JPH0519834B2 - - Google Patents
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- Publication number
- JPH0519834B2 JPH0519834B2 JP59051468A JP5146884A JPH0519834B2 JP H0519834 B2 JPH0519834 B2 JP H0519834B2 JP 59051468 A JP59051468 A JP 59051468A JP 5146884 A JP5146884 A JP 5146884A JP H0519834 B2 JPH0519834 B2 JP H0519834B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- transparent
- film
- temperature
- heating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/17—Photovoltaic cells having only PIN junction potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/169—Thin semiconductor films on metallic or insulating substrates
- H10F77/1692—Thin semiconductor films on metallic or insulating substrates the films including only Group IV materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
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- Photovoltaic Devices (AREA)
Description
産業上の利用分野
本発明は、室内外で使用する非晶質シリコンに
よる太陽電池あるいは光センサなどの光起電力素
子、特にその基板材料の改良に関する。
従来例の構成とその問題点
比較的小型の室内外で使用するポータブル電子
機器の電源として、最近では非晶質シリコン(以
下a−Siと記す)太陽電池が、単独もしくは小型
の二次電池と組み合わされて採用される場合が多
くなつてきた。それは電池交換を不要にし、クリ
ーンエネルギーの利用法と云う時代背景への対応
によるものと思われる。現在よく用いられている
a−Si太陽電池は、無色透明で絶縁性を有するガ
ラス板を基板としている。
第1図により、その一例を説明する。図におい
て、1は厚さが1mm前後の無色透明なガラス板を
用いた透明基板で、その片面に、酸化スズを含む
酸化インジウム(以下ITOと呼ぶ)又は酸化スズ
の薄層を蒸着法などにより所定のパターンで透明
電極2を形成する。次いでプラズマCVD装置等
によりシランガス(SiH4)等を分解してp−i
−n層からなるa−Si層3堆積し、その上面にア
ルミニウムなどを蒸着して裏面電極4を形成し、
太陽電池を構成する。裏面電極4の保護並びに外
部との絶縁を図るために、絶縁塗料などを裏面電
極4の表面上に塗着乾燥して絶縁膜5を必要に応
じて設ける。
以上のようにして構成したa−Si太陽電池で
は、太陽光あるいは電灯光などの光(hν)はガ
ラス透明基板1より入光し、透明電極2を通過
し、a−Si層3に達して起電する。従つて機器に
太陽電池を組込む場合は、ガラス板側が表面とな
るので、外観が美しく、汚れても拭きとりやす
く、小型薄形のポケツタブル電子機器などには設
計上好都合である。
しかし、基板がガラス薄板であるため、持運び
の際の落下衝撃や外力により破損しやすく、機器
への組み込み方法、あるいは機器取扱いに際し十
分な注意を要するなどの問題があつた。そのた
め、ステンレス鋼等の金属薄板にポリイミド樹脂
薄層を設けて基板とする方法や、特開昭57−
103839号公報等で開示されているように、耐熱性
で硬質の樹脂であるポリイミドやポリアミドイミ
ドのフイルムを基板とする太陽電池が検討されて
いる。いずれも不透明基板であるため、ガラス薄
板を基板とする場合とは、電池構成法が逆とな
る。第2図にその例を示す。11は厚さ0.2mm程
度のポリイミドフイルム、又はステンレス鋼みが
き薄板にポリイミドの絶縁層11aを設けた不透
明基板であり、この上に金属膜電極14、a−Si
層13、さらにITO薄膜からなる透明電極12を
順次形成し、透明電極12の外部との絶縁及び表
面保護のため、透明シリコーン樹脂などの透明保
護膜15を塗着して構成している。この方式の太
陽電池では、図からもわかるように光は基板11
とは逆の方向、透明保護膜15、ITO透明電極1
2を通じてa−Si層に入射する。第2図のもの
は、基板に金属あるいは樹脂フイルムを用いてい
るので、落下や若干の曲げに対して破損しない特
長を持つている。しかし、表面に樹脂の透明保護
層が塗着してあるので、外観的には滑面が得られ
にくく、厚さムラも生じやすい。そのため外観が
悪くなつたり、出力特性のバラツキ幅が大きくな
るなど商品的価値が低くなると云う問題があつ
た。別の透明カバーを上に重ねれば若干外観は良
くなるが不十分であり、カバーによつて電池の光
電変換効率が低下するなどの欠点があつた。
また、第2図からわかるように、各電極の出力
端子(図示せず)が表面に形成されるので、使用
機器への装着、配線に制限を受けたり、有効受光
面積が減少する場合があつた。
以上述べた従来例の欠点を解消するため、種々
の検討がなされている。ガラス基板に強化ガラ
ス、硬質ガラスを用いる案も、厚さが1mm以下で
はほとんど効果がない。ガラスの代替材として、
透明で適当な強度と可撓性を有する樹脂材があれ
ば代替可能であるが、アクリル、ポリカーボネー
ト、テフロン材の一部、ポリエステル等の樹脂材
は、機械的強度と光透過性については、ほぼ満足
するが、a−Si層の堆積、ITO膜の形成に適した
温度下では、溶けたり、熱変形するなどで、電池
を構成できないか、あるいは光電変換効率の低い
電池しかできないなどの問題があつた。
発明の目的
本発明は、a−Si層堆積等の光起電力素子構成
の工程における加熱、エツチング、溶剤等に耐
え、落下衝撃などの外力で破損しない強度と可撓
性を有し、透明で光透過性の良いポリエーテルサ
ルフオン樹脂を基板材とすると共に、a−Si層堆
積時等におけるこの基板材の問題点を解決するこ
とによつて、従来のガラス基板(透明)、及びポ
リイミドフイルム、ステンレス鋼薄板等の不透明
基板(可撓性)の両方の特長を兼備し、双方の欠
点を除去した実用性のすぐれた光起電力素子を提
供することを目的とする。
発明の構成
本発明は、基板材質としてポリエーテルサルフ
オン樹脂の透明なフイルムを、a−Si層堆積時の
基板加熱温度と同じか、それよりやや高い温度で
真空加熱脱気処理をして用いるものである。
ポリエーテルサルフオン(強化充填剤を加えて
いない、通常、非強化品と呼ばれるもの)は、下
記に示すような
分子構造を持つた非晶質の熱可塑性樹脂で、高温
下で長期使用での強度低下が少ない、急激な温度
変化に対して性能変化が少ないなどの特長を有
し、透光率も良いものである。その代表物性を次
に示す。
熱変形温度〜203℃
(18.6Kg荷重、ASTMD−648)
