコスト高につき大量生産も不可
能である。
<Prior Art> Polycrystalline silicon wafers have traditionally been manufactured by various methods, most commonly by casting an ingot of a predetermined shape from a silicon base material and slicing it. However, this method not only requires a lot of time for slicing, but also results in about 50% of the ingot being lost during slicing, making the product expensive and requiring mass production. is also impossible.

そこでスライスによらない方法としてリボン法
とキヤステイング法(鋳造法)が既に実施されて
いるが、リボン法は例えば回転ドラムの周面に溶
融シリコンを噴当させ、当該周面にリボン状のウ
エハを形成するものであり、同法によるときは実
際上リボン幅が数mm程度のものしか製造すること
ができず、大形の太陽電池素材等が得られない難
点がある。
Therefore, the ribbon method and casting method (casting method) have already been implemented as methods that do not involve slicing, but in the ribbon method, for example, molten silicon is sprayed onto the peripheral surface of a rotating drum, and a ribbon-shaped wafer is placed on the peripheral surface of the drum. When using this method, it is actually possible to manufacture ribbons with a width of only a few mm, which has the disadvantage that large-sized solar cell materials cannot be obtained.

また上記キヤステイング法と呼ばれているもの
は、シリコン母材を加熱して融液となし、これを
製品ウエハの寸法に応じた鋳型に流し込み、さら
に当該型の可動部分により融液を押圧成型して固
化させるものであるが、同法によるときは、一度
に所定形状のウエハが得られ、量産性の点で望ま
しい結果が期待できるものゝ、上記のように融液
は四方から押えつけられることになる。
In addition, in the above-mentioned casting method, the silicon base material is heated to form a melt, which is poured into a mold according to the dimensions of the product wafer, and then the melt is pressed and molded by the movable parts of the mold. However, when this method is used, wafers of a predetermined shape can be obtained at once, and desirable results can be expected in terms of mass production.As mentioned above, the melt is pressed down from all sides. It turns out.

このため同法では鋳型の上下面と側面が上記融
液の固化に際し、シリコン結晶粒(グレイン)の
成長を抑制してしまうことゝなり、固化製品の前
記各面と接する部分近傍が、非常に細かい結晶粒
となつて大きな結晶粒が得られず、太陽電池用シ
リコンウエハ等にあつて望ましいとされている大
結晶粒生成の要請を満足させることができないた
め、当該ウエハによつて得られた太陽電池の光電
変換効率も2〜3%と極度に悪くなつてしまう欠
陥をもつている。
For this reason, in this method, the upper and lower surfaces and side surfaces of the mold suppress the growth of silicon crystal grains (grains) when the melt solidifies, and the areas near the parts of the solidified product that contact the above-mentioned surfaces are extremely The crystal grains become fine and large crystal grains cannot be obtained, and the requirement for large crystal grain generation, which is considered desirable for silicon wafers for solar cells, etc., cannot be satisfied. The photovoltaic conversion efficiency of solar cells is also extremely poor at 2 to 3%.

そこで本願人は先に、所望雰囲気内にあつて、
ターンテーブル上におけるシリコン母材の融液
を、当該ターンテーブルの回転による遠心力によ
つて拡径方向へ流動させることにより、当該融液
による所望径の融液薄層を形成し、これを固化す
ることにより多結晶シリコンウエハを製造する方
法につき提案した。
Therefore, the applicant first needs to be in the desired atmosphere,
By causing the melt of the silicon base material on the turntable to flow in the direction of diameter expansion due to the centrifugal force generated by the rotation of the turntable, a thin layer of melt with a desired diameter is formed by the melt, and this is solidified. A method for manufacturing polycrystalline silicon wafers was proposed.

しかし上記の如く融液を遠心力により拡径流動
させれば、同液に半径方向の力が作用するから、
得られるウエハの形状は円形板状となる。
However, if the melt is caused to expand in diameter by centrifugal force as described above, a radial force acts on the melt, so
The shape of the obtained wafer is a circular plate.

