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JPH052162B2 - - Google Patents
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JPH052162B2 - - Google Patents

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Publication number
JPH052162B2
JPH052162B2 JP61093568A JP9356886A JPH052162B2 JP H052162 B2 JPH052162 B2 JP H052162B2 JP 61093568 A JP61093568 A JP 61093568A JP 9356886 A JP9356886 A JP 9356886A JP H052162 B2 JPH052162 B2 JP H052162B2
Authority
JP
Japan
Prior art keywords
scanning beam
parallel
light receiving
reflecting mirror
reflecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61093568A
Other languages
Japanese (ja)
Other versions
JPS62250303A (en
Inventor
Masamichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Priority to JP9356886A priority Critical patent/JPS62250303A/en
Publication of JPS62250303A publication Critical patent/JPS62250303A/en
Publication of JPH052162B2 publication Critical patent/JPH052162B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention] 【産業上の利用分野】[Industrial application field]

この発明は光学式測定装置に係り、特に、平行
走査ビームを利用して被測定物の寸法等を測定す
る光学式測定装置の改良に関する。
The present invention relates to an optical measuring device, and more particularly to an improvement in an optical measuring device that measures the dimensions of an object to be measured using parallel scanning beams.

【従来の技術】 従来、回転平面鏡、又はポリゴンミラーにより
形成された回転走査ビーム(レーザビーム)ある
いは音叉偏向器により変更された扇形の回転走査
ビームをコリメータレンズによりこのコリメータ
レンズと集光レンズ間を通る平行走査ビームに変
換し、該コリメータレンズと集光レンズの間に被
測定物を置き、この被測定物によつて前記平行走
査ビームが遮られて生じる暗部又は明部の時間の
長さから被測定物の寸法を測定する光学式測定装
置があつた。 これは、例えば第5図及び第6図に示す如く、
レーザ管10からレーザビーム12を固定ミラー
14に向けて発振し、この固定ミラー14により
反射されたレーザビーム12を多角形回転ミラー
16によつて回転走査ビーム17に変換し、この
走査ビーム17をコリメータレンズ18によつて
平行走査ビーム20に変換し、この平行走査ビー
ム20によりコリメータレンズ18と集光レンズ
22の間に配置した被測定物24を高速走査し、
その時被測定物24によつて生じる暗部又は明部
の時間の長さから、被測定物24の走査方向(Y
方向)寸法を測定するものである。即ち、平行走
査ビーム20の明暗は、集光レンズ22の焦点位
置にある受光素子26の出力電圧の変化となつて
検出され、該受光素子26からの信号は、プリア
ンプ28に入力され、ここで増幅された後、セグ
メント選択回路30に送られる。このセグメント
選択回路30は、受光素子26の出力電圧から被
測定物24が走査されている時間tの間だけゲー
ト回路32を開くための電圧Vを発生して、ゲー
ジ回路32に出力するようにされている。このゲ
ート回路32には、クロツクパルス発振器34か
らクロツクパルスCPが入力されているので、ゲ
ート回路からは被測定物24の走査方向寸法(例
えば外径)に対応した時間tに対応するクロツク
パルスPを計数回路36に入力する。計数回路3
6は、このクロツクパルスPを計数して、デジタ
ル表示器38に計数信号を出力し、デジタル表示
器38は被測定物24の走査方向寸法即ち外径を
デジタル表示することになる。一方、前記多角形
回転ミラー16は、前記クロツクパルス発振器3
4出力を分周して400〜800Hz程度の方形波を発生
する分周器40からパワーアンプ42を経て増幅
された方形波により駆動されているパルスモータ
44によつて、前記クロツクパルス発振器34出
力のクロツクパルスCPと同期して回転され、測
定精度を維持するようにされている。 このような高速度走査型の光学式測定装置は、
移動する物体、高温物体の長さ、厚み等を非接触
で高精度に測定できるので広く利用されつつあ
る。 これと共に、測定対象物の範囲が拡大し従来較
的小さい被測定物であつたものが、大型の被測定
物についても用いられるようになつてきている。 これに対して測定装置の設置スペース、可搬性
等の要求から装置ができるだけ小型であるのが望
ましい。
[Prior Art] Conventionally, a rotating scanning beam (laser beam) formed by a rotating plane mirror or a polygon mirror, or a fan-shaped rotating scanning beam modified by a tuning fork deflector, is transferred between the collimating lens and the condensing lens using a collimator lens. The object to be measured is placed between the collimator lens and the condensing lens, and the length of the dark or bright area that occurs when the parallel scanning beam is blocked by the object to be measured. There was an optical measuring device for measuring the dimensions of objects to be measured. For example, as shown in FIGS. 5 and 6,
A laser beam 12 is oscillated from a laser tube 10 toward a fixed mirror 14, and the laser beam 12 reflected by the fixed mirror 14 is converted into a rotating scanning beam 17 by a polygonal rotating mirror 16. It is converted into a parallel scanning beam 20 by the collimator lens 18, and the object to be measured 24 placed between the collimator lens 18 and the condensing lens 22 is scanned at high speed with this parallel scanning beam 20.
At that time, the scanning direction of the measured object 24 (Y
Direction) dimensions are measured. That is, the brightness and darkness of the parallel scanning beam 20 is detected as a change in the output voltage of the light receiving element 26 located at the focal position of the condensing lens 22, and the signal from the light receiving element 26 is input to the preamplifier 28, where it is After being amplified, it is sent to the segment selection circuit 30. The segment selection circuit 30 generates a voltage V from the output voltage of the light receiving element 26 to open the gate circuit 32 only during the time t during which the object to be measured 24 is being scanned, and outputs it to the gauge circuit 32. has been done. Since the clock pulse CP is inputted to this gate circuit 32 from the clock pulse oscillator 34, the clock pulse P corresponding to the time t corresponding to the scanning direction dimension (for example, the outer diameter) of the object to be measured 24 is output from the gate circuit to the counting circuit. 36. Counting circuit 3
6 counts the clock pulses P and outputs a count signal to the digital display 38, which digitally displays the dimension in the scanning direction, that is, the outer diameter of the object 24 to be measured. On the other hand, the polygonal rotating mirror 16 is connected to the clock pulse oscillator 3.
The output of the clock pulse oscillator 34 is driven by a pulse motor 44 driven by a square wave amplified through a power amplifier 42 from a frequency divider 40 which divides the frequency of four outputs to generate a square wave of about 400 to 800 Hz. It is rotated in synchronization with the clock pulse CP to maintain measurement accuracy. This type of high-speed scanning optical measuring device
It is becoming widely used because it can measure the length, thickness, etc. of moving objects and high-temperature objects with high precision in a non-contact manner. At the same time, the range of objects to be measured has expanded, and what used to be relatively small objects to be measured has come to be used for large objects. On the other hand, it is desirable for the measuring device to be as small as possible due to requirements such as installation space and portability.