引張強度;(ASTMD−638による)20℃……860(K
g/cm2)
150℃……580( 〃 )
180℃……420( 〃 )
曲げ弾性率;(ASTMD−590による)20℃……2650
0(Kg/cm2)
150℃……25500( 〃 )
180℃……23500( 〃 )
塩酸、強アルカリに耐える。
常温から200℃まで線膨張係数がほとんど変化し
ない。
透光率〜88%(ASTMD−1003による)
本発明は、上記(1)式に示したポリエーテルサル
フオンの透明フイルムを基板材として用いる。
しかし、このフイルムを用いて、その表面上に
ITO透明電極、a−Si層を堆積形成すると、フイ
ルム表面から発生するガス状不純物などが、それ
ぞれの膜質を低下、あるいは不均一にさせたり、
さらには部分短絡を生じさせるなどで、特性の安
定した光起電力素子を作ることは困難である。こ
の問題について鋭意検討した結果、前工程として
の真空脱気工程において、a−Si層堆積時の基板
加熱温度と同等もしは若干高い温度で真空加熱脱
気することによつて、フイルム表面に吸着されて
いる水分及び空気その他のガス、不純物を除去し
て、上記のa−Si層堆積時など成膜工程への影響
を解消させたものである。このようにして表面状
態を安定化させたものを基板とし、ITO透明電
極、a−Si層、裏面電極を順次形成して、a−Si
光起電力素子を構成し、ポリエーテルサルフオン
フイルム基板の外面からの入射光によつて起電さ
せるようにしたものである。
実施例の説明
基板材料として、0.1〜0.5mmの厚さのポリエー
テルサルフオンのフイルム(英国I.C.I社製など)
の透明なものを用いる。a−Si層等を形成する前
に、真空加熱炉にフイルムを入れて、上述したよ
うに、水分、空気などの吸着不純物を脱気処理す
る。この際、あとで述べるa−Si層の堆積温度と
同じかそれよりやや高い温度に加熱することによ
り安定した電池特性が確保である。この際の加熱
温度は、フイルムの耐熱性との関係から200℃を
上限にする必要がある。
次に、第1図を参照して、本発明により構成さ
れるa−Si太陽電池の一例を説明する。図におい
て1は上述の方法で、195℃で真空加熱脱気処理
をした厚さ0.2mmのポリエーテルサルフオンの透
明フイルムからなる基板である。この基板1の片
面にITOもしくはSnO2を真空蒸着法(基板温度
180℃)により透明電極2として所定のパターン
で形成する。透明電極の厚さは、透光性、可撓
性、抵抗値からみて、400〜2000Åとする。引続
き、プラズマCVDのグロー放電性による公知の
手法によりモノシランガス(SiH4)、p層ドーピ
ング材としてジポランガス(B2H6)、n層ドーピ
ング材としてホスフインガス(PH3)を分解し
て、p−i−n層の順に所定の厚さで順次堆積
し、起電要素としてのa−Si層3を形成する。こ
の際の基板温度は185〜190℃にする。次いで、そ
の上にアルミニウム、クロムなどの金属蒸着法に
よつて、2000〜5000Å蒸着し裏面電極4を設け
る。この裏面電極の絶縁及び保護のため、端子部
を除く上面に、シリコーン樹脂、エポキシ樹脂な
どの塗料で絶縁膜5を設けてもよい。基板に絶縁
性であるポリエーテルサルフオンフイルムを用い
ているので、従来のガラス基板を用いたものと同
様に、透明電極2、a−Si層3、裏面電極4をパ
ターニングすることにより、同一基板上で複数の
セルを構成して高い電圧を得ることは簡単にでき
る。
本発明は、上述したように、透明で、熱的安定
性にすぐれ、可撓性のあるポリエーテルサルフオ
ンのフイルムを、前記条件で真空加熱脱気処理を
して基板とすることによつて、従来のガラス基板
の特長を生かしながら、代替使用できるようにし
たものである。
透明で適当な硬さと強度を有する樹脂フイルム
として、ポリカーボネート、ポリエステル、アク
リルなどが考えられるが、上述したような熱的性
質が不十分で電池構成の際の加熱温度に耐えない
ものであつた。即ち、a−Si層3の堆積に際し、
基板温度として、180〜250℃が必要で、それ以下
では、膜質が低下し、光電変換特性の良い電池が
得られない。また透明電極2を形成する際も170
〜180℃もしくはそれ以上に加熱することが、電
極表面抵抗を低くするために必要である。ところ
が上述した樹脂フイルムは、耐熱温度が150〜160
℃以下であつて、a−Si層等を形成するに必要な
温度下では、変形もしくは溶融を始めるため使用
することができなかつた。次に熱変形温度が200
℃以上の透明、不透明の樹脂フイルムを用いて、
a−Si堆積実験を試みたところ次のような結果を
得た。
INDUSTRIAL APPLICATION FIELD The present invention relates to photovoltaic elements such as solar cells or optical sensors made of amorphous silicon used indoors and outdoors, and particularly to improvement of substrate materials thereof. Conventional configurations and their problems Recently, amorphous silicon (hereinafter referred to as a-Si) solar cells have been used alone or together with small secondary batteries as power sources for relatively small portable electronic devices used indoors and outdoors. Increasingly, they are being adopted in combination. This seems to be due to the need for battery replacement and the response to the times, such as the use of clean energy. A-Si solar cells, which are commonly used at present, use a transparent, colorless and insulating glass plate as a substrate. An example will be explained with reference to FIG. In the figure, 1 is a transparent substrate made of a colorless transparent glass plate with a thickness of about 1 mm, and a thin layer of indium oxide containing tin oxide (hereinafter referred to as ITO) or tin oxide is coated on one side by vapor deposition or other methods. A transparent electrode 2 is formed in a predetermined pattern. Next, silane gas (SiH 4 ), etc. is decomposed using a plasma CVD device, etc., and p-i
