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JPH0527084B2 - - Google Patents
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JPH0527084B2 - - Google Patents

Info

Publication number
JPH0527084B2
JPH0527084B2 JP58084770A JP8477083A JPH0527084B2 JP H0527084 B2 JPH0527084 B2 JP H0527084B2 JP 58084770 A JP58084770 A JP 58084770A JP 8477083 A JP8477083 A JP 8477083A JP H0527084 B2 JPH0527084 B2 JP H0527084B2
Authority
JP
Japan
Prior art keywords
sample
lens barrel
optical microscope
distance
focus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58084770A
Other languages
Japanese (ja)
Other versions
JPS6068312A (en
Inventor
Hiroyoshi Soejima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP8477083A priority Critical patent/JPS6068312A/en
Publication of JPS6068312A publication Critical patent/JPS6068312A/en
Publication of JPH0527084B2 publication Critical patent/JPH0527084B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)

Description

【発明の詳細な説明】 (イ) 産業上の利用分野 本発明は光学顕微鏡を使用して試料表面の顕微
鏡像を撮影する方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a method of taking a microscopic image of a sample surface using an optical microscope.

(ロ) 従来技術 一般に、光学顕微鏡は観察すべき試料の調整が
簡単であること、操作性が容易であること、色彩
を識別できること、さらに、価格的にも安価であ
ること等により広く採用されている。このように
光学顕微鏡は多くの利点を有する反面、焦点深度
が浅いために表面が曲つていたり凹凸がある試料
をそのまま写真撮影したのでは鮮明な光学顕微鏡
像が得られないという難点がある。このため従来
は専ら表面が比較的フラツトな試料を観察対象と
している。そして、表面が曲つていたり凹凸があ
る試料を観察する場合には実体顕微鏡や走査型電
子顕微鏡が主に適用されている。しかしながら前
者の場合は倍率がせいぜい数10倍程度までであり
充分とはいえない。また、後者の場合は数万倍程
度の高倍率が得られるが試料の調整や装置の操作
が煩雑でまた色彩を識別できず、価格的にも高価
である等の難点がある。
(B) Prior art In general, optical microscopes are widely used because they are easy to prepare samples to be observed, are easy to operate, can distinguish colors, and are inexpensive. ing. Although optical microscopes have many advantages as described above, they have the disadvantage that because of their shallow depth of focus, it is not possible to obtain clear optical microscope images by photographing samples with curved or uneven surfaces. For this reason, in the past, only samples with relatively flat surfaces were observed. When observing samples with curved or uneven surfaces, stereoscopic microscopes and scanning electron microscopes are mainly used. However, in the former case, the magnification is at most several ten times, which is not sufficient. In the latter case, a high magnification of tens of thousands of times can be obtained, but there are drawbacks such as complicated preparation of the sample and operation of the device, inability to distinguish colors, and high price.

(ハ) 目的 本発明は上記の問題点に鑑みてなされたもので
あつて、表面が曲つていたり凹凸があるような試
料に対しても鮮明な光学顕微鏡像を撮影すること
ができるようにして従来の問題点を解消すること
を目的とする。
(c) Purpose The present invention has been made in view of the above-mentioned problems, and is intended to enable clear optical microscope images to be taken even for samples whose surfaces are curved or uneven. The purpose is to solve the problems of the conventional technology.

(ニ) 構成 光学顕微鏡像の光量は第1図に示すように、試
料面と焦点が合つたときに最大となり、ある程度
焦点位置から外れると試料位置によらず一定のバ
ツクグラウンドの強度となる。本発明はこの点に
着目したものであつて、上記の目的を達成するた
め、試料の撮影視野内において、この試料の最も
凸なる部位に焦点を合せたときの試料と鏡筒間の
距離と、試料の最も凹なる部位に焦点を合せたと
きの試料と鏡筒間の距離との間で、撮影露出時間
内に一方の距離から他方の距離まで試料と鏡筒の
少なくとも一方を光学顕微鏡の光軸方向に走査さ
せるようにしている。そして、たとえばフイルム
上に光量を順次積算すれば焦点の合つた部位のみ
がこれに応じて露光されることになり、結果的に
全体として焦点の合つた撮影像が得られるもので
ある。
(D) Configuration As shown in Figure 1, the light intensity of an optical microscope image is at its maximum when it is focused on the sample surface, and when it deviates from the focus position to a certain extent, it becomes a constant background intensity regardless of the sample position. The present invention focuses on this point, and in order to achieve the above object, the distance between the sample and the lens barrel when focusing on the most convex part of the sample within the field of view of the sample. , between the distance between the sample and the lens barrel when focusing on the most concave part of the sample, and move at least one of the sample and the lens barrel of the optical microscope from one distance to the other within the photographic exposure time. Scanning is performed in the optical axis direction. For example, if the amount of light is sequentially integrated onto the film, only the in-focus area will be exposed accordingly, resulting in a photographed image that is in focus as a whole.