【発明が解決しようとする問題点】[Problems to be solved by the invention]

しかしながら、前記第5図及び第6図に示され
るような従来の光学式測定装置における、集光レ
ンズ22と、受光素子26とを含む受光部39
は、受光素子26が集光レンズ22の焦点位置に
あるために、測定範囲を拡大すべくコリメータレ
ンズ18及び集光レンズ22の有効径を大きくし
た場合、当然集光レンズ22の焦点距離もその有
効径に比例して大きくしなければならない。 ここで、集光レンズ22の焦点距離を短くする
と収差が大きくなり測定誤差が生じる。 従つて、従来は、測定範囲を拡大すると受光部
40の光軸方向の距離即ち集光レンズ22と受光
素子26との間の距離を大きくせざるをえず、こ
れによつて装置が大型化してしまうという問題点
があつた。 これに対して、光路の途中に反射鏡を設けて装
置寸法に対して光路長を実質的に長く取ることが
考えられる。 この場合、反射鏡の反射角度及びあおり角度を
微妙に調整して、取付け誤差等による光軸方向の
ずれを防止しなければならない。 このような微調整装置としては、例えば実開昭
60−98119号公報に開示されるガルバノミラーの
固定位置の調整装置がある。 前者の場合、反射鏡の支持部材を支持ピンによ
つて垂直方向に位置調整してあおり角度を調整す
ると共に、該支持ピンを中心に水平方向に回転さ
せ、反射角度を調整するようにしているため、煽
り角度は反射角度の一方のみを微調整しようとし
ても、その調整によつて必ず他方も微少に影響さ
れ、高い精度を要求される装置の場合には、調整
作業が容易でないという問題点がある。 この発明は、上記従来の問題点に鑑みてなされ
たものであつて、受光部の大きさを増大すること
なく集光レンズの焦点距離を長くとることができ
ると共に、光路長を大きくとるための反射鏡の反
射角度及び煽り角度をそれぞれ別個に相互に影響
されることなく、従つて極めて微妙に、高精度で
角度を微調整することができるようにした光学式
測定装置を提供することを目的とする。
However, in the conventional optical measuring device as shown in FIGS. 5 and 6, the light receiving section 39 including the condenser lens 22 and the light receiving element 26
Since the light receiving element 26 is located at the focal point of the condensing lens 22, when the effective diameters of the collimator lens 18 and the condensing lens 22 are increased in order to expand the measurement range, the focal length of the condensing lens 22 naturally also increases. It must be increased in proportion to the effective diameter. Here, if the focal length of the condensing lens 22 is shortened, aberrations will increase and measurement errors will occur. Therefore, in the past, when the measurement range was expanded, the distance in the optical axis direction of the light receiving section 40, that is, the distance between the condenser lens 22 and the light receiving element 26 had to be increased, which increased the size of the device. There was a problem with this. On the other hand, it is conceivable to provide a reflecting mirror in the middle of the optical path to make the optical path length substantially longer than the device dimensions. In this case, it is necessary to delicately adjust the reflection angle and tilt angle of the reflector to prevent deviations in the optical axis direction due to installation errors. As such a fine adjustment device, for example,
There is a device for adjusting the fixing position of a galvano mirror disclosed in Japanese Patent No. 60-98119. In the former case, the support member of the reflector is vertically positioned using a support pin to adjust the tilting angle, and the reflection angle is also adjusted by rotating the support member horizontally around the support pin. Therefore, even if you try to fine-tune only one of the reflection angles, the adjustment will always have a slight effect on the other, making it difficult to make adjustments for devices that require high precision. There is. This invention was made in view of the above-mentioned conventional problems, and it is possible to increase the focal length of the condensing lens without increasing the size of the light receiving part, and also to increase the optical path length. It is an object of the present invention to provide an optical measuring device that allows the reflection angle and deflection angle of a reflecting mirror to be adjusted individually and without being influenced by each other, and therefore very delicately and with high precision. shall be.