- an a-Si layer 3 consisting of an n layer is deposited, and aluminum or the like is deposited on the top surface to form a back electrode 4;
Configure a solar cell. In order to protect the back electrode 4 and insulate it from the outside, an insulating paint or the like is applied and dried on the surface of the back electrode 4 to provide an insulating film 5 as necessary. In the a-Si solar cell configured as described above, light (hν) such as sunlight or electric lamp light enters through the glass transparent substrate 1, passes through the transparent electrode 2, and reaches the a-Si layer 3. Generate electricity. Therefore, when a solar cell is incorporated into a device, the glass plate side becomes the front surface, so it has a beautiful appearance and is easy to wipe off if it gets dirty, which is convenient in terms of design for small and thin portable electronic devices. However, since the substrate is a thin glass plate, it is easily damaged by falling impact or external force during transportation, and there are problems in that it requires careful attention in how to incorporate it into equipment and when handling the equipment. For this reason, methods such as forming a thin layer of polyimide resin on a thin metal plate such as stainless steel and using it as a substrate,
As disclosed in Publication No. 103839 and the like, solar cells using a film of polyimide or polyamideimide, which is a heat-resistant and hard resin, as a substrate are being considered. Since both are opaque substrates, the battery construction method is reversed from the case where a thin glass plate is used as a substrate. An example is shown in FIG. Reference numeral 11 denotes an opaque substrate having a polyimide insulating layer 11a provided on a polyimide film or stainless steel polished thin plate with a thickness of about 0.2 mm, and a metal film electrode 14, a-Si
A layer 13 and a transparent electrode 12 made of an ITO thin film are sequentially formed, and a transparent protective film 15 such as a transparent silicone resin is applied to insulate the transparent electrode 12 from the outside and protect the surface. In this type of solar cell, as can be seen from the figure, light is transmitted to the substrate 11.
In the opposite direction, transparent protective film 15, ITO transparent electrode 1
2 into the a-Si layer. The one shown in Fig. 2 uses a metal or resin film for the substrate, so it has the advantage of not being damaged by being dropped or slightly bent. However, since a transparent protective layer of resin is applied to the surface, it is difficult to obtain a smooth surface in terms of appearance, and the thickness tends to be uneven. As a result, there were problems in that the appearance deteriorated, the variation in output characteristics increased, and the commercial value decreased. If another transparent cover was placed on top of the battery, the appearance would improve somewhat, but this would not be sufficient, and the cover would reduce the photoelectric conversion efficiency of the battery. Additionally, as can be seen from Figure 2, since the output terminals (not shown) of each electrode are formed on the surface, there may be restrictions on installation and wiring to the equipment used, and the effective light-receiving area may be reduced. Ta. Various studies have been made to eliminate the drawbacks of the conventional examples described above. The idea of using tempered glass or hard glass for the glass substrate has little effect if the thickness is less than 1 mm. As an alternative to glass,
