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JPH0512872B2 - - Google Patents
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JPH0512872B2 - - Google Patents

Info

Publication number
JPH0512872B2
JPH0512872B2 JP57018956A JP1895682A JPH0512872B2 JP H0512872 B2 JPH0512872 B2 JP H0512872B2 JP 57018956 A JP57018956 A JP 57018956A JP 1895682 A JP1895682 A JP 1895682A JP H0512872 B2 JPH0512872 B2 JP H0512872B2
Authority
JP
Japan
Prior art keywords
lens
semiconductor substrate
optical
refractive index
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57018956A
Other languages
Japanese (ja)
Other versions
JPS58137271A (en
Inventor
Hideto Furuyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57018956A priority Critical patent/JPS58137271A/en
Publication of JPS58137271A publication Critical patent/JPS58137271A/en
Publication of JPH0512872B2 publication Critical patent/JPH0512872B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies

Landscapes

  • Led Devices (AREA)

Description

【発明の詳細な説明】 発明の属する技術分野 本発明は光半導体素子用レンズ、光半導体素子
用レンズの製造方法、及び光半導体素子に関す
る。
TECHNICAL FIELD The present invention relates to a lens for an optical semiconductor device, a method for manufacturing a lens for an optical semiconductor device, and an optical semiconductor device.

従来技術とその問題点 面発光型発光ダイオード(バラス型LEDとも
言う、以下バラスLEDを記す)は、出力線形性
の良さや素子の信頼性の良さからアナログ系光通
信用光源として広く用いられている。
Conventional technology and its problems Surface-emitting light-emitting diodes (also called ballast-type LEDs, hereinafter referred to as ballast-type LEDs) are widely used as light sources for analog optical communications due to their good output linearity and high element reliability. There is.

一般に光通信用光源は、光伝送体である光フア
イバーとの結合を高めるため、放射される光に指
向性が要求される。しかし、バラスLEDはその
構造上からくる特性により放射光の指向性が鈍
く、光フアイバーとの結合が難しいため欠点を有
する。
In general, light sources for optical communication require directivity in the emitted light in order to enhance coupling with optical fibers that are optical transmission bodies. However, ballast LEDs have drawbacks because the directivity of the emitted light is blunt due to their structural characteristics and it is difficult to couple them with optical fibers.

従来かかる欠点を補うために外部レンズ又は内
部レンズを設けて光フアイバーとの結合を高める
方法が各種提案されている。
In order to compensate for this drawback, various methods have been proposed to improve coupling with optical fibers by providing an external lens or an internal lens.

外部レンズ方式は、球レンズ等のいわゆるマイ
クロレンズをバラスLEDに装着する方法で、そ
の焦点距離等の光学定数を適切に選ぶ事により光
フアイバーとの結合を高める事ができる。しか
し、この方法ではマイクロレンズとバラスLED
との光軸調整を精密に行う必要があり、調整及び
組立てが容易でない欠点を有する。特に、マイク
ロレンズの取り扱いとその固定保持する方法にお
いて考慮しなければならない。
The external lens method is a method in which a so-called microlens, such as a spherical lens, is attached to a ballast LED, and by appropriately selecting the optical constants such as the focal length, it is possible to improve the coupling with the optical fiber. However, this method uses microlens and ballast LED.
It is necessary to precisely adjust the optical axis with the optical axis, which has the disadvantage that adjustment and assembly are not easy. In particular, consideration must be given to how to handle the microlens and how to securely hold it.

また、内部レンズ方式は、バラスLEDの光取
り出し面を救面加工する事により光フアイバーと
の結合を高める方法で、外部レンズを用いずに結
合できるので調整及び組立てが容易な方法であ
る。
In addition, the internal lens method is a method that improves the coupling with the optical fiber by processing the light extraction surface of the ballast LED, and is a method that is easy to adjust and assemble because it can be coupled without using an external lens.

しかし、この方法では精密な球面加工を必要と
し、その加工技術が難しく又、大量に生産する事
が困難である。
However, this method requires precise spherical processing, and the processing technology is difficult and it is difficult to mass produce.