【問題点を解決するための手段】[Means to solve the problem]

この発明は、ビーム発生器からの入射ビームを
反射して回転走査ビームとするビーム変換手段、
該回転走査ビームを平行走査ビームとするコリメ
ータレンズ、を含む平行走査ビーム発生装置と、
被測定物を通過した前記平行走査ビームを集光す
る集光レンズ、この集光レンズによるビーム集光
位置に配置され、集光された走査ビームの明暗を
検出する受光素子、を含む受光装置と、を有し、
前記平行走査ビーム発生装置と前記受光装置の間
に配置した被測定物によつて前記平行走査ビーム
の一部が遮られて生じる暗部又は明部の時間の長
さを検出して被測定物の走査方向寸法を求めるよ
うにした光学式測定装置において、前記集光レン
ズと受光素子との間の走査ビームの光路上に、該
走査ビームを反射する少なくとも1枚の反射鏡を
含む反射手段を配置してなり、該反射手段は、前
記反射鏡を支持する断面略L字形状の取付台と、
この取付台をにおけるL字の底辺を基板に沿つ
て、且つ、前記平行走査ビームの走査方向と平行
な軸線廻りに回動させ、且つ、固定する反射角度
調整機構と、前記走査方向と平行な面内で前記反
射鏡を揺動させ、且つ、固定するあおり角度調整
機構と、を有してなり、前記反射角度調整機構
は、前記基板に対して、前記取付台の底辺を平行
走査ビームの走査方向と平行な軸線廻りに回転可
能に支持する回転中心軸と、この回転中心軸と平
行な中心軸を中心として回動自在に前記基板に支
持され、且つ、該中心軸に対して偏心する偏心部
を備えた偏心軸と、前記取付台の底辺に形成され
ると共に、前記偏心軸の偏心部と摺動自在に係合
し、該係合状態で前記取付台の前記回転中心軸廻
りの回転を許容する長孔と、前記取付台の底辺を
前記回転中心軸廻りの任意回動位置で、前記基板
に固定可能なクランプと、を有してなり、前記あ
おり角度調整機構は、基端において、前記取付台
の立上り辺に固定され、該基端近傍に薄肉部を備
え、該薄肉部よりも自由端側に前記反射鏡を支持
してなる片持支持片と、この片持支持片の自由端
に係合し、前記立上り辺と該自由端との距離を調
整する調整ねじとを有するようにして上記目的を
達成するものである。
The present invention includes a beam conversion means for reflecting an incident beam from a beam generator into a rotating scanning beam;
A parallel scanning beam generator including a collimator lens that converts the rotating scanning beam into a parallel scanning beam;
a light-receiving device including a condenser lens that condenses the parallel scanning beam that has passed through the object to be measured, and a light-receiving element that is disposed at a beam condensing position by the condenser lens and detects brightness or darkness of the condensed scanning beam; , has
A part of the parallel scanning beam is blocked by the object to be measured placed between the parallel scanning beam generator and the light receiving device, and the length of time of a dark or bright area is detected, and the object to be measured is detected. In an optical measuring device configured to determine a dimension in a scanning direction, a reflecting means including at least one reflective mirror for reflecting the scanning beam is disposed on the optical path of the scanning beam between the condenser lens and the light receiving element. The reflecting means includes a mounting base having a substantially L-shaped cross section that supports the reflecting mirror;
A reflection angle adjustment mechanism for rotating and fixing the base of the L-shape along the substrate and around an axis parallel to the scanning direction of the parallel scanning beam; a tilting angle adjustment mechanism for swinging and fixing the reflecting mirror in a plane; a rotation center axis that is rotatably supported around an axis parallel to the scanning direction; and a rotation center axis that is supported by the substrate so as to be rotatable about the center axis that is parallel to the rotation center axis, and is eccentric with respect to the center axis. an eccentric shaft having an eccentric portion; the eccentric shaft is formed at the bottom of the mount and is slidably engaged with the eccentric portion of the eccentric shaft; It has a long hole that allows rotation, and a clamp that can fix the bottom of the mounting base to the substrate at any rotational position around the rotation center axis, and the tilt angle adjustment mechanism has a base end. , a cantilever support piece fixed to a rising side of the mounting base, having a thin wall part near the base end, and supporting the reflecting mirror on the free end side of the thin wall part; and the cantilever support piece. The above object is achieved by including an adjustment screw that engages with the free end of and adjusts the distance between the rising side and the free end.