ところがこれにより製造した太陽電池によつて
太陽電池モジユールを作成しようとするとき、所
要数の太陽電池を所定面積内に敷設することゝな
るから、太陽電池の外形が円形状である場合に
は、太陽電池がモジユールの上記所定面積内に占
める割合、すなわちモジユール装填密度が小さく
なり、このため円形に形成されたウエハを半円
状、四角形状等に切断することにより太陽電池を
作成しているが、これでは作業性が悪く経済的に
も成立し得る方策とならない。
However, when trying to create a solar cell module using solar cells manufactured in this way, the required number of solar cells must be laid within a predetermined area, so if the outer shape of the solar cell is circular, The ratio of the solar cells to the above-mentioned predetermined area of the module, that is, the module loading density, becomes smaller, and for this reason, solar cells are created by cutting a circular wafer into semicircular, square, etc. shapes. However, this method has poor workability and is not economically viable.

そこで本願人は上記の遠心力を利用したウエハ
の製造方法を改善して、モジユール装填密度を大
にすることができる太陽電池の製作に即応可能な
ウエハの製造方法を提供した。
Therefore, the present applicant has improved the above-described wafer manufacturing method using centrifugal force to provide a wafer manufacturing method that can be readily applied to the manufacturing of solar cells that can increase the module loading density.

これによるときは、第1図により示す如き設備
を用意するのであり、同図にあつて坩堝1の外周
側には電気ヒータ等による溶融用熱源2を配し、
坩堝1に投入したシリコン母材を同熱源2によつ
て、当該シリコンの溶融温度1420℃を考慮して加
熱することにより、これを溶融し得るようになつ
ており、当該熱源2としては図示例のように電熱
線であるとか、高周波加熱装置によることがで
き、もちろん適時当該加熱を停止したり、加熱条
件を制御可能にしておくことが望ましい。
In this case, equipment as shown in FIG. 1 is prepared, in which a melting heat source 2 such as an electric heater is placed on the outer periphery of the crucible 1.
The silicon base material placed in the crucible 1 can be melted by heating it with the same heat source 2, taking into account the melting temperature of the silicon of 1420°C. It is possible to use a heating wire or a high-frequency heating device, as shown in FIG.

また上記シリコン母材としては金属級シリコ
ン、半導体級高純度シリコンなどを用いるように
し、また坩堝1の素材としてはシリコンとの反応
性が少ない石英、グラフアイト等を用い、図示例
では坩堝1の回転中心3を転動軸として、これを
回転させることにより、その開口からシリコン母
材の融液を放出し得るようにしてあると共に、坩
堝1の直下にはこれまた石英、グラフアイト等に
より形成した漏斗4を配して、同漏斗4をも溶融
用熱源2による加熱条件下に配し、さらにその直
下に配したターンテーブル機構5も、同熱源2に
よつて加熱可能なるよう比較的近傍に配置されて
いる。
Further, as the silicon base material, metal-grade silicon, semiconductor-grade high-purity silicon, etc. are used, and as the material for the crucible 1, quartz, graphite, etc., which have little reactivity with silicon, are used. By rotating the center of rotation 3 as a rolling axis, the melt of the silicon base material can be discharged from its opening. The funnel 4 is also placed under heating conditions by the heat source 2 for melting, and the turntable mechanism 5 placed directly below it is also placed relatively nearby so that it can be heated by the heat source 2. It is located in

そして上記ターンテーブル機構5は、その回転
軸6に固設した回収受皿7にウエハ皿8を載置
し、同皿8の上面にウエハ形成平面9を形成する
ようにしたものである。
The turntable mechanism 5 has a wafer tray 8 placed on a recovery tray 7 fixedly attached to the rotating shaft 6, and a wafer forming plane 9 is formed on the upper surface of the tray 8.