発明の目的 本発明の目的は、内部レンズによつてバラス
LEDの放射指向性を高め、且つ生産性の高い発
光ダイオードを提供する事にある。
OBJECT OF THE INVENTION The object of the invention is to
The purpose of the present invention is to improve the radiation directivity of LEDs and provide a highly productive light emitting diode.

発明の概要 本発明の特徴は、発光波長に対して透明な半導
体基板を用い、該基板中に局部的高屈折率化によ
るレンズ部を設け、半導体発光素子の放射指向性
を高めた事にある。
Summary of the Invention A feature of the present invention is that a semiconductor substrate that is transparent to the emission wavelength is used, and a lens portion with a locally high refractive index is provided in the substrate, thereby increasing the radiation directivity of the semiconductor light emitting device. .

発明の効果 本発明によれば、バラスLEDの放射指向性を
高め光フアイバーとの結合を容易にできる。ま
た、本発明によるバラスLEDは、生産性が高く
大量生産にも適する。
Effects of the Invention According to the present invention, the radiation directivity of a ballast LED can be improved and coupling with an optical fiber can be facilitated. Furthermore, the ballast LED according to the present invention has high productivity and is suitable for mass production.

発明の実施例 ここでは、光通信用バラスLEDとして
InGaAsP/InP系結晶材料について記述する。
Embodiment of the invention Here, as a balanced LED for optical communication
This article describes InGaAsP/InP-based crystal materials.

第1図はn型InP基板1に拡散法によつてレン
ズ部を設ける工程を示したものである。
FIG. 1 shows the process of providing a lens portion on an n-type InP substrate 1 by a diffusion method.

まずこの工程はInP基板1の両側に拡散マスク
となるSiO2等の酸化膜(又はSi3N4等の窒化膜)
2を設け、片面にはピンホールを設けて拡散窓と
する〔a図〕。但し、ピンホールを設けない面を
後で研摩する場合は、拡散マスク2はレンズ部を
設ける面だけでよい。
First, in this step, an oxide film such as SiO 2 (or nitride film such as Si 3 N 4 ) is placed on both sides of the InP substrate 1 as a diffusion mask.
2 and a pinhole on one side to form a diffusion window [Figure a]. However, if the surface on which the pinhole is not provided is to be polished later, the diffusion mask 2 only needs to be provided on the surface on which the lens portion is provided.

その後、該InP基板1をZn及びPを含む高温雰
囲気中においてZnの拡散を行う〔b図〕。そして
拡散マスク2を取り除く〔c図〕。
Thereafter, Zn is diffused in the InP substrate 1 in a high temperature atmosphere containing Zn and P [Figure b]. Then, the diffusion mask 2 is removed [Figure c].

この結果、Znの拡散された領域3は他の領域
に比べて屈折率が約0.001程度高い領域となり、
しかもピンホールからの拡散のためピンホールか
ら等方向に拡散されて半球状に屈折率が高くな
る。これによりInP基板中に、局部的高屈折率化
によるレンズ部が形製される。
As a result, the region 3 in which Zn is diffused has a refractive index about 0.001 higher than other regions,
Furthermore, because of the diffusion from the pinhole, the refractive index increases in a hemispherical manner because it is diffused in the same direction from the pinhole. As a result, a lens portion is formed in the InP substrate by locally increasing the refractive index.