If there is a resin material that is transparent and has appropriate strength and flexibility, it can be substituted, but resin materials such as acrylic, polycarbonate, some Teflon materials, and polyester have almost no mechanical strength and light transmittance. However, at temperatures suitable for depositing the a-Si layer and forming the ITO film, there are problems such as melting, thermal deformation, etc., making it impossible to construct a battery, or only producing batteries with low photoelectric conversion efficiency. It was hot. Purpose of the Invention The present invention provides a transparent material that has strength and flexibility that can withstand heating, etching, solvents, etc. in the photovoltaic device construction process such as a-Si layer deposition, and is not damaged by external forces such as drop impact. By using polyether sulfon resin with good light transmittance as the substrate material and solving the problems of this substrate material when depositing the a-Si layer, we have succeeded in replacing conventional glass substrates (transparent) and polyimide films. The object of the present invention is to provide a highly practical photovoltaic device that has the features of both opaque substrates (flexibility) such as thin stainless steel plates and eliminates the drawbacks of both. Structure of the Invention The present invention uses a transparent film of polyether sulfon resin as a substrate material, which is subjected to vacuum heating and degassing treatment at a temperature that is the same as or slightly higher than the substrate heating temperature during a-Si layer deposition. It is something. Polyether sulfone (without reinforcing filler added, usually referred to as non-reinforced product) is as shown below. It is an amorphous thermoplastic resin with a molecular structure, and has features such as little strength loss after long-term use at high temperatures, little change in performance due to sudden temperature changes, and good light transmittance. It is. Its representative physical properties are shown below. Heat distortion temperature ~203℃ (18.6Kg load, ASTMD-648) Tensile strength: (according to ASTMD-638) 20℃...860 (K
g/ cm2 ) 150℃...580 (〃) 180℃...420 (〃) Flexural modulus; (according to ASTM D-590) 20℃...2650
0 (Kg/cm 2 ) 150℃...25500 (〃) 180℃...23500 (〃) Resistant to hydrochloric acid and strong alkali. The coefficient of linear expansion hardly changes from room temperature to 200℃. Light transmittance ~88% (according to ASTM D-1003) In the present invention, a transparent film of polyether sulfon expressed by the above formula (1) is used as a substrate material. However, using this film, on its surface
When ITO transparent electrodes and a-Si layers are deposited, gaseous impurities generated from the film surface may deteriorate the film quality or make them non-uniform.