そして上記設備を用いて、多結晶シリコンウエ
ハを製造するには、坩堝1にシリコン母材を投入
して、これを溶融用熱源2により加熱融解し、当
該融液を坩堝1の転動によつて漏斗4へ放流し、
こゝで一たん漏斗4に受承されて、さらにその流
出口4′から、図中点線で示すように当該融液を
ウエハ形成平面9の略中心部に滴下する。
In order to manufacture polycrystalline silicon wafers using the above equipment, a silicon base material is put into the crucible 1, heated and melted by the melting heat source 2, and the melt is transferred by the rolling movement of the crucible 1. Pour into funnel 4,
Once received by the funnel 4, the melt is dropped from the outlet 4' onto the approximate center of the wafer forming plane 9, as shown by the dotted line in the figure.

そしてこの際ターンテーブル機構5は予め回転
させておくのがよいが、同時回転でも、滴下完了
後融液が固化しないうちに回転を開始させてもよ
く、当該回転による遠心力によつて融液は拡径方
向へ流動する。
At this time, it is preferable to rotate the turntable mechanism 5 in advance, but the rotation may be started at the same time or before the melt solidifies after the dropping is completed, and the centrifugal force caused by the rotation causes the melt to flows in the direction of diameter expansion.

ここでウエハ皿8としては、各種寸法の円形、
四角形等所望形状のウエハ形成平面9をもつたも
のが用意され、これを任意選択して用いるが、上
記の融液供給量が充分であれば、拡径流動の融液
はウエハ形成平面9の全面にわたり、その外周縁
まで拡径され、余剰供給の融液は当該外周縁から
遠心力により放出され、この結果ウエハ形成平面
9の形状に見合つた融液薄層14が形成され、こ
れを自然放冷か適宜の冷却手段によつて固化し、
製品たる多結晶シリコンウエハを得るのである。
Here, as the wafer plate 8, circular plates of various sizes,
A wafer forming plane 9 having a desired shape such as a rectangular shape is prepared and used as desired. However, if the above-mentioned melt supply amount is sufficient, the diameter-expanding flow of melt will spread over the wafer forming plane 9. The diameter is expanded over the entire surface to the outer periphery, and the excess supply of melt is discharged from the outer periphery by centrifugal force. As a result, a thin layer 14 of melt corresponding to the shape of the wafer forming plane 9 is formed, and this is naturally spread. Solidify by cooling or by appropriate cooling means,
The product, polycrystalline silicon wafer, is obtained.

しかし上記の如き製造方法によるときは、ター
ンテーブル機構5の回収受皿7上に、別途用意し
たウエハ皿8を載置する構成であるから、従つて
ウエハ皿の温度制御が回収受皿7の配在により難
事となり、また、ウエハ皿8は載置されているだ
けであるからターンテーブル機構5の回転中心か
ら偏心していると、ターンテーブル機構5の回転
数が大となつた際、ウエハ皿8が変動し、場合に
よつては外側へ向け飛んでしまうことがあり、ま
た当該ウエハ皿8は所望の各種ウエハを製造する
ため交換載置すべきものであるため、ウエハ皿8
を回収受皿7に固定してしまうことは望ましくな
く、また固定しようとする場合はターンテーブル
機構5が構造上複雑化してしまうといつた欠陥が
あつた。
However, when using the above manufacturing method, the separately prepared wafer tray 8 is placed on the collection tray 7 of the turntable mechanism 5, so the temperature control of the wafer tray is dependent on the location of the collection tray 7. In addition, since the wafer plate 8 is only placed on the table, if it is eccentric from the rotation center of the turntable mechanism 5, when the rotation speed of the turntable mechanism 5 increases, the wafer plate 8 may The wafer tray 8 may fluctuate and may fly outward in some cases, and the wafer tray 8 must be replaced and placed in order to manufacture various desired wafers.
It is undesirable to fix the turntable mechanism 5 to the collection tray 7, and if it were to be fixed, the turntable mechanism 5 would become structurally complicated.

