Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPH0529244B2 - - Google Patents
[go: Go Back, main page]

JPH0529244B2 - - Google Patents

Info

Publication number
JPH0529244B2
JPH0529244B2 JP61267122A JP26712286A JPH0529244B2 JP H0529244 B2 JPH0529244 B2 JP H0529244B2 JP 61267122 A JP61267122 A JP 61267122A JP 26712286 A JP26712286 A JP 26712286A JP H0529244 B2 JPH0529244 B2 JP H0529244B2
Authority
JP
Japan
Prior art keywords
protrusion
magnetic head
disk
height
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61267122A
Other languages
Japanese (ja)
Other versions
JPS63120209A (en
Inventor
Katsumi Onodera
Shoichi Nagamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP61267122A priority Critical patent/JPS63120209A/en
Publication of JPS63120209A publication Critical patent/JPS63120209A/en
Publication of JPH0529244B2 publication Critical patent/JPH0529244B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Description

【発明の詳細な説明】 〔発明の属する技術分野〕 本発明は、固定磁気デイスク装置に用いる磁気
デイスクなどの表面に存在し、デイスクへのデー
タの書き込み、読み出しに際してトラブルを生じ
たり、磁気ヘツドに損傷を与えたりする突起につ
いて、その高さを測定する方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field to which the Invention Pertains] The present invention relates to a magnetic disk that exists on the surface of a magnetic disk used in a fixed magnetic disk device, and that may cause trouble when writing or reading data to or from the disk, or may damage the magnetic head. This invention relates to a method for measuring the height of protrusions that may cause damage.

〔従来技術とその問題点〕[Prior art and its problems]

磁気デイスクはデイスク状の基板表面に磁性
層、保護潤滑層などをめつき、スパツタ、コーテ
イングなど種々の方法で形成して作製されるが、
基板表面の粗さが充分均一でなく突起が存在した
り、あるいは各層の成膜中に不純物が混入したり
すると、磁気デイスクの表面に突起が発生するこ
とがある。固定磁気デイスク装置ではCSS方式が
採られるが、そのような、磁気ヘツドが磁気デイ
スク面からわずかに浮上走行しながらデータの書
き込み、読み出しを行う場合でも、このような突
起が存在すると誤りが発生することがあり、ま
た、突起が高い場合には、磁気ヘツドが突起に衝
突して損傷を受けることがある。また、CSS方式
では装置の駆動開始時には磁気ヘツドは磁気デイ
スク面に接触している状態から摺動し浮上走行状
態にはいり、装置の停止時には浮上状態から磁気
デイスク面に接触摺動して停止する。このとき、
突起が存在すると磁気ヘツドとの衝突が起こり、
両者は多少とも損傷を受ける。従つて、突起の数
は少ない程望ましく、また、その高さは低い方が
好ましい。
Magnetic disks are manufactured by plating a magnetic layer, protective lubricant layer, etc. on the surface of a disk-shaped substrate and forming them using various methods such as sputtering and coating.
If the roughness of the substrate surface is not sufficiently uniform and protrusions are present, or if impurities are mixed in during the formation of each layer, protrusions may occur on the surface of the magnetic disk. Fixed magnetic disk drives use the CSS method, but even when the magnetic head writes and reads data while moving slightly above the magnetic disk surface, the presence of such protrusions can cause errors. If the protrusion is high, the magnetic head may collide with the protrusion and be damaged. In addition, in the CSS method, when the device starts to drive, the magnetic head slides from a state in contact with the magnetic disk surface and enters a floating running state, and when the device stops, the magnetic head slides in contact with the magnetic disk surface from the floating state and stops. . At this time,
If a protrusion exists, a collision with the magnetic head will occur,
Both will be damaged to some extent. Therefore, it is preferable that the number of protrusions is as small as possible, and the height thereof is preferably as low as possible.