【作用】[Effect]

この発明においては、集光レンズと受光素子の
間の光路上に反射鏡が配置され、これによつて、
集光レンズと受光素子間の光路長を、集光レンズ
と受光素子の機械的距離よりも拡大させているの
で、受光部の装置容積を大きくするこなく集光レ
ンズの焦点距離を長くすることができる。 又、反射鏡の反射角度及びあおり角度をがたを
調整したり、複雑な調整作業及び調整機構を用い
ることなく、容易且つ微妙に調整することができ
る。 又このとき、反射角度とあおり角度を相互に独
立して微妙に且つ正確に調整することができ、し
たがつて調整作業を容易とすることができる。
In this invention, a reflecting mirror is arranged on the optical path between the condensing lens and the light receiving element, thereby
Since the optical path length between the condensing lens and the light receiving element is made larger than the mechanical distance between the condensing lens and the light receiving element, the focal length of the condensing lens can be increased without increasing the device volume of the light receiving part. I can do it. Further, the reflection angle and tilt angle of the reflecting mirror can be easily and delicately adjusted without adjusting play or using complicated adjustment work or adjustment mechanism. Further, at this time, the reflection angle and the tilting angle can be adjusted subtly and accurately independently of each other, thus making the adjustment work easier.

【実施例】【Example】

以下本発明の実施例を図面を参照して説明す
る。ここで、この実施例において、前記第5図及
び第6図に示される従来の光学式測定装置と同一
又は相当部分には第5図及び第6図と同一の符号
を付することにより説明を省略するものとする。 この実施例は、第1図及び第2図に示されるよ
うに、第5図に示されるようなビーム発明器であ
るレーザ管10からの入射ビーム12を反射して
回転走査ビーム17とする多角形回転ミラー1
6、該回転走査ビーム17を平行走査ビーム20
とするコリメータレンズ18、を含む平行走査ビ
ーム発生装置41と、被測定物24を通過した前
記平行走査ビーム20を集光する集光レンズ2
2、この集光レンズ22によるビーム集光位置に
配置され、集光された走査ビームの明暗を検出す
る受光素子26を含む受光装置43と、を有し、
平行走査ビーム発生装置と前記受光装置43の間
に配置した被測定物24によつて前記平行走査ビ
ーム20の一部が遮られて生じる暗部又は明部の
時間の長さを検出して被測定物24の走査方向
(Y方向)寸法を求めるようにした光学式測定装
置において、前記集光レンズ22と受光素子26
との間の走査ビームの光路上に、該走査ビームを
反射する反射鏡45を設けたものである。 ここで、前記受光素子26は、第2図に示され
るように、平行走査ビーム20の走査面からずれ
た位置で反射鏡45と集光レンズ22との間に配
置されている。 この反射鏡45は平面鏡であつて、第3図及び
第4図に示されるような断面略L字形状の取付台
46にあおり角度調整機構48を介して取付られ
ている。 前記取付台46は、反射角度調整機構50によ
つて、前記平行走査ビーム20の走査方向と平行
な軸線廻りに回動自在且つ固定可能とされてい
る。 又前記あおり角度調整機構48は、前記反射鏡
45を前記平行走査ビーム20の走査方向と平行
な面内で揺動させ、且つ固定できるようにされて
いる。 更に具体的に説明すると、前記反射角度調整機
構50は、前記取付台46のL字の底辺を、ハウ
ジング51の底部(基板)51Aに、平行走査ビ
ーム20の走査方向と平行な軸線廻りに回転可能
に支持する回転中心軸52と、この回転中心軸と
平行な中心軸54Aを中心として回動自在に底部
51Aに支持され、且つ、偏心部54Bを備えた
偏心軸54と、前記取付台46に形成されると共
に、前記偏心軸54の偏心部54Bと摺動自在に
係合し、該係合状態で前記取付台46の前記回転
中心軸52廻りの回転を許容する長孔56と、前
記取付台46を前記回転中心軸52廻りの任意回
動位置で底部51Aに固定可能なクランプ58と
を備えている。 又、前記あおり角度調整機構48は、基端(下
端)において、前記取付台46におけるL字の立
上り部46Aにボルト59により固定され、該基
端近傍に薄肉部60Aを備え、該薄肉部60Aよ
りも自由端側に前記反射鏡45を支持してなる片
持支持板60と、この片持支持板60の自由端に
係合し、前記取付台46と該自由端との距離を調
整する調整ねじ62と、を含んで構成されてい
る。 図の符号64は前記受光素子26を取付けるた
めの受光素子取付台を示す。この受光素子取付台
64は、受光装置43のハウジング51における
底部51Aにボルト66により固定されている。 この実施例においては、受光素子26と集光レ
ンズ22間の光路長が反射鏡45によつて両者の
機械的距離の約2倍とされている。 従つて、受光装置43における集光レンズ22
のコリメータレンズ18と反対側の寸法は、集光
レンズ22の焦点距離と同一とした場合従来の約
半分とされている。 この実施例において、反射鏡45の、平行走査
ビーム20の走査方向と平行な軸線廻りの角度、
即ち反射角度の調整は、反射角度調整機構50
における偏心軸54を回転して取付台46を回転
中心軸52廻りに回動させ、適宜位置でクランプ
58により取付台46を固定することによつて行
う。 このとき、偏心軸54の偏心部54Bは取付台
46に形成された長孔56に摺動自在に係合して
いるので、偏心軸54をいずれの方向に回動させ
てもがたが生じることがなく、従つて反射角度の
調整は微妙に、且つ確実に行うことができる。 又、反射鏡45のあおり角度θ、即ち受光素子
26に対する図において上下方向の反射位置の調
整は、あおり角度調整機構48における調整ねじ
62を適宜回転させることによつて行う。 調整ねじ62を適宜回転すると、反射鏡45を
支持している片持支持板60はその基端(下端)
において取付台46に固定され、且つこの下端近
傍に切り欠きからなる薄肉部60Aが形成されて
いるために、片持支持板60が該薄肉部60Aを
中心として弾性的に撓むことができる。 このため、調整ねじ62を回転駆動して片持支
持板60の自由端と取付台46との距離を調整す
ることによつて、反射鏡45のあおり角度θを調
整することができる。 このとき前述の如く、片持支持板60は薄肉部
60Aを中心として弾性的に撓むので、調整ねじ
62のバツクラツシが生じることがなく、従つて
あおり角度の調整時にがたが生じることがなく、
あおり角度の調整を微妙且つ正確に行うことがで
きる。 この実施例においては、反射鏡45のあおり角
度及び反射角度を簡単な構成からなるあおり角度
調整機構48及び反射角度調整機構50によつて
容易に、且つ確実に調整することができる。 更に、反射鏡45のあおり角度と反射角度の調
整が、各々あおり角度調整機構48及び反射角度
調整機構50によつて別個独立に行うことができ
るので、一方を調整することによつて他方の調整
がずれたりすることがなく、調整を微妙且つ正確
に、又短い作業時間で行うことができる。 なお上記実施例において、反射鏡45は平面鏡
とされているが、これは凸面鏡あるいは凹面鏡で
あつてもよい。 又、上記実施例において反射鏡45は1つのみ
であるが、これは、複数であつてもよい。 この場合、集光レンズ22の焦点距離を同一と
仮定したとき、受光装置43の平行走査ビーム進
行方向の寸法を更に小さくすることができる。 又、上記実施例は、いわゆるポリゴンミラーと
称される多角形回転ミラーによりレーザビームを
回転走査ビームに変換するものであるが、本発明
は、例えば回転平面鏡を用いてレーザビームを回
転走査ビームに変更するものあるいは音叉偏向器
を用いてレーザビームを扇形走査ビームに変更す
るものにも同様に適用されるものである。