さらにまた上記方法によるときは、ターンテー
ブル5′の回転数、シリコン融液の供給量、得よ
うとするウエハの厚さ等の各種条件その他の機械
的要素によつては、ウエハ形成平面9から放出さ
れた融液が回収受皿7に飛散せず、ウエハ皿8の
外側面8′に流下しまうことがあり、このような
場合には第2図のように得られた製品が、平板部
Aのみでなく、これと一体に固化された垂下縁部
Bをもつ皿状のものとなつてしまい、かゝる製品
にあつては上記垂下縁部Bを削り落さねばならな
くなる。
Furthermore, when using the above method, depending on various conditions such as the rotation speed of the turntable 5', the amount of silicon melt supplied, the thickness of the wafer to be obtained, and other mechanical factors, the distance from the wafer forming plane 9 may vary. The released melt may not be scattered to the collection tray 7 and may flow down to the outer surface 8' of the wafer tray 8. In such a case, the obtained product will be transferred to the flat plate part A as shown in FIG. Not only that, but it also becomes a dish-shaped product with a hanging edge B that is solidified integrally with the product, and in the case of such a product, the hanging edge B must be scraped off.

《本発明が解決しようとする課題》 本発明は上記の難点に鑑み検討されたもので、
特に、ターンテーブルに離型剤を施したウエハ形
成平面を、円形や半円形等の所望形状となるよう
形成し、その外周部には上記離型剤よりもシリコ
ンに対する大きな濡れ性をもつた窒化ボロンによ
る余剰シリコン放出平面を形成するだけでなく、
上記ウエハ形成平面の高さを、余剰シリコン放出
平面の高さと同等か、低位となるよう形成してや
ることで、当該ターンテーブルの形状如何は問う
ことなしに、円形、四角形等所望形状の多結晶シ
リコンウエハを、窒化ボロンと離型剤の塗布分布
によつて、自由に形成できるようになし、もちろ
んターンテーブルは何回でも使用可能となし、し
かも、その外周縁のはみ出しや垂れ落ちのない、
きれいな仕上りを保証すると共に、当該製品をタ
ーンテーブルから容易にして迅速に剥離し得るよ
うにするのが、その主目的である。
<<Problems to be Solved by the Present Invention>> The present invention has been studied in view of the above-mentioned difficulties.
In particular, the wafer forming plane on which a mold release agent has been applied to the turntable is formed into a desired shape such as a circle or semicircle, and the outer periphery is coated with nitride, which has greater wettability to silicon than the mold release agent. In addition to forming a surplus silicon release plane due to boron,
By forming the height of the wafer forming plane to be equal to or lower than the height of the excess silicon release plane, polycrystalline silicon can be formed into a desired shape such as circular or square, regardless of the shape of the turntable. The wafer can be formed freely by adjusting the application distribution of boron nitride and the mold release agent, and of course the turntable can be used any number of times, and there is no protrusion or dripping of the outer periphery.
Its main purpose is to ensure a clean finish and to allow easy and rapid peeling of the product from the turntable.

《実施例》 本発明を図面によつて、以下詳記すれば、先
ず、前記の設備例において、相違させるべき点
は、ターンテーブル機構にある。
<<Example>> The present invention will be described in detail below with reference to the drawings. First, the difference between the above-mentioned equipment examples lies in the turntable mechanism.

すなわち第3図に示す如く、そのターンテーブ
ル機構10は、その回転軸11にターンテーブル
12を固設したもので、同テーブル12には塗布
用平面13が形成されており、同平面13の外周
部に窒化ボロンを塗布することによつて余剰シリ
コン放出平面14を形成し、同平面の内側端縁1
4′によつて、上記平面13にウエハ形成平面1
5を、同機構10の回転中心と同軸に形成するの
であり、本発明では前記の如きウエハ皿8を用い
ないのである。
That is, as shown in FIG. 3, the turntable mechanism 10 has a turntable 12 fixedly attached to its rotating shaft 11. The table 12 has a coating flat surface 13 formed thereon, and the outer periphery of the flat surface 13. An excess silicon release plane 14 is formed by applying boron nitride to the inner edge 1 of the plane.
4', a wafer forming plane 1 is formed on the plane 13.
5 is formed coaxially with the rotation center of the mechanism 10, and the wafer plate 8 as described above is not used in the present invention.