Furthermore, partial short circuits occur, making it difficult to produce a photovoltaic element with stable characteristics. As a result of intensive study on this problem, we found that in the vacuum degassing step as a pre-process, vacuum heating and degassing is performed at a temperature equal to or slightly higher than the substrate heating temperature during a-Si layer deposition, which allows the film to be adsorbed onto the film surface. By removing moisture, air, other gases, and impurities, the influence on film forming processes such as the above-mentioned a-Si layer deposition is eliminated. Using the substrate whose surface condition was stabilized in this way, an ITO transparent electrode, an a-Si layer, and a back electrode were sequentially formed.
The photovoltaic device is configured to generate electricity by incident light from the outer surface of a polyether sulfon film substrate. Description of Examples A polyether sulfon film (manufactured by ICI, UK, etc.) with a thickness of 0.1 to 0.5 mm was used as the substrate material.
Use a transparent one. Before forming the a-Si layer and the like, the film is placed in a vacuum heating furnace and adsorbed impurities such as moisture and air are degassed as described above. At this time, stable battery characteristics can be ensured by heating to a temperature that is the same as or slightly higher than the deposition temperature of the a-Si layer, which will be described later. The upper limit of the heating temperature at this time needs to be 200° C. in view of the heat resistance of the film. Next, an example of an a-Si solar cell constructed according to the present invention will be described with reference to FIG. In the figure, reference numeral 1 denotes a substrate made of a transparent film of polyether sulfon having a thickness of 0.2 mm and subjected to vacuum heating and degassing treatment at 195° C. by the method described above. ITO or SnO 2 is deposited on one side of this substrate 1 by vacuum evaporation method (substrate temperature
180° C.) to form a transparent electrode 2 in a predetermined pattern. The thickness of the transparent electrode is 400 to 2000 Å in terms of translucency, flexibility, and resistance. Subsequently, monosilane gas (SiH 4 ), diporane gas (B 2 H 6 ) as a p-layer doping material, and phosphine gas (PH 3 ) as an n-layer doping material are decomposed by a known method using the glow discharge property of plasma CVD, and p-i -n layers are sequentially deposited to a predetermined thickness to form an a-Si layer 3 as an electromotive element. The substrate temperature at this time is 185 to 190°C. Next, a metal such as aluminum or chromium is deposited thereon to a thickness of 2000 to 5000 Å to form the back electrode 4. In order to insulate and protect the back electrode, an insulating film 5 may be provided on the upper surface excluding the terminal portion using a paint such as silicone resin or epoxy resin. Since an insulating polyether sulfon film is used for the substrate, the transparent electrode 2, the a-Si layer 3, and the back electrode 4 can be patterned on the same substrate in the same way as when using a conventional glass substrate. It is easy to configure multiple cells to obtain high voltage. As described above, the present invention uses a polyether sulfon film, which is transparent, has excellent thermal stability, and is flexible, and uses it as a substrate by subjecting it to vacuum heating and degassing treatment under the above-mentioned conditions. , which takes advantage of the features of conventional glass substrates and can be used as an alternative. Polycarbonate, polyester, acrylic, and the like are conceivable as transparent resin films with appropriate hardness and strength, but they have insufficient thermal properties as described above and cannot withstand the heating temperatures used in battery construction. That is, when depositing the a-Si layer 3,
A substrate temperature of 180 to 250°C is required; below that temperature, the film quality deteriorates and a battery with good photoelectric conversion characteristics cannot be obtained. Also, when forming the transparent electrode 2, 170
Heating to ~180°C or higher is necessary to lower the electrode surface resistance. However, the resin film mentioned above has a heat resistance temperature of 150-160°C.