こうして作成されたInP基板を用いた実施例を
第2図a及びbに示す。図中の2′は第1図中の
2と同じ膜であるが、ここでは電流制限絶縁膜と
して用いている。まず、a図はレンズ部を設けた
面に結晶成長を行つた例である。また、b図はa
図とは反対面に結晶成長を行つた例である。どち
らの場合においても拡散により形成されたレンズ
部が作用してバラスLEDの放射光に指向性をも
たせる事が判る。この様に本発明によれば、簡単
な製作工程によつて内部レンズを有するバラス
LEDが作製できる。これは従来の内部レンズ方
式に比べて半球加工するための特殊な装置が不要
であり、一度に多数の製作が可能であるため、大
量生産にも適している。次に第3図に製作工程を
変えた本発明実施例を示す。この実施例は第2図
の様に先にInP基板中にレンズ部を設けるのでは
なく、InP基板上に結晶成長を行つてからレンズ
部を設けるものである。この実施例の特徴は、結
晶成長が先に行われている事により、成長ウエハ
ーの発光効率等の特性を確認してスクリーニング
できる事である。これにより結晶成長による不備
等でウエハーを損う事が少くなる。図中a図は、
第1図b図と同様にレンズ部作製の状況を示すも
のである。
An example using the InP substrate thus prepared is shown in FIGS. 2a and 2b. 2' in the figure is the same film as 2 in FIG. 1, but here it is used as a current limiting insulating film. First, Figure a shows an example in which crystal growth is performed on the surface where the lens portion is provided. Also, figure b is a
This is an example in which crystal growth was performed on the opposite side to the one shown in the figure. It can be seen that in both cases, the lens portion formed by diffusion acts to impart directionality to the light emitted from the ballast LED. As described above, according to the present invention, a ballast having an internal lens can be manufactured by a simple manufacturing process.
LEDs can be made. Compared to the conventional internal lens method, this method does not require special equipment to process hemispheres, and it is possible to manufacture a large number of lenses at once, making it suitable for mass production. Next, FIG. 3 shows an embodiment of the present invention in which the manufacturing process is changed. In this embodiment, instead of first providing the lens portion in the InP substrate as shown in FIG. 2, the lens portion is provided after crystal growth is performed on the InP substrate. The feature of this example is that since the crystal growth is performed first, it is possible to check and screen the characteristics such as luminous efficiency of the grown wafer. This reduces the chance of damage to the wafer due to defects caused by crystal growth. Figure a in the figure is
Similar to FIG. 1b, this figure shows the state of manufacturing the lens part.

第4図は、第1図作製方法においてInP基板の
相対する両側にレンズ部を設けた実施例である。
これは片側のレンズ部を研摩により小さくしたり
する事により、光学的定数の設計範囲が広くなる
特徴を有する。
FIG. 4 shows an example in which lens portions are provided on opposite sides of the InP substrate in the manufacturing method shown in FIG.
This has the feature that the design range of optical constants can be widened by making the lens portion on one side smaller by polishing.

第5図は、第2図aの実施例を用いて、n型
InP層を選択除去した事による実施例である。
FIG. 5 shows an example using the embodiment of FIG.
This is an example in which the InP layer is selectively removed.

n型InPの選択エツチングは、フオトエツチン
グや電界エツチング等の手法がある。例えば、
FeCl3水溶液中において光照射を行うと、n形
InPの光照射された部分だけが選択的にエツチン
グされ、光照射されない部分はほとんどエツチン
グされない事が一般に知られている。また、この
時p型InPは光照射の有無にかかわらずほとんど
エツチングされない。
Selective etching of n-type InP includes techniques such as photo etching and electric field etching. for example,
When light irradiation is performed in FeCl 3 aqueous solution, n-type
It is generally known that only the parts of InP that are irradiated with light are selectively etched, and the parts that are not irradiated with light are hardly etched. Furthermore, at this time, p-type InP is hardly etched regardless of whether or not it is irradiated with light.

その手法を用いる事により第5図実施例の作製
が可能である。この実施例もまた、第4図実施例
と同様に、光学定数の設計範囲が広くなる手法の
1つである。
By using this method, the embodiment shown in FIG. 5 can be manufactured. This embodiment is also one of the methods in which the design range of optical constants is widened, similar to the embodiment shown in FIG.

発明の他の実施例 本発明では、InGaAsP/InP系材料について述
べて来たが、本発明はGaAs/GaAlAs系材料等
の材料にも応用が可能である。また、本発明の実
施例ではZn拡散法によるレンズ作製について述
べているが、これは他にもイオン注入法や選択結
晶成長法などの手法も可能であり、又拡散物が
Znの他にも実施可能な物質が存在する事は述べ
るまでもない事である。
Other Embodiments of the Invention Although the present invention has been described with respect to InGaAsP/InP-based materials, the present invention can also be applied to materials such as GaAs/GaAlAs-based materials. In addition, although the embodiments of the present invention describe lens fabrication using the Zn diffusion method, other methods such as ion implantation and selective crystal growth are also possible.
It goes without saying that there are other viable substances besides Zn.