Embodiments of the present invention will be described below with reference to the drawings. Here, in this embodiment, parts that are the same as or equivalent to those of the conventional optical measuring device shown in FIGS. 5 and 6 will be explained by giving the same reference numerals as in FIGS. 5 and 6. It shall be omitted. This embodiment, as shown in FIGS. 1 and 2, reflects an incident beam 12 from a laser tube 10, which is a beam inventor as shown in FIG. Square rotating mirror 1
6. The rotating scanning beam 17 is converted into a parallel scanning beam 20.
a parallel scanning beam generator 41 including a collimator lens 18, and a condenser lens 2 for condensing the parallel scanning beam 20 that has passed through the object to be measured 24.
2. A light receiving device 43 including a light receiving element 26 disposed at the beam focusing position by the focusing lens 22 and detecting the brightness of the focused scanning beam;
A part of the parallel scanning beam 20 is blocked by the object to be measured 24 placed between the parallel scanning beam generator and the light receiving device 43, and the length of time of a dark or bright area is detected and the object to be measured is detected. In an optical measuring device configured to determine the scanning direction (Y direction) dimension of an object 24, the condenser lens 22 and the light receiving element 26
A reflecting mirror 45 for reflecting the scanning beam is provided on the optical path of the scanning beam between the scanning beam and the scanning beam. Here, the light receiving element 26 is arranged between the reflecting mirror 45 and the condensing lens 22 at a position offset from the scanning plane of the parallel scanning beam 20, as shown in FIG. This reflecting mirror 45 is a plane mirror, and is attached to a mounting base 46 having a substantially L-shaped cross section as shown in FIGS. 3 and 4 via a swing angle adjustment mechanism 48. The mounting base 46 is rotatable around an axis parallel to the scanning direction of the parallel scanning beam 20 and fixed by a reflection angle adjustment mechanism 50. Further, the tilt angle adjustment mechanism 48 is configured to swing the reflecting mirror 45 in a plane parallel to the scanning direction of the parallel scanning beam 20 and to fix it. More specifically, the reflection angle adjustment mechanism 50 rotates the L-shaped bottom of the mounting base 46 to the bottom (substrate) 51A of the housing 51 around an axis parallel to the scanning direction of the parallel scanning beam 20. a rotational center shaft 52 that can be supported; an eccentric shaft 54 that is rotatably supported by the bottom portion 51A about a center axis 54A parallel to the rotational center axis and provided with an eccentric portion 54B; and the mounting base 46. an elongated hole 56 that is formed in a shape and slidably engages with the eccentric portion 54B of the eccentric shaft 54, and allows rotation of the mounting base 46 about the rotation center axis 52 in the engaged state; A clamp 58 is provided which can fix the mounting base 46 to the bottom portion 51A at any rotational position about the rotation center axis 52. Further, the tilt angle adjustment mechanism 48 is fixed at the base end (lower end) to the L-shaped rising portion 46A of the mounting base 46 with a bolt 59, and includes a thin wall portion 60A near the base end. A cantilever support plate 60 supporting the reflecting mirror 45 on the free end side is engaged with the free end of the cantilever support plate 60 to adjust the distance between the mounting base 46 and the free end. The adjustment screw 62 is configured to include an adjustment screw 62. Reference numeral 64 in the figure indicates a light-receiving element mounting base for mounting the light-receiving element 26. This light-receiving element mounting base 64 is fixed to the bottom portion 51A of the housing 51 of the light-receiving device 43 with bolts 66. In this embodiment, the optical path length between the light receiving element 26 and the condensing lens 22 is made approximately twice the mechanical distance between the two by the reflecting mirror 45. Therefore, the condenser lens 22 in the light receiving device 43