(ホ) 実施例 以下、本発明を実施例について、図面に基づい
て詳細に説明する。
(E) Embodiments Hereinafter, embodiments of the present invention will be described in detail based on the drawings.

第2図は本発明を適用するための光学顕微鏡の
概略構成図である。第2図において、1は光学顕
微鏡、2は図示省略した拡大レンズ等が内蔵され
た鏡筒、3は、この鏡筒2に取付けられたカメ
ラ、4は観察すべき試料、5はこの試料4を載置
するためのステージである。このステージ5には
ラツク部5aが形成され、ラツク部5aにはピニ
オン6が噛合している。8はピニオン6を回転駆
動するためのシンクロモータ、9は上記カメラ3
のシヤツタ、10はシンクロモータ8やシヤツタ
9等の動作を制御する制御部である。
FIG. 2 is a schematic diagram of an optical microscope to which the present invention is applied. In FIG. 2, 1 is an optical microscope, 2 is a lens barrel with a built-in magnifying lens (not shown), 3 is a camera attached to this lens barrel 2, 4 is a sample to be observed, and 5 is this sample 4 This is a stage for placing. A rack portion 5a is formed on the stage 5, and a pinion 6 is meshed with the rack portion 5a. 8 is a synchro motor for rotationally driving the pinion 6, and 9 is the camera 3 mentioned above.
The shutter 10 is a control unit that controls the operations of the synchro motor 8, shutter 9, and the like.

次に上記構成を有する光学顕微鏡1を適用して
試料2の光学顕微鏡像を撮影する方法について説
明する。
Next, a method of taking an optical microscope image of the sample 2 by applying the optical microscope 1 having the above configuration will be explained.