突起の個数、高さを知る方法として、従来アコ
ーステイツク・エミツシヨン(以下、AEと略記
する)法が知られている。この方法は磁気ヘツド
のスライダアームにAEセンサを取り付けておき、
磁気デイスクを所定の回転数で回転させ磁気ヘツ
ドを浮上走行させる。磁気ヘツドに突起が接触す
るとスライダアームが振動し、AEセンサの出力
信号電圧にピーク電圧が発生する。このピーク電
圧により突起の個数およびその高さを知る。磁気
ヘツドを磁気デイスクの半径方向全体にわたつて
移動させることにより、磁気デイスク全面の突起
の情報を得ることができる。
The acoustic emission (hereinafter abbreviated as AE) method is conventionally known as a method for determining the number and height of protrusions. This method involves attaching an AE sensor to the slider arm of the magnetic head.
The magnetic disk is rotated at a predetermined rotational speed to cause the magnetic head to fly and travel. When the protrusion comes into contact with the magnetic head, the slider arm vibrates and a peak voltage is generated in the output signal voltage of the AE sensor. The number of protrusions and their heights are determined from this peak voltage. By moving the magnetic head over the entire radial direction of the magnetic disk, information on the protrusions on the entire surface of the magnetic disk can be obtained.

ところが、突起の個数はピーク電圧の数をカウ
ントすることにより簡単に知ることができるが、
その高さを知るためには、個々の突起毎に磁気デ
イスクの回転数を変化させて測定を繰り返す必要
があつた。すなわち、その高さを測定しようとす
る突起について、磁気デイスクの回転数をあげて
いき、磁気ヘツドの浮上量が多くなり突起と接触
しなくなつてAEセンサの出力信号電圧にピーク
電圧がでなくなりノイズレベルとなる回転数を測
定し、磁気ヘツドの走行速度を算出する。磁気ヘ
ツドの走行速度と浮上量の関係はわかつている
(ガラス基板を用いた白色干渉法による)ので、
AEセンサの出力信号電圧にピーク電圧が発生し
たときとそのピーク電圧が消滅してノイズレベル
となつたときとの磁気ヘツドの走行速度がわかれ
ば、それぞれの磁気ヘツドの浮上量がわかり、そ
の差として突起高さを知ることができる。しかし
ながら、一つ一つの突起についてこのような測定
を行うことは非常に手間のかかることであつた。
However, although the number of protrusions can be easily determined by counting the number of peak voltages,
In order to find out the height, it was necessary to repeat the measurement by changing the number of rotations of the magnetic disk for each protrusion. In other words, as the rotational speed of the magnetic disk is increased for the protrusion whose height is to be measured, the flying height of the magnetic head increases and it no longer comes into contact with the protrusion, and the peak voltage no longer appears in the output signal voltage of the AE sensor. The rotational speed that corresponds to the noise level is measured, and the traveling speed of the magnetic head is calculated. Since the relationship between the traveling speed of the magnetic head and the flying height is known (based on white light interferometry using a glass substrate),
If you know the traveling speed of the magnetic head when the peak voltage occurs in the output signal voltage of the AE sensor and when that peak voltage disappears and becomes the noise level, you can find out the flying height of each magnetic head and calculate the difference. The protrusion height can be found as . However, it is very time-consuming to perform such measurements for each protrusion.

〔発明の目的〕[Purpose of the invention]

本発明は、前述の欠点を除去して、簡便に突起
の高さを知ることができる突起高さ測定法を提供
することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a protrusion height measuring method that eliminates the above-mentioned drawbacks and allows the height of protrusions to be easily determined.

〔発明の要点〕[Key points of the invention]

本発明によれば、磁気デイスクを所定の回転数
で回転させ、該デイスク面から小間隙を隔てて走
行している磁気ヘツドが該デイスク面上に存在す
る突起に接触したとき、磁気ヘツドのスライダア
ームに取り付けられたAEセンサより発生する出
力信号電圧のピーク電圧Vpとそのピーク電圧を
発生させた突起のデイスク回転中心からの距離R
との積Vp・Rを算出し、あらかじめ求めてある
磁気デイスクを前記所定の回転数で回転させたと
きのVp・R値と突起高さとの関係線図により、
前記の算出したVp.R値となる突起の高さを知る
ことによつて、上記の目的を達成する。
According to the present invention, when a magnetic disk is rotated at a predetermined rotation speed and a magnetic head running at a small gap from the disk surface contacts a protrusion existing on the disk surface, the slider of the magnetic head The peak voltage Vp of the output signal voltage generated by the AE sensor attached to the arm and the distance R from the disk rotation center to the protrusion that generated the peak voltage
Calculate the product Vp・R of , and use the relationship diagram between the Vp・R value and the protrusion height when the previously determined magnetic disk is rotated at the predetermined rotation speed,
The above objective is achieved by knowing the height of the protrusion that gives the calculated Vp.R value.