The dimension of the side opposite to the collimator lens 18 is about half that of the conventional one, assuming that the focal length of the condenser lens 22 is the same. In this embodiment, the angle of the reflecting mirror 45 around the axis parallel to the scanning direction of the parallel scanning beam 20;
That is, the reflection angle adjustment mechanism 50 adjusts the reflection angle.
This is carried out by rotating the eccentric shaft 54 in , pivoting the mount 46 around the rotation center axis 52, and fixing the mount 46 at an appropriate position with a clamp 58. At this time, since the eccentric portion 54B of the eccentric shaft 54 is slidably engaged with the elongated hole 56 formed in the mounting base 46, rattling occurs no matter which direction the eccentric shaft 54 is rotated. Therefore, the reflection angle can be adjusted delicately and reliably. Further, the tilt angle θ of the reflecting mirror 45, that is, the vertical reflection position in the drawing with respect to the light receiving element 26 is adjusted by appropriately rotating the adjustment screw 62 in the tilt angle adjustment mechanism 48. When the adjusting screw 62 is rotated appropriately, the cantilever support plate 60 supporting the reflector 45 moves to its base end (lower end).
Since the cantilever support plate 60 is fixed to the mounting base 46 and has a thin section 60A consisting of a notch formed near the lower end thereof, the cantilever support plate 60 can be elastically bent around the thin section 60A. Therefore, by rotating the adjustment screw 62 to adjust the distance between the free end of the cantilever support plate 60 and the mounting base 46, the tilting angle θ of the reflecting mirror 45 can be adjusted. At this time, as described above, the cantilever support plate 60 elastically bends around the thin wall portion 60A, so that the adjustment screw 62 does not buckle, and therefore no backlash occurs when adjusting the tilting angle. ,
The tilt angle can be adjusted delicately and accurately. In this embodiment, the tilt angle and reflection angle of the reflecting mirror 45 can be easily and reliably adjusted by the tilt angle adjustment mechanism 48 and the reflection angle adjustment mechanism 50, which have simple configurations. Further, since the tilt angle and reflection angle of the reflecting mirror 45 can be adjusted separately and independently by the tilt angle adjustment mechanism 48 and the reflection angle adjustment mechanism 50, adjusting one will adjust the other. The adjustment can be made delicately and accurately, and in a short working time, without causing any misalignment. In the above embodiment, the reflecting mirror 45 is a plane mirror, but it may be a convex mirror or a concave mirror. Further, although there is only one reflecting mirror 45 in the above embodiment, there may be a plurality of reflecting mirrors. In this case, assuming that the focal length of the condenser lens 22 is the same, the dimension of the light receiving device 43 in the parallel scanning beam traveling direction can be further reduced. Further, in the above embodiment, a laser beam is converted into a rotating scanning beam using a polygonal rotating mirror called a polygon mirror, but the present invention converts a laser beam into a rotating scanning beam using, for example, a rotating plane mirror. The same applies to those that convert the laser beam into a fan-shaped scanning beam using a tuning fork deflector.