まず、試料4をステージ5上に載置する。この
試料4の鏡筒2側の表面は平坦でなく第3図aに
示すような凹凸があるものとする。次いで、ステ
ージ5を光学顕微鏡1の光軸方向(第2図中符号
Z方向)へ移動する。そして、鏡筒2を覗きなが
ら試料4の撮影視野内において、試料4の最も凸
なる部位(同図中のA1点)に焦点を合せる。こ
のときの試料4と鏡筒2間の距離をZ1とする。続
いて、ステージ5を移動させて同じ視野内で試料
4の最も凹なる部位(同図中のA2点)に焦点を
合せる。このときの試料4と鏡筒2間の距離をZ3
とする。上記の試料4と鏡筒2間の各距離Z1,Z3
は制御部10に記憶させておく。引き続いて、初
めに設定した距離Z1に試料5を位置させ、この状
態から制御部10を操作してシヤツタ9を開放
し、撮影を開始する。シヤツタ9が開放されると
同時にシンクロモータ8も駆動され、ピニオン6
を回転させる。そして、ステージ5を試料4が後
に設定した距離Z3になるまで等速度で光軸方向に
走査させる(本例では下方に移動させる)。その
間シヤツタ9はシンクロモータ8に連動して開放
のままであり、所定の距離Z3に到達した時にシン
クロモータ8が停止するとともに、シヤツタ9が
閉じる。このように、撮影露出時間内に一方の距
離Z1から他方の距離Z3まで試料4が光軸方向に走
査されるので、時間経過にともない、試料4の各
部位に対応した光量は第3図b〜dに示すように
順次変化する。従つて、カメラ3のフイルム上に
は像が積算され、焦点の合つた部位に対応した所
が次々と露出されていく。そして、結果的には全
体として撮影視野内で焦点の合つた撮影像が得ら
れる。走査の間にはバツクグラウンドのかぶりを
生じるが、これは、フイルムの感度やカメラ3の
絞り、また、図示省略したイルミネータの明る
さ、さらには印画紙、焼付条件等を調整すること
により取り除くことができる。なお、上記実施例
においては試料4の最も凸なる部位に焦点を合せ
た位置Z1から最も凹なる部位に焦点を合せた位置
Z3に試料4を走査させたが逆の場合であつてもよ
く、さらに、試料4側を動かすのではなくて鏡筒
2を動かすようにしてもよい。さらには、試料4
と鏡筒2とを互いに接近、離間させるようにする
こともできる。
First, the sample 4 is placed on the stage 5. It is assumed that the surface of the sample 4 on the lens barrel 2 side is not flat but has irregularities as shown in FIG. 3a. Next, the stage 5 is moved in the optical axis direction of the optical microscope 1 (Z direction in FIG. 2). Then, while looking through the lens barrel 2, focus on the most convex part of the sample 4 ( point A in the figure) within the field of view of the sample 4. The distance between the sample 4 and the lens barrel 2 at this time is defined as Z1 . Next, the stage 5 is moved to focus on the most concave portion of the sample 4 (point A 2 in the figure) within the same field of view. The distance between sample 4 and lens barrel 2 at this time is Z 3
shall be. Each distance Z 1 , Z 3 between the sample 4 and the lens barrel 2 above
is stored in the control unit 10. Subsequently, the sample 5 is positioned at the initially set distance Z1 , and from this state the control section 10 is operated to open the shutter 9 and photographing is started. At the same time as the shutter 9 is released, the synchro motor 8 is also driven, and the pinion 6
Rotate. Then, the stage 5 is scanned at a constant speed in the optical axis direction until the sample 4 reaches a distance Z3 set later (in this example, it is moved downward). During this time, the shutter 9 remains open in conjunction with the synchro motor 8, and when the predetermined distance Z3 is reached, the synchro motor 8 stops and the shutter 9 closes. In this way, the sample 4 is scanned in the optical axis direction from one distance Z 1 to the other distance Z 3 within the photographing exposure time, so as time passes, the light amount corresponding to each part of the sample 4 changes to the third It changes sequentially as shown in Figures b to d. Therefore, images are accumulated on the film of the camera 3, and parts corresponding to the focused parts are exposed one after another. As a result, a photographed image that is in focus within the field of view as a whole is obtained. Background fog occurs during scanning, but this can be removed by adjusting the sensitivity of the film, the aperture of the camera 3, the brightness of the illuminator (not shown), the photographic paper, the printing conditions, etc. I can do it. In the above example, from position Z 1 where the focus is on the most convex part of sample 4 to position Z 1 where the focus is on the most concave part.
Although the sample 4 is scanned by the Z 3 , the opposite case may be used, and furthermore, the lens barrel 2 may be moved instead of moving the sample 4 side. Furthermore, sample 4
The lens barrel 2 and the lens barrel 2 can also be moved closer to each other or separated from each other.

(ヘ) 効果 以上のように本発明によれば光学顕微鏡の鏡筒
と試料との相対的な位置関係を変位することによ
り試料表面が平坦でないものでも鮮明な光学顕微
鏡像が得られる。しかも、走査型電子顕微鏡に比
べて極めて安価に実現することができる。また、
実体顕微鏡では実現できなかつた数100倍の倍率
でも撮影像が得られるという優れた効果が発揮さ
れる。
(f) Effects As described above, according to the present invention, a clear optical microscope image can be obtained even if the sample surface is not flat by changing the relative positional relationship between the lens barrel of the optical microscope and the sample. Furthermore, it can be realized at a much lower cost than a scanning electron microscope. Also,
It has the excellent effect of being able to capture images even at a magnification of several hundred times, something that could not be achieved with a stereo microscope.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は試料表面に焦点を合せたときの光量と
の関係を説明する特性図、第2図および第3図は
本発明の実施例を示し、第2図は本発明を適用す
るための光学顕微鏡の構成図、第3図は試料表面
の形状と、この試料に焦点を合せたときの光量と
の関係を示す特性図である。 1……光学顕微鏡、2……鏡筒、3……カメ
ラ、4……試料。
Fig. 1 is a characteristic diagram explaining the relationship with the amount of light when focused on the sample surface, Figs. 2 and 3 show embodiments of the present invention, and Fig. FIG. 3, which is a block diagram of the optical microscope, is a characteristic diagram showing the relationship between the shape of the sample surface and the amount of light when focused on the sample. 1... Optical microscope, 2... Lens barrel, 3... Camera, 4... Sample.