〔発明の実施例〕[Embodiments of the invention]

第2図は本発明による測定を行うための装置の
一例の概念図であつて、測定すべき磁気デイスク
1は回転軸2に取り付けられており、デイスク1
の面に対向配置される磁気ヘツド3は板ばね4を
介してスライダアーム5に取り付けられており、
スライダアーム5にはAEセンサ6が取り付けて
あり、これにより磁気ヘツドの微少振動を信号化
し、その出力信号を増幅器7により増幅し、実効
値(R.M.S)電圧計8で読みとつたり、オシロス
コープ9に電圧波形を出力したりする。スライダ
アーム5は磁気ヘツド3がデイスク1の面の半径
方向全体にわたつて移動することができ、磁気ヘ
ツド3がデイスク1の面上の適切な位置にくるよ
う調節できる。
FIG. 2 is a conceptual diagram of an example of a device for performing measurements according to the present invention, in which a magnetic disk 1 to be measured is attached to a rotating shaft 2, and a magnetic disk 1 to be measured is attached to a rotating shaft 2.
A magnetic head 3, which is placed opposite to the surface of the magnetic head 3, is attached to a slider arm 5 via a leaf spring 4.
An AE sensor 6 is attached to the slider arm 5, which converts minute vibrations of the magnetic head into a signal.The output signal is amplified by an amplifier 7, read by an effective value (RMS) voltmeter 8, and read by an oscilloscope 9. output a voltage waveform. The slider arm 5 allows the magnetic head 3 to move over the entire radial direction of the surface of the disk 1, and can be adjusted so that the magnetic head 3 is at an appropriate position on the surface of the disk 1.

このような装置を用いて、デイスク1と回転軸
2により1500rpmで回転させる。磁気ヘツド3は
デイスク1の面より僅かに浮上して走行する。デ
イスク1の面上に突起が存在しそれが磁気ヘツド
3に接触すると、ノイズレベルのAEセンサの出
力信号電圧に突起の接触によるピーク電圧が発生
する。第3図にオシロスコープ9に見られるAE
センサの典型的な出力信号電圧波形を示す。正常
なデイスク面に対応してはAEセンサの出力波形
はVnのようなノイズレベルを示してるが、突起
が存在して磁気ヘツドに接触すると出力波形に
Vpのようなピーク電圧が発生する。ピーク電圧
はすぐ減衰してノイズレベルにもどる。このピー
ク電圧は突起の高さに応じて高くなる。デイスク
1の回転数をあげると磁気ヘツド3の走行速度が
速くなりデイスク面よりの浮上量が大きくなり、
磁気ヘツド3は突起に接触しなくなり、第3図に
おけるピーク電圧Vpは発生しなくなる。このと
きの回転数と、デイスク回転中心から磁気ヘツド
までの距離(この距離は、突起までの距離と同等
である)より磁気ヘツドの走行速度が算出でき、
磁気ヘツドのデイスク面からの浮上量を知ること
ができる。
Using such a device, the disk 1 and rotating shaft 2 are rotated at 1500 rpm. The magnetic head 3 travels while slightly floating above the surface of the disk 1. When a protrusion exists on the surface of the disk 1 and comes into contact with the magnetic head 3, a peak voltage is generated in the output signal voltage of the AE sensor at the noise level due to the contact of the protrusion. AE seen on oscilloscope 9 in Figure 3
A typical output signal voltage waveform of the sensor is shown. Corresponding to a normal disk surface, the output waveform of the AE sensor shows a noise level similar to Vn, but if there is a protrusion and it comes into contact with the magnetic head, the output waveform will change.
A peak voltage such as Vp occurs. The peak voltage quickly decays and returns to the noise level. This peak voltage increases depending on the height of the protrusion. When the rotation speed of the disk 1 is increased, the traveling speed of the magnetic head 3 becomes faster and the flying height above the disk surface becomes larger.
The magnetic head 3 no longer contacts the protrusion, and the peak voltage Vp in FIG. 3 no longer occurs. The running speed of the magnetic head can be calculated from the rotational speed at this time and the distance from the disk rotation center to the magnetic head (this distance is equivalent to the distance to the protrusion).
The flying height of the magnetic head above the disk surface can be determined.

この浮上量と、デイスクが1500rpmで回転する
ときの浮上量との差が突起の高さであり、従来は
個々の突起毎にこの作業を行つてその高さを測定
していたが非常に手間がかかつていた。
The difference between this flying height and the flying height when the disk rotates at 1500 rpm is the height of the protrusion, and conventionally this work was done for each individual protrusion to measure the height, but it was very time-consuming. He was stiff.