【発明の効果】【Effect of the invention】

本発明は上記のように構成したので、受光装置
の寸法を大きくすることなく集光レンズの焦点距
離を長くとることができ、従つて、装置容積を増
大させることなく測定対象範囲を拡大させること
ができるという優れた効果を有する。更に、焦点
距離を長くとるための反射鏡の反射角度調整及び
あおり角度調整を相互に独立して行うことができ
るので、極めて微妙な精度の要求される調整も、
容易に行うことができる。
Since the present invention is configured as described above, the focal length of the condensing lens can be increased without increasing the dimensions of the light receiving device, and therefore the measurement target range can be expanded without increasing the device volume. It has the excellent effect of being able to Furthermore, since the reflection angle adjustment and tilt angle adjustment of the reflector to increase the focal length can be performed independently of each other, even adjustments that require extremely delicate precision can be performed.
It can be done easily.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係る光学式測定装置の実施例
を示す一部拡大断面図、第2図は同実施例の受光
装置を示す平断面図、第3図は同実施例の反射角
度調整機構を示す平面図、第4図は同実施例にお
けるあおり角度調整機構を示す正面図、第5図は
従来の光学式測定を示すブロツク図、第6図は同
従来の光学式測定装置の平行走査ビーム発生装置
及び受光装置を示す断面図である。 10……レーザ管(ビーム発生器)、12……
レーザビーム、16……多角形回転ミラー、17
……回転走査ビーム、18……コリメータレン
ズ、20……平行走査ビーム、24……被測定
物、26……受光素子、43……受光装置、45
……反射鏡、46……取付台、48……あおり角
度調整機構、50……反射角度調整機構、51…
…底部(基板)、52……回転中心軸、54……
偏心軸、54A……中心軸、54B……偏心部、
56……長孔、58……クランプ、60……片持
支持板、60A……薄肉部、62……調整ねじ。
FIG. 1 is a partially enlarged sectional view showing an embodiment of the optical measuring device according to the present invention, FIG. 2 is a plan sectional view showing a light receiving device of the same embodiment, and FIG. 3 is a reflection angle adjustment of the same embodiment. A plan view showing the mechanism, FIG. 4 is a front view showing the tilt angle adjustment mechanism in the same embodiment, FIG. 5 is a block diagram showing conventional optical measurement, and FIG. 6 is a parallel view of the conventional optical measuring device. FIG. 2 is a cross-sectional view showing a scanning beam generator and a light receiving device. 10... Laser tube (beam generator), 12...
Laser beam, 16...Polygonal rotating mirror, 17
... Rotating scanning beam, 18 ... Collimator lens, 20 ... Parallel scanning beam, 24 ... Measured object, 26 ... Light receiving element, 43 ... Light receiving device, 45
...Reflector, 46... Mounting base, 48... Tilt angle adjustment mechanism, 50... Reflection angle adjustment mechanism, 51...
...Bottom (substrate), 52...Rotation center axis, 54...
Eccentric shaft, 54A... Central axis, 54B... Eccentric part,
56...Elongated hole, 58...Clamp, 60...Cantilever support plate, 60A...Thin wall portion, 62...Adjustment screw.

Claims (1)