Claims (1)

【特許請求の範囲】[Claims] 1 表面が平坦でない試料の光学顕微鏡像を撮影
する方法であつて、試料の撮影視野内においてこ
の試料の最も凸なる部位に焦点を合せたときの試
料と鏡筒間の距離と、試料の最も凹なる部位に焦
点を合せたときの試料と鏡筒間の距離との間で撮
影露出時間内に、一方の距離から他方の距離まで
試料と鏡筒の少なくとも一方を光学顕微鏡の光軸
方向に走査させることを特徴とする光学顕微鏡像
の撮影方法。
1 A method of taking an optical microscope image of a sample with an uneven surface, which measures the distance between the sample and the lens barrel when focusing on the most convex part of the sample within the field of view of the sample, and the distance between the sample and the lens barrel. During the exposure time, move at least one of the sample and the lens barrel in the direction of the optical axis of the optical microscope from one distance to the other. A method for taking an optical microscope image, characterized by scanning.
JP8477083A 1983-05-13 1983-05-13 Photographing method of optical microscope image Granted JPS6068312A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8477083A JPS6068312A (en) 1983-05-13 1983-05-13 Photographing method of optical microscope image

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8477083A JPS6068312A (en) 1983-05-13 1983-05-13 Photographing method of optical microscope image

Publications (2)

Publication Number Publication Date
JPS6068312A JPS6068312A (en) 1985-04-18
JPH0527084B2 true JPH0527084B2 (en) 1993-04-20

Family

ID=13839912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8477083A Granted JPS6068312A (en) 1983-05-13 1983-05-13 Photographing method of optical microscope image

Country Status (1)

Country Link
JP (1) JPS6068312A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011070757A1 (en) 2009-12-07 2011-06-16 パナソニック株式会社 Imaging device and imaging method
WO2011070755A1 (en) 2009-12-07 2011-06-16 パナソニック株式会社 Imaging device and control method for same
WO2012124321A1 (en) 2011-03-14 2012-09-20 パナソニック株式会社 Imaging device, imaging method, integrated circuit, and computer program
US8890995B2 (en) 2011-04-15 2014-11-18 Panasonic Corporation Image pickup apparatus, semiconductor integrated circuit and image pickup method
US9083880B2 (en) 2011-03-02 2015-07-14 Panasonic Corporation Imaging device, semiconductor integrated circuit, and imaging method
US9185393B2 (en) 2011-10-12 2015-11-10 Panasonic Intellectual Property Management Co., Ltd. Image capturing device, semiconductor integrated circuit, and image capturing method

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2385481B (en) 2002-02-13 2004-01-07 Fairfield Imaging Ltd Microscopy imaging system and method
WO2012157250A1 (en) 2011-05-16 2012-11-22 パナソニック株式会社 Lens unit and image capture device
JP5934940B2 (en) 2012-05-17 2016-06-15 パナソニックIpマネジメント株式会社 Imaging apparatus, semiconductor integrated circuit, and imaging method
DE102019101976B4 (en) 2018-01-30 2022-03-03 Canon Kabushiki Kaisha TONER AND PROCESS FOR MAKING THE TONER

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
OPTICS COMMUNICATIONS=1992 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011070757A1 (en) 2009-12-07 2011-06-16 パナソニック株式会社 Imaging device and imaging method
WO2011070755A1 (en) 2009-12-07 2011-06-16 パナソニック株式会社 Imaging device and control method for same
US9083880B2 (en) 2011-03-02 2015-07-14 Panasonic Corporation Imaging device, semiconductor integrated circuit, and imaging method
WO2012124321A1 (en) 2011-03-14 2012-09-20 パナソニック株式会社 Imaging device, imaging method, integrated circuit, and computer program
US8890995B2 (en) 2011-04-15 2014-11-18 Panasonic Corporation Image pickup apparatus, semiconductor integrated circuit and image pickup method
US9185393B2 (en) 2011-10-12 2015-11-10 Panasonic Intellectual Property Management Co., Ltd. Image capturing device, semiconductor integrated circuit, and image capturing method

Also Published As

Publication number Publication date
JPS6068312A (en) 1985-04-18

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