本発明者等は、デイスク面上の突起によるAE
センサの出力信号のピーク電圧と突起高さとの関
係を種々検討した結果、ピーク電圧Vpとそのと
きの突起のデイスク回転中心からの距離Rmmの積
Vp・Rと突起の高さとの間の関係が、VP・Rを
対数目盛とすると直線となることを見いだし第1
図に示す線図を作製した。あらかじめ作製したこ
のような関係線図を利用すると、従来のように突
起毎に回転数を変化させAEセンサの出力信号の
ピーク電圧Vpの消滅する回転数を見いだすとい
うような手間のかかる作業を行うことなく、ピー
ク電圧を読みとるだけでこの線図より簡単に突起
高さを知ることが可能となる。
The inventors have discovered that AE due to protrusions on the disk surface
As a result of various studies on the relationship between the peak voltage of the sensor output signal and the protrusion height, we found that the product of the peak voltage Vp and the distance Rmm of the protrusion from the center of rotation of the disk at that time.
We found that the relationship between Vp・R and the height of the protrusion is a straight line when VP・R is on a logarithmic scale.
The diagram shown in the figure was created. By using such a relational diagram created in advance, the laborious work of changing the rotation speed for each protrusion and finding the rotation speed at which the peak voltage Vp of the output signal of the AE sensor disappears, as in the conventional method, can be done. It is possible to easily know the height of the protrusion from this diagram by simply reading the peak voltage.

本実施例では、磁気デイスクの回転数を
1500rpmとしたがこの回転数に限定されるもので
はなく、どの程度の突起高さまで検出する必要が
あるか、その検出精度に応じて適切な回転数を選
ぶことができる。
In this example, the rotation speed of the magnetic disk is
Although the rotation speed is set at 1500 rpm, the rotation speed is not limited to this, and an appropriate rotation speed can be selected depending on the height of the protrusion that needs to be detected and the detection accuracy.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、磁気ヘツドに取り付けたAE
センサの出力信号電圧に発生するデイスク面上の
突起に起因するピーク電圧Vpと突起のデイスク
回転中心からの距離Rmmとの積Vp・Rと突起高
さとの関係線図を活用することにより、所定の回
転数で磁気デイスクを回転させながら、磁気ヘツ
ドに取り付けたAEセンサの出力信号のピーク電
圧を読み取り積Vp・Rを算出するだけで突起高
さを簡単に知ることができる。しかも磁気ヘツド
を磁気デイスクの半径方向全体に移動させながら
前述の測定を行うことにより、非常に簡便な手法
でデイスク表面全体の突起の数およびその高さを
知ることができることになり、実用上極めて有効
な測定法である。
According to the present invention, the AE attached to the magnetic head
By utilizing the relationship diagram between the product Vp・R of the peak voltage Vp caused by the protrusion on the disk surface generated in the output signal voltage of the sensor and the distance Rmm of the protrusion from the disk rotation center, and the protrusion height, the predetermined value can be determined. The protrusion height can be easily determined by simply reading the peak voltage of the output signal of the AE sensor attached to the magnetic head and calculating the product Vp·R while rotating the magnetic disk at a rotation speed of . Furthermore, by performing the above measurements while moving the magnetic head over the entire radial direction of the magnetic disk, it is possible to determine the number and height of protrusions on the entire disk surface using a very simple method, which is extremely useful in practice. It is a valid measurement method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例のAEセンサの出力
信号のピーク電圧と突起のデイスク回転中心から
の距離との積と突起高さとの関係を示す線図、第
2図は本発明による測定を行うための装置の一例
の概念図、第3図はAEセンサの出力信号電圧の
一例を示す電圧波形図である。 1…磁気デイスク、2…回転軸、3…磁気ヘツ
ド、4…板ばね、5…スライダアーム、6…AE
センサ、7…増幅器、8…R.M.S.電圧計、9…
オシロスコープ。
FIG. 1 is a diagram showing the relationship between the product of the peak voltage of the output signal of an AE sensor according to an embodiment of the present invention and the distance of the protrusion from the disk rotation center and the protrusion height, and FIG. 2 is a diagram showing the relationship between the protrusion height and the measurement according to the present invention. FIG. 3 is a conceptual diagram of an example of a device for performing this, and FIG. 3 is a voltage waveform diagram showing an example of an output signal voltage of an AE sensor. 1... Magnetic disk, 2... Rotating shaft, 3... Magnetic head, 4... Leaf spring, 5... Slider arm, 6... AE
Sensor, 7...Amplifier, 8...RMS voltmeter, 9...
oscilloscope.