こゝでウエハ形成平面15の形態は、得うとす
るウエハの形状に対して、円形、四角形その他の
所要外形となるよう前記の内側端縁14′により
決定される凹所を形成し、さらに、第3図、第4
図の如く、上記ウエハ形成平面15が、上記凹所
における塗布用平面13自体をそのまゝ用いるの
ではなく、同平面13に窒化シリコンや炭化硅素
(SiC)等の離型剤16を塗布するのである。こ
の際、離型剤16には前記の窒化ボロンよりも、
シリコンに対する濡れ性が大きいものを選定する
ようにして、同剤16の表面を、上記ウエハ形成
平面15として活用するのであつて、この際ウエ
ハ形成平面15と余剰シリコン放出平面14とは
面一の高さとするかウエハ形成平面15を余剰シ
リコン放出平面14よりも低シリコとするのであ
り、また図示の実施例ではターンテーブル12
が、また図示の実施例ではターンテーブル12
が、前記塗布用平面13を形成するための底板部
17だけではなく、その外周端から起立させた起
立周縁部18を具備し、前記窒化ボロンの塗布に
際しては、底板部17だけでなく起立周縁部18
の内面にまで、これを施すようにするのがよい。
Here, the shape of the wafer forming plane 15 forms a recess determined by the inner edge 14' so as to have a circular, square or other desired external shape for the shape of the wafer to be obtained, and further, Figures 3 and 4
As shown in the figure, the wafer forming plane 15 does not use the coating plane 13 itself in the recess as it is, but applies a mold release agent 16 such as silicon nitride or silicon carbide (SiC) to the same plane 13. It is. At this time, the mold release agent 16 contains more than the aforementioned boron nitride.
The surface of the agent 16 is used as the wafer forming plane 15 by selecting a material with high wettability to silicon, and in this case, the wafer forming plane 15 and the excess silicon release plane 14 are flush with each other. The height of the wafer forming plane 15 is lower than that of the excess silicon emitting plane 14, and in the illustrated embodiment, the turntable 12
However, in the illustrated embodiment, the turntable 12
However, it includes not only the bottom plate part 17 for forming the coating plane 13 but also an upright peripheral edge part 18 that stands up from the outer peripheral edge of the bottom plate part 17. Part 18
It is best to apply this to the inside of the body.

そこで本発明を実施するには第1図につき示し
た設備例のようにして、シリコン母材の融液を上
記ウエハ形成平面15の中心部に供給するのであ
るが、この際上記設備例は空気中ではなく、適宜
の容器内に装置し、これに不活性気体を封入する
のが望ましい。
Therefore, in order to carry out the present invention, the melt of the silicon base material is supplied to the center of the wafer forming plane 15 using the equipment shown in FIG. It is preferable that the device be placed inside a suitable container and filled with an inert gas.