C or below, which is the temperature required to form an a-Si layer, etc., it could not be used because it would begin to deform or melt. Next, the heat distortion temperature is 200
Using transparent and opaque resin films at temperatures above ℃,
When an a-Si deposition experiment was attempted, the following results were obtained.
【表】
この表からわかるように、ポリイミドフイルム
を除くと、良質なa−Si膜を形成するに必要な基
板温度180℃以上で良好なのは、本発明のポリエ
ーテルサルフオンを用いた場合であつて、他の2
種は耐熱温度が高いと云われるが、比較的低い温
度から変形を始めている。このように基板材が変
形すると、電池として短絡したり、膜質不良で良
い特性が得られないので実用は不可である。
また、ポリエーテルサルフオンフイルムを基板
として用いるに際し、フイルムの耐熱温度を考慮
して約200℃を上限として、a−Si層堆積時の基
板加熱温度と同じか、それよりやや高い温度上に
加熱して真空加熱脱気処理を行つているが、これ
は上述したようにフイルムの表面には製造及び保
管時に水分や空気その他の不純物が吸着されてい
て、ITO形成、a−Si堆積時に遊離して、ピンホ
ールや膜質不良を発生し、構成した電池の歩留り
低下や、特性低下が生ずるのを防止するためで、
一例を上げると本発明の真空加熱脱気処理をした
場合の電池特性不良が0.5%以下であるのに対し、
無処理では25〜60%不良が発生した。
また、前記真空加熱脱気処理を行なう際の加熱
温度を、a−Si層堆積時の基板加熱温度よりも約
10℃以上低く(例えば170℃〜175℃)したとき
は、前記電池特性不良などの不良率低減効果が低
下すると共に特性異常品も現れる(特性不良2〜
10%)。
なお、本発明のポリエーテルサルフオンフイル
ムを基板とする光起電力素子では、基板厚さを
0.2mm以下(0.08〜0.2mm程度)にすることも可能
であり、従来のガラス基板を用いたものと比べ
て、薄形および軽量化することができるので、面
積の大きな太陽電池などを有利に作ることができ
る。また、ガラス基板方式の場合と同様に、各電
極の出力端子(図示せず)は、素子の裏面側に配
設する方式なので、第2図により説明した従来の
不透明基板を用いたものと比べて、各電極の出力
端子部分のパターニングの自由度が大きく、有効
受光面積を減少させずに、機器との整合性を図る
ことができる。
発明の効果
本発明の光起電力素子は、ガラス基板式と同じ
く、透明なポリエーテルサルフオンフイルム側か
ら光が入射する方式なので、電子機器に取りつけ
ると外観にすぐれ、また、薄形、軽量化が可能で
あるとともに、可撓性、機械的強度にすぐれてい
るので、持ち運びの際の落下、曲げ等にも十分耐
えるなど従来の問題点を解消することができる。[Table] As can be seen from this table, except for polyimide films, the polyether sulfon of the present invention is good at a substrate temperature of 180°C or higher, which is necessary to form a high-quality a-Si film. Well, the other two
Although seeds are said to have a high heat resistance, they begin to deform at relatively low temperatures. If the substrate material is deformed in this way, it is impossible to put it into practical use as a battery because it may cause short circuits or poor film quality, making it impossible to obtain good characteristics. In addition, when using polyether sulfon film as a substrate, it is necessary to heat the film to a temperature that is the same as or slightly higher than the substrate heating temperature during a-Si layer deposition, with an upper limit of approximately 200°C taking into account the film's heat resistance temperature. However, as mentioned above, moisture, air, and other impurities are adsorbed on the film surface during manufacturing and storage, and are released during ITO formation and a-Si deposition. This is to prevent pinholes and poor film quality from occurring, resulting in a decrease in yield and characteristics of the constructed battery.
To give an example, when the vacuum heating deaeration treatment of the present invention is applied, the defective battery characteristics are less than 0.5%.
Without treatment, 25 to 60% defects occurred. Furthermore, the heating temperature during the vacuum heating and degassing treatment is set to about 100% higher than the substrate heating temperature during a-Si layer deposition.
When the temperature is lowered by 10°C or more (for example, 170°C to 175°C), the effect of reducing the defective rate such as the above-mentioned defective battery characteristics decreases, and products with abnormal characteristics also appear (defective characteristics 2 to 175°C).