【特許請求の範囲】[Claims]

1 被検体が該被検体を着脱自在に嵌装する保持
具を介し、その軸心を一致させて装着される回動
軸を有する回転装置と、前記被検体等の任意の位
置へ探触子を移動させるスキヤナとを有し、被検
体の種類の判別および測定のための各動作を、
CPUを介して自動的に行う超音波測定装置にお
いて、前記保持具の外径寸法が、被検体固有の形
状および寸法に形成されていることを特徴とする
超音波測定装置。
1. A rotating device having a rotating shaft to which a subject is attached via a holder that removably attaches the subject, aligning the axes thereof, and a probe to any position on the subject, etc. It has a scanner that moves the
1. An ultrasonic measuring device that performs automatic measurement via a CPU, wherein the outer diameter of the holder is formed to a shape and size specific to a subject.

JP61267122A 1986-11-10 1986-11-10 Method for measuring height of projection on surface of magnetic disk Granted JPS63120209A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61267122A JPS63120209A (en) 1986-11-10 1986-11-10 Method for measuring height of projection on surface of magnetic disk

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61267122A JPS63120209A (en) 1986-11-10 1986-11-10 Method for measuring height of projection on surface of magnetic disk

Publications (2)

Publication Number Publication Date
JPS63120209A JPS63120209A (en) 1988-05-24
JPH0529244B2 true JPH0529244B2 (en) 1993-04-28

Family

ID=17440374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61267122A Granted JPS63120209A (en) 1986-11-10 1986-11-10 Method for measuring height of projection on surface of magnetic disk

Country Status (1)

Country Link
JP (1) JPS63120209A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2709991B2 (en) * 1991-11-22 1998-02-04 日立電子エンジニアリング株式会社 Magnetic disk protrusion detection device
KR100449683B1 (en) * 2002-01-08 2004-09-22 엘지전선 주식회사 Method and Tube for fixing components of Dense Wavelength Division Multipluxer filter

Also Published As

Publication number Publication date
JPS63120209A (en) 1988-05-24

Similar Documents

Publication Publication Date Title
US7038875B2 (en) Dynamic measurement of head media spacing modulation
US4866553A (en) Magnetic disk apparatus having a structure suitable for measuring a minute flying weight
US4624564A (en) Calibration standards for flying height testers
US6568252B1 (en) Flyability and glide methodology for 100 GPSI
US5898499A (en) Method and apparatus for detecting surface discontinuities based on changes in an optical path length during beam scanning
US7121133B2 (en) System, method, and apparatus for glide head calibration with enhanced PZT channel for very low qualification glide heights
US6314814B1 (en) Method and apparatus for precise measurement of pressure dependence of head fly height using transitional thermal signals
Miu et al. Dynamic response of a Winchester-type slider measured by laser Doppler interferometry
JPH0529244B2 (en)
US4702101A (en) Apparatus and method for testing the calibration of a hard disk substrate tester
US5567864A (en) Method and apparatus for calibration of a transducer flying height measurement instrument
US6369900B1 (en) Glide head with features on its air bearing surface for improved fly height measurement
JPS6145907A (en) Flatness detector
Suk et al. Comparison of flying height measurement between multi-channel laser interferometer and the capacitance probe slider
JPH1027342A (en) Method for inspecting magnetic recording medium
US7027252B2 (en) Servo track writer calibration
JPH06259816A (en) Method for measuring thickness of stamper
JPS62132282A (en) Floating test method for floating type magnetic head
JPS6258471A (en) Slider floating characteristic measuring method for magnetic disk
JPH03283152A (en) Measurement system for surface shape of magnetic recording plate and position of recording and reproducing head
JPH08145652A (en) Rotational oscillation inspection apparatus
JPS60246068A (en) Measurement device for minute gap
JP2779520B2 (en) Measuring method of whirling amount of spindle of magnetic disk drive
JPH0640065B2 (en) Method for estimating friction coefficient of magnetic recording medium
JPH08226801A (en) Method for detecting projection on magnetic recording medium