かくしてターンテーブル機構5の回転により、
上記供給融液が離型剤16により形成したウエハ
形成平面15の全面に流動拡径し、さらに拡径し
ようとすれば、当該融液は余剰シリコン放出平面
14へ流入するが、当該平面14は窒化ボロンに
より形成されており、あらゆる物質と濡れ性がな
く、かつ高温度でも安定しているため、上記放出
融液は前記遠心力により飛散されてしまい、同上
平面14上にて固化されるので、これを回収して
再使用することができ、かくて、所要形状に予め
形成されたウエハ形成平面15に施された窒化ボ
ロンよりも、シリコンに対する濡れ性が大きな離
型剤16上には、供給融液により全面にわたる融
液薄層19が形成され、これを自然放冷、強性冷
却等により冷却することで固化し製品を得る。
Thus, by the rotation of the turntable mechanism 5,
When the supplied melt flows over the entire surface of the wafer forming plane 15 formed by the mold release agent 16 and attempts to expand the diameter further, the melt flows into the excess silicon release plane 14, but the plane 14 Since it is made of boron nitride and has no wettability with any substance and is stable even at high temperatures, the discharged melt is scattered by the centrifugal force and solidified on the flat surface 14. , can be recovered and reused, and thus, on the mold release agent 16, which has greater wettability to silicon than the boron nitride applied to the wafer forming plane 15, which has been preformed into the desired shape, A thin melt layer 19 is formed over the entire surface by the supplied melt, and this is cooled by natural cooling, strong cooling, etc. to solidify and obtain a product.

ここまで、前記の如く離型剤16の表面が、余
剰シリコン放出平面14と同高位であればウエハ
形成平面15から融液部分が、前記第2図の如く
垂れ下る如きことなく、さらに、当該離型剤16
の表面が余剰シリコン放出平面14より低位にあ
る場合には、同上融液は、内側端縁14′によつ
てそれ以上の拡径が阻止されると共に、同放出平
面14よりも高位に隆出した融液部分は、さらに
拡径しようとしても前記実施例の場合と同じく、
窒化ボロンによる余剰シリコン放出平面14の配
在により放出飛散され、結局同平面14の内側端
縁14′により規制された融液薄層19が形成さ
れ、これを冷却固化して製品とすることができ
る。
Up to this point, if the surface of the mold release agent 16 is at the same level as the excess silicon release plane 14 as described above, the melt portion will not hang down from the wafer forming plane 15 as shown in FIG. Mold release agent 16
When the surface of the molten liquid is located at a lower level than the surplus silicon release plane 14, the inner edge 14' prevents the melt from further expanding its diameter, and the melt protrudes to a higher level than the excess silicon release plane 14. Even if an attempt is made to further expand the diameter of the melted part, as in the case of the previous example,
Excess silicon is emitted and scattered due to the arrangement of the boron nitride discharge plane 14, and a thin melt layer 19 regulated by the inner edge 14' of the plane 14 is eventually formed, which can be cooled and solidified to form a product. can.

こゝで具体例を示せば、内径180mm、深さ20mm
の石英皿によりターンテーブル5′を形成し、そ
の中心に、窒化シリコンの塗布中心が一致するよ
うにしてウエハ形成平面15となし、残りの部分
には窒化ボロンをスプレーもしくはペースト状に
て塗り、ターンテーブル機構を100〜500r.p.m.に
て回転させると共に800〜1300℃に温度制御し、
溶融シリコンを流下させ、ウエハ形成平面15と
同形の50mm×50mmの角形ウエハ、直径100mmの円
板ウエハを製造した。
Here is a specific example: inner diameter 180mm, depth 20mm
A turntable 5' is formed using a quartz plate, and the center of the turntable 5' is formed by aligning the center of silicon nitride application to form a wafer forming plane 15, and boron nitride is applied to the remaining part by spraying or paste. The turntable mechanism is rotated at 100 to 500 rpm and the temperature is controlled to 800 to 1300℃.
Molten silicon was allowed to flow down to produce a 50 mm x 50 mm rectangular wafer having the same shape as the wafer forming plane 15 and a circular wafer having a diameter of 100 mm.