つまり、本発明はその範囲と本質を離れる事な
く種々の応用が可能である。
In other words, the present invention can be applied in various ways without departing from its scope and essence.

【図面の簡単な説明】[Brief explanation of drawings]

第1図〜第5図は、本発明実施例の断面図であ
る。 1……n型InP基板、2……SiO2、Al2O3
Si3N4等の拡散マスク、2′……SiO2、Al2O3
Si3N4等の絶縁膜、3……Zn拡散p型領域(レン
ズ部)、4……n型InPバツフアー層、5……
InGaAsP発光層(活性層)、6……p型InPクラ
ツド層、7……p型InGaAsPオーミツクコンタ
クト層、8……p側電極金属、9……n側電極金
属。
1 to 5 are cross-sectional views of embodiments of the present invention. 1...n-type InP substrate, 2... SiO2 , Al2O3 ,
Diffusion mask such as Si 3 N 4 , 2'...SiO 2 , Al 2 O 3 ,
Insulating film such as Si 3 N 4 , 3... Zn diffused p-type region (lens part), 4... n-type InP buffer layer, 5...
InGaAsP light emitting layer (active layer), 6... p-type InP cladding layer, 7... p-type InGaAsP ohmic contact layer, 8... p-side electrode metal, 9... n-side electrode metal.

Claims (1)

【特許請求の範囲】 1 使用する波長に対して透明な半導体基板と、
この半導体基板表面に形成され不純物分布により
高屈折率化されたレンズ機構部とを具備すること
を特徴とする光半導体素子用レンズ。 2 使用する波長に対して透明な半導体基板表面
にピンホールを有するマスク膜を形成し、次いで
このマスク膜上から不純物を拡散して前記半導体
基板表面に高屈折率化されたレンズ機構部を形成
する工程とを具備することを特徴とする光半導体
素子用レンズの製造方法。 3 使用する波長に対して透明な半導体基板と、
この半導体基板表面に形成され不純物分布により
高屈折率化されたレンズ機構部と、前記半導体基
板に隣接して形成され、発した光を前記レンズ機
構部に照射する発光部とを具備することを特徴と
する光半導体素子。
[Claims] 1. A semiconductor substrate that is transparent to the wavelength used;
A lens for an optical semiconductor element, comprising a lens mechanism formed on the surface of the semiconductor substrate and having a high refractive index due to impurity distribution. 2. Forming a mask film having pinholes on the surface of a semiconductor substrate that is transparent to the wavelength to be used, and then diffusing impurities from above the mask film to form a lens mechanism portion with a high refractive index on the surface of the semiconductor substrate. 1. A method for manufacturing a lens for an optical semiconductor element, comprising the steps of: 3. A semiconductor substrate that is transparent to the wavelength used,
A lens mechanism section formed on the surface of the semiconductor substrate and having a high refractive index due to impurity distribution, and a light emitting section formed adjacent to the semiconductor substrate and irradiating the lens mechanism section with emitted light. Features of optical semiconductor devices.
JP57018956A 1982-02-10 1982-02-10 Light-emitting diode Granted JPS58137271A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57018956A JPS58137271A (en) 1982-02-10 1982-02-10 Light-emitting diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57018956A JPS58137271A (en) 1982-02-10 1982-02-10 Light-emitting diode

Publications (2)

Publication Number Publication Date
JPS58137271A JPS58137271A (en) 1983-08-15
JPH0512872B2 true JPH0512872B2 (en) 1993-02-19

Family

ID=11986094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57018956A Granted JPS58137271A (en) 1982-02-10 1982-02-10 Light-emitting diode

Country Status (1)

Country Link
JP (1) JPS58137271A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0017655D0 (en) * 2000-07-19 2000-09-06 Secr Defence Light emtting diode arrangements
JP4704628B2 (en) * 2001-08-31 2011-06-15 アーベル・システムズ株式会社 Light emitting diode
JP4899344B2 (en) * 2004-06-29 2012-03-21 富士ゼロックス株式会社 Surface emitting semiconductor laser and manufacturing method thereof

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5643783A (en) * 1979-09-18 1981-04-22 Toshiba Corp Light emitting diode for optical communication

Also Published As

Publication number Publication date
JPS58137271A (en) 1983-08-15

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