Ten%). In addition, in the photovoltaic device using the polyether sulfon film of the present invention as a substrate, the substrate thickness is
It is possible to make it less than 0.2 mm (approximately 0.08 to 0.2 mm), making it thinner and lighter than conventional glass substrates, making it advantageous for large-area solar cells, etc. can be made. In addition, as in the case of the glass substrate method, the output terminals (not shown) of each electrode are arranged on the back side of the element, so compared to the conventional method using an opaque substrate as explained in Fig. 2. Therefore, there is a large degree of freedom in patterning the output terminal portion of each electrode, and compatibility with equipment can be achieved without reducing the effective light-receiving area. Effects of the Invention The photovoltaic element of the present invention uses a method in which light enters from the transparent polyether sulfon film side, similar to the glass substrate type, so it has an excellent appearance when attached to electronic equipment, and is also thin and lightweight. In addition, since it has excellent flexibility and mechanical strength, it can overcome the conventional problems such as being able to sufficiently withstand falling and bending when being carried.
第1図は非晶質シリコン太陽電池の構成を示す
要部断面図、第2図は従来例の非晶質太陽電池の
構成を示す要部断面図である。
1……基板(透明)、2,12……透明電極、
3,13……a−Si層(p−i−n,p−i,n
−i−pなど)、4……裏面電極、5……絶縁膜、
11……基板(金属もしくはポリイミド基板)、
11a……金属基板上に設ける絶縁層、14……
金属薄膜電極、15……透明保護膜。
FIG. 1 is a sectional view of a main part showing the structure of an amorphous silicon solar cell, and FIG. 2 is a sectional view of a main part showing the structure of a conventional amorphous solar cell. 1... Substrate (transparent), 2, 12... Transparent electrode,
3, 13...a-Si layer (p-i-n, p-i, n
-i-p, etc.), 4... Back electrode, 5... Insulating film,
11...Substrate (metal or polyimide substrate),
11a...Insulating layer provided on the metal substrate, 14...
Metal thin film electrode, 15...Transparent protective film.
Claims (1)
ムを、非晶質シリコン層堆積時の基板加熱温度と
同じか、それよりやや高い温度に加熱しながら、
真空加熱脱気処理をして透光性の基板1とする工
程と、前記処理をした基板上に透明電極2を設
け、次いでその上面に、基板温度をおよそ185℃
〜190℃としてプラズマCVD法によつて所定の非
晶質シリコン層3を順次堆積し、次いでその上に
裏面電極4を形成する工程からなる、基板面入射
光起電型の非晶質シリコン光起電力素子の製造
法。1. While heating a transparent polyether sulfon resin film to a temperature that is the same as or slightly higher than the substrate heating temperature during deposition of the amorphous silicon layer,
A process of making a transparent substrate 1 by vacuum heating and degassing treatment, and providing a transparent electrode 2 on the treated substrate, and then heating the substrate at a temperature of approximately 185°C on its upper surface.
A substrate surface incident photovoltaic type amorphous silicon photovoltaic method comprising the steps of sequentially depositing a predetermined amorphous silicon layer 3 by plasma CVD at a temperature of ~190°C, and then forming a back electrode 4 thereon. Manufacturing method of electromotive force element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59051468A JPS60194582A (en) | 1984-03-16 | 1984-03-16 | Manufacturing method of amorphous silicon photovoltaic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59051468A JPS60194582A (en) | 1984-03-16 | 1984-03-16 | Manufacturing method of amorphous silicon photovoltaic device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60194582A JPS60194582A (en) | 1985-10-03 |
| JPH0519834B2 true JPH0519834B2 (en) | 1993-03-17 |
Family
ID=12887767
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59051468A Granted JPS60194582A (en) | 1984-03-16 | 1984-03-16 | Manufacturing method of amorphous silicon photovoltaic device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60194582A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60195979A (en) * | 1984-03-17 | 1985-10-04 | Semiconductor Energy Lab Co Ltd | Thin film solar battery |
| JPS61168271A (en) * | 1985-01-21 | 1986-07-29 | Sumitomo Bakelite Co Ltd | Amorphous silicon solar battery |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59189683A (en) * | 1983-04-13 | 1984-10-27 | Sharp Corp | Solar battery |
-
1984
- 1984-03-16 JP JP59051468A patent/JPS60194582A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60194582A (en) | 1985-10-03 |
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