《発明の効果》 本発明は上記の実施例により具現されるもので
あらるから、ターンテーブル機構にウエハ皿を置
く必用がなくなり、ウエハ皿の不本意な変動によ
る支障がなく、窒化ボロンと、これよりもシリコ
ンに対する濡れ性の大きな離型剤との塗布分布を
変えてやるだけで、同一のターンテーブルである
基板を何回でも使用してどのような形状のウエハ
形成平面でも簡易に形成できるから、これより円
板状だけでなく、多角形その他任意形状のウエハ
を労せずして製造できることゝなり、特に太陽電
池モジユールを作成する際、そのモジユール装填
密度を高くし得る太陽電池が、二次加工などの手
間をかけることなく簡易に提供し得ると共に、円
形ウエハについても各種寸法のものを、ターンテ
ーブルの回転数などを厳密に制御することなく製
造でき、しかも、前記離型剤の表面と窒化ボロン
の表面が面一か、窒化ボロンの表面を高くしたの
で、得られた多結晶シリコンウエハの外周縁も、
きれいに仕上りさらに、離型剤上に当該製品が得
られるから、これを剥離し易くなり、また、ウエ
ハ皿を使用しないことによつて、ウエハ形成平面
を適度に加温することが容易となり、また窒化ボ
ロンの塗布により遠心力により飛散されたシリコ
ン融液を回収することも可能となる。
<<Effects of the Invention>> Since the present invention is realized by the above-described embodiment, there is no need to place a wafer plate on the turntable mechanism, there is no problem caused by involuntary movement of the wafer plate, and boron nitride, By simply changing the application distribution of a mold release agent that has higher wettability to silicon than this, it is possible to easily form any shape of wafer formation plane by using the same turntable as many times as the substrate. Therefore, it is possible to manufacture not only disc-shaped wafers but also polygonal and other arbitrary-shaped wafers without much effort.In particular, when creating solar cell modules, solar cells that can increase the module loading density are two-dimensional. It is possible to easily provide circular wafers without the hassle of subsequent processing, and also to manufacture circular wafers of various sizes without strictly controlling the rotation speed of the turntable. Either the surface of the boron nitride is flush with the surface of the boron nitride, or the surface of the boron nitride is raised, so the outer periphery of the resulting polycrystalline silicon wafer is also
In addition, since the product is obtained on a mold release agent, it is easy to peel it off, and by not using a wafer plate, it is easy to heat the wafer forming surface appropriately. By applying boron nitride, it is also possible to recover the silicon melt scattered by centrifugal force.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本願人が先に提案した多結晶シリコン
ウエハの製造方法を実施するために用い得る設備
の一部を切欠した正面説明図、第2図は同設備の
ターンテーブル機構を示した一部切欠の正面図、
第3図は本発明に係る方法の実施に用いるターン
テーブル機構の一部切欠正面図、第4図は同平面
説明図である。 10……ターンテーブル機構、11……回転
軸、12……ターンテーブル、13……塗布用平
面、14……余剰シリコン放出平面、14′……
内側端縁、15……ウエハ形成平面、16……離
型剤、19……融液薄層。
Figure 1 is a partially cutaway front explanatory view of equipment that can be used to carry out the polycrystalline silicon wafer manufacturing method previously proposed by the applicant, and Figure 2 is a diagram showing the turntable mechanism of the equipment. Front view of partial cutout,
FIG. 3 is a partially cutaway front view of the turntable mechanism used to carry out the method according to the present invention, and FIG. 4 is an explanatory plan view of the turntable mechanism. DESCRIPTION OF SYMBOLS 10... Turntable mechanism, 11... Rotating shaft, 12... Turntable, 13... Coating plane, 14... Surplus silicon release plane, 14'...
Inner edge, 15... Wafer forming plane, 16... Mold release agent, 19... Melt thin layer.

Claims (1)