【特許請求の範囲】[Claims] 1 ビーム発生器からの入射ビームを反射して回
転走査ビームとするビーム変換手段、該回転走査
ビームを平行走査ビームとするコリメータレン
ズ、を含む平行走査ビーム発生装置と、被測定物
を通過した前記平行走査ビームを集光する集光レ
ンズ、この集光レンズによるビーム集光位置に配
置され、集光された走査ビームの明暗を検出する
受光素子、を含む受光装置と、を有し、前記平行
走査ビーム発生装置と前記受光装置の間に配置し
た被測定物によつて前記平行走査ビームの一部が
遮られて生じる暗部又は明部の時間の長さを検出
して被測定物の走査方向寸法を求めるようにした
光学式測定装置において、前記集光レンズと受光
素子との間の走査ビームの光路上に、該走査ビー
ムを反射する少なくとも1枚の反射鏡を含む反射
手段を配置してなり、該反射手段は、前記反射鏡
を支持する断面略L字形状の取付台と、この取付
台をにおけるL字の底辺を基板に沿つて、且つ、
前記平行走査ビームの走査方向と平行な軸線廻り
に回動させ、且つ、固定する反射角度調整機構
と、前記走査方向と平行な面内で前記反射鏡を揺
動させ、且つ、固定するあおり角度調整機構と、
を有してなり、前記反射角度調整機構は、前記基
板に対して、前記取付台の底辺を平行走査ビーム
の走査方向と平行な軸線廻りに回転可能に支持す
る回転中心軸と、この回転中心軸と平行な中心軸
を中心として回動自在に前記基板に支持され、且
つ、該中心軸に対して偏心する偏心部を備えた偏
心軸と、前記取付台の底辺に形成されると共に、
前記偏心軸の偏心部と摺動自在に係合し、該係合
状態で前記取付台の前記回転中心軸廻りの回転を
許容する長孔と、前記取付台の底辺を前記回転中
心軸廻りの任意回動位置で、前記基板に固定可能
なクランプと、を有してなり、前記あおり角度調
整機構は、基端において、前記取付台の立上り辺
に固定され、該基端近傍に薄肉部を備え、該薄肉
部よりも自由端側に前記反射鏡を支持してなる片
持支持板と、この片持支持板の自由端に係合し、
前記立上り辺と該自由端との距離を調整する調整
ねじと、を有してなることを特徴とする光学式測
定装置。
1. A parallel scanning beam generator including a beam conversion means for reflecting an incident beam from a beam generator into a rotational scanning beam, a collimator lens for converting the rotational scanning beam into a parallel scanning beam, and a light receiving device including a condensing lens that condenses the parallel scanning beam, and a light receiving element that is disposed at a beam condensing position by the condensing lens and detects the brightness or darkness of the condensed scanning beam; The scanning direction of the object is determined by detecting the length of the dark or bright portion that occurs when a part of the parallel scanning beam is blocked by the object placed between the scanning beam generator and the light receiving device. In the optical measuring device for determining dimensions, a reflecting means including at least one reflecting mirror for reflecting the scanning beam is disposed on the optical path of the scanning beam between the condenser lens and the light receiving element. The reflecting means includes a mounting base having a substantially L-shaped cross section that supports the reflecting mirror, and a base of the L-shape of the mounting base along the substrate, and
a reflection angle adjustment mechanism that rotates the reflecting mirror around an axis parallel to the scanning direction of the parallel scanning beam and fixes it; and a tilt angle that swings the reflecting mirror in a plane parallel to the scanning direction and fixes it. an adjustment mechanism;
The reflection angle adjustment mechanism has a rotation center shaft that supports the base of the mounting base rotatably around an axis parallel to the scanning direction of the parallel scanning beam, and an eccentric shaft rotatably supported by the substrate about a central axis parallel to the axis and having an eccentric portion eccentric to the central axis; and an eccentric shaft formed at the bottom of the mount;
an elongated hole that slidably engages with the eccentric portion of the eccentric shaft and allows rotation of the mount around the rotation center axis in the engaged state; a clamp that can be fixed to the substrate at any rotational position, and the swing angle adjustment mechanism is fixed to the rising side of the mounting base at the base end, and has a thin wall portion near the base end. a cantilever support plate supporting the reflecting mirror on the free end side of the thin portion; and engaging with the free end of the cantilever support plate;
An optical measuring device comprising: an adjustment screw for adjusting the distance between the rising side and the free end.
JP9356886A 1986-04-23 1986-04-23 Optical measuring apparatus Granted JPS62250303A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9356886A JPS62250303A (en) 1986-04-23 1986-04-23 Optical measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9356886A JPS62250303A (en) 1986-04-23 1986-04-23 Optical measuring apparatus

Publications (2)

Publication Number Publication Date
JPS62250303A JPS62250303A (en) 1987-10-31
JPH052162B2 true JPH052162B2 (en) 1993-01-11

Family

ID=14085857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9356886A Granted JPS62250303A (en) 1986-04-23 1986-04-23 Optical measuring apparatus

Country Status (1)

Country Link
JP (1) JPS62250303A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105006A (en) * 1990-08-24 1992-04-07 Tokyo Seimitsu Co Ltd Contactless measuring device
JP2009244175A (en) * 2008-03-31 2009-10-22 Sunx Ltd Light receiving unit of measuring device, light receiving unit of attitude detection sensor, and method for manufacturing the same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5612746Y2 (en) * 1977-11-07 1981-03-24
JPS5960609U (en) * 1982-10-14 1984-04-20 三秀プレス工業株式会社 Reflector angle fine adjustment table
JPS6098119U (en) * 1983-12-05 1985-07-04 シャープ株式会社 Galvanometer mirror fixed position adjustment device

Also Published As

Publication number Publication date
JPS62250303A (en) 1987-10-31

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