【特許請求の範囲】 1 ターンテーブル機構には、その上部にターン
テーブルを設け、当該ターンテーブルの塗布用平
面における外周部に窒化ボロンを塗布して余剰シ
リコン放出平面を形成することにより、同ターン
テーブルの中心部に所要外形の凹所を形成すると
共に、当該凹所に上記の窒化ボロンよりもシリコ
ンに対する濡れ性が大きな離型剤を施すことでウ
エハ形成平面を、同上余剰シリコン放出平面に連
続させて前記ターンテーブル機構の回転中心と同
軸に形成すると共に、当該ウエハ形成平面と余剰
シリコン放出平面とを面一または、同上ウエハ形
成平面を余剰シリコン放出平面よりも低位に形成
し、当該ウエハ形成平面には、所望雰囲気におい
てシリコン母材の融液を供給し、上記ターンテー
ブル機構の回転による遠心力によつて、当該供給
融液を拡径方向へ流動させることにより、過剰供
給の融液をウエハ形成平面の外周端から前記余剰
シリコン放出平面へ放出させることによつて、供
給溶液による上記ウエハ形成平面の全面にわたる
溶液薄層を形成し、これを冷却固化して得たもの
を、前記離型剤によるウエハ形成平面より剥離す
るようにしたことを特徴とする多結晶シリコンウ
エハの製造方法。 2 ターンテーブルが低板部と、その外周端から
起立する起立周縁部とにより形成されている特許
請求の範囲第1項記載の多結晶シリコンウエハの
製造方法。
[Claims] 1. A turntable mechanism is provided with a turntable on its upper part, and boron nitride is applied to the outer periphery of the application plane of the turntable to form an excess silicon release plane. A recess with the desired external shape is formed in the center of the table, and a release agent with greater wettability for silicon than the boron nitride described above is applied to the recess, thereby making the wafer forming plane continuous with the surplus silicon release plane. The wafer formation plane and the surplus silicon release plane are flush with each other, or the wafer formation plane is formed at a lower level than the surplus silicon release plane, and the wafer formation plane is formed coaxially with the rotation center of the turntable mechanism. A melt of the silicon base material is supplied to the flat surface in a desired atmosphere, and the supplied melt is caused to flow in the direction of diameter expansion by the centrifugal force generated by the rotation of the turntable mechanism, thereby removing excess melt. By discharging the surplus silicon from the outer peripheral edge of the wafer forming plane to the surplus silicon releasing plane, a thin solution layer is formed over the entire surface of the wafer forming plane by the supplied solution, and the obtained solution is cooled and solidified. A method for producing a polycrystalline silicon wafer, characterized in that the wafer is peeled off from a plane on which the wafer is formed using a molding agent. 2. The method for manufacturing a polycrystalline silicon wafer according to claim 1, wherein the turntable is formed by a lower plate portion and an upright peripheral edge portion that stands up from the outer peripheral end of the turntable.
JP57050543A 1981-04-30 1982-03-29 Manufacture of polycrystalline silicon wafer Granted JPS58166716A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP57050543A JPS58166716A (en) 1982-03-29 1982-03-29 Manufacture of polycrystalline silicon wafer
AU83147/82A AU562656B2 (en) 1981-04-30 1982-04-29 Fabricating polycrystalline silicon wafers
US06/373,039 US4561486A (en) 1981-04-30 1982-04-29 Method for fabricating polycrystalline silicon wafer
EP82302246A EP0065373B1 (en) 1981-04-30 1982-04-30 Method fabricating a polycrystalline silicon wafer
DE8282302246T DE3277974D1 (en) 1981-04-30 1982-04-30 Method fabricating a polycrystalline silicon wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57050543A JPS58166716A (en) 1982-03-29 1982-03-29 Manufacture of polycrystalline silicon wafer

Publications (2)

Publication Number Publication Date
JPS58166716A JPS58166716A (en) 1983-10-01
JPH049370B2 true JPH049370B2 (en) 1992-02-20

Family

ID=12861923

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57050543A Granted JPS58166716A (en) 1981-04-30 1982-03-29 Manufacture of polycrystalline silicon wafer

Country Status (1)

Country Link
JP (1) JPS58166716A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5427720A (en) * 1977-08-03 1979-03-02 Nec Corp Process amplifier of color pickup unit
JPS5939897B2 (en) * 1980-03-14 1984-09-27 工業技術院長 Method for manufacturing polycrystalline silicon semiconductor

Also Published As

Publication number Publication date
JPS58166716A (en) 1983-10-01

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